CN103226167A - Conductivity measurement device and method of dielectric material - Google Patents
Conductivity measurement device and method of dielectric material Download PDFInfo
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- CN103226167A CN103226167A CN2013101453019A CN201310145301A CN103226167A CN 103226167 A CN103226167 A CN 103226167A CN 2013101453019 A CN2013101453019 A CN 2013101453019A CN 201310145301 A CN201310145301 A CN 201310145301A CN 103226167 A CN103226167 A CN 103226167A
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Abstract
The invention relates to a conductivity measurement device and a method of a dielectric material and belongs to the field of measurement. The device comprises a vacuum chamber, an electronic accelerator, a dielectric material sample, a plate electrode, an insulating mat, a high-voltage power supply, an electrometer, a vacuum pumping system, a sample stage, a three-dimensional transmission mechanism, a ground switch and a non-contact potentiometer. The method comprises the steps of turning on the vacuum pumping system to vacuumize the vacuum chamber, turning on the electronic accelerator to simulate high-energy electrons in a space environment to irradiate the surface of the dielectric material sample, turning on the high-voltage power supply to apply high voltage across the plate electrode, monitoring a surface potential of the dielectric material sample with the non-contact potentiometer, monitoring leakage current of the dielectric material sample with the electrometer, and calculating to obtain radiation induced conductivity of the dielectric material sample. A test system operates stably; with the adoption of the plate electrode with one side being grounded, a uniform electric field can be provided for the dielectric material sample, and the problems that the original measurement device cannot simulate the dielectric material and is influenced by a field induced effect and an irradiation effect are solved.
Description
Technical field
The present invention relates to a kind of dielectric material conductivity measuring apparatus and method, belong to fields of measurement.
Background technology
It is one of major reason that causes middle and high orbiter abnormal occurrence that dielectric material discharges and recharges effect.Owing to have a large amount of space high energy electrons at middle and high track, these high flux high energy electrons can directly penetrate the screen layer of satellite structure and instrument and equipment etc., enter in the dielectric material such as circuit board, wire insulation of inside satellite, cause insulating medium material deep layer charge deposition, thereby form in the dielectric material charged.Charged process comprises charge deposition and two processes of charge discharging resisting in the dielectric material, and wherein to induce conductivity (RIC) be the key factor that influences charge discharging resisting speed to the high-energy electron irradiation working medium radiation that will cause.The generation of RIC causes the increase of electric charge leak rate, has solved the problem of deposited charge conductive channel, makes to be deposited on that the quantity of electric charge reduces in the dielectric, and then makes time the reducing with the order of magnitude that reduces and reach steady state (SS) of medium internal electric field intensity.Therefore, the radiation-induced conductivity of dielectric material charged degree and puncturing in the possibility in decision plays an important role, and is the important materials characterisitic parameter of the interior charged research of medium.
Be accompanied by the continuous progress of China's satellite technology, in order to satisfy the demand of telstar long-life high-performance, China's satellite platform all will adopt high specific impulse, long-life, high efficiency ion-conductance propulsion system in a large number, need to use the operating voltage up to 1000V.When satellite transit during at geostationary orbit (GEO) track, the high-energy electron irradiation in its spatial charging environment can cause that the satellite dielectric material discharges and recharges effect.At this moment, the highfield that working voltage produces also can exert an influence to the conductivity of dielectric material, even simultaneously dielectric material to be discharged and recharged the influence of effect indeterminate and the field causes effect and irradiation effect, therefore, need badly and carry out under the varying strength electric field action and the measurement of dielectric material conductivity under the different-energy high-energy electron irradiation, it is that dielectric material discharges and recharges a requisite important content in the research and analysis.
Summary of the invention
The technical matters that the present invention solves is: a kind of dielectric material conductivity measuring apparatus and method are provided, the simulation medium material is shown up simultaneously causes the influence of effect and irradiation effect, solve little testing current and technology such as anti-interference in the test process, record the dielectric material conductivity.Can be used for measuring under the different electric field intensity effects with different high-energy electron irradiations under the conductivity variations of dielectric material.
For achieving the above object, technical scheme of the present invention is as follows:
A kind of dielectric material conductivity measuring apparatus, described device comprise vacuum chamber, electron accelerator, dielectric material sample, plate electrode, insulating mat, high-voltage power supply, electrometer, vacuum-pumping system, sample stage, three-dimensional gear train, grounding switch, contactless pot;
Wherein, at internal vacuum chamber, electron accelerator is installed in the vacuum chamber top; Sample stage is installed on the vacuum chamber bottom surface, and insulating mat is set on the sample stage; The dielectric material sample is placed on the insulating mat upper surface, is provided with metal back electrode between dielectric material sample and insulating mat; After the lead that connects dielectric material sample metal back electrode passed insulating mat and draws below insulating mat, the electrometer outer with vacuum chamber was connected ground connection afterwards.
Be respectively equipped with a plate electrode in the dielectric material sample left and right sides, one of them plate electrode is connected back ground connection with vacuum chamber grounding switch outward, to eliminate plate electrode to contactless potentiometric interference; Another plate electrode is connected with vacuum chamber high-voltage power supply outward;
Be provided with three-dimensional gear train in vacuum chamber, three-dimensional gear train is provided with contactless surface potential meter probe; Described contactless surface potential meter probe is connected back ground connection with vacuum chamber contactless surface potential meter outward;
Outside vacuum chamber, vacuum-pumping system is connected with vacuum chamber;
Wherein, preferred described metal back electrode is the conducting metal adhesive tape.
A kind of dielectric material conductivity measuring method said method comprising the steps of:
Step 1, unlatching vacuum-pumping system vacuumize to vacuum chamber;
Step 2, unlocking electronic accelerator, the high-energy electron irradiation dielectric material sample surfaces of space environmental simulation;
Step 3, unlatching high-voltage power supply add high pressure to plate electrode;
Step 4, utilize the surface potential of contactless pot monitoring dielectric material sample, utilize the leakage current of electrometer monitoring dielectric material sample;
Step 5, calculate the radiation-induced conductivity of dielectric material sample under a certain setting electric field intensity; Wherein, the computing formula of resistivity is
Therefore the surface potential V of the dielectric material sample that obtains by contactless pot and the leakage current I of the dielectric material sample that electrometer obtains can obtain in the radiation-induced conductivity of setting dielectric material sample under the electric field intensity.
Wherein, the vacuum tightness of vacuum chamber is lower than 5.0 * 10 in the described step 1
-4Pa.
The high energy electron energy range that electron accelerator provides in the preferred described step 2 is adjustable in 0.8～2.3MeV, and the beam current density scope is at 1～25nA/cm
2Interior adjustable.
The electric field intensity scope that two relative plate electrodes provide in the preferred described step 3 is adjustable in 0～1500V/cm.
When monitoring the surface potential of dielectric material sample in the preferred described step 4, connect grounding switch earlier with plate electrode ground connection; Close high-voltage power supply then, write down contactless potentiometric reading; Described contactless pot model is Trek341A; The electrometer model is Keithley6517A;
Beneficial effect
1. dielectric material conductivity measuring apparatus of the present invention adopts electron accelerator, the high energy electron of the charged environment of virtual space preferably; Described method is workable, this pilot system working stability, be applicable to measurement under the varying strength electric field action and the different-energy high-energy electron irradiation under the dielectric material conductivity.
2. adopt the plate electrode on a side joint ground, can provide uniform electric field for the dielectric material sample, having solved original conductivity measuring apparatus can't be subjected to the field to cause the influence of effect and irradiation effect by the simulation medium material simultaneously;
Description of drawings
Fig. 1 is a dielectric material conductivity measuring apparatus structural drawing of the present invention.
Among the figure: 1-vacuum chamber, 2-electron accelerator, 3-dielectric material sample, 4-plate electrode, 5-insulating mat, 6-high-voltage power supply, 7-electrometer, 8-vacuum-pumping system, 9-sample stage, the three-dimensional gear train of 10-, 11-grounding switch, the contactless pot of 12-.
Embodiment
As shown in Figure 1, be dielectric material conductivity measuring apparatus of the present invention, described device comprises vacuum chamber 1, electron accelerator 2, dielectric material sample 3, plate electrode 4, insulating mat 5, high-voltage power supply 6, electrometer 7, vacuum-pumping system 8, sample stage 9, three-dimensional gear train 10, grounding switch 11, contactless pot 12;
Wherein, in vacuum chamber 1 inside, electron accelerator 2 is installed in vacuum chamber 1 top; Sample stage 9 is installed on vacuum chamber 1 bottom surface, and insulating mat 5 is set on the sample stage 9; Dielectric material sample 3 is placed on insulating mat 5 upper surfaces, is provided with metal back electrode between dielectric material sample 3 and insulating mat 5; After the lead that connects dielectric material sample 3 metal back electrodes passed insulating mat 5 and draws below insulating mat 5, the electrometer 7 outer with vacuum chamber 1 was connected ground connection afterwards.
Be respectively equipped with a plate electrode 4 in dielectric material sample 3 left and right sides, one of them plate electrode is connected back ground connection with vacuum chamber 1 grounding switch 11 outward, to eliminate the interference of 4 pairs of contactless pots 12 of plate electrode; Another plate electrode is connected with vacuum chamber 1 high-voltage power supply 6 outward;
Be provided with three-dimensional gear train 10 in vacuum chamber 1, three-dimensional gear train 10 is provided with contactless surface potential meter probe; Described contactless surface potential meter probe is connected back ground connection with vacuum chamber 1 contactless surface potential meter 12 outward;
Outside vacuum chamber, vacuum-pumping system 8 is connected with vacuum chamber 1;
Wherein, described metal back electrode is the conducting metal adhesive tape.
A kind of dielectric material conductivity measuring method said method comprising the steps of:
Step 1, unlatching vacuum-pumping system 8 vacuumize for vacuum chamber 1, make vacuum tightness be better than 5.0 * 10
-4Pa;
Step 2, unlocking electronic accelerator 2, the high energy electron of space environmental simulation, irradiation dielectric material sample 3 surfaces; Electron energy is 1MeV, and beam current density is 5nA/cm
2
Step 3, unlatching high-voltage power supply 6 add high pressure for plate electrode 4, obtain the field intensity of 500V/cm between two plate electrodes;
Step 4, elder generation connect grounding switch 11 with plate electrode 4 ground connection, close high-voltage power supply 6 then, write down the reading of contactless pot 12, the surface potential of monitoring dielectric material sample 3; Utilize the leakage current of electrometer 7 monitoring dielectric material samples 3; Described contactless pot 12 models are Trek341A; Electrometer 7 models are Keithley6517A.
Step 5, calculating are under effect of 500V/cm electric field intensity and 1MeV high-energy electron irradiation, by the computing formula of resistivity
And the surface potential V of the dielectric material sample that obtains of contactless pot and the leakage current I of the dielectric material sample that electrometer obtains, can obtain in the radiation-induced conductivity of setting dielectric material sample 3 under the electric field intensity.
In sum, more than be preferred embodiment of the present invention only, be not to be used to limit protection scope of the present invention.Within the spirit and principles in the present invention all, any modification of being done, be equal to replacement, improvement etc., all should be included within protection scope of the present invention.
Claims (8)
1. dielectric material conductivity measuring apparatus, it is characterized in that: described device comprises vacuum chamber (1), electron accelerator (2), dielectric material sample (3), plate electrode (4), insulating mat (5), high-voltage power supply (6), electrometer (7), vacuum-pumping system (8), sample stage (9), three-dimensional gear train (10), grounding switch (11), contactless pot (12);
Wherein, in vacuum chamber (1) inside, electron accelerator (2) is installed in vacuum chamber (1) top; Sample stage (9) is installed on vacuum chamber (1) bottom surface, and insulating mat (5) is set on the sample stage (9); Dielectric material sample (3) is placed on insulating mat (5) upper surface, is provided with metal back electrode between dielectric material sample (3) and insulating mat (5); After the lead that connects dielectric material sample (3) metal back electrode passed insulating mat (5) and draws below insulating mat (5), the electrometer (7) outer with vacuum chamber (1) was connected ground connection afterwards;
Be respectively equipped with a plate electrode (4) in dielectric material sample (3) left and right sides, one of them plate electrode is connected back ground connection with vacuum chamber (1) grounding switch (11) outward, to eliminate the interference of plate electrode (4) to contactless pot (12); Another plate electrode is connected with vacuum chamber (1) high-voltage power supply (6) outward;
Be provided with three-dimensional gear train (10) in vacuum chamber (1), three-dimensional gear train (10) is provided with contactless surface potential meter probe; Described contactless surface potential meter probe is connected back ground connection with vacuum chamber (1) contactless surface potential meter (12) outward;
Outside vacuum chamber, vacuum-pumping system (8) is connected with vacuum chamber (1).
2. a kind of dielectric material conductivity measuring apparatus according to claim 1 is characterized in that: described metal back electrode is the conducting metal adhesive tape.
3. dielectric material conductivity measuring method, described method is used a kind of dielectric material conductivity measuring apparatus as claimed in claim 1, it is characterized in that: said method comprising the steps of:
Step 1, unlatching vacuum-pumping system (8) vacuumize for vacuum chamber (1);
Step 2, unlocking electronic accelerator (2), high-energy electron irradiation dielectric material sample (3) surface of space environmental simulation;
Step 3, unlatching high-voltage power supply (6) add high pressure for plate electrode (4);
Step 4, utilize the surface potential of contactless pot (12) monitoring dielectric material sample (3), utilize the leakage current of electrometer (7) monitoring dielectric material sample (3);
Step 5, calculate the radiation-induced conductivity of dielectric material sample (3).
4. a kind of dielectric material conductivity measuring method according to claim 3 is characterized in that: the vacuum tightness of vacuum chamber in the described step 1 (1) is lower than 5.0 * 10
-4Pa.
5. a kind of dielectric material conductivity measuring method according to claim 3 is characterized in that: the high energy electron energy range that electron accelerator in the described step 2 (2) provides is adjustable in 0.8～2.3MeV, and the beam current density scope is at 1～25nA/cm
2Interior adjustable.
6. a kind of dielectric material conductivity measuring method according to claim 3 is characterized in that: the electric field intensity scope that described step 3 middle plateform electrode (4) provides is adjustable in 0～1500V/cm.
7. a kind of dielectric material conductivity measuring method according to claim 3 is characterized in that: when monitoring the surface potential of dielectric material sample (3) in the described step 4, connect grounding switch (11) earlier with plate electrode (4) ground connection; Close high-voltage power supply (6) then, write down the reading of contactless pot (12).
8. a kind of dielectric material conductivity measuring method according to claim 3 is characterized in that: described contactless pot (12) model is Trek341A; Electrometer (7) model is Keithley6517A.
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Cited By (16)
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| CN103760422A (en) * | 2013-12-24 | 2014-04-30 | 兰州空间技术物理研究所 | Device and method for testing resistivity of dielectric material in light |
| CN103823114A (en) * | 2013-12-24 | 2014-05-28 | 兰州空间技术物理研究所 | Apparatus and method for measuring radiation induced conductivity of medium material at different temperatures |
| CN104237684A (en) * | 2014-09-03 | 2014-12-24 | 兰州空间技术物理研究所 | Testing device and method for electrostatic discharge of spacecraft dielectric material |
| CN104237686A (en) * | 2014-09-05 | 2014-12-24 | 兰州空间技术物理研究所 | Method for detecting inner potential of satellite dielectric material |
| CN104237316A (en) * | 2014-09-05 | 2014-12-24 | 兰州空间技术物理研究所 | Internally charged device for testing dielectric material |
| CN104267051A (en) * | 2014-09-05 | 2015-01-07 | 兰州空间技术物理研究所 | Wire earth radiation test device and method |
| CN106483380A (en) * | 2016-09-23 | 2017-03-08 | 中广核工程有限公司 | Particle irradiation sample electrical conductivity and the method for testing of resistivity |
| CN107728026A (en) * | 2017-10-27 | 2018-02-23 | 中国电力科学研究院有限公司 | Insulation print to cable carries out the device of electric breakdown test |
| CN108152354A (en) * | 2018-02-05 | 2018-06-12 | 四川大学 | A kind of dielectric material surface charge self-operated measuring unit based on two axis slide units |
| CN110058086A (en) * | 2019-04-28 | 2019-07-26 | 武汉大学 | Gas conductivity measuring device and method |
| CN110161317A (en) * | 2018-02-11 | 2019-08-23 | 中国科学院电工研究所 | A kind of solid insulating material surface dielectric characteristic comprehensive measurement device |
| CN110261690A (en) * | 2019-08-02 | 2019-09-20 | 华北电力大学 | A kind of electronics dissipation measuring device in nano modification transformer oil |
| CN110308413A (en) * | 2019-08-08 | 2019-10-08 | 上海安平静电科技有限公司 | A kind of contactless static detector calibrating installation and calibration method |
| CN112595993A (en) * | 2020-12-29 | 2021-04-02 | 江苏神马电力股份有限公司 | Insulating medium interface leakage current measuring system and method |
| CN114560109A (en) * | 2022-03-17 | 2022-05-31 | 中国科学院国家空间科学中心 | Space proton deep charging ground simulation device and method |
| CN115684273A (en) * | 2022-11-11 | 2023-02-03 | 中国工程物理研究院激光聚变研究中心 | High-temperature ultrahigh-precision electric transportation test system and test method thereof |
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| CN110161317A (en) * | 2018-02-11 | 2019-08-23 | 中国科学院电工研究所 | A kind of solid insulating material surface dielectric characteristic comprehensive measurement device |
| CN110058086A (en) * | 2019-04-28 | 2019-07-26 | 武汉大学 | Gas conductivity measuring device and method |
| CN110058086B (en) * | 2019-04-28 | 2021-08-17 | 武汉大学 | Gas conductivity measuring device and method |
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| CN114560109A (en) * | 2022-03-17 | 2022-05-31 | 中国科学院国家空间科学中心 | Space proton deep charging ground simulation device and method |
| CN115684273A (en) * | 2022-11-11 | 2023-02-03 | 中国工程物理研究院激光聚变研究中心 | High-temperature ultrahigh-precision electric transportation test system and test method thereof |
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Application publication date: 20130731 |