CN103063996B - One kind of back contact solar cell substrate testing device - Google Patents

One kind of back contact solar cell substrate testing device Download PDF

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CN103063996B
CN103063996B CN 201210541717 CN201210541717A CN103063996B CN 103063996 B CN103063996 B CN 103063996B CN 201210541717 CN201210541717 CN 201210541717 CN 201210541717 A CN201210541717 A CN 201210541717A CN 103063996 B CN103063996 B CN 103063996B
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CN 201210541717
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CN103063996A (en )
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福克斯·斯蒂芬
刘丽芳
刘长明
苗丽燕
苗凤秀
蔡永梅
汤安民
谢斌
谢旭
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浙江晶科能源有限公司
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Abstract

本发明公开了一种背接触太阳能电池片测试装置,包括上、中、下三块绝缘板,通过螺栓将上、中、下三块绝缘板固定在一起,其中中绝缘板设有中空部,下绝缘板上设有若干排探针插入孔和一个真空连接孔,每排探针插入孔包括若干对探针插入孔,每对探针插入孔插入对应的一组测试探针,上绝缘板上设有略大于一组测试探针的若干通孔,所述一组测试探针穿过通孔至上绝缘板上表面4mm~6mm;每排电流测试探针和电压测试探针在焊带的一端分别设有电流联接线和电压联接线,还公开了采用上述测试装置测试背接触太阳能电池片性能的方法。 The present invention discloses a device for testing solar cells back contact solar, including upper, middle and lower three insulating plate, secured together by bolts on the middle and lower three insulating plate, wherein the insulating plate is provided with a hollow portion, the lower insulating plate has a plurality of probe insertion holes and a row of vacuum holes are connected, each row comprising a plurality of probe insertion holes of the probe insertion holes, a pair of probes each set of test probes inserted into the corresponding insertion holes, the insulating plate a plurality of through holes on a set slightly larger than the test probe, the test probe set through a through hole oriented surface of the insulating plate 4mm ~ 6mm; each row current voltage test probe and the test probe of the ribbon One end of the coupling are provided with current and voltage lines coupled lines, also discloses a method of using the above test apparatus for testing a back-contact solar cell performance. 本发明利用背接触电池电极全在背面的结构特点而设计,结构简单,测试方法简单,测试数据精确,制作成本低。 The present invention utilizes a full back-contact cell electrode in the rear surface of the structural characteristics of the design, a simple structure, a simple test method, the test data accuracy, low production cost.

Description

一种背接触太阳能电池片测试装置 One kind of back contact solar cell substrate testing device

技术领域 FIELD

[0001] 本发明涉及一种太阳能电池片测试装置,具体涉及一种背接触太阳能电池片测试 [0001] The present invention relates to a solar cell test apparatus, particularly relates to a back-contact solar cell test

目.0 Head .0

背景技术 Background technique

[0002]目前,背接触晶体硅太阳能电池片是一种新型电池结构,是指电池的发射区和基区电极均位于电池背面的一种电池。 [0002] Currently, crystalline silicon back contact solar cells is a new cell structure refers to the battery emitter and base electrodes are located on the back surface of a battery cell. 其优点是:正面遮光面积的减小或消除,提高了电池的受光面积,提高电池的效率;组件封装无需进行正面焊接,组件封装密度提高,且更美观。 Its advantages are: reduced or eliminated front shielding area, to improve the light receiving area of ​​the cell, improve the efficiency of the cell; front component package without soldering, component packaging density is improved, and more beautiful. 因此背接触晶体硅太阳能电池已成为现阶段光伏行业研宄的一个重点方向。 Thus crystalline silicon back contact solar cells has become a focus direction of current in the photovoltaic industry study based.

[0003] 常规晶体硅太阳能电池的正负极分别在电池的正反两面,太阳能电池测试装置连接上下两排探针排,接线有成对的电流接线和电压接线组成。 [0003] The positive and negative electrodes of conventional crystalline silicon solar cells respectively in both sides of the battery, a solar cell means connected to the test probe rows of upper and lower rows, the current and voltage wiring composed of wiring Wiring paired. 测试过程中,上下两排探针排分别接触电池片的负极和正极,一个标准太阳光照射到太阳能电池片上,测试结果会通过接线传送至测试仪上。 During the test, the vertical rows of two rows of probes are in contact with the positive electrode and the negative electrode plate of the battery, a standard solar light onto the solar cells, the test results will be sent via a connection to the tester. 而传统的测试装置已无法满足背接触晶体硅太阳能电池的测试要求。 The traditional test apparatus has been unable to meet the test requirements of back contact solar cells in crystalline silicon.

发明内容 SUMMARY

[0004] 本发明所要解决的技术问题是提供一种背接触太阳能电池片测试装置,利用背接触电池电极全在背面的结构特点而设计,结构简单,测试方法简单,测试数据精确,制作成本低。 [0004] The present invention solves the technical problem of providing a back contact solar cell wafer testing apparatus, using a back-contact cell electrode all in the structural characteristics of the rear surface of the design, a simple structure, the test method is simple, accurate test data, low production cost .

[0005] 本发明解决技术问题所采用的技术方案是:一种背接触太阳能电池片测试装置,包括上、中、下三块绝缘板,所述三块绝缘板周边分别设有匹配的螺栓安装孔,通过螺栓将上、中、下三块绝缘板固定在一起,所述中绝缘板设有中空部,所述下绝缘板上设有若干排探针插入孔和一个真空连接孔,所述每排探针插入孔包括若干对探针插入孔,所述每对探针插入孔插入对应的一组测试探针,即一个电流测试探针和一个电压测试探针,所述每排探针插入孔内的电流测试探针和电压测试探针分别与电流焊带和电压焊带焊接,所述电流焊带和电压焊带之间设有绝缘层,所述电流焊带、电压焊带和绝缘层处于中绝缘板的中空部;所述上绝缘板上设有略大于一组测试探针的若干通孔,所述一组测试探针穿过通孔至上绝缘板上表面4mm〜6mm ;所述每排电流测试探针和 [0005] Technical Solution The present invention solves the technical problem is: A back-contact solar cell test apparatus includes an upper, middle and lower three insulating plate, surrounding the insulating plate are provided with three matching mounting bolts hole, by bolts on the middle and lower three insulating plates together, the insulating plate is provided with a hollow portion, with a plurality of probe insertion holes and a row of vacuum holes connecting the lower insulating plate, said each row comprising a plurality of probe insertion holes of the probe insertion hole, the insertion hole of each probe set of a corresponding test probe, i.e., a current and a voltage test probe test probe, said probes each row test probe insertion hole current and voltage, respectively the current test probe ribbon and the ribbon welding voltage, welding current is provided between the tape and the ribbon insulation voltage, the welding current tape, ribbon and the voltage the insulating layer in the hollow portion of the insulating plate; said insulating plate is provided with a plurality of through holes slightly larger than a set of test probes, the test probe set through a through hole oriented surface of the insulating plate 4mm~6mm; each row of the current test probe and 电压测试探针在焊带的一端分别设有电流联接线和电压联接线。 Voltage test probe is provided at one end with a welding current line and the coupling lines are coupled to the voltage.

[0006] 作为一种优选,所述上、中、下三块绝缘板的厚度均为10mm,所述每组测试探针高度为34mm〜36mm。 [0006] As a preference, the upper, middle and lower three insulating plate thickness are 10mm, the height of each test probe is 34mm~36mm.

[0007] 本发明中每组测试探针的排列位置与背接触太阳能电池片背面的电极位置相匹配。 [0007] The electrode of the present invention, the position of each arrangement position of the test probe and the back contact solar cell back sheet match.

[0008] 一种采用如上所述的测试装置测试背接触太阳能电池片性能的方法,其步骤如下: [0008] A testing apparatus for testing using the method described above, the back-contact solar cell performance, the following steps:

[0009] 第一步:将下绝缘板上所设的真空连接孔与真空系统连接;将连接电流测试探针电流联接线和连接电压测试探针的电压联接线分别与测试仪连接; [0009] The first step: connecting a vacuum hole of the lower insulating plate is connected to a vacuum system is provided; Connect the current test probe connected to the voltage and current coupled line voltage test probe coupling lines are connected to the tester;

[0010] 第二步:将太阳能电池片放置于上绝缘板上,轻轻按压太阳能电池片,使每组测试探针压缩,太阳能电池片电极与每组测试探针充分接触; [0010] Second Step: The solar cell is placed on insulating plate, gently press solar cells, so that each test probe is compressed, and the solar cell electrode of each test sufficient contact probe;

[0011] 第三步:打开真空系统,使太阳能电池片吸附于上绝缘板表面; [0011] The third step: opening the vacuum system, the solar cell sheet adsorbed on the surface of the insulating plate;

[0012] 第四步:打开测试仪,即开始测试太阳能电池片的各项性能参数。 [0012] The fourth step: opening the tester, the test begins the performance parameters of the solar cells.

[0013] 本发明的有益效果是:本发明的测试装置结构简单,成本低,测试方法简单快速,操作方便,测试结果准确。 [0013] Advantageous effects of the present invention is: a simple test apparatus structure of the present invention, low cost, simple and quick test method, easy to operate, accurate test results.

附图说明 BRIEF DESCRIPTION

[0014] 图1为本发明实施例的结构示意图。 [0014] FIG. 1 is a schematic structure of an embodiment of the present invention.

[0015] 图2为本发明实施例上绝缘板的结构示意图。 [0015] FIG. 2 is a schematic configuration example of the embodiment of the present invention, the insulating plate.

[0016] 图3为本发明实施例中绝缘板的结构示意图。 [0016] FIG. 3 is a schematic structure of the embodiment of the invention the insulating plate.

[0017] 图4为本发明实施例下绝缘板的结构示意图。 [0017] FIG. 4 is a schematic configuration example of the embodiment of the present invention, the insulating plate.

[0018] 下面结合附图对本发明做进一步说明。 [0018] DRAWINGS The present invention is further described.

具体实施方式 detailed description

[0019] 结合附图1所示,一种背接触太阳能电池片测试装置,包括厚度均为1mm的上、中、下三块绝缘板,所述三块绝缘板周边分别设有匹配的螺栓安装孔1,通过螺栓将上、中、下三块绝缘板固定在一起,中绝缘板8中部设有中空部4,下绝缘板9上设有八排探针插入孔和一个真空连接孔2,其中第一、第三、第五、第七排探针插入孔包括四对探针插入孔,第二、第四、第六、第八排探针插入孔包括三对探针插入孔,每对探针插入孔插入对应的一组测试探针,即一个电流测试探针3和一个电压测试探针7,测试探针高度为35mm,每排探针插入孔内的电流测试探针3和电压测试探针7分别与电流焊带和电压焊带焊接,在电流焊带和电压焊带之间设有绝缘层,电流焊带、电压焊带和绝缘层处于中绝缘板8的中空部4;上绝缘板6上设有略大于一组测试探针的二十八个通孔5, [0019] DRAWINGS A back contact solar cell 1 shown in the test apparatus, comprising both the thickness of 1mm, in the lower three insulating plate, surrounding the insulating plate are provided with three matching mounting bolts hole 1 by the bolts, in the lower three insulating plates together, the middle insulating plate 8 is provided with eight rows of probe insertion holes 9 of the hollow portion 4, and a lower insulating plate vacuum connection hole 2, wherein the first, third, fifth, seventh row of probe insertion holes includes four pairs of probe insertion holes, the second, fourth, sixth, eighth row of holes comprises three pairs of probe insertion probe insertion holes, each probe insertion hole corresponding to a set of test probes, i.e., a current and a voltage test probe 3 7 test probe, the test probe height of 35mm, each row of the probe insertion hole 3 and the current test probe voltage test probe 7 respectively current and voltage ribbon ribbon welding, the insulating layer is provided between the current and the welding voltage with ribbon, ribbon current, voltage and insulation layer ribbon in the hollow portion of the insulating plate 8 4 ; with slightly larger than a set of test probes twenty-eight through-holes 5 on the upper insulating plate 6, 组测试探针穿过通孔5至上绝缘板6上表面5mm ;每排电流测试探针和电压测试探针在焊带的一端分别设有电流联接线和电压联接线。 Group test probe 5mm through hole through the upper surface 5 oriented insulating plate 6; each row current and voltage test probe current test probes are provided and the voltage lines coupled line is coupled at one end of the ribbon. 每组测试探针的排列位置与背接触太阳能电池片背面的电极位置相匹配。 The position of the electrode arrangement position of each test probe in contact with the back sheet for solar battery backside match.

[0020] 一种采用如上所述的测试装置测试背接触太阳能电池片性能的方法,其步骤如下: [0020] A testing apparatus for testing using the method described above, the back-contact solar cell performance, the following steps:

[0021] 第一步:将下绝缘板9上所设的真空连接孔2与真空系统连接;将连接电流测试探针电流联接线和连接电压测试探针的电压联接线分别与测试仪连接; [0021] The first step: a vacuum connecting hole 9 provided on the lower insulating plate 2 connected to a vacuum system; Connect the current test probe connected to the voltage and current coupled line voltage test probe coupling lines are connected to the tester;

[0022] 第二步:将太阳能电池片放置于上绝缘板6上,轻轻按压太阳能电池片,使每组测试探针压缩,太阳能电池片电极与每组测试探针充分接触; [0022] Second Step: The solar cell sheet is placed on the upper insulating plate 6, solar cells gently press the test probe each compression, solar cell electrode and a sufficient contact each test probe;

[0023] 第三步:打开真空系统,使太阳能电池片吸附于上绝缘板6表面; [0023] The third step: opening the vacuum system, the solar cell sheet adsorbed on the surface of insulating plate 6;

[0024] 第四步:打开测试仪,即开始测试太阳能电池片的各项性能参数。 [0024] The fourth step: opening the tester, the test begins the performance parameters of the solar cells.

Claims (4)

  1. 1.一种背接触太阳能电池片测试装置,其特征在于:包括上、中、下三块绝缘板,所述三块绝缘板周边分别设有匹配的螺栓安装孔(1),通过螺栓将上、中、下三块绝缘板固定在一起,所述中绝缘板(8)设有中空部(4),所述下绝缘板(9)上设有若干排探针插入孔和一个真空连接孔(2),所述每排探针插入孔包括若干对探针插入孔,所述每对探针插入孔插入对应一组测试探针,即一个电流测试探针(3)和一个电压测试探针(7),所述每排探针插入孔内的电流测试探针(3)和电压测试探针(7)分别与电流焊带和电压焊带焊接,所述电流焊带和电压焊带之间设有绝缘层,所述电流焊带、电压焊带和绝缘层处于中绝缘板(8)的中空部(4);所述上绝缘板(6)上设有略大于一组测试探针的若干通孔(5),所述一组测试探针穿过通孔(5)至上绝缘板(6)上表面4mm〜6mm ;所述每排电流测试探针和电 A back contact solar cell wafer testing apparatus, characterized by: comprising upper, middle and lower three insulating plate, surrounding the insulating plate are respectively provided with three bolt holes matching (1), by a bolt , in the lower three insulating plates together, the insulating plate (8) provided with a hollow portion (4), the lower insulating plate has a plurality of probe insertion holes and a row of vacuum holes on the connector (9) (2), each said row comprising a plurality of probe insertion holes of the probe insertion hole, the insertion hole of each probe corresponding to a set of test probes, i.e., a current test probe (3) and a voltage test probe a needle (7), each row of the probe current test probe insertion hole (3) and a voltage test probe (7) are welded with the welding current and welding voltage with a welding current and voltage with a ribbon is provided between the insulating layer, with the welding current, welding voltage with the insulating layer and in the insulating plate (8) of the hollow section (4); the upper insulating plate (6) is provided with a set of tests on the probe is slightly larger than a plurality of pin through holes (5), the test probe set through a through hole (5) comes first insulating plate (6) surface 4mm~6mm; each row of the test probe and electrical current 测试探针在焊带的一端分别设有电流联接线和电压联接线。 Test probe is provided at one end of the welding current is coupled with the coupling line and the voltage line, respectively.
  2. 2.如权利要求1所述的一种背接触太阳能电池片测试装置,其特征在于:所述每组测试探针的排列位置与背接触太阳能电池片背面的电极位置相匹配。 2. An backing according to claim 1 in contact solar cell testing device, wherein: the arrangement position of each of the test probes in contact with the back electrode of the back surface of the solar cell sheet position matches.
  3. 3.如权利要求1所述的一种背接触太阳能电池片测试装置,其特征在于:所述上、中、下三块绝缘板的厚度均为10mm,所述每组测试探针高度为34mm〜36mm。 3. An backing according to claim 1 in contact solar cell testing apparatus, characterized in that: the upper, middle and lower three insulating plate thickness are 10mm, the height of each test probe is 34mm ~36mm.
  4. 4.一种采用如权利要求1所述的测试装置测试背接触太阳能电池片性能的方法,其特征在于: 第一步:将下绝缘板(9)上所设的真空连接孔(2)与真空系统连接;将连接电流测试探针电流联接线和连接电压测试探针的电压联接线分别与测试仪连接; 第二步:将太阳能电池片放置于上绝缘板(6)上,轻轻按压太阳能电池片,使每组测试探针压缩,太阳能电池片电极与每组测试探针充分接触; 第三步:打开真空系统,使太阳能电池片吸附于上绝缘板(6)表面; 第四步:打开测试仪,即开始测试太阳能电池片的各项性能参数。 A test using the test apparatus of claim 1 as a back-contact solar cell as claimed in claim properties, characterized in that: The first step: connecting the vacuum holes on the lower insulating plate (9) is established (2) connected to a vacuum system; connecting line current test probe coupled voltage coupled to a current line connected to the voltage test probe and are connected to the tester; Step: the solar cell sheet is placed on the upper insulating plate (6), gently press solar cells, so that each test probe is compressed, and the solar cell electrode of each test sufficient contact probe; the third step: opening the vacuum system, the solar cell sheet adsorbed on the insulating plate (6) surface; a fourth step : opening the tester, the test begins the performance parameters of the solar cells.
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