CN110600392A - Photovoltaic laminated tile battery IV testing arrangement - Google Patents

Photovoltaic laminated tile battery IV testing arrangement Download PDF

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Publication number
CN110600392A
CN110600392A CN201910887880.1A CN201910887880A CN110600392A CN 110600392 A CN110600392 A CN 110600392A CN 201910887880 A CN201910887880 A CN 201910887880A CN 110600392 A CN110600392 A CN 110600392A
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CN
China
Prior art keywords
testing
vacuum adsorption
photovoltaic
cell
vacuum
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
CN201910887880.1A
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Chinese (zh)
Inventor
张小亮
彭云
丁志强
张丰军
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Trina Solar Co Ltd
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Trina Solar Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Trina Solar Co Ltd filed Critical Trina Solar Co Ltd
Priority to CN201910887880.1A priority Critical patent/CN110600392A/en
Publication of CN110600392A publication Critical patent/CN110600392A/en
Pending legal-status Critical Current

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    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/67Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
    • H01L21/683Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping
    • H01L21/6838Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping with gripping and holding devices using a vacuum; Bernoulli devices
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L22/00Testing or measuring during manufacture or treatment; Reliability measurements, i.e. testing of parts without further processing to modify the parts as such; Structural arrangements therefor
    • H01L22/10Measuring as part of the manufacturing process
    • H01L22/14Measuring as part of the manufacturing process for electrical parameters, e.g. resistance, deep-levels, CV, diffusions by electrical means
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L31/00Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
    • H01L31/18Processes or apparatus specially adapted for the manufacture or treatment of these devices or of parts thereof
    • YGENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y02TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
    • Y02PCLIMATE CHANGE MITIGATION TECHNOLOGIES IN THE PRODUCTION OR PROCESSING OF GOODS
    • Y02P70/00Climate change mitigation technologies in the production process for final industrial or consumer products
    • Y02P70/50Manufacturing or production processes characterised by the final manufactured product

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  • Engineering & Computer Science (AREA)
  • Manufacturing & Machinery (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Physics & Mathematics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Electromagnetism (AREA)
  • Testing Electric Properties And Detecting Electric Faults (AREA)

Abstract

The invention discloses a photovoltaic laminated cell IV testing device which comprises a main body rack, a front side testing mechanism and a back side testing mechanism, wherein the front side testing mechanism is used for testing a main grid on the front side of a cell, the back side testing mechanism is used for testing a main grid on the back side of the cell, the back side testing mechanism comprises a vacuum adsorption platform which has conductivity and can carry out vacuum adsorption positioning on the cell, and the front side testing mechanism comprises a plurality of rows of testing probe pin rows matched with the shape of the main grid on the front side of the cell. In the automatic testing process, the IV characteristics of the laminated cell are accurately tested under the condition of completely not influencing the yield and the yield of the capacity and the like, and the static stability and the dynamic stability of the laminated cell are approved by the quality test, so that the requirement of testing the laminated cell in a mass production manner is completely met.

Description

Photovoltaic laminated tile battery IV testing arrangement
Technical Field
The invention belongs to the technical field of photovoltaics, and particularly relates to a photovoltaic laminated cell IV testing device.
Background
As shown in fig. 1, the conventional IV test apparatus is generally configured to include an upper probe bank 1a and a lower probe bank 3a, the upper probe bank 1a and the lower probe bank 3a are respectively in contact test with the front main grid and the back main grid of the cell, due to the development of new battery assembly technology, the front and back main grids of the laminated battery piece are designed in a staggered way, and two main grids are basically close together, as shown in figure 2, therefore, the contact test mode of the existing test device can not be realized, firstly, the upper and lower main grids of the laminated cell are staggered, if the upper and lower probes are still used, the probes need to be staggered, which is equivalent to applying a shearing force to the front and back surfaces of the cell, the two main grids of the laminated cell are close to each other, and the two existing probe rows cannot be exactly pressed on the two main grids due to the small distance.
Disclosure of Invention
In order to solve the problems, the invention provides a photovoltaic laminated cell IV testing device, which can automatically and accurately test the electrical performance and efficiency of a laminated cell and provide the IV test of the cell for the mass production of the laminated technology.
The technical scheme of the invention is as follows: the utility model provides a photovoltaic shingling battery IV testing arrangement, includes the main part frame, still includes the front accredited testing organization that is used for carrying out the test to the positive main grid of battery piece and carries out the back accredited testing organization that tests to the main grid at the back of battery piece, back accredited testing organization is including having electric conductivity and can carry out the vacuum adsorption platform of vacuum adsorption location to the battery piece, front accredited testing organization include with the battery piece openly main grid shape assorted multirow survey probe pin row.
In the invention, the back of the battery piece adopts a full-contact type vacuum adsorption platform, the vacuum adsorption platform is provided with a vacuum adsorption structure design, the vacuum adsorption platform needs to adopt a metal material with good conductive contact, copper is adopted as a matrix in the embodiment, and the vacuum adsorption platform needs to be insulated from other mechanisms. The invention can be added with a control switch which can automatically sense and control the vacuum platform to open and release the vacuum.
The two probe rows of the two main grids close to each other on the front side of the battery piece are redesigned, the probe rows corresponding to the arrangement of the main grids on the front side of the battery piece are adopted, for the battery piece with two adjacent main grids, the two adjacent probe rows can be arranged on one substrate, and the two rows of probes on one substrate are guaranteed to be just pressed on the two adjacent main grids.
When the test is carried out, the back surface is in contact fit with the vacuum adsorption platform, the back surface is fixed on the vacuum adsorption platform under the action of the vacuum adsorption force of the vacuum adsorption platform, and after a plurality of rows of test probe rows in the front surface test mechanism correspond to the main grid positions of the battery piece, a plurality of rows of test probe rows are pressed down.
Preferably, the vacuum adsorption platform is provided with a vacuum adsorption hole. The battery piece can be adsorbed through the vacuum adsorption hole, and the vacuum adsorption hole is connected with the vacuum device to generate vacuum adsorption force.
Preferably, the vacuum suction hole is provided in plurality.
Preferably, the vacuum adsorption platform is made of a conductive metal material.
Preferably, the vacuum adsorption platform is made of a copper material.
Preferably, the back side testing mechanism further comprises an insulating support for supporting the vacuum adsorption platform.
Preferably, the back side testing mechanism further comprises a conductive probe for conducting electricity to the vacuum adsorption platform.
Preferably, the number of the conductive probes is six, and the six conductive probes are divided into two rows on average.
Compared with the prior art, the invention has the beneficial effects that:
in the automatic testing process, the IV characteristics of the laminated cell are accurately tested under the condition of completely not influencing the yield and the yield of the capacity and the like, and the static stability and the dynamic stability of the laminated cell are approved by the quality test, so that the requirement of testing the laminated cell in a mass production manner is completely met.
Drawings
Fig. 1 is a schematic structural diagram of an IV testing apparatus in the prior art.
Fig. 2 is a schematic structural diagram of a battery piece.
FIG. 3 is a schematic structural diagram of an IV test apparatus according to the present invention.
FIG. 4 is a schematic view of another structure of an IV test apparatus according to the present invention.
FIG. 5 is a schematic structural diagram of a front testing mechanism according to the present invention.
Fig. 6 is a schematic structural diagram of a test probe row corresponding to the position of a main grid adjacent to a battery piece in the invention.
FIG. 7 is a schematic structural view of a vacuum adsorption platform according to the present invention.
FIG. 8 is a schematic structural view of another aspect of the vacuum chuck stage of the present invention.
Detailed Description
As shown in fig. 3 and 4, the invention includes a main body frame 1, a front side testing mechanism for testing the main grid on the front side of the battery piece 2, and a back side testing mechanism for testing the main grid on the back side of the battery piece 2, wherein the back side testing mechanism includes a vacuum adsorption platform 3 which has conductivity and can carry out vacuum adsorption positioning on the battery piece 2, and the front side testing mechanism includes a plurality of rows of testing probe pin rows 4 which are matched with the shape of the main grid on the front side of the battery piece 2.
In the invention, the back of the battery piece 2 adopts the full-contact type vacuum adsorption platform 3, the vacuum adsorption platform 3 is provided with a vacuum adsorption structure design, the vacuum adsorption platform needs to adopt a metal material with good conductive contact, in the embodiment, copper is used as a matrix, and the vacuum adsorption platform needs to be insulated from other mechanisms. The invention can be added with a control switch which can automatically sense and control the vacuum platform to open and release the vacuum.
The two probe rows of the two main grids close to each other on the front side of the battery piece are redesigned, the probe rows corresponding to the arrangement of the main grids on the front side of the battery piece are adopted, for the battery piece with two adjacent main grids, the two adjacent probe rows can be arranged on one substrate 6, and it is guaranteed that the two rows of probes on one substrate are just pressed on the two adjacent main grids.
As shown in fig. 3 to 6, in the present invention, when testing is performed, the back surface is in contact with the vacuum adsorption platform 3, the back surface is fixed on the vacuum adsorption platform 3 under the action of the vacuum adsorption force of the vacuum adsorption platform 3, and after the multiple rows of test probe rows 4 in the front surface testing mechanism correspond to the main grid positions of the battery piece 2, the multiple rows of test probe rows 4 are pressed down, in the present invention, because the multiple rows of test probe rows 4 correspond to the main grid positions of the front surface of the battery piece 2, the main grid lines of the battery piece 2 respectively correspond to the probe rows after being pressed down, and the vacuum adsorption platform 3 has conductivity, so that testing can be performed.
As shown in fig. 7 and 8, the vacuum suction platform 3 of the present invention is provided with a plurality of vacuum suction holes 31, and the number of the vacuum suction holes 31 is plural. In the invention, the battery piece 2 can be adsorbed through the vacuum adsorption hole 31, and the vacuum adsorption hole 31 is connected with a vacuum device to generate vacuum adsorption force. The vacuum adsorption platform 3 is made of conductive metal material, and the vacuum adsorption platform 3 is made of copper material in general. The back side testing mechanism further comprises an insulating support 5 for supporting the vacuum adsorption platform 3 and a conductive probe 32 for conducting electricity to the vacuum adsorption platform 3. In general, six conductive probes 32 are provided, and the six conductive probes 32 are divided into two rows on average.

Claims (8)

1. The utility model provides a photovoltaic stack tile battery IV testing arrangement, includes the main part frame, its characterized in that still includes the front accredited testing organization that is used for testing the positive main grid of battery piece and tests the back accredited testing organization to the main grid at the back of battery piece, back accredited testing organization is including having electric conductivity and can carry out the vacuum adsorption platform of vacuum adsorption location to the battery piece, front accredited testing organization include with the battery piece front main grid shape assorted multirow survey probe pin row.
2. The photovoltaic shingle battery IV testing apparatus according to claim 1, wherein the vacuum suction platform is provided with vacuum suction holes.
3. The photovoltaic shingle IV test apparatus according to claim 2, wherein the vacuum suction hole is a plurality of holes.
4. The photovoltaic shingle battery IV test apparatus according to any of claims 1 to 3, wherein the vacuum adsorption platform is made of a conductive metal material.
5. The photovoltaic shingle IV test apparatus of claim 4 wherein the vacuum suction platform is made of a copper material.
6. The photovoltaic shingle IV testing apparatus of claim 5 wherein the back side testing mechanism further comprises an insulating support for supporting the vacuum chuck table.
7. The photovoltaic laminated cell IV test apparatus according to any one of claims 1 to 3 and 5 to 6, wherein the back side test mechanism further comprises a conductive probe for conducting electricity to the vacuum adsorption platform.
8. The photovoltaic tandem cell IV testing apparatus according to claim 7, wherein the number of the conductive probes is six, and the six conductive probes are divided into two rows on average.
CN201910887880.1A 2019-09-19 2019-09-19 Photovoltaic laminated tile battery IV testing arrangement Pending CN110600392A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN201910887880.1A CN110600392A (en) 2019-09-19 2019-09-19 Photovoltaic laminated tile battery IV testing arrangement

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN201910887880.1A CN110600392A (en) 2019-09-19 2019-09-19 Photovoltaic laminated tile battery IV testing arrangement

Publications (1)

Publication Number Publication Date
CN110600392A true CN110600392A (en) 2019-12-20

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CN201910887880.1A Pending CN110600392A (en) 2019-09-19 2019-09-19 Photovoltaic laminated tile battery IV testing arrangement

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Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN116559692A (en) * 2023-05-12 2023-08-08 天合光能股份有限公司 Battery testing device and battery testing rapid positioning method

Citations (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN204332976U (en) * 2015-01-27 2015-05-13 苏州阿特斯阳光电力科技有限公司 A kind of electrode structure at right side of solar cell
CN205792459U (en) * 2016-05-26 2016-12-07 苏州协鑫集成科技工业应用研究院有限公司 For testing the IV tester of heterojunction solar battery
JP2016211977A (en) * 2015-05-11 2016-12-15 三菱電機株式会社 Semiconductor chip test device and test method
CN107768454A (en) * 2017-09-18 2018-03-06 成都晔凡科技有限公司 Cell piece and its method of testing for imbrication component
CN108133898A (en) * 2017-12-19 2018-06-08 泰州隆基乐叶光伏科技有限公司 A kind of solar cell electric performance testing device
CN207490864U (en) * 2017-10-31 2018-06-12 泰州隆基乐叶光伏科技有限公司 The testboard of testing two-sided zero main grid/more main grids solar battery efficiency
CN208572033U (en) * 2018-07-25 2019-03-01 隆基绿能科技股份有限公司 Lamination solar cell test device
CN210223953U (en) * 2019-09-19 2020-03-31 天合光能股份有限公司 Photovoltaic laminated tile battery IV testing arrangement

Patent Citations (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN204332976U (en) * 2015-01-27 2015-05-13 苏州阿特斯阳光电力科技有限公司 A kind of electrode structure at right side of solar cell
JP2016211977A (en) * 2015-05-11 2016-12-15 三菱電機株式会社 Semiconductor chip test device and test method
CN205792459U (en) * 2016-05-26 2016-12-07 苏州协鑫集成科技工业应用研究院有限公司 For testing the IV tester of heterojunction solar battery
CN107768454A (en) * 2017-09-18 2018-03-06 成都晔凡科技有限公司 Cell piece and its method of testing for imbrication component
CN207490864U (en) * 2017-10-31 2018-06-12 泰州隆基乐叶光伏科技有限公司 The testboard of testing two-sided zero main grid/more main grids solar battery efficiency
CN108133898A (en) * 2017-12-19 2018-06-08 泰州隆基乐叶光伏科技有限公司 A kind of solar cell electric performance testing device
CN208572033U (en) * 2018-07-25 2019-03-01 隆基绿能科技股份有限公司 Lamination solar cell test device
CN210223953U (en) * 2019-09-19 2020-03-31 天合光能股份有限公司 Photovoltaic laminated tile battery IV testing arrangement

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN116559692A (en) * 2023-05-12 2023-08-08 天合光能股份有限公司 Battery testing device and battery testing rapid positioning method

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