CN103069280B - 电探头和相关方法 - Google Patents

电探头和相关方法 Download PDF

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Publication number
CN103069280B
CN103069280B CN201180039906.9A CN201180039906A CN103069280B CN 103069280 B CN103069280 B CN 103069280B CN 201180039906 A CN201180039906 A CN 201180039906A CN 103069280 B CN103069280 B CN 103069280B
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CN
China
Prior art keywords
pin
engagement member
pipe
elongated member
moveable engagement
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Active
Application number
CN201180039906.9A
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English (en)
Chinese (zh)
Other versions
CN103069280A (zh
Inventor
E·K·霍夫曼
T·A·米勒
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Boeing Co
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Boeing Co
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
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Publication date
Application filed by Boeing Co filed Critical Boeing Co
Publication of CN103069280A publication Critical patent/CN103069280A/zh
Application granted granted Critical
Publication of CN103069280B publication Critical patent/CN103069280B/zh
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Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/06788—Hand-held or hand-manipulated probes, e.g. for oscilloscopes or for portable test instruments

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Measuring Leads Or Probes (AREA)
CN201180039906.9A 2010-08-19 2011-07-20 电探头和相关方法 Active CN103069280B (zh)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US12/859,713 US8310223B2 (en) 2010-08-19 2010-08-19 Electrical probe and associated method
US12/859,713 2010-08-19
PCT/US2011/044717 WO2012024050A1 (en) 2010-08-19 2011-07-20 Electrical probe and associated method

Publications (2)

Publication Number Publication Date
CN103069280A CN103069280A (zh) 2013-04-24
CN103069280B true CN103069280B (zh) 2015-06-24

Family

ID=44513147

Family Applications (1)

Application Number Title Priority Date Filing Date
CN201180039906.9A Active CN103069280B (zh) 2010-08-19 2011-07-20 电探头和相关方法

Country Status (6)

Country Link
US (1) US8310223B2 (enExample)
EP (1) EP2606366B1 (enExample)
JP (1) JP5840689B2 (enExample)
CN (1) CN103069280B (enExample)
AU (1) AU2011292366B2 (enExample)
WO (1) WO2012024050A1 (enExample)

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US9748680B1 (en) * 2016-06-28 2017-08-29 Intel Corporation Multiple contact pogo pin
US10230459B2 (en) 2017-02-14 2019-03-12 The Boeing Company System and method for optical time-domain reflectometry and design data wire testing
JP7692685B2 (ja) * 2020-10-13 2025-06-16 日置電機株式会社 センサ

Citations (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US2529270A (en) * 1949-02-26 1950-11-07 Webster Robert Self-piercing and self-holding test prod
US4414506A (en) * 1980-12-30 1983-11-08 Kelley Jack M Electrical circuit test probe
US4716365A (en) * 1985-10-11 1987-12-29 Lisle Corporation Circuit tester
US5416405A (en) * 1993-08-02 1995-05-16 Dill; David M. Test probe with improved capture assembly and threaded needle point probe adjustment
US5457392A (en) * 1990-12-20 1995-10-10 Filipescu; Radu Testing clip and circuit board contacting method
CN2240150Y (zh) * 1994-12-06 1996-11-13 孙万发 一种测电笔探头
CN2610339Y (zh) * 2003-04-17 2004-04-07 金建叨 试电笔

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6110213Y2 (enExample) * 1979-12-03 1986-04-02
JPH04177172A (ja) * 1990-11-09 1992-06-24 Hokkaido Electric Power Co Inc:The 電気信号検出装置
JP3190708B2 (ja) * 1991-09-09 2001-07-23 北海道電力株式会社 電気信号検出装置
JPH08129039A (ja) * 1994-11-01 1996-05-21 Furukawa Electric Co Ltd:The 電気導体導電針装置
JP4912068B2 (ja) * 2006-08-01 2012-04-04 中国電力株式会社 電圧測定装置
US7355377B1 (en) * 2006-10-17 2008-04-08 Bill Gallentine Telescoping electrical tester

Patent Citations (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US2529270A (en) * 1949-02-26 1950-11-07 Webster Robert Self-piercing and self-holding test prod
US4414506A (en) * 1980-12-30 1983-11-08 Kelley Jack M Electrical circuit test probe
US4716365A (en) * 1985-10-11 1987-12-29 Lisle Corporation Circuit tester
US5457392A (en) * 1990-12-20 1995-10-10 Filipescu; Radu Testing clip and circuit board contacting method
US5416405A (en) * 1993-08-02 1995-05-16 Dill; David M. Test probe with improved capture assembly and threaded needle point probe adjustment
CN2240150Y (zh) * 1994-12-06 1996-11-13 孙万发 一种测电笔探头
CN2610339Y (zh) * 2003-04-17 2004-04-07 金建叨 试电笔

Also Published As

Publication number Publication date
EP2606366B1 (en) 2014-09-03
AU2011292366B2 (en) 2015-10-29
WO2012024050A1 (en) 2012-02-23
EP2606366A1 (en) 2013-06-26
JP2013536435A (ja) 2013-09-19
JP5840689B2 (ja) 2016-01-06
AU2011292366A1 (en) 2012-12-13
CN103069280A (zh) 2013-04-24
US8310223B2 (en) 2012-11-13
US20120043985A1 (en) 2012-02-23

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