CN102253054B - 偏光膜卷材的品质判断系统及其方法 - Google Patents

偏光膜卷材的品质判断系统及其方法 Download PDF

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Publication number
CN102253054B
CN102253054B CN2011101256416A CN201110125641A CN102253054B CN 102253054 B CN102253054 B CN 102253054B CN 2011101256416 A CN2011101256416 A CN 2011101256416A CN 201110125641 A CN201110125641 A CN 201110125641A CN 102253054 B CN102253054 B CN 102253054B
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defect
coiled material
polarizing film
detected object
film roll
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CN102253054A (zh
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尹永根
朴一雨
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Dongwoo Fine Chem Co Ltd
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Dongwoo Fine Chem Co Ltd
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CN2011101256416A 2010-05-10 2011-05-10 偏光膜卷材的品质判断系统及其方法 Expired - Fee Related CN102253054B (zh)

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KR10-2010-0043677 2010-05-10
KR1020100043677A KR101294218B1 (ko) 2010-05-10 2010-05-10 편광 필름 원반의 품질 판정 시스템 및 방법

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CN102253054A CN102253054A (zh) 2011-11-23
CN102253054B true CN102253054B (zh) 2013-11-13

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JP (1) JP5484392B2 (ja)
KR (1) KR101294218B1 (ja)
CN (1) CN102253054B (ja)
TW (1) TWI428588B (ja)

Families Citing this family (12)

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Publication number Priority date Publication date Assignee Title
KR101315103B1 (ko) * 2013-05-16 2013-10-07 동우 화인켐 주식회사 광학 필름의 결함 판별 방법
KR101349662B1 (ko) * 2013-05-16 2014-01-13 동우 화인켐 주식회사 광학 필름의 결함 판별 방법
CN103489182B (zh) * 2013-09-05 2016-04-20 东华大学 一种基于图像投影和奇异值分解的织物瑕疵检测方法
KR101733018B1 (ko) * 2015-02-25 2017-05-24 동우 화인켐 주식회사 광학 필름의 불량 검출 장치 및 방법
KR101733017B1 (ko) * 2015-02-25 2017-05-24 동우 화인켐 주식회사 광학 필름의 불량 검출 장치 및 방법
CN106426612B (zh) * 2016-11-09 2018-10-30 天津京万科技有限公司 一种混炼胶不合格品自动分拣装置
CN108931529B (zh) * 2018-05-10 2020-12-22 深圳市盛波光电科技有限公司 一种连续生产卷状材料的良率预估方法
CN112304259A (zh) * 2020-11-25 2021-02-02 泰州市华发新型建材厂 一种铝型材平面度检测设备
CN113096078B (zh) * 2021-03-26 2024-02-06 深圳市盛波光电科技有限公司 薄膜类产品的分拣方法、分拣系统、及漏检率的预估方法
CN113145489B (zh) * 2021-04-28 2022-05-20 凌云光技术股份有限公司 一种制袋过程中对缺陷产品进行剔除的系统、方法及设备
CN115870233A (zh) * 2022-09-30 2023-03-31 杭州利珀科技有限公司 偏光膜rtp前制程与rtp制程的联动方法及系统
CN116931505B (zh) * 2023-09-19 2023-12-08 单县祥瑞纺织有限公司 一种基于物联网的码布机布料控制系统

Family Cites Families (8)

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Publication number Priority date Publication date Assignee Title
JPS63133048A (ja) * 1986-11-25 1988-06-04 Fuji Photo Film Co Ltd 表面検査装置の処理回路
JP3974400B2 (ja) 2002-01-07 2007-09-12 日東電工株式会社 シート状成形体の検査結果記録方法及び検査結果記録システム及びロール状成形体
JP3976740B2 (ja) 2004-02-16 2007-09-19 テクノス株式会社 基板検査装置及び検査方法
JP4796860B2 (ja) * 2006-02-16 2011-10-19 住友化学株式会社 オブジェクト検出装置及びオブジェクト検出方法
JP4960161B2 (ja) 2006-10-11 2012-06-27 日東電工株式会社 検査データ処理装置及び検査データ処理方法
KR101410120B1 (ko) * 2007-08-21 2014-06-25 삼성전자주식회사 이동통신시스템에서 복합 자동 재전송을 지원하는 응답 신호를 송수신하는 장치 및 방법
WO2009025210A1 (ja) * 2007-08-23 2009-02-26 Nitto Denko Corporation 積層フィルムの欠陥検査方法およびその装置
CN101861516B (zh) * 2007-10-05 2013-09-11 株式会社尼康 显示器件的缺陷检测方法及显示器件的缺陷检测装置

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Publication number Publication date
JP5484392B2 (ja) 2014-05-07
KR20110124090A (ko) 2011-11-16
TWI428588B (zh) 2014-03-01
CN102253054A (zh) 2011-11-23
JP2011237423A (ja) 2011-11-24
TW201209393A (en) 2012-03-01
KR101294218B1 (ko) 2013-08-07

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