CN106898565A - A kind of probe tester for dereliction grid solar cell - Google Patents
A kind of probe tester for dereliction grid solar cell Download PDFInfo
- Publication number
- CN106898565A CN106898565A CN201710113247.8A CN201710113247A CN106898565A CN 106898565 A CN106898565 A CN 106898565A CN 201710113247 A CN201710113247 A CN 201710113247A CN 106898565 A CN106898565 A CN 106898565A
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- China
- Prior art keywords
- probe
- solar cell
- groups
- dereliction grid
- tester
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- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
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Classifications
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L22/00—Testing or measuring during manufacture or treatment; Reliability measurements, i.e. testing of parts without further processing to modify the parts as such; Structural arrangements therefor
- H01L22/10—Measuring as part of the manufacturing process
- H01L22/14—Measuring as part of the manufacturing process for electrical parameters, e.g. resistance, deep-levels, CV, diffusions by electrical means
Abstract
The invention discloses a kind of probe tester for dereliction grid solar cell, including probe row, the probe row includes probe framed bent and some telescopic probe groups, each telescopic probe groups includes at least one current probe and a voltage probe, and probe or conductive bar are provided with below some telescopic probe groups.The test device is using Z-type structure probe head and the design of segmented cross-coincidence or uses elastic telescopic conductive bar, so that the test of dereliction grid cell becomes more convenient and accurate, on the one hand the loose contact problem that conventional screen crimp technology is brought is reduced, the compatible stronger of test probe groups is also caused simultaneously, even if battery grid line quantity and spacing change can also be applicable, above all this design can be well compatible with conventional production line test separation system, is conducive to the Industry Promotion and production of new technology.
Description
Technical field
The invention belongs to solar cell test field, and in particular to a kind of probe for dereliction grid solar cell is surveyed
Trial assembly is put.
Background technology
In recent years, solar cell increasingly receives the concern of people as a kind of new regenerative resource,
Its status on energy industry is also more and more important.With continuing to develop with people for high-efficiency solar for heliotechnics
The continuous of battery is deeply probed into, and the structure of solar cell also has greatly changed, and is ensureing efficient while also
Consider the single watt of decline of cost, now, a kind of high performance solar batteries constituted without the full back contacts of main gate line or without main grid are bound to
The main flow of solar cell application will be turned into, this structure can not only bring the lifting of battery efficiency, while your gold can be reduced
The consumption of category, is one of important way of reduction cost for solar power generation.
Dereliction grid solar cell is front and back all battery structures without main gate line, and this battery structure is reduced
The use of noble metal so that single watt of cost of battery is reduced, simultaneously because without main grid, the shading-area of battery front side subtracts
It is few, moreover it is possible to bring the lifting of battery current, also have larger optimization space in assembly end.But this battery is due to front and back
The electric current on thin grid is all collected without main grid, traditional method of testing cannot carry out testing, sorting to it.And in photovoltaic cell
In production, the quality of battery performance directly affects the efficiency of whole photovoltaic generating system.Therefore, to solar cell photovoltaic property
Test, is just particularly important.
In this case it is necessary to provide a kind of testing scheme of energy accurate measurement dereliction grid line cell so that dereliction
The test of grid cell can be with existing producing line matched, output and yields without influenceing battery.
The content of the invention
It is an object of the invention to provide a kind of probe tester for dereliction grid solar cell, the probe test
Device can be accurately to dereliction grid cell parameters carry out accurate measurement, and can be with existing testing producing lines matched.
Above-mentioned purpose of the invention is achieved through the following technical solutions：It is a kind of for dereliction grid solar cell
Probe tester, including probe row, the probe row include probe framed bent and some telescopic probe groups, and each is scalable
Probe groups include at least one current probe and a voltage probe, be provided with spy below some telescopic probe groups
Syringe needle or conductive bar.
Wherein described dereliction grid solar cell can be N-shaped battery or p-type battery, or one side battery structure
Or double-side cell structure, wherein one side battery be front without main grid, the back side is back of the body constructed of aluminium and light tight, and double-side cell is front
With the back side with the presence of thin grid, and tow sides are without main grid.
Wherein probe tester can be entered using the probe row's pattern in existing producing line, the only concrete structure to probe row
Row is improved.
The quantity of telescopic probe groups of the present invention is preferably 5~30 groups.
As one kind of the invention preferred embodiment, it is provided with a probe below each extensible probe group of the invention
Head, the probe is shaped as Z-type structure, and having between adjacent two probe makes any one on dereliction grid solar cell piece
The lap that the thin grid of root can be in contact with the probe.
So design, can make have coincidence between probe and front and rear adjacent probe in actual test, it is ensured that electricity
Any one thin grid can be contacted with probe on the piece of pond.
The length of Z-type structure probe head is preferably 3~30mm, and width is preferably 2~10mm.
Z-type structure probe head is preferably blade type, saw kerf type or ripple with the contact surface of the thin grid of dereliction grid solar cell
Line type.
Z-type structure probe head is smaller with the thin grid line contact surface of cell piece, is blade type or saw kerf type or ripple type, can ensure that
Probe has certain pressure to act on thin grid will not be damaged to solar cell surface passivating film or thin grid again simultaneously.
As it is of the invention another preferred embodiment, the conductive bar is the resilient electric conductor of tool, described
Having resilient electric conductor includes elastomer, conductor wire and adhesives.
The conductive bar can share same conductive bar located at the lower section of the extensible probe group, multiple probe groups.
The conductive bar is the resilient electric conductor of tool, probe is flexible produce pressure when can produce deformation and then can be with
The thin grid line of battery produces good contact.
Wherein described elastomer is preferably rubber, resin or silica gel, the conductor wire be preferably parcel gold plating copper wire,
Filamentary silver or alloy, the adhesives are preferably polyurethane, silica gel or epoxy resin etc..
The section of the conductive bar is preferably circular, oval, rectangle or trapezoidal.
The length of the conductive bar is preferably 50~300mm, and width is preferably 1~10mm.
Each telescopic probe groups preferably includes two current probes and a voltage probe, and wherein both sides are electric current spy
Pin, centre is voltage probe.
I.e. preferably three probes of each telescopic probe groups are one group, and two ends are current probe, and centre is voltage probe.
The outside of every current probe and every voltage probe is equipped with extensible probe sleeve.So that probe groups can stretch
Contracting.
With current industry dereliction grid cell measurement use silk screening techniques and probe alignment technology compared with, the present invention have with
Lower advantage：
(1) present invention uses telescopic probe structure, and the silk-screening approach commonly used compared to industry can be realized with metal grid lines
Preferably contact, it is more easier and convenient than silk screen to safeguard；
(2) present invention tests probe or uses elastic telescopic conductive bar using segmented, it is to avoid integrated probe row
In be uneven the loose contact problem for causing due to grid line, and overlapped between probe groups and probe groups, institute can be covered
There is region, therefore can be with compatible any battery grid line radical and spacing；
(3) present invention can be conducive to skill due to being improved mainly for probe with compatible any testing, sorting equipment
The Industry Promotion and production of art；
(4) probe tester of the present invention is by using pogo pin sleeve design, Z-type structure probe head and segmented
Cross-coincidence is designed or uses elastic telescopic conductive bar so that the test of dereliction grid cell becomes more convenient and accurate, and one
Aspect reduces the loose contact problem that conventional screen crimp technology is brought, while also causing the compatibility of test probe groups more
By force, even if battery grid line quantity and spacing change can also be applicable, it is most important that this design can be with conventional production line test point
Select system well compatible, be conducive to the Industry Promotion and production of new technology.
Brief description of the drawings
Fig. 1 is front schematic view of the p-type without grid line solar cell in embodiment 1；
Fig. 2 is the probe row's side view for the test of dereliction grid cell in embodiment 1；
Fig. 3 is the probe row's front view for the test of dereliction grid cell in embodiment 1；
Fig. 4 is the probe row's top view for the test of dereliction grid cell in embodiment 1；
Fig. 5 is that the middle probe head of embodiment 1 crimps schematic diagram with dereliction grid cell front gate line；
Fig. 6 is N-shaped double-side cell schematic cross-section in embodiment 2；
Fig. 7 crimps side diagram for the middle probe head of embodiment 2 with two-sided dereliction grid cell grid line；
Fig. 8 is that the middle probe of embodiment 3 arranges side schematic view；
Wherein 1 is the conventional front without main grid p-type battery, and 2 is probe framed bent, and 3 is telescopic probe groups, and 31 is to stretch
Contracting probe sleeve, 4 is probe, and 5 is the two-sided dereliction grid cell of N-shaped, and 61 is front electrode contact probe framed bent, and 62 is front electricity
Pole extensible probe group, 63 is front electrode contact probe head, and 71 is backplate contact probe framed bent, and 72 can for backplate
Pogo pin group, 73 is positive backplate contact probe head, and 8 is gold-plated copper wires, and 9 is rubber elastomer.
Specific embodiment
Embodiment 1
As Figure 1-5, the probe tester for dereliction grid solar cell that the present embodiment is provided, including probe
Row, probe row includes probe framed bent 2 and some telescopic probe groups 3, and each telescopic probe groups includes at least one electricity
Stream probe and a voltage probe, the lower section of telescopic probe groups 3 is provided with probe 4.
Wherein for conventional without main grid p-type battery, Fig. 1 is the conventional front 1 without main grid p-type battery to dereliction grid solar cell
Schematic diagram.
The quantity of telescopic probe groups is 8 groups.
It is provided with a probe 4 below each extensible probe group, probe 4 is shaped as Z-type structure, and adjacent two visit
Having between syringe needle makes the lap that any one thin grid can be in contact with probe 4 on dereliction grid solar cell piece.
Each probe groups includes a probe, and probe is shaped as similar to Z-type structure, probe during actual test
There is coincidence between front and rear adjacent probe, it is ensured that any one thin grid can be contacted with probe on cell piece.
When using, described probe one end is located at least one current probe and a lower section for voltage probe, separately
Outer one end is in contact with the thin grid on the dereliction grid solar cell, the items for testing dereliction grid solar cell
Energy.
The length of Z-type structure probe head is 20mm, and width is 5mm, Z-type structure probe head and the thin grid line contact surface of battery compared with
It is small, it is blade type, the width with battery grid line contact surface is less than 1mm, it is ensured that probe can have certain pressure to act on thin grid
Solar cell surface passivating film and thin grid will not be damaged again simultaneously.
Each telescopic probe groups includes two current probes and a voltage probe, and wherein both sides are current probe,
Centre is voltage probe.
The outside of every current probe and every voltage probe is equipped with extensible probe sleeve 31.
Wherein Fig. 2-4 is respectively the side view of probe row, front view and top view employed in the present embodiment, and Fig. 5 is this
Z-type structure probe head crimps schematic diagram with the thin grid line of battery in embodiment, it is seen that the thin grid line of battery all can be connect by probe row
On touching.
The probe tester for being used for dereliction grid solar cell can be used for the properties of dereliction grid solar cell
Test.
Embodiment 2
As different from Example 1, dereliction grid solar cell is the two-sided dereliction grid cell 5 of conventional n-type, the electricity for being used
Pond front and back is fine grid structure, therefore front and back is both needed to using the probe tester in the present invention, and Fig. 6 is this
N-shaped double-side cell schematic cross-section in embodiment.
The quantity of the wherein telescopic probe groups of front and back is 16 groups.
Front is used for the probe tester of dereliction grid solar cell, including front electrode contact probe row, front electricity
Pole contact probe row includes front electrode contact probe framed bent 61 and some telescopic front electrode extensible probe groups 62, often
Individual telescopic probe groups include at least one current probe and a voltage probe, are provided with just below telescopic probe groups
Face electrode contact probe 63.
The back side is used for the probe tester of dereliction grid solar cell, including backplate contact probe row, back side electricity
Pole contact probe row includes backplate probe framed bent 71 and 16 telescopic backplate extensible probe groups 72, and each can
Flexible probe groups include at least one current probe and a voltage probe, and back side electricity is provided with below telescopic probe groups
Pole contact probe first 73.
Wherein front electrode contact probe head (Z-type structure) 63 and the backplate contact probe head (length of Z-type structure 73
12mm is, width is 3mm.
Front electrode contact probe first 63 and backplate contact probe first 73 are smaller with battery grid line contact surface, are wave
Type, the width with battery grid line contact surface is less than 3mm, it is ensured that probe can have certain pressure to act on simultaneously again will not on thin grid
Solar cell surface passivating film is damaged, Fig. 7 crimps schematic diagram for the present embodiment middle probe head with the thin grid line of battery, can
See that the thin grid line of battery can all by probe row's contact.
Embodiment 3
As shown in figure 8, the probe tester for dereliction grid solar cell that the present embodiment is provided, including probe
Row, probe row includes probe framed bent 2 and some telescopic probe groups 3, and each telescopic probe groups includes at least one electricity
Stream probe and a voltage probe, the lower section of telescopic probe groups 3 is provided with conductive bar.
Wherein dereliction grid solar cell is the two-sided dereliction grid cell of conventional P-type, the two-sided dereliction grid cell of the conventional P-type
Front and back is fine grid structure, therefore front and back is both needed to using test probe row of the present invention.
The quantity of telescopic probe groups is 30 groups.
Each telescopic probe groups includes a current probe and a voltage probe.
The lower edge of telescopic probe groups 3 is connected by a conductive bar, and conductive bar is that the copper wire of parcel gold plating is (gold-plated
Copper cash 8) and rubber composition elastic electric conductor material (rubber elastomer 9), be connected by epoxy between copper cash and elastomer
It is resin-bonded, deformation can be produced when probe stretches and produces pressure and then good contact can be produced with the thin grid line of battery.
A conductive bar is shared below multiple probe groups.
Wherein the length of conductive bar is 160mm, and width is 2mm, and Fig. 8 is that probe arranges side schematic view.
Although oneself is disclosed as above the present invention with embodiment, it is not limited to protection scope of the present invention, any ripe
The technical staff of this technology is known, in the change made without departing from the spirit and scope of the invention and retouching, this all should be belonged to
The protection domain of invention.
Claims (10)
1. a kind of probe tester for dereliction grid solar cell, it is characterized in that：Including probe row, the probe row bag
Probe framed bent and some telescopic probe groups are included, each telescopic probe groups includes at least one current probe and an electricity
Pressure probe, probe or conductive bar are provided with below some telescopic probe groups.
2. the probe tester for dereliction grid solar cell according to claim 1, it is characterized in that：It is described to stretch
The quantity of the probe groups of contracting is 5~30 groups.
3. the probe tester for dereliction grid solar cell according to claim 1, it is characterized in that：Each can stretch
It is provided with a probe below contracting probe groups, the probe is shaped as Z-type structure, and to have between adjacent two probe make
The lap that any one thin grid can be in contact with the probe on the dereliction grid solar cell.
4. the probe tester for dereliction grid solar cell according to claim 3, it is characterized in that：Z-type structure
The length of probe is 3~30mm, and width is 2~10mm.
5. the probe tester for dereliction grid solar cell according to claim 3, it is characterized in that：Z-type structure
Probe is blade type, saw kerf type or ripple type with the contact surface of the thin grid of the dereliction grid solar cell.
6. the probe tester for dereliction grid solar cell according to claim 1, it is characterized in that：The conduction
Bar is the resilient electric conductor of tool, and the resilient electric conductor of tool includes elastomer, conductor wire and adhesives.
7. the probe tester for dereliction grid solar cell according to claim 6, it is characterized in that：The elasticity
Body is rubber, resin or silica gel, and the conductor wire is copper wire, filamentary silver or the alloy for wrapping up gold plating, and the adhesives is poly-
Urethane, silica gel or epoxy resin.
8. the probe tester for dereliction grid solar cell according to claim 6, it is characterized in that：The conduction
The section of bar is circular, oval, rectangle or trapezoidal, and the length of the conductive bar is 50~300mm, and width is 1~10mm.
9. the probe tester for dereliction grid solar cell according to claim any one of 1-8, it is characterized in that：
Each telescopic probe groups includes two current probes and a voltage probe, and wherein both sides are current probe, and centre is electricity
Pressure probe.
10. the probe tester for dereliction grid solar cell according to claim 9, it is characterized in that：Every electricity
The outside of stream probe and every voltage probe is equipped with extensible probe sleeve.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201710113247.8A CN106898565A (en) | 2017-02-28 | 2017-02-28 | A kind of probe tester for dereliction grid solar cell |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201710113247.8A CN106898565A (en) | 2017-02-28 | 2017-02-28 | A kind of probe tester for dereliction grid solar cell |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN106898565A true CN106898565A (en) | 2017-06-27 |
Family
ID=59184878
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| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201710113247.8A Pending CN106898565A (en) | 2017-02-28 | 2017-02-28 | A kind of probe tester for dereliction grid solar cell |
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| WO2013001910A1 (en) * | 2011-06-27 | 2013-01-03 | Ｊｘ日鉱日石エネルギー株式会社 | Solar cell measurement jig |
| WO2013001911A1 (en) * | 2011-06-27 | 2013-01-03 | Ｊｘ日鉱日石エネルギー株式会社 | Solar cell measurement jig |
| CN103858018A (en) * | 2011-10-13 | 2014-06-11 | 迪睿合电子材料有限公司 | Measurement jig for solar battery and method for measuring output of solar battery cell |
| CN104124919A (en) * | 2013-04-24 | 2014-10-29 | 共进电机株式会社 | Rodlike probe and measuring device used for solar cell unit |
| CN206558480U (en) * | 2017-02-28 | 2017-10-13 | 晶澳（扬州）太阳能科技有限公司 | A kind of probe tester for dereliction grid solar cell |
-
2017
- 2017-02-28 CN CN201710113247.8A patent/CN106898565A/en active Pending
Patent Citations (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2006118983A (en) * | 2004-10-21 | 2006-05-11 | Sharp Corp | Measurement fixture for solar battery cell |
| WO2013001910A1 (en) * | 2011-06-27 | 2013-01-03 | Ｊｘ日鉱日石エネルギー株式会社 | Solar cell measurement jig |
| WO2013001911A1 (en) * | 2011-06-27 | 2013-01-03 | Ｊｘ日鉱日石エネルギー株式会社 | Solar cell measurement jig |
| CN103858018A (en) * | 2011-10-13 | 2014-06-11 | 迪睿合电子材料有限公司 | Measurement jig for solar battery and method for measuring output of solar battery cell |
| CN104124919A (en) * | 2013-04-24 | 2014-10-29 | 共进电机株式会社 | Rodlike probe and measuring device used for solar cell unit |
| CN206558480U (en) * | 2017-02-28 | 2017-10-13 | 晶澳（扬州）太阳能科技有限公司 | A kind of probe tester for dereliction grid solar cell |
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