KR102043425B1 - Measurement equipment of solar cell - Google Patents

Abstract

The present invention relates to a solar cell measuring device.
One example of a solar cell measuring apparatus according to the present invention includes: a first electrode probe part in contact with a plurality of first electrodes extending in a first direction on a first surface of a solar cell; A second electrode probe contacting the second electrode positioned on the second surface of the solar cell; And a measuring unit configured to measure the voltage and current of the solar cell by receiving an electrical signal from the first electrode probe unit and the second electrode probe unit, wherein the first electrode probe unit includes a second intersecting with the first direction. A plurality of first probe bars disposed across the direction; Each of the plurality of first probe bars is formed in a second direction under each of the first probe bars and includes a plurality of first probe wires contacting the first electrode.

Description

Solar cell measuring device {MEASUREMENT EQUIPMENT OF SOLAR CELL}

The present invention relates to a solar cell measuring device.

With the recent prediction of the depletion of existing energy resources such as oil and coal, the interest in renewable energy to replace them is increasing, and solar cell cells producing electric energy from solar energy are attracting attention.

The solar cell is used as a solar cell module of a waterproof type in the form of a panel (panel) after several are connected in series or in parallel to obtain a desired output.

In general, a solar cell module having solar cells includes a plurality of solar cells arranged at regular intervals, an interconnector 20 which electrically connects electrodes of adjacent solar cells, upper and lower protecting solar cells. A protective film, a transparent member disposed on the protective film toward the first side of the solar cells, and a back sheet disposed under the lower protective film opposite the first side.

Such solar cell modules must include solar cells having the same efficiency to maximize the efficiency of the solar cell module. To this end, a solar cell module process includes a sorting process for separating solar cells by efficiency.

SUMMARY OF THE INVENTION An object of the present invention is to provide a solar cell measuring apparatus used in a sorting process for separating solar cells by efficiency.

One example of a solar cell measuring apparatus according to the present invention includes: a probe part for a first electrode contacting a plurality of first electrodes extending in a first direction on a first surface of a solar cell; A second electrode probe contacting the second electrode positioned on the second surface of the solar cell; And a measuring unit configured to measure the voltage and current of the solar cell by receiving an electrical signal from the first electrode probe unit and the second electrode probe unit, wherein the first electrode probe unit includes a second intersecting with the first direction. A plurality of first probe bars disposed across the direction; Each of the plurality of first probe bars is formed in a second direction under each of the first probe bars and includes a plurality of first probe wires contacting the first electrode.

Here, the plurality of first probe wires may include at least one first current probe wire measuring current and at least one first voltage probe wire measuring voltage.

Here, the plurality of first probe wires may be formed in a metal thin film form or may be formed of a metal material of a mesh type.

In addition, each of the first probe bars may have a tube therein.

In addition, the first electrode may be a finger electrode, and the first probe bar may cross the finger electrode of the solar cell.

In addition, the width of each of the first probe bars may be equal to the width of an interconnector electrically connecting the plurality of solar cells to each other.

The second electrode probe part may include a plurality of second probe bars disposed in a second direction, the plurality of second probe bars including at least one second current probe bar for measuring current and at least one second probe for measuring a voltage. 2 may include a voltage probe bar.

The second current probe bar and the second voltage probe bar may be plural, and the plurality of second current probe bar and the second voltage probe bar may be alternately arranged in the second direction.

The second electrode probe may include a plurality of second probe bars disposed in a second direction; Each of the plurality of second probe bars may be formed in a second direction by contacting each of the second probe bars, and may include a plurality of second probe wires contacting the second electrode.

Here, the plurality of second probe wires may include at least one second current probe wire measuring current and at least one second voltage probe wire measuring voltage.

In addition, the plurality of second probe wires may be formed in a metal thin film form, or may be formed of a metal material of a mesh type.

In addition, the width of each of the second probe bars may be equal to the width of an interconnector for electrically connecting the plurality of solar cells to each other.

In addition, a bar frame supporting the second probe bar may be further provided below each of the second probe bars.

The solar cell measuring apparatus according to an example of the present invention has an effect of more accurately and easily performing the measurement of the solar cell without the busbar electrode.

BRIEF DESCRIPTION OF THE DRAWINGS It is a figure for demonstrating an example of the solar cell which is a measuring object of the solar cell measuring apparatus which concerns on this invention.
2 to 5 are diagrams for explaining an example of the solar cell measuring device according to the present invention.
6 is a view for explaining another example of the second electrode probe in the solar cell measuring apparatus according to the present invention.
It is a figure for demonstrating another example of the solar cell which is a measuring object of the solar cell measuring apparatus which concerns on this invention.
8 to 9 are diagrams for explaining another example of the solar cell measuring apparatus according to the present invention.

DETAILED DESCRIPTION Hereinafter, exemplary embodiments of the present invention will be described in detail with reference to the accompanying drawings so that those skilled in the art may easily implement the present invention. As those skilled in the art would realize, the described embodiments may be modified in various different ways, all without departing from the spirit or scope of the present invention. In the drawings, parts irrelevant to the description are omitted for simplicity of explanation, and like reference numerals designate like parts throughout the specification.

In the drawings, the thickness of layers, films, panels, regions, etc., are exaggerated for clarity. When a portion of a layer, film, region, plate, etc. is said to be "on top" of another part, this includes not only when the other part is "right over" but also when there is another part in the middle. On the contrary, when a part is "just above" another part, there is no other part in the middle.

Hereinafter, before describing the solar cell measuring apparatus according to the present invention, an example of a solar cell which is a measurement target of the solar cell measuring apparatus will be described first.

BRIEF DESCRIPTION OF THE DRAWINGS It is a figure for demonstrating an example of the solar cell which is a measuring object of the solar cell measuring apparatus which concerns on this invention.

As shown in FIG. 1A, an example of the solar cell 10 to be measured by the solar cell measuring apparatus includes a substrate 11, an emitter part 12, a first electrode 13, and an antireflection film ( 15), and the second electrode 16. The interconnector 20 is connected to the front or rear of the solar cell 10 as shown.

Here, the substrate 11 functions to convert light energy incident from the outside into electrical energy, and may be a semiconductor substrate 11 made of silicon of a first conductivity type, for example, a p-type conductivity. In this case, the silicon may be monocrystalline silicon, polycrystalline silicon, or amorphous silicon. When the substrate 11 has a p-type conductivity type, it contains impurities of trivalent elements such as boron (B), gallium (Ga), indium (In), and the like.

The emitter part 12 may be a second conductive type which is positioned on the first surface of the substrate 11 to which light is incident and is opposite to the conductive type of the substrate 11. For example, the emitter portion 12 is a region doped with an impurity having an n-type conductivity type and forms a p-n junction with the semiconductor substrate 11. When the emitter portion 12 has an n-type conductivity type, the emitter portion 12 may be doped with impurities of a pentavalent element such as phosphorus (P), arsenic (As), antimony (Sb), and the like on the substrate 11. Can be formed.

Accordingly, when electrons in the semiconductor receive energy by light incident on the substrate 11, the electrons move toward the n-type semiconductor and the holes move toward the p-type semiconductor. Therefore, when the substrate 11 is p-type and the emitter portion 12 is n-type, the separated holes move toward the substrate 11 and the separated electrons move toward the emitter portion 12.

In contrast, the substrate 11 may be of an n-type conductivity type, and may be made of a semiconductor material other than silicon. When the substrate 11 has an n-type conductivity type, the substrate 11 may contain impurities of pentavalent elements such as phosphorus (P), arsenic (As), and antimony (Sb).

Since the emitter portion 12 forms a p-n junction with the substrate 11, when the substrate 11 has an n-type conductivity type, the emitter portion 12 has a p-type conductivity type. In this case, the separated electrons move toward the substrate 11 and the separated holes move toward the emitter portion 12.

When the emitter portion 12 has a p-type conductivity type, the emitter portion 12 may dopant impurities of trivalent elements such as boron (B), gallium (Ga), indium (In), and the like onto the substrate 11. Can be formed.

The anti-reflection film 15 is positioned on the emitter portion 12 where the first electrode 13 is not located, and functions to allow more light incident from the outside to enter the substrate 11.

The plurality of first electrodes 13 extend in a first direction x on the first surface of the solar cell, are formed on the emitter part 12, and are electrically connected to the emitter part 12, and adjacent first electrodes. (13) and formed spaced apart from each other. Each first electrode 13 functions to collect charges, for example, electrons, which are moved toward the emitter part 12, and transfer them to the interconnector 20 that contacts the first electrode 13.

Here, the plurality of first electrodes 13 may be finger electrodes 13, and busbar electrodes (not shown) may not be included in the first electrodes 13.

The second electrode 16 is formed on the opposite surface of the first surface of the substrate 11, that is, on the entire surface of the second surface of the substrate 11, and collects charges, for example, holes, moving toward the substrate 11. do.

In addition, a portion of the second surface of the substrate 11 may further include a second bus bar 14 electrically connected to the second electrode 16 and in contact with the interconnector 20. The second bus bar 14 may be formed long in the second direction y, which is the same direction as the interconnector 20.

The operation of the solar cell 10 having such a structure is as follows.

When light is incident on the solar cell 10 and is incident on the substrate 11 through the anti-reflection film 15 and the emitter part 12, electrons and holes are generated inside the substrate 11 by the incident light, and pn According to the principle of bonding, electrons move toward the emitter portion 12 having an n-type conductivity type, and holes move toward the substrate 11 having a p-type conductivity type. As such, the electrons moved toward the emitter part 12 move to the interconnector 20 that is collected by the first electrode 13 and is electrically connected to the first electrode 13, and moves toward the substrate 11. One hole is collected by the second electrode 16 and moves to the interconnector 20 which is in contact with and electrically connected to the second electrode 16.

The solar cell 10 may be used alone, but for more efficient use, the solar cells 10A, 10B, and 10C having the same structure as shown in FIG. 20) is connected in series to form a solar cell module.

Here, the interconnector 20 is used when the plurality of solar cells are electrically connected to each other, and is disposed in a direction crossing the first electrode 13.

The interconnector 20 may be connected to the plurality of first electrodes 13 by a conductive film or a conductive paste. The conductive film may have a structure in which a plurality of conductive particles of nickel (Ni) are included in the epoxy resin.

Meanwhile, the solar cell 10 illustrated in FIG. 1A is a bus bar that intersects with the first electrode 13 on the first surface of the substrate 11 and is parallel to the interconnector 20. It may not include an electrode.

As the busbar electrode, an electrode paste made of an expensive material such as silver (Ag) is generally used. When the busbar electrode is omitted, as described above, the amount of the electrode paste forming the busbar electrode can be reduced. Since the process of forming the busbar electrode can be omitted, the manufacturing cost can be greatly reduced.

However, the solar cell not including the busbar electrode as described above is not easy to measure the efficiency of the solar cell because the width of the first electrode 13 is minute, so that it is not easy to classify the solar cell by the efficiency. When using the solar cell measuring apparatus according to, it is possible to easily perform the process of classifying the solar cells by efficiency.

Hereinafter, a solar cell measuring apparatus according to the present invention will be described.

2 to 5 are diagrams for explaining an example of the solar cell measuring device according to the present invention.

FIG. 2 is a view illustrating an overall conceptual diagram of a solar cell measuring apparatus according to the present invention, and FIG. 3 (a) is a diagram for explaining the first electrode probe part 100 in the solar cell measuring apparatus according to the present invention. 3B is a diagram showing a case where the first electrode probe part 100 is in contact with the first surface of the solar cell 10.

In addition, FIG. 3 is a view for explaining the tube 120T provided in the first probe bar 120, and FIG. 4 is a view for explaining the first probe wire 120W formed under the first probe bar 120. FIG. It is for illustration.

As shown in FIG. 2, an example of a solar cell measuring apparatus according to the present invention includes a front electrode probe 100, a second electrode probe 200, and a measurement unit 300.

The first electrode probe part 100 is in contact with the first electrode 13 positioned on the first surface of the solar cell 10 and receives an electrical signal from the first electrode 13 of the solar cell 10. .

The second electrode probe part 200 is formed to contact the second electrode 16 formed on the second surface opposite to the first surface of the solar cell 10. Here, the shape of the second electrode probe part 200 may be formed in a planar shape to be in contact with the surface of the second electrode 16. However, it is also possible to be formed differently. This will be described later.

The measuring unit 300 is electrically connected to each of the front electrode probe 100 and the second electrode probe 200, and is electrically connected from the front electrode probe 100 and the second electrode probe 200. In response to the signal, the open circuit voltage Voc and the short circuit current Isc of the solar cell 10 are measured. In addition, the fill factor F.F and the resistance per unit area R of the solar cell 10 may also be measured using the open voltage Voc and the short circuit current Isc of the solar cell 10. Here, the electrical signal may be a current or voltage generated from the solar cell 10.

On the other hand, the first electrode probe 100 according to the present invention, as shown in Figure 2 and 3 (a), the first frame 110, a plurality of first probe bar 120, and a plurality of First probe wires 120W.

Here, the first frame 110 is disposed on the first surface of the solar cell 10, and has an opening formed by the first frame 110, and such opening is the first surface of the solar cell 10. It may be larger than the area of. The first frame 110 may be formed of steel or stainless steel.

In addition, both ends of the plurality of first probe bars 120 are connected to the first frame 110, and are disposed to cross the opening of the first frame 110 in a second direction y. That is, the plurality of first probe bars 120 are disposed in a direction crossing the first electrodes 13 of the solar cell.

Here, although the number of the first probe bars 120 is shown as an example of three in FIG. 2 and FIG. 3, the number of the first probe bars 120 may be changed.

The plurality of first probe bars 120 may be formed of a non-conductive material having elastic force. For example, the plurality of first probe bars 120 may be formed of a polymer material.

In addition, the width of each of the first probe bars 120 is the interconnector 20 electrically connecting the plurality of solar cells 10 to each other in consideration of a state when the plurality of solar cells 10 are formed as a module. It may be equal to the width of.

In addition, as illustrated in FIGS. 3 and 4, the plurality of first probe wires 120W may be formed under the first probe bar 120 in the same second direction y as the first probe bar 120. have. The plurality of first probe wires 120W are formed of a conductive material, and are in contact with the first electrode 13 to receive an electrical signal from the first electrode 13.

As described above, a plurality of first probe wires 120W may be formed in one first probe bar 120. For example, the plurality of first probe wires 120W formed under one first probe bar 120 may include at least one first current probe wire 120WI measuring current and at least one first measuring voltage. One voltage probe wire 120WV may be included. Accordingly, at least one first current probe wire 120WI and at least one first voltage probe wire 120WV may be disposed on one first probe bar 120.

In FIG. 3A, two first current probe wires 120WI and two first voltage probe wires 120WV are alternately arranged in one first probe bar 120, but the first probe bar 120 is alternately disposed. Alternatively, you can change the number and arrangement.

Therefore, when measuring one solar cell 10, each of the plurality of first probe bars 120 includes at least one first current probe wire 120WI and at least one first voltage probe wire 120WV. Thus, when measuring one solar cell 10, a plurality of electrical signals are inputted through a plurality of first current probe wires 120WI and a plurality of first voltage probe wires 120WV, which are different in position, to receive data. It is possible to measure and calculate the open voltage (Voc), the short circuit current (Jsc) and the filter (FF) of the solar cell 10 from a plurality of data, it is possible to measure the solar cell 10 more precisely .

In addition, the solar cell is provided by providing at least one first current probe wire 120WI and at least one first voltage probe wire 120WV under each of the plurality of first probe bars 120 arranged in different positions. Voltage and current may be measured for each specific position of 10 so that a specific portion of the solar cell 10 can be measured.

In addition, the plurality of first probe bars 120 according to the present invention may include a tube 120T inside the first probe bar 120 as shown in FIG.

As such, when the first probe bar 120 includes the tube 120T, as illustrated in FIG. 3B, the plurality of first probe wires 120W provided in the first electrode probe part 100 may be provided. Is in contact with the first electrode 13 of the solar cell 10, as shown in (b) of FIG. 4, the fluid from the outside with a tube 120T provided inside the first probe bar 120 When the gas is introduced, the volume of the first probe bar 120 is thereby expanded, so that the plurality of first probe wires 120W under the first probe bar 120 is connected to the first electrode of the solar cell 10. It is possible to make contact with (13) at a higher pressure.

Accordingly, the electrical connection between the plurality of first probe wires 120W and the first electrode 13 of the solar cell 10 may be more firmly performed. Thereby, the solar cell 10 can be measured more precisely.

In addition, the plurality of first probe wires 120W may be formed in the form of a metal thin film, as shown in FIG. 5A, or may be formed of a metal material of mesh type, as shown in FIG. 5B. Can be.

In this case, the width of each of the plurality of first probe wires 120W may be equal to or larger than the width of the first electrode 13, that is, the finger electrode 13.

As described above, the solar cell measuring apparatus according to the present invention has an effect of more accurately and easily measuring the efficiency of the solar cell 10 in which the busbar electrode is not formed.

More specifically, as shown in FIG. 3A, the plurality of first probe bars 120 are formed in a second direction y crossing the first direction x of the first electrode 13. However, the width is equal to the width of the interconnector 20 by making the area where light is blocked by the plurality of first probe bars 120 equal to the amount of light blocked by the interconnector 20, This is to measure the efficiency of the solar cell 10 more accurately when measuring the solar cell 10.

By doing in this way, the sorting process of the solar cell 10 according to the photoelectric conversion efficiency of the solar cell 10 can be made more accurate.

This sorting process is important because the overall efficiency of the solar cell module 10 depends greatly on the efficiency of each solar cell 10.

More specifically, for example, when one solar cell 10 module is composed of 60 solar cells 10, each solar cell 10 may be connected in series with each other.

In this case, when 59 of the solar cells 10 produce a current of 10 mA, and one produces a current of 5 mA, the current produced by one solar cell 10 module produces the lowest current of the solar cell 10. Since a problem occurs that the photoelectric conversion efficiency of the solar cell module 10 decreases due to convergence to a current of 5 mA, all 60 solar cells 10 should be classified to have the same efficiency.

Therefore, since the sorting process of classifying the solar cells 10 having the same efficiency greatly affects the efficiency of the solar cell module, it is very important to measure the solar cell 10 more accurately in the sorting process. .

Until now, the solar cell measuring apparatus according to the present invention has been described only for the example of measuring the solar cell 10 without the busbar electrode, but the busbar electrode as well as the solar cell 10 is not formed The formed solar cell 10 can also be measured easily.

In addition, in the solar cell measuring apparatus according to the present invention, the second electrode probe part 200 has been described as an example in the case of being formed in a planar shape so as to be in contact with the surface of the second electrode 16 as an example. It may be.

6 is a view for explaining another example of the second electrode probe in the solar cell measuring apparatus according to the present invention.

As shown in FIG. 6, the second electrode probe 200 according to the present invention includes a plurality of second probe bars 200B disposed in a second direction y on a support, and includes a plurality of second probe bars 200B. The probe bar 200B includes a plurality of second probe bars 200B including at least one second current probe bar 200BI for measuring current and at least one second voltage probe bar 200BV for measuring voltage. Can be.

Here, the plurality of second probe bars 200B is in contact with the second electrode 16 of the solar cell 10. In this case, the position and direction in which the plurality of second probe bars 200B are arranged may be the same as the position and direction in which the interconnector 20 contacts the second electrode 16 of the solar cell 10.

In this case, the second current probe bar 200BI and the second voltage probe bar 200BV are plural, and the plurality of second current probe bar 200BI and the second voltage probe bar 200BV are in the second direction y. It can be arranged alternately.

In FIG. 6, the second current probe bar 200BI is three in each line, and the second voltage probe bar 200BV is two in each line. However, the number and positions of the two current probe bars 200BI may be changed. .

Up to now, as shown in FIG. 1A, the solar cell 10 includes a finger electrode 13 on a first surface, and a second electrode 16 on an entire surface on a second surface. In the case of the solar cell 10 of the type, only the solar cell measuring apparatus for measuring the conventional solar cell 10 is described. Hereinafter, as shown in FIG. The solar cell measuring apparatus which can measure the double-sided solar cell 10 provided with the finger electrode 13 in the 1st surface and the 2nd surface is demonstrated.

It is a figure for demonstrating another example of the solar cell which is a measuring object of the solar cell measuring apparatus which concerns on this invention.

In FIG. 7, detailed description of the same parts as those described with reference to FIG. 1 will be omitted.

As shown in FIG. 7, the double-sided solar cell 10 ′ includes a substrate 11, an emitter part 12, a first electrode 13, an antireflection film 15, a back antireflection film 17, and a second surface. It may include an electrode 18.

Here, the plurality of second electrodes 18 may be formed in the same shape and arrangement of the first electrodes 13 as shown in FIG. 1.

That is, the plurality of second electrodes 18 extend in the first direction x on the second surface of the solar cell 10 ′, are electrically connected to the substrate 11, and adjacent second electrodes 18. And spaced apart from each other.

In the case of such a double-sided solar cell 10 ', light is also incident on the second surface of the substrate 11 to generate photoelectric conversion. Therefore, measuring the efficiency of the solar cell 10' is a conventional solar cell. It is relatively harder than 10 '.

That is, since the efficiency of the solar cell 10 ', that is, the short-circuit current, the open circuit voltage and the effector should be measured in a state where light is incident on not only the first surface of the solar cell 10' but also the second surface, Measurement of cell 10 'may be more challenging.

Therefore, in the present invention, in order to measure such a double-sided solar cell 10 ', the structure of the second electrode probe 200 may be formed similarly to the structure of the first electrode probe 100. .

This will be described in more detail as follows.

8 to 9 are diagrams for explaining another example of the solar cell measuring apparatus according to the present invention.

FIG. 8A illustrates an example of the first electrode probe part 100 disposed on the first surface of the double-sided solar cell 10 ′, and FIG. 8B illustrates the second electrode probe part. The double-sided solar cell 10 ′ is disposed on the top surface of the substrate 200, and FIG. 8C illustrates a first electrode probe 100 and a second electrode probe 200. It is an example which shows the cross-sectional shape at the time of contacting the 1st surface and the 2nd surface of the double-sided solar cell 10 ', respectively.

9 illustrates a cross section of the second probe bar 220 when the plurality of second probe wires 220W of the second probe bar 220 and the second electrode 18 of the solar cell 10 'are in contact with each other. It is a figure which shows a shape.

As shown in FIG. 8, the solar cell measuring apparatus according to another exemplary embodiment of the present invention may include the first electrode probe 100 described above with reference to FIGS. 2 to 5, and a second electrode probe formed in a similar shape. 200).

In more detail, the second electrode probe part 200 is similar to the second electrode probe part 200, and includes a second frame 210, a plurality of second probe bars 220, and a plurality of second electrodes. Probe wire 220W may be provided.

Here, the second frame 210 may have an opening larger than the area of the first surface of the solar cell 10 ′. In addition, both ends of the plurality of second probe bars 220 may be connected to the second frame 210, and may be disposed to cross the opening of the second frame 210 in the second direction y. Here, the width of each of the second probe bars 220 may be equal to the width of the interconnector 20 that electrically connects the plurality of solar cells 10 ′ with each other.

In addition, as shown in FIG. 9, a bar frame 220F supporting the second probe bar 220 may be further provided below each of the second probe bars 220. The bar frame 220F may be formed of steel or stainless steel in the same manner as the second frame 210.

The bar frame 220F prevents the central portion of the second probe bar 220 from being bent downward by the weight of the solar cell 10 ′ and the second probe bar 220 itself. The probe wire 220W may be in close contact with the plurality of second electrodes 18. Accordingly, the measurement of the solar cell 10 'can be performed more precisely.

In addition, the plurality of second probe wires 220W may be formed in the second direction y by contacting the upper portions of the plurality of second probe bars 220, and may contact the second electrode 18.

Here, the plurality of second probe wires 220W may include at least one second current probe wire measuring current and at least one second voltage probe wire measuring voltage.

In this case, the plurality of second probe wires 220W may be formed in a metal thin film form or may be formed of a metal material of a mesh type.

As described above, another example of the solar cell measuring apparatus according to the present invention includes not only the first electrode probe part 100 but also the second electrode probe part 200 being incident on the second surface of the solar cell 10 '. By preventing light from being blocked except at the portion overlapping with the interconnector 20, the double-sided solar cell 10 ′ can be measured more precisely.

In addition, since the solar cell measuring apparatus needs to align only the region where the interconnector 20 is to be disposed with the positions of the first probe bar 120 and the second probe bar 220, the double-sided solar cell 10 ') Can also be performed more easily.

The above description is merely illustrative of the technical idea of the present invention, and various modifications, changes, and substitutions may be made by those skilled in the art without departing from the essential characteristics of the present invention. will be.

Accordingly, the embodiments disclosed in the present invention and the accompanying drawings are not intended to limit the technical spirit of the present invention but to describe the present invention, and the scope of the technical idea of the present invention is not limited by the embodiments and the accompanying drawings. . The protection scope of the present invention should be interpreted by the following claims, and all technical ideas within the equivalent scope should be interpreted as being included in the scope of the present invention.

Claims (13)

A first electrode probe contacting the plurality of first electrodes extending in a first direction on the first surface of the solar cell;
A second electrode probe part in contact with a second electrode on the second surface of the solar cell; And
And a measuring unit configured to receive an electrical signal from the first electrode probe and the second electrode probe to measure the voltage and current of the solar cell.
The first electrode probe portion,
A first frame disposed on the first surface of the solar cell and having an opening larger than an area of the first surface of the solar cell and formed of steel or stainless steel;
Both ends are connected to the first frame, are disposed across the opening of the first frame in a second direction crossing the first direction to intersect the plurality of first electrodes of the solar cell, non-conductive with elastic force A plurality of first probe bars formed of a material; And
A plurality of first probe wires positioned under each of the first probe bars to contact the first electrodes;
Equipped with
Each of the plurality of first probe wires is elongated in the second direction, and both ends thereof are respectively connected to the first frame, spaced apart in the first direction, and formed of a conductive material.
And the first frame and the measurement unit are electrically connected to each other. According to claim 1,
The plurality of first probe wires includes at least one first current probe wire for measuring the current and at least one first voltage probe wire for measuring the voltage. According to claim 1,
The plurality of first probe wires are formed in a metal thin film form, or a solar cell measuring device formed of a metal material of the mesh type. According to claim 1,
Each of the first probe bar is a solar cell measuring device having a tube therein. According to claim 1,
The first electrode is a finger electrode,
And the first probe bar intersects the finger electrode and simultaneously contacts the plurality of finger electrodes. According to claim 1,
And a width of each of the first probe bars is equal to a width of an interconnector electrically connecting two adjacent solar cells to each other. According to claim 1,
The second electrode probe portion
A plurality of second probe bars arranged in the second direction,
The plurality of second probe bars includes at least one second current probe bar for measuring the current and at least one second voltage probe bar for measuring the voltage. The method of claim 7, wherein
The plurality of second current probe bar and the second voltage probe bar,
And the plurality of second current probe bars and the second voltage probe bars are alternately arranged in the second direction. According to claim 1,
The second electrode probe portion
A plurality of second probe bars disposed across the second direction,
Each of the plurality of second probe bars has a plurality of second probe wires formed on the second probe bars in the second direction and in contact with the second electrode. The method of claim 9,
The plurality of second probe wires includes at least one second current probe wire for measuring the current and at least one second voltage probe wire for measuring the voltage. The method of claim 9,
The plurality of second probe wires are formed in a metal thin film form, or a solar cell measuring device is formed of a metal material of the mesh type. The method of claim 9,
And a width of each of the second probe bars is equal to a width of an interconnector electrically connecting the plurality of solar cells to each other. The method of claim 9,
The lower part of each of the second probe bar further comprises a bar frame for supporting the second probe bar.

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