CN104237684A - Testing device and method for electrostatic discharge of spacecraft dielectric material - Google Patents
Testing device and method for electrostatic discharge of spacecraft dielectric material Download PDFInfo
- Publication number
- CN104237684A CN104237684A CN201410445793.8A CN201410445793A CN104237684A CN 104237684 A CN104237684 A CN 104237684A CN 201410445793 A CN201410445793 A CN 201410445793A CN 104237684 A CN104237684 A CN 104237684A
- Authority
- CN
- China
- Prior art keywords
- dielectric material
- electron
- energy
- vacuum
- vacuum chamber
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Landscapes
- Analysing Materials By The Use Of Radiation (AREA)
Abstract
The invention discloses a testing device and method for electrostatic discharge of a spacecraft dielectric material. According to the device and method, an electron accelerator and an electron gun are utilized for obtaining a high-energy electron and low-energy electron mixed irradiation environment, electrostatic discharge pulses of the dielectric material under the irradiation of a high-energy and low-energy combination environment are tested, and meanwhile the surface potential of the dielectric material under the irradiation of the high-energy and low-energy combination environment is measured. The device mainly comprises the electron accelerator, the electron gun, a vacuum pumping system, a dielectric material sample, a sample surface potential measuring device and an oscilloscope. The device can be used for testing the electrostatic discharge pulses of the dielectric material under the combined irradiation of the high-energy and low-energy environment, and an important basis is provided for researching the relationship between electrostatic discharge of the dielectric material and the space environment.
Description
Technical field
The present invention relates to the electrostatic discharge pulses of a kind of Spacecraft Dielectrics material ESD test device and method, particularly tested media material dielectric material under the combining environmental irradiation of low energy and high energy, belong to fields of measurement.
Background technology
For all kinds of dielectric materials that spacecraft uses, relation between research Spacecraft Dielectrics material static discharge and environment, very important for comprehend spacecraft dielectric material electro static discharge characteristic under the true irradiation in space, meanwhile, also for the Design and manufacture of spacecraft provides important foundation.
The static discharge of spacecraft mostly occurs on cable insulation, printed circuit board, capacitor part, synthetic circuit bag or suspended conductor, when Spacecraft Electronic system is coupled in the transient pulse produced by electric discharge, logic switch can be caused abnormal, electronic system eventual failure or sensitive element hydraulic performance decline, so that the destruction of whole system.Except the electromagnetic interference (EMI) producing electronic equipment and damage, static discharge also causes damage or the physical property decline of surfacing.Create amount of localized heat due to electric discharge and produce material damage in arc-discharge zone, it not only damages the integrality of spacecraft, but also changes the physical characteristics of surfacing, thus the final normal work destroying spacecraft.
Electronic energy spectrum in natural space environment has wide spectrum feature, and this tests difference with the monoenergetic electrons Irradiation simulating carried out in laboratory, and therefore its result obtained neither be on all four.Foreign scholar studies discovery, if add the high energy electron line of 200keV in 25keV low-energy electron environment, so Kapton material static discharge phenomenon can not occur.Therefore, the static discharge occurred in real space environment has very strong uncertainty.Along with the raising of Spacecraft Electronic system performance, the dielectric material electrostatic discharge problem that spacecraft causes spatial charging environment is also more and more responsive, and spacecraft charging guard technology becomes one of gordian technique that development long-life applied satellite must solve.Carry out the prerequisite of spacecraft charging guard technology research, need the phenomenon at the dielectric material generation static discharge of ground simulation spacecraft under real space conductive environment, monitoring dielectric material surface potential and electrostatic discharge pulses, evaluate the charged barrier propterty of Spacecraft Dielectrics material.Therefore, need the test of electrostatic discharge pulses and the measurement of surface potential of carrying out dielectric material dielectric material under the combining environmental irradiation of low energy and high energy badly, this is a requisite important content in dielectric material discharge and recharge research and analysis.
Summary of the invention
In view of this, the invention provides a kind of Spacecraft Dielectrics material ESD test device and method, simulation medium material is subject to the impact on dielectric material static discharge under the combining environmental irradiation of low-energy electron and high energy electron simultaneously, records electrostatic discharge pulses and the surface potential of dielectric material.
For solving the problems of the technologies described above, concrete grammar of the present invention is as follows:
A kind of Spacecraft Dielectrics material ESD test device, it is made up of vacuum chamber, electron accelerator, electron gun, vacuum-pumping system, insulated sample platform, three-dimensional motion mechanism, oscillograph, sampling resistor, contactless pot; Electron accelerator and electron energy that electron gun produces and beam current density all adjustable;
Vacuum-pumping system and vacuum chamber, the part that oscillograph, sampling resistor and contactless pot remove probe is placed in vacuum chamber outside; Dielectric material sample with medium upper, the back of the body metal electrode under state be placed on the insulated sample platform of internal vacuum chamber, the back of the body metal electrode of dielectric material sample is by 50 Ω sampling resistor ground connection outside vacuum target chamber, oscillograph is accessed between back of the body metal electrode and stake resistance, contactless potentiometric probe is arranged on three-dimensional motion mechanism, and electron accelerator and electron gun are positioned at above insulated sample platform.
Use a method of testing for the dielectric material ESD test device of claim 1, comprise the following steps:
Step 1, be positioned over dielectric material sample in vacuum chamber insulated sample platform on, close vacuum chamber;
Step 2, unlatching vacuum-pumping system are to vacuum chamber;
The high energy electron of step 3, unlocking electronic accelerator simulation space environment;
The low-energy electron of step 4, unlocking electronic rifle space environmental simulation;
Step 5, utilize three-dimensional motion mechanism contactless potentiometric probe to be moved to the top measured surface current potential of dielectric material sample, utilize oscillograph to monitor the electrostatic discharge pulses of dielectric material sample.
The present invention's beneficial effect is compared with prior art:
(1) electron accelerator and electron gun energy Reality simulation spatial charging environment is preferably adopted;
(2) this conductivity of medium material measurement mechanism and method workable, this pilot system working stability, is applicable to measure dielectric material electrostatic discharge pulses under the low-energy electron and high energy electron combining environmental irradiation of different-energy and surface potential.
Accompanying drawing explanation
Fig. 1 is dielectric material ESD test structure drawing of device of the present invention.
In figure: 1-vacuum chamber, 2-electron accelerator, 3-electron gun, 4-vacuum-pumping system, 5-sample stage, 6-dielectric material sample, 7-three-dimensional motion mechanism, 8-oscillograph, 9-sampling resistor, the contactless pot of 10-.
Embodiment
The invention provides a kind of dielectric material ESD test device and method, it utilizes electron accelerator and electron gun to obtain the mixing radiation environment of high energy electron and low-energy electron, the electrostatic discharge pulses of tested media material dielectric material under the combining environmental irradiation of low energy and high energy, the simultaneously surface potential under low energy and high energy combining environmental irradiation of measuring media material.
As shown in Figure 1, for dielectric material ESD test device of the present invention, it is made up of vacuum chamber 1, electron accelerator 2, electron gun 3, vacuum-pumping system 4, sample stage 5, three-dimensional motion mechanism 7, oscillograph 8, sampling resistor 9, contactless pot 10.
Vacuum-pumping system 4 is communicated with vacuum chamber 1, and oscillograph 8, sampling resistor 9 and contactless pot 10 is outside except the part of popping one's head in is placed in vacuum chamber 1; Dielectric material sample 6 with medium upper, the back of the body metal electrode under state be placed on the insulated sample platform 5 of vacuum chamber 1 inside, the back of the body metal electrode of dielectric material sample 6 is by 50 Ω sampling resistor 9 ground connection outside vacuum target chamber 1, oscillograph 8 is accessed between back of the body metal electrode and stake resistance, the probe of contactless pot 10 is arranged on three-dimensional motion mechanism 7, and electron accelerator 2 and electron gun 3 are positioned at above insulated sample platform 5.
The implementation step of method of testing of the present invention is as follows:
(1) dielectric material sample 6 is positioned on the sample stage 5 in vacuum chamber 1, meanwhile, requires joint test circuit according to accompanying drawing, check and connect errorless rear closedown vacuum chamber;
(2) open vacuum-pumping system 4 to vacuumize to vacuum chamber 1, make vacuum tightness be better than 5.0 × 10
-4pa;
(3) high energy electron of unlocking electronic accelerator 2 space environmental simulation;
Electron accelerator provide the energy of high energy electron adjustable within the scope of 0.8MeV ~ 2.3MeV, beam current density is at 0 ~ 100pA/cm
2adjustable in scope.In this test, the electron energy regulating electron accelerator to produce is 1MeV, and beam current density is 50pA/cm
2;
(4) low-energy electron of unlocking electronic rifle 3 space environmental simulation;
The energy of electron gun is adjustable within the scope of 0-100keV, and beam current density is at 0-1nA/cm
2interior adjustable.In this test, the electron energy regulating electron gun to produce is 25keV, and beam current density is 0.5nA/cm
2;
(5) utilize three-dimensional motion mechanism 7 probe of contactless pot 10 to be moved to the top measured surface current potential of dielectric material sample 6, utilize oscillograph 8 to monitor the electrostatic discharge pulses of dielectric material sample.Wherein, contactless pot 10 can adopt model to be the contactless pot of Trek341A.
In sum, these are only preferred embodiment of the present invention, be not intended to limit protection scope of the present invention.Within the spirit and principles in the present invention all, any amendment done, equivalent replacement, improvement etc., all should be included within protection scope of the present invention.
Claims (6)
1. a Spacecraft Dielectrics material ESD test device, is characterized in that: it is made up of vacuum chamber (1), electron accelerator (2), electron gun (3), vacuum-pumping system (4), insulated sample platform (5), three-dimensional motion mechanism (7), oscillograph (8), sampling resistor (9), contactless pot (10); Electron accelerator (2) and electron gun (3) produce electron energy and beam current density is all adjustable;
Vacuum-pumping system (4) is communicated with vacuum chamber (1), and oscillograph (8), sampling resistor (9) and contactless pot (10) are outside except the part of popping one's head in is placed in vacuum chamber (1); Dielectric material sample (6) with medium upper, back of the body metal electrode under state be placed on the inner insulated sample platform (5) of vacuum chamber (1), the back of the body metal electrode of dielectric material sample (6) is by vacuum target chamber (1) 50 Ω sampling resistor (9) ground connection outward, oscillograph (8) is accessed between back of the body metal electrode and stake resistance, the probe of contactless pot (10) is arranged on three-dimensional motion mechanism (7), and electron accelerator (2) and electron gun (3) are positioned at insulated sample platform (5) top.
2. use a method of testing for the Spacecraft Dielectrics material ESD test device of claim 1, it is characterized in that comprising the following steps:
Step 1, be positioned over dielectric material sample (6) in vacuum chamber (1) insulated sample platform (5) on, close vacuum chamber (1);
Step 2, unlatching vacuum-pumping system (4) vacuumize to vacuum chamber (1);
The high energy electron of step 3, unlocking electronic accelerator (2) space environmental simulation;
The low-energy electron of step 4, unlocking electronic rifle (3) space environmental simulation;
Step 5, utilize three-dimensional motion mechanism (7) probe of contactless pot (10) to be moved to the top measured surface current potential of dielectric material sample (6), utilize oscillograph (8) to monitor the electrostatic discharge pulses of dielectric material sample.
3. method of testing according to claim 2, is characterized in that: in described step 2, vacuum environment vacuum level requirements is better than 5.0 × 10
-4pa.
4. method of testing according to claim 2, is characterized in that: in described step 3 electron accelerator provide the energy of high energy electron adjustable within the scope of 0.8MeV ~ 2.3MeV, beam current density is at 0 ~ 100pA/cm
2adjustable in scope.
5. method of testing according to claim 2, is characterized in that: the energy of described step 4 electron gun is adjustable within the scope of 0-100keV, and beam current density is at 0-1nA/cm
2interior adjustable.
6. measuring method according to claim 2, is characterized in that: adopt Trek341A contactless pot monitoring sample surfaces current potential in described step 5.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201410445793.8A CN104237684A (en) | 2014-09-03 | 2014-09-03 | Testing device and method for electrostatic discharge of spacecraft dielectric material |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201410445793.8A CN104237684A (en) | 2014-09-03 | 2014-09-03 | Testing device and method for electrostatic discharge of spacecraft dielectric material |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN104237684A true CN104237684A (en) | 2014-12-24 |
Family
ID=52226157
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201410445793.8A Pending CN104237684A (en) | 2014-09-03 | 2014-09-03 | Testing device and method for electrostatic discharge of spacecraft dielectric material |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN104237684A (en) |
Cited By (11)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN104535868A (en) * | 2015-01-09 | 2015-04-22 | 中国人民解放军军械工程学院 | Electrostatic discharge test device under electromagnetic pulse radiation environment |
| CN105652163A (en) * | 2015-12-21 | 2016-06-08 | 国网四川省电力公司电力科学研究院 | Electricity purchasing card antistatic capacity test device |
| CN107102225A (en) * | 2017-04-18 | 2017-08-29 | 沈阳理工大学 | The surface graded potential simulated experiment circuit of spacecraft |
| CN108120889A (en) * | 2017-12-15 | 2018-06-05 | 北京卫星环境工程研究所 | Laser Driven Flyer Plates induced discharge effect test system and test method |
| CN108152354A (en) * | 2018-02-05 | 2018-06-12 | 四川大学 | A kind of dielectric material surface charge self-operated measuring unit based on two axis slide units |
| CN109018457A (en) * | 2018-07-31 | 2018-12-18 | 北京卫星环境工程研究所 | Spacecraft floating potential verification experimental verification method |
| CN109142924A (en) * | 2015-10-01 | 2019-01-04 | 景祝强 | A kind of charge and discharge analogy method induced based on electronics |
| CN110275070A (en) * | 2019-06-26 | 2019-09-24 | 西安交通大学 | Surface potential self-operated measuring unit and method under a kind of particle bombardment |
| CN111913083A (en) * | 2020-08-07 | 2020-11-10 | 许昌学院 | Simulation test method for space charge-discharge effect of multilayer thin film material |
| CN114560109A (en) * | 2022-03-17 | 2022-05-31 | 中国科学院国家空间科学中心 | Space proton deep charging ground simulation device and method |
| WO2024092865A1 (en) * | 2022-11-04 | 2024-05-10 | 电子科技大学长三角研究院(湖州) | Deep dielectric charging and discharging test device and method under electron radiation |
Citations (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS59204775A (en) * | 1983-05-07 | 1984-11-20 | Mitsubishi Electric Corp | Measurement for charging and discharging of dielectric |
| CN101275989A (en) * | 2007-03-26 | 2008-10-01 | 中国航天科技集团公司第五研究院第五一○研究所 | Method of high pressure sun array electrostatic punch-through effect earth surface simulation test |
| CN102508127A (en) * | 2011-10-20 | 2012-06-20 | 中国航天科技集团公司第五研究院第五一〇研究所 | Device and method for monitoring internal discharge of materials for ground simulation satellite |
| CN102507717A (en) * | 2011-10-20 | 2012-06-20 | 中国航天科技集团公司第五研究院第五一〇研究所 | Device and method for on-orbit monitoring of charging of satellite material surface |
| CN103018587A (en) * | 2012-11-25 | 2013-04-03 | 中国航天科技集团公司第五研究院第五一〇研究所 | System and method for electrostatic discharge test of high-voltage cable under high-energy electronic irradiation |
| CN103226167A (en) * | 2013-04-24 | 2013-07-31 | 兰州空间技术物理研究所 | Conductivity measurement device and method of dielectric material |
-
2014
- 2014-09-03 CN CN201410445793.8A patent/CN104237684A/en active Pending
Patent Citations (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS59204775A (en) * | 1983-05-07 | 1984-11-20 | Mitsubishi Electric Corp | Measurement for charging and discharging of dielectric |
| CN101275989A (en) * | 2007-03-26 | 2008-10-01 | 中国航天科技集团公司第五研究院第五一○研究所 | Method of high pressure sun array electrostatic punch-through effect earth surface simulation test |
| CN102508127A (en) * | 2011-10-20 | 2012-06-20 | 中国航天科技集团公司第五研究院第五一〇研究所 | Device and method for monitoring internal discharge of materials for ground simulation satellite |
| CN102507717A (en) * | 2011-10-20 | 2012-06-20 | 中国航天科技集团公司第五研究院第五一〇研究所 | Device and method for on-orbit monitoring of charging of satellite material surface |
| CN103018587A (en) * | 2012-11-25 | 2013-04-03 | 中国航天科技集团公司第五研究院第五一〇研究所 | System and method for electrostatic discharge test of high-voltage cable under high-energy electronic irradiation |
| CN103226167A (en) * | 2013-04-24 | 2013-07-31 | 兰州空间技术物理研究所 | Conductivity measurement device and method of dielectric material |
Cited By (12)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN104535868A (en) * | 2015-01-09 | 2015-04-22 | 中国人民解放军军械工程学院 | Electrostatic discharge test device under electromagnetic pulse radiation environment |
| CN109142924A (en) * | 2015-10-01 | 2019-01-04 | 景祝强 | A kind of charge and discharge analogy method induced based on electronics |
| CN105652163A (en) * | 2015-12-21 | 2016-06-08 | 国网四川省电力公司电力科学研究院 | Electricity purchasing card antistatic capacity test device |
| CN107102225A (en) * | 2017-04-18 | 2017-08-29 | 沈阳理工大学 | The surface graded potential simulated experiment circuit of spacecraft |
| CN107102225B (en) * | 2017-04-18 | 2019-04-30 | 沈阳理工大学 | The surface graded potential simulated experiment circuit of spacecraft |
| CN108120889A (en) * | 2017-12-15 | 2018-06-05 | 北京卫星环境工程研究所 | Laser Driven Flyer Plates induced discharge effect test system and test method |
| CN108152354A (en) * | 2018-02-05 | 2018-06-12 | 四川大学 | A kind of dielectric material surface charge self-operated measuring unit based on two axis slide units |
| CN109018457A (en) * | 2018-07-31 | 2018-12-18 | 北京卫星环境工程研究所 | Spacecraft floating potential verification experimental verification method |
| CN110275070A (en) * | 2019-06-26 | 2019-09-24 | 西安交通大学 | Surface potential self-operated measuring unit and method under a kind of particle bombardment |
| CN111913083A (en) * | 2020-08-07 | 2020-11-10 | 许昌学院 | Simulation test method for space charge-discharge effect of multilayer thin film material |
| CN114560109A (en) * | 2022-03-17 | 2022-05-31 | 中国科学院国家空间科学中心 | Space proton deep charging ground simulation device and method |
| WO2024092865A1 (en) * | 2022-11-04 | 2024-05-10 | 电子科技大学长三角研究院(湖州) | Deep dielectric charging and discharging test device and method under electron radiation |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| CN104237684A (en) | Testing device and method for electrostatic discharge of spacecraft dielectric material | |
| CN102507717B (en) | Device and method for on-orbit monitoring of charging of satellite material surface | |
| Yan et al. | Breakdown process and fragmentation characteristics of anthracite subjected to high-voltage electrical pulses treatment | |
| CN103308798B (en) | Method for testing shielding effectiveness of electromagnetic shielding material | |
| CN103245858A (en) | Device and method for ground-based simulation experimentation of charging effect of high altitude satellite material | |
| CN107843776B (en) | Space electric field detector ground plasma simulation environment experiment test system | |
| CN103226167A (en) | Conductivity measurement device and method of dielectric material | |
| CN103267910B (en) | Device and method for utilizing plasma generated by electric propeller to induce charge-discharge effect | |
| CN103257279B (en) | Device and method for testing medium material radiation induction conductivity for satellite | |
| CN103954888A (en) | Suspension discharge test model suspension discharge detection positioning device and method | |
| CN102981074A (en) | Interior charging and discharging characteristic stimulation test system and method of high-power part | |
| CN103018587A (en) | System and method for electrostatic discharge test of high-voltage cable under high-energy electronic irradiation | |
| CN102944722B (en) | Method for monitoring inner electrified electric potentials of spacecraft | |
| CN104237659A (en) | In-situ measurement device and method for space charges of dielectric material under electron irradiation | |
| Talebzadeh et al. | Spark-less electrostatic discharge (ESD) on display screens | |
| Cordill et al. | Shielding effectiveness of composite and aluminum aircraft, model and measurement comparison | |
| CN102539920B (en) | Multipurpose induction conductivity measuring electrode | |
| CN203535206U (en) | GIS partial discharging simulation system | |
| Zhang et al. | The measurement method of tower grounding resistance with shorter measuring wire based on green's theorem | |
| CN115932445B (en) | Device test method for simulating space radiation | |
| Smohai et al. | Auxiliary Electrode Arrangements' Effect on Earth Resistance Measurements with Fall-of-Potential Method. | |
| CN104237686A (en) | Method for detecting inner potential of satellite dielectric material | |
| Shang et al. | Effect of operating voltage and grounding method on the internal charging characteristics of polyimide | |
| Sima et al. | Enhancement of Soil Discharge Channels on Potential Surrounding Buried Cables Under Impulsive Currents | |
| CN104360176A (en) | System for electrifying teflon through electron beam irradiation and testing electric quantity in teflon |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| C06 | Publication | ||
| PB01 | Publication | ||
| C10 | Entry into substantive examination | ||
| SE01 | Entry into force of request for substantive examination | ||
| WD01 | Invention patent application deemed withdrawn after publication |
Application publication date: 20141224 |
|
| WD01 | Invention patent application deemed withdrawn after publication |