CN103163256B - 放电离子化电流检测器 - Google Patents

放电离子化电流检测器 Download PDF

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Publication number
CN103163256B
CN103163256B CN201210548770.0A CN201210548770A CN103163256B CN 103163256 B CN103163256 B CN 103163256B CN 201210548770 A CN201210548770 A CN 201210548770A CN 103163256 B CN103163256 B CN 103163256B
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China
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gas passage
electrode
tube
gas
region
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Expired - Fee Related
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CN201210548770.0A
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English (en)
Chinese (zh)
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CN103163256A (zh
Inventor
品田惠
堀池重吉
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Shimadzu Corp
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Shimadzu Corp
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N27/00—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means
    • G01N27/62—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating the ionisation of gases, e.g. aerosols; by investigating electric discharges, e.g. emission of cathode
    • G01N27/68—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating the ionisation of gases, e.g. aerosols; by investigating electric discharges, e.g. emission of cathode using electric discharge to ionise a gas
    • G01N27/70—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating the ionisation of gases, e.g. aerosols; by investigating electric discharges, e.g. emission of cathode using electric discharge to ionise a gas and measuring current or voltage
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N27/00—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means
    • G01N27/60—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating electrostatic variables, e.g. electrographic flaw testing
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N27/00—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means
    • G01N27/62—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating the ionisation of gases, e.g. aerosols; by investigating electric discharges, e.g. emission of cathode
    • G01N27/64—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating the ionisation of gases, e.g. aerosols; by investigating electric discharges, e.g. emission of cathode using wave or particle radiation to ionise a gas, e.g. in an ionisation chamber
    • G01N27/66—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating the ionisation of gases, e.g. aerosols; by investigating electric discharges, e.g. emission of cathode using wave or particle radiation to ionise a gas, e.g. in an ionisation chamber and measuring current or voltage
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N30/00—Investigating or analysing materials by separation into components using adsorption, absorption or similar phenomena or using ion-exchange, e.g. chromatography or field flow fractionation
    • G01N30/02—Column chromatography
    • G01N30/62—Detectors specially adapted therefor
    • G01N30/64—Electrical detectors

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  • Chemical & Material Sciences (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Electrochemistry (AREA)
  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
CN201210548770.0A 2011-12-16 2012-12-17 放电离子化电流检测器 Expired - Fee Related CN103163256B (zh)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2011275922A JP5704065B2 (ja) 2011-12-16 2011-12-16 放電イオン化電流検出器
JP2011-275922 2011-12-16

Publications (2)

Publication Number Publication Date
CN103163256A CN103163256A (zh) 2013-06-19
CN103163256B true CN103163256B (zh) 2015-04-01

Family

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CN201210548770.0A Expired - Fee Related CN103163256B (zh) 2011-12-16 2012-12-17 放电离子化电流检测器

Country Status (3)

Country Link
US (1) US9784713B2 (https=)
JP (1) JP5704065B2 (https=)
CN (1) CN103163256B (https=)

Families Citing this family (17)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US9117616B2 (en) * 2012-07-13 2015-08-25 Sp Tech Co., Ltd. Dielectric barrier discharge-type electrode structure for generating plasma having conductive body protrusion on electrodes
US11002684B2 (en) * 2012-10-25 2021-05-11 Agilent Technologies, Inc. Chemiluminescent detector having coating to reduce excited species adsorption
US9448177B2 (en) 2012-10-25 2016-09-20 Agilent Technologies, Inc. Flame photometric detector
CH707685A1 (de) * 2013-03-06 2014-09-15 Inficon Gmbh Ionisations-Vakuummesszelle mit Abschirmvorrichtung.
CN103776893B (zh) * 2014-02-17 2016-09-21 哈尔滨工业大学（威海） 一种介质阻挡放电电离源离子迁移谱仪
JP6350391B2 (ja) * 2015-05-22 2018-07-04 株式会社島津製作所 放電イオン化検出器
EP3353802B1 (de) 2015-09-23 2019-07-24 Inficon AG Ionisations-vakuummesszelle
JP6743599B2 (ja) * 2016-09-08 2020-08-19 株式会社島津製作所 誘電体バリア放電イオン化検出器
JP6775141B2 (ja) 2016-09-08 2020-10-28 株式会社島津製作所 誘電体バリア放電イオン化検出器
JP6675709B2 (ja) * 2016-09-08 2020-04-01 株式会社島津製作所 誘電体バリア放電イオン化検出器
JP6747198B2 (ja) 2016-09-08 2020-08-26 株式会社島津製作所 誘電体バリア放電イオン化検出器
JP6747197B2 (ja) * 2016-09-08 2020-08-26 株式会社島津製作所 誘電体バリア放電イオン化検出器
KR102046637B1 (ko) * 2018-01-30 2019-11-19 한국기계연구원 공정 모니터링을 위한 플라즈마 반응기
JP2023077708A (ja) * 2021-11-25 2023-06-06 株式会社島津製作所 放電イオン化検出器およびガスクロマトグラフ分析装置
CN114235943B (zh) * 2021-12-31 2024-11-19 北京华泰诺安技术有限公司 用于光离子化传感器的一体化离子收集机构及其制备方法
US12146854B2 (en) * 2023-03-01 2024-11-19 Mocon, Inc. Galvanic current protection for photoionization detector
CN120076146A (zh) * 2024-08-22 2025-05-30 南方科技大学 多级电容耦合等离子激发器

Citations (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5394090A (en) * 1991-02-28 1995-02-28 Wentworth; Wayne E. Improved system for detecting compounds in a gaseous sample using induced photoionizations and electron capture detection
US5892364A (en) * 1997-09-11 1999-04-06 Monagle; Matthew Trace constituent detection in inert gases
CN200968949Y (zh) * 2006-07-10 2007-10-31 尹俊荣 脉冲放电氦离子化气相色谱仪
CN101770924A (zh) * 2008-12-30 2010-07-07 株式会社岛津制作所 一种解吸电离装置
CN101981441A (zh) * 2008-03-25 2011-02-23 国立大学法人大阪大学 放电电离电流检测器
CN102087255A (zh) * 2009-12-04 2011-06-08 国立大学法人大阪大学 放电电离电流检测器
CN102192952A (zh) * 2010-02-01 2011-09-21 株式会社岛津制作所 放电离子化电流检测器

Family Cites Families (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3447071A (en) * 1965-09-22 1969-05-27 Webb James E Probes having guard ring and primary sensor at same potential to prevent collection of stray wall currents in ionized gases
US3526828A (en) * 1967-08-07 1970-09-01 Univ Minnesota Method and apparatus for measuring particle concentration
SU1048395A1 (ru) * 1982-04-19 1983-10-15 Московский Ордена Октябрьской Революции И Ордена Трудового Красного Знамени Институт Стали И Сплавов Ионизационный детектор дл хроматографа
US5394092A (en) 1991-02-28 1995-02-28 Valco Instruments Co., Inc. System for identifying and quantifying selected constituents of gas samples using selective photoionization
US5594346A (en) * 1991-02-28 1997-01-14 Valco Instruments Co., Inc. Apparatus and methods for identifying and quantifying compounds using a plurality of pulsed rare gas photoionization detectors
JPH10307123A (ja) * 1997-05-07 1998-11-17 Hitachi Ltd 光イオン化検出方法及び光イオン化検出器
US6333632B1 (en) * 1999-09-16 2001-12-25 Rae Systems, Inc. Alternating current discharge ionization detector
US6448777B1 (en) * 2001-08-20 2002-09-10 Agilent Technologies, Inc. Hermetically-sealed miniaturized discharge ionization detector
US6842008B2 (en) * 2003-03-11 2005-01-11 Stanley D. Stearns Gas detector with modular detection and discharge source calibration
US7812614B2 (en) * 2004-10-27 2010-10-12 Hitachi High-Tech Science Systems Corporation Electron capture detector and nonradiative electron capture detector
JP5136300B2 (ja) * 2008-09-02 2013-02-06 株式会社島津製作所 放電イオン化電流検出器

Patent Citations (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5394090A (en) * 1991-02-28 1995-02-28 Wentworth; Wayne E. Improved system for detecting compounds in a gaseous sample using induced photoionizations and electron capture detection
US5892364A (en) * 1997-09-11 1999-04-06 Monagle; Matthew Trace constituent detection in inert gases
CN200968949Y (zh) * 2006-07-10 2007-10-31 尹俊荣 脉冲放电氦离子化气相色谱仪
CN101981441A (zh) * 2008-03-25 2011-02-23 国立大学法人大阪大学 放电电离电流检测器
CN101770924A (zh) * 2008-12-30 2010-07-07 株式会社岛津制作所 一种解吸电离装置
CN102087255A (zh) * 2009-12-04 2011-06-08 国立大学法人大阪大学 放电电离电流检测器
CN102192952A (zh) * 2010-02-01 2011-09-21 株式会社岛津制作所 放电离子化电流检测器

Non-Patent Citations (4)

* Cited by examiner, † Cited by third party
Title
AGC氦放电离子化检测器(DID)气相色谱仪;曾素芳 等;《低温与特气》;20110630;第29卷(第3期);37-44 *
Pulsed discharge helium ionization detector universal detector for inorganic and organic compounds at the low picogram level;W.E.Wentwortha et al;《Journal of Chromatography A》;19941230;第688卷(第1-2期);135-152 *
Pulsed discharge helium ionization detector;W.E.Wentworth et al;《Chromatographia》;19921031;第34卷(第5-8期);219-225 *
放电离子化气相色谱仪在高纯度氢分析中的应用;陈小娟;《分析测试技术与仪器》;20081231;第14卷(第4期);236-240 *

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Publication number Publication date
CN103163256A (zh) 2013-06-19
JP5704065B2 (ja) 2015-04-22
JP2013125022A (ja) 2013-06-24
US9784713B2 (en) 2017-10-10
US20130154658A1 (en) 2013-06-20

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