AU2011292366B2 - Electrical probe and associated method - Google Patents

Electrical probe and associated method Download PDF

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Publication number
AU2011292366B2
AU2011292366B2 AU2011292366A AU2011292366A AU2011292366B2 AU 2011292366 B2 AU2011292366 B2 AU 2011292366B2 AU 2011292366 A AU2011292366 A AU 2011292366A AU 2011292366 A AU2011292366 A AU 2011292366A AU 2011292366 B2 AU2011292366 B2 AU 2011292366B2
Authority
AU
Australia
Prior art keywords
elongate member
tube
needles
engagement member
electrical probe
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Active
Application number
AU2011292366A
Other languages
English (en)
Other versions
AU2011292366A1 (en
Inventor
Edward K. Hoffman
Thomas A. Miller
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Boeing Co
Original Assignee
Boeing Co
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Boeing Co filed Critical Boeing Co
Publication of AU2011292366A1 publication Critical patent/AU2011292366A1/en
Application granted granted Critical
Publication of AU2011292366B2 publication Critical patent/AU2011292366B2/en
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/06788—Hand-held or hand-manipulated probes, e.g. for oscilloscopes or for portable test instruments

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Measuring Leads Or Probes (AREA)
AU2011292366A 2010-08-19 2011-07-20 Electrical probe and associated method Active AU2011292366B2 (en)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US12/859,713 US8310223B2 (en) 2010-08-19 2010-08-19 Electrical probe and associated method
US12/859,713 2010-08-19
PCT/US2011/044717 WO2012024050A1 (en) 2010-08-19 2011-07-20 Electrical probe and associated method

Publications (2)

Publication Number Publication Date
AU2011292366A1 AU2011292366A1 (en) 2012-12-13
AU2011292366B2 true AU2011292366B2 (en) 2015-10-29

Family

ID=44513147

Family Applications (1)

Application Number Title Priority Date Filing Date
AU2011292366A Active AU2011292366B2 (en) 2010-08-19 2011-07-20 Electrical probe and associated method

Country Status (6)

Country Link
US (1) US8310223B2 (enExample)
EP (1) EP2606366B1 (enExample)
JP (1) JP5840689B2 (enExample)
CN (1) CN103069280B (enExample)
AU (1) AU2011292366B2 (enExample)
WO (1) WO2012024050A1 (enExample)

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US9748680B1 (en) * 2016-06-28 2017-08-29 Intel Corporation Multiple contact pogo pin
US10230459B2 (en) 2017-02-14 2019-03-12 The Boeing Company System and method for optical time-domain reflectometry and design data wire testing
JP7692685B2 (ja) * 2020-10-13 2025-06-16 日置電機株式会社 センサ

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7355377B1 (en) * 2006-10-17 2008-04-08 Bill Gallentine Telescoping electrical tester

Family Cites Families (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US2529270A (en) 1949-02-26 1950-11-07 Webster Robert Self-piercing and self-holding test prod
JPS6110213Y2 (enExample) * 1979-12-03 1986-04-02
US4414506A (en) * 1980-12-30 1983-11-08 Kelley Jack M Electrical circuit test probe
US4716365A (en) 1985-10-11 1987-12-29 Lisle Corporation Circuit tester
JPH04177172A (ja) * 1990-11-09 1992-06-24 Hokkaido Electric Power Co Inc:The 電気信号検出装置
WO1992011539A1 (en) * 1990-12-20 1992-07-09 Radu Filipescu Testing clip and circuit board contacting method
JP3190708B2 (ja) * 1991-09-09 2001-07-23 北海道電力株式会社 電気信号検出装置
US5416405A (en) * 1993-08-02 1995-05-16 Dill; David M. Test probe with improved capture assembly and threaded needle point probe adjustment
JPH08129039A (ja) * 1994-11-01 1996-05-21 Furukawa Electric Co Ltd:The 電気導体導電針装置
CN2240150Y (zh) * 1994-12-06 1996-11-13 孙万发 一种测电笔探头
CN2610339Y (zh) * 2003-04-17 2004-04-07 金建叨 试电笔
JP4912068B2 (ja) * 2006-08-01 2012-04-04 中国電力株式会社 電圧測定装置

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7355377B1 (en) * 2006-10-17 2008-04-08 Bill Gallentine Telescoping electrical tester

Also Published As

Publication number Publication date
EP2606366B1 (en) 2014-09-03
CN103069280B (zh) 2015-06-24
WO2012024050A1 (en) 2012-02-23
EP2606366A1 (en) 2013-06-26
JP2013536435A (ja) 2013-09-19
JP5840689B2 (ja) 2016-01-06
AU2011292366A1 (en) 2012-12-13
CN103069280A (zh) 2013-04-24
US8310223B2 (en) 2012-11-13
US20120043985A1 (en) 2012-02-23

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FGA Letters patent sealed or granted (standard patent)