CN103116039A - Film sampling compressing device used with atomic force microscopes - Google Patents
Film sampling compressing device used with atomic force microscopes Download PDFInfo
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- CN103116039A CN103116039A CN2013100379460A CN201310037946A CN103116039A CN 103116039 A CN103116039 A CN 103116039A CN 2013100379460 A CN2013100379460 A CN 2013100379460A CN 201310037946 A CN201310037946 A CN 201310037946A CN 103116039 A CN103116039 A CN 103116039A
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- pedestal
- atomic force
- groove
- force microscope
- cover plate
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Abstract
A film sampling compressing device used with atomic force microscopes is characterized in that a base is provided with a recess, guide rails are arranged on two sides of a recess on the rear portion of the base, the rear end of the base is provided with a threaded hole, and a pushing screw is connected with the threaded hole in a threaded manner and penetrates through a right clamp. The right clamp is arranged on the guide rails and slidably connected with the same. A left clamp is fixed in the recess of the rear portion of the base and comprises a cover plate and a bottom plate as well as the right clamp. The cover plate and the bottom plate of the left clamp as well as the cover plate and the bottom of the right clamp are fixedly connected through bolts. The film sampling compression device assorted with the atomic force microscopes is simple in structure, easy to operate and convenient to use, and solves the problem that size structures of tested samples are strictly limited. In addition, manufacture cost is reduced and the requirements of vast users of the atomic force microscopes can be met.
Description
Technical field
The present invention relates to the supporting film sample compression set of using of atomic force microscope, be specifically related to the improvement to its structure.
Background technology
In order to organically combine the measurement of nano material and Mechanical Properties of Products and the detection of microscopic appearance, the micro-nano optical viewers such as atomic force microscope (AFM) will be used in conjunction with some mechanics test devices, thereby can in depth explore microscopic damage fracture behaviour and the mechanism of all kinds of nano materials and goods, and and load, material structure and performance between the correlativity rule.
Existing a kind of across yardstick micron-nano scale in-situ compression Compressive Mechanical Properties proving installation, this invention has effectively promoted the development of in-situ nano compression verification device.But remain in following limitation: this kind equipment is strict to the restriction of tested sample dimensional structure; Make comparatively complexity, comprise power sensor, stepper motor etc., thereby manufacturing cost is higher, may not satisfy vast common atomic force microscope user's request.
Summary of the invention
For defective of the prior art, the object of the invention is to provide a kind of easy atomic force microscope the supporting film sample compression set of using.
The supporting film sample compression set of using of a kind of atomic force microscope is characterized in that a pedestal is provided with inner groovy, and pedestal rear groove both sides are provided with guide rail; The pedestal rear end is provided with threaded hole, and augering screw is threaded with threaded hole;
Augering screw withstands on right fixture; Right fixture is positioned on guide rail, is slidably connected with guide rail; Left fixture is fixed in the rear section groove of pedestal;
Described left fixture is comprised of cover plate and base plate; Right fixture is comprised of cover plate and base plate; Cover plate and the base plate of described left fixture are bolted to connection; Cover plate and the base plate of described right fixture are bolted to connection.
The present invention is simple in structure, and processing ease has solved the exclusive problem of tested sample dimensional structure, and is easy to use; Reduce in addition manufacturing cost, can be satisfied with vast common atomic force microscope user's request.
Description of drawings
Accompanying drawing 1 is perspective view of the present invention.
Accompanying drawing 2 is side views of Fig. 1.
Accompanying drawing 3 is track structure cut-open views.
1 pedestal, 11 rectangle grooves, 12 rectangle grooves, 13 screws, 14 scales, 15 grooves,
2 left fixtures, 21 left fixture cover plates, 22 left clamp bottom boards,
3 guide rails,
4 right fixtures, 41 right fixture cover plates, 42 right clamp bottom boards,
5 augering screws,
6 L shaped fastening blocks, 7 specimen platforms, 8 bolts, 9 test vibration isolators.
Embodiment
The preferred embodiments of the present invention accompanying drawings is as follows:
The supporting film sample compression set of using of a kind of atomic force microscope, a pedestal 1 is provided with inner groovy 15, and pedestal rear groove both sides are provided with guide rail 3; The pedestal rear end is provided with threaded hole 13, and augering screw 5 is threaded with threaded hole;
Augering screw withstands on right fixture 4; Right fixture is positioned on guide rail, is slidably connected with guide rail; Left fixture 2 is fixed in the rear section groove of pedestal.Rail section is shaped as wide at the top and narrow at the bottom, is fixedly connected with pedestal by bolt 8, and right fixture card can break away from orbit, can guarantee that left fixture level on described guide rail slides.
Described left fixture is comprised of cover plate 21 and base plate 22; Right fixture is comprised of cover plate 41 and base plate 42; The upper plane one side indent of described left clamp bottom board 22 forms a plane, for placing specimen one end; The upper plane one side indent of corresponding described right clamp bottom board 42 forms a plane, for placing the specimen other end.
The cover plate of described left fixture is fixedly connected with by bolt 8 with base plate; The cover plate of described right fixture is fixedly connected with by bolt 8 with base plate.
Have long through groove 12 on described pedestal front part sides wall, left clamp bottom board is fixing by the bolt 8 in long through groove, and the bolt that is about in long through groove 12 is tightened inwards, thus fixing left fixture.Described long through groove 12 makes the fixed position of described left fixture have certain degree of freedom, thereby can guarantee that the atomic force microscope test zone is the sample appointed area by regulating left fixture fixed position.
Be provided with scale 14 on described pedestal one sidewall, can read left and right fixture edge numerical value, thereby calculate sample initial length, reduction length etc.
Four corners position at described pedestal is provided with long through groove 11; Two L shaped fastening blocks 6 are arranged, be separately positioned on the bottom, two ends of pedestal, the long through groove 11 that bolt 8 passes on pedestal is fixedly connected with L shaped fastening block 6.
Long through groove 11 has certain degree of freedom because its length can make the fixed position of bolt in long through groove, thereby can connect from the sample stage of the different sizes of different model atomic force microscope.
When the present invention uses, be fixed on specimen platform 7, the specimen platform is placed on test vibration isolators 9.
The objective of the invention is to realize in the following manner, left fixture cover plate and left clamp bottom board are clamped sample one end, tighten left fixture fastening bolt, thereby fixed sample one end, right fixture cover plate and right clamp bottom board are clamped the sample other end, tighten right fixture fastening bolt, thus the fixed sample other end; Regulate the relative position of left and right fixture, the center of sample and atomic force microscope probe be similar on same perpendicular line, thus guarantee under atomic force microscope probe pin afterwards surveyed area be the sample central area.Left fixture fastening bolt is tightened inwards by the rectangle groove on pedestal, thus fixing left fixture, and the rotation augering screw promotes right fixture along guide rail movement, and then compression sample.
Claims (6)
1. the supporting film sample compression set of using of atomic force microscope, is characterized in that, a pedestal is provided with inner groovy, and pedestal rear groove both sides are provided with guide rail; The pedestal rear end is provided with threaded hole, and augering screw is threaded with threaded hole;
Augering screw withstands on right fixture; Right fixture is positioned on guide rail, is slidably connected with guide rail; Left fixture is fixed in the rear section groove of pedestal;
Described left fixture is comprised of cover plate and base plate; Right fixture is comprised of cover plate and base plate; Cover plate and the base plate of described left fixture are bolted to connection; Cover plate and the base plate of described right fixture are bolted to connection.
2. the supporting film sample compression set of using of atomic force microscope according to claim 1, is characterized in that, the upper plane one side indent of described left clamp bottom board forms a plane, and the upper plane one side indent of corresponding described right clamp bottom board forms a plane.
3. the supporting film sample compression set of using of atomic force microscope according to claim 1 and 2, is characterized in that, has long through groove on described pedestal front part sides wall, and left clamp bottom board is fixed by the bolt in long through groove.
4. the supporting film sample compression set of using of atomic force microscope according to claim 3, is characterized in that, is provided with scale on described pedestal one sidewall.
5. the supporting film sample compression set of using of atomic force microscope according to claim 4, is characterized in that, is provided with long through groove at the four corners position of described pedestal; Two L shaped fastening blocks are arranged, be separately positioned on the bottom, two ends of pedestal, the long through groove that bolt passes on pedestal is fixedly connected with L shaped fastening block.
6. the supporting film sample compression set of using of atomic force microscope according to claim 5, is characterized in that, rail section is shaped as wide at the top and narrow at the bottom, is fixedly connected with pedestal by bolt, and right fixture card in orbit.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201310037946.0A CN103116039B (en) | 2013-01-31 | 2013-01-31 | The supporting film sample compression set of atomic force microscope |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201310037946.0A CN103116039B (en) | 2013-01-31 | 2013-01-31 | The supporting film sample compression set of atomic force microscope |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN103116039A true CN103116039A (en) | 2013-05-22 |
| CN103116039B CN103116039B (en) | 2015-09-09 |
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Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
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| CN201310037946.0A Expired - Fee Related CN103116039B (en) | 2013-01-31 | 2013-01-31 | The supporting film sample compression set of atomic force microscope |
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Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN107192608A (en) * | 2017-04-14 | 2017-09-22 | 上海海洋大学 | The horizontal material Compression and Expansion testing machine of AFM is to clip-type compression clamp |
| CN109143565A (en) * | 2018-10-31 | 2019-01-04 | 南京拓创精密金属材料有限公司 | A kind of novel projector and microscope slide rail section |
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| FR2248751A5 (en) * | 1973-09-27 | 1975-05-16 | Anvar | Device for deforming electron microscope samples - has strain gauge and oppositely moving supports on motor driven screw |
| CN1740769A (en) * | 2005-09-23 | 2006-03-01 | 东华大学 | Micro-measuring method, apparatus and use on microscope |
| CN101158629A (en) * | 2007-10-26 | 2008-04-09 | 北京工业大学 | Scanning electron microscope electron back scattering diffraction in-situ stretching device and measuring method |
| CN201083658Y (en) * | 2007-10-18 | 2008-07-09 | 上海交通大学 | Stretching apparatus for metal deformation in situ dynamic observation |
| CN101285747A (en) * | 2008-04-25 | 2008-10-15 | 哈尔滨工业大学 | In situ nanometer stretching experiment measuring detection device |
| CN101592573A (en) * | 2009-06-08 | 2009-12-02 | 清华大学 | Tension and compression and tired loading experiment machine based on laser confocal microscope |
| CN102331370A (en) * | 2011-10-11 | 2012-01-25 | 吉林大学 | In-situ high-frequency fatigue material mechanical test platform under scanning electron microscope based on stretching/compressing mode |
| CN203101424U (en) * | 2013-01-31 | 2013-07-31 | 上海纳米技术及应用国家工程研究中心有限公司 | Compressing device matched with atomic force microscopy |
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2013
- 2013-01-31 CN CN201310037946.0A patent/CN103116039B/en not_active Expired - Fee Related
Patent Citations (8)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| FR2248751A5 (en) * | 1973-09-27 | 1975-05-16 | Anvar | Device for deforming electron microscope samples - has strain gauge and oppositely moving supports on motor driven screw |
| CN1740769A (en) * | 2005-09-23 | 2006-03-01 | 东华大学 | Micro-measuring method, apparatus and use on microscope |
| CN201083658Y (en) * | 2007-10-18 | 2008-07-09 | 上海交通大学 | Stretching apparatus for metal deformation in situ dynamic observation |
| CN101158629A (en) * | 2007-10-26 | 2008-04-09 | 北京工业大学 | Scanning electron microscope electron back scattering diffraction in-situ stretching device and measuring method |
| CN101285747A (en) * | 2008-04-25 | 2008-10-15 | 哈尔滨工业大学 | In situ nanometer stretching experiment measuring detection device |
| CN101592573A (en) * | 2009-06-08 | 2009-12-02 | 清华大学 | Tension and compression and tired loading experiment machine based on laser confocal microscope |
| CN102331370A (en) * | 2011-10-11 | 2012-01-25 | 吉林大学 | In-situ high-frequency fatigue material mechanical test platform under scanning electron microscope based on stretching/compressing mode |
| CN203101424U (en) * | 2013-01-31 | 2013-07-31 | 上海纳米技术及应用国家工程研究中心有限公司 | Compressing device matched with atomic force microscopy |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN107192608A (en) * | 2017-04-14 | 2017-09-22 | 上海海洋大学 | The horizontal material Compression and Expansion testing machine of AFM is to clip-type compression clamp |
| CN109143565A (en) * | 2018-10-31 | 2019-01-04 | 南京拓创精密金属材料有限公司 | A kind of novel projector and microscope slide rail section |
Also Published As
| Publication number | Publication date |
|---|---|
| CN103116039B (en) | 2015-09-09 |
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