CN102544068B - Bidirectional controllable silicon device based on assistant triggering of PNP-type triodes - Google Patents
Bidirectional controllable silicon device based on assistant triggering of PNP-type triodes Download PDFInfo
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- CN102544068B CN102544068B CN201210060567.9A CN201210060567A CN102544068B CN 102544068 B CN102544068 B CN 102544068B CN 201210060567 A CN201210060567 A CN 201210060567A CN 102544068 B CN102544068 B CN 102544068B
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Abstract
The invention discloses a bidirectional controllable silicon device based on assistant triggering of PNP-type triodes. The bidirectional controllable silicon device comprises a P substrate layer and four PNP-type triodes, wherein a first N trap, a P trap and a second N trap are arranged on the P substrate layer; a first N+ active injection region, a first P+ active injection region and a second N+ active injection region are arranged on the first N trap; a third N+ active injection region, a second P+ active injection region and a fourth N+ active injection region are arranged on the second N trap; the third N+ active injection region is connected with the second PNP-type triode; the first PNP-type triode is connected with a first metal electrode; the second N+ active injection region is connected with the third PNP-type triode; and the fourth PNP-type triode is connected with a second metal electrode. According to the controllable silicon device, the PNP-type triodes are used as assistant triggering units, so that the device has adjustable and relatively low positive and negative breakdown voltage, and can be suitable for electrostatic discharging (ESD) protection application in some hybrid voltage interface circuits.
Description
Technical field
The invention belongs to integrated circuit electrostatic defending technical field, be specifically related to a kind of bidirectional triode thyristor device based on positive-negative-positive triode auxiliary triggering.
Background technology
Natural static discharge (ESD) phenomenon has formed serious threat to the reliability of integrated circuit.In industrial quarters, the inefficacy 30% of integrated circuit (IC) products is all owing to suffering static discharge phenomenon caused, and more and more less process, and the probability that thinner gate oxide thickness all makes integrated circuit be subject to static discharge destruction increases greatly.Therefore the reliability of, improving integrated circuit electrostatic discharge protection has very important effect to improving the rate of finished products of product.
The pattern of static discharge phenomenon is divided into four kinds conventionally: HBM (human-body model), MM (machine discharge mode), CDM (assembly charging and discharging pattern) and electric field induction pattern (FIM).And the most common two kinds of static discharge patterns that are also industrial quarters product must pass through are HBM and MM.When there is static discharge, electric charge conventionally flows into and flows out from another pin from a pin of chip, and the electric current that now electrostatic charge produces is conventionally up to several amperes, and the voltage producing at electric charge input pin is up to even tens volts of several volts.If larger ESD electric current flows into inside chip, can cause the damage of inside chip, meanwhile, the high pressure producing at input pin also can cause internal components generation grid oxygen punch-through, thereby causes circuit malfunction.Therefore, in order to prevent that inside chip from damaged by ESD, to each pin of chip, to carry out effective ESD protection, ESD electric current is released.
In the evolution of ESD protection, the devices such as diode, GGNMOS (the NMOS pipe of grid ground connection), SCR (controllable silicon) are used as ESD protective unit conventionally.For modern CMOS (complementary metal oxide semiconductors (CMOS)) integrated circuit, the input of chip output conventionally with input buffer stage the grid of output buffer stage or MOS device as input.Therefore, when there is esd event, ESD stress can be applied directly on grid oxygen, if ESD device opens not prompt enough or clamping voltage is too high, grid oxygen punch-through probably occurs, thereby chip is damaged.
Because unidirectional SCR structure has the low voltage that maintains, the features such as high current drain ability, so unidirectional SCR structure has very wide application in ESD protection.
Fig. 1 is the unidirectional SCR structure under a kind of CMOS technique, this unidirectional SCR trigger voltage is in one direction higher, and in another direction, be parasitic diode structure, trigger voltage is very low and non-adjustable, therefore, this structure is difficult to ESD protection in direct application sheet, especially can not be applied in the mixed-voltage domain interface circuit ESD protection that the two-way trigger voltage of ask for something is adjustable and lower.
Fig. 2 is the two-way SCR structure under a kind of CMOS technique, and this structure is compared unidirectional SCR structure, at both direction, all has identical trigger voltage, but trigger voltage value is same too high and non-adjustable, under deep submicron process, is difficult to protect fragile grid oxygen.
Summary of the invention
For the existing above-mentioned technological deficiency of prior art, the invention discloses a kind of bidirectional triode thyristor device based on positive-negative-positive triode auxiliary triggering, make controllable silicon on both direction, there is two-way adjustable and lower trigger voltage, can directly apply to the ESD protection of some the mixed-voltage interface circuits under deep submicron process.
A bidirectional triode thyristor device for positive-negative-positive triode auxiliary triggering, comprising:
P substrate layer and four positive-negative-positive triodes;
On described P substrate layer, be from left to right provided with successively a N trap, P trap and the 2nd N trap, described P trap is connected with the 2nd N trap side by side with a N trap;
On a described N trap, be from left to right provided with side by side successively an active injection region of N+, an active injection region of P+ and the 2nd active injection region of N+; On the 2nd described N trap, be from left to right provided with side by side successively the 3rd active injection region of N+, the 2nd active injection region of P+ and the 4th active injection region of N+;
A described active injection region of N+ is connected by the first metal electrode with an active injection region of P+, and the 2nd described active injection region of P+ is connected by the second metal electrode with the 4th active injection region of N+;
The 3rd described active injection region of N+ is connected with base stage with the emitter of the second positive-negative-positive triode, and the collector electrode of the first positive-negative-positive triode is connected with the first metal electrode with base stage; The 2nd described active injection region of N+ is connected with base stage with the emitter of the 3rd positive-negative-positive triode, and the collector electrode of the 4th positive-negative-positive triode is connected with the second metal electrode with base stage; The emitter of the first positive-negative-positive triode is connected with the collector electrode of the second positive-negative-positive triode, and the collector electrode of the 3rd positive-negative-positive triode is connected with the emitter of the 4th positive-negative-positive triode.
Shallow-trench isolation is passed through in a described active injection region of N+ and an active injection region of P+, an active injection region of P+ and the 2nd active injection region of N+, the 2nd active injection region of N+ and the 3rd active injection region of N+, the 3rd active injection region of N+ and the 2nd active injection region of P+ or the 2nd active injection region of P+ and the 4th active injection region of N+.
The equivalent electric circuit of described silicon-controlled device consists of four resistance, three triodes and four positive-negative-positive triodes; Wherein, the emitter of the first triode is connected with base stage with one end of the first resistance and the collector electrode of the first positive-negative-positive triode and forms the first electrode of silicon-controlled device, base stage is with the other end of the first resistance, the emitter of the 3rd positive-negative-positive triode is connected with emitter or the collector electrode of base stage and the 3rd triode, and collector electrode is connected with one end of the 3rd resistance; The emitter of the second triode is connected with base stage with one end of the second resistance and the collector electrode of the 4th positive-negative-positive triode and forms the second electrode of silicon-controlled device, base stage is with the other end of the second resistance, the emitter of the second positive-negative-positive triode is connected with collector electrode or the emitter of base stage and the 3rd triode, and collector electrode is connected with one end of the 4th resistance; The base stage of the 3rd triode is connected with the other end of the 4th resistance with the other end of the 3rd resistance; The emitter of the first positive-negative-positive triode is connected with the collector electrode of the second positive-negative-positive triode, and the collector electrode of the 3rd positive-negative-positive triode is connected with the emitter of the 4th positive-negative-positive triode.
Described the first triode and the second triode are positive-negative-positive triode, and the 3rd described triode is NPN type triode.
The first described triode consists of a described active injection region of P+, a N trap and P trap; The second described triode consists of described the 2nd active injection region of P+, the 2nd N trap and P trap; The 3rd described triode consists of a N trap, the 2nd N trap and P trap; The first described resistance and the 3rd resistance are the dead resistance of a N trap; The second described resistance and the 4th resistance are the dead resistance of the 2nd N trap.
The protection voltage range of silicon-controlled device of the present invention can reach (1.2～5) V, and trigger voltage is (5～12) V.
Silicon-controlled device of the present invention utilizes positive-negative-positive triode as auxiliary triggering unit, makes device have adjustable and lower trigger voltage, realizes the ESD protection of low trigger voltage; This silicon-controlled device has two-way forward and reverse puncture voltage simultaneously, makes device applicable to ESD protection on the sheet under deep submicron process, especially applicable to the ESD security application between some mixed-voltage interface circuits or different electrical power territory.
Accompanying drawing explanation
Fig. 1 is the structural representation of traditional one-way SCR device.
Fig. 2 is that traditional double is to the structural representation of silicon-controlled device.
Fig. 3 is the enforcement domain of silicon-controlled device of the present invention.
Fig. 4 is that Fig. 3 is along the generalized section of AA ' direction.
Fig. 5 is the equivalent circuit diagram of silicon-controlled device of the present invention.
Fig. 6 (a) is the ESD current drain path profile of silicon-controlled device of the present invention when esd event betides A port.
Fig. 6 (b) is the ESD current drain path profile of silicon-controlled device of the present invention when esd event betides K port.
Fig. 7 is the structural representation of silicon-controlled device of the present invention.
Fig. 8 is that silicon-controlled device of the present invention and traditional double are to the current-voltage characteristic schematic diagram of silicon-controlled device.
Embodiment
In order more specifically to describe the present invention, below in conjunction with the drawings and the specific embodiments, technical scheme of the present invention and relative theory thereof are elaborated.
As shown in Figure 3 and Figure 4, a kind of bidirectional triode thyristor device based on positive-negative-positive triode auxiliary triggering, comprising:
On P substrate layer 10, be from left to right provided with successively a N trap 21, P trap 23 and the 2nd N trap 22, P trap 23 is connected with the 2nd N trap 22 side by side with a N trap 21;
On the one N trap 21, be from left to right provided with side by side successively an active injection region 41 of N+, an active injection region 51 of P+ and the active injection region 42 of the 2nd N+; On the 2nd N trap 22, be from left to right provided with side by side successively the 3rd active injection region 43 of N+, the 2nd active injection region 52 of P+ and the active injection region 44 of the 4th N+;
The one active injection region 41 of N+ is connected by the first metal electrode 61 with an active injection region 51 of P+, and the 2nd active injection region 52 of P+ is connected by the second metal electrode 62 with the 4th active injection region 44 of N+;
The 3rd active injection region 43 of N+ is connected with base stage with the emitter of the second positive-negative-positive triode P2, and the collector electrode of the first positive-negative-positive triode P1 is connected with the first metal electrode 61 with base stage; The 2nd active injection region 42 of N+ is connected with base stage with the emitter of the 3rd positive-negative-positive triode P3, and the collector electrode of the 4th positive-negative-positive triode P4 is connected with the second metal electrode 62 with base stage; The emitter of the first positive-negative-positive triode P1 is connected with the collector electrode of the second positive-negative-positive triode P2, and the collector electrode of the 3rd positive-negative-positive triode P3 is connected with the emitter of the 4th positive-negative-positive triode P4.
The active injection region 51 of the one active injection region 41 of N+ and a P+, an active injection region 51 of P+ and the active injection region 42 of the 2nd N+, the 2nd active injection region 42 of N+ and the active injection region 43 of the 3rd N+, the 3rd active injection region 43 of N+ and the active injection region 52 of the 2nd P+ and the active injection region 52 of the 2nd P+ and the active injection region 44 of the 4th N+ all isolate by shallow slot 3, in shallow slot 3, are filled with silica.
As shown in Figure 5, the equivalent electric circuit of present embodiment silicon-controlled device consists of four resistance R 1～R4, three triode Q1～Q3 and four positive-negative-positive triode P1～P4; Wherein, the emitter of the first triode Q1 is connected with base stage with one end of the first resistance R 1 and the collector electrode of the first positive-negative-positive triode P1 and forms the A electrode of silicon-controlled device, base stage is with the other end of the first resistance R 1, the emitter of the 3rd positive-negative-positive triode P3 is connected with emitter or the collector electrode of base stage and the 3rd triode Q3, and collector electrode is connected with one end of the 3rd resistance R 3; The emitter of the second triode Q2 is connected with base stage with one end of the second resistance R 2 and the collector electrode of the 4th positive-negative-positive triode P4 and forms the K electrode of silicon-controlled device, base stage is with the other end of the second resistance R 2, the emitter of the second positive-negative-positive triode P2 is connected with collector electrode or the emitter of base stage and the 3rd triode Q3, and collector electrode is connected with one end of the 4th resistance R 4; The base stage of the 3rd triode Q3 is connected with the other end of the 4th resistance R 4 with the other end of the 3rd resistance R 3; The emitter of the first positive-negative-positive triode P1 is connected with the collector electrode of the second positive-negative-positive triode P2, and the collector electrode of the 3rd positive-negative-positive triode P3 is connected with the emitter of the 4th positive-negative-positive triode P4.
The first triode Q1 and the second triode Q2 are positive-negative-positive triode, and the 3rd triode Q3 is NPN type triode.
The first triode Q1 consists of an active injection region 51 of P+, a N trap 21 and P trap 23; The second triode Q2 consists of the 2nd active injection region 52 of P+, the 2nd N trap 22 and P trap 23; The 3rd triode Q3 consists of a N trap 21, the 2nd N trap 22 and P trap 23; The first resistance R 1 and the 3rd resistance R 3 are the dead resistance of a N trap 21; The second resistance R 2 and the 4th resistance R 4 are the dead resistance of the 2nd N trap 22.
As shown in Fig. 6 (a) and Fig. 7, when esd event occurs in A end, and during K end ground connection, the reverse PN junction generation avalanche breakdown that the voltage that ESD electric current produces on A end can cause a N trap 21 and P trap 23 to form, when the pressure drop that the charge carrier producing when avalanche breakdown produces in the first resistance R 1 reaches the cut-in voltage (0.7V) of the forward diode that an active injection region 51 of P+ and a N trap 21 form, open in parasitic SCR path, and A terminal voltage is clamped to one compared with electronegative potential, ESD electric current now will be released by SCR path.Existence due to positive-negative-positive triode, the reverse PN junction generation avalanche breakdown that the 3rd positive-negative-positive triode P3 can form prior to a N trap 21 and P trap 23, by the 2nd active injection region 42 of N+ adding, provide auxiliary current path, make the first resistance R 1 produce enough pressure drops and allow the first triode Q1 more early open; Therefore trigger voltage is lower than not connecing in the situation of positive-negative-positive triode.Owing to occurring in K end when esd event, and during A end ground connection, if do not add the 4th positive-negative-positive triode P4, ESD stress current can be directly from the reverse parasitic diode path flow of the 3rd positive-negative-positive triode P3 mistake, so need add the anti-situation here of the 4th positive-negative-positive triode P4 to occur.
As shown in Fig. 6 (b) and Fig. 7, when esd event occurs in K end, and during A end ground connection, the reverse PN junction generation avalanche breakdown that the voltage that ESD electric current produces on K end can cause the 2nd N trap 22 and P trap 23 to form, when the pressure drop that the charge carrier producing when avalanche breakdown produces in the second resistance R 2 reaches the cut-in voltage (0.7V) of the forward diode that the 2nd active injection region 52 of P+ and the 2nd N trap 22 form, open in parasitic SCR path, and K terminal voltage is clamped to one compared with electronegative potential, ESD electric current now will be released by SCR path.Simultaneously, also due to the existence of positive-negative-positive triode, the reverse PN junction generation avalanche breakdown that the second positive-negative-positive triode P2 can form prior to the 2nd N trap 22 and P trap 23, by the 3rd active injection region 43 of N+ adding, provide auxiliary current path, make the second resistance R 2 produce enough pressure drops and allow the second triode Q2 more early open; Therefore trigger voltage is lower than not connecing in the situation of positive-negative-positive triode.Simultaneously, also owing to occurring in A end when esd event, and during K end ground connection, if do not add the first positive-negative-positive triode P1, ESD stress current can be directly from the reverse parasitic diode path flow of the second positive-negative-positive triode P2 mistake, so need add the anti-situation here of the first positive-negative-positive triode P1 to occur.
Shown in Fig. 8 present embodiment and traditional double to silicon-controlled device, at ESD stress, by A, held to the current-voltage characteristic under K end, as can be seen from the figure traditional double is 34.5V to the trigger voltage of silicon-controlled device, and the trigger voltage of present embodiment only has 8.97V; Because two kinds of structures are two-way and symmetrical, when ESD stress is by K to A, the current-voltage characteristic curve of gained is symmetrical.Existence due to positive-negative-positive triode, extra auxiliary current path is provided, parasitic triode is opened in advance, greatly reduce the trigger voltage of silicon-controlled device, and can by adjusting the routed size that collapses voltage of the second positive-negative-positive triode and the 3rd positive-negative-positive triode, adjust the size of two-way trigger voltage, be applicable to ESD protection on the sheet below deep-submicron.
Claims (1)
1. the bidirectional triode thyristor device based on positive-negative-positive triode auxiliary triggering, is characterized in that, comprising:
P substrate layer (10) and four positive-negative-positive triodes;
On described P substrate layer (10), be from left to right provided with successively a N trap (21), P trap (23) and the 2nd N trap (22), described P trap (23) is connected with the 2nd N trap (22) side by side with a N trap (21);
On a described N trap (21), be from left to right provided with side by side successively an active injection region of N+ (41), an active injection region of P+ (51) and the 2nd active injection region of N+ (42); On the 2nd described N trap (22), be from left to right provided with side by side successively the 3rd active injection region of N+ (43), the 2nd active injection region of P+ (52) and the 4th active injection region of N+ (44);
A described active injection region of N+ (41) isolates by shallow slot (3) with the 4th active injection region of N+ (44) with the 2nd active injection region of P+ (52) or the 2nd active injection region of P+ (52) with the 3rd active injection region of N+ (43), the 3rd active injection region of N+ (43) with an active injection region of P+ (51), an active injection region of P+ (51) and the 2nd active injection region of N+ (42), the 2nd active injection region of N+ (42);
A described active injection region of N+ (41) is connected by the first metal electrode (61) with an active injection region of P+ (51), and the 2nd described active injection region of P+ (52) is connected by the second metal electrode (62) with the 4th active injection region of N+ (44);
The 3rd described active injection region of N+ (43) is connected with base stage with the emitter of the second positive-negative-positive triode, and the collector electrode of the first positive-negative-positive triode is connected with the first metal electrode (61) with base stage; The 2nd described active injection region of N+ (42) is connected with base stage with the emitter of the 3rd positive-negative-positive triode, and the collector electrode of the 4th positive-negative-positive triode is connected with the second metal electrode (62) with base stage; The emitter of the first positive-negative-positive triode is connected with the collector electrode of the second positive-negative-positive triode, and the collector electrode of the 3rd positive-negative-positive triode is connected with the emitter of the 4th positive-negative-positive triode.
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| CN108461491B (en) * | 2018-03-21 | 2023-09-29 | 湖南静芯微电子技术有限公司 | Low-trigger bidirectional silicon controlled electrostatic protection device with high maintenance voltage |
| US11145641B2 (en) * | 2019-03-21 | 2021-10-12 | Macronix International Co., Ltd. | Electrostatic discharge protection device |
| CN111725205B (en) * | 2019-07-18 | 2023-05-12 | 中国科学院上海微系统与信息技术研究所 | ESD protection device with diagonal bidirectional SCR structure |
| CN111129006B (en) * | 2020-01-20 | 2022-04-15 | 中国科学院微电子研究所 | Bidirectional low-trigger-voltage ESD protection structure for SOI (silicon on insulator) intelligent power integrated circuit |
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| CN101047178A (en) * | 2006-03-31 | 2007-10-03 | 台湾类比科技股份有限公司 | Low trigger voltage silicon control rectifier and its circuit |
| CN101281910A (en) * | 2008-05-28 | 2008-10-08 | 浙江大学 | Polysilicon concatenating diode |
| CN101771045A (en) * | 2010-01-19 | 2010-07-07 | 浙江大学 | Complementary type SCR (Silicon Controlled Rectifier) structure by auxiliary triggering of PNP (positive-negative-positive) bipolar transistors |
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| US7342281B2 (en) * | 2004-12-14 | 2008-03-11 | Electronics And Telecommunications Research Institute | Electrostatic discharge protection circuit using triple welled silicon controlled rectifier |
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| Publication number | Priority date | Publication date | Assignee | Title |
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| CN101047178A (en) * | 2006-03-31 | 2007-10-03 | 台湾类比科技股份有限公司 | Low trigger voltage silicon control rectifier and its circuit |
| CN101281910A (en) * | 2008-05-28 | 2008-10-08 | 浙江大学 | Polysilicon concatenating diode |
| CN101771045A (en) * | 2010-01-19 | 2010-07-07 | 浙江大学 | Complementary type SCR (Silicon Controlled Rectifier) structure by auxiliary triggering of PNP (positive-negative-positive) bipolar transistors |
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