FR2248751A5 - Device for deforming electron microscope samples - has strain gauge and oppositely moving supports on motor driven screw - Google Patents

Device for deforming electron microscope samples - has strain gauge and oppositely moving supports on motor driven screw

Info

Publication number
FR2248751A5
FR2248751A5 FR7334618A FR7334618A FR2248751A5 FR 2248751 A5 FR2248751 A5 FR 2248751A5 FR 7334618 A FR7334618 A FR 7334618A FR 7334618 A FR7334618 A FR 7334618A FR 2248751 A5 FR2248751 A5 FR 2248751A5
Authority
FR
France
Prior art keywords
electron microscope
strain gauge
deforming
motor driven
driven screw
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
FR7334618A
Other languages
French (fr)
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Bpifrance Financement SA
Original Assignee
Agence National de Valorisation de la Recherche ANVAR
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Agence National de Valorisation de la Recherche ANVAR filed Critical Agence National de Valorisation de la Recherche ANVAR
Priority to FR7334618A priority Critical patent/FR2248751A5/en
Application granted granted Critical
Publication of FR2248751A5 publication Critical patent/FR2248751A5/en
Expired legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/02—Details
    • H01J37/20—Means for supporting or positioning the objects or the material; Means for adjusting diaphragms or lenses associated with the support
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N3/00—Investigating strength properties of solid materials by application of mechanical stress
    • G01N3/02—Details
    • G01N3/06—Special adaptations of indicating or recording means
    • G01N3/068—Special adaptations of indicating or recording means with optical indicating or recording means
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N3/00—Investigating strength properties of solid materials by application of mechanical stress
    • G01N3/08—Investigating strength properties of solid materials by application of mechanical stress by applying steady tensile or compressive forces
    • G01N3/16—Investigating strength properties of solid materials by application of mechanical stress by applying steady tensile or compressive forces applied through gearing
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2203/00—Investigating strength properties of solid materials by application of mechanical stress
    • G01N2203/0014—Type of force applied
    • G01N2203/0016—Tensile or compressive
    • G01N2203/0017—Tensile
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2203/00—Investigating strength properties of solid materials by application of mechanical stress
    • G01N2203/02—Details not specific for a particular testing method
    • G01N2203/026—Specifications of the specimen
    • G01N2203/0286—Miniature specimen; Testing on microregions of a specimen
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2203/00—Investigating strength properties of solid materials by application of mechanical stress
    • G01N2203/02—Details not specific for a particular testing method
    • G01N2203/04—Chucks, fixtures, jaws, holders or anvils
    • G01N2203/0429—Chucks, fixtures, jaws, holders or anvils using adhesive bond; Gluing
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2203/00—Investigating strength properties of solid materials by application of mechanical stress
    • G01N2203/02—Details not specific for a particular testing method
    • G01N2203/06—Indicating or recording means; Sensing means
    • G01N2203/0641—Indicating or recording means; Sensing means using optical, X-ray, ultraviolet, infrared or similar detectors
    • G01N2203/0647—Image analysis

Abstract

The device is for deforming samples of materials while they are being observed by a scanning electron microscope and comprises a base plate (1) supporting on one side a damper (5) on which is mounted an interchangeable reduction gear and electric motor unit (7) via a coupling (8) and extended on the other side by a plate (11) on which two cross-pieces (13, 15) run in opposite directions guided by two axles (17, 19) and a double threaded master screw (21). The cross-pieces hold the sample, one (13) directly and the other (15) through the intermediary of a strain gauge (25). The device is for studies of fracture propagation, development of slip lines in grain structures, etc.
FR7334618A 1973-09-27 1973-09-27 Device for deforming electron microscope samples - has strain gauge and oppositely moving supports on motor driven screw Expired FR2248751A5 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
FR7334618A FR2248751A5 (en) 1973-09-27 1973-09-27 Device for deforming electron microscope samples - has strain gauge and oppositely moving supports on motor driven screw

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
FR7334618A FR2248751A5 (en) 1973-09-27 1973-09-27 Device for deforming electron microscope samples - has strain gauge and oppositely moving supports on motor driven screw

Publications (1)

Publication Number Publication Date
FR2248751A5 true FR2248751A5 (en) 1975-05-16

Family

ID=9125624

Family Applications (1)

Application Number Title Priority Date Filing Date
FR7334618A Expired FR2248751A5 (en) 1973-09-27 1973-09-27 Device for deforming electron microscope samples - has strain gauge and oppositely moving supports on motor driven screw

Country Status (1)

Country Link
FR (1) FR2248751A5 (en)

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR2704649A1 (en) * 1993-04-30 1994-11-04 Centre Nat Rech Scient In situ traction machine and specimen for scanning electron microscope.
FR2890746A1 (en) * 2005-09-15 2007-03-16 Univ Lille Sciences Tech IN SITU TRACTION DEVICE FOR APPARATUSING AN ANALYTICAL MICROSCOPY DEVICE.
CN103105510A (en) * 2013-01-31 2013-05-15 上海纳米技术及应用国家工程研究中心有限公司 Film sample stretching device used for being matched with atomic force microscope (AFM)
CN103116039A (en) * 2013-01-31 2013-05-22 上海纳米技术及应用国家工程研究中心有限公司 Film sampling compressing device used with atomic force microscopes
FR3058220A1 (en) * 2016-10-27 2018-05-04 Safran Helicopter Engines METHOD FOR DETERMINING THE MECHANICAL BEHAVIOR OF A METALLIC MATERIAL

Cited By (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR2704649A1 (en) * 1993-04-30 1994-11-04 Centre Nat Rech Scient In situ traction machine and specimen for scanning electron microscope.
WO1994025846A2 (en) * 1993-04-30 1994-11-10 Centre National De La Recherche Scientifique In situ tensile testing machine and specimen for a scanning electron microscope
WO1994025846A3 (en) * 1993-04-30 1995-01-12 Centre Nat Rech Scient In situ tensile testing machine and specimen for a scanning electron microscope
US5606168A (en) * 1993-04-30 1997-02-25 Centre National De La Recherche Scientifique In situ tensile testing machine and sample for a scanning electron microscope
FR2890746A1 (en) * 2005-09-15 2007-03-16 Univ Lille Sciences Tech IN SITU TRACTION DEVICE FOR APPARATUSING AN ANALYTICAL MICROSCOPY DEVICE.
WO2007031653A1 (en) * 2005-09-15 2007-03-22 Universite Des Sciences Et Technologies De Lille On-site traction device for equipping an analytical microscopy apparatus
CN103105510A (en) * 2013-01-31 2013-05-15 上海纳米技术及应用国家工程研究中心有限公司 Film sample stretching device used for being matched with atomic force microscope (AFM)
CN103116039A (en) * 2013-01-31 2013-05-22 上海纳米技术及应用国家工程研究中心有限公司 Film sampling compressing device used with atomic force microscopes
CN103116039B (en) * 2013-01-31 2015-09-09 上海纳米技术及应用国家工程研究中心有限公司 The supporting film sample compression set of atomic force microscope
CN103105510B (en) * 2013-01-31 2015-10-28 上海纳米技术及应用国家工程研究中心有限公司 The supporting film sample stretching device of atomic force microscope
FR3058220A1 (en) * 2016-10-27 2018-05-04 Safran Helicopter Engines METHOD FOR DETERMINING THE MECHANICAL BEHAVIOR OF A METALLIC MATERIAL

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Legal Events

Date Code Title Description
ST Notification of lapse