CN112367050A - Electrical performance testing method suitable for large-size solar cell - Google Patents
Electrical performance testing method suitable for large-size solar cell Download PDFInfo
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- CN112367050A CN112367050A CN202011077991.5A CN202011077991A CN112367050A CN 112367050 A CN112367050 A CN 112367050A CN 202011077991 A CN202011077991 A CN 202011077991A CN 112367050 A CN112367050 A CN 112367050A
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- 238000012360 testing method Methods 0.000 title claims abstract description 34
- 239000000523 sample Substances 0.000 claims abstract description 96
- 229910052782 aluminium Inorganic materials 0.000 claims abstract description 24
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 claims abstract description 24
- 229910052751 metal Inorganic materials 0.000 claims abstract description 17
- 239000002184 metal Substances 0.000 claims abstract description 17
- 238000010998 test method Methods 0.000 claims abstract description 9
- 230000003068 static effect Effects 0.000 claims abstract description 4
- 238000000034 method Methods 0.000 claims description 8
- 229910021419 crystalline silicon Inorganic materials 0.000 claims description 7
- 239000000758 substrate Substances 0.000 claims description 6
- BQCADISMDOOEFD-UHFFFAOYSA-N Silver Chemical compound [Ag] BQCADISMDOOEFD-UHFFFAOYSA-N 0.000 claims description 4
- 229910052709 silver Inorganic materials 0.000 claims description 4
- 239000004332 silver Substances 0.000 claims description 4
- 229910000838 Al alloy Inorganic materials 0.000 claims description 2
- -1 silver-aluminum Chemical compound 0.000 claims description 2
- 238000010586 diagram Methods 0.000 description 9
- 238000005259 measurement Methods 0.000 description 6
- 230000000694 effects Effects 0.000 description 3
- 238000011056 performance test Methods 0.000 description 3
- 230000005684 electric field Effects 0.000 description 2
- 239000004065 semiconductor Substances 0.000 description 2
- 238000009827 uniform distribution Methods 0.000 description 2
- 238000007792 addition Methods 0.000 description 1
- 239000000969 carrier Substances 0.000 description 1
- 238000001514 detection method Methods 0.000 description 1
- 238000005286 illumination Methods 0.000 description 1
- 238000004519 manufacturing process Methods 0.000 description 1
- 239000000463 material Substances 0.000 description 1
- 238000000691 measurement method Methods 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 238000011160 research Methods 0.000 description 1
- 230000000717 retained effect Effects 0.000 description 1
- 238000004088 simulation Methods 0.000 description 1
- 238000003860 storage Methods 0.000 description 1
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Classifications
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- H—ELECTRICITY
- H02—GENERATION; CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
- H02S—GENERATION OF ELECTRIC POWER BY CONVERSION OF INFRARED RADIATION, VISIBLE LIGHT OR ULTRAVIOLET LIGHT, e.g. USING PHOTOVOLTAIC [PV] MODULES
- H02S50/00—Monitoring or testing of PV systems, e.g. load balancing or fault identification
- H02S50/10—Testing of PV devices, e.g. of PV modules or single PV cells
- H02S50/15—Testing of PV devices, e.g. of PV modules or single PV cells using optical means, e.g. using electroluminescence
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
- Y02E—REDUCTION OF GREENHOUSE GAS [GHG] EMISSIONS, RELATED TO ENERGY GENERATION, TRANSMISSION OR DISTRIBUTION
- Y02E10/00—Energy generation through renewable energy sources
- Y02E10/50—Photovoltaic [PV] energy
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- Photovoltaic Devices (AREA)
Abstract
The invention provides an electrical property test method suitable for a large-size solar cell, which comprises the following steps: preparing a battery piece to be tested: the battery piece to be tested is a large-size battery piece formed by connecting N sliced batteries in series, M aluminum strips are arranged on the back of the battery piece to be tested, metal electrodes are arranged on the aluminum strips, and N and M are positive integers larger than 1; preparing a probe row: removing all probes on the probe row, installing voltage probes, wherein the voltage probes are distributed in the middle of each sliced battery, the voltage probes are in contact with aluminum strips on the back surface of the battery piece, only one voltage probe is arranged on each aluminum strip, and the metal probes are uniformly distributed on the N sliced batteries of the battery piece; installing current probes on two sides of a voltage probe; placing the test battery piece into a tester with the back side facing upwards in a calibration mode of an IV tester, and testing the dynamic and static stability; and taking out the battery pieces for testing, putting the battery pieces to be tested into the battery pieces for testing in batches. The invention can improve the accuracy of the test.
Description
Technical Field
The invention belongs to the technical field of performance test of crystalline silicon solar cells, and particularly relates to an electrical performance test method suitable for large-size solar cells, in particular to an electrical performance test method suitable for 210mm slice cells.
Background
A common IV tester on the market comprises a simulation light source, an electronic load, a temperature detection system, a data acquisition system, a display device, a storage system and the like. The IV test is used for representing the relation between the output voltage and the current of the solar cell under a certain illumination condition, and the core principle of the IV test is the photovoltaic effect. When light with a specific frequency is irradiated on a non-uniform semiconductor, carriers are redistributed due to the action of a built-in electric field, so that electromotive force is generated inside the semiconductor material, and current is generated if a loop is formed, the current is called photogenerated current, and the photoelectric effect caused by the built-in electric field is the photovoltaic effect. When the electrical performance of a large-size solar cell is tested, the solar simulator is used for providing a light source, the probes collect current, and the density degree and the arrangement mode of the probes can obviously influence the test result of the electrical performance of the solar cell.
The probes are divided into current pins and voltage pins, and in order to improve the testing efficiency of the general IV tester for production lines, a double-probe-row structure is adopted, the current value passing through each probe row is about 1-2A, and the maximum voltage drop is generated at the connection position of the line. Usually, a four-wire method is adopted for testing, a pair of current leads can be directly connected to two ends of a resistor to be tested, a pair of voltage measuring leads are close to the resistor to be tested, and because the impedance of a voltage measuring loop is very high, the current flowing through the voltage leads is very small, and the testing error caused by the resistance of the leads can be effectively eliminated. However, when the existing testing instrument is used for measuring the electrical property of a 210mm battery, because the positions and the interface numbers of a current line and a voltage line of the equipment are limited, a real four-line method cannot be adopted for testing, and a two-line method is adopted for measuring the resistance, so that the voltage value on one probe row cannot be correctly measured by a voltage needle, the measurement result is inaccurate, the lead resistance brings measurement errors in the measurement of low resistance, and particularly, the filling factor is low.
Disclosure of Invention
The invention aims to solve the problems and provides a method for testing the electrical performance of a solar cell, which can improve the filling factor obtained by measurement, further improve the measurement accuracy and improve the testing efficiency.
In order to achieve the purpose, the invention adopts the following technical scheme: an electrical property test method suitable for a large-size solar cell specifically comprises the following steps:
s0: preparing a battery piece to be tested: the battery piece to be tested is a large-size battery piece formed by connecting N sliced batteries in series, M aluminum strips are arranged on the back of the battery piece to be tested, metal electrodes are arranged on the aluminum strips, and N and M are positive integers larger than 1;
s1: preparing a probe row: removing all probes on the probe row, installing voltage probes, wherein the voltage probes are distributed in the middle of each sliced battery, the voltage probes are in contact with aluminum strips on the back surface of the battery piece, only one voltage probe is arranged on each aluminum strip, and the metal probes are uniformly distributed on the N sliced batteries of the battery piece;
s2: installing current probes on two sides of a voltage probe;
s3, adopting a calibration mode of an IV tester, putting the back side of the battery piece for testing upwards into the tester, and testing the dynamic and static stability;
and S4, taking out the battery pieces for testing, putting the battery pieces to be tested into the battery pieces, and carrying out batch testing.
Further, the battery piece to be measured is a 210mm battery piece formed by connecting 3 sliced batteries in series.
Further, the metal electrode is an aluminum electrode, a silver electrode or a silver-aluminum alloy electrode.
Further, the voltage probe is positioned on the aluminum strip on the back surface of the cell piece, and/or the lap joint of the aluminum strip and the metal electrode, and/or the metal electrode.
Further, in step S2, one current probe is mounted on each of both sides of the voltage probe.
Further, the solar cell sheet is a p-type substrate crystalline silicon solar cell and/or an n-type substrate crystalline silicon solar cell.
Compared with the prior art, the invention has the following advantages:
1. the voltage probes are rearranged, so that the current cannot be transmitted to other parts of the battery through the voltage probes to form a current loop, the generation of measurement errors is avoided, and the accuracy of the test is improved; meanwhile, accurate electrical performance parameters of each sliced battery can be obtained.
2. By the testing method, the filling factor is improved by about 1.5 percent and the testing efficiency is improved by about 0.5 percent.
Additional advantages, objects, and features of the invention will be set forth in part in the description which follows and in part will become apparent to those having ordinary skill in the art upon examination of the following or may be learned from practice of the invention.
Drawings
FIG. 1a is a schematic diagram of a three-voltage probe structure;
FIG. 1b is a schematic diagram of a single voltage probe configuration;
FIG. 1c is a circuit diagram of a three voltage probe;
FIG. 1d is a circuit diagram of a single voltage probe;
FIG. 2a is a schematic illustration of a voltage probe center type arrangement;
FIGS. 2b and 2c are schematic diagrams of voltage probe staggered arrangements;
FIG. 2d is a schematic diagram of a three voltage probe arrangement;
FIG. 2e is a schematic diagram of a six voltage probe arrangement;
FIG. 3 is a graph of fill factors for different voltage arrangements;
FIGS. 4a and 4b are schematic diagrams of an alternative arrangement of voltage probes according to an embodiment of the present invention;
FIGS. 5a and 5b are schematic diagrams illustrating the staggered arrangement of the voltage probes according to another embodiment of the present invention;
in the figure, 1 is a battery piece to be tested, 2 is a sliced battery, 3 is a voltage probe, 4 is a silver electrode, and 5 is a circuit probe.
Detailed Description
The present invention will be described in further detail with reference to the accompanying drawings and specific embodiments.
An electrical property test method suitable for a large-size solar cell specifically comprises the following steps:
s0: preparing a battery piece 1 to be tested: the battery piece to be tested is a large-size battery piece formed by connecting N sliced batteries 2 in series, M aluminum strips are arranged on the back of the battery piece to be tested, metal electrodes are arranged on the aluminum strips, and N and M are positive integers larger than 1; in this embodiment, the battery piece to be measured is a 210mm large-sized battery piece formed by connecting three sliced batteries in series;
s1: preparing a probe row: removing all probes on the probe row, installing voltage probes 3, wherein the voltage probes 3 are distributed in the middle of each sliced battery 2 and are in contact with aluminum strips on the back surface of the battery piece, and only one voltage probe is arranged on each aluminum strip and the metal probes are uniformly distributed on the N sliced batteries of the battery piece; specifically, each voltage probe is located on the centerline of each slice in the length direction, as shown in FIGS. 2b, 2c, and FIGS. 4a-4 d; the voltage probe is positioned on the aluminum strip on the back surface of the cell piece, and/or the lap joint part of the aluminum strip and the metal electrode, and/or the metal electrode; in this embodiment, the voltage probe is located on a metal electrode, which is a silver electrode 4;
s2: current probes 5 are mounted on both sides of the voltage probe, preferably one current probe on each side of the voltage probe as shown in fig. 4a, 4 b;
s3, adopting a calibration mode of an IV tester, putting the back side of the battery piece for testing upwards into the tester, and testing the dynamic and static stability; the stability of the electrical property test result is ensured;
and S4, taking out the battery pieces for testing, putting the battery pieces to be tested into the battery pieces, and carrying out batch testing.
The invention can be applied to a crystalline silicon solar cell with a p-type substrate or a crystalline silicon solar cell with an n-type substrate.
The principle of the invention is as follows:
for the two-wire method of measuring the electrical property of the connection mode, when one layer of probe row has more than one voltage probe, all the voltage probes are connected by the voltage bus, and the voltage probes are not completely insulated. As shown in fig. 1a and fig. 1c, taking three voltage probes on each probe row as an example, qualitatively analyzing that, since the light source cannot be absolutely uniformly distributed, a voltage drop due to current is generated, and a loop is easily formed among the voltage probes, such as a loop formed among R1, R2, and R3 in fig. 1c, the test accuracy is affected. As shown in fig. 1b and 1d, the possibility of forming loops is eliminated when there is only one voltage probe per probe bank. Therefore, the present embodiment adopts an arrangement mode in which only one voltage probe is retained on each probe row.
As shown in fig. 2 a-2 d, there are various arrangements of the voltage probes, such as center type, staggered type, three voltage probes, and six voltage probes. The applicant researches and discovers that the filling factor measured value is greatly influenced by adopting different voltage probe arrangement modes, the filling factors under the different voltage probe arrangement modes are shown in figure 3, and the result shows that the filling factor is the highest by adopting the staggered voltage probe arrangement mode. Therefore, the present invention adopts a staggered arrangement of voltage probes.
The invention is suitable for various sliced batteries, and when voltage probes are distributed, the voltage probes are required to be uniformly distributed on N sliced batteries of a battery piece; the uniform distribution here is relatively uniform distribution, and does not mean that the number of voltage probes on each sliced cell is absolutely equal. When the number of voltage probes is not a multiple of N, the number of voltage probes on each sliced cell may differ by 1.
Fig. 4a-4b schematically show an embodiment of the invention, namely: the number of slices is 3, the arrangement of the voltage probes and the current probes.
Fig. 5a-5b schematically show an embodiment of the invention, namely: in the case of the number of slices being 4, the voltage probes are arranged (current probes are omitted).
It should be understood that the present invention is not limited to the above two slice numbers, and in principle, a measurement method in which voltage probes are uniformly arranged on each sliced cell according to the slice number to obtain an accurate electrical performance parameter of each sliced cell falls within the protection scope of the present invention.
The specific embodiments described herein are merely illustrative of the spirit of the invention. Various modifications or additions may be made to the described embodiments or alternatives may be employed by those skilled in the art without departing from the spirit or ambit of the invention as defined in the appended claims.
Claims (6)
1. An electrical property test method suitable for a large-size solar cell is characterized by comprising the following steps: the method comprises the following steps:
s0: preparing a battery piece to be tested: the battery piece to be tested is a large-size battery piece formed by connecting N sliced batteries in series, M aluminum strips are arranged on the back of the battery piece to be tested, metal electrodes are arranged on the aluminum strips, and N and M are positive integers larger than 1;
s1: preparing a probe row: removing all probes on the probe row, installing voltage probes, wherein the voltage probes are distributed in the middle of each sliced battery, the voltage probes are in contact with aluminum strips on the back surface of the battery piece, only one voltage probe is arranged on each aluminum strip, and the metal probes are uniformly distributed on the N sliced batteries of the battery piece;
s2: installing current probes on two sides of a voltage probe;
s3, adopting a calibration mode of an IV tester, putting the back side of the battery piece for testing upwards into the tester, and testing the dynamic and static stability;
and S4, taking out the battery pieces for testing, putting the battery pieces to be tested into the battery pieces, and carrying out batch testing.
2. The electrical property test method suitable for large-sized solar cells according to claim 1, wherein: the battery piece to be measured is a 210mm battery piece formed by connecting 3 sliced batteries in series.
3. The electrical property test method suitable for large-sized solar cells according to claim 1, wherein: the metal electrode is an aluminum electrode, a silver electrode or a silver-aluminum alloy electrode.
4. The electrical property test method suitable for large-sized solar cells according to claim 1, wherein: the voltage probe is positioned on the aluminum strip on the back surface of the cell piece, and/or the lap joint of the aluminum strip and the metal electrode, and/or the metal electrode.
5. The electrical property test method suitable for large-sized solar cells according to claim 1, wherein: in step S2, one current probe is mounted on each side of the voltage probe.
6. The electrical property test method suitable for large-sized solar cells according to claim 1, wherein: the solar cell sheet is a p-type substrate crystalline silicon solar cell and/or an n-type substrate crystalline silicon solar cell.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202011077991.5A CN112367050B (en) | 2020-10-10 | 2020-10-10 | Electrical performance test method suitable for large-size solar cell |
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| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202011077991.5A CN112367050B (en) | 2020-10-10 | 2020-10-10 | Electrical performance test method suitable for large-size solar cell |
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| Publication Number | Publication Date |
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| CN112367050A true CN112367050A (en) | 2021-02-12 |
| CN112367050B CN112367050B (en) | 2023-11-03 |
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Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN113900057A (en) * | 2021-09-09 | 2022-01-07 | 天合光能(宿迁)光电有限公司 | Method for checking and detecting measuring equipment before and after test box replacement |
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2020
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| US20090224142A1 (en) * | 2006-10-03 | 2009-09-10 | Sharp Kabushiki Kaisha | Reverse bias processing apparatus and reverse bias processing method for photoelectric conversion devices |
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| CN103063996A (en) * | 2012-12-14 | 2013-04-24 | 浙江晶科能源有限公司 | Testing device of back-contacted solar cell piece |
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| CN113900057B (en) * | 2021-09-09 | 2023-08-29 | 天合光能(宿迁)光电有限公司 | Method for checking, detecting and measuring equipment before and after replacement of test box |
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| CN112367050B (en) | 2023-11-03 |
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