CN203101423U - Stretching device matched with atomic force microscopy - Google Patents
Stretching device matched with atomic force microscopy Download PDFInfo
- Publication number
- CN203101423U CN203101423U CN 201320054466 CN201320054466U CN203101423U CN 203101423 U CN203101423 U CN 203101423U CN 201320054466 CN201320054466 CN 201320054466 CN 201320054466 U CN201320054466 U CN 201320054466U CN 203101423 U CN203101423 U CN 203101423U
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- CN
- China
- Prior art keywords
- anchor clamps
- pedestal
- atomic force
- groove
- cover plate
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
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Abstract
The utility model provides a stretching device matched with atomic force microscopy. A base is provided with an inner groove. Two sides of a part of the groove at the front part of the base are provided with guide rails. The back end of the base is provided with a threaded hole, and a pushing screw rod is in threaded connection with the threaded hole. The pushing screw rod passes through a center hole of a right clamp and presses against a left clamp. The right clamp is fixed in the back part of groove of the base. The left clamp is positioned on the guide rails and is slidingly connected with the guide rails. The left clamp is formed by a cover plate and a bottom plate, and the right clamp is formed by a cover plate and a bottom plate. The cover plate and the bottom plate of the left clamp are fixedly connected through screws. The cover plate and the bottom plate of the right clamp are fixedly connected through screws. According to the device, a problem of the strict limitation of the size and structure of a tested sample is solved, the device can be applied to a material with a high strain rate, in addition, the production cost is reduced, and the demands of vast ordinary atomic force microscopy users can be satisfied.
Description
Technical field
The utility model relates to the supporting film sample stretching device of using of atomic force microscope, is specifically related to the improvement to its structure.
Background technology
In order to organically combine to the measurement of nano material and goods mechanical property and the detection of microscopic appearance, atomic force microscope micro-nano optical viewers such as (AFM) will be used with some mechanics test devices, thereby can in depth explore the microscopic damage fracture behaviour and the mechanism of all kinds of nano materials and goods, and and loading, material structure and performance between the correlativity rule.
Existing a kind of yardstick micron-nano scale in-situ stretching mechanical property testing device of striding, there is following limitation in this device: strict to the restriction of tested sample dimensional structure; The maximum strain amount can not satisfy high rate of strain material, because these devices are all comparatively complicated, comprise force transducer, stepper motor or the like, thereby manufacturing cost is higher in addition, can not be satisfied with vast common atomic force microscope user's request.
Summary of the invention
In order to overcome defective of the prior art, the utility model provides a kind of easy atomic force microscope the supporting stretching device of using.
The supporting stretching device of using of a kind of atomic force microscope is characterized in that a pedestal is provided with inner groovy, and pedestal front groove both sides are provided with guide rail; The pedestal rear end is provided with threaded hole, and augering screw is threaded with threaded hole;
Augering screw passes right anchor clamps center pit and withstands on the left anchor clamps; Right anchor clamps are fixed in the rear section groove of pedestal; Left side anchor clamps are positioned on the guide rail, are slidingly connected with guide rail;
Described left anchor clamps are made up of cover plate and base plate; Right anchor clamps are made up of cover plate and base plate; The cover plate and the base plate of described left anchor clamps are bolted to connection; The cover plate and the base plate of described right anchor clamps are bolted to connection.
The utility model has solved the exclusive problem of tested sample dimensional structure, can be applied to high rate of strain material, has reduced manufacturing cost in addition, can be satisfied with vast common atomic force microscope user's request.
Description of drawings
Accompanying drawing 1 is the utility model perspective view.
Accompanying drawing 2 is side views of Fig. 1.
Accompanying drawing 3 is guide rail structure cut-open views.
1 pedestal, 11 long through grooves, 12 long through grooves, 13 threaded holes, 14 scales, 15 grooves,
2 guide rails,
3 left anchor clamps, 31 cover plates; 32 base plates;
4 augering screws,
5 right anchor clamps, 51 cover plates, 52 base plates, 53 center pits,
6 L shaped fastening blocks,
7 specimen platforms, 8 bolts, 9 test vibration isolators.
Embodiment
Preferred embodiment accompanying drawings of the present utility model is as follows:
When the utility model uses, this device can be fixed on the specimen platform 7, the specimen platform can place on the test vibration isolators 9.
The supporting stretching device of using of a kind of atomic force microscope, a pedestal 1 is provided with inner groovy 15, and pedestal front groove both sides are provided with guide rail 2; The pedestal rear end is provided with threaded hole 13, and augering screw 4 is threaded with threaded hole; Augering screw passes right anchor clamps 5 center pits 53 and withstands on the left anchor clamps 3; Right anchor clamps 5 are fixed in the rear section groove of pedestal; Left side anchor clamps are positioned on the guide rail, are slidingly connected with guide rail.The guide rail cross sectional shape can be wide at the top and narrow at the bottom, fixedlys connected with pedestal by bolt 8.Left side anchor clamps are stuck on the guide rail and can break away from, and can guarantee that left anchor clamps level on described guide rail slides.
Described left anchor clamps are made up of cover plate 31 and base plate 32; Right anchor clamps are made up of cover plate 51 and base plate 52.
The cover plate of described left anchor clamps is fixedlyed connected by bolt 8 with base plate; The cover plate of described right anchor clamps is fixedlyed connected by bolt 8 with base plate.
Described pedestal rear portion has long through groove 12 on the two side, and right anchor clamps base plate is fixing by the bolt in the long through groove 8.Described long through groove 12 makes the fixed position of described right anchor clamps have certain degree of freedom, thereby can guarantee that the atomic force microscope test zone is the sample appointed area by regulating right anchor clamps fixed position.
Described pedestal one sidewall is provided with scale 14, can read left and right sides anchor clamps edge numerical value, thereby calculate sample initial length, tensile elongation etc.
Four corners position at described pedestal is provided with long through groove 11; Two L shaped fastening blocks 6 are arranged, be separately positioned on the bottom, two ends of pedestal, the long through groove 11 that bolt 8 passes on the pedestal is fixedlyed connected with L shaped fastening block 6.
Long through groove 11 has level of freedom because of its length can make the fixed position of bolt in long through groove, thereby can connect with the sample stage of the different sizes of different model atomic force microscope.
Principle of work of the present utility model is as follows:
Left anchor clamps cover plate and left anchor clamps base plate are clamped sample one end, tighten left anchor clamps sample fastening bolt, thereby fixed sample one end, right anchor clamps cover plate and right anchor clamps base plate are clamped the sample other end, tighten right anchor clamps sample fastening bolt, thereby the fixed sample other end, regulate the relative position of left and right sides anchor clamps, the center and the atomic force microscope probe of sample are similar on same perpendicular line, thereby under the assurance atomic force microscope probe after the pin surveyed area be the sample central area, the bolt that has in the long through groove 12 on the two side, pedestal rear portion is tightened inwards, thereby fixing right anchor clamps, the rotation augering screw promotes left anchor clamps along guide rail movement, and then the stretching sample.
Claims (5)
1. the supporting stretching device of using of atomic force microscope is characterized in that a pedestal is provided with inner groovy, and pedestal front groove both sides are provided with guide rail; The pedestal rear end is provided with threaded hole, and augering screw is threaded with threaded hole;
Augering screw passes right anchor clamps center pit and withstands on the left anchor clamps; Right anchor clamps are fixed in the rear section groove of pedestal; Left side anchor clamps are positioned on the guide rail, are slidingly connected with guide rail;
Described left anchor clamps are made up of cover plate and base plate; Right anchor clamps are made up of cover plate and base plate; The cover plate and the base plate of described left anchor clamps are bolted to connection; The cover plate and the base plate of described right anchor clamps are bolted to connection.
2. the supporting stretching device of using of atomic force microscope according to claim 1 is characterized in that described pedestal rear portion has long through groove on the two side, and right anchor clamps base plate is by the bolt in the long through groove.
3. the supporting stretching device of using of atomic force microscope according to claim 1 and 2 is characterized in that, described pedestal one sidewall is provided with scale.
4. the supporting stretching device of using of atomic force microscope according to claim 3 is characterized in that, is provided with long through groove at the four corners position of described pedestal; Two L shaped fastening blocks are arranged, be separately positioned on the bottom, two ends of pedestal, the long through groove that bolt passes on the pedestal is fixedlyed connected with L shaped fastening block.
5. the supporting stretching device of using of atomic force microscope according to claim 4 is characterized in that the guide rail cross sectional shape is wide at the top and narrow at the bottom, fixedlys connected with pedestal by bolt, and left anchor clamps are stuck on the guide rail.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN 201320054466 CN203101423U (en) | 2013-01-31 | 2013-01-31 | Stretching device matched with atomic force microscopy |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN 201320054466 CN203101423U (en) | 2013-01-31 | 2013-01-31 | Stretching device matched with atomic force microscopy |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN203101423U true CN203101423U (en) | 2013-07-31 |
Family
ID=48852813
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN 201320054466 Expired - Fee Related CN203101423U (en) | 2013-01-31 | 2013-01-31 | Stretching device matched with atomic force microscopy |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN203101423U (en) |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN103105510A (en) * | 2013-01-31 | 2013-05-15 | 上海纳米技术及应用国家工程研究中心有限公司 | Film sample stretching device used for being matched with atomic force microscope (AFM) |
| CN110567810A (en) * | 2019-10-28 | 2019-12-13 | 山东大庚工程材料科技有限公司 | Tensile detection device of grid is moulded to steel |
-
2013
- 2013-01-31 CN CN 201320054466 patent/CN203101423U/en not_active Expired - Fee Related
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN103105510A (en) * | 2013-01-31 | 2013-05-15 | 上海纳米技术及应用国家工程研究中心有限公司 | Film sample stretching device used for being matched with atomic force microscope (AFM) |
| CN103105510B (en) * | 2013-01-31 | 2015-10-28 | 上海纳米技术及应用国家工程研究中心有限公司 | The supporting film sample stretching device of atomic force microscope |
| CN110567810A (en) * | 2019-10-28 | 2019-12-13 | 山东大庚工程材料科技有限公司 | Tensile detection device of grid is moulded to steel |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| C14 | Grant of patent or utility model | ||
| GR01 | Patent grant | ||
| C17 | Cessation of patent right | ||
| CF01 | Termination of patent right due to non-payment of annual fee |
Granted publication date: 20130731 Termination date: 20140131 |