WO2019178931A1

WO2019178931A1 - Method and system for testing battery pieces of shingled assembly

Info

Publication number: WO2019178931A1
Application number: PCT/CN2018/087533
Authority: WO
Inventors: 尹丙伟; 李晨; 孙俊; 张峥嵘; 周福深
Original assignee: 成都晔凡科技有限公司
Priority date: 2018-03-23
Filing date: 2018-05-18
Publication date: 2019-09-26
Also published as: CN110299296A

Abstract

The present invention relates to a method and a system for testing battery pieces of a shingled assembly. The battery pieces have a front surface and a back surface opposite the front surface, a plurality of front surface busbars extending parallel to each other being formed on the front surface, and a plurality of back surface busbars extending parallel to each other being formed on the back surface. The method according to the present invention comprises the following steps: providing an adjustable upper test device comprising an adjustable number of upper probe rows; providing an adjustable lower test device comprising an adjustable number of lower probe rows; and electrically connecting the adjustable upper test device and the adjustable lower test device to test equipment for testing, selecting, according to the tested battery pieces of the shingled assembly, the number of probe rows of the adjustable upper test device and the number of probe rows of the adjustable lower test device, so that the adjustable upper test device is located on the front surface, is in contact with the front surface busbars and is turned on, and the adjustable lower test device is located on the back surface, is in contact with the back surface busbars and a back surface field and is turned on.

Description

Method and system for testing a cell for a tile assembly

Technical field

The present invention relates to the field of photovoltaic cell technology, and in particular to a method and system for testing a cell sheet for a tile assembly.

Background technique

With the rapid development of global technology and economy, various countries are actively developing low-carbon economy and developing and utilizing various clean energy sources. Solar power generation has no carbon dioxide emission and a small environmental burden, so it is one of the most developed and promising clean energy sources, and photovoltaic power generation is the best way to use solar energy. Photovoltaic cells, also known as solar cells, are devices that convert light energy into electrical energy using the photoelectric effect. They are usually composed of a plurality of cells made of crystalline silicon, wherein the cell is based on the photovoltaic effect of the self-semiconductor PN junction. Ability to convert solar energy into electrical energy.

Since the cost of manufacturing solar cells was higher than the cost of conventional thermal power, this has become a bottleneck restricting the development of the photovoltaic industry. In order to reduce the photovoltaic cost of photovoltaic power generation, increasing the power of solar cells is one of the most effective methods. At present, the shingle assembly technology can connect the solar cells more closely to each other in a shingled manner, thereby minimizing the gap between the solar cells, thereby stacking more solar cells in the same unit area. At the same time, no solder ribbon connection is required, which reduces the series resistance between the solar cell modules, thereby increasing the power of the solar cell module while also eliminating the cost of the solder ribbon.

Due to the requirements of the fabrication process of the tile assembly, the graphic design of the main grid line on the cell for the tile assembly is more complicated than that of the conventional solar cell, and some complicated designs, especially when the two main gate lines are closely adjacent At the time of testing the electrical performance of the battery sheet, it was very difficult to test.

There is therefore an urgent need for an improved method and system for testing a cell for a tile assembly.

Summary of the invention

The present invention is directed to the above problems in the prior art, and provides a method and system for testing a battery sheet for a tile assembly, which can utilize the existing tooling of the production line, and is flexible according to the specific design of the main grid line of the battery sheet. Adjusting to achieve effective and stable testing of the cell for the tile assembly, such as cell sheet relative conversion efficiency test and electroluminescence (EL) screening test, thereby effectively ensuring the cell sheet when fabricating the tile assembly Stable and reliable, thereby reducing waste and reducing costs.

In order to achieve the above object, according to the present invention, there is provided a method of testing a battery sheet for a tile assembly having a front surface and a back surface opposite to the front surface, and a plurality of strips extending in parallel with each other are formed on the front surface The front main gate line is formed with a plurality of back main gate lines extending in parallel with each other on the back surface. In particular, the method according to the invention comprises the steps of: providing an adjustable upper test device comprising an adjustable number of upper probe rows; providing an adjustable lower test device comprising an adjustable number of lower probe rows or test plates The electrically adjustable test device and the adjustable lower test device are electrically connected to the test device for testing; wherein, according to the test piece of the tile assembly, the number of probe rows of the test device can be adjusted and the test can be adjusted. The number of probe rows or the test board of the device such that the adjustable upper test device is in contact with the front and front main gate lines and is turned on, and the adjustable lower test device is placed in contact with and electrically connected to the back and back main gate lines and the back electric field .

According to a preferred embodiment of the present invention, according to the design of the front main gate line and the back main gate line of the cell sheet of the tested shingle assembly, in consideration of balancing the two sides of the battery sheet to be firmly fixed, Set some or all of the upper probe rows as a double probe row or set some or all of the lower probe rows as a double probe row, but the upper probe row and the lower probe row may also be partially or completely simultaneously Set to double probe row.

In accordance with a preferred embodiment of the present invention, the two front main gate lines adjacent to each other of the plurality of front main gate lines are simultaneously brought into contact with and turned on by the dual probe row of the adjustable test device.

In accordance with a preferred embodiment of the present invention, one of the plurality of back main gate lines and the back electric field are simultaneously brought into contact with and conducted by the dual probe row of the adjustable lower test apparatus.

According to a preferred embodiment of the invention, the pair of probes in the double probe row of the adjustable test device are arranged in both the lateral direction of the dual probe row of the adjustable test device and the adjustable test device The double probe rows are staggered in the longitudinal direction. Additionally or alternatively, the pair of probes in the dual probe row of the adjustable test device are arranged to partially overlap in the longitudinal direction of the dual probe row of the adjustable test device, on the adjustable test device The probe rows are staggered in the lateral direction.

According to a preferred embodiment of the invention, the pair of probes in the double probe row of the adjustable test device are arranged in both the lateral direction of the dual probe row of the adjustable test device and the adjustable test device The double probe rows are staggered in the longitudinal direction. Additionally or alternatively, the pair of probes in the dual probe row of the adjustable test device are arranged to partially overlap in the longitudinal direction of the dual probe row of the adjustable test device, and the pair of test devices are adjustable The probe rows are staggered in the lateral direction.

According to a preferred embodiment of the invention, the adjustable lower test device is arranged as a plate test device. Preferably, the plate-shaped test device is provided as a single rectangular plate or a plurality of strip plates. In particular, the plate-shaped test device was set as a gold-plated copper plate.

According to a preferred embodiment of the invention, the cell is subjected to an efficiency test and an electroluminescence screening test.

In another aspect, according to the present invention, there is provided a system for testing a battery panel for a tile assembly having a front side and a back side opposite the front side, and a plurality of front main grids extending parallel to each other are formed on the front side a line having a plurality of back main gate lines extending parallel to each other on the back side, the system comprising: an adjustable upper test device including an adjustable number of upper probe rows; and an adjustable lower test device including a quantity a lower probe row or test board; wherein the adjustable upper test device and the adjustable lower test device are electrically connected to the test device, wherein the test device is adjustable according to the battery piece of the tested tile assembly The number of probe rows and the number of probe rows or test boards of the test device are adjusted so that the adjustable upper test device is in contact with the front and front main grid lines and is turned on, and the adjustable lower test device is located on the back and back. The gate line is in contact with and electrically connected to the back electric field.

According to a preferred embodiment of the present invention, according to the design of the front main gate line and the back main gate line of the cell sheet of the tested shingle assembly, in consideration of balancing the two sides of the battery sheet to be firmly fixed, The upper probe row is partially or entirely a double probe row or a whole of the dual probe row, but the upper probe row and the lower probe row may also be partially or fully double probe rows at the same time. . .

In accordance with a preferred embodiment of the present invention, the dual probe row of the adjustable test device is simultaneously in contact and conductive with the two front main gate lines adjacent to each other of the plurality of front main gate lines.

In accordance with a preferred embodiment of the present invention, the dual probe row of the adjustable lower test device is in simultaneous contact and conduction with one of the plurality of back main gate lines and the back electric field.

According to a preferred embodiment of the invention, the pair of probes in the double probe row of the adjustable test device are arranged both in the lateral direction of the dual probe row of the adjustable test device and on the adjustable test device The double probe rows are staggered in the longitudinal direction. Additionally or alternatively, the pairs of probes in the dual probe row of the adjustable test device are arranged to partially overlap in the longitudinal direction of the dual probe row of the adjustable test device, and the dual probe of the test device is adjustable The needle rows are staggered in the lateral direction.

According to a preferred embodiment of the invention, the pair of probes in the dual probe row of the adjustable test device are arranged in both the lateral direction of the dual probe row of the adjustable test device and the test device under adjustable conditions The double probe rows are staggered in the longitudinal direction. Additionally or alternatively, the pairs of probes in the dual probe row of the adjustable test device are arranged to partially overlap in the longitudinal direction of the dual probe row of the adjustable test device, and the dual probe of the test device under adjustable conditions The needle rows are staggered in the lateral direction.

According to a preferred embodiment of the invention, the adjustable lower test device is a plate test device. Preferably, the plate-shaped test device is a single rectangular plate or a plurality of strip plates. In particular, the plate-shaped test device is a gold-plated copper plate.

DRAWINGS

1 is a front elevational view showing an example of a battery sheet for a shingle assembly in the prior art;

Figure 2 is a schematic rear view of the battery sheet of Figure 1;

3 is a front elevational view showing another example of a battery sheet for a tile assembly in the prior art;

Figure 4 is a schematic rear view of the battery sheet of Figure 3;

Figure 5 is a top cross-sectional view of the position A-A of Figure 1 when the cell of Figures 1 and 2 is tested using a preferred embodiment of the method for testing a cell sheet for a tile assembly in accordance with the present invention;

Figure 6 is a side cross-sectional view of the position B-B of Figure 1 when the cell of Figures 1 and 2 is tested using a preferred embodiment of the method for testing a cell sheet for a tile assembly in accordance with the present invention;

Figure 7 is a side cross-sectional view showing the cell sheet of Figures 1 and 2 when tested using another preferred embodiment of the method for testing a cell sheet for a tile assembly in accordance with the present invention;

Figure 8 is a top cross-sectional view showing a further preferred embodiment of a method for testing a cell for use in a tile assembly in accordance with the present invention;

Figure 9 is a bottom plan view of a preferred arrangement of double probe rows in the method according to the invention;

Figure 10 is a bottom plan view of another preferred arrangement of double probe rows in the method according to the invention.

In the drawings: 1 is a front main gate line; 2 is a back main gate line; 3 is a battery sheet; 4 is an upper probe row; 6 is a lower probe row; 5 and 7 are probes; 8 is a back electric field; 9 is a plate test device; 10 is an adjustable upper test device; 20 is an adjustable lower test device.

detailed description

Hereinafter, a method and system for testing a battery sheet for a tile assembly of the present invention will be described in detail with reference to the accompanying drawings. The invention is described in terms of a preferred embodiment of the invention, and other ways in which the invention can be practiced on the basis of the preferred embodiments are also contemplated.

The orientation terms appearing in the following detailed description, such as "upper", "lower", "left", "right", etc., refer to the orientations in the particular figures.

Referring to Figures 1, 2, 3 and 4, the prior art battery sheet 3 for the tile assembly is generally rectangular prior to cutting, having a front side and a back side opposite the front side.

Specifically, in FIG. 1, the shape of the battery sheet 3 is substantially square, and the plurality of front main gate lines 1 each extend in a direction parallel to a set of parallel sides of the battery sheet 3, which is shown in the figure as Longitudinal direction. It can also be seen from FIG. 1 that there are a plurality of front surface fine gate lines intersecting the front main gate line 1 on the front surface of the battery chip 3, and the front side fine gate lines are mainly used for collecting the current generated by the battery sheet 3 and passing through the front main grid. Line 1 is delivered to the outside of the battery for use. In FIG. 1, the front fine gate line and the front main gate line are substantially perpendicularly intersected, but this is only for convenience of illustration, and the front surface fine gate line on the cell may also intersect the front main gate line at other angles, for example, at 45 degrees. Tilt intersect. As shown in FIG. 1, the plurality of front main gate lines 1 are located at non-edge positions of the cell sheet 3, and two of the front main gate lines 1 (left side in FIG. 1) are adjacent to each other.

2 shows the back surface of the battery sheet 3 of FIG. 1, in which a plurality of back main gate lines 2 extend in parallel with each other in the longitudinal direction, and the position of the back main gate line 2 corresponds to the position of the front main gate line 1. And a back electric field 8 is provided between the adjacent two rear main gate lines 2 at a position immediately adjacent to the back main gate line 2. The main material of the front main gate line, the front side fine gate line and the back main gate line is generally silver, and the main material of the back electric field 8 is generally aluminum.

3 is a front elevational view showing another example of a prior art battery sheet for a tile assembly, the main difference from FIG. 1 being the arrangement of the front main gate lines 1: a plurality of front main gate lines 1 The outermost two front main gate lines 1 are located at the edge positions of the battery sheets 3, and the front main gate lines 1 are not adjacent to each other.

4 shows the back surface of the battery sheet 3 of FIG. 3, and the back surface of the battery sheet 3 has a plurality of back main gate lines 2 extending in parallel with each other in the longitudinal direction, and the front main gate line 2 is located at the front main gate line 1 Corresponding to the position, and having a back electric field 8 at a position immediately adjacent to the back main gate line 2, wherein the outermost two rear main gate lines 2 are not located at the edge position of the cell sheet 3, and there are two positions to the left in the figure. The back main gate lines 2 are closely adjacent. The main material of the front main gate line, the front side fine gate line and the back main gate line is generally silver, and the main material of the back electric field 8 is generally aluminum.

Hereinafter, how to test the battery sheet 3 shown in Figs. 1, 2, 3, and 4 as an example using the method for testing a battery sheet for a tile assembly according to the present invention will be described in detail.

Referring to FIG. 5, which is a position along the line AA of FIG. 1 when testing the battery sheets of FIGS. 1 and 2 in a preferred embodiment of the method for testing a battery sheet for a tile assembly according to the present invention. A top cross-sectional view taken at the position of the main grid line 1). The upper main grid line 1 is located above the battery sheet 3, the back main gate line 2 is located below the battery sheet 3, and the adjustable upper test device 10 is located on the uppermost side in contact with the front main gate line 1 and is turned on. The lowermost side is in contact with and electrically connected to the back main gate line 2, and is an adjustable lower test device 20, and the adjustable upper test device 10 and the adjustable lower test device 20 are electrically connected to the conventionally used test equipment to the battery sheet 3. Perform other tests such as conversion efficiency testing and electroluminescence screening tests. In the preferred embodiment shown in FIG. 5, the adjustable upper test device 10 includes an adjustable number of upper probe rows, in particular a plurality of upper probe rows 4 having a plurality of probes 5, the test device 20 being adjustable Including a number of lower probe rows, in particular a plurality of lower probe rows 6 having a plurality of probes 7, the upper probe row 4 and/or the lower probe row 6 being partially or completely arranged as a double probe row .

This is now further illustrated by a cross-sectional view in another direction. 6 is a cross-sectional view taken along line B-B of FIG. 1 when the cell sheets of FIGS. 1 and 2 are tested using a preferred embodiment of a method for testing a cell sheet for a tile assembly in accordance with the present invention. As can be seen from the figure, at the front of the cell sheet 3, the probe 5 of the upper probe row 4 of the test device 10 is brought into contact with and turned on by the front main gate line 1 during the test. For the front and right front main grid lines 1, the upper probe row 4 used is the same as in the prior art, i.e., a single probe row is used. For the two adjacent front main gate lines 1 (left side in Fig. 6), the upper probe row 4 used according to the invention is a double probe row, i.e., not only one row of probes is arranged in the probe row. 5, but two rows of probes 5 are arranged at the same time, whereby two front main gate lines 1 adjacent to each other among the plurality of front main gate lines can be simultaneously contacted and conducted by only one double probe row 4. On the back side of the battery chip 3, the lower probe row 6 of the adjustable lower test device 20 is in contact with and electrically connected to the rear main gate line 2 and the back electric field 8 at a position substantially corresponding to the probe 5, in which case, In the present invention, the lower probe row 6 used is a double probe row, one of the two probes being in contact with the back main gate line 2 and the other with the back electric field 8 and conducting. Thereby, even for a complicated design in which the battery sheet includes closely adjacent main gate lines, the performance test of the battery sheet can be simply performed, and the stress on the front and back sides of the battery sheet is relatively uniform and the force point corresponds, There is a moment in which the battery sheet is deformed, and the battery piece to be tested is less likely to be undesirably caused by cracks and fragments.

Of course, it is conceivable that the probes can also be arranged on the cell in other ways to achieve the same purpose. For example, FIG. 7 illustrates testing of the battery sheets of FIGS. 1 and 2 using another preferred embodiment of a method for testing a battery sheet for a tile assembly in accordance with the present invention, although the battery to be tested The design of the front main gate line 1 and the back main gate line 2 of the sheet 3 was unchanged, but different probe arrangements were used for testing. Specifically, two lower probe rows 6 of the outermost edges of the left and right sides of the test device 20 are disposed at the edge position of the battery sheet to be in contact with and electrically connected to the rear main gate line 2 at the corresponding position, and The two lower probe rows 6 at the edge locations are single row probes. For the middle portion of the back side of the battery sheet 3, similarly to Fig. 6, the lower probe row 6 of the adjustable lower test device 20 used is a double probe row, one of the two probes and the back main gate line 2 The other is in contact with the back electric field 8 and is turned on. This arrangement increases the support of the edge of the battery sheet, avoids uneven force on the battery sheet, and the test battery sheet is less prone to undesired situations such as cracking and fragmentation.

For the design of the front main gate line 1 and the back main gate line 2 of the battery sheets shown in FIGS. 3 and 4, in order to test them, it is conceivable to adjust the outermost edges of the left and right sides of the test device 10 The upper probe row 4 is disposed at an edge position of the battery sheet to be in contact with and electrically connected to the front main gate line 1 at the corresponding position, and the two upper probe rows 4 at the edge position are single row probes. For the middle portion of the front side of the cell sheet 3, similarly to Figure 6, the upper probe row 4 of the adjustable test device 10 is also a single row of probes. For the back side of the cell sheet 3, the same arrangement as the arrangement of the lower probe row 6 of the adjustable lower test device 20 shown in Fig. 6 can be considered, that is, all double probe rows are used, but the leftmost double probe In the row, the two probes are respectively in contact with and open to the adjacent two back main gate lines 2, and are not in contact with the back electric field 8.

Therefore, when the battery chip is tested using the method according to the present invention, the upper probe row 4 may be partially or completely set to a double probe according to different designs of the front main gate line, the rear main gate line, and the like of the battery sheet. The rows and/or the lower probe row 6 are arranged in part or in whole as a double probe row.

Preferably, other forms of adjustable down test devices may be employed in place of the lower probe row 6 and probe 7 as described above. Figure 8 is a top cross-sectional view taken along line AA of Figure 1 when tested in accordance with yet another preferred embodiment of the method for testing a cell sheet for a tile assembly in accordance with the present invention, in this preferred embodiment, adjustable The test device 20 is a plate-shaped test device 9, and since it has a large contact area, the contact pressure applied to the back surface of the battery sheet during the test is greatly reduced, thereby protecting the battery sheet from cracking and fragmentation. It is conceivable that the plate-shaped test device 9 may be a single rectangular plate member corresponding to the shape and size of the battery sheet, or may be a plurality of strip-shaped plate members or other shaped plate members as long as there is sufficient contact. The area is fine. According to a preferred embodiment of the invention, the plate-shaped test device 9 may be a gold-plated copper plate.

Figures 9 and 10 show bottom views of a preferred arrangement of the dual probe row of the present invention, respectively. Referring to Fig. 9, the pair of probes in the double probe row are arranged to be staggered both in the lateral direction of the double probe row and in the longitudinal direction of the double probe row, so that the probes integrally form a wave shape. Referring to Figure 10, the pair of probes in the double probe row are arranged to partially overlap in the longitudinal direction of the double probe row and to be staggered in the lateral direction of the double probe row. However, those skilled in the art will readily appreciate that the arrangement of the probes in the dual probe row can be adjusted as needed to achieve the best conductive contact and robust support based on the particular design of the main grid lines on the surface of the cell.

With the test method described above, it is possible to effectively perform other tests such as conversion efficiency test and EL screening test on the battery sheets for the tile assembly in a simple manner, thereby reducing waste of the battery sheets.

In order to test a cell for a tile assembly, in accordance with the present invention, a system for testing a cell for a tile assembly is presented. As described above, referring to Figs. 1-4, the battery sheet 3 has a front surface and a back surface opposite to the front surface, and a plurality of front main gate lines 1 extending in parallel with each other are formed on the front surface, and a plurality of strips extending in parallel with each other are formed on the back surface. Back main gate line 2.

Referring to FIG. 5, a system for testing a battery sheet for a tile assembly according to the present invention includes: an adjustable upper test device 10, which is in contact with and electrically connected to the front main gate line 1 on the front side of the battery chip 3; The test apparatus 20 is in contact with and electrically connected to the back main gate line 2 and the back electric field 8 on the back surface of the battery chip 3. Both the adjustable upper test device 10 and the adjustable lower test device 20 are electrically connected to conventionally used test equipment to perform other tests such as conversion efficiency test and electroluminescence screening test on the battery chip 3. In particular, the adjustable upper test device 10 can comprise a plurality of upper probe rows 4, which can be arranged partially or completely as a double probe row.

Referring to Figure 6, for the front main grid line 1 in the middle and on the right side of the cell, the upper probe row 4 used is the same as in the prior art, i.e., a single probe row is used. For the two adjacent front main gate lines 1 (left side in Fig. 6), the upper probe row 4 used according to the invention is a double probe row, i.e., not only one row of probes is arranged in the probe row. 5, but two rows of probes 5 are arranged at the same time, whereby two front main gate lines 1 adjacent to each other among the plurality of front main gate lines can be simultaneously contacted and conducted by only one double probe row 4. On the back side of the battery chip 3, the probe 7 of the adjustable test device 20 is in contact with and electrically connected to the back main gate line 2 and the back electric field 8 at a position substantially corresponding to the probe 5, in which case, according to the present invention The lower probe row 6 used is a double probe row, one of the two probes being in contact with the back main gate line 2 and the other with the back electric field 8 and conducting.

In the system according to the invention, the probes on the adjustable upper test device 10 and the adjustable lower test device 20 can also be arranged in other ways to achieve the same purpose. For example, Figure 7 shows another arrangement of the probes when testing the cell sheets of Figures 1 and 2, wherein the placement of the lower probe row 6 of the adjustable lower test device is different. Specifically, two lower probe rows 6 near the left and right sides are disposed at the edge position of the battery sheet to be in contact with and electrically connected to the rear main gate line 2 at the corresponding position, and two down probes at the edge position The needle row 6 is a single row of probes. For the middle portion of the battery chip 3, as in Fig. 6, the lower probe row 6 used is a double probe row, one of the two probes is in contact with the back main gate line 2, the other is in contact with the back electric field 8, and is turned on. .

In the system according to the present invention, the design of the front main gate line 1 and the back main gate line 2 of the battery sheets shown in FIGS. 3 and 4, in order to test them, will be adjusted to the left and right of the test device 10. The two upper probe rows 4 on the outermost edge of the side are disposed at the edge position of the battery sheet to be in contact with and electrically connected to the front main gate line 1 at the corresponding position, and the two upper probe rows 4 at the edge position are single Row of probes. For the middle portion of the front side of the cell sheet 3, similarly to Figure 6, the upper probe row 4 of the adjustable test device 10 is also a single row of probes. For the back side of the cell sheet 3, the same arrangement as the arrangement of the lower probe row 6 of the adjustable lower test device 20 shown in Fig. 6 can be considered, that is, all double probe rows are used, but the leftmost double probe In the row, the two probes are respectively in contact with and open to the adjacent two back main gate lines 2, and are not in contact with the back electric field 8.

Therefore, in the system according to the present invention, the upper probe row 4 may be partially or completely set as a double probe row and/or according to different designs of the front main gate line, the rear main gate line, and the like of the battery sheet. The probe row 6 is described as being partially or completely arranged as a double probe row.

Preferably, other forms of adjustable down test devices may be employed in place of the lower probe row 6 and probe 7 as described above. Figure 8 shows a further preferred embodiment of the system according to the invention, wherein the adjustable lower test device 20 is a plate-like test device 9 which, due to its large contact area, applies contact to the back of the cell during testing. The pressure is greatly reduced, thus protecting the battery from cracking and fragmentation. It is conceivable that the plate-shaped test device 9 may be a single rectangular plate member corresponding to the shape and size of the battery sheet, or may be a plurality of strip-shaped plate members or other shaped plate members as long as there is sufficient contact. The area is fine. According to a preferred embodiment of the invention, the plate-shaped test device 9 may be a gold-plated copper plate.

Figures 9 and 10 respectively show bottom views of a preferred arrangement of dual probe rows in the system of the present invention. Referring to Fig. 9, the pair of probes in the double probe row are arranged to be staggered both in the lateral direction of the double probe row and in the longitudinal direction of the double probe row, so that the probes integrally form a wave shape. Referring to Figure 10, the pair of probes in the double probe row are arranged to partially overlap in the longitudinal direction of the double probe row and to be staggered in the lateral direction of the double probe row. However, those skilled in the art will readily appreciate that the arrangement of the probes in the dual probe row can be adjusted as needed to achieve the best conductive contact and robust support based on the particular design of the main grid lines on the surface of the cell.

It should be noted that in the preferred embodiment of the invention as described above, the number and arrangement of the front main gate lines, the back main gate lines, the probe rows and the probes are merely exemplary, and the scope of protection of the present invention is There is no limit, and any other number can be adopted depending on the specific situation.

The scope of the invention is defined only by the claims. Those skilled in the art will readily appreciate that alternative configurations of the disclosed structures can be considered as possible alternative embodiments, and that the disclosed embodiments can be combined to produce new embodiments. They also fall within the scope of the appended claims.

Claims

A method of testing a battery sheet for a tile assembly having a front surface and a back surface opposite to the front surface, wherein the front surface is formed with a plurality of front main gate lines extending in parallel with each other, The back surface is formed with a plurality of back main gate lines extending in parallel with each other, and the test method includes the following steps:

Providing an adjustable upper test device, the adjustable upper test device comprising an adjustable number of upper probe rows;

Providing an adjustable lower test device comprising an adjustable number of lower probe rows or test plates;

Electrically connecting the adjustable upper test device and the adjustable lower test device to a test device for testing;

Characterizing that the number of probe rows of the adjustable upper test device and the number of probe rows or test plates of the adjustable lower test device are selected according to the battery piece of the tested tile assembly, thereby enabling the adjustable An upper test device is located in the front surface in contact with the front main gate line and is turned on, and the adjustable lower test device is placed on the back surface in contact with the back main gate line and the back electric field and is turned on.
The method of claim 1 wherein the upper probe row is partially or fully disposed as a dual probe row and/or the lower probe row is partially or fully disposed as a dual probe row .
The method according to claim 2, wherein two front main gate lines adjacent to each other of said plurality of front main gate lines are simultaneously brought into contact with and turned on by said double probe row of said adjustable upper test device And/or causing one of the plurality of back main gate lines and the back electric field to simultaneously contact and conduct with the double probe row of the adjustable lower test device.
Method according to claim 2 or 3, wherein the pair of probes in the double probe row of the adjustable upper test device are arranged in both double probe rows of the adjustable upper test device In the transverse direction, it is again offset in the longitudinal direction of the double probe row of the adjustable upper test device.
Method according to claim 2 or 3, wherein the pair of probes in the double probe row of said adjustable upper test device are arranged in the longitudinal direction of the double probe row of said adjustable upper test device The directions partially overlap and are staggered in the lateral direction of the double probe row of the adjustable test device.
Method according to claim 2 or 3, wherein the pair of probes in the double probe row of the adjustable down test device are arranged in both double probe rows of the adjustable lower test device In the transverse direction, it is again offset in the longitudinal direction of the double probe row of the adjustable lower test device.
Method according to claim 2 or 3, wherein the pair of probes in the double probe row of the adjustable lower test device are arranged in the longitudinal direction of the double probe row of the adjustable lower test device The directions partially overlap and are staggered in the lateral direction of the double probe row of the adjustable test device.
The method according to claim 1, wherein the plate-shaped test device is provided as a single rectangular plate or a plurality of strip-shaped plates.
The method according to claim 8, wherein the plate-shaped test device is provided as a gold-plated copper plate.
The method according to any one of claims 1 to 3, characterized in that the cell sheet is subjected to an efficiency test and an electroluminescence screening test.
A system for testing a battery panel for a tile assembly having a front surface and a back surface opposite the front surface, the front surface being formed with a plurality of front main gate lines extending parallel to each other, The back surface is formed with a plurality of back main gate lines extending in parallel with each other, and the system includes:

Adjusting the test device, the adjustable upper test device comprising an adjustable number of upper probe rows;

Adjusting the test device, the adjustable lower test device comprising an adjustable number of lower probe rows or test plates;

Wherein the adjustable upper test device and the adjustable lower test device are electrically connected to the test device,

Characterizing that the number of probe rows of the adjustable upper test device and the number of probe rows or test plates of the adjustable lower test device are selected according to the battery piece of the tested tile assembly, thereby enabling the adjustable An upper test device is located in the front surface in contact with the front main gate line and is turned on, and the adjustable lower test device is placed on the back surface in contact with the back main gate line and the back electric field and is turned on.
The system of claim 11 wherein said upper probe row is partially or wholly a dual probe row and/or said lower probe row is partially or wholly a dual probe row.
The system according to claim 12, wherein the double probe row of the adjustable upper test device is in contact with and electrically connected to two front main gate lines adjacent to each other among the plurality of front main gate lines; And/or the double probe row of the adjustable lower test device is in simultaneous contact with and conductive with one of the plurality of back main gate lines and the back electric field.
A system according to claim 12 or claim 13 wherein the pair of probes in the dual probe row of the adjustable upper test device are arranged in a lateral direction of the dual probe row of the adjustable upper test device The direction is again offset in the longitudinal direction of the double probe row of the adjustable upper test device.
A system according to claim 12 or claim 13 wherein the pair of probes in the dual probe row of the adjustable upper test device are arranged in the longitudinal direction of the double probe row of the adjustable upper test device The upper portions overlap and are staggered in the lateral direction of the double probe row of the adjustable test device.
A system according to claim 12 or claim 13 wherein the pair of probes in the dual probe row of said adjustable lower test device are arranged in a lateral direction of both double probe rows of said adjustable lower test device The direction is again offset in the longitudinal direction of the double probe row of the adjustable lower test device.
A system according to claim 12 or claim 13 wherein the pair of probes in the double probe row of said adjustable lower test device are arranged in the longitudinal direction of the double probe row of said adjustable lower test device The upper portions overlap and are staggered in the lateral direction of the double probe row of the adjustable test device.
The system of claim 11 wherein said plate-shaped test device is a single rectangular plate or a plurality of strip plates.
The system of claim 18 wherein said plate shaped test device is a gold plated copper plate.