CN103105510B - The supporting film sample stretching device of atomic force microscope - Google Patents
The supporting film sample stretching device of atomic force microscope Download PDFInfo
- Publication number
- CN103105510B CN103105510B CN201310037964.9A CN201310037964A CN103105510B CN 103105510 B CN103105510 B CN 103105510B CN 201310037964 A CN201310037964 A CN 201310037964A CN 103105510 B CN103105510 B CN 103105510B
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- pedestal
- fixture
- cover plate
- base plate
- groove
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Abstract
The supporting film sample stretching device of a kind of atomic force microscope, a pedestal is provided with inner groovy, and pedestal front groove both sides are provided with guide rail; Pedestal rear end is provided with threaded hole, and augering screw is threaded with threaded hole; Augering screw withstands on left fixture through right clamp central hole; Right fixture is fixed in the rear section groove of pedestal; Left fixture is positioned on guide rail, is connected with slide; Described left fixture is made up of cover plate and base plate; Right fixture is made up of cover plate and base plate; Cover plate and the base plate of described left fixture are bolted to connection; Cover plate and the base plate of described right fixture are bolted to connection.The invention solves the exclusive problem of tested sample dimensional structure, high strain-rate material can be applied to, reduce manufacturing cost in addition, the user's request of vast conventional atomic force microscope can be satisfied with.
Description
Technical field
The present invention relates to the supporting film sample stretching device of atomic force microscope, be specifically related to the improvement to its structure.
Background technology
In order to organically combine to the measurement of nano material and Mechanical Properties of Products and the detection of microscopic appearance, the micro-nano optical viewers such as atomic force microscope (AFM) will with some mechanics test devices with the use of, thus in depth can explore microscopic damage fracture behaviour and the mechanism of all kinds of nano material and goods, and and load effect, correlativity rule between material structure and performance.
Existing one is across scale micronano in-situ drawing mechanics performance testing device, and this device exists following limitation: strict to the restriction of tested sample dimensional structure; Maximum strain amount can not meet high strain-rate material, and in addition because these devices are all comparatively complicated, comprise force snesor, stepper motor etc., thus manufacturing cost is higher, can not be satisfied with the user's request of vast conventional atomic force microscope.
Summary of the invention
In order to overcome defect of the prior art, the invention provides a kind of easy supporting film sample stretching device of atomic force microscope.
The supporting film sample stretching device of a kind of atomic force microscope, it is characterized in that, a pedestal is provided with inner groovy, and pedestal front groove both sides are provided with guide rail; Pedestal rear end is provided with threaded hole, and augering screw is threaded with threaded hole;
Augering screw withstands on left fixture through right clamp central hole; Right fixture is fixed in the rear section groove of pedestal; Left fixture is positioned on guide rail, is connected with slide;
Described left fixture is made up of cover plate and base plate; Right fixture is made up of cover plate and base plate; Cover plate and the base plate of described left fixture are bolted to connection; Cover plate and the base plate of described right fixture are bolted to connection.
The invention solves the exclusive problem of tested sample dimensional structure, high strain-rate material can be applied to, reduce manufacturing cost in addition, the user's request of vast conventional atomic force microscope can be satisfied with.
Accompanying drawing explanation
Accompanying drawing 1 is perspective view of the present invention.
Accompanying drawing 2 is side views of Fig. 1.
Accompanying drawing 3 is track structure cut-open views.
1 pedestal, 11 long through grooves, 12 long through grooves, 13 threaded holes, 14 scales, 15 grooves,
2 guide rails,
3 left fixtures, 31 cover plates; 32 base plates,
4 augering screws,
5 right fixtures, 51 cover plates, 52 base plates, 53 center pits,
6 L shape fastening blocks,
7 test specimens sample platform, 8 bolts, 9 test vibration isolators.
Embodiment
The preferred embodiments of the present invention accompanying drawings is as follows:
When the present invention uses, this device can be fixed in test specimens sample platform 7, test specimens sample platform can be placed on test vibration isolators 9.
The supporting sample extension device of a kind of atomic force microscope, a pedestal 1 is provided with inner groovy 15, and pedestal front groove both sides are provided with guide rail 2; Pedestal rear end is provided with threaded hole 13, and augering screw 4 is threaded with threaded hole; Augering screw withstands on left fixture 3 through right fixture 5 center pit 53; Right fixture 5 is fixed in the rear section groove of pedestal; Left fixture is positioned on guide rail, is connected with slide.Rail section shape can be wide at the top and narrow at the bottom, is fixedly connected with pedestal by bolt 8.Left fixture card can not depart from orbit, can ensure left fixture sliding horizontal on described guide rail.
Described left fixture is made up of cover plate 31 and base plate 32; Right fixture is made up of cover plate 51 and base plate 52.
The cover plate of described left fixture is fixedly connected with by bolt 8 with base plate; The cover plate of described right fixture is fixedly connected with by bolt 8 with base plate.
Two side has long through groove 12 at described pedestal rear portion, and right clamp bottom board is fixed by the bolt 8 in long through groove.Described long through groove 12 makes the fixed position of described right fixture have certain degree of freedom, thus can ensure that atomic force microscope test zone is sample appointed area by regulating right fixture fixed position.
Described pedestal one sidewall is provided with scale 14, clamp edges place, left and right numerical value can be read, thus calculate initial sample length, tensile elongation etc.
The four corners position of described pedestal is provided with long through groove 11; Have two pieces of L shape fastening blocks 6, bottom the two ends being separately positioned on pedestal, bolt 8 is fixedly connected with L shape fastening block 6 through the long through groove 11 on pedestal.
Long through groove 11 can make the fixed position of bolt in long through groove have certain degree of freedom because of its length, thus can connect from the sample stage of the different sizes of different model atomic force microscope.
Principle of work of the present utility model is as follows:
Left fixture cover plate and left clamp bottom board are clamped sample one end, tighten left fixture sample fastening bolt, thus fixed sample one end, right fixture cover plate and right clamp bottom board are clamped the sample other end, tighten right fixture sample fastening bolt, thus the fixed sample other end, regulate the relative position of left and right fixture, the center of sample and atomic force microscope probe is made to be similar on same perpendicular line, thus under guarantee atomic force microscope probe after pin surveyed area be sample central area, the bolt had in long through groove 12 on two side, pedestal rear portion is tightened inwards, thus fixing right fixture, rotate augering screw and promote left fixture along guide rail movement, and then drawn samples.
Claims (1)
1. the supporting film sample stretching device of atomic force microscope, is characterized in that, a pedestal (1) is provided with inner groovy (15), and pedestal front groove both sides are provided with guide rail (2); Pedestal rear end is provided with threaded hole (13), and augering screw (4) is threaded with threaded hole;
Augering screw withstands on left fixture (3) through right fixture (5) center pit (53); Right fixture (5) is fixed in the rear section groove of pedestal; Left fixture is positioned on guide rail, is connected with slide;
Described left fixture is made up of cover plate (31) and base plate (32); Right fixture is made up of cover plate (51) and base plate (52);
The cover plate of described left fixture is fixedly connected with by bolt (8) with base plate; The cover plate of described right fixture is fixedly connected with by bolt (8) with base plate;
Two side has long through groove (12) at described pedestal rear portion, and right clamp bottom board is fixed by the bolt (8) in long through groove;
Described pedestal one sidewall is provided with scale (14);
The four corners position of described pedestal is provided with long through groove (11); Have two pieces of L shape fastening blocks (6), bottom the two ends being separately positioned on pedestal, bolt (8) is fixedly connected with L shape fastening block (6) through the long through groove (11) on pedestal;
Orbit of guide rail cross sectional shape is wide at the top and narrow at the bottom, is fixedly connected with pedestal by bolt (8), and left fixture card in orbit.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
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CN201310037964.9A CN103105510B (en) | 2013-01-31 | 2013-01-31 | The supporting film sample stretching device of atomic force microscope |
Applications Claiming Priority (1)
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CN201310037964.9A CN103105510B (en) | 2013-01-31 | 2013-01-31 | The supporting film sample stretching device of atomic force microscope |
Publications (2)
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CN103105510A CN103105510A (en) | 2013-05-15 |
CN103105510B true CN103105510B (en) | 2015-10-28 |
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CN201310037964.9A Expired - Fee Related CN103105510B (en) | 2013-01-31 | 2013-01-31 | The supporting film sample stretching device of atomic force microscope |
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Families Citing this family (10)
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CN103760019B (en) * | 2013-12-31 | 2016-04-27 | 上海纳米技术及应用国家工程研究中心有限公司 | Atomic force microscope is supporting with horizontal material extending compression test |
CN104330301B (en) * | 2014-10-16 | 2016-12-07 | 上海纳米技术及应用国家工程研究中心有限公司 | Atomic force microscope horizontal material Compression and Expansion testing machine leading screw drives sample holder |
CN104316399B (en) * | 2014-10-16 | 2017-01-11 | 上海纳米技术及应用国家工程研究中心有限公司 | Lever-type tensile fixture for horizontal type material stretch compression tester for atomic force microscope |
CN104913866B (en) * | 2015-06-17 | 2018-03-06 | 上海大学 | The method, apparatus of secondary ray diffraction measurement thin plate residual stress and application |
US10571433B2 (en) * | 2016-11-04 | 2020-02-25 | Sonix, Inc. | Adjustable fixture for scanning acoustic microscopy |
CN107192608A (en) * | 2017-04-14 | 2017-09-22 | 上海海洋大学 | The horizontal material Compression and Expansion testing machine of AFM is to clip-type compression clamp |
CN107290207A (en) * | 2017-06-06 | 2017-10-24 | 华南理工大学 | A kind of material testing apparatus based on AFM and electrodynamics stretching-machine |
CN107764640A (en) * | 2017-09-13 | 2018-03-06 | 上海海洋大学 | The supporting Universal micro mechanics machine of AFM |
CN109406265A (en) * | 2018-11-23 | 2019-03-01 | 中国汽车技术研究中心有限公司 | A kind of extension test clamping device of brittle materials |
CN109781516B (en) * | 2018-12-28 | 2024-02-02 | 东北大学 | Clamp for material strain in-situ EBSD observation test and test method |
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FR2248751A5 (en) * | 1973-09-27 | 1975-05-16 | Anvar | Device for deforming electron microscope samples - has strain gauge and oppositely moving supports on motor driven screw |
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CN201083658Y (en) * | 2007-10-18 | 2008-07-09 | 上海交通大学 | Stretching apparatus for metal deformation in situ dynamic observation |
CN101285747A (en) * | 2008-04-25 | 2008-10-15 | 哈尔滨工业大学 | In situ nanometer stretching experiment measuring detection device |
CN101592573A (en) * | 2009-06-08 | 2009-12-02 | 清华大学 | Tension and compression and tired loading experiment machine based on laser confocal microscope |
CN102331370A (en) * | 2011-10-11 | 2012-01-25 | 吉林大学 | In-situ high-frequency fatigue material mechanical test platform under scanning electron microscope based on stretching/compressing mode |
CN203101423U (en) * | 2013-01-31 | 2013-07-31 | 上海纳米技术及应用国家工程研究中心有限公司 | Stretching device matched with atomic force microscopy |
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2013
- 2013-01-31 CN CN201310037964.9A patent/CN103105510B/en not_active Expired - Fee Related
Patent Citations (8)
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FR2248751A5 (en) * | 1973-09-27 | 1975-05-16 | Anvar | Device for deforming electron microscope samples - has strain gauge and oppositely moving supports on motor driven screw |
CN1740769A (en) * | 2005-09-23 | 2006-03-01 | 东华大学 | Micro-measuring method, apparatus and use on microscope |
CN201083658Y (en) * | 2007-10-18 | 2008-07-09 | 上海交通大学 | Stretching apparatus for metal deformation in situ dynamic observation |
CN101158629A (en) * | 2007-10-26 | 2008-04-09 | 北京工业大学 | Scanning electron microscope electron back scattering diffraction in-situ stretching device and measuring method |
CN101285747A (en) * | 2008-04-25 | 2008-10-15 | 哈尔滨工业大学 | In situ nanometer stretching experiment measuring detection device |
CN101592573A (en) * | 2009-06-08 | 2009-12-02 | 清华大学 | Tension and compression and tired loading experiment machine based on laser confocal microscope |
CN102331370A (en) * | 2011-10-11 | 2012-01-25 | 吉林大学 | In-situ high-frequency fatigue material mechanical test platform under scanning electron microscope based on stretching/compressing mode |
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