CN111505387A - Method for testing microwave dielectric property of dielectric material under irradiation condition - Google Patents
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- 238000012360 testing method Methods 0.000 title claims abstract description 99
- 239000003989 dielectric material Substances 0.000 title claims abstract description 41
- 238000000034 method Methods 0.000 title claims abstract description 31
- 230000005855 radiation Effects 0.000 claims abstract description 44
- 239000002245 particle Substances 0.000 claims abstract description 8
- 230000008859 change Effects 0.000 claims description 11
- 230000009471 action Effects 0.000 claims description 4
- -1 polytetrafluoroethylene Polymers 0.000 claims description 3
- 229920001343 polytetrafluoroethylene Polymers 0.000 claims description 3
- 239000004810 polytetrafluoroethylene Substances 0.000 claims description 3
- 229910052594 sapphire Inorganic materials 0.000 claims description 3
- 239000010980 sapphire Substances 0.000 claims description 3
- 238000009774 resonance method Methods 0.000 abstract description 3
- 238000013142 basic testing Methods 0.000 abstract description 2
- 230000005251 gamma ray Effects 0.000 abstract description 2
- 230000015556 catabolic process Effects 0.000 description 7
- 239000000463 material Substances 0.000 description 7
- 238000010998 test method Methods 0.000 description 6
- 238000006731 degradation reaction Methods 0.000 description 5
- 230000008569 process Effects 0.000 description 5
- 239000003822 epoxy resin Substances 0.000 description 4
- 229920000647 polyepoxide Polymers 0.000 description 4
- PNEYBMLMFCGWSK-UHFFFAOYSA-N aluminium oxide Inorganic materials [O-2].[O-2].[O-2].[Al+3].[Al+3] PNEYBMLMFCGWSK-UHFFFAOYSA-N 0.000 description 3
- 230000009286 beneficial effect Effects 0.000 description 3
- 229910052751 metal Inorganic materials 0.000 description 3
- 239000002184 metal Substances 0.000 description 3
- 229910052593 corundum Inorganic materials 0.000 description 2
- 230000007547 defect Effects 0.000 description 2
- 238000010586 diagram Methods 0.000 description 2
- 238000010894 electron beam technology Methods 0.000 description 2
- 229920000642 polymer Polymers 0.000 description 2
- 238000011160 research Methods 0.000 description 2
- 229910001845 yogo sapphire Inorganic materials 0.000 description 2
- 230000032683 aging Effects 0.000 description 1
- 239000000919 ceramic Substances 0.000 description 1
- 229910010293 ceramic material Inorganic materials 0.000 description 1
- 238000006243 chemical reaction Methods 0.000 description 1
- 238000004891 communication Methods 0.000 description 1
- 238000004132 cross linking Methods 0.000 description 1
- 230000001419 dependent effect Effects 0.000 description 1
- 238000013461 design Methods 0.000 description 1
- 238000011161 development Methods 0.000 description 1
- 230000018109 developmental process Effects 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 230000005684 electric field Effects 0.000 description 1
- 230000005672 electromagnetic field Effects 0.000 description 1
- 230000005865 ionizing radiation Effects 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 230000003287 optical effect Effects 0.000 description 1
- 230000003647 oxidation Effects 0.000 description 1
- 238000007254 oxidation reaction Methods 0.000 description 1
- TWNQGVIAIRXVLR-UHFFFAOYSA-N oxo(oxoalumanyloxy)alumane Chemical compound O=[Al]O[Al]=O TWNQGVIAIRXVLR-UHFFFAOYSA-N 0.000 description 1
- 238000012545 processing Methods 0.000 description 1
- 230000001681 protective effect Effects 0.000 description 1
- 230000003068 static effect Effects 0.000 description 1
- 239000000758 substrate Substances 0.000 description 1
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- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R27/00—Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
- G01R27/02—Measuring real or complex resistance, reactance, impedance, or other two-pole characteristics derived therefrom, e.g. time constant
- G01R27/26—Measuring inductance or capacitance; Measuring quality factor, e.g. by using the resonance method; Measuring loss factor; Measuring dielectric constants ; Measuring impedance or related variables
- G01R27/2688—Measuring quality factor or dielectric loss, e.g. loss angle, or power factor
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R27/00—Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
- G01R27/02—Measuring real or complex resistance, reactance, impedance, or other two-pole characteristics derived therefrom, e.g. time constant
- G01R27/26—Measuring inductance or capacitance; Measuring quality factor, e.g. by using the resonance method; Measuring loss factor; Measuring dielectric constants ; Measuring impedance or related variables
- G01R27/2617—Measuring dielectric properties, e.g. constants
- G01R27/2623—Measuring-systems or electronic circuits
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Abstract
The invention discloses a method for testing microwave dielectric property of a dielectric material under irradiation conditions, which adopts a fixed cavity length method to measure the microwave dielectric property of the microwave dielectric material under irradiation conditions, and does not need to adjust the length of a cavity, so that the system structure is simpler. The radiation source is fixed at a certain angle position by adopting an electron gun or gamma ray source device through a semi-open structure, so that radiation particles can be conveniently and accurately hit on a tested sample, the influence of parameters such as irradiation intensity and dosage on the dielectric property of a dielectric material is tested in real time by utilizing the basic testing principle of a resonance method, and the real-time testing requirement of a simulated space environment is met. The quasi-optical cavity belongs to an open cavity, and radiation source equipment is easy to install.
Description
Technical Field
The invention relates to the technical field of microwave testing, including but not limited to microwave dielectric materials and real-time testing of microwave dielectric properties thereof under irradiation conditions.
Background
With the development of aerospace industry in China, a novel microwave device made of a high-performance microwave dielectric material can effectively reduce the size and weight of the device, is beneficial to high performance and miniaturization of a satellite, and is increasingly applied to the spacecraft. On-orbit failure analysis of the spacecraft shows that although the failure of the spacecraft is represented in various forms, except for design defects, the failure is mostly induced by performance degradation of used materials and components under the action of space environments represented by irradiation, temperature and the like. Therefore, the problem of performance degradation of the dielectric property of the microwave dielectric material in a space environment becomes a key problem in the research of spacecraft communication components.
The ubiquitous radiation (gamma rays, electrons and particles) in the space has an important influence on the degradation of the microwave dielectric property of the dielectric material, and the important influence factor is considered when the dielectric material is applied in the space at present. Dielectric materials can be classified into ceramic dielectric materials and polymer-based dielectric materials according to material classification. When radiation acts on the ceramic material, a part of excited Frankel defects can stay in the dielectric layer, so that the total dose effect of ionizing radiation is caused, and the dielectric loss of the material is increased and the resistivity is reduced. When radiation acts on a polymer, various reactions such as aging failure, crosslinking, degradation, oxidation, radical removal and the like can be caused, and the electrical property and the mechanical property of the material are seriously influenced. The changes in the dielectric properties can be calibrated by accurately testing the relationship between the dielectric properties of the microwave dielectric material and the irradiation dose, which is also a main means for evaluating the dielectric property degradation of the dielectric material.
The traditional method for accurately testing the microwave dielectric property is mainly a resonance method, and representative methods include a dielectric resonator method, a coaxial surface wave resonator method, a split resonator method and the like. When the method is used for testing, the dielectric material is placed in the metal cavity, and the microwave dielectric property of the material is calculated through the change of the resonance property of the resonant cavity before and after the sample is placed in the resonant cavity. In the test process, the metal cavity shields (blocks) the influence of an external field (an electric field, irradiation and the like) on the dielectric material, which means that the influence of irradiation on the dielectric property of the material cannot be tested in real time when the dielectric property test method is adopted. Therefore, under the existing test method, for example, when the influence of irradiation on the dielectric property of the dielectric material is researched, the sample after irradiation treatment is usually taken out, and the test is carried out by adopting the test method, which belongs to a static test method and does not conform to the space application scene of the dielectric material. In the irradiation process, the dielectric property of the material has real-time change relationship with the irradiation intensity and the dose, and presents dynamic change. How to simulate the space irradiation environment and dynamically test the microwave dielectric property of the dielectric material in real time under the irradiation condition becomes a difficult point in the industry.
In order to solve the problem of real-time dielectric property test, researchers use dielectric materials as dielectric substrates, adopt an antenna structure to actually test, place an antenna in an irradiation environment, and calculate the property change of the dielectric materials by analyzing the change relation between the antenna property and the irradiation, but the metal conducting layer inevitably existing on the surface of the antenna affects the test result, and the test precision is low. Meanwhile, the network analyzer only endures 40V dc voltage, and when no special protective measures are taken, such as applying high-energy electron beams, dielectric discharge breakdown may be caused, which may cause breakdown damage to the expensive network analyzer, further limiting the practicability of the method.
Disclosure of Invention
The invention aims to solve the technical problem of providing a real-time microwave dielectric property testing method for microwave dielectric materials, which can realize real-time radiation on a tested sample without causing damage or loss, has the advantages of convenient operation, simple structure, low price, higher testing accuracy and high testing speed and is suitable for the irradiation condition.
In order to solve the above technical problems, the present invention provides the following technical solutions:
a method for testing microwave dielectric property of a dielectric material under irradiation conditions comprises a network analyzer, a quasi-optical cavity, a notebook, a radiation source and test system control software. The quasi-optical cavity testing system is adopted, radiation source equipment is added on the basis of the quasi-optical cavity testing system, a radiation source is controlled to emit radiation particles to a tested sample to simulate a space radiation environment, and the quasi-optical cavity is utilized to test the microwave dielectric property of the sample under the conditions of different radiation doses or intensities in real time.
A method for testing microwave dielectric property of a dielectric material under irradiation conditions comprises the following steps:
step 1: the size of the quasi-optical cavity structure is researched and developed, and the size of the cavity structure is more suitable for real-time testing under the irradiation condition. The curvature radius of the concave mirror is 300-320 mm, the radius of the concave mirror is 155 mm-175 mm, the radius of the plane mirror is 120 mm-140 mm, and the height of the cavity is 160 mm-190 mm.
Step 2: the irradiation of samples with different doses and intensities is realized by adopting an irradiation source automatic emission device and controlling the magnitude of the accelerating voltage (30-150 kv) of different electron guns.
And step 3: and compiling test system control software by utilizing labview to realize the control of the radiant quantity of a radiation source and the control of real-time test on the whole system, and inputting scanning parameters and the control voltage of an electron gun through a system operation interface to test the microwave dielectric property of the dielectric material.
And 4, step 4: the combination of software and hardware is realized, the system is calibrated by using standard samples of polytetrafluoroethylene and sapphire, and a complete and available microwave dielectric property testing system is built.
And 5: and starting the vacuum device, keeping the radiation source in a closed state, performing cavity test by using developed test system control software, and recording S parameters, resonant frequency f and quality factor Q.
Step 6: keeping the radiation source in a closed state, putting a sample on a plane mirror of the quasi-optical cavity, starting a vacuum device, testing the microwave dielectric property of the sample by using developed test system control software, and calculating the dielectric constant of the sample according to the change of quality factors Q and S parameters1And recording the resonance frequency f1Quality factor Q1；
And 7: holding the sample in place, turning on the radiation source device, using the grindingThe control software of the test system is used for testing the microwave dielectric property of the sample, and the dielectric constant of the sample is calculated according to the change of the quality factor Q and the S parameter2And recording the resonance frequency f2Quality factor Q2。
And 8: and (6) repeating the steps (6) and (7), controlling the radiation intensity and the radiation dose of the radiation source by using the control software of the test system, and analyzing the microwave dielectric property of the sample under the action of different intensities or doses of the radiation particles according to the result obtained by the microwave dielectric property test system.
The invention has the following beneficial effects:
compared with the prior art, the method for testing the microwave dielectric property of the dielectric material under the irradiation condition adopts a quasi-optical cavity method, the quasi-optical cavity is an open cavity, and the method has the advantages of convenience in test operation, low requirement on samples, high test precision, suitability for high-frequency multi-physics fields and the like, and has more test application fields and higher test precision compared with the traditional test method. The test system of the invention adopts a fixed cavity length method to measure the microwave dielectric property of the microwave dielectric material under the irradiation condition, and the length of the cavity does not need to be adjusted, so that the system structure is simpler. The characteristic that a physical structure of a quasi-optical cavity method is a semi-open cavity is utilized, an electron gun or gamma ray source equipment is adopted through the semi-open structure, a radiation source is fixed at a certain angle position, radiation particles can be conveniently and accurately shot on a tested sample, the influence of parameters such as irradiation intensity and dosage on dielectric properties of a dielectric material is tested in real time by utilizing a basic testing principle of a resonance method, and the requirement of real-time testing of a simulated space environment is met. The test method has the advantages of simple structure, convenient operation, low price, high efficiency, high accuracy and the like, and can well test the microwave dielectric property of the microwave dielectric material under the radiation condition, thereby being beneficial to researching the influence of the radiation condition on the microwave device of the spacecraft.
Drawings
Fig. 1 is a schematic structural diagram of a system of a method for testing microwave dielectric properties of a dielectric material under irradiation conditions, which is provided by the invention.
Detailed Description
In order to make the technical problems, technical solutions and advantages to be solved by the present invention clearer, the following detailed description is made with reference to the accompanying drawings.
The invention provides a method and a system structure schematic diagram suitable for testing the microwave dielectric property of a dielectric material under an irradiation condition, which are shown in figure 1, wherein 1 is a vacuum cover, 2 is a concave mirror of a quasi-optical cavity, 3 is a sample, 4 is a plane mirror of the quasi-optical cavity, 5 is a notebook, 6 is a network analyzer, 7 is a radiation source electron gun, 8 is an electron beam, the network analyzer is connected with the quasi-optical cavity through a coaxial line, and the network analyzer is connected with the notebook through a GPIB. The test system transmits signals to the quasi-optical cavity by a network analyzer, then collects and processes the signals reflected from the quasi-optical cavity, and transmits the processed signals to self-developed system software for processing, so that the whole test process is controlled, and the final result is displayed by a display screen; the emission of the electron gun is controlled by system software, and irradiation conditions are completed by the programmed system control software.
The quasi-optical cavity is an open cavity, and is a quasi-optical device for extrapolating an optical Fabry-Perot interferometer to millimeter wave band, also called quasi-optical resonant cavity, and the quasi-optical cavity is divided into a concave-plano resonant cavity and a concave-plano resonant cavity. In an open cavity, the magnitude of the diffraction loss is mode dependent and the different modes differ widely. The electromagnetic field acts as a Gaussian beam in the quasi-optical cavity, and the higher-order mode quality factor in the quasi-optical cavity is too low to be directly ignored due to diffraction loss, so that the higher-quality-factor fundamental mode TE is used011And in the resonant mode, the working mode is sparsely distributed in the cavity, so that the mode identification is facilitated, and the sample test can be accurately carried out. The quasi-optical cavity test system adopts a fixed cavity length method to test the microwave dielectric performance, keeps the cavity length unchanged, and calculates the dielectric constant according to the change of the resonant frequency f, the quality factor Q and the S parameter
The method for testing the microwave dielectric property of the dielectric material under the irradiation condition adopts the quasi-optical cavity testing system, and the testing system has the advantages of high testing precision, high efficiency and the like. In the aspect of hardware, on the basis of predecessors, great modification is made, a quasi-optical cavity suitable for the test system is redesigned, and the research on the microwave dielectric property of the microwave dielectric material is more facilitated under the irradiation condition. In terms of software, the control software of the test system can control the operation process of the whole system in real time, comprehensively considers various influence factors, adds the influence factors when calculating the dielectric property of the microwave dielectric material by using the software, reduces the source of test errors and enables the test result of the system to be more accurate. The method for testing the microwave dielectric property of the dielectric material under the irradiation condition adopts an automatic radiation source, can simulate the irradiation influence on a microwave device in a space environment by controlling and transmitting radiation particles with different intensities or dosages to a tested sample, and can meet the requirement of real-time testing under the irradiation condition
As the quasi-optical cavity method test system is recorded in the related documents and belongs to the prior art, the invention has the innovative point of improving the quasi-optical cavity test system and increasing the irradiation conditions on the basis of the quasi-optical cavity test system so as to be convenient for researching the influence of the irradiation conditions on the microwave devices of the space spacecraft.
Example 1:
the method for testing the microwave dielectric property of the dielectric material under the irradiation condition comprises the following operation steps:
step 1: the size of the quasi-optical cavity structure is researched and developed, and the size of the cavity structure is more suitable for real-time testing under the irradiation condition. The curvature radius of the concave mirror is 300-320 mm, the radius of the concave mirror is 155 mm-175 mm, the radius of the plane mirror is 120 mm-140 mm, and the height of the cavity is 160 mm-190 mm.
Step 2: the irradiation of samples with different doses and intensities is realized by adopting an irradiation source automatic emission device and controlling the magnitude of the accelerating voltage (30-150 kv) of different electron guns.
And step 3: and compiling test system control software by utilizing labview to realize the control of the radiant quantity of a radiation source and the control of real-time test on the whole system, and inputting scanning parameters and the control voltage of an electron gun through a system operation interface to test the microwave dielectric property of the dielectric material.
And 4, step 4: the combination of software and hardware is realized, the system is calibrated by using standard samples of polytetrafluoroethylene and sapphire, and a complete and available microwave dielectric property testing system is built.
And 5: and starting the vacuum device, keeping the radiation source in a closed state, performing cavity test by using developed test system control software, and recording S parameters, resonant frequency f and quality factor Q.
Step 6: keeping the radiation source in a closed state, putting a sample on a plane mirror of the quasi-optical cavity, starting a vacuum device, testing the microwave dielectric property of the sample by using developed test system control software, and calculating the dielectric constant of the sample according to the change of quality factors Q and S parameters1And recording the resonance frequency f1Quality factor Q1；
And 7: keeping the sample at the original position, starting the radiation source device, testing the microwave dielectric property of the sample by using the developed test system control software, and calculating the dielectric constant of the sample according to the variation of the Q and S parameters of the quality factor2And recording the resonance frequency f2Quality factor Q2。
And 8: and (6) repeating the steps (6) and (7), controlling the radiation intensity and the radiation dose of the radiation source by using the control software of the test system, and analyzing the microwave dielectric property of the sample under the action of different intensities or doses of the radiation particles according to the result obtained by the microwave dielectric property test system.
At normal temperature, microwave dielectric property tests before and after irradiation are carried out on aluminum oxide and epoxy resin, and the results are shown in the following table:
table 1: test results before irradiation
| Sample (I) | Resonance frequency (GHz) | ε |
| Al2O3 | 9.72 | 8.87 |
| Epoxy resin | 10.18 | 3.56 |
Table 2: test results after irradiation
| Sample (I) | Resonance frequency (GHz) | ε |
| Al2O3 | 9.59 | 8.98 |
| Epoxy resin | 10.04 | 3.76 |
From the above two tables, it can be seen that the resonant frequency and dielectric constant of the alumina and epoxy resin are changed after the sample is irradiated. After irradiation, the resonant frequency of the two samples is reduced, the dielectric constant is increased, the change of the test is in a normal range compared with relevant literature data, and the test result is accurate. Therefore, the invention can be used for researching the microwave dielectric property of the microwave dielectric material under the irradiation condition.
Claims (1)
1. A method for testing microwave dielectric property of a dielectric material under irradiation condition is characterized by comprising the following steps:
step 1: the size of the quasi-optical cavity structure is researched and developed, the size of the cavity structure is more suitable for real-time test under the irradiation condition, the curvature radius of the concave mirror is 300, the radius of the concave mirror is 165mm, the radius of the plane mirror is 130mm, and the height of the cavity is 150 mm;
step 2: the irradiation of samples with different doses and intensities is realized by adopting an irradiation source automatic emission device and controlling the magnitude of the accelerating voltage (30-150 kv) of different electron guns;
and step 3: compiling test system control software by utilizing labview to realize the control of the radiant quantity of a radiation source and the control of real-time test of the whole system, inputting scanning parameters and the control voltage of an electron gun through a system operation interface, and then testing the microwave dielectric property of the dielectric material;
and 4, step 4: the combination of software and hardware is realized, the system is calibrated by using standard samples of polytetrafluoroethylene and sapphire, and a complete and available microwave dielectric property testing system is built;
and 5: starting a vacuum device, keeping a radiation source in a closed state, performing cavity test by using developed test system control software, and recording S parameters, resonant frequency f and quality factor Q;
step 6: keeping the radiation source in a closed state, putting a sample on a plane mirror of the quasi-optical cavity, starting a vacuum device, testing the microwave dielectric property of the sample by using developed test system control software, and calculating the dielectric constant of the sample according to the change of quality factors Q and S parameters1And recording the resonance frequency f1Quality factor Q1；
And 7: keeping the sample at the original position, starting the radiation source device, testing the microwave dielectric property of the sample by using the developed test system control software, and calculating the dielectric constant of the sample according to the variation of the Q and S parameters of the quality factor2And recording the resonance frequency f2Quality factor Q2；
And 8: and (6) repeating the steps (6) and (7), controlling the radiation intensity and the radiation dose of the radiation source by using the control software of the test system, and analyzing the microwave dielectric property of the sample under the action of different intensities or doses of the radiation particles according to the result obtained by the microwave dielectric property test system.
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| CN112051453A (en) * | 2020-08-31 | 2020-12-08 | 电子科技大学 | Remote testing device and method for dielectric property of high-temperature fluid material |
| CN112180174A (en) * | 2020-09-11 | 2021-01-05 | 西安交通大学 | Voltage-sensitive ceramic interface state response measuring method based on frequency domain dielectric response |
| CN112305315A (en) * | 2020-09-30 | 2021-02-02 | 山东国瓷功能材料股份有限公司 | Variable-temperature automatic test system and method for dielectric property of dielectric material |
| CN112782489A (en) * | 2021-01-09 | 2021-05-11 | 西安交通大学 | Device and method for measuring antenna performance under vacuum environment electron irradiation |
| CN115932445A (en) * | 2022-12-14 | 2023-04-07 | 北京卫星环境工程研究所 | Device test method for simulating space radiation |
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| CN112305315A (en) * | 2020-09-30 | 2021-02-02 | 山东国瓷功能材料股份有限公司 | Variable-temperature automatic test system and method for dielectric property of dielectric material |
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