CN102128985A - Method for testing conductivity of medium material - Google Patents
Method for testing conductivity of medium material Download PDFInfo
- Publication number
- CN102128985A CN102128985A CN2010106246064A CN201010624606A CN102128985A CN 102128985 A CN102128985 A CN 102128985A CN 2010106246064 A CN2010106246064 A CN 2010106246064A CN 201010624606 A CN201010624606 A CN 201010624606A CN 102128985 A CN102128985 A CN 102128985A
- Authority
- CN
- China
- Prior art keywords
- sample
- probe
- potential
- test
- electric potential
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Images
Landscapes
- Investigating Or Analyzing Materials By The Use Of Electric Means (AREA)
Abstract
The invention discloses a method for testing conductivity of medium material, wherein the method comprises the following steps of: positioning an electric potential probe at a zero electric potential position above a sample after the preparation before testing is finished; confirming the placing position of the sample, confirming the position coordinate of an electric potential measuring point by a probe driving mechanism, then closing a vacuum jar, turning on the power of an electric gun, and performing electronic irradiation to the sample via a Faraday cut test; quickly descending an electric potential meter probe to the front surface of the sample every 10 minutes to perform inducted non-contact measurement, wherein the data measured by a micro galvanometer and the electric potential probe is waved between negative 0.5% and positive 0.5%, then the charge of the sample is regarded as saturation; turning off the electric gun, attenuating the similar process via a tapping index form in the sample interior electric charge Q and measuring the electric potential decay process of the sample; in a word, the attenuation relationship of the surface electric potential of the sample along time is measured by a surface electric potential probe, and the conductivity of the sample can be calculated according to the sample surface attenuated electric potential at different time. The conductivity testing equipment in the invention can be applied to hazard assessment of deep charging, and also can provide valuable engineering data for the protection of deep charging or discharging.
Description
Technical field
The present invention relates to a kind of dielectric material charge-discharge test method, dielectric material surface potential test macro belongs to field tests under particularly a kind of vacuum environment.
Background technology
For alleviating throw-weight and satisfying performance requirements such as spacecraft electricity, heat, mechanics, spacecraft will be used a large amount of organic media materials.In the space radiation environment, high energy particle, plasma are inner or pass the spacecraft shileding layer and deposit on the dielectric material of portion within it at the dielectric material of spacecraft periphery easily.Electric discharge phenomena can take place when the surperficial electric field with miscellaneous part potential difference (PD) or deposited charge generation on every side of these dielectric materials surpasses certain threshold value, high-energy discharge then can directly cause responsive electronic devices and components to puncture or organic media punctures, this will disturb the operate as normal of electronic device on the spacecraft, when serious spacecraft is broken down.
The dielectric material conductivity is the important materials parameter that influences the satellite charging current potential, and it has determined the speed that electric charge leaks in the dielectric material charging process.At present, the measurement of China's dielectric material conductivity generally adopts three-electrode method to carry out.Because star is minimum with the conductivity of dielectric material, need usually to adopt special weak current testing apparatus to measure.But under the influence of sample environmental baseline of living in (as temperature, humidity, vacuum tightness), sample state (as purity, surface cleanness degree, thickness of sample and size), test condition factors such as (as applying voltage swing, test duration and jig Design), this measurement result can produce the variation of 2 orders of magnitude along with the difference of test condition.Therefore press for the method and apparatus that exploitation is stablized, is suitable for the sample conductivity of test space Issues on Static Electrification reliably.
Conventional conductivity measuring method also not exclusively is suitable for the spatial charging environment, the main cause that conventional method is unsuitable for space condition has: (1) electric charge method for implanting difference, formed charged particles densimetric curve and electric field also have in essence different: conventional three-electrode method voltage provides by power supply, and the dielectric charge surface potential to be electric charge inject forms; (2) electrode number difference: conventional three-electrode method all has electrode in the medium both sides, and charged in the medium side is only arranged is electrode, and opposite side then is the electric charge injection face; (3) research purpose difference: conventional three-electrode method conductivity measurement is relevant with the loss of power in medium, and does not consider storage time and quantity after electric charge injects; (4) leakage current measurement asynchronism(-nization): the Measuring Time of conventional three-electrode method or reading duration are several minutes, and space medium charging or damped cycle can reach the several months long, and the variation of dielectric conductance rate just can display in the long period.
Summary of the invention
The object of the invention provides a kind of dielectric material charge-discharge test method, and the method for testing of conductivity is selected the charge decay method for use among the present invention---and utilize electronics injection, contactless surface potential measurement method to obtain the dielectric material conductivity.Low-energy electron rifle irradiation dielectric sample makes its surface reach certain current potential (usually near the dangerous current potential of discharge) in the utilization, stops irradiation afterwards and makes sample retention at vacuum chamber.
Testing apparatus among the present invention comprises vacuum system, charge-discharge system, potential test system.Wherein vacuum system comprises vacuum tank, mechanical pump, diffusion pump, multistage sliding vane rotary pump, valve, sealing pipeline and worktable; Charge-discharge system is made up of electron gun and sample installation system; The potential test system comprises pot and microgalvanometer.
The annexation of native system is: vacuum tank is placed on the worktable, be connected with mechanical pump through flapper valve by one road sealing pipeline, be connected with diffusion pump through flapper valve by another road sealing pipeline, mechanical pump, lobe pump, diffusion pump are formed the unit of bleeding in the vacuum system; Electron gun is positioned at place, axis, vacuum chamber top; Sample is installed on the copper coin of center of vacuum chamber bottom, and copper coin is coaxial with electron gun, isolates with the block teflon between sample and the copper coin; Vacuum meter is positioned at the top of vacuum tank inside, is in the optional position that does not influence other top components and parts; The charging potential of sample surfaces and decay current potential are tested by pot, and the line of electron gun is tested by Faraday cup, and moving by driving mechanisms control of pot and Faraday cup can be moved in two-dimensional plane; Microgalvanometer is connected on the back electrode of sample, and main tested object is the Leakage Current of sample when charging.
This test macro workflow is:
The first step is prepared before the test, checks recirculated water, the circuit of consumers such as vacuum system and electron gun, pot, microgalvanometer, the signal line of detector;
In second step, sample is carried out dried; Press the circuit connection among Fig. 1, the current potential probe is positioned at zero-potential point place, sample top; Determine the sample riding position, determine the position coordinates of potential measurement point with the probe driving mechanism.
Second goes on foot, and closes vacuum tank, vacuumizes to make system vacuum to 5.4x10
-4Below the Pa, open the electron gun power supply, electron energy is set to 14Kev, makes sample by 2.0nA/cm with the Faraday cup test
2Electron irradiation, the charging potential of sample surfaces cooperates pot probe TREK 3450E to test by pot TREK 341HV.Every 10 minutes the pot probe is dropped rapidly to apart from sample front surface 2cm place, carries out the induction type non-cpntact measurement; The data that microgalvanometer and current potential probe record fluctuate in positive and negative 0.5%, think that promptly the sample charging is saturated, close electron gun afterwards.
The 3rd step, after closing electron gun, utilize releasing of sample interior charge Q to be the exponential form similar process that decays, come the potential decay process of measuring samples, be specially: probe is dropped rapidly to apart from sample front surface 2cm place every 30 minutes, carry out the induction type non-cpntact measurement, with the data typing testing software that records, the conductivity of calculation sample.Concrete computing formula is:
τ=ερ
Wherein: Vs-surface voltage, Vs0-initial surface charging voltage, ρ-body resistivity, ε-specific inductive capacity, t-die-away time, τ-time attenuation constant;
In a word, utilize surface potential probe measurement sample surfaces current potential attenuation relation in time, can extrapolate the conductivity of sample according to the sample surfaces decay current potential of the different time that measures.
In the 4th step, after off-test, the power supply of closing test device is opened gas valve, opens vacuum tank, takes out test specimen.
Advantage of the present invention is: the dielectric conductance rate is high more to be unfavorable for releasing of deposited charge more, if the electrical resistivity results that adopts classic method to measure is assessed the deep layer charging process of spacecraft component, with the deposited charge in the underestimation dielectric material, and then may underestimate the discharge risk and caused unnecessary loss.Table 1 has been listed this method of testing and conventional test methodologies is used to test the result of typical media material bodies resistivity, and it is apparent to table look-up.The conductivity method of testing is suitable for deep layer charging hazard evaluation among the present invention, can provide valuable project data for the protection that deep layer discharges and recharges effect.
The charge decay method---utilize electronics injection, contactless surface potential measurement method to obtain the dielectric material conductivity.This method of testing high precision, highly reliable, it is more suitable for the measurement of dielectric material conductivity under the spatial charging environment.Proving installation of the present invention has improved experiment automatized degree, control accuracy, test efficiency.This method is in the ordinary course of things than the high one or more magnitude of traditional method.
The comparison of table one method of testing of the present invention and traditional test dielectric material body resistivity test result
Description of drawings
The test macro of a kind of dielectric material conductivity of Fig. 1-the present invention is seen figure
Among the figure: the multistage sliding vane rotary pump of 1-, 2-diffusion pump, 3-mechanical pump, 4-vacuum valve, 5-vacuum meter, 6-electron gun, 7-pot valve, 8-Ferrari cup, 9-pot, 10-driving mechanism, 11-sample, 12-teflon insulation piece, 13-copper coin, 14-microgalvanometer, 15-flapper valve A, 16-flapper valve B
Fig. 2-25 μ m single face the scheme of installation of Kapton film of aluminizing in when test
Embodiment
Testing apparatus among the present invention comprises vacuum system, charge-discharge system, potential test system.Wherein vacuum system comprises vacuum tank, mechanical pump 3, diffusion pump 2, multistage sliding vane rotary pump 1, valve, sealing pipeline and worktable; Charge-discharge system is made up of electron gun 6 and sample 11 installation systems; The potential test system comprises pot 9 and microgalvanometer 14, is placed with vacuum valve 4, vacuum meter 5 in the vacuum tank.
The annexation of native system is: vacuum tank is placed on the worktable, be connected with mechanical pump through flapper valve A15 by one road sealing pipeline, be connected the unit of bleeding that mechanical pump 3, multistage sliding vane rotary pump 1, diffusion pump 2 are formed in the vacuum system with diffusion pump 2 through flapper valve B16 by another road sealing pipeline; Electron gun 6 is positioned at place, axis, vacuum chamber top; Sample 11 is installed on the copper coin 13 of center of vacuum chamber bottom, and copper coin 13 is coaxial with electron gun 6, isolates with teflon insulation piece 12 between sample 11 and the copper coin 13; Vacuum meter 5 is positioned at the top of vacuum tank inside, is in the optional position that does not influence other top components and parts; The charging potential on sample 11 surfaces and decay current potential are by pot 9 tests, and the line of electron gun 6 is by Faraday cup 8 tests, and moving by driving mechanism 10 controls of pot 9 and Faraday cup 8 can be moved in two-dimensional plane; Microgalvanometer 14 is connected on the back electrode of sample 11, and main tested object is the Leakage Current of sample when charging.
This test macro workflow is:
The first step is prepared before the test, checks recirculated water, the circuit of consumers such as vacuum system and electron gun, pot, microgalvanometer, the signal line of detector;
In second step,, the 25 μ m single faces Kapton film of aluminizing is dried 2h at 80 ℃; Press the circuit connection among Fig. 1, the current potential probe is positioned at zero-potential point place, sample top; Determine the sample riding position, determine the position coordinates of potential measurement point with the probe driving mechanism.
Second goes on foot, and closes vacuum tank, vacuumizes to make system vacuum to 5.4x10
-4Below the Pa, open the electron gun power supply, electron energy is set to 14Kev, makes sample by 2.0nA/cm with the Faraday cup test
2Electron irradiation, the charging potential of sample surfaces cooperates pot probe TREK 3450E to test by pot TREK 341HV.Every 10 minutes the pot probe is dropped rapidly to apart from sample front surface 2cm place, carries out the induction type non-cpntact measurement; The Leakage Current of this sample is to think that the sample charging is saturated at 23 ± 0.2pA, charging potential at 3250 ± 50V, closes electron gun afterwards.
The 3rd the step, close electron gun after, every 30 minutes probe is dropped rapidly to apart from sample front surface 2cm place, carry out the induction type non-cpntact measurement, with the data typing testing software that records, the conductivity of calculation sample.
In the 4th step, after off-test, the power supply of closing test device is opened gas valve, opens vacuum tank, takes out test specimen.
25 μ m single faces are aluminized body resistivity result that the Kapton film records with conventional test methodologies 10
16(Ω cm), and the result who records with this method is 10
18About (Ω cm), this explanation is if the electrical resistivity results that adopts classic method to measure is assessed the deep layer charging process of spacecraft component, with the deposited charge in the underestimation dielectric material, and the die-away time of deposited charge, and then may underestimate the discharge risk and caused unnecessary loss.
Claims (4)
1. dielectric material charge-discharge test method, its testing apparatus comprises vacuum system, charge-discharge system, potential test system; Wherein vacuum system comprises vacuum tank, mechanical pump, diffusion pump, multistage sliding vane rotary pump, valve, sealing pipeline and worktable; Charge-discharge system is made up of electron gun and sample installation system; The potential test system comprises pot and microgalvanometer;
It is characterized in that:
This test macro workflow is:
The first step is prepared before the test, checks recirculated water, the circuit of consumers such as vacuum system and electron gun, pot, microgalvanometer, the signal line of detector;
In second step, the current potential probe is positioned at zero-potential point place, sample top; Determine the sample riding position, determine the position coordinates of potential measurement point with the probe driving mechanism;
Second goes on foot, and closes vacuum tank, vacuumizes to make system vacuum to 5.4x10
-4Below the Pa, open the electron gun power supply, electron energy is set to 14Kev, makes sample by 2.0nA/cm with the Faraday cup test
2Electron irradiation, the charging potential of sample surfaces cooperates pot probe TREK 3450E to carry out the induction type non-cpntact measurement by pot TREK 341HV; Saturated up to the sample charging, close electron gun afterwards;
The 3rd step, close electron gun after, utilize releasing of sample interior charge Q to be the exponential form similar process that decays, come the potential decay process of measuring samples, and with the data typing testing software that records, the conductivity of calculation sample; Concrete computing formula is:
τ=ερ
Wherein: Vs-surface voltage, Vs0-initial surface charging voltage, ρ-body resistivity, ε-specific inductive capacity, t-die-away time, τ-time attenuation constant;
In the 4th step, after off-test, the power supply of closing test device is opened gas valve, opens vacuum tank, takes out test specimen;
In a word, utilize surface potential probe measurement sample surfaces current potential attenuation relation in time, can extrapolate the conductivity of sample according to the sample surfaces decay current potential of the different time that measures.
2. a kind of dielectric material charge-discharge test method according to claim 1 is characterized in that: in step 2, every 10 minutes the pot probe is dropped rapidly to apart from sample front surface 2cm place, carries out the induction type non-cpntact measurement.
3. a kind of dielectric material charge-discharge test method according to claim 1 is characterized in that: in step 2, the data that microgalvanometer and current potential probe record fluctuate in positive and negative 0.5%, think that promptly the sample charging is saturated.
4. a kind of dielectric material charge-discharge test method according to claim 1, it is characterized in that: in step 3, every 30 minutes probe is dropped rapidly to apart from sample front surface 2cm place, carries out the induction type non-cpntact measurement, with the data typing testing software that records.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
CN 201010624606 CN102128985B (en) | 2010-12-30 | 2010-12-30 | Method for testing conductivity of medium material |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
CN 201010624606 CN102128985B (en) | 2010-12-30 | 2010-12-30 | Method for testing conductivity of medium material |
Publications (2)
Publication Number | Publication Date |
---|---|
CN102128985A true CN102128985A (en) | 2011-07-20 |
CN102128985B CN102128985B (en) | 2013-04-24 |
Family
ID=44267144
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
CN 201010624606 Active CN102128985B (en) | 2010-12-30 | 2010-12-30 | Method for testing conductivity of medium material |
Country Status (1)
Country | Link |
---|---|
CN (1) | CN102128985B (en) |
Cited By (17)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN102426173A (en) * | 2011-10-20 | 2012-04-25 | 中国航天科技集团公司第五研究院第五一〇研究所 | Device and method for testing weak electron beam |
CN102507717A (en) * | 2011-10-20 | 2012-06-20 | 中国航天科技集团公司第五研究院第五一〇研究所 | Device and method for on-orbit monitoring of charging of satellite material surface |
CN102937673A (en) * | 2012-11-25 | 2013-02-20 | 中国航天科技集团公司第五研究院第五一〇研究所 | Method for detecting surface charge density of dielectric material under electron irradiation |
CN102944721A (en) * | 2012-11-25 | 2013-02-27 | 中国航天科技集团公司第五研究院第五一〇研究所 | Ionic current collection test device and method for satellite tail regions |
CN103226167A (en) * | 2013-04-24 | 2013-07-31 | 兰州空间技术物理研究所 | Conductivity measurement device and method of dielectric material |
CN103257279A (en) * | 2013-04-24 | 2013-08-21 | 兰州空间技术物理研究所 | Device and method for testing medium material radiation induction conductivity for satellite |
CN103257278A (en) * | 2013-04-24 | 2013-08-21 | 兰州空间技术物理研究所 | Medium material conductivity testing device and method |
CN103454315A (en) * | 2013-09-16 | 2013-12-18 | 中国科学院空间科学与应用研究中心 | Device and method for measuring deep dielectric charging characteristic parameter of spacecraft dielectric material |
CN104237316A (en) * | 2014-09-05 | 2014-12-24 | 兰州空间技术物理研究所 | Internally charged device for testing dielectric material |
CN104635054A (en) * | 2015-02-11 | 2015-05-20 | 华北电力大学 | Closed-type temperature control solid medium electrical resistivity measurement device |
CN106154049A (en) * | 2015-04-03 | 2016-11-23 | 深圳光启高等理工研究院 | The method of testing of thin-film material dielectric properties and system |
CN106483380A (en) * | 2016-09-23 | 2017-03-08 | 中广核工程有限公司 | Particle irradiation sample electrical conductivity and the method for testing of resistivity |
CN108761206A (en) * | 2018-06-28 | 2018-11-06 | 江苏瑞能防腐设备有限公司 | A kind of online resistance temperature, pressure monitoring and early warning instrument |
CN109813974A (en) * | 2018-12-18 | 2019-05-28 | 兰州空间技术物理研究所 | A kind of geostationary orbit material inequality charging test device |
CN110297014A (en) * | 2019-06-26 | 2019-10-01 | 天津大学 | A method of characterization nuclear power station epoxy resin insulation material is by soda acid erosion degree |
CN111505387A (en) * | 2020-04-24 | 2020-08-07 | 西安交通大学 | Method for testing microwave dielectric property of dielectric material under irradiation condition |
CN116840629A (en) * | 2023-05-11 | 2023-10-03 | 成都产品质量检验研究院有限责任公司 | Polymer insulating material conductivity characteristic test system |
Families Citing this family (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US9746514B2 (en) * | 2013-09-04 | 2017-08-29 | Kla-Tencor Corporation | Apparatus and method for accurate measurement and mapping of forward and reverse-bias current-voltage characteristics of large area lateral p-n junctions |
Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH03144378A (en) * | 1989-10-31 | 1991-06-19 | Yokogawa Electric Corp | Resistance measuring apparatus by electron beam |
EP0710848A1 (en) * | 1994-11-02 | 1996-05-08 | Alcatel Cable | Procedure for measuring the voltage decay and the electron mobility of a material |
CN101187683A (en) * | 2007-10-30 | 2008-05-28 | 电子科技大学 | Low consumption dielectric material high temperature complex dielectric constant test device and method |
CN101452020A (en) * | 2007-12-04 | 2009-06-10 | 北京卫星环境工程研究所 | In-situ measurement material surface resistivity method under vacuum environment |
Family Cites Families (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP3144378B2 (en) * | 1998-04-01 | 2001-03-12 | 日本電気株式会社 | Method for manufacturing solid-state imaging device |
-
2010
- 2010-12-30 CN CN 201010624606 patent/CN102128985B/en active Active
Patent Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH03144378A (en) * | 1989-10-31 | 1991-06-19 | Yokogawa Electric Corp | Resistance measuring apparatus by electron beam |
EP0710848A1 (en) * | 1994-11-02 | 1996-05-08 | Alcatel Cable | Procedure for measuring the voltage decay and the electron mobility of a material |
CN101187683A (en) * | 2007-10-30 | 2008-05-28 | 电子科技大学 | Low consumption dielectric material high temperature complex dielectric constant test device and method |
CN101452020A (en) * | 2007-12-04 | 2009-06-10 | 北京卫星环境工程研究所 | In-situ measurement material surface resistivity method under vacuum environment |
Cited By (25)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN102507717A (en) * | 2011-10-20 | 2012-06-20 | 中国航天科技集团公司第五研究院第五一〇研究所 | Device and method for on-orbit monitoring of charging of satellite material surface |
CN102507717B (en) * | 2011-10-20 | 2013-06-26 | 中国航天科技集团公司第五研究院第五一〇研究所 | Device and method for on-orbit monitoring of charging of satellite material surface |
CN102426173A (en) * | 2011-10-20 | 2012-04-25 | 中国航天科技集团公司第五研究院第五一〇研究所 | Device and method for testing weak electron beam |
CN102944721B (en) * | 2012-11-25 | 2015-04-15 | 中国航天科技集团公司第五研究院第五一〇研究所 | Ionic current collection test device and method for satellite tail regions |
CN102937673A (en) * | 2012-11-25 | 2013-02-20 | 中国航天科技集团公司第五研究院第五一〇研究所 | Method for detecting surface charge density of dielectric material under electron irradiation |
CN102944721A (en) * | 2012-11-25 | 2013-02-27 | 中国航天科技集团公司第五研究院第五一〇研究所 | Ionic current collection test device and method for satellite tail regions |
CN103257279B (en) * | 2013-04-24 | 2015-06-24 | 兰州空间技术物理研究所 | Device and method for testing medium material radiation induction conductivity for satellite |
CN103257278A (en) * | 2013-04-24 | 2013-08-21 | 兰州空间技术物理研究所 | Medium material conductivity testing device and method |
CN103257279A (en) * | 2013-04-24 | 2013-08-21 | 兰州空间技术物理研究所 | Device and method for testing medium material radiation induction conductivity for satellite |
CN103226167A (en) * | 2013-04-24 | 2013-07-31 | 兰州空间技术物理研究所 | Conductivity measurement device and method of dielectric material |
CN103454315A (en) * | 2013-09-16 | 2013-12-18 | 中国科学院空间科学与应用研究中心 | Device and method for measuring deep dielectric charging characteristic parameter of spacecraft dielectric material |
CN104237316A (en) * | 2014-09-05 | 2014-12-24 | 兰州空间技术物理研究所 | Internally charged device for testing dielectric material |
CN104237316B (en) * | 2014-09-05 | 2016-08-24 | 兰州空间技术物理研究所 | A kind of device charged in tested media material |
CN104635054A (en) * | 2015-02-11 | 2015-05-20 | 华北电力大学 | Closed-type temperature control solid medium electrical resistivity measurement device |
CN106154049B (en) * | 2015-04-03 | 2020-03-31 | 深圳光启高等理工研究院 | Method and system for testing dielectric property of thin film material |
CN106154049A (en) * | 2015-04-03 | 2016-11-23 | 深圳光启高等理工研究院 | The method of testing of thin-film material dielectric properties and system |
CN106483380A (en) * | 2016-09-23 | 2017-03-08 | 中广核工程有限公司 | Particle irradiation sample electrical conductivity and the method for testing of resistivity |
CN108761206A (en) * | 2018-06-28 | 2018-11-06 | 江苏瑞能防腐设备有限公司 | A kind of online resistance temperature, pressure monitoring and early warning instrument |
CN108761206B (en) * | 2018-06-28 | 2024-05-14 | 江苏瑞能氟材料科技有限公司 | Online resistance temperature pressure monitoring and early warning instrument |
CN109813974A (en) * | 2018-12-18 | 2019-05-28 | 兰州空间技术物理研究所 | A kind of geostationary orbit material inequality charging test device |
CN110297014A (en) * | 2019-06-26 | 2019-10-01 | 天津大学 | A method of characterization nuclear power station epoxy resin insulation material is by soda acid erosion degree |
CN110297014B (en) * | 2019-06-26 | 2021-09-14 | 天津大学 | Method for representing acid and alkali erosion degree of epoxy resin insulating material of nuclear power station |
CN111505387A (en) * | 2020-04-24 | 2020-08-07 | 西安交通大学 | Method for testing microwave dielectric property of dielectric material under irradiation condition |
CN116840629A (en) * | 2023-05-11 | 2023-10-03 | 成都产品质量检验研究院有限责任公司 | Polymer insulating material conductivity characteristic test system |
CN116840629B (en) * | 2023-05-11 | 2024-06-04 | 成都产品质量检验研究院有限责任公司 | Polymer insulating material conductivity characteristic test system |
Also Published As
Publication number | Publication date |
---|---|
CN102128985B (en) | 2013-04-24 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
CN102128985B (en) | Method for testing conductivity of medium material | |
CN102162825B (en) | Charge-discharge test equipment for medium material | |
CN103454315A (en) | Device and method for measuring deep dielectric charging characteristic parameter of spacecraft dielectric material | |
CN102841123A (en) | Measuring device and measuring method for trap parameter of solid dielectric material | |
CN103257279B (en) | Device and method for testing medium material radiation induction conductivity for satellite | |
CN103226167A (en) | Conductivity measurement device and method of dielectric material | |
CN103245858A (en) | Device and method for ground-based simulation experimentation of charging effect of high altitude satellite material | |
CN110082201A (en) | Material delayed fracture test method under high pressure hydrogen loading natural gas environment | |
CN102981074A (en) | Interior charging and discharging characteristic stimulation test system and method of high-power part | |
CN108710083A (en) | A kind of electronic product altitude environment adaptability checking test method | |
CN111811750A (en) | Fuel cell leakage detection device | |
CN110108840B (en) | Method for determining correlation degree of synergistic effect of spatial environment | |
Wang et al. | In Situ Detection of Lithium‐Ion Battery Pack Capacity Inconsistency Using Magnetic Field Scanning Imaging | |
Wan et al. | Failure analysis of the electromagnetic relay contacts | |
Qiao et al. | Experimental measurement of deuterium concentration and depth profiling in tungsten by radio frequency glow discharge optical emission spectroscopy | |
Zhai et al. | Thermal model and experimental verification of lithium-ion battery based on heat generation rate | |
Munõz et al. | Dynamic hyperfine interactions in 111In (111Cd)-doped ZnO semiconductor: PAC results supported by ab initio calculations | |
Issa et al. | Analytical solution of steady-state transport equation for photocarriers in CdTe photovoltaics under bias-dependent photoluminescence | |
CN106768034B (en) | Method for measuring deposition pollution in vacuum tank body | |
Sturm et al. | On the impact of the locality on short-circuit characteristics: Experimental analysis and multiphysics simulation of external and local short-circuits applied to Lithium-Ion batteries | |
Feng et al. | Characteristics of charge and discharge of PMMA samples due to electron irradiation | |
Luo et al. | Influence of space charge on the performance of the Kelvin probe | |
Umstadter et al. | Effect of ELMs on deuterium-loaded-tungsten plasma facing components | |
Koivuniemi et al. | Large COMPASS polarized solid state target for Drell-Yan physics | |
Yongchun et al. | Studies on adsorption-desorption of xenon on surface of BC-404 plastic scintillator based on soaking method |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
C06 | Publication | ||
PB01 | Publication | ||
C10 | Entry into substantive examination | ||
SE01 | Entry into force of request for substantive examination | ||
C14 | Grant of patent or utility model | ||
GR01 | Patent grant |