CN103105510A - Film sample stretching device used for being matched with atomic force microscope (AFM) - Google Patents
Film sample stretching device used for being matched with atomic force microscope (AFM) Download PDFInfo
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- CN103105510A CN103105510A CN2013100379649A CN201310037964A CN103105510A CN 103105510 A CN103105510 A CN 103105510A CN 2013100379649 A CN2013100379649 A CN 2013100379649A CN 201310037964 A CN201310037964 A CN 201310037964A CN 103105510 A CN103105510 A CN 103105510A
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- pedestal
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- stretching device
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- film sample
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Abstract
The invention discloses a film sample stretching device used for being matched with an atomic force microscope (AFM). According to the film sample stretching device, an inwardly concave groove is formed in a base seat, guide rails are arranged on two sides of the front portion of the groove in the base seat, a threaded hole is formed in the rear end of the base seat, a propulsion screw is in threaded connection with the threaded hole, penetrates through a right fixture central hole and abuts against a left fixture. A right fixture is fixed in the rear portion of the groove in the base seat. The left fixture is located on the guiding rails and is in slide connection with the guide rails. The left fixture is composed of a cover plate and a bottom plate, the right fixture is composed of a cover plate and a bottom plate, the cover plate and the bottom plate of the left fixture are fixedly connected through bolts, and the cover plate and the bottom plate of the right fixture are fixedly connected through bolts. The film sample stretching device used for being matched with the AFM solves the problem that the size and the structure of a sample to be tested are strictly restricted and is applicable to materials with high strain rates; and moreover, the production fees are reduced, and demands of the majority of ordinary AFM users can be met.
Description
Technical field
The present invention relates to the supporting film sample stretching device of using of atomic force microscope, be specifically related to the improvement to its structure.
Background technology
In order to organically combine the measurement of nano material and Mechanical Properties of Products and the detection of microscopic appearance, the micro-nano optical viewers such as atomic force microscope (AFM) will be used in conjunction with some mechanics test devices, thereby can in depth explore microscopic damage fracture behaviour and the mechanism of all kinds of nano materials and goods, and and load, material structure and performance between the correlativity rule.
Existing a kind of across scale micronano in-situ drawing mechanics performance testing device, there is following limitation in this device: strict to the restriction of tested sample dimensional structure; The maximum strain amount can not satisfy high rate of strain material, because these devices are all comparatively complicated, comprise power sensor, stepper motor etc., thereby manufacturing cost is higher in addition, can not be satisfied with vast common atomic force microscope user's request.
Summary of the invention
In order to overcome defective of the prior art, the invention provides the supporting film sample stretching device of using of a kind of easy atomic force microscope.
The supporting film sample stretching device of using of a kind of atomic force microscope is characterized in that a pedestal is provided with inner groovy, and pedestal front groove both sides are provided with guide rail; The pedestal rear end is provided with threaded hole, and augering screw is threaded with threaded hole;
Augering screw passes right fixture center pit and withstands on left fixture; Right fixture is fixed in the rear section groove of pedestal; Left fixture is positioned on guide rail, is slidably connected with guide rail;
Described left fixture is comprised of cover plate and base plate; Right fixture is comprised of cover plate and base plate; Cover plate and the base plate of described left fixture are bolted to connection; Cover plate and the base plate of described right fixture are bolted to connection.
The invention solves the exclusive problem of tested sample dimensional structure, can be applied to high rate of strain material, reduced in addition manufacturing cost, can be satisfied with vast common atomic force microscope user's request.
Description of drawings
Accompanying drawing 1 is perspective view of the present invention.
Accompanying drawing 2 is side views of Fig. 1.
Accompanying drawing 3 is track structure cut-open views.
1 pedestal, 11 long through grooves, 12 long through grooves, 13 threaded holes, 14 scales, 15 grooves,
2 guide rails,
3 left fixtures, 31 cover plates; 32 base plates,
4 augering screws,
5 right fixtures, 51 cover plates, 52 base plates, 53 center pits,
6 L shaped fastening blocks,
7 specimen platforms, 8 bolts, 9 test vibration isolators.
Embodiment
The preferred embodiments of the present invention accompanying drawings is as follows:
When the present invention uses, this device can be fixed on specimen platform 7, the specimen platform can be placed on test vibration isolators 9.
The supporting sample stretching device of using of a kind of atomic force microscope, a pedestal 1 is provided with inner groovy 15, and pedestal front groove both sides are provided with guide rail 2; The pedestal rear end is provided with threaded hole 13, and augering screw 4 is threaded with threaded hole; Augering screw passes right fixture 5 center pits 53 and withstands on left fixture 3; Right fixture 5 is fixed in the rear section groove of pedestal; Left fixture is positioned on guide rail, is slidably connected with guide rail.The rail section shape can be wide at the top and narrow at the bottom, is fixedly connected with pedestal by bolt 8.Left fixture card can not break away from orbit, can guarantee that left fixture level on described guide rail slides.
Described left fixture is comprised of cover plate 31 and base plate 32; Right fixture is comprised of cover plate 51 and base plate 52.
The cover plate of described left fixture is fixedly connected with by bolt 8 with base plate; The cover plate of described right fixture is fixedly connected with by bolt 8 with base plate.
Described pedestal rear portion has long through groove 12 on the two side, and right clamp bottom board is fixing by the bolt 8 in long through groove.Described long through groove 12 makes the fixed position of described right fixture have certain degree of freedom, thereby can guarantee that the atomic force microscope test zone is the sample appointed area by regulating right fixture fixed position.
Be provided with scale 14 on described pedestal one sidewall, can read left and right fixture edge numerical value, thereby calculate sample initial length, tensile elongation etc.
Four corners position at described pedestal is provided with long through groove 11; Two L shaped fastening blocks 6 are arranged, be separately positioned on the bottom, two ends of pedestal, the long through groove 11 that bolt 8 passes on pedestal is fixedly connected with L shaped fastening block 6.
Long through groove 11 has certain degree of freedom because its length can make the fixed position of bolt in long through groove, thereby can connect from the sample stage of the different sizes of different model atomic force microscope.
Principle of work of the present invention is as follows:
left fixture cover plate and left clamp bottom board are clamped sample one end, tighten left fixture sample fastening bolt, thereby fixed sample one end, right fixture cover plate and right clamp bottom board are clamped the sample other end, tighten right fixture sample fastening bolt, thereby the fixed sample other end, regulate the relative position of left and right fixture, center and the atomic force microscope probe of sample are similar on same perpendicular line, thereby under the assurance atomic force microscope probe after pin surveyed area be the sample central area, the bolt that has in long through groove 12 on two side, pedestal rear portion is tightened inwards, thereby fixing right fixture, the rotation augering screw promotes left fixture along guide rail movement, and then stretching sample.
Claims (5)
1. the supporting film sample stretching device of using of atomic force microscope, is characterized in that, a pedestal is provided with inner groovy, and pedestal front groove both sides are provided with guide rail; The pedestal rear end is provided with threaded hole, and augering screw is threaded with threaded hole;
Augering screw passes right fixture center pit and withstands on left fixture; Right fixture is fixed in the rear section groove of pedestal; Left fixture is positioned on guide rail, is slidably connected with guide rail;
Described left fixture is comprised of cover plate and base plate; Right fixture is comprised of cover plate and base plate; Cover plate and the base plate of described left fixture are bolted to connection; Cover plate and the base plate of described right fixture are bolted to connection.
2. the supporting film sample stretching device of using of atomic force microscope according to claim 1, is characterized in that, described pedestal rear portion has long through groove on the two side, and right clamp bottom board is fixed by the bolt in long through groove.
3. the supporting film sample stretching device of using of atomic force microscope according to claim 1 and 2, is characterized in that, is provided with scale on described pedestal one sidewall.
4. the supporting film sample stretching device of using of atomic force microscope according to claim 3, is characterized in that, is provided with long through groove at the four corners position of described pedestal; Two L shaped fastening blocks are arranged, be separately positioned on the bottom, two ends of pedestal, the long through groove that bolt passes on pedestal is fixedly connected with L shaped fastening block.
5. the supporting film sample stretching device of using of atomic force microscope according to claim 4, is characterized in that, rail section is shaped as wide at the top and narrow at the bottom, is fixedly connected with pedestal by bolt, and left fixture card in orbit.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201310037964.9A CN103105510B (en) | 2013-01-31 | 2013-01-31 | The supporting film sample stretching device of atomic force microscope |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201310037964.9A CN103105510B (en) | 2013-01-31 | 2013-01-31 | The supporting film sample stretching device of atomic force microscope |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN103105510A true CN103105510A (en) | 2013-05-15 |
| CN103105510B CN103105510B (en) | 2015-10-28 |
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| Application Number | Title | Priority Date | Filing Date |
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| CN201310037964.9A Expired - Fee Related CN103105510B (en) | 2013-01-31 | 2013-01-31 | The supporting film sample stretching device of atomic force microscope |
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Cited By (10)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN103760019A (en) * | 2013-12-31 | 2014-04-30 | 上海纳米技术及应用国家工程研究中心有限公司 | Horizontal material stretch compression tester assorted with atomic force microscope |
| CN104316399A (en) * | 2014-10-16 | 2015-01-28 | 上海纳米技术及应用国家工程研究中心有限公司 | Lever-type tensile fixture for horizontal type material stretch compression tester for atomic force microscope |
| CN104330301A (en) * | 2014-10-16 | 2015-02-04 | 上海纳米技术及应用国家工程研究中心有限公司 | Screw-driven sample support table of atomic force microscope-horizontal material tensile compression testing machine |
| CN104913866A (en) * | 2015-06-17 | 2015-09-16 | 上海大学 | Method of assisting ray diffraction method to measure residual stress of thin plate, device and applications |
| CN107192608A (en) * | 2017-04-14 | 2017-09-22 | 上海海洋大学 | The horizontal material Compression and Expansion testing machine of AFM is to clip-type compression clamp |
| CN107290207A (en) * | 2017-06-06 | 2017-10-24 | 华南理工大学 | A kind of material testing apparatus based on AFM and electrodynamics stretching-machine |
| CN107764640A (en) * | 2017-09-13 | 2018-03-06 | 上海海洋大学 | The supporting Universal micro mechanics machine of AFM |
| CN109406265A (en) * | 2018-11-23 | 2019-03-01 | 中国汽车技术研究中心有限公司 | A kind of extension test clamping device of brittle materials |
| CN109781516A (en) * | 2018-12-28 | 2019-05-21 | 东北大学 | A kind of material strain original position EBSD observation test fixture and the test method |
| TWI756279B (en) * | 2016-11-04 | 2022-03-01 | 美商梭尼克斯公司 | Adjustable fixture for scanning acoustic microscopy and method for using the fixture |
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| CN203101423U (en) * | 2013-01-31 | 2013-07-31 | 上海纳米技术及应用国家工程研究中心有限公司 | Stretching device matched with atomic force microscopy |
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| FR2248751A5 (en) * | 1973-09-27 | 1975-05-16 | Anvar | Device for deforming electron microscope samples - has strain gauge and oppositely moving supports on motor driven screw |
| CN1740769A (en) * | 2005-09-23 | 2006-03-01 | 东华大学 | Micro-measuring method, apparatus and use on microscope |
| CN201083658Y (en) * | 2007-10-18 | 2008-07-09 | 上海交通大学 | Stretching apparatus for metal deformation in situ dynamic observation |
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Cited By (13)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN103760019B (en) * | 2013-12-31 | 2016-04-27 | 上海纳米技术及应用国家工程研究中心有限公司 | Atomic force microscope is supporting with horizontal material extending compression test |
| CN103760019A (en) * | 2013-12-31 | 2014-04-30 | 上海纳米技术及应用国家工程研究中心有限公司 | Horizontal material stretch compression tester assorted with atomic force microscope |
| CN104316399A (en) * | 2014-10-16 | 2015-01-28 | 上海纳米技术及应用国家工程研究中心有限公司 | Lever-type tensile fixture for horizontal type material stretch compression tester for atomic force microscope |
| CN104330301A (en) * | 2014-10-16 | 2015-02-04 | 上海纳米技术及应用国家工程研究中心有限公司 | Screw-driven sample support table of atomic force microscope-horizontal material tensile compression testing machine |
| CN104316399B (en) * | 2014-10-16 | 2017-01-11 | 上海纳米技术及应用国家工程研究中心有限公司 | Lever-type tensile fixture for horizontal type material stretch compression tester for atomic force microscope |
| CN104913866A (en) * | 2015-06-17 | 2015-09-16 | 上海大学 | Method of assisting ray diffraction method to measure residual stress of thin plate, device and applications |
| TWI756279B (en) * | 2016-11-04 | 2022-03-01 | 美商梭尼克斯公司 | Adjustable fixture for scanning acoustic microscopy and method for using the fixture |
| CN107192608A (en) * | 2017-04-14 | 2017-09-22 | 上海海洋大学 | The horizontal material Compression and Expansion testing machine of AFM is to clip-type compression clamp |
| CN107290207A (en) * | 2017-06-06 | 2017-10-24 | 华南理工大学 | A kind of material testing apparatus based on AFM and electrodynamics stretching-machine |
| CN107764640A (en) * | 2017-09-13 | 2018-03-06 | 上海海洋大学 | The supporting Universal micro mechanics machine of AFM |
| CN109406265A (en) * | 2018-11-23 | 2019-03-01 | 中国汽车技术研究中心有限公司 | A kind of extension test clamping device of brittle materials |
| CN109781516A (en) * | 2018-12-28 | 2019-05-21 | 东北大学 | A kind of material strain original position EBSD observation test fixture and the test method |
| CN109781516B (en) * | 2018-12-28 | 2024-02-02 | 东北大学 | Clamp for material strain in-situ EBSD observation test and test method |
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| Publication number | Publication date |
|---|---|
| CN103105510B (en) | 2015-10-28 |
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Granted publication date: 20151028 Termination date: 20180131 |