CN212627814U - Testing device for perovskite solar cell - Google Patents

Abstract

The utility model relates to a testing device for perovskite solar cell, comprising a base frame, a fixing clamp and a testing mechanism which are arranged on the base frame, wherein the base frame comprises a testing table and a bracket which is supported below the testing table and forms a testing space together with the testing table, and a light hole is formed on the testing table; the fixed clamp comprises a pair of clamping mechanisms which are relatively fixed below the test board, and the pair of clamping mechanisms are relatively fixed on two sides of the light hole; the testing mechanism comprises a pair of probe mechanisms arranged below the clamping mechanism, the pair of probe mechanisms are also oppositely arranged on two sides of the light hole, and the probe mechanisms are provided with probe arms obliquely extending towards the direction of the light hole. Through the utility model discloses a testing arrangement, but the electrical parameter of accurate test perovskite battery can be applicable to not unidimensional battery moreover, and this device simple structure easily operates, and the suitability is strong.

Description

Testing device for perovskite solar cell

Technical Field

The utility model relates to a solar cell test equipment field especially relates to a testing arrangement for perovskite solar cell.

Background

The perovskite solar cell rapidly grows up in the field of novel photovoltaic technology due to the advantages of being cleaner, light absorption characteristic, adjustable band gap, long service life of current carriers, high mobility, simple preparation process, low cost and the like, and becomes a research hotspot of the solar cell. Researchers predict that the conversion efficiency of the perovskite solar cell can reach 50%, which is 2 times of the conversion efficiency of the solar cell in the current market, and the perovskite solar cell has a wide commercial application prospect.

The rapid development of perovskite solar cells is witnessed in recent years, and the conversion rate is less than 3% in 2006 to 25.2% in 2019. Similarly, a method capable of accurately representing the electrical parameters of the perovskite solar cell is also needed, at present, the perovskite solar cell is similar to the existing silicon cell in testing principle, sunlight is simulated by using a xenon lamp, the perovskite solar cell is irradiated to generate current, and data signals are acquired by an instrument to obtain the electrical parameters of the perovskite solar cell. Because the perovskite solar cell structure is different from that of the traditional silicon-based cell, the clamp structure of the test equipment for the electrical parameters of the silicon-based cell cannot be applied to the test of the perovskite solar cell.

SUMMERY OF THE UTILITY MODEL

The utility model provides a testing arrangement for perovskite solar cell.

In order to achieve the above object, the present invention provides the following technical solutions:

the testing device for the perovskite solar cell comprises a base frame, a fixing clamp and a testing mechanism, wherein the fixing clamp and the testing mechanism are arranged on the base frame; the fixed clamp comprises a pair of clamping mechanisms which are relatively fixed below the test board, and the pair of clamping mechanisms are relatively fixed on two sides of the light hole; the testing mechanism comprises a pair of probe mechanisms arranged below the clamping mechanism, the pair of probe mechanisms are also oppositely arranged on two sides of the light hole, and the probe mechanisms are provided with probe arms obliquely extending towards the direction of the light hole.

Further, fixture is including the centre gripping arm that is used for the centre gripping to await measuring battery, be used for fixing the fixed baseplate of centre gripping arm, be equipped with a first spring of horizontal extension in the fixed baseplate, centre gripping arm one end is located in the fixed baseplate and with first spring looks butt, and the other end extends fixed baseplate along horizontal, forms the contact site for the butt battery that awaits measuring.

Furthermore, a buffer part is arranged on the contact part.

Further, the probe mechanism comprises a connecting base arranged below the test bench, the connecting base is provided with an extension arm extending transversely towards the test space, and the probe arm is fixedly arranged at the upper part of the extension arm.

Further, the probe arm comprises a probe rod and a second spring, the probe rod is located above the extension arm, the second spring is arranged between the probe rod and the extension arm, a connecting portion connected with the extension arm is formed at one end, far away from the light transmission hole, of the probe rod, and the second spring and the connecting portion are arranged at intervals.

Furthermore, the free end of the probe rod is provided with double rows of telescopic probes, and the telescopic quantity of the probes is 0.1 mm-50 mm.

Furthermore, a pair of binding posts is arranged on the outer side of the connecting base, and the binding posts are electrically connected with the probes through wires.

Further, testing arrangement still includes the temperature sensor of accuse temperature mechanism and measuration battery temperature that awaits measuring, accuse temperature mechanism sets up in the test space of light trap below, accuse temperature mechanism arranges in proper order from bottom to top: the cooling device comprises an outer fan, a lower radiating fin, a semiconductor refrigerator, an upper radiating fin and an inner fan, wherein the inner fan is located below the fixing clamp.

Further, the testing device further comprises a dryer disposed between the upper heat sink and the inner fan.

Furthermore, the testing device also comprises a control system for controlling the testing process and the temperature of the battery to be tested and a signal acquisition system for acquiring current and voltage signals, wherein the signal acquisition system is electrically connected with the control system and the testing mechanism respectively.

Compared with the prior art, the beneficial effects of the utility model reside in that: the utility model is used for perovskite solar cell's testing arrangement, through the relatively fixture that sets up and the combination of probe mechanism, can accurately test perovskite solar cell's electrical parameter, fixture and probe mechanism all can be suitable for not unidimensional battery moreover, and this device simple structure easily operates, and the suitability is strong.

Drawings

Fig. 1 is a schematic structural diagram of a testing apparatus for a perovskite solar cell according to an embodiment of the present invention.

Fig. 2 is a partially enlarged view of a portion a in fig. 1.

Fig. 3 is a top view of the schematic of the test setup of fig. 1 for a perovskite solar cell.

Fig. 4 is a bottom view of the schematic structural diagram of the testing apparatus for perovskite solar cells of fig. 1.

Wherein, 1-a pedestal, 11-a test bench, 12-a light hole, 13-a support, 14-a test space, 2-a fixed clamp, 20-a clamping mechanism, 21-a clamping arm, 211-an abutting part, 212-a contact part, 213-a buffer part, 22-a fixed base, 23-a first spring, 3-a test mechanism, 30-a probe mechanism, 31-a connecting base, 311-an extension arm, 312-a binding post, 32-a probe arm, a probe rod-321, a second spring-322, a connecting part-323, a probe-324, 4-a temperature control mechanism, 41-an external fan, 42-a lower heat sink, 43-a semiconductor refrigerator, 44-an upper heat sink, 45-an internal fan and 5-a temperature sensor, 6-dryer, 7-battery to be tested, 71-conductive glass and 72-electrode.

Detailed Description

In order to make those skilled in the art better understand the technical solution of the present invention, the technical solution of the embodiments of the present invention will be clearly and completely described below with reference to the accompanying drawings in the embodiments of the present invention, and it is obvious that the described embodiments are only some embodiments of the present invention, not all embodiments. Based on the embodiments in the present invention, all other embodiments obtained by a person skilled in the art without creative efforts shall belong to the protection scope of the present invention.

It should be noted that the terms "upper", "lower", etc. indicate orientations or positional relationships based on the orientations or positional relationships shown in the drawings, which are only used for convenience of simplifying the description of the present invention, and do not indicate or imply that the indicated devices or elements must have a specific orientation, be constructed and operated in a specific orientation, and thus, should not be construed as limiting the scope of the present invention. Specifically, in the utility model discloses in to the direction of simulation light directive is down.

In the various drawings of the present invention, certain dimensions of structures or portions may be exaggerated relative to other structural portions for ease of illustration and, thus, are provided only to illustrate the basic structure of the subject matter of the present invention.

As shown in fig. 1 to 4, the testing device for perovskite solar cell provided by the present invention comprises a base frame 1, a fixing clamp 2 and a testing mechanism 3, which are arranged on the base frame 1, wherein the base frame 1 comprises a testing platform 11, a support 13 supported below the testing platform 11 and forming a testing space 12 together with the testing platform 11, and a light hole 14 is formed on the testing platform; because the utility model discloses the perovskite solar cell that well awaits measuring (hereinafter be referred to as the battery that awaits measuring) adopts conductive glass 71 to make as the different active material of substrate deposit, when carrying out the electricity parameter test, the sensitive surface is the conductive glass face, consequently, will await measuring battery 7 and put the suitable position of adjustment below light trap 14 and fix with mounting fixture 2, and testing mechanism 3 connects the positive and negative electrode of awaiting measuring battery 7 respectively, and the simulation sunlight passes through light trap 14 shoots on awaiting measuring battery 7 to carry out the test of electricity parameter.

Specifically, the fixing clamp 2 includes a pair of clamping mechanisms 20 fixed relatively below the test bench 11, and the pair of clamping mechanisms 20 is fixed relatively on two sides of the light hole 14; the testing mechanism 3 includes a pair of probe mechanisms 30 disposed below the clamping mechanism 20, the pair of probe mechanisms 30 are also disposed on two sides of the light-transmitting hole 14, and the probe mechanisms 30 have probe arms 32 extending obliquely toward the light-transmitting hole 14.

In the utility model, the clamping mechanisms 20 at the two sides of the light hole 14 respectively clamp the two side walls of the conductive glass 71 of the battery 7 to be tested, so as to fix the battery 7 to be tested below the light hole 14, that is, the clamping mechanisms 20 do not contact the perovskite position of the battery 7 to be tested; during testing, the pair of probe arms 32 respectively abut against the positive and negative electrodes 22 of the battery 7 to be tested, so that the probe arms 32 and the electrodes 72 of the battery 7 to be tested are in good contact, and accurate electrical parameters are ensured to be measured.

In addition, the probe arm 32 is disposed obliquely towards the light hole 14, so that an upward force can be applied to the battery 7 under the battery 7, and the fixing of the battery 7 can be further strengthened by combining the fixing manner of the clamping mechanism 20.

The utility model discloses in, testboard 11 adopts preparation such as magnetism-loving metal or alloy material, is not limited to materials such as iron, nickel, iron cobalt nickel alloy, is convenient for with 3 fixed mounting of accredited testing organization. The light hole 14 is located in the middle of the test platform 11 and is symmetrically arranged with respect to the center of the test platform 11.

Further, the number of the brackets 13 is four, and the brackets 13 are disposed on the periphery of the light-transmitting hole 14. The support 13 is arranged on the test bench 11 in a matrix form, preferably, the support 13 is symmetrically arranged at the center of the test bench 11, so that the base frame 1 is stable in structure and attractive in overall appearance. The test space 12 is formed between four brackets 13 for accommodating the battery 7 to be tested and other components of the test apparatus.

Further, a pair of the clamping mechanisms 20 forms a fixing jig 2 for fixing the battery 7 to be measured. Preferably, the clamping mechanism 20 is symmetrically disposed about the center of the light-transmitting hole 14. Specifically, fixture 20 is including the centre gripping arm 21 that is used for the centre gripping battery 7 that awaits measuring, is used for fixing the fixed baseplate 22 of centre gripping arm 21, be equipped with a first spring 23 that transversely extends in the fixed baseplate 22, centre gripping arm 21 one end is located in the fixed baseplate 22 and is inconsistent with first spring 23, and the other end extends fixed baseplate 22 along transversely, forms the contact site 212 that is used for the butt battery 7 that awaits measuring. The distance between the pair of clamping mechanisms 20 is changed by adjusting the deformation of the first spring 23 so as to match batteries with different sizes, and the applicability of the testing device is improved.

Specifically, fixed baseplate 22 is fixed the below of testboard 11 is horizontal setting, fixed baseplate 22's inside size slightly is greater than first spring 23's diameter size, for first spring 23 provides a space that produces deformation, guarantees moreover first spring 23 only produces deformation along the transverse direction.

One end of the first spring 23 is fixedly connected to or abutted against the inner bottom wall of the fixed base 22, and the other end is abutted against the holding arm 21 in the fixed base 22.

The arm of the clamp 21 has an abutting part 211 abutting against the first spring, and a limiting part 221 engaged with the abutting part 211 is provided at an end port of the fixed base 22. When a battery 7 to be tested is installed, the clamping arms 21 are transversely pressed to enable the first spring 23 to be compressed, the distance between the two clamping arms 21 is adjusted, after the battery 7 to be tested is installed as required, the first spring 23 restores to be partially deformed, the clamping arms 21 clamp two sides of the conductive glass 71 of the battery 7 to be tested, and meanwhile, the abutting part 211 abuts against the first spring 23 in the fixed base 22; after the battery 7 to be tested is detached, in the process that the first spring 23 recovers the elastic deformation, the clamping arm 21 moves towards the light hole 14, and the limiting portion 221 can prevent the clamping arm 21 from being separated from the limitation of the fixed base 22.

Of course, the clamping arm 21 and the first spring 23 may be fixedly connected, in this case, the fixing base 22 does not need to be provided with the limiting portion 221, the clamping arm 21 does not need to be provided with the abutting portion 211, and the above structure can also achieve the purpose of clamping the side wall of the battery 7 to be tested and laterally adjusting the distance between the two clamping mechanisms 20.

It can be understood that, in the fixing clamp 2, one clamping mechanism 20 may be provided with the first spring 23, the other clamping mechanism 20 may not be provided with a spring, and the clamping arm 21 is directly fixed on the fixing base 22, which also achieves the purpose of fixing the battery 7 to be tested.

Further, the diameter of the contact part 212 is larger than that of the clamping arm 21, so that the contact area between the contact part and the battery 7 to be tested is increased, and the battery 7 to be tested is better fixed; on the other hand, the diameter of the contact part 212 is relatively large, so that the device can adapt to batteries with different thicknesses, and the applicability of the testing device is improved.

The contact part 212 is provided with a buffer part 213 which can buffer the abutting force when the contact part 212 contacts with the battery 7 to be tested, thereby avoiding the sample from being damaged; the buffer portion 213 can also increase the friction between the contact portion 212 and the battery 7 to be tested, prevent the battery 7 to be tested from sliding down due to the action of gravity, and further strengthen the fixation of the battery 7 to be tested. Preferably, the buffer 213 is made of a rubber material having a good elasticity.

In this embodiment, the testing mechanism 3 is composed of a pair of the probe mechanisms 30 for testing the battery 7 to be tested, the pair of the probe mechanisms 30 are respectively located at two sides of the battery 7 to be tested, and preferably, the probe mechanisms 30 are symmetrically arranged with respect to the center of the light hole 14.

Specifically, one of the probe mechanisms 30 is used to electrically connect to the positive electrode of the battery 7 to be tested, and the other probe mechanism 30 is used to electrically connect to the negative electrode, so as to connect the battery 7 to be tested to the test loop for testing.

Specifically, the probe mechanism 30 includes a connection base 31 disposed below the test stage 11, the connection base 31 has an extension arm 311 extending laterally toward the inside of the test space 12, and the probe arm 32 is fixedly disposed at an upper portion of the extension arm 311. In this embodiment, the connection base 31 is made of a magnetic material and is adsorbed below the test platform 11, and the position of the probe arm 32 relative to the battery 7 to be tested can be changed by adjusting the position of the connection base 31 according to the distance between the positive electrode and the negative electrode 22 of the battery 7 to be tested, so as to meet the requirement that the probe arm 32 is connected with the positive electrode and the negative electrode 72 of the battery 7 to be tested.

The extension arm 311 is located below the clamping mechanism 20, a space for accommodating the probe arm 32 is formed between the extension arm 311 and the clamping mechanism 20, and preferably, the probe arm 32 is located right below the clamping mechanism 20, so that the operation is convenient.

It will be appreciated that the probe arm 32 is disposed below the clamping mechanism 20, and is merely a vertically opposed position, and the projected positions of the two may not coincide.

Further, the probe arm 32 includes a probe rod 321 located above the extension arm 311, a double row of retractable probes 324 is disposed at a free end of the probe rod 321, that is, two probes 324 are disposed at a free end of the probe rod 321, one of the probes 324 is used for testing a voltage signal, and the other probe 321 is used for testing a current signal, so as to form a four-wire method for testing an electrical parameter, reduce an influence of a resistance, and improve a testing accuracy.

Further, the distance between the two probes 324 is set to be between 0.2mm and 0.5mm, and the two probes 324 are at a proper distance, so that the influence of resistance can be reduced and mutual interference is avoided.

The diameter of the probe 324 is set between 0.01mm and 3mm, and the probe can be suitable for electrodes of the battery 7 to be tested with different sizes; the probe 324 can be extended and retracted up and down, so that the probe 324 is abutted against the electrode 72, the probe 324 is in good contact with the electrode 72, and the test accuracy can be further improved; on the other hand, the probe 324 can be extended and retracted up and down to buffer the contact between the probe 324 and the electrode 72, so as to avoid the electrode 72 from being damaged, and preferably, the extension and retraction amount of the probe 324 is between 0.01mm and 50 mm.

Further, the probe arm further comprises a second spring 322 disposed between the probe rod 321 and the extension arm 311, a connection part 323 connected to the extension arm 311 is formed at an end of the probe rod 321 away from the light-transmitting hole 14, and the second spring 322 is spaced from the connection part 323. When the probe 324 contacts the battery 7 to be tested, the end of the probe rod 321 facing the light hole 14 is pressed downward by the battery 7 to be tested, the probe rod 321 presses the second spring 322 downward, and the other end of the probe rod 322 is fixed on the extension arm 311 through the connection part 323, so that the pressed second spring 322 applies an upward force to the probe rod 321, the contact between the probe 324 and the battery 7 to be tested is further increased, and the test accuracy is improved.

On the other hand, the end of the probe rod 321 can pull the battery 7 to be tested upwards, and the fixing clamp is used for fixing two sides of the battery 7 to be tested, so that a fixing mode for fixing the battery 7 to be tested in three directions is formed, and the fixing of the battery 7 to be tested is further enhanced.

The probe rod 322 is made of an insulating material, so that current is prevented from being conducted to other parts through the probe rod 322.

Specifically, the connecting portion 323 is pivotally connected to the probe shaft 321, it being understood that the connecting portion 323 can also be a fixed point on the extension arm 311, as long as the same purpose is achieved.

Of course, the probe arm 32 may also be a spring (not shown) fixedly disposed on the extension arm 311, the spring is oriented toward the free end extending in the direction of the light hole 14, and two rows of retractable probes are disposed at the free end, the probe 324 is connected to the positive and negative electrodes 72 of the battery 7 to be tested, and the spring has a pair of upward force applied to the battery 7 to be tested, so as to increase the contact between the probe arm 32 and the battery 7 to be tested and enhance the fixation of the battery 7 to be tested.

Further, a pair of terminals 312 are disposed on the outer side of the connection base 31, the terminals 312 and the probes 324 are electrically connected by wires, and the probes 324 are electrically connected with other components through the terminals 312.

The perovskite solar cell has the characteristics of long minority carrier service life and high carrier mobility, and a stable I-V test mode is required to be adopted when the electrical parameters of the cell are tested, so that the cell 7 to be tested is illuminated for a long time, the temperature of the cell 7 to be tested is obviously increased, and the accuracy of the electrical parameters is further influenced. As a preferred embodiment of the present invention, the testing device further includes a temperature control mechanism 4 and a temperature sensor 5 for measuring the temperature of the battery to be tested, the temperature control mechanism 4 is disposed in the testing space 12 below the light hole 14, the temperature control mechanism 4 is arranged from bottom to top: the cooling device comprises an outer fan 41, a lower cooling fin 42, a semiconductor cooler 43, an upper cooling fin 44 and an inner fan 45, wherein the inner fan 45 is positioned below the fixing clamp 2.

Specifically, the temperature sensor 5 is disposed on the surface of the conductive glass 71 of the battery 7 to be tested, and is used for detecting whether the temperature of the battery 7 to be tested reaches a preset temperature. Generally, when testing electrical parameters, the predetermined temperature is the standard test temperature: at 25 ℃. The utility model discloses in, temperature sensor 5 is preferred to be RTD film temperature sensor, utilizes advantages such as RTD film temperature sensor precision height, resolution ratio are good can accurately detect the temperature of the battery that awaits measuring. It is to be understood that the temperature sensor 5 is not limited to a thermocouple, a thermistor, a semiconductor sensor, or the like.

Furthermore, the cold energy generated by the semiconductor refrigerator 43 is conducted upwards through the upper heat sink 44, then is sucked by the inner fan 45 and is continuously conducted to the periphery of the battery 7 to be tested to cool the battery 7 to be tested, and the combination of the upper heat sink 44 and the inner fan 45 can increase the speed of cold energy conduction and make the cold energy conduction more uniform. In the present invention, the lower heat dissipation plate 42 and the outer fan 41 disposed below the semiconductor cooler 43 can accelerate the heat exchange in the test space 12 to be conducted to the outside of the test space 12.

Of course, the semiconductor cooler 43 can be replaced by other coolers, and it is within the scope of the present invention to achieve the same cooling purpose.

Because the perovskite part of perovskite solar cell is wet to take place the reaction easily to influence the electricity parameter of battery, in the utility model discloses in testing arrangement is still including setting up go up fin 44 with desiccator 6 between interior fan 45. In the process of conducting cold energy by the upper radiating fin 44 and the inner fan 45, the dryer 6 absorbs moisture in the air, so that the influence of the moisture in the air on the battery 7 to be tested can be effectively reduced, and the test accuracy is improved.

As a preferred embodiment of the present invention, the testing device further includes a control system (not shown) for controlling the testing process and the temperature of the battery to be tested, and a signal acquisition system (not shown) for acquiring the current and voltage signals, wherein the signal acquisition system is respectively electrically connected to the control system and the testing mechanism 3. During testing, the battery 7 to be tested is fixed in the testing space 12, the control system controls the testing process according to the instruction, and the signal acquisition system processes the measured current and voltage signals and outputs a testing result.

The test process of a single battery to be tested is as follows: fixing the battery 7 to be tested below the light hole 14 by adopting a clamping mechanism 20; adjusting the position of the connection base 31 to make the probes 324 on the two probe arms 32 respectively abut against the positive and negative electrodes 72 of the battery 7 to be tested; starting the control system, controlling the temperature control mechanism to work by the control system so that the battery 7 to be tested reaches a preset temperature, controlling a signal acquisition system by the control system to acquire a current and voltage signal of the battery 7 to be tested, calculating and processing the acquired current and voltage signal by the signal acquisition system, and outputting a test result; the testing process is complete.

To sum up, the utility model discloses a testing arrangement for perovskite solar cell through the relatively fixture 20 that sets up and the combination of probe mechanism 30, can accurately test perovskite solar cell's electricity parameter, and fixture 20 and probe mechanism 30 all can be suitable for not unidimensional battery moreover, and this device simple structure easily operates, and the suitability is strong.

It should be understood that although the present description refers to embodiments, not every embodiment may contain only a single embodiment, and such description is for clarity only, and those skilled in the art will be able to make the description as a whole, and the embodiments may be appropriately combined to form other embodiments as will be appreciated by those skilled in the art.

The above detailed description of a series of embodiments is only for the purpose of illustration, and is not intended to limit the scope of the invention, which is intended to include all equivalent embodiments or modifications that do not depart from the spirit of the invention.

Claims (10)

1. A test apparatus for perovskite solar cells, characterized by: the device comprises a base frame, a fixed clamp and a testing mechanism, wherein the fixed clamp and the testing mechanism are arranged on the base frame, the base frame comprises a testing table and a bracket which is supported below the testing table and forms a testing space together with the testing table, and a light hole is formed in the testing table; the fixed clamp comprises a pair of clamping mechanisms which are relatively fixed below the test board, and the pair of clamping mechanisms are relatively fixed on two sides of the light hole; the testing mechanism comprises a pair of probe mechanisms arranged below the clamping mechanism, the pair of probe mechanisms are also oppositely arranged on two sides of the light hole, and the probe mechanisms are provided with probe arms obliquely extending towards the direction of the light hole.

2. The test apparatus for perovskite solar cells as defined in claim 1, wherein: fixture including the centre gripping arm that is used for the centre gripping to await measuring battery, be used for fixing the fixed baseplate of centre gripping arm, be equipped with a first spring that transversely extends in the fixed baseplate, centre gripping arm one end is located in the fixed baseplate and with first spring looks butt, and the other end extends fixed baseplate along transversely, forms the contact site for the butt battery that awaits measuring.

3. The test apparatus for perovskite solar cells as defined in claim 2, wherein: the contact part is provided with a buffer part.

4. The test apparatus for perovskite solar cells as claimed in claim 3, wherein: the probe mechanism comprises a connecting base arranged below the test bench, the connecting base is provided with an extension arm extending transversely towards the test space, and the probe arm is fixedly arranged on the upper portion of the extension arm.

5. The test apparatus for perovskite solar cells as defined in claim 4, wherein: the probe arm is including being located probe rod, the setting of extension arm top are in second spring between probe rod and the extension arm, the one end that the light trap was kept away from to the probe rod is formed with the connecting portion of connecting the extension arm, second spring and connecting portion interval set up.

6. The test apparatus for perovskite solar cells as defined in claim 5, wherein: the free end of the probe rod is provided with double rows of telescopic probes, and the telescopic quantity of the probes is 0.1 mm-50 mm.

7. The test apparatus for perovskite solar cells as defined in claim 6, wherein: the outer side of the connecting base is provided with a pair of wiring terminals, and the wiring terminals are electrically connected with the probes through wires.

8. The test apparatus for perovskite solar cells as claimed in any one of claims 1 to 7, wherein: testing arrangement still includes temperature control mechanism and measuration battery temperature's temperature sensor, temperature control mechanism sets up in the test space of light trap below, temperature control mechanism arranges in proper order from bottom to top: the cooling device comprises an outer fan, a lower radiating fin, a semiconductor refrigerator, an upper radiating fin and an inner fan, wherein the inner fan is located below the fixing clamp.

9. The test apparatus for perovskite solar cells as defined in claim 8, wherein: the testing device further includes a dryer disposed between the upper heat sink and the inner fan.

10. The test apparatus for perovskite solar cells as defined in claim 9, wherein: the testing device further comprises a control system for controlling the testing process and the temperature of the battery to be tested and a signal acquisition system for acquiring current and voltage signals, wherein the signal acquisition system is electrically connected with the control system and the testing mechanism respectively.

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