CN112289698A - Calibration method of sliced battery standard slice - Google Patents
Calibration method of sliced battery standard slice Download PDFInfo
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- CN112289698A CN112289698A CN202011171783.1A CN202011171783A CN112289698A CN 112289698 A CN112289698 A CN 112289698A CN 202011171783 A CN202011171783 A CN 202011171783A CN 112289698 A CN112289698 A CN 112289698A
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- 238000000034 method Methods 0.000 title claims abstract description 23
- 238000012360 testing method Methods 0.000 claims abstract description 55
- 239000000523 sample Substances 0.000 claims abstract description 45
- 230000004044 response Effects 0.000 claims description 6
- 230000003595 spectral effect Effects 0.000 claims description 6
- 238000001228 spectrum Methods 0.000 claims description 6
- 238000006243 chemical reaction Methods 0.000 claims description 4
- 239000003292 glue Substances 0.000 claims description 3
- 238000004519 manufacturing process Methods 0.000 abstract description 5
- 229910021419 crystalline silicon Inorganic materials 0.000 abstract description 4
- 238000002360 preparation method Methods 0.000 abstract description 3
- 230000007246 mechanism Effects 0.000 abstract description 2
- 230000008569 process Effects 0.000 description 4
- 238000010586 diagram Methods 0.000 description 3
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 description 2
- 229910052710 silicon Inorganic materials 0.000 description 2
- 239000010703 silicon Substances 0.000 description 2
- 238000007792 addition Methods 0.000 description 1
- 238000003698 laser cutting Methods 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 238000002161 passivation Methods 0.000 description 1
- 230000009467 reduction Effects 0.000 description 1
- 239000002699 waste material Substances 0.000 description 1
- 238000003466 welding Methods 0.000 description 1
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L22/00—Testing or measuring during manufacture or treatment; Reliability measurements, i.e. testing of parts without further processing to modify the parts as such; Structural arrangements therefor
- H01L22/10—Measuring as part of the manufacturing process
- H01L22/14—Measuring as part of the manufacturing process for electrical parameters, e.g. resistance, deep-levels, CV, diffusions by electrical means
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/67005—Apparatus not specifically provided for elsewhere
- H01L21/67242—Apparatus for monitoring, sorting or marking
- H01L21/67271—Sorting devices
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L22/00—Testing or measuring during manufacture or treatment; Reliability measurements, i.e. testing of parts without further processing to modify the parts as such; Structural arrangements therefor
- H01L22/20—Sequence of activities consisting of a plurality of measurements, corrections, marking or sorting steps
Abstract
The invention belongs to the technical field of crystalline silicon solar cells, and relates to a calibration method of a sliced cell standard chipmeaAccording to the short-circuit current data I of the standard wafer provided by the third-party laboratoryrefObtaining a current correction factor
Subsequent calibration of sliced cell I with QE tester1Let I2＝α*I1By use of I2Recalibrating the laboratory IV tester, measuring the slice battery to be calibrated, adjusting the position of the voltage probe on the probe row during testing, removing the voltage and current probes exceeding the area region of the slice battery to be tested, and adjusting the relative position of the voltage probe in contact with the slice to be tested to ensure that the voltage probe is opposite to the slice to be testedThe position is consistent with the relative position of the voltage probe and the whole piece of the label before adjustment. The invention can keep the test standard in the same mechanism stable and accurate, and the production ratio of the sliced battery preparation assembly is consistent with the original standard.
Description
Technical Field
The invention belongs to the technical field of crystalline silicon solar cells, and relates to a calibration method of a sliced cell standard sheet.
Background
The filling factor of the crystalline silicon solar cell prepared by the prior art is obviously reduced after the crystalline silicon solar cell is cut into halves by laser, so that the photoelectric conversion efficiency is reduced, and taking TOPCon cell as an example, the efficiency of the half-cut cell by laser is reduced by about 0.2-0.3% abs. Recently, some enterprises use a larger-sized silicon wafer as a solar cell, for example, a 210mm × 210mm silicon wafer, when a module is manufactured, the solar cell is cut into three by using laser, so that the efficiency of a solar cell with two sides being laser cutting surfaces is reduced more, and the series welding mismatch of the solar cell is caused. Similarly, the laminated module requires that a solar cell is cut into multiple parts, and the efficiency reduction of the cell is more remarkable. And because the passivation inside the solar cell is uneven due to the influence of the manufacturing process, the electrical performance of the laser-sliced piece is different from that of the original whole piece, and the electrical mismatch in the component preparation process needs to be reduced by sorting after slicing, however, because the relative positions of the voltage probes arranged on the probe row used by the testing machine are different for the half piece and the whole piece of the solar cell, if the whole piece of the solar cell is spliced by using a dummy piece and a sliced piece of the solar cell and tested by using the original testing machine, the testing reference of the filling factor FF of the whole piece of the solar cell and the half piece of the solar cell can be different, so that the testing accuracy and the component production ratio are influenced. As shown in fig. 1, 10 batteries were selected, the relative positions of the voltage probe and the battery were changed, and the fill factor was tested, and since the relative positions of the voltage probe and the battery were different, the fill factor difference was up to 0.8%.
Disclosure of Invention
The invention aims to solve the problems and provides a calibration method of a sliced battery tab.
In order to achieve the purpose, the invention adopts the following technical scheme:
a calibration method for a sliced battery tab comprises testing a first-level tab of a third-party laboratory according to a QE machine in a laboratory to obtain a short-circuit current I of the first-level tab tested by a QE testermeaAccording to the short-circuit current data I of the standard wafer provided by the third-party laboratoryrefObtaining a current correction factor
Subsequent calibration of sliced cell I with QE tester1Let I2＝α*I1By use of I2And calibrating the IV tester of the laboratory again, measuring the slice battery to be calibrated, adjusting the position of the voltage probe on the probe row during testing, removing the voltage and current probes exceeding the area region of the slice battery to be tested, and adjusting the relative position of the voltage probe contacted with the slice to be tested so that the position of the voltage probe relative to the slice to be tested is consistent with the relative position of the voltage probe and the whole slice before adjustment.
Further, the QE tester uses a large light spot to cover the whole area of the sliced battery to be tested to perform testing or uses a small light spot to scan the whole area of the battery slice in the testing process.
Further, the QE tester may add additional light intensity when testing in the long wavelength band.
Further, the slice battery to be tested is subjected to sufficient light-induced attenuation or electric attenuation.
A calibration method of a sliced battery tab comprises the following steps:
s1, testing the first-level standard plate calibrated by the third-party laboratory through the QE tester, and integrating the absolute spectral response after the test and the AM1.5g standard spectrum to obtain the short-circuit current I of the first-level standard plate tested by the QE testermea；
S2, providing short-circuit current data I of the target sheet according to the third-party laboratoryrefFor the QE tester to be corrected, the calculation formula of the correction factor is
S3，Testing the first-level standard wafer of the third-party laboratory by using a QE tester, and inputting short-circuit current data I provided by the third-party laboratoryrefCalibrating the QE tester, adjusting the light intensity of the machine table to enable the light intensity output by the machine table to enable the target to reach the calibration current, adjusting the temperature of the IV tester to be 25 +/-1 ℃ through a temperature control system of the tester, and controlling the voltage temperature coefficient of the battery to enable the tested open-circuit voltage V of the battery to be VocThe value is within +/-0.1V of the voltage given by the first-level standard plate, and the battery filling factor FF is given by a measured value of a QE tester;
s4, testing the slice battery to be calibrated after the QE tester is calibrated and adjusted, adjusting the position of a voltage probe on a probe row during testing, removing the voltage and current probes exceeding the area of the slice battery to be tested, and adjusting the relative position of the voltage probe contacting the slice battery to be tested, so that the position of the voltage probe relative to the slice battery to be tested is consistent with the relative position of the voltage probe and the whole slice battery before adjustment, and simultaneously covering the rest position of the tester with black insulating glue to avoid the influence of the reflection of the rest part of the machine table on the testing;
s5, testing the cut piece to be calibrated through the QE tester, and integrating the absolute spectral response after the test and the AM1.5g standard spectrum to obtain the short-circuit current I of the cut piece to be calibrated, which is tested by the QE tester1(ii) a Correcting the result by the correction factor alpha obtained in the step S2 to obtain the short-circuit current value I which accords with the third-party test reference2＝α*I1；
S6, use I after adjustment2And after the tester is calibrated again, testing the sliced battery to obtain the electrical parameters of short-circuit current Isc, open-circuit voltage Voc, fill factor FF and conversion Efficiency Efficiency required by the sliced battery.
Further, the QE tester uses a large light spot to cover the whole area of the sliced battery to be tested to perform testing or uses a small light spot to scan the whole area of the battery slice in the testing process.
Further, the QE tester may add additional light intensity when testing in the long wavelength band.
Further, the slice battery to be tested is subjected to sufficient light-induced attenuation or electric attenuation.
Compared with the prior art, the invention has the advantages that:
the invention considers the influence of the relative position of the voltage probe arrangement on the probe row on the cell filling factor, can accurately prepare the sliced cell label sheet which keeps the same reference with the whole cell label sheet on the same tester through a strict calibration process and a strict calibration method, and uses the sliced cell label sheet for sorting the sliced cells, thereby keeping the test reference in the same mechanism stable and accurate, keeping the production ratio of the sliced cell preparation assembly consistent with the original reference, and avoiding the waste of productivity.
Additional advantages, objects, and features of the invention will be set forth in part in the description which follows and in part will become apparent to those having ordinary skill in the art upon examination of the following or may be learned from practice of the invention.
Drawings
FIG. 1 is a schematic diagram of the fill factor difference after the relative position of the voltage probe and the cell is changed.
Fig. 2 is a schematic diagram of a full cell pin position.
Figure 3 is a schematic diagram of a half cell pin position.
Detailed Description
In order to make the technical solutions of the present invention better understood, the technical solutions in the embodiments of the present invention will be clearly and completely described below with reference to the drawings in the embodiments of the present invention.
The embodiment provides a calibration method of a sliced cell standard sheet, which is used for testing the electrical performance of a TOPCon solar cell half-cut cell, and comprises the following specific implementation steps:
testing a first-level standard plate calibrated in a third-party laboratory through a QE tester, and integrating the absolute spectral response after the test and the AM1.5g standard spectrum to obtain the short-circuit current I of the first-level standard plate tested by the QE testermea；
According to the short-circuit current data I of the standard wafer provided by the third-party laboratoryrefFor the QE tester to be corrected, the calculation formula of the correction factor is
Testing the first-level standard wafer of the third-party laboratory by using a QE tester, and inputting short-circuit current data I provided by the third-party laboratoryrefCalibrating the tester, adjusting the light intensity of the machine platform to make the output light intensity reach the calibration current of the target chip, adjusting the temperature of the tester to 25 +/-1 ℃ through the temperature control system of the tester, and controlling the voltage temperature coefficient of the battery to make the open-circuit voltage V of the tested batteryocThe numerical value is within +/-0.1V of the voltage given by the first-level standard plate, and the battery filling factor FF is given by the measured value of a field tester;
after the calibration and alignment of the tester are completed, the sliced battery to be calibrated is tested, and the position of the voltage probe on the probe row is adjusted during the test, as shown in fig. 2 and fig. 3, the voltage and current probes exceeding the area region of the sliced battery to be tested are removed, and meanwhile, the relative position of the voltage probe contacted with the sliced battery to be tested is adjusted, so that the position of the voltage probe relative to the sliced battery to be tested is consistent with the relative position of the voltage probe and the whole sliced battery before the adjustment. Meanwhile, black insulating glue is used for covering the rest position of the tester so as to avoid the influence of the reflection of the rest part of the machine table on the test;
testing the cut piece to be calibrated by a QE tester, and integrating the absolute spectral response after the test and the AM1.5g standard spectrum to obtain the short-circuit current I of the cut piece to be calibrated, which is tested by the QE tester1(ii) a Correcting the result by the correction factor obtained in the step 2 to obtain a short-circuit current value I which accords with a third-party test reference2＝α*I1
After adjustment, the sliced battery is tested to obtain the electrical parameters of short-circuit current Isc, open-circuit voltage Voc, fill factor FF and conversion Efficiency Efficiency required by the sliced battery tab.
On the basis of a traditional whole battery tab calibration method, the influence of different relative positions of voltage probes on a probe row on the fill factor FF of a whole battery tab and a sliced battery tab is considered, and the sliced battery tab which keeps the same test reference with the whole battery tab is accurately prepared on the same test machine platform through a strict calibration process and a calibration method; the sliced battery label prepared by the invention can be used for sorting sliced batteries, so that the mismatch loss of a sliced component is reduced; meanwhile, the testing standard can be kept consistent with the original whole battery piece, the testing accuracy is improved, and the assembly production ratio is kept stable.
The specific embodiments described herein are merely illustrative of the spirit of the invention. Various modifications or additions may be made to the described embodiments or alternatives may be employed by those skilled in the art without departing from the spirit of the invention.
Claims (8)
1. The calibration method of the sliced battery standard sheet is characterized in that a first-level standard sheet of a third-party laboratory is tested according to a QE machine in the laboratory to obtain a short-circuit current I of the first-level standard sheet tested by a QE testermeaAccording to the short-circuit current data I of the standard wafer provided by the third-party laboratoryrefObtaining a current correction factor
Subsequent calibration of sliced cell I with QE tester1Let I2＝α*I1By use of I2And calibrating the IV tester of the laboratory again, measuring the slice battery to be calibrated, adjusting the position of the voltage probe on the probe row during testing, removing the voltage and current probes exceeding the area region of the slice battery to be tested, and adjusting the relative position of the voltage probe contacted with the slice to be tested so that the position of the voltage probe relative to the slice to be tested is consistent with the relative position of the voltage probe and the whole slice before adjustment.
2. The calibration method of the sliced battery tab as claimed in claim 1, wherein the QE tester uses a large light spot to cover the whole area of the sliced battery to be tested for testing or uses a small light spot to scan the whole area of the sliced battery during testing.
3. The method for calibrating a sliced battery tab according to claim 1 wherein the QE tester is capable of adding extra light intensity during long-wavelength band testing.
4. The method for calibrating the sliced battery tab of claim 1, wherein the sliced battery to be tested is subjected to sufficient photo-induced attenuation or electro-induced attenuation.
5. A calibration method of a sliced battery tab is characterized by comprising the following steps:
s1, testing the first-level standard plate calibrated by the third-party laboratory through the QE tester, and integrating the absolute spectral response after the test and the AM1.5g standard spectrum to obtain the short-circuit current I of the first-level standard plate tested by the QE testermea；
S2, providing short-circuit current data I of the target sheet according to the third-party laboratoryrefFor the QE tester to be corrected, the calculation formula of the correction factor is
S3, testing the first-level standard wafer of the third-party laboratory by using the QE tester, and inputting short-circuit current data I provided by the third-party laboratoryrefCalibrating the QE tester, adjusting the light intensity of the machine table to enable the light intensity output by the machine table to enable the target to reach the calibration current, adjusting the temperature of the IV tester to be 25 +/-1 ℃ through a temperature control system of the tester, and controlling the voltage temperature coefficient of the battery to enable the tested open-circuit voltage V of the battery to be VocThe value is within +/-0.1V of the voltage given by the first-level standard plate, and the battery filling factor FF is given by a measured value of a QE tester;
s4, testing the slice battery to be calibrated after the QE tester is calibrated and adjusted, adjusting the position of a voltage probe on a probe row during testing, removing the voltage and current probes exceeding the area of the slice battery to be tested, and adjusting the relative position of the voltage probe contacting the slice battery to be tested, so that the position of the voltage probe relative to the slice battery to be tested is consistent with the relative position of the voltage probe and the whole slice battery before adjustment, and simultaneously covering the rest position of the tester with black insulating glue to avoid the influence of the reflection of the rest part of the machine table on the testing;
s5, testing the cut piece to be calibrated through the QE tester, and integrating the absolute spectral response after the test and the AM1.5g standard spectrum to obtain the short-circuit current I of the cut piece to be calibrated, which is tested by the QE tester1(ii) a Correcting the result by the correction factor alpha obtained in the step S2 to obtain the short-circuit current value I which accords with the third-party test reference2＝α*I1；
S6, use I after adjustment2And after the tester is calibrated again, testing the sliced battery to obtain the electrical parameters of short-circuit current Isc, open-circuit voltage Voc, fill factor FF and conversion Efficiency Efficiency required by the sliced battery.
6. The calibration method of the sliced battery tab as claimed in claim 5, wherein the QE tester uses a large light spot to cover the whole area of the sliced battery to be tested for testing or uses a small light spot to scan the whole area of the sliced battery during testing.
7. The method for calibrating a sliced battery tab according to claim 5, wherein the QE tester is capable of adding extra light intensity during long-wavelength band test.
8. The method for calibrating the sliced battery tab of claim 5, wherein the sliced battery to be tested is subjected to sufficient photo-induced attenuation or electro-induced attenuation.
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| CN202011171783.1A CN112289698A (en) | 2020-10-28 | 2020-10-28 | Calibration method of sliced battery standard slice |
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| CN202011171783.1A CN112289698A (en) | 2020-10-28 | 2020-10-28 | Calibration method of sliced battery standard slice |
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Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN113900057A (en) * | 2021-09-09 | 2022-01-07 | 天合光能(宿迁)光电有限公司 | Method for checking and detecting measuring equipment before and after test box replacement |
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2020
- 2020-10-28 CN CN202011171783.1A patent/CN112289698A/en active Pending
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