CN212622956U

CN212622956U - Electric connection device for testing solar cell

Info

Publication number: CN212622956U
Application number: CN202021004124.4U
Authority: CN
Inventors: 刘皎; 冯云峰; 张鹤仙
Original assignee: Gsolar Power Co ltd
Current assignee: Gsolar Power Co ltd
Priority date: 2020-06-04
Filing date: 2020-06-04
Publication date: 2021-02-26
Anticipated expiration: 2030-06-04

Abstract

The utility model belongs to a solar cell electric connection device, concretely relates to solar cell test is with electric connection device. The method is characterized in that: the testing device comprises an upper surface testing part and a lower surface testing part for testing the solar cell, wherein the upper surface testing part comprises a first frame and a conducting strip, a first testing area is arranged in the first frame, and the conducting strip is arranged in the first testing area and is fixedly connected with the first frame; the lower surface testing part comprises a second testing area, and a probe row is arranged in the second testing area. The utility model discloses a stable and reliable electricity is connected, has improved photoelectric conversion efficiency, has further improved the accuracy of test result.

Description

Electric connection device for testing solar cell

Technical Field

The utility model belongs to a solar cell electric connection device, concretely relates to solar cell test is with electric connection device.

Background

The solar cell is a semiconductor sheet which can generate electricity by the photovoltaic effect, the common size is 156X156mm, one surface of the sheet is a positive electrode, the other surface of the sheet is a negative electrode, and a conductive grid mesh or a conductive coating is arranged on the positive electrode surface and the negative electrode surface to collect current and voltage. During production and use of the solar cell, electrical correlation tests including an IV electrical property test, an EL electroluminescence test, a reverse current test and the like are often required. In the prior art, a reliable test electric connection scheme is that elastic conductive strips are respectively arranged on the upper surface and the lower surface of a tested solar cell, and a test probe is arranged on each elastic conductive strip to be in contact with the surface of the solar cell to realize electric conduction, but the thickness of each conductive strip is about 3mm, the height of each conductive strip is 3cm, serious shading can be generated, the problem that the shading on the surface of the solar cell is serious can be caused on the solar cell with more main grids, and the test effects related to light, such as an IV electric performance test and an EL electroluminescence test, are influenced.

SUMMERY OF THE UTILITY MODEL

In order to solve the above technical problem, the utility model provides a reduce shading area, improve photoelectric conversion efficiency's electric connection device is used in solar cell test.

The utility model relates to an electric connecting device for testing a solar cell, which comprises an upper surface testing part and a lower surface testing part for testing the solar cell, wherein the upper surface testing part comprises a first frame and a conductive bar, a first testing area is arranged in the first frame, and the conductive bar is arranged in the first testing area and is fixedly connected with the first frame; the lower surface testing part comprises a second testing area, a probe row is arranged in the second testing area, and the projections of the first testing area and the second testing area on the horizontal plane coincide with each other.

Preferably, the length of the conductive strip is between 2 and 50cm, the thickness is between 0.01 and 3mm, and the height is between 1 and 30 mm.

Preferably, the probe row comprises a plurality of probes which are arranged in sequence and regularly arranged, and an elastic component is arranged at the lower part of each probe.

More preferably, the elastic member is a spring.

Furthermore, the probe row is provided with a plurality of probe rows which are arranged in parallel, and the plurality of probe rows are arranged in the second test area.

Furthermore, the device also comprises a probe seat, and a plurality of probe banks are arranged on the probe seat.

Furthermore, the device also comprises a plurality of probe seats, each probe row corresponds to one probe seat, and the probes on each probe row are connected with the corresponding probe seats.

Furthermore, the number of the conducting strips is a plurality, the conducting strips are arranged in parallel, the lower surfaces of all the conducting strips are on the same horizontal plane, and the conducting strips are arranged in the first testing area and connected with the first frame; each conductive strip corresponds to one probe row, and each conductive strip is coincident with the projection of the corresponding probe row on the horizontal plane.

Furthermore, the conductive strip is a metal conductive strip or a composite conductive strip formed by combining metal and an insulator.

Furthermore, the composite conductive strip comprises a PCB strip, wherein two opposite side surfaces of the PCB strip are respectively provided with a tin coating, each tin coating is respectively provided with a copper foil strip, and the copper foil strips on the two sides of the PCB strip respectively extend to the outside of the PCB strip and are bent inwards to form the elastic contact.

Furthermore, the lower surface testing part further comprises a second frame and a second driving device, the second testing area is arranged inside the second frame, the second frame is further connected with the second driving device, and the second driving device is an air cylinder device or an electric cylinder device.

Furthermore, the upper surface testing part also comprises a first driving device, the first driving device is fixedly connected with the first frame, and the first driving device is an air cylinder device or an electric cylinder device.

The utility model has the advantages that:

the electric connection device for testing the solar cell has stable and reliable testing process, compared with the prior art, the utility model has the advantages that the conductive bar is utilized in the upper surface testing part to replace the upper surface device with the probe in the prior art, the thickness of the upper surface conductive bar is reduced, and the shading of light to the surface of the solar cell is obviously reduced; during testing, the second driving device drives the testing probe on the probe seat to tightly press the solar cell on the conductive strip, so that stable and reliable electric connection is realized, the photoelectric conversion efficiency is improved, and the accuracy of a testing result is further improved.

Drawings

Fig. 1 is a schematic structural view of embodiment 1.

Fig. 2 is a schematic structural view of embodiment 3.

Fig. 3 is a top view of the first frame and the conductive strip.

Figure 4 is a top view of the second frame and probe mount.

FIG. 5 is a first schematic diagram of probe electrical connections.

Fig. 6 is a diagram of a PCB composite conductive strip and its structure.

FIG. 7 is a second schematic diagram of the probe structure.

Fig. 8 shows an arrangement 1 of the elastic probe in the probe holder.

Fig. 9 shows a mode 2 of arranging the elastic probe in the probe holder.

Reference numerals: 1-a solar cell; 2-a first frame; 3-a second drive; 4-a second frame; 5-a probe; 6-a first drive; 7-a conductive strip; 8-a probe seat; 9-PCB strip; 10-a spring contact; 11-copper foil strips; 12-insulating plate, 13-elastic component.

Detailed Description

Example 1

An electric connecting device is used in solar cell test, as shown in fig. 1, it contains the last surface test portion and the lower surface test portion that test solar cell 1, and last surface test portion includes the busbar 7 of first frame 2 and the mutual parallel arrangement of a plurality of, and the lower surface of a plurality of busbar 7 is on same horizontal plane. As shown in fig. 3, a first testing area is disposed in the first frame 2, and a plurality of conductive strips 7 are disposed in the first testing area and fixedly connected to the first frame 2. As shown in fig. 4, the lower surface testing portion includes a second testing area, a plurality of probe rows arranged in parallel are arranged in the second testing area, the number of the probe rows is consistent with the number of the conductive strips 7, the plurality of probe rows are all arranged in the second testing area, each probe row includes a plurality of probes 5 arranged in sequence and arranged in a certain arrangement rule, and an elastic component 13 is arranged at the lower part of each probe 5. For example, a plurality of probes 5 in a probe row are divided into several groups, the distances between the probes 5 in adjacent groups are equal, and the probes 5 in the groups are regularly arranged; or all the probes 5 in the probe row can be arranged at equal intervals; or the probe rows can be arranged according to a certain rule. The probes 5 on the probe row are equidistantly arranged in the probe seat 8 along the extension direction thereof, the lower part of each probe 5 is provided with a spring, an insulating plate 12 can be arranged between the probe 5 and the spring, the probe 5 is perpendicular to the probe seat 8 and extends towards the direction far away from the probe seat 8, the probe 5 is externally connected with a testing device through a lead, and when the electrical performance of the solar cell 1 is tested, the projections of the first testing area and the second testing area on the horizontal plane coincide.

As shown in fig. 3 and 4, the probe seat 8 in the second frame 4 is preferably a bar shape, the number of the bar shape matches with the number of the conductive bars 7 in the first frame 2, and when testing, the projections of the conductive bars 7 in the first frame 2 and the probe seat 8 in the second frame 4 on the horizontal plane coincide with each other. The conductive strip 7 in this embodiment is preferably a metal conductive strip.

The lower surface testing part of the present embodiment further includes a second frame 4 and a second driving device 3, the second testing area is disposed inside the second frame 4, the second driving device 3 is connected to the second frame 4, and the second driving device 3 is preferably a cylinder device or an electric cylinder device. The utility model discloses utilize second drive arrangement 3 to drive second frame 4 and follow the perpendicular line direction and move repeatedly. During testing, the projections of the second testing area and the first testing area on the horizontal plane are mutually overlapped.

During testing, the solar cell 1 is placed between the first testing area and the second testing area, the second driving device 3 drives the second frame 4 to move upwards along the vertical line direction, the solar cell 1 is pressed upwards to the lower surface of the conductive strip 7 in the first testing area, and because the conductive strip 7 in the first frame 2 and the projection of the probe seat 8 in the second frame 4 on the horizontal plane are overlapped with each other, when the second frame 4 drives the solar cell 1 to move upwards and presses the solar cell 1 to the lower surface of the conductive strip 7 in the first testing area, the solar cell 1 simultaneously receives the downward pressure of the conductive strip 7 and the upward supporting force of the probe 5 in the probe seat 8, on one hand, the solar cell 1 can be stressed uniformly during testing, the situation that the solar cell 1 is inclined or crushed due to uneven stress is avoided, and on the other hand, the conductive strip 7 can be ensured to be reliably contacted with the solar cell 1. The invention utilizes the conductive bar 7 to contact the main grid on the upper surface of the solar cell 1 to collect the electric signal on the upper surface of the solar cell 1, and the probe 5 is electrically contacted with the lower surface of the solar cell 1 to collect the electric signal in the opposite area of the main grid. After the test is finished, the second driving device 3 drives the second frame 4 to move downwards and away from the solar cell 1.

The spring is respectively arranged at the lower part of each probe 5, when the solar cell 1 is lifted by the probes 5, each probe 5 can independently generate elastic deformation, each probe 5 can be in contact with the lower surface of the solar cell 1, current can be collected well, effective contact of the probes 5 is achieved, and stability and accuracy of test results are improved. The PA100-H4 Royal probe can also be selected and used in the invention.

The preferred embodiment is that the number of conductive strips 7 in the first frame 2 is between 1 and 30, the length of the conductive strips 7 is between 2 and 50cm, the thickness is between 0.01 and 3mm, and the height is between 1 and 30 mm. The utility model discloses a reduce the thickness of busbar 7, reduced 1 surperficial sheltering from of solar cell, improved photoelectric conversion efficiency, improved the reliability of test result. The number of the probes 5 is preferably 1 to 100 in the present invention.

As shown in fig. 7 and 8, in the present embodiment, a plurality of probe lines are arranged on the same probe holder 8. Fig. 7 is another electrical connection mode of the probe 5 of the present invention during testing, all the probes 5 are connected together and then externally connected to a testing device.

As shown in fig. 5, in this embodiment, the 3 rd test probe 5 and the 8 th test probe 5 on one of the probe rows are electrically connected to collect a voltage signal of the solar cell 1, the remaining test probes 5 are electrically connected to collect a current signal of the solar cell 1, and different test devices are externally connected to different test probes 5 to perform corresponding electrical performance tests.

Example 2

This embodiment is substantially the same as embodiment 1, except that the present invention further comprises a plurality of probe holders 8, each probe row corresponds to one probe holder 8, and the probes 5 on each probe row are all connected to the corresponding probe holders 8, as shown in fig. 9. The probe card row can be conveniently replaced and position adjusted by connecting the probe card rows through different probe holders 8.

Example 3

As shown in fig. 2, this embodiment is substantially the same as embodiments 1 and 2, in which a first driving device 6 is further disposed on the upper surface testing portion, the first driving device 6 is connected to the first frame 2, the first driving device 6 is used to drive the first frame 2 to move, and the first driving device 6 is an air cylinder device or an electric cylinder device. The utility model discloses a move when first frame 2 and second frame 4, solved the test demand of different site environment.

Example 4

The conductive strip 7 in this embodiment is a metal strip or a composite conductive strip formed by combining metal and an insulator, as shown in fig. 6, wherein the composite conductive strip comprises a PCB strip 9, two opposite side surfaces of the PCB strip are respectively provided with a tin coating, each tin coating is respectively provided with a copper foil strip 11, the copper foil strips 11 at the two sides of the PCB strip 9 respectively extend to the outside of the PCB strip 9 to form an elastic contact 10, but the two elastic contacts 10 are not electrically connected, and the elastic structure can change the hard contact between the conductive strips 7 and the solar cell 1 into elastic contact, buffer the impact force of the conductive strips 7 on the upper surface of the solar cell 1 during testing, and avoid the damage to the solar cell 1, and on the other hand, when the IV test is carried out, the two elastic contacts 10 on the conductive strips 7 collect voltage signals on one surface and current signals on the other surface, so that the test of the solar cell 1 is facilitated.

Claims

1. An electric connection device for testing a solar cell is characterized in that: the testing device comprises an upper surface testing part and a lower surface testing part for testing the solar cell (1), wherein the upper surface testing part comprises a first frame (2) and a conducting strip (7), a first testing area is arranged in the first frame (2), and the conducting strip (7) is arranged in the first testing area and fixedly connected with the first frame (2); the lower surface testing part comprises a second testing area, a probe row is arranged in the second testing area, and the projections of the first testing area and the second testing area on the horizontal plane coincide with each other.

2. The electrical connection device for solar cell testing as claimed in claim 1, wherein: the conductive strips (7) have a length of 2-50cm, a thickness of 0.01-3mm and a height of 1-30 mm.

3. The electrical connection device for solar cell testing as claimed in claim 1, wherein: the probe row comprises a plurality of probes (5) which are arranged in sequence and are arranged regularly, and an elastic part (13) is arranged at the lower part of each probe (5).

4. The electrical connection device for solar cell testing as claimed in claim 3, wherein: the elastic component (13) is a spring.

5. The electrical connection device for solar cell testing according to claim 3 or 4, wherein: the probe row is provided with a plurality of probe rows which are arranged in parallel, and the plurality of probe rows are all arranged in the second test area.

6. The electrical connection device for solar cell testing as claimed in claim 5, wherein: the probe device is characterized by further comprising a plurality of probe seats (8), each probe row corresponds to one probe seat (8), and the probes (5) on each probe row are connected with the corresponding probe seats (8).

7. The electrical connection device for solar cell testing as claimed in claim 6, wherein: the number of the conductive strips (7) is a plurality, the conductive strips are arranged in parallel, the lower surfaces of all the conductive strips (7) are on the same horizontal plane, and the conductive strips (7) are arranged in the first test area and connected with the first frame (2); each conductive strip (7) corresponds to one probe row, and each conductive strip (7) is coincided with the projection of the corresponding probe row on the horizontal plane.

8. The electrical connection device for solar cell testing as claimed in claim 7, wherein: the conductive strips (7) are metal conductive strips or composite conductive strips formed by compounding metal and insulators.

9. The electrical connection device for solar cell testing according to claim 8, wherein: the composite conductive strip comprises PCB strips (9), wherein two opposite side faces of the composite conductive strip are respectively provided with a tin coating, each tin coating is respectively provided with a copper foil strip (11), the copper foil strips (11) on two sides of each PCB strip (9) are respectively extended to the outside of the PCB strips (9) and are bent inwards to form elastic contacts (10).

10. The electrical connection device for solar cell testing as claimed in claim 9, wherein: the lower surface testing part further comprises a second frame (4) and a second driving device (3), the second testing area is arranged inside the second frame (4), the second frame (4) is further connected with the second driving device (3), and the second driving device (3) is an air cylinder device or an electric cylinder device.

11. The electrical connection device for solar cell testing as claimed in claim 10, wherein: the upper surface testing part also comprises a first driving device (6), the first driving device (6) is fixedly connected with the first frame (2), and the first driving device (6) is an air cylinder device or an electric cylinder device.