CN104502641B - Chip automatic testing equipment - Google Patents
Chip automatic testing equipment Download PDFInfo
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- CN104502641B CN104502641B CN201410849984.0A CN201410849984A CN104502641B CN 104502641 B CN104502641 B CN 104502641B CN 201410849984 A CN201410849984 A CN 201410849984A CN 104502641 B CN104502641 B CN 104502641B
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Abstract
The present invention relates to a kind of chip automatic testing equipment, including test section, the test section includes test bottom rail, test rail drive cap, test barrier structure, test hold-down mechanism and the golden finger for test, and the test bottom rail and test rail drive cap have two positions：Transmission location and test position, in the transmission location, the test section track is for receiving the chip；The test bottom rail and test rail drive cap can be moved to test position under the action of the test hold-down mechanism from transmission location, and in the test position, the golden finger completes the automatic test to the chip.Chip automatic testing equipment provided by the invention, using pressure survey mode, golden finger test bench is fixed on the panel of lower section golden finger part of detecting, passes through top briquetting cylinder movement so that the positioning of chip is more accurate, and is not easy to get stuck.
Description
Technical field
The present invention relates to a kind of apparatus for testing chip more particularly to a kind of chip automatic testing equipments.
Background technology
Semiconductor integrated circuit with extensively, is especially in the growth stage at home in the world at present, is to pull market hair
The major impetus of exhibition, then test stepping technology is particularly important automatically.Current automatic testing equipment is mainly by stopping
Block blocks chip, golden finger clamping test.And the positioning of existing test device chips test position is not accurate enough, positions
Journey is not smooth enough；Chip also only falls by its own gravity in track, and the period is too long, and efficiency is too low.
Invention content
In view of this, the purpose of the present invention is to provide a kind of chip automatic testing equipment, to solve to deposit in the prior art
In above-mentioned at least one technical problem.
Chip automatic testing equipment provided by the invention, including test section, the test section include test bottom rail, test rail
Drive cap, test barrier structure, test hold-down mechanism and the golden finger for test, in the test bottom rail and test rail drive cap phase
To surface on be formed with test section track, the test barrier structure by the chip positioning in the test section track,
The test bottom rail and test rail drive cap have two positions：Transmission location and test position, in the transmission location, the survey
Examination area's track is for receiving the chip；The test bottom rail and test rail drive cap can under the action of the test hold-down mechanism
It is moved to test position from transmission location, in the test position, the golden finger completes the automatic test to the chip.
Preferably, further include upper working area and lower working area, chip to be tested is from top to bottom in its own gravity
Under pass through the upper working area, test section and lower working area successively, the chip waits in the upper working area enters test section,
Automatic testing process is completed in test section, the chip for completing test enters the waiting of lower working area into next process.
Preferably, the upper working area includes bottom rail and upper temporary rail cover on test section；Bottom rail is solid on the test section
It is scheduled on the test section bottom plate, is formed with upper temporary track between bottom rail and upper temporary rail cover on the test section,
The transmission location, the test section track and upper temporary track are connected to each other.
Preferably, the upper working area further includes blowing structure, and the blowing structure includes being arranged in upper temporary rail cover
On gas hole and air blower, the outer end of the gas hole is connected with the air blower, inner end and the upper temporary track phase
Connection
Preferably, the gas hole is obliquely installed on the upper temporary rail cover.
Preferably, multiple support shafts, the support shaft and the test section bottom plate are provided on the test section bottom plate
Surface be vertically arranged, covered in the test bottom rail, test tracks and be provided with through-hole corresponding with the support shaft, institute
The through-hole that support shaft passes through the test bottom rail and test rail drive cap is stated, thus can edge by the test bottom rail and test rail drive cap
The inside and outside mode slided of the support shaft is fixed in the support shaft, in transmission location, the test bottom rail and test tracks
It covers and is moved axially adjacent to the direction of test section bottom plate along the support under the action of test hold-down mechanism, to reach
The test position.
Preferably, the test barrier structure includes stopper, and the stopper includes stop flat.
Preferably, the test hold-down mechanism includes test briquetting and briquetting driving structure, the test briquetting with it is described
Briquetting driving structure is fixedly connected, and the test briquetting can be under the action of the briquetting driving structure to close or separate
It is moved on the direction of the test rail drive cap.
Preferably, the briquetting driving structure is cylinder or motor.
Preferably, when the briquetting driving structure is cylinder, the test hold-down mechanism further includes cylinder fixing structure,
The cylinder fixing structure includes cylinder fixed block and cylinder secured adjusted block, and the cylinder fixed block is relative to the test section
Bottom plate position is fixed, and the cylinder secured adjusted block is fixed in the cylinder fixed block, and can be fixed relative to the cylinder
Block moves on the direction close to or far from the test rail drive cap, and the cylinder is fixed on the cylinder secured adjusted block,
It, can be under the action of the cylinder on the free end for the piston rod that the test briquetting is fixedly connected on the briquetting cylinder
It is moved on the direction of the test rail drive cap.
Preferably, the test briquetting includes pressing part and positioning region, and the thickness of the pressing part is less than the positioning region
Thickness, to the pressing part and positioning region junction formed boss, covered and the compacting in the test tracks
The corresponding position in portion is formed with through-hole, and the pressing part is inserted into the through-hole, and the boss can be resisted against the test tracks
On the surface of lid.
Preferably, the width of the positioning region is slightly larger than the width of the test rail drive cap, the test rail drive cap and survey
The width for trying the gap between bottom rail is slightly larger than the width of the chip.
Preferably, the lower working area includes bottom rail and lower temporary rail cover under test section；Bottom rail is solid under the test section
It is scheduled on the test section bottom plate, is formed with lower temporary track between bottom rail and lower temporary rail cover under the test section,
The transmission location, the test section track and lower temporary track are connected to each other.
Preferably, certain angle α is formed between the direction that the test section track extends and horizontal plane, the angle
40°<α<90°
In chip automatic testing equipment provided by the invention, test bottom rail moves simultaneously with test rail drive cap, can be more convenient
Ground makes blocking act, and the entrance test mode that chip can be made to stablize；Ensure to make pressing structure become while stable testing
It obtains simple and effective；Using keeping in up and down, tracheae air blowing effect is added during chip motion, reduces entire test period；Golden hand
Refer to part of detecting using pressure survey mode, golden finger test bench is fixed on the panel of lower section, passes through top briquetting cylinder movement, briquetting
It is depressed into test rail drive cap, entire test tracks and rail cover push simultaneously, so that chip is slid into golden finger test bench and are tested, core
Piece accurate positioning；Stop portions are stopped using plane, are got out of the way chip burr part, are conducive to the more stable chip that stops, side
Just it is tested.
Description of the drawings
By referring to the drawings to the description of the embodiment of the present invention, above-mentioned and other purposes of the invention, feature and
Advantage will be apparent from, in the accompanying drawings：
Fig. 1 is the overall structure diagram of the chip automatic testing equipment of the present invention；
Fig. 2 is the schematic elevation view of the chip automatic testing equipment of the present invention；
Fig. 3 is the A-A sectional views in Fig. 2；
Fig. 4 is the B-B sectional views in Fig. 2；
Fig. 5 is the schematic diagram of the test barrier structure in the present invention；
Fig. 6 is the schematic diagram of the test hold-down mechanism in the present invention；
Fig. 7 is the K direction views in Fig. 6；
Fig. 8 is the portions A enlarged drawing in Fig. 4；
Fig. 9 is the portions B enlarged drawing in Fig. 4；
Figure 10 is the usage state diagram of the chip automatic testing equipment of the present invention.
Specific implementation mode
Hereinafter reference will be made to the drawings is more fully described various embodiments of the present invention.In various figures, identical element
It is indicated using same or similar reference numeral.For the sake of clarity, the various pieces in attached drawing are not necessarily to scale.
Illustrate, in the application, upper and lower directions shown in FIG. 1 is short transverse, and left and right directions is width direction, front-rear direction
For thickness direction.
As shown in Figure 1, the chip automatic testing equipment of the present invention includes two p-wires disposed in parallel, two p-wires
Chip can be tested automatically simultaneously.Every p-wire including test section bottom plate 100 and is located at the test section bottom plate 100
On upper working area 1, test section 2 and lower working area 3.Chip to be tested passes through under its own gravity successively from top to bottom
The upper working area 1, test section 2 and lower working area 3 are crossed, is waited in the upper working area 1 and enters test section 2, it is complete in test section 2
At automatic testing process, the chip for completing test enters the waiting of lower working area 3 into next process.
As shown in Figure 1, Figure 3, the upper working area 1 includes bottom rail 11, upper temporary rail cover 12, upper temporary gas on test section
Cylinder 13 and upper temporary blocking 14.Bottom rail 11 is fixed on the test section bottom plate 100 on the test section, on the test section
Vertically extending groove 111 is formed on the surface of bottom rail 11, the upper temporary rail cover 12 is arranged on the test section
Bottom rail 11 is arranged on fluted 111 surface, the also shape on 12 surface opposite with the groove 111 of upper temporary rail cover
At fluted 121, the groove 111 and groove 121 collectively form for chip by upper temporary track 122.In other reality
It applies in example, groove 111 and groove 121 are entirely formed on test section in bottom rail 11 or are entirely formed in temporary rail cover 12
On, the relevant surfaces of another component opposite with groove are plane.The upper setting of temporary cylinder 13 is described temporary
On rail cover 12, the upper temporary blocking 14 is connected with the free end of the upper temporary cylinder 13, the upper temporary blocking 14
One end passes through the upper temporary rail cover 12 along the direction vertical with the upper temporary rail cover 12, and can along with it is described temporary
Inside and outside sliding on the vertical direction of rail cover 12 so that the respective end of the upper temporary blocking 14 is inserted into or far from institute
Temporary track 122 is stated, to which the chip by the upper temporary track 122 is stopped or be let pass.It is described temporary
Cylinder 13 is used to drive the inside and outside sliding of the upper temporary blocking 14.Preferably, in order to promote the chip in upper temporary track
Sliding in 122, is provided with blowing structure 15 on the upper temporary rail cover 12, and the blowing structure includes setting upper temporary
The gas hole 151 and air blower (not shown) on rail cover 12 are deposited, gas hole 151 is in upper 12 updip of temporary rail cover
Tiltedly setting, outer end are connected with the air blower, and inner end is connected with the upper temporary track 122, what air blower generated
Air-flow is entered by gas hole 151 in the upper temporary track 122, and sliding of the chip in upper temporary track 122 is can speed up.
Picture 1-4, shown in 8-9, the test section 2 includes test bottom rail 21, test rail drive cap 22, test barrier structure
23, hold-down mechanism 24 and the golden finger 25 for test are tested.The side of the test section bottom plate 100 is provided with multiple supports
Axis 101, the support shaft 101 and the surface of the test section bottom plate 100 are vertically arranged.In the test bottom rail 21, test
Through-hole corresponding with the support shaft 101 is provided on rail cover 22, the support shaft 101 passes through 21 He of test bottom rail
The through-hole of test rail drive cap 22, to which the test bottom rail 21 and test rail drive cap 22 can be slided inside and outside the support shaft 101
Dynamic mode is fixed in the support shaft.The golden finger 25 is fixed on the test section bottom plate 100, is located at the test
The side opposite with the test rail drive cap 22 of bottom rail 21, the test surfaces of the golden finger 25, which are in, faces the test bottom rail
21 side.The golden finger 25 include guide post 251 and test pin 252, the guide post 251 have it is multiple, be located at the test
The both sides up and down of bottom rail 21, the test bottom rail 21 and the test rail drive cap 22 are in 251 phase of guide post with the golden finger 25
The height of corresponding part is less than the distance of the guide post 251 in the up-down direction, in this way, in the test bottom rail 21 and test
When rail cover 22 moves under the action of testing hold-down mechanism to the direction of the close golden finger 25,21 He of test bottom rail
The test rail drive cap 22 can be moved down in leading for the guide post 251, to be located at the test bottom rail 21 and the survey
Chip between examination rail cover 22 can also be moved along the guide post 251 so that the pin of the chip finally with the golden hand
The test pin of finger is in contact.It is formed with and upper temporary rail on the opposite surface of the test bottom rail 21 and test rail drive cap 22
122 corresponding test section track 222 of road.The test bottom rail 21 and test rail drive cap 22 have two along the support shaft 101
A position, one is the transmission location far from the test section bottom plate 100, in the position, the test section track 222 with it is described
Upper temporary track 122 is connected to each other so that the chip being located in the upper temporary track 122 under the effect of gravity can be suitable
Profit enters in the test section track 222, and is located in the test section track under the action of test barrier structure 23
In 222；Another is proximate to the test position (position shown in attached drawing 3) of the test section bottom plate 100, in transmission location,
The test bottom rail 21 and test rail drive cap 22 under the action of test hold-down mechanism 24 along the support shaft 101 to by
The direction movement of nearly test section bottom plate 100, to reach the test position, in the position, chip reaches the golden finger 25
On test zone, chip is tested automatically by golden finger 25.
Preferably, it is respectively arranged with test bottom rail limited block under bottom rail 11 and test section in bottom rail 31 on the test section
102, for being positioned to the transmission location for testing bottom rail 21.
As shown in figure 5, the test barrier structure 23 includes stopper 231, countercheck rod 232, blocking driving lever 233, blocking
Fixed block 234 and stop cylinder 235.Boss 2321 is provided on the countercheck rod 232.The stopper 231 is connected to institute
Countercheck rod 232 is stated close to the end of the side of the test rail drive cap 22, the stopper includes stop flat 2311.The resistance
Gear fixed block 234 is fixed on the test rail drive cap 22, and the cylinder barrel or piston of the stop cylinder 235 are fixed on the blocking
On fixed block 234, the centre position of the blocking driving lever 233 is fixed on by hinged shaft 236 on blocking fixed block 234, the resistance
The one end for keeping off driving lever 233 is opposite with the free end of the piston of the stop cylinder 235 or cylinder barrel, and the other end is provided with through-hole (figure
In be not shown), which is set on the countercheck rod 232, be located at boss 2321 close to the side of test rail drive cap 22.It is preferred that
Ground is provided with spring (not shown) in the countercheck rod 232 and the junction of blocking fixed block 234, which is stopping
When cylinder 235 is in non-applied state, the blocking driving lever 233 is pushed, is at close to the test rail drive cap 22
The position in direction so that the end of the stopper 231 is located in the test section track 222, and the end of stopper 231 can
Stop the lower edge of chip, at this point, the test barrier structure 23 is in blocked state, chip cannot be in the test section rail
Sliding in road 222；When stop cylinder 235 acts on, the blocking group is pressed against in the piston of stop cylinder 235 or the free end of cylinder barrel
End of the bar 233 far from the countercheck rod 232 so that countercheck rod 232 and the boss 2321 against one end to far from described
The boss 2321 is pressed against in the direction of test rail drive cap 22, so that the countercheck rod 232 and stopper 231 are to far from institute
The direction movement of test rail drive cap 22 is stated, the test section track 222 is left in the end of the stopper 232, at this point, the survey
Examination barrier structure 23 is in non-blocking state, working area 3 under chip can enter under its own gravity.Preferably, it is
So that blocking driving lever 233 is operated steadily, is provided with bias spring (not shown), the bullet of the bias spring at hinged shaft 236
Power is far smaller than the elastic force for being located at the countercheck rod 232 and the spring for the junction for stopping fixed block 234, does not interfere with countercheck rod
232 normal operation process.
As shown in fig. 6, the test hold-down mechanism 24 includes test briquetting 241, briquetting cylinder 242 and cylinder fixing structure
243.The cylinder fixing structure 243 includes cylinder fixed block 2431 and cylinder secured adjusted block 2432, the cylinder fixed block
2431 fix relative to 100 position of test section bottom plate, and the cylinder secured adjusted block 2432 is fixed on the cylinder and fixes
On block 2431, and it can be moved up close to or far from 22 direction of test rail drive cap relative to the cylinder fixed block 2431
Dynamic, the briquetting cylinder 242 is fixed on the cylinder secured adjusted block 2432, so as to adjust 242 phase of briquetting cylinder
For the distance of the test rail drive cap 22.The test briquetting 241 is fixedly connected on the piston rod of the briquetting cylinder 242
It, can be under the action of briquetting cylinder 242 to direction close or far from the test rail drive cap 22 on free end
Upper movement.
The test briquetting 241 includes pressing part 2411 and positioning region 2412, and the thickness h of the pressing part 2411 is less than institute
The thickness H of positioning region 2412 is stated, to form boss 2413 (as schemed in the junction of the pressing part 2411 and positioning region 2412
Shown in 7).Position corresponding with the pressing part 2411 is formed with through-hole 223, the pressing part on the test rail drive cap 22
2411 are inserted into the through-hole 223 so that the free end of the pressing part 2411 can abut directly against on chip.The positioning
The height H in portion 2412 is slightly larger than the height of the through-hole 223.When chip enters in test section track 222, in test barrier structure
When stopping in a state to be tested in the test section track 222 under the action of 23, the briquetting cylinder 242 is in control device
It bringing into operation under control, the piston rod of cylinder 242 drives test briquetting 241 to be moved on the direction of the golden finger 25,
The boss 2413 is resisted against on the surface of the test rail drive cap 22, drives the test rail drive cap 22, chip and test bottom
Rail 21 is moved along the support shaft 101 to close to the direction of golden finger 25 together.
As Figure 8-9, the width W of the positioning region 2412 slightly larger than the test rail drive cap 22 width w1, it is described
The width in the gap between test rail drive cap 22 and test bottom rail 21 is slightly larger than the width of the chip.When the test rail drive cap
22, when chip and test bottom rail 21 move under the action of the pressing structure 24 to the direction where golden finger 25, the core
(as shown in Figure 8) is not touched in two surfaces of piece by pressure, with test rail drive cap 22, chip and the further shifting for testing bottom rail 21
Dynamic, the pin of the chip is in contact with the test pin of the golden finger 25, at this time test of the chip in golden finger 25
No longer moved under the action of pin, the test briquetting 241 drive the test rail drive cap 22 and test bottom rail 21 continue to by
The direction movement of nearly golden finger 25, finally so that the end face of the free end of the positioning region 2412 is resisted against the left side of the chip
On surface (as shown in Fig. 9).At this point, the chip-side is offseted by the test pin of its chip pin and golden finger 25
It connects, other side is abutted against by the end of its side surface and the positioning region 2412, so that the chip is by described fixed
Position portion 2412 and golden finger 25 position, in this way, chip is located at best test position, are surveyed to the chip by golden finger 25
When examination, chip can be clamped rigidly positioning.
As shown in Figure 1, Figure 3, the lower working area 3 includes bottom rail 31, lower temporary rail cover 32, lower temporary gas under test section
Cylinder 33 and lower temporary blocking 34.Bottom rail 31 is fixed on the test section bottom plate 100 under the test section, under the test section
Vertically extending groove is formed on the surface of bottom rail 31, bottom rail is arranged under the test section in the lower temporary rail cover 32
On the 31 reeded surfaces of setting, it is also formed with groove on 32 surface opposite with the groove of lower temporary rail cover,
Two grooves collectively form for chip by lower temporary track 322.In a further embodiment, two are entirely formed in test
It in bottom rail 31 or is entirely formed on lower temporary rail cover 32, the relevant surfaces of another component opposite with groove under area
For plane.The lower temporary cylinder 33 and lower temporary blocking 34 are arranged on the lower temporary rail cover 32, the lower temporary resistance
Gear 34 one end along the direction vertical with the lower temporary rail cover 32 pass through the lower temporary rail cover 32, and can along with it is described
Inside and outside sliding on the vertical direction of temporary rail cover 32 down so that it is described it is lower it is temporary blocking 34 respective end be inserted into or
Far from the track 322, to which the chip by the lower temporary track 322 is stopped or be let pass.It is described lower temporary
Blocking 34 is connected with lower temporary cylinder 33, and the lower temporary cylinder 33 is used to drive the inside and outside cunning of the lower temporary blocking 34
It is dynamic.
As shown in Figure 10, the present invention in chip automatic testing equipment when in use, along the upper working area 1, test section 2
Certain angle α is formed between the direction and horizontal plane of the lower extension of working area 3,40 ° of the angle<α<90 °, in this way, the core
Piece when slide downward under gravity, can paste in upper temporary track 122, test section track 222 and lower temporary track 322
The upper surface of bottom rail 31 under the nearly upper bottom rail 11, test bottom rail 21 and test section so that the sliding of chip is more unobstructed.
Finally it should be noted that：Obviously, the above embodiment is merely an example for clearly illustrating the present invention, and simultaneously
The non-restriction to embodiment.For those of ordinary skill in the art, it can also do on the basis of the above description
Go out other various forms of variations or variation.There is no necessity and possibility to exhaust all the enbodiments.And thus drawn
The obvious changes or variations that Shen goes out are still in the protection scope of this invention.
Claims (14)
1. a kind of chip automatic testing equipment, which is characterized in that include the test section on the bottom plate of test section, the test section
Including test bottom rail, test rail drive cap, test barrier structure, test hold-down mechanism and for the golden finger of test, in the survey
It is formed with test section track in examination bottom rail and the opposite surface of test rail drive cap, the test barrier structure is by the chip positioning
In the test section track,
It is provided with multiple support shafts on the test section bottom plate, the surface of the support shaft and the test section bottom plate is vertically
It is arranged, there are two positions for support shaft tool described in the test bottom rail and test tracks cover rim：Transmission location and test position, in institute
Transmission location is stated, the test section track is for receiving the chip；The test bottom rail and test rail drive cap are in the test
The survey that test position makes the pin and the golden finger of the chip can be moved under the action of hold-down mechanism from transmission location
Test tube foot is in contact, and in the test position, the golden finger completes the automatic test to the chip.
2. chip automatic testing equipment according to claim 1, which is characterized in that further include upper working area and lower temporary
Area, chip to be tested is from top to bottom successively by the upper working area, test section and lower temporary under its own gravity
Area, the chip waits in the upper working area enters test section, completes automatic testing process in test section, completes the core of test
Piece enters lower working area and waits for into next process.
3. chip automatic testing equipment according to claim 2, which is characterized in that the upper working area includes on test section
Bottom rail and upper temporary rail cover；Bottom rail is fixed on the test section bottom plate on the test section, the bottom rail on the test section
It is formed with temporary track between upper temporary rail cover, in the transmission location, the test section track and upper temporary track
It is connected to each other.
4. chip automatic testing equipment according to claim 3, which is characterized in that the upper working area further includes knot of blowing
Structure, the blowing structure include the gas hole and air blower being arranged on upper temporary rail cover, the outer end of the gas hole and institute
It states air blower to be connected, inner end is connected with the upper temporary track.
5. chip automatic testing equipment according to claim 4, which is characterized in that the gas hole is in the upper temporary rail
It is obliquely installed on drive cap.
6. chip automatic testing equipment according to claim 1, which is characterized in that in the test bottom rail, test tracks
It covers and is provided with through-hole corresponding with the support shaft, the support shaft passes through the logical of the test bottom rail and test rail drive cap
Hole, to which the mode that can slide the test bottom rail and test rail drive cap inside and outside the support shaft is fixed on the support shaft
On, in transmission location, the test bottom rail and test rail drive cap are under the action of the test hold-down mechanism along the support
Axially adjacent to the direction movement of test section bottom plate, to reach the test position.
7. chip automatic testing equipment according to claim 1, which is characterized in that the test barrier structure includes blocking
Block, the stopper include stop flat.
8. chip automatic testing equipment according to claim 2, which is characterized in that the test hold-down mechanism includes test
Briquetting and briquetting driving structure, the test briquetting are fixedly connected with the briquetting driving structure, and the test briquetting can be
It is moved on the direction of the test rail drive cap under the action of the briquetting driving structure.
9. chip automatic testing equipment according to claim 8, which is characterized in that the briquetting driving structure be cylinder or
Motor.
10. chip automatic testing equipment according to claim 9, which is characterized in that when the briquetting driving structure is gas
When cylinder, the test hold-down mechanism further includes cylinder fixing structure, and the cylinder fixing structure includes cylinder fixed block and cylinder
Secured adjusted block, the cylinder fixed block are fixed relative to test section bottom plate position, and the cylinder secured adjusted block is fixed
In the cylinder fixed block, and can be relative to the cylinder fixed block in direction close or far from the test rail drive cap
Upper movement, the cylinder are fixed on the cylinder secured adjusted block, and the test briquetting is fixedly connected on the briquetting cylinder
The free end of piston rod can move up under the action of the cylinder to the direction close to or far from the test rail drive cap
It is dynamic.
11. chip automatic testing equipment according to claim 10, which is characterized in that the test briquetting includes pressing part
And positioning region, the thickness of the pressing part is less than the thickness of the positioning region, in the connection of the pressing part and positioning region
Place forms boss, and covering position corresponding with the pressing part in the test tracks is formed with through-hole, and the pressing part is inserted into
In the through-hole, the boss can be resisted against on the surface of the test rail drive cap.
12. chip automatic testing equipment according to claim 11, which is characterized in that the width of the positioning region is slightly larger than
The width of the test rail drive cap, the width in the gap between the test rail drive cap and test bottom rail is slightly larger than the chip
Width.
13. chip automatic testing equipment according to claim 10, which is characterized in that the lower working area includes test section
Lower bottom rail and lower temporary rail cover；Bottom rail is fixed on the test section bottom plate under the test section, is gone to the bottom in the test section
Lower temporary track is formed between rail and lower temporary rail cover, in the transmission location, the test section track and lower temporary rail
Road is connected to each other.
14. according to claim 1-13 any one of them chip automatic testing equipments, which is characterized in that along the test section rail
Certain angle α is formed between the direction that road extends and horizontal plane, 40 ° of the angle<α<90°.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201410849984.0A CN104502641B (en) | 2014-12-31 | 2014-12-31 | Chip automatic testing equipment |
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| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201410849984.0A CN104502641B (en) | 2014-12-31 | 2014-12-31 | Chip automatic testing equipment |
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| CN104502641A CN104502641A (en) | 2015-04-08 |
| CN104502641B true CN104502641B (en) | 2018-11-02 |
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Families Citing this family (4)
| Publication number | Priority date | Publication date | Assignee | Title |
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| CN106391512B (en) * | 2016-08-29 | 2020-09-04 | 福州派利德电子科技有限公司 | SOT appearance integrated circuit chip test sorting unit |
| CN106933257B (en) * | 2017-03-15 | 2023-10-13 | 广西中科阿尔法科技有限公司 | Positioning mechanism of chip intelligent inspection machine |
| CN109531473B (en) * | 2019-01-07 | 2024-07-30 | 昆山金蚂蚁精密机械有限公司 | Automatic clamping device for IC chip test |
| CN117347814B (en) * | 2023-11-22 | 2024-04-02 | 广东歌得智能装备有限公司 | High-temperature test structure of semiconductor device and gravity type normal temperature and high temperature tester |
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