CN102907180B - 使用脉冲传热流体流动的等离子体处理设备中的温度控制 - Google Patents
使用脉冲传热流体流动的等离子体处理设备中的温度控制 Download PDFInfo
- Publication number
- CN102907180B CN102907180B CN201180019903.9A CN201180019903A CN102907180B CN 102907180 B CN102907180 B CN 102907180B CN 201180019903 A CN201180019903 A CN 201180019903A CN 102907180 B CN102907180 B CN 102907180B
- Authority
- CN
- China
- Prior art keywords
- transfer fluid
- heat
- valve
- temperature
- chuck
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Active
Links
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/02—Details
- H01J37/20—Means for supporting or positioning the object or the material; Means for adjusting diaphragms or lenses associated with the support
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/32—Gas-filled discharge tubes
- H01J37/32431—Constructional details of the reactor
- H01J37/32715—Workpiece holder
- H01J37/32724—Temperature
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/32—Gas-filled discharge tubes
- H01J37/32431—Constructional details of the reactor
- H01J37/32798—Further details of plasma apparatus not provided for in groups H01J37/3244 - H01J37/32788; special provisions for cleaning or maintenance of the apparatus
- H01J37/32908—Utilities
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/32—Gas-filled discharge tubes
- H01J37/32917—Plasma diagnostics
- H01J37/32926—Software, data control or modelling
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/32—Gas-filled discharge tubes
- H01J37/32917—Plasma diagnostics
- H01J37/32935—Monitoring and controlling tubes by information coming from the object and/or discharge
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J2237/00—Discharge tubes exposing object to beam, e.g. for analysis treatment, etching, imaging
- H01J2237/20—Positioning, supporting, modifying or maintaining the physical state of objects being observed or treated
- H01J2237/2001—Maintaining constant desired temperature
Landscapes
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- Plasma & Fusion (AREA)
- Drying Of Semiconductors (AREA)
- Container, Conveyance, Adherence, Positioning, Of Wafer (AREA)
- Spectroscopy & Molecular Physics (AREA)
- General Physics & Mathematics (AREA)
- Automation & Control Theory (AREA)
- Plasma Technology (AREA)
Applications Claiming Priority (7)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US35277910P | 2010-06-08 | 2010-06-08 | |
| US61/352,779 | 2010-06-08 | ||
| US36223210P | 2010-07-07 | 2010-07-07 | |
| US61/362,232 | 2010-07-07 | ||
| US13/111,334 US8916793B2 (en) | 2010-06-08 | 2011-05-19 | Temperature control in plasma processing apparatus using pulsed heat transfer fluid flow |
| US13/111,334 | 2011-05-19 | ||
| PCT/US2011/039182 WO2011156239A2 (en) | 2010-06-08 | 2011-06-03 | Temperature control in plasma processing apparatus using pulsed heat transfer fluid flow |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN102907180A CN102907180A (zh) | 2013-01-30 |
| CN102907180B true CN102907180B (zh) | 2015-09-16 |
Family
ID=45098592
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201180019903.9A Active CN102907180B (zh) | 2010-06-08 | 2011-06-03 | 使用脉冲传热流体流动的等离子体处理设备中的温度控制 |
Country Status (6)
| Country | Link |
|---|---|
| US (2) | US8916793B2 (enExample) |
| JP (1) | JP6077995B2 (enExample) |
| KR (1) | KR101801070B1 (enExample) |
| CN (1) | CN102907180B (enExample) |
| TW (1) | TWI445459B (enExample) |
| WO (1) | WO2011156239A2 (enExample) |
Families Citing this family (28)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US8916793B2 (en) | 2010-06-08 | 2014-12-23 | Applied Materials, Inc. | Temperature control in plasma processing apparatus using pulsed heat transfer fluid flow |
| US9338871B2 (en) * | 2010-01-29 | 2016-05-10 | Applied Materials, Inc. | Feedforward temperature control for plasma processing apparatus |
| US8880227B2 (en) | 2010-05-27 | 2014-11-04 | Applied Materials, Inc. | Component temperature control by coolant flow control and heater duty cycle control |
| US8580693B2 (en) * | 2010-08-27 | 2013-11-12 | Applied Materials, Inc. | Temperature enhanced electrostatic chucking in plasma processing apparatus |
| US10274270B2 (en) | 2011-10-27 | 2019-04-30 | Applied Materials, Inc. | Dual zone common catch heat exchanger/chiller |
| JP5973731B2 (ja) | 2012-01-13 | 2016-08-23 | 東京エレクトロン株式会社 | プラズマ処理装置及びヒータの温度制御方法 |
| CN103369810B (zh) * | 2012-03-31 | 2016-02-10 | 中微半导体设备(上海)有限公司 | 一种等离子反应器 |
| CN104715992B (zh) * | 2013-12-13 | 2018-02-09 | 中微半导体设备(上海)有限公司 | 一种等离子体处理腔室及其冷却装置 |
| JP6374301B2 (ja) | 2013-12-24 | 2018-08-15 | 東京エレクトロン株式会社 | ステージ、ステージの製造方法、熱交換器 |
| JP6158111B2 (ja) * | 2014-02-12 | 2017-07-05 | 東京エレクトロン株式会社 | ガス供給方法及び半導体製造装置 |
| JP6018606B2 (ja) * | 2014-06-27 | 2016-11-02 | 東京エレクトロン株式会社 | 温度制御可能なステージを含むシステム、半導体製造装置及びステージの温度制御方法 |
| JP5970040B2 (ja) * | 2014-10-14 | 2016-08-17 | 東京エレクトロン株式会社 | 温度制御システム及び温度制御方法 |
| US10490429B2 (en) * | 2014-11-26 | 2019-11-26 | Applied Materials, Inc. | Substrate carrier using a proportional thermal fluid delivery system |
| US10515786B2 (en) * | 2015-09-25 | 2019-12-24 | Tokyo Electron Limited | Mounting table and plasma processing apparatus |
| US11837479B2 (en) * | 2016-05-05 | 2023-12-05 | Applied Materials, Inc. | Advanced temperature control for wafer carrier in plasma processing chamber |
| US10522377B2 (en) * | 2016-07-01 | 2019-12-31 | Lam Research Corporation | System and method for substrate support feed-forward temperature control based on RF power |
| JP6832132B2 (ja) * | 2016-11-08 | 2021-02-24 | 東京エレクトロン株式会社 | 供給装置及び基板処理装置 |
| CN108257839B (zh) * | 2016-12-29 | 2019-10-08 | 中微半导体设备(上海)股份有限公司 | 一种用于晶圆处理的反应腔 |
| WO2018194807A1 (en) | 2017-04-21 | 2018-10-25 | Applied Materials, Inc. | Improved electrode assembly |
| US10867812B2 (en) | 2017-08-30 | 2020-12-15 | Taiwan Semiconductor Manufacturing Co., Ltd. | Semiconductor manufacturing system and control method |
| US11164759B2 (en) | 2018-05-10 | 2021-11-02 | Micron Technology, Inc. | Tools and systems for processing one or more semiconductor devices, and related methods |
| US10971384B2 (en) * | 2018-09-13 | 2021-04-06 | Lam Research Corporation | Auto-calibrated process independent feedforward control for processing substrates |
| US12278094B2 (en) * | 2020-05-08 | 2025-04-15 | Applied Materials, Inc. | Methods and apparatus for processing a substrate |
| JP7560215B2 (ja) | 2021-03-17 | 2024-10-02 | 東京エレクトロン株式会社 | プラズマ処理装置 |
| JP7668682B2 (ja) | 2021-06-02 | 2025-04-25 | 東京エレクトロン株式会社 | 温度制御装置および基板処理装置 |
| US12300464B2 (en) * | 2021-10-25 | 2025-05-13 | Advanced Energy Industries, Inc. | Robust tensorized shaped setpoint waveform streaming control |
| US20250319563A1 (en) * | 2024-04-16 | 2025-10-16 | Applied Materials, Inc. | Dual zone pedestal coolant distribution system |
| US20250349575A1 (en) * | 2024-05-09 | 2025-11-13 | Applied Materials, Inc. | Semiconductor processing chamber thermal control |
Citations (8)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US5548470A (en) * | 1994-07-19 | 1996-08-20 | International Business Machines Corporation | Characterization, modeling, and design of an electrostatic chuck with improved wafer temperature uniformity |
| EP0766300A1 (en) * | 1995-09-28 | 1997-04-02 | Applied Materials, Inc. | Method and structure for improving heat transfer fluid flow in electrostatic chucks |
| US6142208A (en) * | 1998-01-07 | 2000-11-07 | Premark Feg L.L.C. | Seal pickup station |
| US20070091537A1 (en) * | 2005-10-20 | 2007-04-26 | Applied Materials, Inc. | Method for agile workpiece temperature control in a plasma reactor using a thermal model |
| US20070258186A1 (en) * | 2006-04-27 | 2007-11-08 | Applied Materials, Inc | Substrate support with electrostatic chuck having dual temperature zones |
| US20090065181A1 (en) * | 2007-09-07 | 2009-03-12 | Spx Cooling Technologies, Inc. | System and method for heat exchanger fluid handling with atmospheric tower |
| US20100083952A1 (en) * | 2008-10-06 | 2010-04-08 | Van Houten Arnoud | Adaptive self pumping solar hot water heating system with overheat protection |
| US20100116788A1 (en) * | 2008-11-12 | 2010-05-13 | Lam Research Corporation | Substrate temperature control by using liquid controlled multizone substrate support |
Family Cites Families (64)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP3147392B2 (ja) | 1991-03-04 | 2001-03-19 | 宇部サイコン株式会社 | 熱可塑性樹脂組成物 |
| JPH0796170A (ja) | 1993-09-09 | 1995-04-11 | Tokyo Electron Ltd | 熱処理装置の温度制御方法 |
| US5435145A (en) | 1994-03-03 | 1995-07-25 | General Electric Company | Refrigerant flow rate control based on liquid level in simple vapor compression refrigeration cycles |
| US5711851A (en) * | 1996-07-12 | 1998-01-27 | Micron Technology, Inc. | Process for improving the performance of a temperature-sensitive etch process |
| KR100254793B1 (ko) | 1997-12-08 | 2000-05-01 | 윤종용 | 반도체장치 제조설비의 케미컬 분사장치 및 그 장치에 사용되는폐액조 |
| US6125025A (en) * | 1998-09-30 | 2000-09-26 | Lam Research Corporation | Electrostatic dechucking method and apparatus for dielectric workpieces in vacuum processors |
| US6368975B1 (en) | 1999-07-07 | 2002-04-09 | Applied Materials, Inc. | Method and apparatus for monitoring a process by employing principal component analysis |
| US6776801B2 (en) * | 1999-12-16 | 2004-08-17 | Sail Star Inc. | Dry cleaning method and apparatus |
| AU3084101A (en) | 2000-01-05 | 2001-07-16 | Tokyo Electron Limited | A method of wafer band-edge measurement using transmission spectroscopy and a process for controlling the temperature uniformity of a wafer |
| JP2001237226A (ja) | 2000-02-23 | 2001-08-31 | Kobe Steel Ltd | プラズマ処理装置 |
| US6635117B1 (en) | 2000-04-26 | 2003-10-21 | Axcelis Technologies, Inc. | Actively-cooled distribution plate for reducing reactive gas temperature in a plasma processing system |
| JP2002009049A (ja) | 2000-06-21 | 2002-01-11 | Matsushita Electric Ind Co Ltd | プラズマ処理方法及びこれを用いたプラズマ処理装置 |
| US6266968B1 (en) | 2000-07-14 | 2001-07-31 | Robert Walter Redlich | Multiple evaporator refrigerator with expansion valve |
| US6606234B1 (en) | 2000-09-05 | 2003-08-12 | Saint-Gobain Ceramics & Plastics, Inc. | Electrostatic chuck and method for forming an electrostatic chuck having porous regions for fluid flow |
| US7069984B2 (en) | 2001-02-08 | 2006-07-04 | Oriol Inc. | Multi-channel temperature control system for semiconductor processing facilities |
| US6921724B2 (en) | 2002-04-02 | 2005-07-26 | Lam Research Corporation | Variable temperature processes for tunable electrostatic chuck |
| JP2004063670A (ja) | 2002-07-26 | 2004-02-26 | Dainippon Screen Mfg Co Ltd | 制御装置および制御方法並びに熱処理装置および熱処理方法 |
| JP2004069933A (ja) | 2002-08-05 | 2004-03-04 | Hitachi Ltd | 速度検出器および画像形成装置 |
| JP4295490B2 (ja) | 2002-11-15 | 2009-07-15 | 東京エレクトロン株式会社 | 処理装置並びに処理装置用のチラー制御方法及びチラー制御装置 |
| US7221553B2 (en) | 2003-04-22 | 2007-05-22 | Applied Materials, Inc. | Substrate support having heat transfer system |
| US9236279B2 (en) | 2003-06-27 | 2016-01-12 | Lam Research Corporation | Method of dielectric film treatment |
| DE10336599B4 (de) | 2003-08-08 | 2016-08-04 | Daimler Ag | Verfahren zur Ansteuerung eines Thermostaten in einem Kühlkreislauf eines Verbrennungsmotors |
| JP2005079415A (ja) | 2003-09-02 | 2005-03-24 | Hitachi High-Technologies Corp | プラズマ処理装置 |
| JP2005150173A (ja) | 2003-11-12 | 2005-06-09 | Hitachi High-Technologies Corp | 真空処理装置 |
| JP4381963B2 (ja) | 2003-11-19 | 2009-12-09 | パナソニック株式会社 | プラズマ処理装置 |
| JP2005210080A (ja) | 2003-12-25 | 2005-08-04 | Tokyo Electron Ltd | 温度調節方法及び温度調節装置 |
| JP4522783B2 (ja) | 2004-08-03 | 2010-08-11 | 株式会社日立ハイテクノロジーズ | プラズマ処理装置及びプラズマ処理方法 |
| US7544251B2 (en) * | 2004-10-07 | 2009-06-09 | Applied Materials, Inc. | Method and apparatus for controlling temperature of a substrate |
| TWI314842B (en) | 2005-01-28 | 2009-09-11 | Advanced Display Proc Eng Co | Plasma processing apparatus |
| JP4551256B2 (ja) * | 2005-03-31 | 2010-09-22 | 東京エレクトロン株式会社 | 載置台の温度制御装置及び載置台の温度制御方法及び処理装置及び載置台温度制御プログラム |
| JP2006339253A (ja) | 2005-05-31 | 2006-12-14 | Toshiba Corp | プラズマ処理装置及びプラズマ処理方法 |
| JP2006351887A (ja) | 2005-06-17 | 2006-12-28 | Hitachi High-Technologies Corp | プラズマ処理装置 |
| US7279427B2 (en) | 2005-08-03 | 2007-10-09 | Tokyo Electron, Ltd. | Damage-free ashing process and system for post low-k etch |
| GB0516695D0 (en) | 2005-08-15 | 2005-09-21 | Boc Group Plc | Microwave plasma reactor |
| JP4878801B2 (ja) | 2005-09-26 | 2012-02-15 | 株式会社日立国際電気 | 基板処理装置、半導体装置の製造方法 |
| JP4488999B2 (ja) | 2005-10-07 | 2010-06-23 | 株式会社日立ハイテクノロジーズ | エッチング方法およびエッチング装置 |
| US7695633B2 (en) | 2005-10-18 | 2010-04-13 | Applied Materials, Inc. | Independent control of ion density, ion energy distribution and ion dissociation in a plasma reactor |
| US7368393B2 (en) | 2006-04-20 | 2008-05-06 | International Business Machines Corporation | Chemical oxide removal of plasma damaged SiCOH low k dielectrics |
| JP4779807B2 (ja) | 2006-05-29 | 2011-09-28 | 株式会社島津製作所 | Icp発光分光分析装置 |
| US20080060978A1 (en) * | 2006-06-14 | 2008-03-13 | Paul Wegner | Handling and extracting hydrocarbons from tar sands |
| JP4815298B2 (ja) * | 2006-07-31 | 2011-11-16 | 株式会社日立ハイテクノロジーズ | プラズマ処理方法 |
| US20080035306A1 (en) | 2006-08-08 | 2008-02-14 | White John M | Heating and cooling of substrate support |
| JP4826483B2 (ja) | 2007-01-19 | 2011-11-30 | 東京エレクトロン株式会社 | プラズマ処理装置 |
| JP4838197B2 (ja) | 2007-06-05 | 2011-12-14 | 東京エレクトロン株式会社 | プラズマ処理装置,電極温度調整装置,電極温度調整方法 |
| US7998873B2 (en) | 2007-06-15 | 2011-08-16 | Taiwan Semiconductor Manufacturing Company, Ltd. | Method for fabricating low-k dielectric and Cu interconnect |
| US20090095218A1 (en) | 2007-10-16 | 2009-04-16 | Novellus Systems, Inc. | Temperature controlled showerhead |
| WO2009076576A2 (en) * | 2007-12-12 | 2009-06-18 | Eco2 Plastics | Continuous system for processing particles |
| JP4486135B2 (ja) | 2008-01-22 | 2010-06-23 | 東京エレクトロン株式会社 | 温度制御機構およびそれを用いた処理装置 |
| JP5551343B2 (ja) | 2008-05-14 | 2014-07-16 | 東京エレクトロン株式会社 | 誘導結合プラズマ処理装置 |
| US8596336B2 (en) | 2008-06-03 | 2013-12-03 | Applied Materials, Inc. | Substrate support temperature control |
| JP5433171B2 (ja) | 2008-06-16 | 2014-03-05 | 株式会社日立ハイテクノロジーズ | 試料温度の制御方法 |
| JP5374109B2 (ja) | 2008-10-17 | 2013-12-25 | 株式会社アルバック | 加熱真空処理方法 |
| JP5655010B2 (ja) * | 2009-02-11 | 2015-01-14 | アプライド マテリアルズ インコーポレイテッドApplied Materials,Incorporated | 非接触基板処理のための方法及び装置 |
| US8404572B2 (en) | 2009-02-13 | 2013-03-26 | Taiwan Semiconductor Manufacturing Co., Ltd | Multi-zone temperature control for semiconductor wafer |
| US8916793B2 (en) | 2010-06-08 | 2014-12-23 | Applied Materials, Inc. | Temperature control in plasma processing apparatus using pulsed heat transfer fluid flow |
| US9338871B2 (en) | 2010-01-29 | 2016-05-10 | Applied Materials, Inc. | Feedforward temperature control for plasma processing apparatus |
| US8880227B2 (en) | 2010-05-27 | 2014-11-04 | Applied Materials, Inc. | Component temperature control by coolant flow control and heater duty cycle control |
| US8608852B2 (en) * | 2010-06-11 | 2013-12-17 | Applied Materials, Inc. | Temperature controlled plasma processing chamber component with zone dependent thermal efficiencies |
| US8980754B2 (en) | 2011-07-20 | 2015-03-17 | Applied Materials, Inc. | Method of removing a photoresist from a low-k dielectric film |
| US8741775B2 (en) | 2011-07-20 | 2014-06-03 | Applied Materials, Inc. | Method of patterning a low-K dielectric film |
| US8940642B2 (en) | 2011-07-20 | 2015-01-27 | Applied Materials, Inc. | Method of multiple patterning of a low-K dielectric film |
| US8778207B2 (en) | 2011-10-27 | 2014-07-15 | Applied Materials, Inc. | Plasma etch processes for boron-doped carbonaceous mask layers |
| US8871650B2 (en) | 2011-10-28 | 2014-10-28 | Applied Materials, Inc. | Post etch treatment (PET) of a low-K dielectric film |
| US8937800B2 (en) | 2012-04-24 | 2015-01-20 | Applied Materials, Inc. | Electrostatic chuck with advanced RF and temperature uniformity |
-
2011
- 2011-05-19 US US13/111,334 patent/US8916793B2/en active Active
- 2011-06-03 WO PCT/US2011/039182 patent/WO2011156239A2/en not_active Ceased
- 2011-06-03 CN CN201180019903.9A patent/CN102907180B/zh active Active
- 2011-06-03 KR KR1020127027408A patent/KR101801070B1/ko active Active
- 2011-06-03 JP JP2013514239A patent/JP6077995B2/ja active Active
- 2011-06-08 TW TW100120026A patent/TWI445459B/zh active
-
2014
- 2014-12-22 US US14/580,184 patent/US9214315B2/en active Active
Patent Citations (9)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US5548470A (en) * | 1994-07-19 | 1996-08-20 | International Business Machines Corporation | Characterization, modeling, and design of an electrostatic chuck with improved wafer temperature uniformity |
| EP0766300A1 (en) * | 1995-09-28 | 1997-04-02 | Applied Materials, Inc. | Method and structure for improving heat transfer fluid flow in electrostatic chucks |
| US6142208A (en) * | 1998-01-07 | 2000-11-07 | Premark Feg L.L.C. | Seal pickup station |
| US20070091537A1 (en) * | 2005-10-20 | 2007-04-26 | Applied Materials, Inc. | Method for agile workpiece temperature control in a plasma reactor using a thermal model |
| US20070258186A1 (en) * | 2006-04-27 | 2007-11-08 | Applied Materials, Inc | Substrate support with electrostatic chuck having dual temperature zones |
| US20090065181A1 (en) * | 2007-09-07 | 2009-03-12 | Spx Cooling Technologies, Inc. | System and method for heat exchanger fluid handling with atmospheric tower |
| US20100083952A1 (en) * | 2008-10-06 | 2010-04-08 | Van Houten Arnoud | Adaptive self pumping solar hot water heating system with overheat protection |
| US20100116788A1 (en) * | 2008-11-12 | 2010-05-13 | Lam Research Corporation | Substrate temperature control by using liquid controlled multizone substrate support |
| WO2010055441A2 (en) * | 2008-11-12 | 2010-05-20 | Lam Research Corporation | Improved substrate temperature control by using liquid controlled multizone substrate support |
Also Published As
| Publication number | Publication date |
|---|---|
| US9214315B2 (en) | 2015-12-15 |
| TWI445459B (zh) | 2014-07-11 |
| JP2013534695A (ja) | 2013-09-05 |
| WO2011156239A3 (en) | 2012-01-26 |
| WO2011156239A2 (en) | 2011-12-15 |
| KR20130084221A (ko) | 2013-07-24 |
| KR101801070B1 (ko) | 2017-11-24 |
| CN102907180A (zh) | 2013-01-30 |
| JP6077995B2 (ja) | 2017-02-08 |
| US8916793B2 (en) | 2014-12-23 |
| TW201215248A (en) | 2012-04-01 |
| US20150316941A1 (en) | 2015-11-05 |
| US20120132397A1 (en) | 2012-05-31 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| CN102907180B (zh) | 使用脉冲传热流体流动的等离子体处理设备中的温度控制 | |
| TWI631876B (zh) | 電漿處理設備之前饋溫度控制 | |
| CN102907181B (zh) | 通过冷却剂流量控制及加热器占空比控制的组件温度控制 | |
| CN102187742B (zh) | 等离子体处理装置中的快速响应热控制的方法和设备 | |
| CN109075110B (zh) | 用于等离子体处理腔室中晶片载体的先进温度控制的设备和方法 | |
| TWI706504B (zh) | 用以降低靜電夾頭中之溫度變遷的系統及方法 | |
| US10928145B2 (en) | Dual zone common catch heat exchanger/chiller | |
| CN102057476B (zh) | 快速衬底支撑件温度控制 | |
| US9916967B2 (en) | Fast response fluid control system | |
| US11158528B2 (en) | Component temperature control using a combination of proportional control valves and pulsed valves | |
| US20130240144A1 (en) | Fast response fluid temperature control system |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| C06 | Publication | ||
| PB01 | Publication | ||
| C10 | Entry into substantive examination | ||
| SE01 | Entry into force of request for substantive examination | ||
| C14 | Grant of patent or utility model | ||
| GR01 | Patent grant |