CN104237316A - Internally charged device for testing dielectric material - Google Patents
Internally charged device for testing dielectric material Download PDFInfo
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- CN104237316A CN104237316A CN201410453290.5A CN201410453290A CN104237316A CN 104237316 A CN104237316 A CN 104237316A CN 201410453290 A CN201410453290 A CN 201410453290A CN 104237316 A CN104237316 A CN 104237316A
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- pot
- traveling table
- test board
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Abstract
The invention discloses an internally charged device for testing a dielectric material. The device comprises a potentiometer probe clamp, a movable table, a sample table and a testing board, wherein the potentiometer probe clamp is adopted for fixing a non-contact type surface potentiometer probe, a movable groove is formed in the movable table, the potentiometer probe clamp is capable of driving the non-contact type surface potentiometer probe to slide in the movable groove so as to continuously detect potentials of a plurality of metal surfaces. Therefore, the device disclosed by the invention has the characteristics of being simple in structure, convenient to operate, low in cost and high in efficiency.
Description
Technical field
The present invention relates to space application technology, specifically a kind of for device charged in tested media material.
Background technology
Charged in satellite is generally to be injected in material at the high energy electron of 0.1 ~ 10MeV by energy in space to cause.Above-mentioned high energy electron can penetrate satellite structure (satellite surface material, cable sheath etc.) and deposited charge on cable insulation, printed circuit board, capacitor part, synthetic circuit bag or suspended conductor.If in medium the rate of sedimentation of incident electron exceed its release speed time, in medium, electric density will increase gradually, electric field intensity also strengthens thereupon, discharges (also referred to as electronic induction electromagnetic pulse ECEMP) in occurring when built in field intensity exceedes the disruptive strength of dielectric material.When Spacecraft Electronic system is coupled in the transient pulse produced by electric discharge, logic switch can be caused abnormal, electronic system eventual failure or sensitive element hydraulic performance decline, so that the destruction of whole system.Except the electromagnetic interference (EMI) producing electronic equipment and damage, static discharge also causes damage or the physical property decline of surfacing.Create amount of localized heat due to electric discharge and produce material damage in arc-discharge zone, it not only damages the integrality of spacecraft, but also changes the physical characteristics of surfacing, thus the final normal work destroying spacecraft.Interior electric discharge is usually to the harm of the work of satellite system more direct close to electronic system.Along with the raising of satellite electron system performance and the use of a large amount of new material, in the dielectric material that satellite causes space high energy electron environment, charged effect problem is also more and more responsive, and in satellite, charged guard technology becomes one of gordian technique that development long-life applied satellite must solve.In order to study interior charged effect and guard technology thereof, needing charged effect in ground simulation, evaluating chargeding performance in dielectric material, and the interior hot-line electrical potential of dielectric material is the important content evaluated.Interior hot-line electrical potential monitoring needs the current potential at the inner different depth place of measuring media, and test needs to adopt non-contact measurement, non-contact surface pot as shown in Figure 1, is placed in 3-8mm place above determinand by non-contact surface pot probe induction point and measures.Therefore need the current potential that design tool can be drawn with a multiple dielectric layer of non-contact surface potentiometer measurement, and test.
Summary of the invention
In view of this, the invention provides a kind of for device charged in tested media material, adopt movable multilayer test board, a non-contact surface pot can measure the current potential of multiple dielectric layer extraction.
Of the present invention a kind of for device charged in tested media material, comprise pot probe gripper, traveling table, sample stage and test board;
Described pot probe gripper is the rectangular structure adopting insulating material processing, and pot probe gripper has the through hole coordinated of popping one's head in non-contact surface pot;
Described traveling table is the rectangle dielectric-slab of insulating material, and traveling table has the strip loose slot of through traveling table;
Described test board is rectangle insulcrete, and the one side of test board is coated with multiple convex metal covering along proper alignment on test board length direction;
Described traveling table is placed on described sample stage, and described test board is positioned on traveling table, and the orientation of convex metal covering is parallel with the length direction of strip loose slot; Non-contact surface pot is popped one's head in through described through hole and is fixed with pot probe gripper, and pot probe gripper is placed in loose slot; The lower surface of pot probe gripper is fixedly connected with sample stage;
Non-contact surface pot probe is positioned at above convex metal covering, but does not contact with convex metal covering.
The material of described traveling table and test board is teflon.
The material of described convex metal covering is copper.
The frontier distance of described two adjacent metal coverings is greater than 1cm.
The present invention has following beneficial effect: of the present invention a kind of for device charged in tested media material, non-contact surface pot probe is fixed by adopting pot probe gripper, adopt on traveling table and open loose slot, pot probe gripper drives non-contact surface pot to pop one's head in and slides in loose slot, can the current potential of the multiple metal covering of continuous probe, therefore, it is simple that device of the present invention has structure, easy to operate, with low cost and high efficiency feature.
Accompanying drawing explanation
Fig. 1 is the structural representation of non-contact surface pot probe;
Fig. 2 is the structural representation of each ingredient of device of the present invention, wherein (a) is pot probe gripper schematic diagram, b () is traveling table schematic diagram, (c) is sample stage schematic diagram, and (d) is test board schematic diagram.
Fig. 3 is the structural representation of device of the present invention, and wherein (a) is vertical view, and (b) is side view.
Wherein, 1-pot probe gripper, 2-through hole, 3-traveling table, 4-loose slot, 5-sample stage, 6-test board, 7-metal covering, 8-non-contact surface pot is popped one's head in, 9-non-contact surface pot main frame.
Embodiment
To develop simultaneously embodiment below in conjunction with accompanying drawing, describe the present invention.
Of the present invention a kind of for device charged in tested media material, comprise pot probe gripper 1, traveling table 3, sample stage 5 and test board 6;
As shown in Fig. 2 (a), pot probe gripper 1 is the rectangular structure adopting insulating material processing, and the Width of pot probe gripper 1 has 8 rectangular through-hole coordinated 2 of popping one's head in non-contact surface pot;
As shown in Fig. 2 (b), traveling table 3 is the rectangle dielectric-slab of insulating material, and traveling table 3 has the loose slot 4 of the strip of through traveling table 3;
As shown in Fig. 2 (d), described test board 6 is rectangle insulcrete, and a side of test board 6 is coated with multiple convex metal covering 7 along proper alignment on test board 6 length direction;
As shown in Figure 3, described traveling table 3 is placed on described sample stage 5, and described test board 6 is positioned on traveling table 3, and the orientation of convex metal covering 7 is parallel with the length direction of strip loose slot 4; Non-contact surface pot probe 8 passes described through hole 2 and fixes with pot probe gripper 1, and pot probe gripper 1 is placed in loose slot; The lower surface of pot probe gripper 1 is fixedly connected with sample stage 5;
Non-contact surface pot probe 8 is positioned at above convex metal covering 7, but does not contact with convex metal covering 7.
The material of traveling table 3 and test board 6 is teflon.The material of metal covering 7 is copper.The frontier distance of two adjacent metal coverings 7 is greater than 1cm.
Principle of work for device charged in tested media material of the present invention is:
The present invention can monitor current potential charged in dielectric material, inner for dielectric material different layers current potential is drawn by wire, be connected respectively on the metal covering 7 of test board 6, make the inner equivalent layer equipotential of metal covering 7 and dielectric material, non-contact surface pot probe 8 is fixed in mounting hole, makes non-contact surface pot pop one's head in 9 induction points wherein above a metal covering 7.Because pot probe gripper 1 is stuck in the loose slot 4 of traveling table 3, pot probe gripper 1 is fixed on sample stage 5, then traveling table 3 can be pulled to move relative to pot probe gripper 1.As long as moved to by metal covering 7 to be measured during test immediately below pot probe 8, namely measure corresponding current potential by non-contact surface pot main frame 9.
Concrete operation steps is:
1, inner for dielectric material different layers current potential is drawn by wire, be connected respectively on the metal covering 7 on test board 6;
2, non-contact surface pot main frame 9 power supply is opened;
3, metal covering 7 to be measured is moved to immediately below pot probe 8, measure corresponding current potential by non-contact surface pot main frame 9;
4, move traveling table 3 along loose slot 4, another metal covering 7 to be measured is moved to immediately below pot probe 8, measures current potential.
In sum, these are only preferred embodiment of the present invention, be not intended to limit protection scope of the present invention.Within the spirit and principles in the present invention all, any amendment done, equivalent replacement, improvement etc., all should be included within protection scope of the present invention.
Claims (4)
1. for a device charged in tested media material, it is characterized in that, comprise pot probe gripper (1), traveling table (3), sample stage (5) and test board (6);
Described pot probe gripper (1) is the rectangular structure adopting insulating material processing, and pot probe gripper (1) has the through hole (2) that to pop one's head in non-contact surface pot (8) coordinate;
The rectangle dielectric-slab that described traveling table (3) is insulating material, traveling table (3) has the strip loose slot (4) of through traveling table (3);
Described test board (6) is rectangle insulcrete, and the one side of test board (6) is coated with multiple convex metal covering (7) along proper alignment on test board (6) length direction;
Described traveling table (3) is placed on described sample stage (5), described test board (6) is positioned on traveling table (3), and the orientation of convex metal covering (7) is parallel with the length direction of strip loose slot (4); Non-contact surface pot probe (8) through described through hole (2) and with pot probe gripper (1) fix, pot probe gripper (1) is placed in loose slot; The lower surface of pot probe gripper (1) is fixedly connected with sample stage (5);
Non-contact surface pot probe (8) is positioned at convex metal covering (7) top, but does not contact with convex metal covering (7).
2. a kind ofly as claimed in claim 1 it is characterized in that for device charged in tested media material, the material of described traveling table (3) and test board (6) is teflon.
3. a kind ofly as claimed in claim 1 it is characterized in that for device charged in tested media material, the material of described convex metal covering (7) is copper.
4. a kind ofly as claimed in claim 1 it is characterized in that for device charged in tested media material, the frontier distance of described two adjacent metal coverings (7) is greater than 1cm.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
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| CN201410453290.5A CN104237316B (en) | 2014-09-05 | 2014-09-05 | A kind of device charged in tested media material |
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| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201410453290.5A CN104237316B (en) | 2014-09-05 | 2014-09-05 | A kind of device charged in tested media material |
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| CN104237316A true CN104237316A (en) | 2014-12-24 |
| CN104237316B CN104237316B (en) | 2016-08-24 |
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| CN201410453290.5A Active CN104237316B (en) | 2014-09-05 | 2014-09-05 | A kind of device charged in tested media material |
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| CN102507717A (en) * | 2011-10-20 | 2012-06-20 | 中国航天科技集团公司第五研究院第五一〇研究所 | Device and method for on-orbit monitoring of charging of satellite material surface |
| CN102507990A (en) * | 2011-10-18 | 2012-06-20 | 中国航天科技集团公司第五研究院第五一〇研究所 | Fixture of electrified test in dielectric material for satellite |
| CN102841123A (en) * | 2012-09-04 | 2012-12-26 | 西安交通大学 | Measuring device and measuring method for trap parameter of solid dielectric material |
| CN102944722A (en) * | 2012-11-27 | 2013-02-27 | 中国航天科技集团公司第五研究院第五一〇研究所 | Method for monitoring inner electrified electric potentials of spacecraft |
| CN103226167A (en) * | 2013-04-24 | 2013-07-31 | 兰州空间技术物理研究所 | Conductivity measurement device and method of dielectric material |
| CN103823114A (en) * | 2013-12-24 | 2014-05-28 | 兰州空间技术物理研究所 | Apparatus and method for measuring radiation induced conductivity of medium material at different temperatures |
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2014
- 2014-09-05 CN CN201410453290.5A patent/CN104237316B/en active Active
Patent Citations (8)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH10254311A (en) * | 1997-03-07 | 1998-09-25 | Ricoh Co Ltd | Method for measuring sensitivity of electrophotographic photoreceptor |
| CN102128985A (en) * | 2010-12-30 | 2011-07-20 | 中国航天科技集团公司第五研究院第五一○研究所 | Method for testing conductivity of medium material |
| CN102507990A (en) * | 2011-10-18 | 2012-06-20 | 中国航天科技集团公司第五研究院第五一〇研究所 | Fixture of electrified test in dielectric material for satellite |
| CN102507717A (en) * | 2011-10-20 | 2012-06-20 | 中国航天科技集团公司第五研究院第五一〇研究所 | Device and method for on-orbit monitoring of charging of satellite material surface |
| CN102841123A (en) * | 2012-09-04 | 2012-12-26 | 西安交通大学 | Measuring device and measuring method for trap parameter of solid dielectric material |
| CN102944722A (en) * | 2012-11-27 | 2013-02-27 | 中国航天科技集团公司第五研究院第五一〇研究所 | Method for monitoring inner electrified electric potentials of spacecraft |
| CN103226167A (en) * | 2013-04-24 | 2013-07-31 | 兰州空间技术物理研究所 | Conductivity measurement device and method of dielectric material |
| CN103823114A (en) * | 2013-12-24 | 2014-05-28 | 兰州空间技术物理研究所 | Apparatus and method for measuring radiation induced conductivity of medium material at different temperatures |
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| CN104237316B (en) | 2016-08-24 |
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