CN104237316B - A kind of device charged in tested media material - Google Patents
A kind of device charged in tested media material Download PDFInfo
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- CN104237316B CN104237316B CN201410453290.5A CN201410453290A CN104237316B CN 104237316 B CN104237316 B CN 104237316B CN 201410453290 A CN201410453290 A CN 201410453290A CN 104237316 B CN104237316 B CN 104237316B
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- potentiometer
- traveling table
- test board
- metal covering
- contact surface
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Abstract
The invention discloses a kind of device charged in tested media material, including potentiometer probe gripper, traveling table, sample stage and test board；Pop one's head in by using potentiometer probe gripper to fix non-contact surface potentiometer, use and open loose slot on traveling table, potentiometer probe gripper drives non-contact surface potentiometer probe to slide in loose slot, can the current potential of the multiple metal covering of continuous probe, therefore, assembly of the invention has simple in construction, easy to operate, with low cost and high efficiency feature.
Description
Technical field
The present invention relates to space application technology, a kind of dress charged in tested media material
Put.
Background technology
In satellite charged be usually by energy in space 0.1～10MeV high energy electron inject material in draw
Rise.Above-mentioned high energy electron can penetrate satellite structure (satellite surface material, cable sheath etc.) and deposit
Electric charge is on cable insulation, printed circuit board, capacitor part, synthetic circuit bag or suspended conductor.As
Really in medium the sedimentation rate of incident electron exceed its release speed time, in medium, charge density will be gradually increased,
Electric field intensity strengthens the most therewith, when built in field intensity exceedes the breakdown strength of dielectric material by generation in put
Electricity (also referred to as electronic induction electromagnetic pulse ECEMP).Spacecraft is coupled in the transient pulse produced by electric discharge
During electronic system, logic switch can be caused abnormal, electronic system eventual failure or sensing element hydraulic performance decline,
So that the destruction of whole system.In addition to the electromagnetic interference producing electronic equipment and damage, static discharge also causes
The damage of surfacing or physical property decline.Owing to electric discharge creates amount of localized heat and produces in arc-discharge zone
Green material is damaged, and it not only damages the integrity of spacecraft, but also changes the physical characteristic of surfacing,
Thus finally destroy the normal work of spacecraft.Interior electric discharge is usually closer to electronic system thus to satellite system
The harm of work more direct.Along with improving and the use of a large amount of new materials of satellite electron systematic function, defend
In the dielectric material that space high energy electron environment is caused by star, charged effect problem is more sensitive, in satellite
Charged guard technology becomes one of the development key technology that must solve of long-life applied satellite.In order to study
Interior charged effect and guard technology thereof, need charged effect in ground simulation, charged in evaluating dielectric material
Performance, and the interior hot-line electrical potential of dielectric material is the important content evaluated.The monitoring of interior hot-line electrical potential need to measure Jie
Current potential at the internal different depth of matter, and test and need to use non-contact measurement, as shown in Figure 1 non-connects
Touch surface potential meter, is placed in above determinand at 3-8mm by non-contact surface potentiometer probe induction point
Measure.It is thus desirable to design tool can be with a multiple dielectric layer of non-contact surface potentiometer measurement
The current potential drawn, and test.
Summary of the invention
In view of this, the invention provides a kind of device charged in tested media material, use multilamellar
Movable testboard, a non-contact surface potentiometer can measure the current potential that multiple dielectric layer is drawn.
A kind of device charged in tested media material of the present invention, including potentiometer probe gripper, work
Dynamic platform, sample stage and test board；
Described potentiometer probe gripper is the rectangular structure using insulant processing, at potentiometer probe clip
The through hole coordinated of popping one's head in non-contact surface potentiometer is had on tool；
Described traveling table is the rectangle dielectric-slab of insulant, has the length of through traveling table on traveling table
Bar shaped loose slot；
Described test board is rectangle insulation board, and the one side of test board is coated with multiple along test board length direction
The convex metal covering of proper alignment；
Described traveling table is placed on described sample stage, and described test board is positioned on traveling table, convex gold
The orientation in genus face is parallel with the length direction of strip loose slot；Non-contact surface potentiometer probe is worn
Crossing described through hole and fix with potentiometer probe gripper, potentiometer probe gripper is placed in loose slot；Potentiometer
The lower surface of probe gripper is fixing with sample stage to be connected；
Non-contact surface potentiometer probe is positioned at above convex metal covering, but does not connects with convex metal covering
Touch.
The material of described traveling table and test board is politef.
The material of described convex metal covering is copper.
The frontier distance of described two adjacent metal coverings is more than 1cm.
There is advantages that a kind of device charged in tested media material of the present invention,
Pop one's head in by using potentiometer probe gripper to fix non-contact surface potentiometer, use and open activity on traveling table
Groove, potentiometer probe gripper drives non-contact surface potentiometer probe to slide in loose slot, can visit continuously
Surveying the current potential of multiple metal covering, therefore, assembly of the invention has simple in construction, easy to operate, low cost
Honest and clean and high efficiency feature.
Accompanying drawing explanation
Fig. 1 is the structural representation of non-contact surface potentiometer probe；
Fig. 2 is the structural representation of each ingredient of assembly of the invention, and wherein (a) is potentiometer probe clip
Tool schematic diagram, (b) is traveling table schematic diagram, and (c) is sample stage schematic diagram, and (d) is test board schematic diagram.
Fig. 3 is the structural representation of assembly of the invention, and wherein (a) is top view, and (b) is side view.
Wherein, 1-potentiometer probe gripper, 2-through hole, 3-traveling table, 4-loose slot, 5-sample stage, 6-surveys
Test plate (panel), 7-metal covering, 8-non-contact surface potentiometer probe, 9-non-contact surface potentiometer main frame.
Detailed description of the invention
Develop simultaneously embodiment below in conjunction with the accompanying drawings, describes the present invention.
A kind of device charged in tested media material of the present invention, including potentiometer probe gripper 1, lives
Dynamic platform 3, sample stage 5 and test board 6；
As shown in Fig. 2 (a), potentiometer probe gripper 1 is the rectangular structure using insulant processing,
The width of potentiometer probe gripper 1 has the square coordinated with non-contact surface potentiometer probe 8
Shape through hole 2；
As shown in Fig. 2 (b), traveling table 3 is the rectangle dielectric-slab of insulant, opens on traveling table 3
There is the loose slot 4 of the strip of through traveling table 3；
As shown in Fig. 2 (d), described test board 6 is rectangle insulation board, a side plating of test board 6
There is multiple convex metal covering 7 of proper alignment along test board 6 length direction；
As it is shown on figure 3, described traveling table 3 is placed on described sample stage 5, described test board 6 is positioned over
On traveling table 3, the orientation of convex metal covering 7 is parallel with the length direction of strip loose slot 4；
Non-contact surface potentiometer probe 8 is fixed through described through hole 2 and with potentiometer probe gripper 1, current potential
Meter probe gripper 1 is placed in loose slot；The lower surface of potentiometer probe gripper 1 is fixing with sample stage 5 to be connected；
Non-contact surface potentiometer probe 8 is positioned at above convex metal covering 7, but not with convex metal
Face 7 contacts.
The material of traveling table 3 and test board 6 is politef.The material of metal covering 7 is copper.Two is adjacent
The frontier distance of metal covering 7 is more than 1cm.
The operation principle of the device charged in tested media material of the present invention is:
The current potential that the present invention is charged in can monitoring dielectric material, by internal for dielectric material different layers current potential by leading
Line is drawn, and is connected respectively on the metal covering 7 of test board 6, makes metal covering 7 and dielectric material internal corresponding
Layer equipotential, is fixed on non-contact surface potentiometer probe 8 in installing hole, makes non-contact surface electricity
Above the meter probe 9 induction points metal covering 7 wherein of position.Owing to potentiometer probe gripper 1 is stuck in activity
In the loose slot 4 of platform 3, potentiometer probe gripper 1 is fixed on sample stage 5, then can pull traveling table 3
Move relative to potentiometer probe gripper 1.As long as metal covering 7 to be measured to be moved to during test potentiometer probe 8
Underface, can measure corresponding current potential by non-contact surface potentiometer main frame 9.
Concrete operating procedure is:
1, internal for dielectric material different layers current potential is drawn by wire, be connected respectively to the gold on test board 6
On genus face 7；
2, non-contact surface potentiometer main frame 9 power supply is opened；
3, metal covering 7 to be measured is moved to immediately below potentiometer probe 8, by non-contact surface potentiometer
Corresponding current potential measured by main frame 9；
4, move traveling table 3 along loose slot 4, make another metal covering 7 to be measured move to potentiometer probe
Immediately below 8, measure current potential.
In sum, these are only presently preferred embodiments of the present invention, be not intended to limit the protection model of the present invention
Enclose.All within the spirit and principles in the present invention, any modification, equivalent substitution and improvement etc. made, all
Within protection scope of the present invention should being included in.
Claims (4)
1. a device charged in tested media material, it is characterised in that include potentiometer probe clip
Tool (1), traveling table (3), sample stage (5) and test board (6)；
Described potentiometer probe gripper (1) is the rectangular structure using insulant processing, visits at potentiometer
The through hole (2) coordinated with non-contact surface potentiometer probe (8) is had on fixture head (1)；
Described traveling table (3) is the rectangle dielectric-slab of insulant, has through on traveling table (3)
The strip loose slot (4) of traveling table (3)；
Described test board (6) is rectangle insulation board, and the one side of test board (6) is coated with multiple along test board
(6) the convex metal covering (7) of proper alignment on length direction；
Described traveling table (3) is placed on described sample stage (5), and described test board (6) is positioned over activity
On platform (3), the orientation of convex metal covering (7) is flat with the length direction of strip loose slot (4)
OK；Non-contact surface potentiometer probe (8) is through described through hole (2) and by potentiometer probe gripper (1)
Fixing, potentiometer probe gripper (1) is placed in loose slot；The lower surface of potentiometer probe gripper (1) with
Sample stage (5) is fixing to be connected；
Non-contact surface potentiometer probe (8) be positioned at convex metal covering (7) top, but not with type
Type metal covering (7) contacts.
A kind of device charged in tested media material, it is characterised in that
The material of described traveling table (3) and test board (6) is politef.
A kind of device charged in tested media material, it is characterised in that
The material of described convex metal covering (7) is copper.
A kind of device charged in tested media material, it is characterised in that
The frontier distance of described two adjacent convex metal coverings (7) is more than 1cm.
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| Application Number | Priority Date | Filing Date | Title |
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| CN201410453290.5A CN104237316B (en) | 2014-09-05 | 2014-09-05 | A kind of device charged in tested media material |
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|---|---|---|---|
| CN201410453290.5A CN104237316B (en) | 2014-09-05 | 2014-09-05 | A kind of device charged in tested media material |
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| CN104237316A CN104237316A (en) | 2014-12-24 |
| CN104237316B true CN104237316B (en) | 2016-08-24 |
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Citations (8)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH10254311A (en) * | 1997-03-07 | 1998-09-25 | Ricoh Co Ltd | Method for measuring sensitivity of electrophotographic photoreceptor |
| CN102128985A (en) * | 2010-12-30 | 2011-07-20 | 中国航天科技集团公司第五研究院第五一○研究所 | Method for testing conductivity of medium material |
| CN102507990A (en) * | 2011-10-18 | 2012-06-20 | 中国航天科技集团公司第五研究院第五一〇研究所 | Fixture of electrified test in dielectric material for satellite |
| CN102507717A (en) * | 2011-10-20 | 2012-06-20 | 中国航天科技集团公司第五研究院第五一〇研究所 | Device and method for on-orbit monitoring of charging of satellite material surface |
| CN102841123A (en) * | 2012-09-04 | 2012-12-26 | 西安交通大学 | Measuring device and measuring method for trap parameter of solid dielectric material |
| CN102944722A (en) * | 2012-11-27 | 2013-02-27 | 中国航天科技集团公司第五研究院第五一〇研究所 | Method for monitoring inner electrified electric potentials of spacecraft |
| CN103226167A (en) * | 2013-04-24 | 2013-07-31 | 兰州空间技术物理研究所 | Conductivity measurement device and method of dielectric material |
| CN103823114A (en) * | 2013-12-24 | 2014-05-28 | 兰州空间技术物理研究所 | Apparatus and method for measuring radiation induced conductivity of medium material at different temperatures |
-
2014
- 2014-09-05 CN CN201410453290.5A patent/CN104237316B/en active Active
Patent Citations (8)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH10254311A (en) * | 1997-03-07 | 1998-09-25 | Ricoh Co Ltd | Method for measuring sensitivity of electrophotographic photoreceptor |
| CN102128985A (en) * | 2010-12-30 | 2011-07-20 | 中国航天科技集团公司第五研究院第五一○研究所 | Method for testing conductivity of medium material |
| CN102507990A (en) * | 2011-10-18 | 2012-06-20 | 中国航天科技集团公司第五研究院第五一〇研究所 | Fixture of electrified test in dielectric material for satellite |
| CN102507717A (en) * | 2011-10-20 | 2012-06-20 | 中国航天科技集团公司第五研究院第五一〇研究所 | Device and method for on-orbit monitoring of charging of satellite material surface |
| CN102841123A (en) * | 2012-09-04 | 2012-12-26 | 西安交通大学 | Measuring device and measuring method for trap parameter of solid dielectric material |
| CN102944722A (en) * | 2012-11-27 | 2013-02-27 | 中国航天科技集团公司第五研究院第五一〇研究所 | Method for monitoring inner electrified electric potentials of spacecraft |
| CN103226167A (en) * | 2013-04-24 | 2013-07-31 | 兰州空间技术物理研究所 | Conductivity measurement device and method of dielectric material |
| CN103823114A (en) * | 2013-12-24 | 2014-05-28 | 兰州空间技术物理研究所 | Apparatus and method for measuring radiation induced conductivity of medium material at different temperatures |
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| CN104237316A (en) | 2014-12-24 |
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