CN113484734A - Digital integrated circuit test system - Google Patents
Digital integrated circuit test system Download PDFInfo
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- CN113484734A CN113484734A CN202110859648.4A CN202110859648A CN113484734A CN 113484734 A CN113484734 A CN 113484734A CN 202110859648 A CN202110859648 A CN 202110859648A CN 113484734 A CN113484734 A CN 113484734A
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- 238000012360 testing method Methods 0.000 title claims abstract description 75
- 238000006243 chemical reaction Methods 0.000 claims description 31
- 238000003825 pressing Methods 0.000 claims description 16
- 239000007787 solid Substances 0.000 claims 2
- 238000003466 welding Methods 0.000 claims 2
- 230000006698 induction Effects 0.000 abstract description 18
- 230000005540 biological transmission Effects 0.000 abstract description 7
- 230000006835 compression Effects 0.000 abstract description 7
- 238000007906 compression Methods 0.000 abstract description 7
- 230000009351 contact transmission Effects 0.000 abstract 1
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 description 8
- 229910052782 aluminium Inorganic materials 0.000 description 8
- 238000005299 abrasion Methods 0.000 description 6
- 230000007774 longterm Effects 0.000 description 5
- 230000000694 effects Effects 0.000 description 3
- 238000001125 extrusion Methods 0.000 description 3
- 238000009413 insulation Methods 0.000 description 3
- 238000010998 test method Methods 0.000 description 3
- 238000010586 diagram Methods 0.000 description 2
- 238000000034 method Methods 0.000 description 2
- 229910052710 silicon Inorganic materials 0.000 description 2
- 239000010703 silicon Substances 0.000 description 2
- 239000004411 aluminium Substances 0.000 description 1
- 238000005452 bending Methods 0.000 description 1
- 230000009286 beneficial effect Effects 0.000 description 1
- 238000001514 detection method Methods 0.000 description 1
- 238000003780 insertion Methods 0.000 description 1
- 230000037431 insertion Effects 0.000 description 1
- 230000002452 interceptive effect Effects 0.000 description 1
- 238000004519 manufacturing process Methods 0.000 description 1
- 239000000463 material Substances 0.000 description 1
- 230000002035 prolonged effect Effects 0.000 description 1
- 230000035939 shock Effects 0.000 description 1
- 230000008054 signal transmission Effects 0.000 description 1
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2851—Testing of integrated circuits [IC]
- G01R31/2886—Features relating to contacting the IC under test, e.g. probe heads; chucks
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/04—Housings; Supporting members; Arrangements of terminals
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/04—Housings; Supporting members; Arrangements of terminals
- G01R1/0408—Test fixtures or contact fields; Connectors or connecting adaptors; Test clips; Test sockets
- G01R1/0425—Test clips, e.g. for IC's
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/04—Housings; Supporting members; Arrangements of terminals
- G01R1/0408—Test fixtures or contact fields; Connectors or connecting adaptors; Test clips; Test sockets
- G01R1/0433—Sockets for IC's or transistors
- G01R1/0441—Details
- G01R1/0466—Details concerning contact pieces or mechanical details, e.g. hinges or cams; Shielding
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2851—Testing of integrated circuits [IC]
- G01R31/2886—Features relating to contacting the IC under test, e.g. probe heads; chucks
- G01R31/2889—Interfaces, e.g. between probe and tester
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- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- General Engineering & Computer Science (AREA)
- Measuring Leads Or Probes (AREA)
- Tests Of Electronic Circuits (AREA)
Abstract
The invention discloses a digital integrated circuit testing system which structurally comprises a display screen, a tester main body and a rack, wherein the display screen is fixedly embedded at the upper part of the rear side of the left end of the tester main body, the bottom of the tester main body is welded at the top of the rack, a handle is rotated to enable a rotary column to compress a compression plate, so that the compression plate extrudes the compression plate, poor contact between a testing contact and a testing end head and deviation of a component to be tested are avoided, the accuracy of integrated circuit testing is improved, different induction sheets and the contact heads in a groove are in contact transmission signals, the simultaneous testing of a plurality of components to be tested in different shapes is facilitated, the working efficiency is improved, a push rod is pushed to rotate, a linkage rod is driven to push a fastening block, the fastening block is fastened to the bottom of a wire plug, and the problem that the connection between the wire plug and a wire plug is loosened and unstable is avoided, so that the stability of data transmission is influenced is avoided.
Description
Technical Field
The present invention relates to the field of integrated circuit testing, and more particularly, to a digital integrated circuit testing system.
Background
The integrated circuit test is an important link of the integrated circuit production process, the packaged component to be tested is placed on a machine table with a test board during the test, the lead plug of the component is inserted into a slot of the test board and is electrically connected with a corresponding port on the test board, the tester generates an electric signal to test the electrical property of a product, but a plurality of tests of the integrated circuit are usually completed by a plurality of test procedures, the integrated circuit needs to switch among the plurality of test procedures, the test efficiency is reduced because the integrated circuit needs to switch and plug for a plurality of times in the test process, poor contact between a test contact and a test end and deviation of the component to be tested are easily caused, the accuracy of the tester for testing the integrated circuit is reduced, and the lead plug is directly inserted into a wire insertion groove of the integrated circuit tester, so that the lead plug is connected with the integrated circuit tester unstably, when the integrated circuit tester is moved or is collided by the outside, the connection between the wire plug and the integrated circuit tester is loosened, so that the stability of data transmission is influenced.
Disclosure of Invention
The technical scheme adopted by the invention for realizing the technical purpose is as follows: the digital integrated circuit test system structurally comprises a display screen, an operation panel, a tester main body, a lock catch, a stand and a power supply box, the display screen is fixedly embedded at the upper part of the rear side of the left end of the tester main body, an operation panel is arranged at the upper part of the front side of the left end of the tester main body, the lower part of the left side of the tester main body is provided with a lock catch, the bottom of the tester main body is welded on the top of the frame, the power supply box is arranged at the bottom of the frame, the tester main body comprises a shell, a conversion device, a pressing device, a working platform, a signal emitter and a data processor, the right end of the conversion device is arranged at the lower part of the right end of the inner side of the shell, a pressing device is arranged at the center of the bottom of the inner side of the shell, the bottom of the working platform is welded at the top of the rack, the right end of the signal emitter is installed in the middle of the right end of the inner side of the shell, and the upper portion of the right end of the inner side of the shell is fixedly connected with a data processor.
As a further improvement of the present invention, the conversion device includes an air cylinder, a contact device, a conversion plate, a rotation shaft, a support rod, and a spring, the right end of the air cylinder is fixedly connected to the lower portion of the right end inside the housing, the middle portion of the conversion plate is hinged to the top portion of the support rod, the right end of the spring is connected to the bottom portion of the left end of the conversion plate, and the left end of the spring is mounted to the bottom portion of the right end of the support rod, the top portion of the conversion plate is provided with the contact device, the contact device is disposed at the bottom portion of the air cylinder, the number of the air cylinder is six, the contact device slides in the left-right direction along with the output end of the air cylinder, the contact device is five at the bottom portion of each air cylinder, the middle portion of the conversion plate can rotate around the rotation shaft at the top portion of the support rod by a certain angle, and the conversion plate is arc-shaped.
As a further improvement of the present invention, the contact device includes a rotation shaft, a sensing piece, a groove, and a contact head, the rotation shaft is installed in the middle of the left side inside the groove, the middle of the sensing piece is hinged to the rotation shaft, the contact head is installed on the top of the conversion piece, the groove is in a shape of narrow inside and wide outside, a rubber layer is installed on the bottom of the groove, the rubber layer has certain elasticity, the top of the left end of the contact head is inclined to the right by a certain angle, the contact head and the sensing piece are both aluminum, the conductivity and the abrasion resistance are strong, the middle of the sensing piece can rotate by a certain angle around the rotation shaft, and the bottom of the sensing piece is in an arc shape.
As a further improvement of the invention, the compressing device comprises a compressing column, a pressure spring, an insulating housing, a compressing plate, a rotating groove, a rotating column and a handle, the compressing column is connected with the inside of the right end of the center of the bottom of the shell in a sliding way, the bottom end of the pressure spring is connected with the top of the compressing column, the top end of the pressure spring is arranged at the bottom of the right side of the pressure plate, the two ends of the top side of the pressure plate in the insulating outer cover are connected in a sliding manner, the top of the rotary column is movably clamped in the rotary groove, the middle lower part of the rotary column is in threaded connection with the left end of the center of the bottom of the shell, the handle is fixedly embedded at the bottom of the rotating column, six compressing columns and all parts are arranged, the pressure strip material is aluminium, and shock resistance is strong, the top of column spinner can rotate in the inside of rotating the groove to the well lower part both ends of column spinner all are equipped with the screw thread.
As a further improvement of the invention, the working platform comprises a bottom plate, a test plate, a component to be tested, an induction block and a fastening device, wherein the bottom plate is welded at two ends of the top side of the frame, the test plate is embedded and installed at the top of the bottom plate, the component to be tested is installed at the top of the test plate, the induction block is installed at the top of the component to be tested, the fastening device is arranged at the center of the top of the test plate, the bottom plate is made of aluminum and has high hardness and strong abrasion resistance, the test plate is made of silicon and has good insulation, the induction block is made of aluminum and has good conductivity and abrasion resistance, the bottom plate and the test plate are respectively provided with one induction block at the left end and the right end of the bottom of the tester body, the induction blocks are respectively provided with three induction blocks at the top of the test plate, six induction blocks are respectively provided with a circular shape and a rectangular shape, and the fastening devices are respectively provided with one at the left side, the right side and the back three sides of the top of the test plate, six in total.
As a further improvement of the invention, the fastening device comprises a wire plug, a wire inserting groove, a fastening block, a bottom platform, a push rod, a linkage rod and a wire inserting column, wherein the bottom platform is arranged at two ends of the bottom side in the wire inserting groove, the bottom of the left end of the fastening block is hinged with the right end of the bottom platform, the lower part of the wire plug is connected in the fastening block in a sliding manner, the middle part of the push rod is hinged with the middle parts of two ends of the top of the wire inserting groove, the bottom of the push rod is hinged with the left end of the linkage rod, the middle part of the linkage rod is connected in a sliding manner at two sides in the wire inserting groove, the center of the bottom of the wire inserting groove is provided with the wire inserting column, the wire inserting column is in clearance fit with the bottom end of the wire plug, the wire inserting groove is in a shape with two narrow ends and wide middle, the left side and the right side of the fastening block are respectively provided with one, the fastening block is made of rubber, has certain elasticity and good insulation, and the bottom of the left end of the fastening block can rotate a certain angle around the right end of the bottom platform, the middle part of push rod can rotate certain angle round the middle part at plug wire groove top both ends to the bottom of push rod can rotate certain angle round the left end of gangbar, the right-hand member of gangbar can slide right in the inside both sides of plug wire groove.
The invention has the beneficial effects that:
1. rotate the handle and make the column spinner compress tightly the pressure strip to make the pressure strip extrusion compress tightly the post, avoid causing contact failure and the subassembly off tracking that awaits measuring between test contact and the test end, thereby increase the accuracy of integrated circuit test, different response pieces and contact head touch transmission signal in the recess, a plurality of integrated circuits of being convenient for test simultaneously, increase work efficiency.
2. The promotion push rod rotates, drives the gangbar and promotes the fastening block for the fastening block is to the bottom fastening of wire plug, avoids wire plug and plug wire columnar connection appearance not hard up and unstable, thereby influences data transmission's stability, and the subassembly that awaits measuring of a plurality of different shapes of being convenient for tests simultaneously, increases work efficiency.
Drawings
FIG. 1 is a schematic diagram of a digital integrated circuit test system according to the present invention.
Fig. 2 is a schematic view of the internal structure of a tester body according to the present invention.
Fig. 3 is a schematic diagram of an internal structure of a conversion device according to the present invention.
Fig. 4 is a partially enlarged view of the contact device at a in fig. 3 according to the present invention.
Fig. 5 is a schematic view of the internal structure of a pressing device according to the present invention.
Fig. 6 is a schematic plan view of a working platform according to the present invention.
Fig. 7 is a schematic view of the internal structure of a fastening device of the present invention.
In the figure: display screen-1, operation panel-2, tester body-3, lock catch-4, frame-5, power supply box-6, shell-31, conversion device-32, pressing device-33, working platform-34, signal emitter-35, data processor-36, cylinder-321, contact device-322, conversion sheet-323, rotation shaft-324, support rod-325, spring-326, rotation shaft-22 a, induction sheet-22 b, groove-22 c, contact head-22 d, pressing column-331, pressure spring-332, insulating housing-333, pressing plate-334, rotation groove-335, rotation column-336, handle-337, bottom plate-341, test plate-342, component-343, to be tested, The device comprises induction blocks-344, fastening devices-345, wire plugs-45 a, wire inserting grooves-45 b, fastening blocks-45 c, a bottom platform-45 d, push rods-45 e, linkage rods-45 f and wire inserting columns-45 g.
Detailed Description
The invention is further described below with reference to the accompanying drawings:
example 1:
as shown in figures 1 to 5:
the invention relates to a digital integrated circuit testing system which structurally comprises a display screen 1, an operating panel 2, a tester main body 3, a lock catch 4, a rack 5 and a power supply box 6, wherein the display screen 1 is fixedly embedded at the upper part of the rear side of the left end of the tester main body 3, the operating panel 2 is arranged at the upper part of the front side of the left end of the tester main body 3, the lock catch 4 is arranged at the lower part of the left side of the tester main body 3, the bottom of the tester main body 3 is welded at the top of the rack 5, the power supply box 6 is arranged at the bottom of the rack 5, the tester main body 3 comprises a shell 31, a conversion device 32, a pressing device 33, a working platform 34, a signal emitter 35 and a data processor 36, the right end of the conversion device 32 is arranged at the lower part of the right end of the inner side of the shell 31, the pressing device 33 is arranged at the center of the bottom of the inner side of the shell 31, the bottom of the working platform 34 is welded at the top of the rack 5, the right end of the signal emitter 35 is installed in the middle of the right end of the inner side of the shell 31, and the upper part of the right end of the inner side of the shell 31 is fixedly connected with a data processor 36.
Wherein, the conversion device 32 comprises a cylinder 321, a contact device 322, a conversion sheet 323, a rotation shaft 324, a support rod 325 and a spring 326, the right end of the cylinder 321 is fixedly connected with the lower part of the right end inside the shell 31, the middle part of the conversion sheet 323 is hinged with the top of the support rod 325, the right end of the spring 326 is connected with the bottom of the left end of the conversion sheet 323, the left end of the spring 326 is installed at the bottom of the right end of the support rod 325, the top of the conversion sheet 323 is provided with the contact device 322, the contact device 322 is arranged at the bottom of the cylinder 321, the cylinder 321 is provided with six in total, so that a plurality of integrated circuits can be tested simultaneously, the working efficiency is increased, the contact device 322 slides in the left-right direction along with the output end of the cylinder 321 synchronously, the contact device 322 is provided with five at the bottom of each cylinder 321, and the middle part of the conversion sheet 323 can rotate around the rotation shaft 324, rotate certain angle at the top of bracing piece 325, avoid integrated circuit to change the way and plug many times in the test procedure for the efficiency of test improves, change over plate 323 is established to the arc form, reduces the wearing and tearing that contact device 322 long-term touching received, avoids causing contact failure between the contact.
Wherein, the contact device 322 includes a rotation axis 22a, a sensing piece 22b, a groove 22c, and a contact 22d, the rotation axis 22a is installed at the left middle part inside the groove 22c, the middle part of the sensing piece 22b is hinged to the rotation axis 22a, the contact 22d is arranged at the top of the conversion piece 323, the groove 22c is designed to be of a shape with a narrow inside and a wide outside, which is convenient for the contact of the contact 22d with the sensing piece 22b to be tested, and the bottom of the groove 22c is provided with a rubber layer with certain elasticity, and the top of the left end of the contact 22d is inclined to the right at a certain angle, so as to avoid the contact 22d from being damaged due to long-term collision, the contact 22d and the sensing piece 22b are both made of aluminum, which has strong conductivity and wear resistance, reduces wear caused by long-term touch, increases the service life of the device, the middle part of the sensing piece 22b can rotate at a certain angle around the rotation axis 22a, and the bottom of the induction sheet 22b is set to be arc-shaped, so that the bottom of the induction sheet 22b is buffered from being collided, and abrasion caused by long-term touch of the induction sheet 22b is reduced, so that poor contact between the contact head 22d and the induction sheet 22b is caused, and the service life of the equipment is prolonged.
The compressing device 33 comprises a compressing column 331, a pressure spring 332, an insulating outer cover 333, a compressing plate 334, a rotating groove 335, a rotating column 336 and a handle 337, wherein the compressing column 331 is connected in a sliding manner inside the right end of the center of the bottom of the housing 31, the bottom end of the pressure spring 332 is connected with the top of the compressing column 331, the top end of the pressure spring 332 is installed at the bottom of the right side of the compressing plate 334, the compressing plate 334 is connected in a sliding manner at two ends of the top side inside the insulating outer cover 333, the top of the rotating column 336 is movably clamped inside the rotating groove 335, the middle lower part of the rotating column 336 is in threaded connection with the left end of the center of the bottom of the housing 31, the handle 337 is fixedly installed at the bottom of the rotating column 336, the compressing column 331 and all the components are provided with six components, so that a plurality of integrated circuits can be tested at the same time, the working efficiency is increased, the compressing plate 334 is made of aluminum and has strong impact resistance, avoid pressure strip 334 to receive extrusion deformation for a long time, increase the life of equipment, the top of column spinner 336 can rotate in the inside of rotating groove 335 to column spinner 336's well lower part both ends all are equipped with the screw thread, the column spinner 336 of being convenient for plays the effect that compresses tightly to pressure strip 334, make pressure strip 334 compress tightly post 331 through pressure spring 332 extrusion, compress tightly integrated circuit, avoid causing contact failure and the subassembly off tracking that awaits measuring between test contact and the test end, reduce the accuracy of tester to the integrated circuit test.
The specific use mode and function of the embodiment are as follows:
in the invention, after the integrated circuit is placed on the top of the working platform 34, the handle 337 at the bottom of the rotary column 336 at the left end of the center of the bottom of the shell 31 is rotated, so that the rotary column 336 plays a role in compressing the compression plate 334, the compression plate 334 extrudes the compression column 331 through the compression spring 332, poor contact between a test contact and a test end and deviation of the integrated circuit are avoided, and the accuracy of the tester for testing the integrated circuit is reduced, the air cylinder 321 arranged at the lower part of the right end of the inner side of the shell 31 is started through the operation panel 2, the groove 22c at the bottom of the air cylinder 321 is driven to slide when the air cylinder 321 operates, different induction sheets 22b in the groove 22c and a contact head 22d at the bottom are subjected to touch signal transmission, the integrated circuit is prevented from being turned and plugged for multiple times in the testing process, a plurality of integrated circuits are convenient to be tested simultaneously, the working efficiency is increased, and the contact head 22d can rotate at a certain angle at the top of the supporting rod 325, reduce the long-term wearing and tearing that the touching received of contact 22d, avoid causing contact failure between the contact, increase the life of equipment, send the signal of telecommunication through operating panel 2 control signal transmitter 35, the signal of telecommunication returns behind the subassembly 343 that awaits measuring, after the conversion test of data processor 36, shows the test result on display screen 1.
Example 2:
as shown in fig. 6 to 7:
the working platform 34 includes a bottom plate 341, a testing plate 342, a component 343 to be tested, an induction block 344, and a fastening device 345, the bottom plate 341 is welded at two ends of the top side of the frame 5, the testing plate 342 is embedded and installed at the top of the bottom plate 341, the component 343 to be tested is installed at the top of the testing plate 342, the induction block 344 is installed at the top of the component 343 to be tested, the fastening device 345 is installed at the center of the top of the testing plate 342, the bottom plate 341 is made of aluminum, has high hardness and strong abrasion resistance, and avoids the bending deformation of the bottom plate 341, the testing plate 342 is made of silicon, has good insulation, avoids interfering with the detection of the testing equipment, and affects the stability of data transmission, the induction block 344 is made of aluminum, has good conductivity and abrasion resistance, enhances the testing effect of the equipment 342, and the bottom plate 341 and the testing plate are respectively installed at the left and right ends of the bottom of the tester body 3, the sensing blocks 344 are respectively provided with six sensing blocks at the top of the testing board 342, the sensing blocks are circular and rectangular, so that the testing of the to-be-tested components 343 with different shapes is facilitated, the fastening devices 345 are respectively provided with one sensing block at the left side, the right side and the rear side of the top of the testing board 342, the six sensing blocks are provided, so that the testing of the to-be-tested components 343 is facilitated, and the working efficiency is improved.
Wherein, the fastening device 345 comprises a wire plug 45a, a wire inserting groove 45b, a fastening block 45c, a bottom platform 45d, a push rod 45e, a linkage rod 45f and a wire inserting column 45g, the bottom platform 45d is installed at two ends of the bottom side inside the wire inserting groove 45b, the bottom of the left end of the fastening block 45c is hinged with the right end of the bottom platform 45d, the lower part of the wire plug 45a is connected inside the fastening block 45c in a sliding manner, the middle part of the push rod 45e is hinged with the middle parts of two ends of the top of the wire inserting groove 45b, the bottom of the push rod 45e is hinged with the left end of the linkage rod 45f, the middle part of the linkage rod 45f is connected inside the wire inserting groove 45b in a sliding manner, the wire inserting column 45g is arranged at the center of the bottom of the wire inserting groove 45b, the wire inserting column 45g is in clearance fit with the bottom end of the wire plug 45a, the wire inserting groove 45b is in a shape with two narrow ends and a wide middle part, the wire plug 45a can be conveniently inserted into the wire inserting groove 45b, the left side and the right side of the fastening block 45c are respectively provided with one, the left side and the right side of the fastening block 45c are made of rubber, the rubber has certain elasticity and good insulativity, the bottom of the wire plug 45a can be conveniently clamped and the influence on the stability of the test can be avoided, the bottom of the left end of the fastening block 45c can rotate for a certain angle around the right end of the bottom platform 45d, the middle part of the push rod 45e can rotate for a certain angle around the middle parts of the two ends of the top of the wire inserting groove 45b, the bottom of the push rod 45e can rotate for a certain angle around the left end of the linkage rod 45f, the right end of the linkage rod 45f can slide rightwards on the two sides inside the wire inserting groove 45b, so that the push rod 45e drives the linkage rod 45f to play a fastening role on the fastening block 45c, the unstable connection between the wire plug 45a and the wire plug 45g can be prevented when the integrated circuit testing device is moved or collided by the outside, so that the connection between the wire plug 45a and the plug 45g is loosened to affect the stability of data transmission.
The specific use mode and function of the embodiment are as follows:
in the invention, the bottom of the wire plug 45a is connected with the wire inserting column 45g at the bottom of the wire inserting groove 45b at the center of the test board 342, by pushing the tops of the push rods 45e at the two ends of the top of the wire inserting groove 45b, the push rods 45e rotate a certain angle to the left around the middle parts of the two ends of the top of the wire inserting groove 45b, so as to drive the right end of the linkage rod 45f to slide to the right at the two sides in the wire inserting groove 45b, so that the right end of the linkage rod 45f pushes the left end of the fastening block 45c, and the bottom of the left end of the fastening block 45c rotates a certain angle to the right around the right end of the bottom platform 45d, so that the right end of the fastening block 45c plays a fastening role on the bottom of the wire plug 45a, thereby preventing the unstable connection between the wire plug 45a and the wire inserting column 45g, and preventing the looseness of the connection between the wire plug 45a and the wire inserting column 45g when the integrated circuit test equipment is moved or collided by the outside, therefore, the stability of data transmission is affected, and the top of the test board 342 is provided with a plurality of sensing blocks 344, so that a plurality of to-be-tested components 343 in different shapes can be tested simultaneously, and the working efficiency is improved.
The technical solutions of the present invention or similar technical solutions designed by those skilled in the art based on the teachings of the technical solutions of the present invention are all within the scope of the present invention to achieve the above technical effects.
Claims (6)
1. The utility model provides a digital integrated circuit test system, its structure includes display screen (1), operating panel (2), tester main part (3), hasp (4), frame (5), power pack (6), display screen (1) is embedded solid and is installed on the left end rear side upper portion of tester main part (3), the left end front side upper portion of tester main part (3) is equipped with operating panel (2), the left side lower part of tester main part (3) is equipped with hasp (4), the bottom of tester main part (3) welds in frame (5) top, power pack (6) are installed in frame (5) bottom, its characterized in that:
tester main part (3) include shell (31), conversion equipment (32), closing device (33), work platform (34), signal transmitter (35), data processor (36), the right-hand member lower part at shell (31) inboard is installed to the right-hand member of conversion equipment (32), the bottom center of shell (31) inboard is equipped with closing device (33), the bottom welding of work platform (34) is at the top of frame (5), the right-hand member middle part at shell (31) inboard is installed to the right-hand member of signal transmitter (35), the right-hand member upper portion of shell (31) inboard is embedded and is connected with data processor (36).
2. A digital integrated circuit test system as claimed in claim 1, wherein: conversion equipment (32) are including cylinder (321), contact device (322), conversion piece (323), axis of rotation (324), bracing piece (325), spring (326), the right-hand member of cylinder (321) is connected with the inboard right-hand member lower part of shell (31) is embedded solid, the middle part of conversion piece (323) is connected with the top of bracing piece (325) is articulated, the right-hand member of spring (326) is connected with the left end bottom of conversion piece (323) to the right-hand member bottom at bracing piece (325) is installed to the left end of spring (326), the top of conversion piece (323) is equipped with contact device (322), contact device (322) are established in the bottom of cylinder (321).
3. A digital integrated circuit test system as claimed in claim 2, wherein: the contact device (322) comprises a rotating shaft (22a), a sensing piece (22b), a groove (22c) and a contact head (22d), wherein the rotating shaft (22a) is installed in the middle of the left side inside the groove (22c), the middle of the sensing piece (22b) is hinged to the rotating shaft (22a), and the contact head (22d) is arranged at the top of the conversion piece (323).
4. A digital integrated circuit test system as claimed in claim 1, wherein: the pressing device (33) comprises a pressing column (331), a pressure spring (332), an insulating outer cover (333), a pressing plate (334), a rotating groove (335), a rotating column (336) and a handle (337), wherein the pressing column (331) is connected with the top of the pressing column (331) in a sliding mode inside the right end of the bottom of the shell (31), the bottom end of the pressure spring (332) is connected with the top of the pressing column (331), the top end of the pressure spring (332) is installed at the bottom of the right side of the pressing plate (334), the two ends of the top side of the pressing plate (334) inside the insulating outer cover (333) are connected in a sliding mode, the top of the rotating column (336) is clamped in the rotating groove (335) in a movable mode, the middle lower portion of the rotating column (336) is in threaded connection with the left end of the bottom of the shell (31), and the handle (337) is fixedly installed at the bottom of the rotating column (336).
5. A digital integrated circuit test system as claimed in claim 1, wherein: work platform (34) include bottom plate (341), survey test panel (342), subassembly (343) to be tested, response piece (344), fastener (345), bottom plate (341) welding is at the top side both ends of frame (5), survey test panel (342) and inlay the top of installing at bottom plate (341), subassembly (343) to be tested are installed at the top of surveying test panel (342), response piece (344) are installed at the top of subassembly (343) to be tested, the top center of surveying test panel (342) is equipped with fastener (345).
6. A digital integrated circuit test system as claimed in claim 5, wherein: the fastening device (345) comprises a wire plug (45a), a wire inserting groove (45b), a fastening block (45c), a bottom platform (45d), a push rod (45e), a linkage rod (45f) and a wire inserting column (45g), wherein the bottom platform (45d) is installed at two ends of the bottom side inside the wire inserting groove (45b), the bottom of the left end of the fastening block (45c) is hinged with the right end of the bottom platform (45d), the lower part of the wire plug (45a) is connected with the fastening block (45c) in a sliding mode, the middle part of the push rod (45e) is hinged with the middle parts of two ends of the top of the wire inserting groove (45b), the bottom of the push rod (45e) is hinged with the left end of the linkage rod (45f), the middle part of the linkage rod (45f) is connected with two sides inside the wire inserting groove (45b) in a sliding mode, the wire inserting column (45g) is arranged at the center of the bottom of the wire inserting groove (45b), the plug wire column (45g) is in clearance fit with the bottom end of the wire plug (45 a).
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| CN202110859648.4A CN113484734B (en) | 2021-07-28 | 2021-07-28 | Digital integrated circuit test system |
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| CN202110859648.4A CN113484734B (en) | 2021-07-28 | 2021-07-28 | Digital integrated circuit test system |
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|---|---|
| CN113484734B (en) | 2024-07-19 |
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Effective date of registration: 20240624 Address after: 518000 13a01, block a, building 1, anhongji TIANYAO Plaza, Daling community, Minzhi street, Longhua District, Shenzhen, Guangdong Province Applicant after: SHENZHEN ZHUOBIN ELECTRONICS Co.,Ltd. Country or region after: China Address before: 362411 No. 2 Qianjin Road, Hutou Town, Anxi County, Quanzhou City, Fujian Province Applicant before: Wang Xuelian Country or region before: China |
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