JP2006118983A - Measurement fixture for solar battery cell - Google Patents

Measurement fixture for solar battery cell Download PDF

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JP2006118983A
JP2006118983A JP2004307151A JP2004307151A JP2006118983A JP 2006118983 A JP2006118983 A JP 2006118983A JP 2004307151 A JP2004307151 A JP 2004307151A JP 2004307151 A JP2004307151 A JP 2004307151A JP 2006118983 A JP2006118983 A JP 2006118983A
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probe
contact
measurement
probe pin
bus bar
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Shuzo Ishii
周三 石井
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Sharp Corp
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    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
    • Y02E—REDUCTION OF GREENHOUSE GAS [GHG] EMISSIONS, RELATED TO ENERGY GENERATION, TRANSMISSION OR DISTRIBUTION
    • Y02E10/00—Energy generation through renewable energy sources
    • Y02E10/50—Photovoltaic [PV] energy

Abstract

<P>PROBLEM TO BE SOLVED: To provide a measurement fixture for a solar battery cell which prevents a decrease in a curve factor and reduces losses in time and a cost for replacing probe pins. <P>SOLUTION: A bus bar electrode 13 is provided on an n-type semiconductor 11. A probe bar 22a is provided with a voltage measurement probe pin 22b and a current measurement probe pin 22c which retract upward when they are brought into contact with the bus bar electrode from above for the measurement of a solar battery cell 1. For each probe pin, an advancing/retracting section 22g is provided between a base end part supported by the probe bar and a contact part 22f which is in contact with the bus bar electrode. The advancing/retracting part 22g allows the contact part to advance or retract in a noncontact manner with the base end part being a fulcrum with respect to the probe bar. The advancing/retracting part is configured such that it allows its tip to retract upward through spring elasticity when it is brought into contact with the bus bar electrode from above. <P>COPYRIGHT: (C)2006,JPO&NCIPI

Description

本発明は、太陽電池セルの電気特性を測定する測定治具に関する。   The present invention relates to a measurement jig for measuring electrical characteristics of a solar battery cell.

一般に、図１０に示すように、太陽電池セルａの受光面となる表面側のｎ型半導体ａ１上には、疑似太陽光ｐの入射をできるだけ妨げないように細いフィンガー電極ｃ，…と、電力を取り出すための太いバスバー電極ｄとが設けられている一方、太陽電池セルａの裏面のｐ型半導体ａ２には全面に電極（図示せず）が設けられている。そして、測定治具ｂを用いて測定する際には、金属製（例えばＣｕ板にＡｕメッキ）のステージｆに太陽電池セルａを載せることで裏面全体で導通をとり、表面側はバスバー電極ｄ上に、余分な影が生じない様にバスバー電極ｄの幅に収まる程度の細長いプローブユニットｇを降ろして導通をとり、両極からそれぞれ電圧・電流を測定する。この場合、図１１に示すように、測定時の等価回路では、疑似太陽光ｐを照射した状態で太陽電池端子間の電圧をスイープさせ、そのときの電流・電圧を読むことでＩ−Ｖ特性が得られるようになっている。   In general, as shown in FIG. 10, on the n-type semiconductor a <b> 1 on the surface side serving as the light receiving surface of the solar battery cell a, a thin finger electrode c,... On the other hand, an electrode (not shown) is provided on the entire surface of the p-type semiconductor a2 on the back surface of the solar battery cell a. When the measurement jig b is used for measurement, the solar cell a is placed on a metal (for example, Au plating on a Cu plate) stage so that the entire back surface is electrically connected, and the front side is a bus bar electrode d. On top of that, a long and narrow probe unit g that fits within the width of the bus bar electrode d is lowered so as not to cause an excessive shadow, and conduction is made, and voltage and current are measured from both poles. In this case, as shown in FIG. 11, in the equivalent circuit at the time of measurement, the voltage between the solar cell terminals is swept in a state where the artificial sunlight p is irradiated, and the current / voltage at that time is read to obtain the IV characteristic. Can be obtained.

そして、従来、プローブユニットｇとしては、図１２に示すように、太陽電池セルａの測定時に上記バスバー電極ｄに対し測定方向（図１２では上方）から接触した際に、図１３に示すように、プローブピンｇ１，ｇ２…を測定方向（図１２および図１３では上方）に退去移動させる収縮機構ｅを具備し、プローブユニットｇをバスバー電極ｄに沿って押し付けた際に、工程上の様々なばらつき等により生じるバスバー電極ｄ表面の凹凸をプローブピンｇ１，ｇ２…の進退移動により吸収しつつバスバー電極ｄに対する電気的接触が得られるようにしたものが知られている（例えば、特許文献１参照）。そして、各プローブピンｇ１，ｇ２は、バスバー電極ｄの長手方向に適当な間隔で一列に並べて配され、四端子測定を行なう上で、電流測定用のプローブピンｇ２は全て短絡し、電圧測定用のプローブピンｇ１のみが電流測定用のプローブピンｇ２から絶縁されている。この場合、図１４に示すように、プローブピンｇ１，ｇ２は、例えば銅合金に金メッキ等が施され、同様に銅合金に金メッキ等を施したシリンダー状の金属パイプｇ３内に挿入されており、コイル状バネｇ４の収縮によるピストン運動によって収縮機構ｅが構成され、各プローブピンｇ１，ｇ２の導通が金属パイプｇ３の内周面との接触によって得られるようになっている。また、電流測定用のプローブピンの短絡は、金属製（例えば、Ｃｕ）のプローブバーに直接ピンを導通接触させて固定してもよいし、樹脂製（例えば、アクリル板）のプローブバーにピンを固定し、リード線などで短絡させてもよい。
特開平９−１８６２１２号公報 Then, conventionally, as shown in FIG. 12, when the probe unit g is in contact with the bus bar electrode d from the measurement direction (upward in FIG. 12) when measuring the solar cell a, as shown in FIG. , The probe pins g1, g2,... Are retracted and moved in the measuring direction (upward in FIGS. 12 and 13), and when the probe unit g is pressed along the bus bar electrode d, various processes are performed. It is known that electrical contact with the bus bar electrode d can be obtained while absorbing the unevenness on the surface of the bus bar electrode d caused by variations and the like by the advance and retreat movement of the probe pins g1, g2,... ). The probe pins g1 and g2 are arranged in a line at an appropriate interval in the longitudinal direction of the bus bar electrode d, and when performing four-terminal measurement, all of the probe pins g2 for current measurement are short-circuited and used for voltage measurement. Only the probe pin g1 is insulated from the probe pin g2 for current measurement. In this case, as shown in FIG. 14, the probe pins g1 and g2 are inserted into a cylindrical metal pipe g3 in which a copper alloy is gold-plated, for example, and the copper alloy is similarly gold-plated, The contraction mechanism e is configured by the piston movement caused by the contraction of the coil spring g4, and conduction between the probe pins g1 and g2 is obtained by contact with the inner peripheral surface of the metal pipe g3. The short-circuit of the probe pin for current measurement may be fixed by directly contacting the pin with a metal (for example, Cu) probe bar, or may be fixed to a probe bar (for example, an acrylic plate) made of resin. May be fixed and short-circuited with a lead wire or the like.
JP 9-186212 A

ところが、上記従来のものでは、太陽電池セルａの測定時にプローブピンｇ１，ｇ２が金属パイプｇ３の内周面に対し機械的に接触して電気的導通が得られるようになっているため、測定を繰り返すことでプローブピンｇ１，ｇ２と金属パイプｇ３との互いの接触面が摩耗し、金メッキが剥がれるなどの劣化が生じる。このため、接触抵抗が増大し、曲線因子の低下の原因となる。   However, in the above-mentioned conventional one, since the probe pins g1 and g2 are in mechanical contact with the inner peripheral surface of the metal pipe g3 during measurement of the solar battery cell a, electrical conduction is obtained. By repeating the above, the contact surfaces of the probe pins g1 and g2 and the metal pipe g3 are worn, and deterioration such as peeling of the gold plating occurs. For this reason, contact resistance increases and causes the fall of a fill factor.

しかも、曲線因子が低下すると、出力の低下にも繋がるため、これを避ける上で、プローブピンを頻繁に定期交換する必要があり、時間およびコストの両面で大きなロスとなる。   Moreover, since the reduction of the fill factor leads to a reduction in the output, it is necessary to regularly replace the probe pin in order to avoid this, resulting in a large loss in both time and cost.

本発明は、かかる点に鑑みてなされたものであり、その目的とするところは、曲線因子の低下を確実に防止し、プローブピンの交換に費やす時間およびコストのロスを低減することができる太陽電池セルの測定治具を提供することにある。   The present invention has been made in view of such a point, and the object of the present invention is to prevent the fall of the fill factor, and to reduce the time and cost loss for replacing the probe pin. The object is to provide a measuring jig for battery cells.

上記目的を達成するため、本発明では、受光面にバスバー電極を備えた太陽電池セルの測定治具として、測定治具本体に、太陽電池セルの測定時に上記バスバー電極に対し測定方向から接触した際にその測定方向に退去移動する進退移動自在なプローブピンを設ける。そして、上記プローブピンに、測定治具本体に支持された基端と上記バスバー電極に対し接触する先端との間において測定治具本体に対し基端を支点にして非接触状態で先端を進退移動させる進退移動部を設けている。   In order to achieve the above object, in the present invention, as a measurement jig for a solar battery cell having a bus bar electrode on the light receiving surface, the measurement jig main body was contacted with the bus bar electrode from the measurement direction when measuring the solar battery cell. At this time, a probe pin which is movable back and forth in the measuring direction is provided. The probe pin is moved forward and backward in a non-contact state with respect to the measurement jig body between the proximal end supported by the measurement jig body and the distal end contacting the bus bar electrode with the proximal end as a fulcrum. An advancing / retreating movement unit is provided.

この特定事項により、太陽電池セルの測定時にバスバー電極に対し測定方向から先端が接触するプローブピンは、測定治具本体に支持された基端を支点にして測定治具本体に対し非接触状態で先端を測定方向に退去移動させながら進退移動部によって進退移動するようになっているので、工程上の様々なばらつき等により生じるバスバー電極表面の凹凸がプローブピンの進退移動により吸収されつつバスバー電極に対する電気的接触が得られることになる。これにより、太陽電池セルの測定時に金属パイプの内周面に対しプローブピンを接触させていたもののように金属同士の機械的接触によって電気的導通を得る必要がなく、摩耗等の劣化による接触抵抗増大に伴う曲線因子の低下を確実に防止することが可能となる。しかも、曲線因子の低下が防止されることによって出力低下も抑制され、プローブピンの交換の周期を遅延させて、プローブピンの交換に費やす時間およびコストのロスを低減することが可能となる。   With this specific matter, the probe pin whose tip contacts the bus bar electrode from the measurement direction when measuring the solar cell is in a non-contact state with the measurement jig body with the base end supported by the measurement jig body as a fulcrum. As the tip moves back and forth in the measurement direction, it moves forward and backward by the forward / backward moving part, so that irregularities on the surface of the bus bar electrode caused by various variations in the process etc. are absorbed by the forward / backward movement of the probe pin and against the bus bar electrode Electrical contact will be obtained. This eliminates the need to obtain electrical continuity by mechanical contact between the metals as in the case where the probe pin is in contact with the inner peripheral surface of the metal pipe at the time of measuring the solar cell, and contact resistance due to deterioration such as wear. It becomes possible to reliably prevent a decrease in the fill factor accompanying the increase. In addition, since the decrease in the fill factor is prevented, the decrease in the output is also suppressed, and the probe pin replacement period is delayed to reduce the time and cost loss for the probe pin replacement.

特に、プローブピンの進退移動部を特定するものとして、以下の構成が掲げられる。   In particular, the following configuration is listed as a means for specifying the advancing / retreating portion of the probe pin.

つまり、進退移動部を、バスバー電極に対し測定方向から接触した際に先端を測定方向にバネ弾力によって退去移動させるように構成している。   That is, the advancing / retreating movement part is configured to retreat the tip in the measurement direction by spring elasticity when contacting the bus bar electrode from the measurement direction.

この特定事項により、太陽電池セルの測定時にバスバー電極に対し測定方向からプローブピンの先端が接触すると、測定治具本体に支持された基端を支点にして先端が進退移動部のバネ弾力によって測定方向に退去移動するようになっているので、太陽電池セルの測定時に基端を除く部位（先端および進退移動部）の測定治具本体に対する非接触状態が確実なものとなり、プローブピン自体の構造を非常に簡単なものにすることが可能となる上、摩耗等の劣化による接触抵抗増大による曲線因子の低下をより確実に防止することが可能となる。   Due to this specific matter, when the tip of the probe pin comes into contact with the bus bar electrode from the measurement direction when measuring the solar cell, the tip is measured by the spring elasticity of the advancing / retreating moving part with the base end supported by the measurement jig body as a fulcrum. Because it moves away in the direction, the non-contact state of the part excluding the base end (tip and forward / backward moving part) with respect to the measuring jig body is assured when measuring solar cells, and the structure of the probe pin itself Can be made very simple, and it is possible to more reliably prevent a decrease in the fill factor due to an increase in contact resistance due to deterioration such as wear.

以上、要するに、プローブピンの基端と先端との間に測定治具本体に対し非接触状態で先端を進退移動させる進退移動部を設けることで、太陽電池セルの測定時に金属同士の機械的接触による電気的導通を不要にし、摩耗等の劣化による接触抵抗増大に伴う曲線因子の低下を確実に防止することができるとともに、プローブピンの交換の周期を遅延させてプローブピンの交換に費やす時間およびコストのロスを低減させることができる。   In short, in short, by providing an advancing / retreating part that moves the tip back and forth in a non-contact state with respect to the measurement jig main body between the base end and the tip of the probe pin, mechanical contact between metals during measurement of the solar battery cell This eliminates the need for electrical continuity due to wear, can reliably prevent a decrease in the fill factor associated with increased contact resistance due to wear and other deterioration, and delays the probe pin replacement period and Cost loss can be reduced.

以下、本発明を実施するための最良の形態を図面に基づいて説明する。   Hereinafter, the best mode for carrying out the present invention will be described with reference to the drawings.

図１〜図３は本発明の実施例１に係わる太陽電池セルの電気特性を測定する測定治具を示している。   1 to 3 show a measuring jig for measuring electrical characteristics of a solar battery cell according to Example 1 of the present invention.

図１〜図３において、太陽電池セル１は、受光面となる表面側にｎ型半導体１１が設けられ、そのｎ型半導体１１上に、光の入射をできるだけ妨げないように細いフィンガー電極１２，…と、電力を取り出すための２本の太いバスバー電極１３，１３とが設けられている。各フィンガー電極１２は、バスバー電極１３に対し直交している。一方、太陽電池セル１の裏面にｐ型半導体１４が設けられ、このｐ型半導体１４の全面に裏面電極１５が設けられている。   1 to 3, a solar cell 1 is provided with an n-type semiconductor 11 on the surface side serving as a light-receiving surface, and a thin finger electrode 12 on the n-type semiconductor 11 so as not to disturb the incidence of light as much as possible. ... and two thick bus bar electrodes 13 and 13 for taking out electric power are provided. Each finger electrode 12 is orthogonal to the bus bar electrode 13. On the other hand, a p-type semiconductor 14 is provided on the back surface of the solar battery cell 1, and a back electrode 15 is provided on the entire surface of the p-type semiconductor 14.

測定治具２は、Ｃｕ板にＡｕメッキが施された金属ステージ２１を備え、この金属ステージ２１上に太陽電池セル１を載せることによって、太陽電池セル１裏面のｐ型半導体１４全面の裏面電極１５に対し導通が取られるようになっている。また、測定治具２は、太陽電池セル１表面のｎ型半導体１１のバスバー電極１３，１３に対しそれぞれの幅に収まる程度の細長いプローブユニット２２，２２を備えている。この各プローブユニット２２は、バスバー電極１３に対し上方から昇降移動する測定治具本体としてのＣｕ製のプローブバー２２ａと、このプローブバー２２ａの長手方向所定間隔置き（例えば１３ｍｍ置き）に基部（上部）が取り付けられたプローブピン２２ｂ，２２ｃとを備えている。上記プローブピン２２ｂ，２２ｃは、プローブバー２２ａの長手方向に一列に並べて配され、中央に位置する単一の電圧測定用プローブピン２２ｂと、この電圧測定用プローブピン２２ｂを挟んで両側に配された複数の電流測定用プローブピン２２ｃ，…とからなる。上記各電流測定用プローブピン２２ｃは、四端子測定を行なう上でプローブバー２２ａに対し導通され、全てが短絡するようになっている。一方、上記電圧測定用プローブピン２２ｂは、プローブバー２２ａに対し絶縁具２２ｄを介して接続され、各電流測定用プローブピン２２ｃに対し絶縁されるようになっている。また、上記電圧測定用プローブピン２２ｂと電圧端子２２ｅとの間に電圧計Ｖが接続されている一方、上記各電流測定用プローブピン２２ｃは、電流計Ａにそれぞれ接続されている。そして、上記電圧測定用プローブピン２２ｂおよび各電流測定用プローブピン２２ｃの先端には、バスバー電極１３に対し接触する接触部２２ｆ（図４に表れる）が設けられている。この場合、電圧測定用プローブピン２２ｂおよび各電流測定用プローブピン２２ｃは、例えば銅合金等の金属製よりなり、直径が１ｍｍに形成されている。   The measuring jig 2 includes a metal stage 21 having a Cu plate plated with Au, and the solar battery cell 1 is placed on the metal stage 21 so that the back electrode on the entire surface of the p-type semiconductor 14 on the back surface of the solar battery cell 1. 15 is made conductive. The measuring jig 2 includes elongate probe units 22 and 22 that fit within the width of the bus bar electrodes 13 and 13 of the n-type semiconductor 11 on the surface of the solar battery cell 1. Each probe unit 22 includes a Cu probe bar 22a as a measurement jig body that moves up and down with respect to the bus bar electrode 13, and a base portion (upper portion) at predetermined intervals in the longitudinal direction of the probe bar 22a (for example, every 13 mm). ) Are attached to the probe pins 22b and 22c. The probe pins 22b and 22c are arranged in a line in the longitudinal direction of the probe bar 22a, and are arranged on both sides with a single voltage measurement probe pin 22b located at the center and the voltage measurement probe pin 22b. And a plurality of current measuring probe pins 22c. Each of the current measuring probe pins 22c is electrically connected to the probe bar 22a in performing four-terminal measurement, and all of them are short-circuited. On the other hand, the voltage measurement probe pin 22b is connected to the probe bar 22a via an insulator 22d and insulated from each current measurement probe pin 22c. A voltmeter V is connected between the voltage measurement probe pin 22b and the voltage terminal 22e, while each of the current measurement probe pins 22c is connected to an ammeter A. A contact portion 22f (shown in FIG. 4) that contacts the bus bar electrode 13 is provided at the tip of the voltage measurement probe pin 22b and each current measurement probe pin 22c. In this case, the voltage measurement probe pin 22b and each current measurement probe pin 22c are made of a metal such as a copper alloy and have a diameter of 1 mm.

そして、図４にも示すように、上記電圧測定用プローブピン２２ｂおよび各電流測定用プローブピン２２ｃは、プローブバー２２ａに支持された基端部と上記バスバー電極１３に対し接触する接触部２２ｆ（先端）との間においてプローブバー２２ａに対し基端部を支点にして非接触状態で接触部２２ｆを上下方向に進退移動させる進退移動部２２ｇを備えている。この進退移動部２２ｇは、基端部より下方に真っ直ぐ延びたのち略水平方向に屈曲させてプローブバー２２ａの長手方向一側（図４では左側）に向かって距離ｍ（例えば略１１ｍｍ）延びてから、その延長端を下方に屈曲させて真っ直ぐに距離ｋ（例えば略５ｍｍ）延ばしており、バスバー電極１３に対し測定方向となる上方から接触した際に先端を上方にバネ弾力によって退去移動させるように構成されている。   As shown in FIG. 4, the voltage measuring probe pin 22b and each current measuring probe pin 22c are in contact with the base end supported by the probe bar 22a and the bus bar electrode 13, respectively. An advancing / retreating portion 22g is provided for moving the contact portion 22f up and down in a non-contact state with the base end portion as a fulcrum with respect to the probe bar 22a. The forward / backward moving portion 22g extends straight downward from the base end portion, then bends in a substantially horizontal direction, and extends a distance m (for example, approximately 11 mm) toward one side in the longitudinal direction of the probe bar 22a (left side in FIG. 4). The extension end is bent downward to extend straight by a distance k (for example, approximately 5 mm), and when the bus bar electrode 13 is contacted from above in the measurement direction, the tip is moved upward by spring elasticity. It is configured.

ここで、測定治具２により太陽電池セル１の電気特性を測定する手順を図面に基づいて説明する。   Here, the procedure for measuring the electrical characteristics of the solar battery cell 1 with the measuring jig 2 will be described with reference to the drawings.

まず、図２に示すように、金属ステージ２１上に太陽電池セル１を載せて、太陽電池セル１裏面のｐ型半導体１４全面の裏面電極１５に対し導通を取っておく。   First, as shown in FIG. 2, the solar battery cell 1 is mounted on the metal stage 21, and conduction is maintained with respect to the back surface electrode 15 on the entire surface of the p-type semiconductor 14 on the back surface of the solar battery cell 1.

次いで、図３に示すように、各プローブユニット２２（プローブバー２２ａ）を上方から降ろして電圧測定用プローブピン２２ｂおよび各電流測定用プローブピン２２ｃの接触部２２ｆをバスバー電極１３に対し接触させる。このとき、電圧測定用プローブピン２２ｂおよび各電流測定用プローブピン２２ｃの先端（接触部２２ｆ）は、プローブバー２２ａに支持された基端部と接触部２２ｆとの間の進退移動部２２ｇによって、プローブバー２２ａに対し基端部を支点にして非接触状態で接触部２２ｆを上下方向に進退移動、つまりバスバー電極１３に対し測定方向となる上方から接触した際に上方にバネ弾力によって退去移動するようになっている。この場合、図５の（ａ）に示すように、電流測定用プローブピン２２ｃ（電圧測定用プローブピン２２ｂ）の先端（接触部２２ｆ）をバスバー電極１３に対し押し付けた際に、図５の（ｂ）に示すように、先端は電流測定用プローブピン２２ｃの基端部の支持位置から見てプローブバー２２ａの長手方向一側（図５では左側）にズレるが、このズレる方向がバスバー電極１３の延びる方向と一致しているので、接触部２２ｆがバスバー電極１３からはみ出して導通不良になったり、太陽電池セル１のｎ型半導体１１（受光部分）に余分な影を落としたりすることがないようにしている。   Next, as shown in FIG. 3, each probe unit 22 (probe bar 22 a) is lowered from above, and the contact portion 22 f of the voltage measurement probe pin 22 b and each current measurement probe pin 22 c is brought into contact with the bus bar electrode 13. At this time, the distal end (contact portion 22f) of the voltage measurement probe pin 22b and each current measurement probe pin 22c is moved forward and backward by a forward / backward moving portion 22g between the base end portion supported by the probe bar 22a and the contact portion 22f. The contact portion 22f moves up and down in a vertical direction in a non-contact state with the base end portion as a fulcrum with respect to the probe bar 22a, that is, when it contacts the bus bar electrode 13 from above in the measurement direction, the probe bar 22a moves upward by a spring elasticity. It is like that. In this case, when the tip (contact portion 22f) of the current measurement probe pin 22c (voltage measurement probe pin 22b) is pressed against the bus bar electrode 13, as shown in FIG. As shown in b), the tip is shifted to one side in the longitudinal direction of the probe bar 22a (left side in FIG. 5) when viewed from the support position of the proximal end portion of the current measuring probe pin 22c. Therefore, the contact portion 22f does not protrude from the bus bar electrode 13 to cause poor conduction, or an excessive shadow is not cast on the n-type semiconductor 11 (light receiving portion) of the solar battery cell 1. I am doing so.

そして、電圧測定用プローブピン２２ｂおよび各電流測定用プローブピン２２ｃの接触部２２ｆによりバスバー電極１３に対する導通をとり、両極からそれぞれ電圧・電流を測定し、図示しないキセノンランプにより疑似太陽光Ｐを照射した状態で太陽電池１端子間の電圧をスイープさせ、そのときの電流・電圧を読むことでＩ−Ｖ特性を得る。   Then, the contact portion 22f of the voltage measurement probe pin 22b and each current measurement probe pin 22c conducts to the bus bar electrode 13, measures the voltage and current from both poles, and irradiates the artificial sunlight P with a xenon lamp (not shown). In this state, the voltage between the solar cell 1 terminals is swept, and the current / voltage at that time is read to obtain the IV characteristic.

この場合、図６に示すように、測定治具２による測定回数と曲線因子の関係について説明するに、測定回数の増加とともに曲線因子が低下しており、太陽電池セルの測定時に金属パイプの内周面の内周面に対しプローブピンを接触させていた従来のもの（図６中において破線で示す）では３０万回の測定で曲線因子が１％低下しているのに対し、本実施例１のもの（図６中において実線で示す）では、同じく曲線因子が１％低下するまでに３６万回程度の測定ができることが判る。要するに、出力低下を避けるためにＦＦの１％低下を目安に電圧測定用プローブピン２２ｂおよび各電流測定用プローブピン２２ｃの交換周期を決めるとすると、本実施例１の電圧測定用プローブピン２２ｂおよび各電流測定用プローブピン２２ｃでは寿命が従来のものに比して１．２倍となる。   In this case, as shown in FIG. 6, the relationship between the number of measurements by the measuring jig 2 and the fill factor will be described. The fill factor decreases as the number of measurements increases, In the conventional example (indicated by a broken line in FIG. 6) in which the probe pin is in contact with the inner peripheral surface of the peripheral surface, the fill factor decreases by 1% after 300,000 measurements. In the case of 1 (indicated by the solid line in FIG. 6), it can be seen that about 360,000 times can be measured before the fill factor decreases by 1%. In short, in order to avoid a reduction in output, assuming that the replacement period of the voltage measurement probe pin 22b and each current measurement probe pin 22c is determined based on a 1% decrease in FF, the voltage measurement probe pin 22b of the first embodiment and Each current measuring probe pin 22c has a lifetime that is 1.2 times that of the conventional one.

このように、太陽電池セル１の測定時にバスバー電極１３に対し上方から先端（接触部２２ｆ）が接触する電圧測定用プローブピン２２ｂおよび各電流測定用プローブピン２２ｃは、各プローブユニット２２のプローブバー２２ａに支持された基端部を支点にしてプローブバー２２ａに対し非接触状態で先端を上方に退去移動させながら進退移動部２２ｇによって進退移動するようになっているので、工程上の様々なばらつき等により生じるバスバー電極１３表面の凹凸が電圧測定用プローブピン２２ｂおよび各電流測定用プローブピン２２ｃの進退移動により吸収されつつバスバー電極１３に対する電気的接触が得られることになる。これにより、太陽電池セルの測定時に金属パイプの内周面の内周面に対しプローブピンを接触させていたもののように金属同士の機械的接触によって電気的導通を得る必要がなく、摩耗等の劣化による接触抵抗増大に伴う曲線因子の低下を確実に防止することができる。しかも、曲線因子の低下が防止されることによって出力低下も抑制され、電圧測定用プローブピン２２ｂおよび各電流測定用プローブピン２２ｃの交換の周期を遅延させて、電圧測定用プローブピン２２ｂおよび各電流測定用プローブピン２２ｃの交換に費やす時間およびコストのロスを低減することができる。   As described above, the voltage measurement probe pin 22b and the current measurement probe pin 22c whose tip (contact portion 22f) contacts the bus bar electrode 13 from above at the time of measurement of the solar battery cell 1 are the probe bar of each probe unit 22. Since the base end supported by 22a is used as a fulcrum, the forward / backward moving portion 22g moves forward and backward while moving the tip upward and backward with no contact with the probe bar 22a. Electrical contact with the bus bar electrode 13 is obtained while the irregularities on the surface of the bus bar electrode 13 caused by the above are absorbed by the forward and backward movement of the voltage measurement probe pin 22b and each current measurement probe pin 22c. As a result, it is not necessary to obtain electrical continuity by mechanical contact between metals like the one in which the probe pin is in contact with the inner peripheral surface of the inner peripheral surface of the metal pipe at the time of measuring the solar battery cell. It is possible to reliably prevent a decrease in the fill factor accompanying an increase in contact resistance due to deterioration. In addition, since the decrease in the fill factor is prevented, the decrease in the output is also suppressed, and the replacement period of the voltage measurement probe pin 22b and each of the current measurement probe pins 22c is delayed to thereby reduce the voltage measurement probe pin 22b and each of the currents. It is possible to reduce time and cost loss for replacement of the measurement probe pin 22c.

しかも、太陽電池セル１の測定時にバスバー電極１３に対し上方から電圧測定用プローブピン２２ｂおよび各電流測定用プローブピン２２ｃの先端が接触すると、各プローブユニット２２のプローブバー２２ａに支持された基端部を支点にして先端が進退移動部２２ｇのバネ弾力によって上方に退去移動するようになっているので、太陽電池セル１の測定時に基端部を除く部位（接触部２２ｆおよび進退移動部２２ｇ）のプローブバー２２ａに対する非接触状態が確実なものとなり、電圧測定用プローブピン２２ｂおよび各電流測定用プローブピン２２ｃ自体の構造を非常に簡単なものにすることができる上、摩耗等の劣化による接触抵抗増大による曲線因子の低下をより確実に防止することができる。   Moreover, when the tips of the voltage measurement probe pins 22b and the current measurement probe pins 22c come into contact with the bus bar electrode 13 from above when measuring the solar battery cell 1, the base ends supported by the probe bars 22a of the probe units 22 Since the tip is moved upward by the spring elasticity of the forward / backward moving portion 22g with the portion as a fulcrum, the portion excluding the base end during measurement of the solar cell 1 (contact portion 22f and forward / backward moving portion 22g) The non-contact state with respect to the probe bar 22a is ensured, and the structure of the voltage measurement probe pin 22b and each current measurement probe pin 22c itself can be made very simple, and contact due to deterioration of wear or the like. A decrease in fill factor due to an increase in resistance can be prevented more reliably.

次に、本発明の実施例２を図７に基づいて説明する。   Next, a second embodiment of the present invention will be described with reference to FIG.

この実施例２では、進退移動部の形状を変更している。なお、進退移動部を除くその他の構成は、上記実施例１の場合と同じであり、同じ部分については同一の符号を付してその詳細な説明は省略する。   In the second embodiment, the shape of the advance / retreat moving unit is changed. The other configurations except for the advancing / retreating unit are the same as those in the first embodiment, and the same portions are denoted by the same reference numerals and detailed description thereof is omitted.

すなわち、本実施例では、図７に示すように、各プローブピン３１は、プローブバー２２ａに支持された基端部３１ａとバスバー電極１３に対し接触する接触部３１ｂ（先端）との間においてプローブバー２２ａに対し基端部３１ａを支点にして非接触状態で接触部３１ｂを上下方向に進退移動させる進退移動部３１ｃを備えている。この進退移動部３１ｃは、基端部３１ａより下方に真っ直ぐ延びたのちプローブバー２２ａの長手方向一側（図７では左側）に向かって斜め下方に延びるように屈曲してから、プローブバー２２ａの長手方向他側（図７では右側）に向かって斜め下方に延びるように屈曲し、再度プローブバー２２ａの長手方向一側に向かって斜め下方に延びるように屈曲し、その延長端を、基端部と対応する位置（進退移動部３１ｃにおけるプローブバー２２ａの長手方向中央位置）で下方に屈曲させて真っ直ぐに延ばしており、バスバー電極１３に対し測定方向となる上方から接触した際に先端を上方にバネ弾力によって退去移動させるように構成されている。この場合、進退移動部３１ｃは、プローブバー２２ａの長手方向に距離ｍ（例えば１１ｍｍ）の長さに設定されている。   That is, in this embodiment, as shown in FIG. 7, each probe pin 31 is a probe between a base end portion 31 a supported by the probe bar 22 a and a contact portion 31 b (tip) that contacts the bus bar electrode 13. An advancing / retreating movement part 31c for moving the contact part 31b up and down in a vertical direction in a non-contact state with the base end part 31a as a fulcrum with respect to the bar 22a is provided. The forward / backward moving portion 31c extends straight downward from the base end portion 31a and then bends so as to extend obliquely downward toward one side in the longitudinal direction (left side in FIG. 7) of the probe bar 22a. It is bent so as to extend obliquely downward toward the other side in the longitudinal direction (right side in FIG. 7), is again bent so as to extend obliquely downward toward one side in the longitudinal direction of the probe bar 22a, and its extended end is a base end Is bent downward at a position corresponding to the portion (the center position in the longitudinal direction of the probe bar 22a in the forward / backward moving portion 31c) and extends straight, and the tip is moved upward when contacting the bus bar electrode 13 from above in the measurement direction. It is configured to move away by spring elasticity. In this case, the advancing / retreating movement part 31c is set to a distance m (for example, 11 mm) in the longitudinal direction of the probe bar 22a.

これにより、太陽電池セル１の測定時にバスバー電極１３に対し上方から各プローブピン３１の先端が接触すると、各プローブユニット２２のプローブバー２２ａに支持された基端部３１ａを支点にして先端が進退移動部３１ｂのバネ弾力によって上方に退去移動するようになっているので、太陽電池セル１の測定時に基端部３１ａを除く部位（接触部３１ｂおよび進退移動部３１ｃ）のプローブバー２２ａに対する非接触状態が確実なものとなり、各プローブピン３１自体の構造を非常に簡単なものにすることができる上、摩耗等の劣化による接触抵抗増大による曲線因子の低下をより確実に防止することができる。   Thus, when the tip of each probe pin 31 comes into contact with the bus bar electrode 13 from above during measurement of the solar battery cell 1, the tip advances and retreats with the base end portion 31 a supported by the probe bar 22 a of each probe unit 22 as a fulcrum. Since the moving portion 31b moves backward due to the spring elasticity, the portion (the contact portion 31b and the forward / backward moving portion 31c) excluding the base end portion 31a at the time of measurement of the solar battery cell 1 is not in contact with the probe bar 22a. The state is assured and the structure of each probe pin 31 itself can be made very simple. Further, it is possible to more reliably prevent a decrease in the curve factor due to an increase in contact resistance due to deterioration such as wear.

また、バスバー電極１３に対し接触部３１ｂを押し付けて接触させた際に、接触部３１ｂが水平方向にズレることがなく、接触部３１ｂの接触によるバスバー電極１３および太陽電池セル１のｎ型半導体１１への傷付きを確実に防止することができる。   Further, when the contact portion 31b is pressed against the bus bar electrode 13 and brought into contact with the bus bar electrode 13, the contact portion 31b is not displaced in the horizontal direction, and the bus bar electrode 13 and the n-type semiconductor 11 of the solar battery cell 1 due to the contact of the contact portion 31b. It is possible to reliably prevent damage to the skin.

次に、本発明の実施例３を図８に基づいて説明する。   Next, Embodiment 3 of the present invention will be described with reference to FIG.

この実施例３では、進退移動部の形状を変更している。なお、進退移動部を除くその他の構成は、上記実施例１の場合と同じであり、同じ部分については同一の符号を付してその詳細な説明は省略する。   In the third embodiment, the shape of the advance / retreat moving unit is changed. The other configurations except for the advancing / retreating unit are the same as those in the first embodiment, and the same portions are denoted by the same reference numerals and detailed description thereof is omitted.

すなわち、本実施例では、図８に示すように、各プローブピン３２は、プローブバー２２ａに上端が支持された基端部３２ａと、バスバー電極１３に対し接触する接触部３２ｂと、この両者間においてプローブバー２２ａに対し基端部３２ａを支点にして非接触状態で接触部３２ｂを上下方向に進退移動させる進退移動部３２ｃとを備えている。この進退移動部３２ｃは、プローブバー２２ａの長手方向と平行に略水平方向に延びる板バネよりなり、その長手方向一側（図８では左側）に接触部３２ｂの上端が取り付けられている一方、長手方向他側（図８では右側）に基端部３２ａの下端が取り付けられていて、バスバー電極１３に対し測定方向となる上方から接触した際に先端を上方にバネ弾力によって退去移動させるように構成されている。   That is, in this embodiment, as shown in FIG. 8, each probe pin 32 includes a base end portion 32a whose upper end is supported by the probe bar 22a, a contact portion 32b that contacts the bus bar electrode 13, and a gap between the two. The probe bar 22a includes an advancing / retreating movement part 32c that moves the contact part 32b up and down in a non-contact state with the base end part 32a as a fulcrum. The forward / backward moving portion 32c is formed of a leaf spring extending in a substantially horizontal direction parallel to the longitudinal direction of the probe bar 22a, and the upper end of the contact portion 32b is attached to one side in the longitudinal direction (left side in FIG. 8), The lower end of the base end portion 32a is attached to the other side in the longitudinal direction (the right side in FIG. 8), and when the bus bar electrode 13 comes into contact with the bus bar electrode 13 from above in the measurement direction, the tip is moved upward by spring elasticity. It is configured.

これにより、太陽電池セル１の測定時にバスバー電極１３に対し上方から各プローブピン３２の先端（接触部３２ｂの下端）が接触すると、各プローブユニット２２のプローブバー２２ａに支持された基端部３２ａの上端を支点にして先端が進退移動部３２ｃのバネ弾力によって上方に退去移動するようになっているので、太陽電池セル１の測定時に基端部を除く部位（接触部３２ｂおよび進退移動部３２ｃ）のプローブバー２２ａに対する非接触状態が確実なものとなり、各プローブピン３２自体の構造を非常に簡単なものにすることができる上、摩耗等の劣化による接触抵抗増大による曲線因子の低下をより確実に防止することができる。   Thus, when the tip of each probe pin 32 (the lower end of the contact portion 32b) comes into contact with the bus bar electrode 13 from above during measurement of the solar battery cell 1, the base end portion 32a supported by the probe bar 22a of each probe unit 22 Since the tip is moved upward by the spring elasticity of the forward / backward moving part 32c with the upper end of the fulcrum as a fulcrum, the parts other than the base end part (contact part 32b and forward / backward moving part 32c when measuring the solar cell 1) ) In a non-contact state with respect to the probe bar 22a, the structure of each probe pin 32 itself can be made very simple, and the curve factor can be further reduced due to an increase in contact resistance due to deterioration such as wear. It can be surely prevented.

次に、本発明の実施例４を図９に基づいて説明する。   Next, a fourth embodiment of the present invention will be described with reference to FIG.

この実施例４では、進退移動部の形状を変更している。なお、進退移動部を除くその他の構成は、上記実施例１の場合と同じであり、同じ部分については同一の符号を付してその詳細な説明は省略する。   In the fourth embodiment, the shape of the advance / retreat moving unit is changed. The other configurations except for the advancing / retreating unit are the same as those in the first embodiment, and the same portions are denoted by the same reference numerals and detailed description thereof is omitted.

すなわち、本実施例では、図９に示すように、各プローブピン３３は、プローブバー２２ａに上端が支持された基端部３３ａと、バスバー電極１３に対し接触する接触部３３ｂと、この両者間においてプローブバー２２ａに対し基端部３３ａを支点にして非接触状態で接触部３３ｂを上下方向に進退移動させる進退移動部３３ｃとを備えている。この進退移動部３３ｃは、基端部３３ａと対応する位置（進退移動部３３ｂにおけるプローブバー２２ａの長手方向中央位置）からプローブバー２２ａの長手方向一側（図９では左側）に向かって斜め下方に延びたのち、プローブバー２２ａの長手方向他側（図９では右側）に向かって斜め下方に延びるように屈曲し、基端部と対応する位置まで再度プローブバー２２ａの長手方向一側に向かって斜め下方に延びるように屈曲する板バネよりなり、その下端に接触部３３ｂの上端が取り付けられている一方、上端に基端部３２ａの下端が取り付けられていて、バスバー電極１３に対し測定方向となる上方から接触した際に先端を上方にバネ弾力によって退去移動させるように構成されている。   That is, in this embodiment, as shown in FIG. 9, each probe pin 33 includes a base end portion 33a whose upper end is supported by the probe bar 22a, a contact portion 33b contacting the bus bar electrode 13, and a gap between the two. Are provided with an advancing / retreating movement portion 33c for moving the contact portion 33b up and down in a non-contact state with the base end portion 33a as a fulcrum with respect to the probe bar 22a. The advancing / retreating portion 33c is obliquely downward from a position corresponding to the base end portion 33a (a longitudinal center position of the probe bar 22a in the advancing / retreating moving portion 33b) toward one side in the longitudinal direction of the probe bar 22a (left side in FIG. 9). Then, it is bent so as to extend obliquely downward toward the other side in the longitudinal direction (right side in FIG. 9) of the probe bar 22a, and again toward the one side in the longitudinal direction of the probe bar 22a to a position corresponding to the base end portion. The upper end of the contact portion 33b is attached to the lower end of the leaf spring, and the lower end of the base end portion 32a is attached to the upper end of the leaf spring. When contacted from above, the tip is moved upward by spring elasticity.

これにより、太陽電池セル１の測定時にバスバー電極１３に対し上方から各プローブピン３３の先端（接触部３３ｂの下端）が接触すると、各プローブユニット２２のプローブバー２２ａに支持された基端部３３ａの上端を支点にして先端が進退移動部３３ｃのバネ弾力によって上方に退去移動するようになっているので、太陽電池セル１の測定時に基端部を除く部位（接触部３３ｂおよび進退移動部３３ｃ）のプローブバー２２ａに対する非接触状態が確実なものとなり、各プローブピン３３自体の構造を非常に簡単なものにすることができる上、摩耗等の劣化による接触抵抗増大による曲線因子の低下をより確実に防止することができる。   Accordingly, when the tip of each probe pin 33 (the lower end of the contact portion 33b) comes into contact with the bus bar electrode 13 from above when measuring the solar battery cell 1, the base end portion 33a supported by the probe bar 22a of each probe unit 22 is used. Since the tip is moved upward by the spring elasticity of the advance / retreat movement part 33c with the upper end of the fulcrum as a fulcrum, the parts excluding the base end part (contact part 33b and advance / retreat movement part 33c) when measuring the solar cell 1 ) In the non-contact state with respect to the probe bar 22a, and the structure of each probe pin 33 itself can be made very simple, and the curve factor is further reduced due to an increase in contact resistance due to deterioration of wear or the like. It can be surely prevented.

本発明の実施例１に係わる太陽電池セルの測定治具の斜視図である。It is a perspective view of the measuring jig of the photovoltaic cell concerning Example 1 of the present invention. 同じく各プローブピンをバスバー電極に対し接触させる前の状態を示す測定治具の一部を切り欠いた側面図である。It is the side view which notched a part of measuring jig which shows the state before making each probe pin contact a bus-bar electrode similarly. 同じく各プローブピンをバスバー電極に対し接触させた状態を示す測定治具の一部を切り欠いた側面図である。It is the side view which notched a part of measurement jig | tool which shows the state which similarly contacted each probe pin with the bus-bar electrode. 同じくプローブピンの側面図である。It is a side view of a probe pin similarly. 同じく（ａ）はバスバー電極に対し接触させる前の状態を示すプローブピンの概略側面図、（ｂ）はバスバー電極に対し接触させた後の状態を示すプローブピンの概略側面図である。Similarly, (a) is a schematic side view of the probe pin showing a state before being brought into contact with the bus bar electrode, and (b) is a schematic side view of the probe pin showing a state after being brought into contact with the bus bar electrode. 測定回数に対するプローブピンの曲線因子変化率の特性を示す特性図である。It is a characteristic view which shows the characteristic of the curve factor change rate of a probe pin with respect to the frequency | count of a measurement. 本発明の実施例２に係わる測定治具のプローブピンの側面図である。It is a side view of the probe pin of the measuring jig concerning Example 2 of the present invention. 本発明の実施例３に係わる測定治具のプローブピンの斜視図である。It is a perspective view of the probe pin of the measuring jig concerning Example 3 of the present invention. 本発明の実施例４に係わる測定治具のプローブピンの斜視図である。It is a perspective view of the probe pin of the measuring jig concerning Example 4 of the present invention. 従来例に係わる太陽電池セルの測定治具の斜視図である。It is a perspective view of the measuring jig of the photovoltaic cell concerning a prior art example. 同じく測定治具の測定時に使用される等価回路図である。It is the equivalent circuit diagram similarly used at the time of the measurement of a measuring jig. 同じく各プローブピンをバスバー電極に対し接触させる前の状態を示す測定治具の一部を切り欠いた側面図である。It is the side view which notched a part of measuring jig which shows the state before making each probe pin contact a bus-bar electrode similarly. 同じく各プローブピンをバスバー電極に対し接触させた状態を示す測定治具の一部を切り欠いた側面図である。It is the side view which notched a part of measurement jig | tool which shows the state which similarly contacted each probe pin with the bus-bar electrode. 同じくプローブピンの縦断側面図である。It is a vertical side view of the probe pin.

符号の説明Explanation of symbols

１ 太陽電池セル
１１ ｎ型半導体（受光面）
１３ バスバー電極
２ 測定治具
２２ａ ブローブバー（測定治具本体）
２２ｂ 電圧測定用プローブピン（プローブピン）
２２ｃ 電流測定用プローブピン（プローブピン）
２２ｆ 接触部（先端）
２２ｇ 進退移動部
３１，３２，３３
プローブピン
３１ａ，３２ａ，３３ａ
基端部（基端）
３１ｂ，３２ｂ，３３ｂ
接触部（先端）
３１ｃ，３２ｃ，３３ｃ
進退移動部 1 Solar cell 11 n-type semiconductor (light-receiving surface)
13 Busbar Electrode 2 Measurement Jig 22a Probe Bar (Measurement Jig Body)
22b Probe pin for voltage measurement (probe pin)
22c Probe pin for current measurement (probe pin)
22f Contact part (tip)
22g forward / backward moving part 31, 32, 33
Probe pins 31a, 32a, 33a
Base end (base end)
31b, 32b, 33b
Contact (tip)
31c, 32c, 33c
Advance and retreat part

Claims (2)

受光面にバスバー電極を備えた太陽電池セルの測定治具おいて、
測定治具本体には、太陽電池セルの測定時に上記バスバー電極に対し測定方向から接触した際にその測定方向に退去移動する進退移動自在なプローブピンを備え、
このプローブピンには、測定治具本体に支持された基端と上記バスバー電極に対し接触する先端との間において測定治具本体に対し基端を支点にして非接触状態で先端を進退移動させる進退移動部が設けられていることを特徴とする太陽電池セルの測定治具。 In a measurement jig for solar cells with a bus bar electrode on the light receiving surface,
The measurement jig body is provided with a probe pin that is movable back and forth in the measurement direction when it comes into contact with the bus bar electrode from the measurement direction when measuring the solar cell,
The probe pin is moved forward and backward in a non-contact state with the base end as a fulcrum with respect to the measurement jig body between the base end supported by the measurement jig body and the tip contacting the bus bar electrode. A solar cell measurement jig, wherein an advancing / retreating portion is provided. 上記請求項１に記載の太陽電池セルの測定治具において、
プローブピンの進退移動部は、バスバー電極に対し測定方向から接触した際に先端を測定方向にバネ弾力によって退去移動させるように構成されていることを特徴とする太陽電池セルの測定治具。 In the solar cell measurement jig according to claim 1,
The solar cell measurement jig, wherein the probe pin advance / retreat portion is configured to retreat the tip in the measurement direction by spring elasticity when contacting the bus bar electrode from the measurement direction.
JP2004307151A 2004-10-21 2004-10-21 Measurement fixture for solar battery cell Pending JP2006118983A (en)

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JP7388673B2 (en) 2018-04-25 2023-11-29 共進電機株式会社 Probes and measuring devices for solar cells
CN111579955A (en) * 2019-01-31 2020-08-25 英飞凌科技股份有限公司 Probe station with bus bar mechanism for testing a device under test
US11307247B2 (en) 2019-01-31 2022-04-19 Infineon Technologies Ag Prober with busbar mechanism for testing a device under test
CN111579955B (en) * 2019-01-31 2022-10-14 英飞凌科技股份有限公司 Probe station with bus bar mechanism for testing a device under test
JPWO2020234959A1 (en) * 2019-05-20 2020-11-26
JP7202458B2 (en) 2019-05-20 2023-01-11 三菱重工機械システム株式会社 Tire electrical resistance measuring device, electrical resistance probe

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