CN102636739A - Multi-station positioning device for testing integrated circuits - Google Patents
Multi-station positioning device for testing integrated circuits Download PDFInfo
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- CN102636739A CN102636739A CN2012100745937A CN201210074593A CN102636739A CN 102636739 A CN102636739 A CN 102636739A CN 2012100745937 A CN2012100745937 A CN 2012100745937A CN 201210074593 A CN201210074593 A CN 201210074593A CN 102636739 A CN102636739 A CN 102636739A
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- 238000012360 testing method Methods 0.000 title claims abstract description 190
- 230000007246 mechanism Effects 0.000 claims abstract description 108
- 230000007704 transition Effects 0.000 claims description 37
- 238000007599 discharging Methods 0.000 claims description 29
- 239000002994 raw material Substances 0.000 claims description 29
- 230000003028 elevating effect Effects 0.000 claims description 20
- 230000008878 coupling Effects 0.000 claims description 4
- 238000010168 coupling process Methods 0.000 claims description 4
- 238000005859 coupling reaction Methods 0.000 claims description 4
- 238000012423 maintenance Methods 0.000 description 6
- 238000004519 manufacturing process Methods 0.000 description 4
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- 230000005484 gravity Effects 0.000 description 3
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- 238000010586 diagram Methods 0.000 description 2
- 238000009434 installation Methods 0.000 description 2
- 239000000463 material Substances 0.000 description 2
- 238000001387 multinomial test Methods 0.000 description 2
- 238000003466 welding Methods 0.000 description 2
- 238000013461 design Methods 0.000 description 1
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Abstract
The invention relates to the field of integrated circuit testing equipment, and aims to provide a multi-station positioning device for testing integrated circuits, which is high in integrated circuit testing efficiency. Testing contacts of the multi-station positioning device keep good contact with testing ends. The multi-station positioning device for testing the integrated circuits comprises a mounting seat, a feeding track, a plurality of testing contacts, a distributing mechanism, a distributing driving mechanism, a pushing mechanism and a pushing driving mechanism, the feeding track is fixedly connected with the mounting seat, the distributing mechanism is used for distributing the integrating circuits to the testing contacts, the pushing mechanism pushes the testing contacts to contact with testing ends of the integrated circuits, the distributing driving mechanism is respectively fixedly connected with the distributing mechanism and the mounting seat, and the pushing driving mechanism is respectively fixedly connected with the pushing mechanism and the mounting seat. The multi-station positioning device for testing the integrated circuits is high in integrated circuit testing efficiency, and the testing contacts keep good contact with the testing ends.
Description
Technical field
The present invention relates to the integrated circuit testing apparatus field, keep the integrated circuit testing multi-station positioning device that well contacts between especially a kind of testing integrated circuits efficient height and test contact and the test cap.
Background technology
Integrated circuit is produced by batch and need be carried out multinomial test, must contact between the test cap of the very big and integrated circuit of workload and the test contact of proving installation well just can make test accurate; The multinomial test of integrated circuit is at present often accomplished by the multiple tracks test step, and integrated circuit needs between the multiple tracks test step, to make a detour, and often testing in the socket with test contact of the test cap of integrated circuit insertion proving installation; Because integrated circuit process need in test is repeatedly made a detour and is plugged; There is the low deficiency that also causes loose contact between test contact and the test cap easily of testing efficiency; Therefore; Design and keep the integrated circuit testing multi-station positioning device that well contacts between a kind of testing integrated circuits efficient height and test contact and the test cap, become problem demanding prompt solution.
Summary of the invention
The objective of the invention is in order to overcome present testing efficiency lowly and cause the deficiency of loose contact between test contact and the test cap easily, provide to keep the integrated circuit testing multi-station positioning device that well contacts between a kind of testing integrated circuits efficient height and test contact and the test cap.
Concrete technical scheme of the present invention is:
Feeding track, several test contact that a kind of integrated circuit testing multi-station positioning device, described integrated circuit testing multi-station positioning device comprise mount pad, be fixedly connected with mount pad, be used for being distributed to pushing mechanism and the promotion driving mechanism that gradation mechanism, gradation driving mechanism, the push to test contact at each test contact place contact with the integrated circuit testing termination to integrated circuit; Described gradation driving mechanism is fixedly connected with mount pad with gradation mechanism respectively; Described promotion driving mechanism is fixedly connected with mount pad with pushing mechanism respectively.When this integrated circuit testing multi-station positioning device uses; Integrated circuit in the feeding track falls under action of gravity; The gradation driving mechanism makes integrated circuit get into several test positions continuously through gradation mechanism to carry out different tests, and different tests can be carried out to several integrated circuit simultaneously in several test positions; After integrated circuit fell entering test position, promotion driving mechanism drive pushing mechanism was pushed down test contact and is contacted with the integrated circuit testing termination; Keep well contacting between this integrated circuit testing multi-station positioning device testing integrated circuits efficient height and test contact and the test cap.
As preferably, described mount pad comprises base plate, fixed head and connecting link; Described base plate is provided with through hole; Described fixed head and feeding track lay respectively at the both sides at the place, through hole place of base plate, and fixed head is fixedly connected with base plate through connecting link, and feeding track is fixedly connected with base plate; Described feeding track is provided with chute feeder and end tank along its length; The two side ends of described end tank connects with a side external surface of chute feeder and feeding track respectively.Mount pad is simple in structure.
As preferably, described integrated circuit testing multi-station positioning device also comprises cushion block and the cushion block elevating mechanism that is used to fill up the integrated circuit testing end; Described cushion block elevating mechanism is fixedly connected with fixed head with cushion block respectively.After integrated circuit fell entering test position, the cushion block elevating mechanism drove cushion block and stretches out firmly integrated circuit testing termination of pad forward; The cushion block pad firmly make between integrated circuit testing termination and the test contact contact better.
As preferably, described cushion block elevating mechanism comprises lift cylinder and up-down buffer stopper; Described lift cylinder is positioned at the rear side of fixed head and is fixedly connected with fixed head, is provided with cushion block guide pillar guide pin bushing between described cushion block and the fixed head; The lift cylinders bar of described lift cylinder passes fixed head and is fixedly connected with cushion block with through hole; Described lift cylinder is provided with back cylinder bar; Described up-down buffer stopper is fixedly connected with the back cylinder bar that goes up and down.Elevating mechanism is that cylinder is simple and practical, and cushion block guide pillar guide pin bushing goes up and down steadily cushion block, and the up-down buffer stopper reduces the impact of cushion block to the integrated circuit testing termination.
As preferably, described elevating mechanism is first cylinder; Described first cylinder is fixedly connected with fixed head, is provided with the first guide pillar guide pin bushing between described cushion block and the fixed head; The first cylinder bar of described first cylinder passes fixed head and is fixedly connected with cushion block with through hole.Elevating mechanism is that cylinder is simple and practical.
As preferably, described gradation mechanism comprises test backing pin and the transition backing pin that header board, back plate, transiting rod, discharging backing pin, the backing pin of getting the raw materials ready, number equate with test contact; The trailing flank of described feeding track be provided with connect with chute feeder and with the back pin-and-hole of test backing pin with the backing pin coupling of getting the raw materials ready, the leading flank of feeding track is provided with the preceding pin-and-hole that connects with chute feeder and mate with transition backing pin and discharging backing pin; Described header board is positioned at the front side of feeding track, and back plate is between the rear side and fixed head of feeding track, and transiting rod passes through hole, and the two ends of transiting rod are fixedly connected with the back plate with header board respectively; The described backing pin of getting the raw materials ready, discharging backing pin and transition backing pin are arranged in order from top to bottom, and below and transition backing pin that the test backing pin is positioned at the transition backing pin are spaced; One end of described test backing pin is fixedly connected with the back plate respectively with an end of the backing pin of getting the raw materials ready, and the other end of test backing pin stretches into corresponding back pin-and-hole with the other end of the backing pin of getting the raw materials ready; One end of described transition backing pin is fixedly connected with header board respectively with an end of discharging backing pin, and the other end of the other end of transition backing pin and discharging backing pin stretches into corresponding preceding pin-and-hole respectively; Be provided with gradation guide pillar guide pin bushing between described back plate and the fixed head.Gradation mechanism is simple and reliable for structure, and gradation guide pillar guide pin bushing goes up and down steadily gradation mechanism.
As preferably, described gradation driving mechanism comprises gradation cylinder and gradation buffer stopper; The gradation cylinder is provided with cylinder bar behind the gradation; Described gradation cylinder is positioned at the rear side of fixed head and is fixedly connected with fixed head; The gradation cylinder bar of described gradation cylinder passes fixed head and is fixedly connected with the back plate; The cylinder bar is fixedly connected behind described gradation buffer stopper and the gradation.The gradation driving mechanism is that cylinder is simple and practical, and the gradation buffer stopper reduces the impact of gradation mechanism to feeding track and integrated circuit survey.
As preferably, described gradation driving mechanism is second cylinder; Described second cylinder is fixedly connected with fixed head; The second cylinder bar of described second cylinder passes fixed head and is fixedly connected with the back plate.The gradation driving mechanism is that cylinder is simple and practical.
As preferably, described pushing mechanism comprises the preceding holder that back holder and number equate with test contact; Fixed seating, described back is side in the feeding track place of base plate, and the rear end of back holder is fixedly connected with base plate, and preceding holder is fixedly connected with the front end of back holder, and test contact is fixedly connected with the back holder; Described promotion driving mechanism comprises promotion cylinder and the pusher head that number equates with test contact; Described promotion cylinder is fixedly connected with preceding holder, and pusher head is fixedly connected with the promotion cylinder bar that promotes cylinder and is relative with test contact.Driving driving mechanism is that cylinder is simple and practical; Pushing mechanism is simple in structure.
As preferably, described before holder comprise fixed mount, slide block, cover plate and set screw; The front end face of described fixed mount is provided with the groove with the slide block coupling, and the dual-side of slide block is slidingly connected through the relative dual-side of guide rail and groove respectively; Described cover plate is fixedly connected with the front end of fixed mount, and set screw is passed cover plate and is threaded with slide block; Described promotion cylinder is fixedly connected with slide block.The set screw of holder drive adjusting slider makes pusher head push down the suitable pressure of integrated circuit testing termination maintenance before the rotation.
Compared with prior art, the invention has the beneficial effects as follows: one. keep well contacting between this integrated circuit testing multi-station positioning device testing integrated circuits efficient height and test contact and the test cap.Two. mount pad is simple in structure.Three. elevating mechanism is that cylinder is simple and practical, and cushion block guide pillar guide pin bushing goes up and down steadily cushion block, and the up-down buffer stopper reduces the impact of cushion block to the integrated circuit testing termination, the cushion block pad firmly make between integrated circuit testing termination and the test contact contact better.Four. gradation mechanism is simple and reliable for structure, and gradation guide pillar guide pin bushing goes up and down steadily gradation mechanism, and the gradation driving mechanism is that cylinder is simple and practical, and the gradation buffer stopper reduces the impact of gradation mechanism to feeding track and integrated circuit survey.Five. driving driving mechanism is that cylinder is simple and practical; Pushing mechanism is simple in structure; The set screw of holder drive adjusting slider makes pusher head push down the suitable pressure of integrated circuit testing termination maintenance before the rotation.
Description of drawings
Fig. 1 is the synoptic diagram of the embodiment of the invention 1;
Fig. 2 is the right view of Fig. 1;
Fig. 3 is that the A of Fig. 2 is to view;
Fig. 4 is the synoptic diagram of the embodiment of the invention 2;
Fig. 5 is the right view of Fig. 4;
Fig. 6 is that the A of Fig. 5 is to view.
Among the figure: test contact-1; Cushion block-2; Feeding track-3; Chute feeder-31; End tank-32; Back pin-and-hole-33; Preceding pin-and-hole-34; Mount pad-4; Base plate-41; Fixed head-42; Connecting link-43; Through hole-44; Cushion block guide pillar guide pin bushing-45; Lift cylinder-5; Lift cylinders bar-51; Back cylinder bar-52 goes up and down; Gradation cylinder-6; Gradation cylinder bar-61; Cylinder bar-62 behind the gradation; Preceding holder-7; Fixed mount-71; Slide block-72; Cover plate-73; Set screw-74; Groove-75; Guide rail-76; Promote cylinder-8; Promote cylinder bar-81; First cylinder-9; The first cylinder bar-91; Second cylinder-10; The second cylinder bar-101; Up-down buffer stopper-11; Header board-12; Back plate-13; Transiting rod-14; Discharging backing pin-15; The backing pin-16 of getting the raw materials ready; Test backing pin-17; Transition backing pin-18; Gradation guide pillar guide pin bushing-19; Gradation buffer stopper-20; Back holder 21; Pusher head-22.
Embodiment
Below in conjunction with shown in the accompanying drawing the present invention is described further.
Described mount pad 4 comprises base plate 41, fixed head 42 and connecting link 43; Connecting link 43 has four, and base plate 41 has through hole 44; Fixed head 42 and feeding track 3 lay respectively at the both sides at the place, through hole 44 places of base plate 41, and fixed head 42 is through connecting link 43 and base plate 41 welding, and feeding track 3 is connected with base plate 41 screws; Feeding track 3 has chute feeder 31 and end tank 32 along its length; The two side ends of end tank 32 connects with a side external surface of chute feeder 31 and feeding track 3 respectively.
Described elevating mechanism comprises lift cylinder 5 and up-down buffer stopper 11; Described cushion block elevating mechanism is fixedly connected with fixed head 42 with cushion block 2 respectively; In the present embodiment, lift cylinder 5 is positioned at the rear side of fixed head 42 and is connected with fixed head 42 screws, has cushion block guide pillar guide pin bushing 45 between cushion block 2 and the fixed head 42; The lift cylinders bar 51 of lift cylinder 5 passes fixed head 42 and is threaded with cushion block 2 with through hole 44; Lift cylinder 5 has the back of up-down cylinder bar 52; The material of up-down buffer stopper 11 is a rubber, and up-down buffer stopper 11 is threaded with the back cylinder bar 52 that goes up and down.
Described gradation mechanism comprises that four that header board 12, back plate 13, transiting rod 14, discharging backing pin 15, the backing pin 16 of getting the raw materials ready, number equate with test contact 1 are tested backing pins 17 and four transition backing pins 18; The trailing flank of feeding track 3 have connect with chute feeder 31 and with the back pin-and-hole 33 of the test backing pin 17 and backing pin 16 clearance fit of getting the raw materials ready, the leading flank of feeding track 3 have connect with chute feeder 31 and with the preceding pin-and-hole 34 of transition backing pin 18 and discharging backing pin 15 clearance fit; Header board 12 is positioned at the front side of feeding track 3, and back plate 13 is between the rear side and fixed head 42 of feeding track 3, and transiting rod 14 passes through hole 44, and weld with header board 12 and back plate 13 respectively at the two ends of transiting rod 14; Get the raw materials ready backing pin 16, discharging backing pin 15 and transition backing pin 18 is arranged in order from top to bottom, and below and transition backing pin 18 that test backing pin 17 is positioned at transition backing pin 18 are spaced; One end of test backing pin 17 is threaded with back plate 13 respectively with an end of the backing pin 16 of getting the raw materials ready, and the other end of test backing pin 17 stretches into corresponding back pin-and-hole 33 with the other end of the backing pin 16 of getting the raw materials ready; One end of transition backing pin 18 and an end of discharging backing pin 15 are threaded with header board 12 respectively, and the other end of the other end of transition backing pin 18 and discharging backing pin 15 stretches into corresponding preceding pin-and-hole 34 respectively; Has gradation guide pillar guide pin bushing 19 between back plate 13 and the fixed head 42.
Described gradation driving mechanism comprises gradation cylinder 6 and gradation buffer stopper 20; Gradation cylinder 6 has cylinder bar 62 behind the gradation; Described gradation driving mechanism is fixedly connected with mount pad 4 with gradation mechanism respectively; In the present embodiment, gradation cylinder 6 is positioned at the rear side of fixed head 42 and is connected with fixed head 42 screws; The gradation cylinder bar 61 of gradation cylinder 6 passes fixed head 42 and is threaded with back plate 13; The material of gradation buffer stopper 20 is a rubber, and cylinder bar 62 is threaded behind gradation buffer stopper 20 and the gradation.
Described pushing mechanism comprises four preceding holders 7 that back holder 21 and number equate with test contact 1; Back holder 21 is positioned at the feeding track 3 place sides of base plate 41, and the rear end of back holder 21 is connected with base plate 41 screws, and preceding holder 7 is connected with the front end screw of back holder 21, and test contact 1 is connected with back holder 21 screws; Described promotion driving mechanism comprises four promotion cylinders 8 and four pusher head 22 that number equates with test contact 1.
When this integrated circuit testing multi-station positioning device uses; Integrated circuit in the feeding track falls under action of gravity; First integrated circuit is blocked by discharging backing pin 15; The gradation cylinder bar 61 of gradation cylinder 6 stretches out forward, through header board 12, transiting rod 14 and after plate 13, drive discharging backing pin 15, the backing pin 16 of getting the raw materials ready, test backing pin 17 and transition backing pin 18 and travel forward; The backing pin 16 of getting the raw materials ready inserts the fabrication hole of second integrated circuit, and first integrated circuit falls by first test backing pin 17 and blocks the entering first test position; Gradation cylinder bar 61 is withdrawn backward; Through header board 12, transiting rod 14 and after plate 13; Driving discharging backing pin 15, the backing pin 16 of getting the raw materials ready, test backing pin 17 and transition backing pin 18 moves backward; The backing pin 16 of getting the raw materials ready withdraws from the fabrication hole of second integrated circuit, and second integrated circuit falls to being blocked by discharging backing pin 15, and first integrated circuit falls by first transition backing pin 18 and blocks the entering first transition position; And the like, can make integrated circuit carry out different tests four test positions continuously, different tests can be carried out to four integrated circuit simultaneously in four test positions; When integrated circuit fall backing pin 17 to be tested block get into the test position after, the lift cylinders bar 51 of lift cylinder 5 drives cushion blocks 2 and stretches out pad forward and live the integrated circuit testing termination; The promotion cylinder bar 81 that promotes cylinder 8 drives pusher head 22 and stretches out backward and push down test contact 1 and contact with the integrated circuit testing termination; The set screw 74 drive adjusting sliders 72 of holder 7 make pusher head 22 push down the suitable pressure of integrated circuit testing termination maintenance before the rotation.
This beneficial effect of the invention is: keep well contacting between this integrated circuit testing multi-station positioning device testing integrated circuits efficient height and test contact and the test cap.Mount pad is simple in structure.Elevating mechanism is that cylinder is simple and practical, and cushion block guide pillar guide pin bushing goes up and down steadily cushion block, and the up-down buffer stopper reduces the impact of cushion block to the integrated circuit testing termination, the cushion block pad firmly make between integrated circuit testing termination and the test contact contact better.Gradation mechanism is simple and reliable for structure, and gradation guide pillar guide pin bushing goes up and down steadily gradation mechanism, and the gradation driving mechanism is that cylinder is simple and practical, and the gradation buffer stopper reduces the impact of gradation mechanism to feeding track and integrated circuit survey.Driving driving mechanism is that cylinder is simple and practical; Pushing mechanism is simple in structure; The set screw of holder drive adjusting slider makes pusher head push down the suitable pressure of integrated circuit testing termination maintenance before the rotation.
Described mount pad 4 comprises base plate 41, fixed head 42 and connecting link 43; Connecting link 43 has four, and base plate 41 has through hole 44; Fixed head 42 and feeding track 3 lay respectively at the both sides at the place, through hole 44 places of base plate 41, and fixed head 42 is through connecting link 43 and base plate 41 welding, and feeding track 3 is connected with base plate 41 screws; Feeding track 3 has chute feeder 31 and end tank 32 along its length; The two side ends of end tank 32 connects with a side external surface of chute feeder 31 and feeding track 3 respectively.
Described elevating mechanism is first cylinder 9; Described cushion block elevating mechanism is fixedly connected with mount pad 4 with cushion block 2 respectively; In the present embodiment, described first cylinder 9 is connected with fixed head 42 screws, has cushion block guide pillar guide pin bushing 45 between described cushion block 2 and the fixed head 42; The first cylinder bar 91 of described first cylinder 9 passes fixed head 42 and is threaded with cushion block 2 with through hole 44.
Described gradation mechanism comprises that four that header board 12, back plate 13, transiting rod 14, discharging backing pin 15, the backing pin 16 of getting the raw materials ready, number equate with test contact 1 are tested backing pins 17 and four transition backing pins 18; The trailing flank of feeding track 3 have connect with chute feeder 31 and with the back pin-and-hole 33 of the test backing pin 17 and backing pin 16 clearance fit of getting the raw materials ready, the leading flank of feeding track 3 have connect with chute feeder 31 and with the preceding pin-and-hole 34 of transition backing pin 18 and discharging backing pin 15 clearance fit; Header board 12 is positioned at the front side of feeding track 3, and back plate 13 is between the rear side and fixed head 42 of feeding track 3, and transiting rod 14 passes through hole 44, and weld with header board 12 and back plate 13 respectively at the two ends of transiting rod 14; Get the raw materials ready backing pin 16, discharging backing pin 15 and transition backing pin 18 is arranged in order from top to bottom, and below and transition backing pin 18 that test backing pin 17 is positioned at transition backing pin 18 are spaced; One end of test backing pin 17 is threaded with back plate 13 respectively with an end of the backing pin 16 of getting the raw materials ready, and the other end of test backing pin 17 stretches into corresponding back pin-and-hole 33 with the other end of the backing pin 16 of getting the raw materials ready; One end of transition backing pin 18 and an end of discharging backing pin 15 are threaded with header board 12 respectively, and the other end of the other end of transition backing pin 18 and discharging backing pin 15 stretches into corresponding preceding pin-and-hole 34 respectively; Has gradation guide pillar guide pin bushing 19 between back plate 13 and the fixed head 42.
Described gradation driving mechanism is second cylinder 10; Described gradation driving mechanism is fixedly connected with mount pad 4 with gradation mechanism respectively; In the present embodiment, described second cylinder 10 is connected with fixed head 42 screws; The second cylinder bar 101 of second cylinder 10 passes fixed head 42 and is threaded with back plate 13.
Described pushing mechanism comprises four preceding holders 7 that back holder 21 and number equate with test contact 1; Back holder 21 is positioned at the feeding track 3 place sides of base plate 41, and the rear end of back holder 21 is connected with base plate 41 screws, and preceding holder 7 is connected with the front end screw of back holder 21, and test contact 1 is connected with back holder 21 screws; Described promotion driving mechanism comprises four promotion cylinders 8 and four pusher head 22 that number equates with test contact; Promote cylinder 8 and four pusher head 22;
When this integrated circuit testing multi-station positioning device uses; Integrated circuit in the feeding track falls under action of gravity; First integrated circuit is blocked by discharging backing pin 15; The second cylinder bar 101 of second cylinder 10 stretches out forward, through header board 12, transiting rod 14 and after plate 13, drive discharging backing pin 15, the backing pin 16 of getting the raw materials ready, test backing pin 17 and transition backing pin 18 and travel forward; The backing pin 16 of getting the raw materials ready inserts the fabrication hole of second integrated circuit, and first integrated circuit falls by first test backing pin 17 and blocks the entering first test position; The second cylinder bar 101 is withdrawn backward; Through header board 12, transiting rod 14 and after plate 13; Driving discharging backing pin 15, the backing pin 16 of getting the raw materials ready, test backing pin 17 and transition backing pin 18 moves backward; The backing pin 16 of getting the raw materials ready withdraws from the fabrication hole of second integrated circuit, and second integrated circuit falls to being blocked by discharging backing pin 15, and first integrated circuit falls by first transition backing pin 18 and blocks the entering first transition position; And the like, can make integrated circuit carry out different tests four test positions continuously, different tests can be carried out to four integrated circuit simultaneously in four test positions; When integrated circuit fall backing pin 17 to be tested block get into the test position after, the first cylinder bar 91 of first cylinder 9 drives cushion blocks 2 and stretches out pad forward and live the integrated circuit testing termination; The promotion cylinder bar 81 that promotes cylinder 8 drives pusher head 22 and stretches out backward and push down test contact 1 and contact with the integrated circuit testing termination; The set screw 74 drive adjusting sliders 72 of holder 7 make pusher head 22 push down the suitable pressure of integrated circuit testing termination maintenance before the rotation.
This beneficial effect of the invention is: keep well contacting between this integrated circuit testing multi-station positioning device testing integrated circuits efficient height and test contact and the test cap.Mount pad is simple in structure.Elevating mechanism is that cylinder is simple and practical, and cushion block guide pillar guide pin bushing goes up and down steadily cushion block, the cushion block pad firmly make between integrated circuit testing termination and the test contact contact better.Gradation mechanism is simple and reliable for structure, and gradation guide pillar guide pin bushing goes up and down steadily gradation mechanism, and the gradation driving mechanism is that cylinder is simple and practical.Driving driving mechanism is that cylinder is simple and practical; Pushing mechanism is simple in structure; The set screw of holder drive adjusting slider makes pusher head push down the suitable pressure of integrated circuit testing termination maintenance before the rotation.
It is apparent to one skilled in the art that the present invention can change into multiple mode, and such change is not thought and departed from the scope of the present invention.The conspicuous modification of the technician to said field that all are such is within the scope that is included in this claim.
Claims (10)
1. integrated circuit testing multi-station positioning device is characterized in that: feeding track, several test contact that described integrated circuit testing multi-station positioning device comprises mount pad, be fixedly connected with mount pad, be used for being distributed to pushing mechanism and the promotion driving mechanism that gradation mechanism, gradation driving mechanism, the push to test contact at each test contact place contact with the integrated circuit testing termination to integrated circuit; Described gradation driving mechanism is fixedly connected with mount pad with gradation mechanism respectively; Described promotion driving mechanism is fixedly connected with mount pad with pushing mechanism respectively.
2. integrated circuit testing multi-station positioning device according to claim 1 is characterized in that: described mount pad comprises base plate, fixed head and connecting link; Described base plate is provided with through hole; Described fixed head and feeding track lay respectively at the both sides at the place, through hole place of base plate, and fixed head is fixedly connected with base plate through connecting link, and feeding track is fixedly connected with base plate; Described feeding track is provided with chute feeder and end tank along its length; The two side ends of described end tank connects with a side external surface of chute feeder and feeding track respectively.
3. integrated circuit testing multi-station positioning device according to claim 2 is characterized in that: described integrated circuit testing multi-station positioning device also comprises cushion block and the cushion block elevating mechanism that is used to fill up the integrated circuit testing end; Described cushion block elevating mechanism is fixedly connected with fixed head with cushion block respectively.
4. integrated circuit testing multi-station positioning device according to claim 3 is characterized in that: described cushion block elevating mechanism comprises lift cylinder and up-down buffer stopper; Described lift cylinder is positioned at the rear side of fixed head and is fixedly connected with fixed head, is provided with cushion block guide pillar guide pin bushing between described cushion block and the fixed head; The lift cylinders bar of described lift cylinder passes fixed head and is fixedly connected with cushion block with through hole; Described lift cylinder is provided with back cylinder bar; Described up-down buffer stopper is fixedly connected with the back cylinder bar that goes up and down.
5. integrated circuit testing multi-station positioning device according to claim 3 is characterized in that: described elevating mechanism is first cylinder; Described first cylinder is fixedly connected with fixed head, is provided with the first guide pillar guide pin bushing between described cushion block and the fixed head; The first cylinder bar of described first cylinder passes fixed head and is fixedly connected with cushion block with through hole.
6. according to claim 2 or 3 or 4 or 5 described integrated circuit testing multi-station positioning devices, it is characterized in that: described gradation mechanism comprises test backing pin and the transition backing pin that header board, back plate, transiting rod, discharging backing pin, the backing pin of getting the raw materials ready, number equate with test contact; The trailing flank of described feeding track be provided with connect with chute feeder and with the back pin-and-hole of test backing pin with the backing pin coupling of getting the raw materials ready, the leading flank of feeding track is provided with the preceding pin-and-hole that connects with chute feeder and mate with transition backing pin and discharging backing pin; Described header board is positioned at the front side of feeding track, and back plate is between the rear side and fixed head of feeding track, and transiting rod passes through hole, and the two ends of transiting rod are fixedly connected with the back plate with header board respectively; The described backing pin of getting the raw materials ready, discharging backing pin and transition backing pin are arranged in order from top to bottom, and below and transition backing pin that the test backing pin is positioned at the transition backing pin are spaced; One end of described test backing pin is fixedly connected with the back plate respectively with an end of the backing pin of getting the raw materials ready, and the other end of test backing pin stretches into corresponding back pin-and-hole with the other end of the backing pin of getting the raw materials ready; One end of described transition backing pin is fixedly connected with header board respectively with an end of discharging backing pin, and the other end of the other end of transition backing pin and discharging backing pin stretches into corresponding preceding pin-and-hole respectively; Be provided with gradation guide pillar guide pin bushing between described back plate and the fixed head.
7. integrated circuit testing multi-station positioning device according to claim 6 is characterized in that: described gradation driving mechanism comprises gradation cylinder and gradation buffer stopper; The gradation cylinder is provided with cylinder bar behind the gradation; Described lift cylinder is positioned at the rear side of fixed head and is fixedly connected with fixed head; The gradation cylinder bar of described gradation cylinder passes fixed head and is fixedly connected with the back plate; The cylinder bar is fixedly connected behind described gradation buffer stopper and the gradation.
8. integrated circuit testing multi-station positioning device according to claim 6 is characterized in that: described gradation driving mechanism is second cylinder; Described second cylinder is fixedly connected with fixed head; The second cylinder bar of described second cylinder passes fixed head and is fixedly connected with the back plate.
9. according to claim 2 or 3 or 4 described integrated circuit testing multi-station positioning devices, it is characterized in that: described pushing mechanism comprises the preceding holder that back holder and number equate with test contact; Fixed seating, described back is side in the feeding track place of base plate, and the rear end of back holder is fixedly connected with base plate, and preceding holder is fixedly connected with the front end of back holder, and test contact is fixedly connected with the back holder; Described promotion driving mechanism comprises promotion cylinder and the pusher head that number equates with test contact; Described promotion cylinder is fixedly connected with preceding holder, and pusher head is fixedly connected with the promotion cylinder bar that promotes cylinder and is relative with test contact.
10. integrated circuit testing multi-station positioning device according to claim 8 is characterized in that: holder comprises fixed mount, slide block, cover plate and set screw before described; The front end face of described fixed mount is provided with the groove with the slide block coupling, and the dual-side of slide block is slidingly connected through the relative dual-side of guide rail and groove respectively; Described cover plate is fixedly connected with the front end of fixed mount, and set screw is passed cover plate and is threaded with slide block; Described promotion cylinder is fixedly connected with slide block.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201210074593.7A CN102636739B (en) | 2012-03-20 | 2012-03-20 | Multi-station positioning device for testing integrated circuits |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201210074593.7A CN102636739B (en) | 2012-03-20 | 2012-03-20 | Multi-station positioning device for testing integrated circuits |
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| Publication Number | Publication Date |
|---|---|
| CN102636739A true CN102636739A (en) | 2012-08-15 |
| CN102636739B CN102636739B (en) | 2014-08-13 |
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| Application Number | Title | Priority Date | Filing Date |
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| CN201210074593.7A Active CN102636739B (en) | 2012-03-20 | 2012-03-20 | Multi-station positioning device for testing integrated circuits |
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| CN (1) | CN102636739B (en) |
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| CN103091622A (en) * | 2013-01-18 | 2013-05-08 | 宁波三星电气股份有限公司 | Final circular test (FCT) multi-station test device |
| CN103630827A (en) * | 2013-11-27 | 2014-03-12 | 杭州友旺电子有限公司 | Automatic testing device for integrated circuit |
| CN104316793A (en) * | 2014-10-21 | 2015-01-28 | 江苏西欧电子有限公司 | Power frequency magnetic field multi-position measuring device |
| CN104502641A (en) * | 2014-12-31 | 2015-04-08 | 杭州友旺电子有限公司 | Automatic chip testing device |
| CN105251700A (en) * | 2015-09-28 | 2016-01-20 | 杭州长川科技股份有限公司 | Equal-distance adjusting mechanism for automatic separation equipment |
| CN106428838A (en) * | 2016-09-25 | 2017-02-22 | 东莞市联洲知识产权运营管理有限公司 | Separation device of integrated circuit board package packing line |
| CN108061829A (en) * | 2017-11-16 | 2018-05-22 | 浙江凯耀照明股份有限公司 | Band line drive test device and test method |
| CN113484734A (en) * | 2021-07-28 | 2021-10-08 | 王雪莲 | Digital integrated circuit test system |
| CN113655243A (en) * | 2021-07-16 | 2021-11-16 | 深圳市鑫信腾科技股份有限公司 | Multi-station test system |
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| CN103091622A (en) * | 2013-01-18 | 2013-05-08 | 宁波三星电气股份有限公司 | Final circular test (FCT) multi-station test device |
| CN103091622B (en) * | 2013-01-18 | 2015-09-30 | 宁波三星智能电气有限公司 | FCT multistation proving installation |
| CN103630827B (en) * | 2013-11-27 | 2016-07-06 | 杭州友旺电子有限公司 | Integrated circuit automatic testing device |
| CN103630827A (en) * | 2013-11-27 | 2014-03-12 | 杭州友旺电子有限公司 | Automatic testing device for integrated circuit |
| CN104316793A (en) * | 2014-10-21 | 2015-01-28 | 江苏西欧电子有限公司 | Power frequency magnetic field multi-position measuring device |
| CN104502641A (en) * | 2014-12-31 | 2015-04-08 | 杭州友旺电子有限公司 | Automatic chip testing device |
| CN104502641B (en) * | 2014-12-31 | 2018-11-02 | 杭州友旺电子有限公司 | Chip automatic testing equipment |
| CN105251700A (en) * | 2015-09-28 | 2016-01-20 | 杭州长川科技股份有限公司 | Equal-distance adjusting mechanism for automatic separation equipment |
| CN105251700B (en) * | 2015-09-28 | 2017-07-18 | 杭州长川科技股份有限公司 | The grade distance regulating mechanism of automatic separation equipment |
| CN106428838A (en) * | 2016-09-25 | 2017-02-22 | 东莞市联洲知识产权运营管理有限公司 | Separation device of integrated circuit board package packing line |
| CN106428838B (en) * | 2016-09-25 | 2020-01-31 | 协丰万佳科技(深圳)有限公司 | Separation device for integrated circuit board packaging line |
| CN108061829A (en) * | 2017-11-16 | 2018-05-22 | 浙江凯耀照明股份有限公司 | Band line drive test device and test method |
| CN108061829B (en) * | 2017-11-16 | 2020-01-14 | 浙江凯耀照明股份有限公司 | Testing device and testing method for strip line driver |
| CN113655243A (en) * | 2021-07-16 | 2021-11-16 | 深圳市鑫信腾科技股份有限公司 | Multi-station test system |
| CN113484734A (en) * | 2021-07-28 | 2021-10-08 | 王雪莲 | Digital integrated circuit test system |
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