CN206442353U - Crystal silicon solar batteries built-in testing device - Google Patents
Crystal silicon solar batteries built-in testing device Download PDFInfo
- Publication number
- CN206442353U CN206442353U CN201621490183.0U CN201621490183U CN206442353U CN 206442353 U CN206442353 U CN 206442353U CN 201621490183 U CN201621490183 U CN 201621490183U CN 206442353 U CN206442353 U CN 206442353U
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- CN
- China
- Prior art keywords
- conductor
- probe support
- silk pressing
- crystal silicon
- testing device
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- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
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- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
- Y02E—REDUCTION OF GREENHOUSE GAS [GHG] EMISSIONS, RELATED TO ENERGY GENERATION, TRANSMISSION OR DISTRIBUTION
- Y02E10/00—Energy generation through renewable energy sources
- Y02E10/50—Photovoltaic [PV] energy
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Abstract
The purpose of this utility model is that traditional main gate line cell piece can either be detected by providing one kind, can detect the crystal silicon solar batteries built-in testing device of dereliction grid cell piece again.Including data processor, display, analog light source, power supply, test platform, power supply is data processor, display, analog light source provide power supply, data processor is connected respectively with display and test platform, analog light source is correspondingly arranged with test platform, the test platform includes base, conductor, silk pressing, probe support, the lower section of probe support is provided with silk pressing, silk pressing lower vertical direction is provided with conductor, conductor two ends are connected on probe support, and probe support is arranged on the surface of base.The utility model is integral type electrical contact conductor, and contact surface is the plane of high roughness value, can be directed to dereliction grid cell built-in testing, moreover it is possible to which test has main grid cell piece.There is directive significance in solar battery sheet detection field, possess good market prospects.
Description
Technical field
The utility model belongs to field of new energy technologies, more particularly to solar energy, specifically a kind of crystal silicon solar
Cell slice test device.
Background technology
Traditional cell piece negative electrode is made up of main gate line and secondary grid line, and its IV curve test method is usually to use a row
Probe contacts cell piece main gate line, platform surface contact cell piece positive electrode；Cell piece surface is irradiated by solar simulator
Photoelectric effect is produced, probe carrys out gathered data signal to gather IV data.
Traditional main grid cell piece is in IV Data Collections, and a small number of cell pieces are often because artificial origin or machine reason
And cause probe to deviate with main grid line position.One causes cell piece to survey number the dual shading because of probe and main gate line
According to relatively low or inaccurate；Two no all formed with main gate line in contact for carrying out probe contact, it is impossible to collect cell piece generation
All electric currents, so as to cause the inaccuracy of data.Therefore this is also improved place needed for conventional one-piece cell slice test instrument.
For dereliction grid line cell piece, traditional tester is can not to collect IV data.Because probe contact can not connect
All thin grid lines are connected to, so the electric current that cell piece photoelectric effect is produced all can not be pooled on probe, so that can not essence
Really measure the IV data of cell piece.
On the test problem of monolithic battery piece or dereliction grid cell piece, there are following patent or document to propose this
Solution.1. will is defended quick《The probe row of dereliction grid solar cell piece measurement equipment》[the patent No.：CNNZO2600001
U] in mention, two row's probe cross-cutting distributions are in the both sides of fixed probe support, and two row's probes are enough to cover all thin
Grid line.2. Shen Jian《The tester of solar battery sheet》[the patent No.：CN 1O2540037 A] in mention, the conductor of tester
All thin grid line formation is contacted with cell piece, so can effectively collect all electric currents of cell piece generation.3. Shen Jian《Solar energy
The tester of cell piece》[the patent No.：The U of CN 201945665] in conductor, under any circumstance can be with cell piece grid line shape
Into contact, therefore without worrying the drift condition of cell piece.
To defend will quick for above-mentioned《The probe row of dereliction grid solar cell piece measurement equipment》Though, its improved probe of institute
The thin grid line of cell piece so can be all touched, but virtually increases the shading-area of probe, causes its test data to be deposited
In inaccuracy.For above-mentioned Shen Jian's《The tester of solar battery sheet》, conductor only have two ends by fixture imposed load from
And contacted with the formation of cell piece thin grid line, but it can not ensure that all thin grid lines all can contact (meeting in the middle part of conductor with conductor formation
Have situation that is uneven or tilting), cause test data inaccurate.
Therefore the technical barrier existed now is still：
1st, the probe of traditional tester may can not align with main gate line in some cases, cause test result to be forbidden
Really；
2nd, traditional tester be able to not can not be tested dereliction grid cell piece.
The content of the invention
The purpose of this utility model is that traditional main gate line cell piece can either be detected by providing one kind, can detect dereliction again
The crystal silicon solar batteries built-in testing device of grid cell piece.
In order to achieve the above object, the technical solution adopted in the utility model is：A kind of crystal silicon solar batteries built-in testing
Device, including data processor, display, analog light source, power supply, test platform, power supply are data processor, display, mould
Intend light source and power supply is provided, data processor is connected respectively with display and test platform, and analog light source is corresponding with test platform to be set
Put, the test platform includes base, conductor, silk pressing, probe support, the lower section of probe support, which is provided with the downside of silk pressing, silk pressing, hangs down
Nogata is provided with conductor upwards, and conductor two ends are connected on probe support, and probe support is arranged on the surface of base.
Silk pressing is that two ends are connected on probe support, and silk pressing is provided with several, provided with number below the vertical direction of several silk pressings
Root conductor.The conductor is flexible conductor.
Probe support is provided with data line, and the data that conductor is obtained are sent in data processor.
Conductor and the size of cell piece contact force are controlled using silk pressing, in case cell piece is destroyed.Silk pressing is primarily served
Flatten conductor and cause conductor to form good electrical contact with cell piece grid line.
Preferably, silk pressing is wear-resisting transparent material such as soft glass PVC, and quantity is 10-15 roots, a diameter of 1mm.
The conductor is copper conductor, and high roughness plane of its surface Jing Guo coarse processing, its width is 0.8-1.3mm,
The quantity and width of welding are consistent when the quantity and width of conductor are with establishment of component.Preferably 4 conductors.
After conductor and cell piece grid line form good electrical connection, analog light source irradiation cell piece surface produces photoelectricity
Effect, then current information is transmitted to data processor via probe support.Data processor is calculated so as to obtain by set again
Go out IV data messages.
The present invention difference maximum with traditional tester is：Traditional instrument is Split type electric contact probe, so can only
For there is main grid cell piece to be tested；The present invention is integral type electrical contact conductor, and contact surface is the plane of high roughness value,
Dereliction grid cell built-in testing can be directed to, moreover it is possible to which test has main grid cell piece.Have in solar battery sheet detection field and instruct
Meaning, possesses good market prospects.
Brief description of the drawings
Fig. 1 the utility model theory structure schematic diagrams；
Fig. 2 the utility model test platform architecture schematic diagrames；
Overlooking the structure diagram after probe support is removed in this practicality of Fig. 3；
In figure：1 base；2 cell pieces；3 conductors；4 silk pressings；5 probe supports.
Embodiment
The utility model is further described below in conjunction with the accompanying drawings.
A kind of crystal silicon solar batteries built-in testing device, including data processor, display, analog light source, power supply, test
Platform, power supply is data processor, display, analog light source provide power supply, data processor and display and test platform point
Do not connect, analog light source is correspondingly arranged with test platform, test platform includes base 1, conductor 3, silk pressing 4, probe support 5, visit
The lower section of needle rack 5 is provided with silk pressing 4, and silk pressing 4 is connected with conductor 3, and probe support 5 is arranged on the surface of base 1, probe support
5 lower section is provided with silk pressing 4, and the lower vertical direction of silk pressing 4 is provided with conductor 3, and the two ends of conductor 3 are connected on probe support 5, probe
Support 5 is arranged on the surface of base 1.
Probe support 5 is provided with data line, and the data that conductor 3 is obtained are sent in data processor.
Silk pressing 4 is that two ends are connected on probe support 5, and silk pressing 4 is set provided with several below the vertical direction of several silk pressings 4
There are several conductors 3.
Silk pressing 4 is wear-resisting transparent material, and quantity is 10-15 roots, a diameter of 1mm.
Silk pressing 4 is soft glass PVC.
Conductor 3 is copper conductor, and high roughness plane of its surface Jing Guo coarse processing, its width is 0.8-1.3mm.
Conductor 3 is strip, and quantity is 4.
Conductor 3 is formed after good electrical connection with the grid line of cell piece 2, and analog light source irradiation cell piece 2 surface produces light
Electrical effect, then current information is transmitted to data processor via probe support 5.Data processor again by it is set calculate so as to
Draw IV data messages.
Certainly, the above is only preferred embodiment of the present utility model, it is impossible to be considered as being used to limit to utility model
Scope of embodiments.The utility model is also not limited to the example above, and those skilled in the art are in this practicality
The equivalent change made in new essential scope and improvement etc., all should belong to the utility model patent covering scope.
Claims (7)
1. a kind of crystal silicon solar batteries built-in testing device, including data processor, display, analog light source, power supply, test are flat
Platform, power supply is data processor, display, analog light source provide power supply, and data processor is distinguished with display and test platform
Connection, analog light source is correspondingly arranged with test platform, it is characterised in that：Test platform includes base (1), conductor (3), silk pressing
(4), probe support (5), the lower section of probe support (5) is provided with silk pressing (4), and silk pressing (4) is connected with conductor (3), probe support (5)
The surface of base (1) is arranged on, the lower section of probe support (5) is provided with silk pressing (4), and silk pressing (4) lower vertical direction is provided with
Conductor (3), conductor (3) two ends are connected on probe support (5), and probe support (5) is arranged on the surface of base (1).
2. crystal silicon solar batteries built-in testing device according to claim 1, it is characterised in that：Probe support is set on (5)
There is data line, the data that conductor (3) is obtained are sent in data processor.
3. crystal silicon solar batteries built-in testing device according to claim 1, it is characterised in that：Silk pressing (4) connects for two ends
It is connected on probe support (5), silk pressing (4) is provided with several conductors (3) provided with several below the vertical direction of several silk pressings (4).
4. crystal silicon solar batteries built-in testing device according to claim 3, it is characterised in that：Silk pressing (4) is wear-resisting
Transparent material, quantity is 10-15 roots, a diameter of 1mm.
5. crystal silicon solar batteries built-in testing device according to claim 4, it is characterised in that：Silk pressing (4) is soft glass
PVC。
6. crystal silicon solar batteries built-in testing device according to claim 1, it is characterised in that：Conductor (3) is copper conductor,
High roughness plane of its surface Jing Guo coarse processing, its width is 0.8-1.3mm.
7. crystal silicon solar batteries built-in testing device according to claim 1, it is characterised in that：Conductor (3) is strip,
Quantity is 4.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201621490183.0U CN206442353U (en) | 2016-12-30 | 2016-12-30 | Crystal silicon solar batteries built-in testing device |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201621490183.0U CN206442353U (en) | 2016-12-30 | 2016-12-30 | Crystal silicon solar batteries built-in testing device |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN206442353U true CN206442353U (en) | 2017-08-25 |
Family
ID=59643161
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201621490183.0U Expired - Fee Related CN206442353U (en) | 2016-12-30 | 2016-12-30 | Crystal silicon solar batteries built-in testing device |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN206442353U (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN111257605A (en) * | 2020-02-03 | 2020-06-09 | 上海华力集成电路制造有限公司 | Probe card and WAT test machine |
-
2016
- 2016-12-30 CN CN201621490183.0U patent/CN206442353U/en not_active Expired - Fee Related
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN111257605A (en) * | 2020-02-03 | 2020-06-09 | 上海华力集成电路制造有限公司 | Probe card and WAT test machine |
| CN111257605B (en) * | 2020-02-03 | 2022-06-14 | 上海华力集成电路制造有限公司 | Probe card and WAT test machine |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| GR01 | Patent grant | ||
| GR01 | Patent grant | ||
| CF01 | Termination of patent right due to non-payment of annual fee |
Granted publication date: 20170825 Termination date: 20201230 |
|
| CF01 | Termination of patent right due to non-payment of annual fee |