CN101082631A

CN101082631A - IC detecting machine capable of simultaneously multiple parallel built-in testing

Info

Publication number: CN101082631A
Application number: CN 200610083642
Authority: CN
Inventors: 杨家彰
Original assignee: HON TECHNOLOGIES Inc
Current assignee: HON TECHNOLOGIES Inc; HNI Technologies Inc
Priority date: 2006-05-31
Filing date: 2006-05-31
Publication date: 2007-12-05
Anticipated expiration: 2026-05-31
Also published as: CN101082631B

Abstract

The invention discloses an IC feeler mechanism to do multiple paralleling particle placements simultaneously, which comprises the following parts: material supplying box, material-receiving box, input end IC transmitting mechanism, output end IC transmitting mechanism, testing part, transmitting tool and orbit transmitting mechanism, wherein the input end IC transmitting mechanism sucks the detected IC on the material supplying box to the transmitting tool to bear multiple particles of the detected IC; the transmitting tool utilizes orbit transmitting mechanism to transmit the transmitting tool into the testing part through orbit, which testes multiple particles of IC to move out the transmitting tool after testing; the output end IC transmitting mechanism classifies each tested IC in the transmitting tool to place in each receiving box. The invention reduces the exchanging, placing and depositing time of IC greatly, which improves the testing property effectively.

Description

The IC machines of many parallel built-in testings simultaneously

Technical field

The present invention relates to a kind of IC machines, particularly relate to a kind of utilization and carry the IC machines that tool is transplanted on many IC many parallel built-in testings of testing at the test port simultaneously simultaneously.

Background technology

Science and technology is under constantly researching and developing and innovating now, in the past must be by many large-scale electronic circuits in conjunction with the work that just can finish fully by integrated circuit (integrated circuit, abbreviation IC) replaces, because IC is the job sequence through multiple tracks in process of production, therefore in order to ensure product quality, businessman is after IC completes, all can carry out the electric circuit inspection operation, to detect IC in manufacturing process, whether suffer damage, and then detect defective products.

See also Fig. 1, it is to be previous No. 91210786 " conveyer of IC machines " the patent case of TaiWan, China patented claim of the applicant, but described machines is to arrange the feed frame 21 and rewinding frame 22 that several automatic lifting are set in board 20 front sides, the rear side of board 20 then is provided with the monitor station 23 that array is equiped with test board, is provided with at confession, rewinding

frame

21,22 and 23 of monitor stations to comprise left cantilever fetching device 24, right cantilever fetching device 25 and transshipment acitivity 26; When IC carries out test jobs, be single IC to be measured to be transplanted on transshipment acitivity 26 with left cantilever fetching device 24, after the mode that transshipment acitivity 26 passes through with the tunnel moves to rear side, then by right cantilever fetching device 25 IC being transplanted on monitor station 23 detects operation, after finishing detection, right cantilever fetching device 25 is transplanted on transshipment acitivity 26 with single intact survey IC again, by transshipment acitivity 26 front side is got back in the IC handover, the multiple IC that will finish survey by left cantilever fetching device 24 takes out and according to testing result, IC is transferred and be categorized into each rewinding frame 22, and finish the detection operation of IC.

See also Fig. 2, the described top of respectively organizing monitor station 23 is that correspondence is provided with compression joint mechanism 27 respectively, described compression joint mechanism 27 has one and can be driven the down-pressed pole 271 of lifting and be pressed down tool 272 by drive source, behind IC test bench 231 of not inserting at each monitor station 23, described down-pressed pole 271 will descend to making and press down the surface that tool 272 is pressed against IC, so that IC guarantees to touch the contact of test bench 231, with the operation that detects smoothly.

Because above-mentioned IC detects operation, all be that each IC to be measured is transplanted on transshipment acitivity 26 earlier by left cantilever fetching device 24, to be transplanted on monitor station 23 at the IC on the transshipment acitivity 26 by right cantilever fetching device 25 again and detect operation, making to transport needs in the process to pick and place the dislocation program through the exchange of twice, and expend the too much exchange dislocation time, relative, the IC after intact the survey transports also need pick and place the dislocation program through the exchange of twice, causes whole transporting to expend the too much time; Moreover, each test bench 231 of organizing monitor station 23 is once only to provide single IC to test, even if six groups of monitor stations 23 are set, also only can be simultaneously to six IC tests, therefore the tested productivity that can carry out is quite limited, if the required test duration of each IC, the production capacity that whole machines can be reached was limited especially when longer, and was not enough to deal with the demand of present high production capacity.

In view of this, the inventor then is engaged in the research and development and the making experience of relevant industries for many years with it, at the present problem further investigation that faces, through the research of long-term endeavour with study, grind eventually to create and a kind ofly can effectively reduce the time that IC exchange picks and places dislocation and test, and make machines effectively promote the production capacity of test, significantly to improve the scarce fraud of habit formula, this is design aim of the present invention.

Summary of the invention

Fundamental purpose of the present invention provides a kind of IC machines of many parallel built-in testings simultaneously, it is with input end IC conveying mechanism the IC to be measured on the feed casket to be displaced in the mode of one or many to carry tool, carry the IC to be measured that is fully loaded with many of bearings on the tool simultaneously and make, the described tool that carries is transplanted directly on it in test port with the track connecting gear again, and many IC to be measured that will be carried on the tool by the press mechanism in the test port press down simultaneously, so that each IC guarantees to touch each test bench contact of test board, and carry out the test jobs of many IC simultaneously, and after finishing test jobs, utilize the track connecting gear will carry tool and shift out the test port, again with output terminal IC conveying mechanism according to test result, classify and pick and place in each rewinding casket carrying in the tool each intact IC that surveys; So, the tool that carries that utilization will be fully loaded with many IC to be measured of bearing is transplanted directly in the test port, not only can significantly reduce the time that the IC exchange picks and places dislocation, and many IC that will carry on the tool test simultaneously, also can effectively reduce the time of IC test, and then make machines effectively promote the production capacity of test.

Another object of the present invention provides a kind of IC machines of many parallel built-in testings simultaneously, described carrying on the tool is to arrange to be provided with most bearing seats, to supply many IC of bearing respectively, then be provided with a plurality of test benches on the test board in the test port, be pressed into test for the IC to be measured that carries on the tool many, wherein said each bearing seat that carries on the tool is to offer through hole, and set up support frame with elastic component in all sides of through hole, and with described support frame bearing IC, press down when compressing IC at press mechanism, can utilize the elastic compression of elastic component and IC is descended, and after decline, make the IC pin touch each test bench contact of test board, to carry out test jobs, after finishing test and press mechanism being climbed away compress IC, the elastic stretch of elastic component will make IC rise and break away from each test bench, then carry tool and can shift out test port with the track connecting gear again, to finish test jobs, and then many side IC that treats can be carried out test jobs simultaneously, with the time of effective reduction IC test.

Another purpose of the present invention provides a kind of IC machines of many parallel built-in testings simultaneously, it is can distribute to mount on the track connecting gear to have at least first to carry tool, second carries tool and the 3rd carries tool, when first carries tool and carries out test jobs, second carries tool can be transplanted on material feeding region, for input end IC conveying mechanism the IC to be measured on the feed casket is displaced to second and carries tool, the 3rd carries tool then rests on discharge zone in the mode of empty boxes, when first carries tool and finishes test jobs and transfer out test port to discharge zone, first carries on the tool each intact IC that surveys classifies with output terminal IC conveying mechanism and picks and places in each rewinding casket, second IC to be measured that carries on the tool fully loaded bearing then is transplanted on test port and carries out test jobs, the 3rd carries tool then is transplanted on material placing area, for input end IC conveying mechanism the IC to be measured on the feed casket is displaced to the 3rd and carries tool, and then recycle with many groups the tool that carries, can make full use of the collocation of sequential, test the stand-by time of port when IC exchanges dislocation to reduce, and then make machines effectively promote the production capacity of test.

For achieving the above object, the technical solution used in the present invention is:

A kind of IC machines of many parallel built-in testings simultaneously, it is characterized in that: it mainly includes:

At least one feed casket: bearing has a plurality of IC to be measured;

At least one rewinding casket: for the intact IC that surveys of bearing;

At least one test port: be to be equiped with to link the test board of test signal, on the described test board and be provided with and supply IC to be measured to insert a plurality of test benches with the test jobs that carries out IC to central controller;

Track connecting gear: be all sides that are erected at the test port;

At least one tool that carries: be bearing on the track connecting gear, and can be transplanted on each operation post by the track connecting gear, carrying out pan feeding, test and discharging operation, describedly carry tool and arrange a plurality of bearing seats that are provided with many IC of bearing simultaneously;

At least one IC conveying mechanism: be to be provided with to do multi-direction displacement and can and carry between the tool head that picks and places of drawing dislocation IC at feed casket, rewinding casket.

The advantage that the present invention of employing technique scheme has is:

The tool that carries that utilization of the present invention will be fully loaded with many IC to be measured of bearing is transplanted directly in the test port, not only can significantly reduce the time that the IC exchange picks and places dislocation, and many IC that will carry on the tool test simultaneously, also can effectively reduce the time of IC test, and many groups carry recycling of tool, can make full use of the collocation of sequential, test the stand-by time of port when IC exchanges dislocation to reduce, and then make machines effectively promote the production capacity of test.

Description of drawings

Fig. 1 is for practising the configuration schematic diagram of formula IC machines;

Fig. 2 is the monitor station of practising formula IC machines and the configuration schematic diagram of compression joint mechanism;

Fig. 3 is the Organization Chart of overlooking of the present invention;

Fig. 4 is a configuration schematic diagram of the present invention;

Fig. 5 is the schematic appearance that tool is carried in the present invention;

Fig. 6 is the diagrammatic cross-section that tool is carried in the present invention;

Fig. 7 is the schematic appearance of test board of the present invention;

Fig. 8 is an action synoptic diagram of the present invention ();

Fig. 9 is an action synoptic diagram of the present invention (two);

Figure 10 is an action synoptic diagram of the present invention (three);

Figure 11 is an action synoptic diagram of the present invention (four);

Figure 12 is that the action synoptic diagram () of tool in the test port carried in the present invention;

Figure 13 is that the action synoptic diagram (two) of tool in the test port carried in the present invention;

Figure 14 is that another embodiment that tool is carried in the present invention moves synoptic diagram ();

Figure 15 is that another embodiment that tool is carried in the present invention moves synoptic diagram (two).

Description of reference numerals: 20-board; The 21-feed frame; 22-rewinding frame; The 23-monitor station; The 231-test bench; 24-left side cantilever fetching device; The right cantilever fetching device of 25-; The 26-transshipment acitivity; The 27-compression joint mechanism; The 271-down-pressed pole; 272-presses down tool; 30-feed casket; The 31-empty boxes; 32-rewinding casket; 33-rewinding casket; 34-rewinding casket; 35-rewinding casket; 36-rewinding casket; 37-rewinding casket; 40-input end IC conveying mechanism; 401-picks and places head; 41-output terminal IC conveying mechanism; 411-picks and places head; 50-tests the port; The 51-test board; The 511-test bench; The 52-press mechanism; 60-track connecting gear; The 61-material feeding region; The 62-test section; The 63-discharge zone; 71-first carries tool; 711-bearing seat; The 712-through hole; The 713-elastic component; The 714-support frame; 72-second carries tool; 73-the 3rd carries tool; 80-IC; 90-IC; 100-IC; 110-IC.

Embodiment

Understand in depth for your juror is had further the present invention, exemplify a preferred embodiment now, and cooperate graphic being described as follows:

See also Fig. 3, Fig. 4, the present invention is provided with liftable feed casket 30 in the front side of board and all sides, liftable empty boxes 31, the rewinding casket 32 of liftable non-defective unit, 33, and the rewinding casket 34 of defective products, 35,36,37, side at feed casket 30 is provided with input end IC conveying mechanism 40, at rewinding

casket

34,35,36,37 side then is provided with output terminal IC conveying mechanism 41, input end IC conveying mechanism 40 be provided with a tool number suction nozzle pick and place 401, and make and pick and place 401 and can do first, two, three direction (X, Y, Z is axial) displacement, to draw the IC to be measured on the

dislocation feed casket

30,41 of output terminal IC conveying mechanisms be identical be provided with a tool number suction nozzle pick and place 411, and make and pick and place 41 1 and can do first, two, three direction (X, Y, Z is axial) displacement, survey the rewinding casket 32 that the IC absorption is displaced to each classification finishing, 33,34,35,36,37, all bogie side frames at test port 50 are provided with the track connecting gear 60 of Back Word type in addition, and on track connecting gear 60 respectively at material feeding region 61, test section 62, what discharge zone 63 bearings were identical first carries tool 71, second carries tool 72, the 3rd carries tool 73, and can utilize track connecting gear 60 to carry tool 71 with first, second carries tool 72, the 3rd carries tool 73 transfers respectively via material feeding region 61, each operation post is waited with discharge zone 63 in test section 62, to carry out pan feeding, test and discharging operation.

See also Fig. 5, Fig. 6, lift first and carry tool 71, be to arrange to be provided with most bearing seats 711 (as 32) on it, can distinguish many IC of bearing simultaneously, offer through hole 712 in each bearing seat 711, and set up support frame 714 with elastic component 713 (as spring) in all sides of through hole 712, and above described support frame 714 bearing IC, and when the IC pressurized, can utilize the elastic compression of elastic component 713 and IC is descended, and after decline, make the IC pin touch each test bench contact of test board, to carry out test jobs, when finishing test and make IC break away from pressurized, utilize the elastic stretch of elastic component 713, can make IC climb away each test bench contact of test board, carry out the dislocation operation in order to do profit.

See also Fig. 4, Fig. 7, the below that the present invention tests port 50 is to be equiped with to link the test board 51 of test signal to central controller, be to be provided with most test benches 511 on the described test board 51, the quantity of described test bench 511 is the quantity (as 32) that can corresponding carry the bearing seat of tool, descends press contacts to carry out test jobs simultaneously for the IC to be measured that carries on the tool many.

See also Fig. 8, the present invention is when original state, and first carries tool 71, second carries tool the 72, the 3rd to carry tool 73 be to put at material feeding region 61, test section 62 and discharge zone 63 with the kenel of empty boxes respectively; Input end IC conveying mechanism 40 pick and place 401, will be by the IC80 to be measured that once draws many in the feed casket 30, and be displaced to first and carry in the bearing seat 711 of tool 71, carry fully loaded IC80 to be measured in the bearing seat 711 of tool 71 and finish the feed operation up to first.

See also Fig. 9, then track connecting gear 60 will start, fully loaded have first of IC80 to be measured to carry tool 71 to transfer to enter and carry out test jobs in the test port 50 and make, make second to carry tool 72 and be transplanted on material feeding region 61 simultaneously, the 3rd carries 73 of tools is transplanted on discharge zone 63 positions, be positioned at material feeding region 61 because second carries tool 72, therefore when first carries IC80 in the tool 71 and carries out test jobs, input end IC conveying mechanism 40 pick and place 401, will continue to be displaced to second and carry in the bearing seat of tool 72, carry tool 72 fully loaded IC90 to be measured and finish the feed operation up to second by feed casket 30 interior IC90 to be measured with many.

See also Figure 10, after first carries many IC80 in the tool 71 and finishes test jobs, then track connecting gear 60 start once more, fully loaded had first of survey IC80 to carry tool 71 to be transplanted on discharge zone 63 positions and make, and pick and place 411 by output terminal IC conveying mechanism 41, carry each intact IC80 of survey in the tool 71 according to test result with first and classify and pick and place in each rewinding

casket

32,33,34,35,36,37, to carry out the discharging operation; Carry tool 71 first and finish the discharging operation while of surveying IC80, fully loaded have second of IC90 to be measured to carry tool 72 will to transfer to enter and carry out test jobs in the test port 50, make the 3rd to carry tool 73 and be transplanted on material feeding region 61 simultaneously, be positioned at material feeding region 61 because the 3rd carries tool 73, therefore when second carries IC90 in the tool 72 and carries out test jobs, input end IC conveying mechanism 40 pick and place 401, will continue to be displaced to the 3rd and carry in the bearing seat of tool 73, carry tool 73 fully loaded IC100 to be measured and finish the feed operation up to the 3rd by feed casket 30 interior IC100 to be measured with many.

See also Figure 11, after second carries many IC90 in the tool 72 and finishes test jobs, then track connecting gear 60 start once more, fully loaded had second of survey IC90 to carry tool 72 to be transplanted on discharge zone 63 positions and make, and pick and place 401 by output terminal IC conveying mechanism 41, carry each intact IC90 of survey in the tool 72 according to test result with second and classify and pick and place in each rewinding

casket

32,33,34,35,36,37, to carry out the discharging operation; Carry tool 72 second and finish the discharging operation while of surveying IC90, fully loaded have the 3rd of IC100 to be measured to carry tool 73 will to transfer to enter and carry out test jobs in the test port 50, first carry tool 71 simultaneously because of finishing the discharging operation, and be transplanted on material feeding region 61 with the kenel of empty boxes, and pick and place 401 by input end IC conveying mechanism 40, feed casket 30 interior IC110 to be measured with many are displaced to first carry in the bearing seat of tool 71, carry tool 71 fully loaded IC110 to be measured and finish the feed operation up to first.

See also Figure 12, of the present invention first carry tool 71 (second carry tool, the 3rd carries tool also with) be transplanted on carry out test jobs in the test port before, described first carries tool 71 is positioned at each test bench 511 top of test board 51 because of the support of track connecting gear 60, and this moment, the pin of each IC80 to be measured was each the test bench contact that does not touch test board as yet.See also Figure 13, press mechanism 52 when the test port presses down when compressing IC80 to be measured, can utilize the elastic compression of elastic component 713 and IC80 to be measured is descended, and after decline, make its pin touch each test bench 511 contact of test board 51, to carry out test jobs, after finishing test and press mechanism 52 being climbed away compressed survey IC80, the elastic stretch of elastic component 713 will make to be surveyed the IC80 rising and breaks away from each test bench 511 (as shown in figure 12), then first carry tool 71 and can shift out test port with track connecting gear 60 again, to finish test jobs.

In addition, see also Figure 14, Figure 15, of the present invention first carries tool 71, and (second carries tool, the 3rd carries tool also together) also can enclose elastic component 713 at the frame of tool, and need not to set up support frame in all sides of through hole with elastic component, identical can pressing down when compressing IC80 to be measured at press mechanism 52, make that tool is whole to be utilized the elastic compression of elastic component 713 and make first to carry tool 71 and descend, and after decline, make the IC pin touch each test bench contact of test board, to carry out test jobs, when finishing test and make IC break away from pressurized, utilize the elastic stretch of elastic component 713, can make first to carry each test bench contact that tool 71 and IC climb away the engaged test plate, carry out the dislocation operation in order to do profit.

In view of the above, the tool that carries that utilization of the present invention will be fully loaded with many IC to be measured of bearing is transplanted directly in the test port, not only can significantly reduce the time that the IC exchange picks and places dislocation, and many IC that will carry on the tool test simultaneously, also can effectively reduce the time of IC test, and many groups carry recycling of tool, can make full use of the collocation of sequential, test the stand-by time of port when IC exchanges dislocation to reduce, and then make machines effectively promote the production capacity of test.

More than explanation is just illustrative for the purpose of the present invention, and it is nonrestrictive, those of ordinary skills understand, under the situation of the spirit and scope that do not break away from claim and limited, can make many modifications, change, or equivalence, but but all will fall within the claim restricted portion of the present invention.

Claims

1. IC machines of many parallel built-in testings simultaneously, it is characterized in that: it mainly includes:

At least one feed casket: bearing has a plurality of IC to be measured;

At least one rewinding casket: for the intact IC that surveys of bearing;

Track connecting gear: be all sides that are erected at the test port;

2. the IC machines of many parallel built-in testings simultaneously according to claim 1 is characterized in that: the test bench quantity on the test board in the described test port is the quantity that can corresponding carry the bearing seat of tool.

3. the IC machines of many parallel built-in testings simultaneously according to claim 1 is characterized in that: be to have distinguished material feeding region, test section and discharge zone respectively on the described track connecting gear.

4. the IC machines of many parallel built-in testings simultaneously according to claim 1, it is characterized in that: in the described bearing seat that carries tool is to offer through hole, and set up support frame with elastic component in all sides of through hole, bearing IC above support frame, and IC is descended, and make the IC pin touch each test bench contact of test board, to carry out test jobs.

5. the IC machines of many parallel built-in testings simultaneously according to claim 1 is characterized in that: in the described bearing seat that carries tool is to offer through hole, and encloses elastic component at the frame of tool.

6. the IC machines of many parallel built-in testings simultaneously according to claim 1, it is characterized in that: the described tool that carries is to include first to carry tool, second and carry tool and the 3rd and carry tool, and does the round-robin collocation and use with many groups the tool that carries.

7. the IC machines of many parallel built-in testings simultaneously according to claim 1 is characterized in that: described IC conveying mechanism to pick and place head be to be provided with the plural number that can draw the IC of many of dislocations simultaneously to prop up suction nozzle.

8. the IC machines of many parallel built-in testings simultaneously according to claim 1 is characterized in that: described IC conveying mechanism is to include IC to be measured is displaced to the input end IC conveying mechanism that carries tool by the absorption of feed casket and will finishes survey IC by carrying the output terminal IC conveying mechanism that the tool absorption is displaced to the rewinding casket.

9. according to claim 1 a described IC machines of many parallel built-in testings simultaneously, it is characterized in that: described rewinding casket is to distinguish non-defective unit rewinding casket and defective products rewinding casket are arranged.

10. the IC machines of many parallel built-in testings simultaneously according to claim 1 is characterized in that: be to be provided with liftable press mechanism in the described test port.