CN102253054B - Polarizing film roll quality judging system and method thereof - Google Patents
Polarizing film roll quality judging system and method thereof Download PDFInfo
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- CN102253054B CN102253054B CN2011101256416A CN201110125641A CN102253054B CN 102253054 B CN102253054 B CN 102253054B CN 2011101256416 A CN2011101256416 A CN 2011101256416A CN 201110125641 A CN201110125641 A CN 201110125641A CN 102253054 B CN102253054 B CN 102253054B
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Abstract
The invention provides a polarizing film roll quality judging system and method thereof. According to the system and the method, the time and the cost for additional detections can be reduced. Meanwhile, coils of higher defect missing rate can also be automatically discriminated. In one embodiment of the invention, the important information of the roll quality based on the detection result data acquired by an optical detector is transmitted to subsequent steps, so that the early warning system function for unqualified coils is realized. Meanwhile, different processes are constructed according to coils of different qualities in subsequent steps.
Description
Technical field
The present invention relates to a kind of quality judging system and method thereof of polarizing film roll, particularly relate to a kind of data of testing result with automatic optical detector and judge system and the method thereof of the quality of polarizing film roll.
Background technology
Produce a kind of manufacturer of the light polarizing film of using as the LCD optical material, in order to detect in real time the product of high-speed production, use inline (IN-LINE) automatic optical detecting system (Automated Optical Inspection system, back is called automatic optical detector).In general, inline automatic optical detector, by in defect, producing marker color or slug shape code on position, is discarded the position that is labeled, or detection is appended at this type of position again in follow-up operation.
But, i) above-mentioned defect is in the situation that produce in continuum on particular point in time, ii) to trickle defect etc. in the situation that can't determine whether clearly substantial defect, due to overload and the H/W performance issue of described automatic optical detector, can occur can not the whole described defective locations of mark problem.
Be not labeled the product of defective locations, have and as substandard product, by identification, be not sent to the possibility of client company yet in subsequent handling.Due to this reason, in subsequent handling, there is detection person again to carry out the final step that detects to product, this visual detection operation has needs a lot of expenses and the problem of time.
In addition, in the prior art, because can only obtain only using the defect generation rate information of the number of defects of measuring in coiled material, so have the problem of the possibility of not considering defect omission (that is, defect is not labeled).
Summary of the invention
[problem that invention will solve]
The present invention completes in view of described problem points, the object of the present invention is to provide a kind of quality judging system and method thereof, and it can improve correctness and reliability to the quality judgement of polarizing film roll.
Other purposes of the present invention are to provide a kind of quality judging system and method thereof, it obtains the important information of judgement coiled material quality and these important informations is communicated to subsequent handling by the testing result data with automatic optical detector, fulfils thus the function as the early warning system for defective coiled material.
Other purposes more of the present invention are to provide a kind of quality judging system and method thereof, and it there will be the coiled material of higher defect missing rate automatically to screen for being contemplated for.
[method of dealing with problems]
According to one embodiment of present invention, provide a kind of quality judging system of polarizing film roll, this system comprises: storage part, the testing result data that its storage obtains from the automatic optical detector that polarizing film roll is carried out defects detection; Defect data analysis section, its defect of calculating the constituent parts zone of detected object coiled material according to the defective locations information in described testing result data of being contained in produces density, and produces density according to described defect and become defect concentration abnormal area more than setting and figure out the defect concentration abnormal index of described detected object coiled material; And coiled material quality judging part, when the permissible value that its abnormal index of defect concentration at described detected object coiled material becomes regulation is above, described detected object coiled material is judged as defective coiled material.
In one embodiment, also comprise that the testing result data with described automatic optical detector are converted to the data-switching section of general format, described defect data analysis section can, according to the testing result data that are converted to described general format, carry out data analysis.
In one embodiment, described defect data analysis section,, according to the fleck defect information that is contained in described testing result data, further calculate the fleck defect number of the fleck defect number in described detected object coiled material divided by resulting each unit length of length of described detected object coiled material
Described coiled material quality judging part, judge according to the fleck defect number of described each unit length of calculating whether coiled material is defective,
Calculating of the fleck defect number of described each unit length, can distinguish by described automatic optical detector the fleck defect that is judged as OK and the fleck defect that is judged as NG and carry out respectively among described fleck defect.
In one embodiment, in described testing result data, comprise the defect pattern information that detects by described automatic optical detector, described pattern-information comprises width, length, form, circle, the linear information of described defect,
Described defect data analysis section,, according at least one among described pattern-information, further calculate the open defect number of detected object coiled material or the open defect number of each unit length,
Here, described open defect comprises: at least one among the striped of the striped of inhomogeneous, the coating of the gauffer of TAC (cellulose triacetate sheet base) film, the gauffer of PVA (polyvinyl alcohol (PVA)) film, bottom TAC film, the striped of tack coat and extruding property
Described coiled material quality judging part, can at the open defect number of described open defect number or described each unit length when the permissible value of regulation is above, be judged as defective coiled material with described detected object coiled material.
In one embodiment, described defect data analysis section, the defect that the defect of calculating respectively each the first unit area of described detected object coiled material produces density and each the second unit area produces density,
Here, each distinguishable region when described the first unit area is equivalent to described detected object coiled material is divided into the ranks form of N * M, each distinguishable region when described the second unit area is equivalent to the length of described detected object coiled material is divided into the L equal portions
Described defect concentration abnormal area number, can be equivalent to the defect of described each the first unit area is produced density is the number of the first unit area more than the 3rd permissible value, producing density with the defect of described each the second unit area is the number of the second unit area more than the 4th permissible value, the value of carrying out addition.
In one embodiment, described defect data analysis section, for the polarizing film roll of not implementing coating state and the polarizing film roll of implementing coating state, the defect of carrying out respectively described each unit area produces calculating of density,
Described coiled material quality judging part, can in following wherein any one situation, polarizing film roll be judged as defective coiled material, that is: for the described polarizing film roll of not implementing coating state, it does not implement the situation of defect concentration abnormal index more than the 5th permissible value of regulation of coating; And for the polarizing film roll of described enforcement coating state, the situation of the defect concentration abnormal index of applied layer more than the 6th permissible value of regulation in fact.
In one embodiment, described defect data analysis section, given the value of the first weighted value, and the defect concentration abnormal index of described enforcement coating given the value of the second weighted value to the described defect concentration abnormal index of not implementing coating, carry out addition and calculate that density anomaly adds and index
Described coiled material quality judging part, can add with index and when above, described polarizing film roll is judged as defective coiled material at the 7th permissible value of regulation in the described density anomaly of calculating.
Here, with described density anomaly, add with index and carry out size described the 7th permissible value relatively, the defect missing rate of the probability that can not be labeled according to the defect that is judged as NG by described automatic optical detector calculates.
According to other embodiments of the invention, a kind of quality determination methods of polarizing film roll is provided, the method is to use the testing result data that polarizing film roll is carried out the automatic optical detector of defects detection to judge the method for the quality of detected object coiled material, and the method comprises: the defect of calculating the constituent parts zone of detected object coiled material according to the defective locations information in described testing result data of being contained in produces the step of density; Producing density according to described defect becomes defect concentration abnormal area more than setting and figures out the step of the defect concentration abnormal index of described detected object coiled material; Become the permissible value of regulation at the defect concentration abnormal index of described detected object coiled material and described detected object coiled material is judged as when above the step of defective coiled material.
[invention effect]
, according to embodiments of the invention, can improve correctness and the reliability of the quality judgement of polarizing film roll.
In addition, according to embodiments of the invention, obtain the important information of judgement coiled material quality and these important informations are communicated to subsequent handling by the testing result data with automatic optical detector, fulfil thus the function as the early warning system for defective coiled material, can construct different technique according to the difference of coiled material quality in subsequent handling and can reduce and append needed expense and the time detected.
Also have,, according to embodiments of the invention, can there will be the coiled material of higher defect missing rate automatically to screen for being contemplated for.
Description of drawings
Fig. 1 carries out the schematic diagram of an example of the automatic optical detector of defects detection to polarizing film roll.
Fig. 2 is for the quality judging system of the polarizing film roll of the explanation embodiment of the present invention and the schematic diagram that uses the quality determination methods of this system.
Fig. 3 is for the quality judging system of the polarizing film roll of the explanation embodiment of the present invention and the schematic diagram that uses the quality determination methods of this system.
Fig. 4 carries out the schematic diagram of flaw labeling to polarizing film roll.
Fig. 5 is by the schematic diagram of defect data analysis section to the computing method of defect concentration abnormal area number for explanation.
Fig. 6 is by the schematic diagram of defect data analysis section to the computing method of defect concentration abnormal area number for explanation.
Fig. 7 A is the fold schematic diagram of TAC film.
Fig. 7 B is the schematic diagram for the feature of the defect of the fold of explanation TAC film.
Fig. 7 C is the schematic diagram for the feature of the defect of the fold of explanation TAC film.
Fig. 8 is the schematic diagram for seven standards of the coiled material quality judgement of one embodiment of the present of invention.
Fig. 9 is the schematic diagram for the mutual relationship between description defect density anomaly exponential sum defect missing rate.
Figure 10 is used for illustrating the schematic diagram of defective coiled material determination methods according to the defect concentration abnormal index.
[description of reference numerals]
110 storage parts
120 data-switching sections
130 defect data analysis sections
140 coiled material quality judging parts
Embodiment
The present invention can give multiple change, has various embodiment, and specific embodiment as shown in drawings, is described in detail.But this not is defined in specific example with the present invention, and is construed as all changes that comprise in design of the present invention and technical scope, is equal to substitute and sub all belongs to protection scope of the present invention.
When carrying out explanation of the present invention,, to illustrating when being judged as when instead making main points of the present invention unclear of related known technology, omit this detailed explanation.In addition, the numeral used in declarative procedure of this instructions (such as first, second etc.) be for an inscape being different from the identifying label of other inscapes.
Below, at first automatic optical detector is illustrated tout court in order to help to understand the present invention.Fig. 1 carries out the schematic diagram of an example of the automatic optical detector of defects detection to polarizing film roll.
The light polarizing film of producing, be to preserve by the form of coiled material, and such polarizing film roll is uncoiled from uncoiling section (not shown) when defects detection, by the direction carrying of roller 12 to regulation.At this moment, the transporting velocity of light polarizing film 10, read by such speed detection device such as scrambler 11 grades, the generation of the defective locations information after being used to.
Here, described automatic optical detector comprises possessing at least one lighting device 21 and the optical devices 20 of the camera head 22 of corresponding at least one therewith, can obtain the optical image of light polarizing film thus in described carrying.
The formation of optical devices 20 and design, corresponding to the project of the defect that need to detect with described automatic optical detector (namely, kind and content) difference and difference, common automatic optical detector to light polarizing film see through that detection, reflection detect, the polarisation blocking detect (also referred to as intersect (cross) detect) etc.
Therefore, optical devices 20 are designed to, the project of the defect that detects corresponding to needs drives indirect illumination (and therewith corresponding camera head) and transmission illumination (and the camera head of correspondence) therewith by optionally or arranged side by side property ground, thereby can obtain be used to the optical image that detects various defect types.
Like this, the optical image that will obtain from optical devices 20, be conveyed in image analysing computer/pick-up unit 40, and the optical image that image analysing computer/pick-up unit 40 is communicated by analysis can detect the various defects that exist in polarizing film roll.In addition, the defective data that 40 generations of image analysing computer/pick-up unit are detected (below, be called the testing result data), and with its storage.
At this moment, produce position based on the defect of described testing result data and be communicated to Mk system 30, the marking of control section 32 of described Mk system 30, be labeled as Flaw display by control mark unit 31 on the described light polarizing film that produces position corresponding to described defect.
In addition, described testing result data, can be sent to this result of the output such as output unit 50, display device 60, and can be sent to gerentocratic server 70 and store and manage.
After described defects detection finished, light polarizing film can be reeled again by winder (not shown), with the form of original such coiled material, took care of.
Below, according to Fig. 2 and Fig. 3, and with reference to Fig. 4～Figure 10, to the quality determination methods of the polarizing film roll of the embodiment of the present invention with and system describe.
Fig. 2 and Fig. 3 are for the quality judging system of the polarizing film roll of the explanation embodiment of the present invention and the schematic diagram that uses the quality determination methods of this system.
The quality judging system of polarizing film roll of the present invention with and method, as shown in Figure 2, substantially be divided into three steps and carry out.Be divided into specifically the switch process (S100) of the testing result data of automatic optical detector, the analytical procedure (S200) of defective data and coiled material quality determining step (S300).
Namely, the invention provides a kind of new method, the testing result data that the method will obtain from the automatic optical detector that polarizing film roll is carried out optical defects detection are as its basis, and judgement needs the quality of the polarizing film roll that detects (below, be called the detected object coiled material).Quality determination methods and system by polarizing film roll of the present invention, when can carry out the coiled material quality judgement of high reliability more, also can obtain forming the various information of standard of the quality level of different coiled materials, therefore can construct the subsequent handling flow process that conforms to the quality of each coiled material.
This can more clearly understand by explanation afterwards.Below, with reference to Fig. 3, described each step (S100, S200, S300) is described successively.Simultaneously, below the main body of each step of carrying out of explanation, both can separate and realize independently from described automatic optical detector, also can realize with the form that automatic optical detector is combined with one.
In addition, each step of coiled material quality determination methods described later, (for example also can be included in the computer-readable recording medium of the program that has recorded the command language that is used for these steps of execution, hard disk, CD etc.) in and be provided, this is apparent for those of ordinary skills.
The switch process of testing result data (S100)
The testing result data of automatic optical detector, normally store with database (database) or the such file layout of Excel form.Automatic optical detector, can generate and store brightness, width, length, size (area), form (circle/linear) as the defect to the testing result of each coiled material batch (LOT), detect the various data such as optics group (blocking of projection/reflection/polarisation).
When the data of described testing result data transmit, in order to ensure most of users or gerentocratic close relationship, can use FTP (file transfer protocol) here.The testing result data that are transmitted like this can store in the interior storage part 110 of coiled material quality judging system of the present invention, for the assay format unification can be converted into by data-switching section 120 general format of regulation.Here, described general format, refer to the markup language of data language, can be such as XML (Extensible Markup Language), HTML etc.Therefore, later data analysis, can carry out with XML of having changed etc.
But, the switch process (S100) of testing result data as described above, due to different the obtaining of form of the detection machine of different rows storage data, so in order to analyze the data that obtain from the detection machine of different machines, need to be converted into the general format of having unified.Different therewith, detect the form of storage data of machine all identical the time, can omit this step.And then, also can carry out data analysis according to the form of each data when the form of each storage data is different, therefore can certainly omit under these circumstances.
The analytical procedure of defective data (S200)
The analytical procedure of defective data (S200), in each coiled material LOT, as shown in Figure 8, can calculate the work of seven quality criterions altogether.With reference to Fig. 8, described seven quality criterions comprise three defect concentration abnormal indexs (combined index/do not implement coating index/enforcement coating index), two bright spot DPM (bright spot DPM (OK), bright spot DPM (NG)), major defect number, total mark DPM.
But quality criterion shown in Figure 8 is not or not all essential, clearly both can only use these a part, perhaps can further use other the quality criterion that comprises these yet.
That is, suppose in the present embodiment and illustrated, calculating whole analysis results (numerical value) of described seven quality criterions, the coiled material that any one among described seven standards is shown as the above value of the permissible value of regulation is judged as defective coiled material.But, clearly also can analyze at least one among described seven standards, thereby be judged as YES defective coiled material.
Below, described seven quality criterions are described in order.The analysis of the defective data that this step is carried out, undertaken by defect data analysis section 130.
Calculate the defect concentration abnormal index
As shown in Figure 4, automatic optical detector is to each coiled material LOT, and record is with respect to the mark position of the width/height of coiled material.The length of the coiled material in this instructions, be defined as by the working direction corresponding length of automatic optical detector with the coiled material carrying; The width of coiled material, be defined as the corresponding length of the direction that intersects vertically with this working direction.
Defect data analysis section 130 in coiled material quality judging system of the present invention, from the testing result data of automatic optical detector, obtain as shown in Figure 4 " flaw labeling figure (defective locations information) " (S210), its each interval defect of being analyzed and calculating coiled material is produced density.
Each interval defect according to coiled material produces calculating of density, be coiled material to be divided into each unit area of regulation, and the defect of calculating in each unit area of having been divided like this produces density (S212).Be described with reference to Fig. 5, as follows.
" defect of regional produces density ", as shown in Figure 5, calculate this numerical value of each unit area of M/D direction (length direction of coiled material) and T/D direction (Width of coiled material) setting, this density calculation method, can calculate by following formula (1).
[several 1]
MD
i＝MC
i/(W
m·H
m)、
TD
i＝TC
i/(W
f·H
f)---(1)
Here, MC
iMD
iThe overall defect number in zone, TC
iTD
iThe overall defect number in zone.
That is, the defect of each unit area in the M/D direction produces density (that is, MD
i), overall defect number (that is, the MC that exists in divided each unit area by the detected object coiled material is divided into the ranks form of N * M
i), divided by area (that is, the W of this unit area
mH
m) calculate.And the defect of each unit area in the T/D direction produces density (that is, TD
i), be divided into the L equal portions and overall defect number (that is, the TC that exists in divided each unit area by the length with the detected object coiled material
i), divided by area (that is, the W of this unit area
fH
f) calculate.
Here, the W of the unit area of the unit area of the M/D direction in the coiled material of definition, T/D direction
m, H
m, H
f, as setup parameter, also can constitute changeably and have suitable value in design.And, W
fAs the width of coiled material and be set.
Afterwards, defect data analysis section 130, as described above, calculate defect concentration abnormal area number (S214) according to the defect generation density of each unit area of calculating.
" defect concentration abnormal area number ", be to produce density for the defect calculated, as surpassing by the sum in the zone of the predefined reference value of described coiled material quality judging system, calculated.Fig. 6 calculates defect that the relative defect of the M/D direction of each unit area produces density and T/D direction to produce the schematic diagram of the example of density, suppose respectively the density benchmark value of M/D direction is set as 3, the density benchmark value of T/D direction is set as 1, described defect concentration abnormal area number is, it is 4 in the M/D direction in the zone that surpasses described reference value, in the T/D direction be 1, total is 5.
That is, described defect concentration abnormal area number of calculating, be in each unit area in coiled material, the degree of the intensive generation of defect, the value of the visual defects closeness that namely quantizes.So-called defect closeness is higher, means defect concentrated and generation continuously at particular point in time (that is, between the given zone in coiled material).
Therefore, when defect is concentrated and is produced continuously between given zone, because the defect detection operation of automatic optical detector produces overload, so because the performance issue of system causes and can not the probability of happening that all defects are all carried out mark be uprised.Calculating of defect concentration abnormal area number, in the possibility of omitting in judgement defect as described above (that is, have the NG defect, and the possibility that is not labeled) time, be used effectively.That is, the density value that the defect closeness has been quantized, owing to the defect missing rate, close relationship being arranged, so constitute the main project of coiled material quality judgement.
As mentioned above, after calculating defect concentration abnormal area number, defect data analysis section 130,, according to predefined mode, calculate the defect concentration abnormal index (S216) that exponentiate has showed with the defect concentration abnormal area number of calculating.
" defect concentration abnormal index " as shown in Figure 8, calculate respectively " combined index ", " not implementing the index of coating ", " implementing the index of coating ", this be for " defect concentration abnormal area number " divided into do not implement coating detect machine, implement coating detect machine each and with the combined index that they combine, utilize at the defective coiled material determining step that has used EW (Early Warning) index afterwards.
In order to distinguish and calculate such " not implementing the index of coating " and " implementing the index of coating ", defect data analysis section 130 in coiled material quality judging system of the present invention, can distinguish the polarizing film roll of not implementing coating state and the situation of implementing the polarizing film roll of coating state from the step of calculating of described " defect generation density ", and carry out described density and calculate work.
Here, described " not implementing the index of coating " and " implementing the index of coating ", for example can calculate by following formula (2).
[several 2]
Do not implement the index of coating=(A/C) 1000
Implement the 1000---(2) of the index of coating=(B/C)
Here, A is the defect concentration abnormal area number with respect to the polarizing film roll of not implementing coating state, and B is that C means the length of the polarizing film roll of detected object with respect to the defect concentration abnormal area number of the polarizing film roll of implementing coating state.In addition, in described formula (2), take advantage of when calculating each index 1000, be to produce density for the defect of calculating each 1000m.
In addition, described " combined index " is for example shown in formula described as follows (3), can detect machine and implement data that coating detection machine calculates (herein never implementing respectively coating, refer to above-mentioned " not implementing the index of coating " and " implementing the index of coating ") in, calculate by the weighted value of giving respectively regulation.
[several 3]
Combined index=the do not implement index a of coating
1The index a of+enforcement coating
2
＝[(A·a
1+B·a
2)/C]·1000---(3)
Here, a
1Mean the weighted value that the index of not implementing coating is given, a
2Mean the weighted value that the index of implementing coating is given, a
1And a
2Can be set as greater than 0 less than or equal to 1.
As mentioned above, combined index will not implemented the index of coating and the index of enforcement coating is distinguished in order to calculate, and the reason of giving respectively the weighted value of regulation is, do not implement the defect concentration that exists in the polarizing film roll of coating state, with the defect concentration that exists in the polarizing film roll of implementing coating state, after the judgement of defective coiled material the time, can utilize as different importance degrees mutually.Therefore, can make described each weighted value be set as suitable value corresponding to the characteristic of the production process of light polarizing film.
Bright spot DPM calculates
Fleck defect be the size of defect for less fine defects, owing to being difficult to carry out identification by visual detection, the defect type of difficulty very while being defective detecting.Therefore, coiled material quality judging system of the present invention, classify bright spot DPM separately according to the DPM of different defect kinds, and it is used in defective coiled material judgement.In addition, described bright spot DPM, the subsequent handling after defective coiled material judgement is passed on, and in subsequent handling, as Useful Information, uses.
Described DPM (Defect per meter) produces the defect in coiled material the value of frequency number value, is defined as the value of the generation number of whole defects divided by web length.
Total fleck defect number in the coiled material of calculating middle necessity of described bright spot DPM, obtain (S220) in fleck defect (bright defect) information that can comprise from the testing result data of automatic optical detector.The testing result data of automatic optical detector, also can comprise by polarisation and interdict the fleck defect information that detection (cross detection) detects.Blocking detects according to polarisation, all light (comprising polarisation) all becomes and does not see through light polarizing film, but the defect due to light polarizing film, the zone (position) that the polarisation of a part sees through the part of light polarizing film produces fleck defect, and such fleck defect information just is recorded in described testing result data.
Therefore, the defect data analysis section 130 in coiled material quality judging system of the present invention, can calculate fleck defect number in coiled material based on the fleck defect information that comprises in described testing result data, like this, just can calculate bright spot DPM (S222).In an embodiment of the present invention, described bright spot DPM can calculate by following formula (4).
[several 4]
Here, described S
iBe to be detected (being monitored) by automatic optical detector, but be not judged as the fleck defect that carries out mark because defect level is lower, that is, be meant to be the fleck defect that is judged as OK, T
iBe to be judged the fleck defect that carries out mark, that is, be meant to be the fleck defect that is judged as NG.
Described fleck defect (the S that is judged as OK
i), in the situation that each single pixel is difficult to be judged as the trickle defect of defect, many but if these trickle defect numbers become, perhaps at a place, concentrate the words that distribute, just can be used as defective estimative trickle defect, so the bright spot DPM (that is, with reference to described bright spot DPM (NG)) to the fleck defect that is judged as NG in the present embodiment is also calculated separately together with bright spot DPM (OK).Therefore, coiled material quality judging system of the present invention, consider that the significance level of fleck defect can be considered bright spot DPM (NG) and bright spot DPM (OK) simultaneously.
Calculating of major defect number
The coiled material quality judging system of the embodiment of the present invention,, except described " fleck defect ", can also form in the mode of selecting other various major defect types and calculate.
Therefore, described major defect number, the generation number that means the specified defect type that is defined in system of the present invention, in major defect, such as " gauffer of TAC film ", " gauffer of PVA film ", " bottom TAC film inhomogeneous ", " striped of AS coating ", " striped of NCFT/D (striped of tack coat) ", " striped of extruding property " etc. arranged.
Described PVA film; be utilized usually used as the polarization element that shows polarized light property; form the core layer of light polarizing film; described TAC film is used for supporting and protecting described PVA film; be layered on the two sides of described PVA film core layer, tack coat be used for after be attached to light polarizing film on liquid crystal panel and be stacked in described TAC film.In addition, described AS coating, mean that the static of light polarizing film prevents from using coating, and the striped of extruding property means the striped that is produced by the roller extruding when automated optical detects.
Described such six kinds of defect types, be that discrimination power is lower, and are higher in the generation frequency of specific region, whole generation defects all can not be carried out the representative types of the higher defect cluster of the danger of mark by automatic optical detector.Therefore, coiled material quality judging system of the present invention, automatically identify the generation number of packages of described such major defect and be used in simultaneously the judgement of coiled material quality.But described major defect is an example only, carries out different selections from described example and obviously also is fine.
Described such major defect number, the defect pattern information that comprises in can the testing result data according to automatic optical detector is calculated (S230).In described testing result data, about the defect of the defect that detects, produce form, can comprise the pattern-information of the size, width, length, area, circle/linear etc. of described defect.Therefore, the defect data analysis section 130 of coiled material quality judging system of the present invention, be the feature that has quantized with the Feature Conversion of apparent defect by using described defect pattern data, just can the such major defect (S232) of the described example of identification.
For example, in the time of " gauffer of TAC film ", as shown in Figure 7 A, as a rule this defect form is circle possibility is lower, and the ratio of the length/width of defect is higher, that is, compare with the width of defect and have the larger apparent feature of length.About this point, with reference to Fig. 7 B and Fig. 7 C, when the length of defect divided by the width gained ratio of defect be more than 2, defect area divided by the longest length with defect as the area gained ratio of the circle of the supposition of diameter be below A, when defect area is defect more than B, it is judged as described " gauffer of TAC film ", is the sort of example.
As mentioned above, the defect data analysis section 130 in coiled material quality judging system of the present invention, the apparent feature that manifests according to each defect, the combination by the characteristic data to defect quantizes each major defect form and carry out identification.At this moment, the distinctive pattern-information that manifests in each major defect (the identification key element of defect type), can detect cumulative data by the past of analyzing automatic optical detector and obtain.In addition, can certainly use various statistical methods as the method for the identification key element of searching for each defect type.
As the example relevant with described " gauffer of TAC film ", " major defect number " sets various identification key elements for specific specified defect type in advance, will meet this defect that imposes a condition and identify as major defect.At this moment, the same in the time of with described " fleck defect ", also investigate simultaneously the defect that is judged as OK and the defect that is judged as NG during the major defect identification.This be because, defect generation information unsuccessful from marker for judgment, that discrimination power is lower can be offered subsequent handling, utilize as unusual Useful Information.At this moment, described major defect number, can show by DPM.
Total mark DPM calculates
" total mark DPM " from automatic optical detector as by flaw labeling DPM calculated." total mark DPM " calculates (S242) and can obtain by following formula (5).
[several 5]
Here, flaw labeling (M
i) number, the flaw labeling information that comprises in can the testing result data according to automatic optical detector is calculated (S240).Described total mark DPM means that the defect in coiled material produces the value of frequency, and the big event that judges as quality afterwards uses.
Coiled material quality determining step (S300)
, in this step, use seven information altogether of " the defect concentration abnormal index " of calculating in the analytical procedure (S200) of described defective data (combined index/do not implement coating index/enforcements coating index), " bright spot DPM (OK/NG) ", " major defect number " and " total mark DPM " to distinguish defective coiled material.This can be undertaken by the coiled material quality judging part 140 in system of the present invention.
As shown in Figure 8, even any one project among seven standards that are used for the judgement of coiled material quality surpasses permissible value (the EW benchmark of regulation, during with reference to k1～k7), coiled material quality judging part 140 can judge that also corresponding coiled material is defective coiled material (S310, S320, S330, S340).Described EW benchmark, can be set as defective coiled material is screened in the volume production process correctness and be the suitable value that has been verified.
Fig. 9 show the defect missing rate (that is, NG defect unsuccessful ratio from mark) of each coiled material LOT and with " combined index " mark in the EW index example.Coiled material quality judging part 140, for example in order to ensure the defect missing rate in the level of quality below 0.3%, setting " EW benchmark (combined index) " according to described Fig. 9 is k
1(k here,
1Positive number), thus will be judged as over the coiled material of described permissible value defective coiled material.
Therefore,, for the correctness of defective coiled material judgement, by the mark relation of the defect missing rate to different coiled materials and each EW index, carry out the cumulative statistics work of statistical correlationship, be necessary to set suitable " EW benchmark ".
By described such method, in case suitable " EW benchmark " is set, " EW benchmark " (with reference to Fig. 9 and the Figure 10) that by use, is set, can screen over the defective coiled material of this benchmark (permissible value) with not over the coiled material of this benchmark.Namely, according to coiled material quality judging system of the present invention and method, by defective coiled material being carried out early warning (Early Warning), confirm in advance in subsequent handling being contemplated for the higher coiled material LOT of defect missing rate, other operation of the defect omission that can prevent this coiled material can be set.In addition, the coiled material LOT that is screened for not having as defective coiled material, also can not use other visual detection in subsequent handling, perhaps can simplify the detection operation, therefore has advantages of and can reduce time and the expense of appending detection.Figure 9 illustrates, in eight coiled material LOT altogether, for EW index k
1, with six interior coiled materials, even do not carry out other detection in subsequent handling, can not guarantee that missing rate is at the quality level below 0.3% yet.
Above,, although with reference to embodiments of the invention, describe the present invention, be to be understood that for those skilled in the art and can carry out various modification and change to the present invention in the situation that do not take off design and the scope that the present invention puts down in writing.
Claims (11)
1. the quality judging system of a polarizing film roll, is characterized in that, described quality judging system comprises:
Storage part, the testing result data that its storage obtains from the automatic optical detector that polarizing film roll is carried out defects detection;
Defect data analysis section, its defect of calculating the constituent parts zone of detected object coiled material according to the defective locations information in described testing result data of being contained in produces density, and produces density according to described defect and become defect concentration abnormal area more than setting and figure out the defect concentration abnormal index of described detected object coiled material; And
Coiled material quality judging part, when the permissible value that its abnormal index of defect concentration at described detected object coiled material becomes regulation is above, be judged as defective coiled material with described detected object coiled material;
Described defect data analysis section, for the polarizing film roll of not implementing coating state and the polarizing film roll of implementing coating state, the defect of carrying out respectively described each unit area produces calculating of density;
Described coiled material quality judging part, in following wherein any one situation, polarizing film roll is judged as defective coiled material, that is: for the described polarizing film roll of not implementing coating state, it does not implement the situation of defect concentration abnormal index more than the 5th permissible value of regulation of coating; And for the polarizing film roll of described enforcement coating state, the situation of the defect concentration abnormal index of applied layer more than the 6th permissible value of regulation in fact;
Described defect data analysis section, the described defect concentration abnormal index of not implementing coating has been given the value of the first weighted value, given the value of the second weighted value with the defect concentration abnormal index to described enforcement coating, carried out addition and calculate that density anomaly adds and index;
Described coiled material quality judging part, add with index and when above, described polarizing film roll be judged as defective coiled material at the 7th permissible value of regulation in the described density anomaly of calculating.
2. the quality judging system of polarizing film roll according to claim 1, is characterized in that,
Also comprise that the testing result data with described automatic optical detector are converted to the data-switching section of general format,
Described defect data analysis section can, according to the testing result data that are converted to described general format, carry out data analysis.
3. the quality judging system of polarizing film roll according to claim 1, is characterized in that,
Described defect data analysis section,, according to the fleck defect information that is contained in described testing result data, further calculate the fleck defect number of the fleck defect number in described detected object coiled material divided by resulting each unit length of length of described detected object coiled material;
Described coiled material quality judging part, judge according to the fleck defect number of described each unit length of calculating whether coiled material is defective;
Calculating of the fleck defect number of described each unit length is to distinguish the fleck defect that is judged as OK and the fleck defect that is judged as NG to carry out respectively by described automatic optical detector among described fleck defect.
4. the quality judging system of polarizing film roll according to claim 1, is characterized in that,
In described testing result data, comprise the defect pattern information that detects by described automatic optical detector, described pattern-information comprises width, length, form, circle, the linear information of described defect;
Described defect data analysis section, by with at least one among described pattern-information with the major defect processing that quantizes, further calculate the major defect number of detected object coiled material or the major defect number of each unit length;
Described major defect comprises: at least one among the striped of the striped of inhomogeneous, the coating of the gauffer of the gauffer of TAC film, PVA film, bottom TAC film, the striped of tack coat and extruding property;
Described coiled material quality judging part, when the permissible value of regulation is above, be judged as defective coiled material with described detected object coiled material at the major defect number of described major defect number or described each unit length.
5. the quality judging system of polarizing film roll according to claim 1, is characterized in that,
Described defect data analysis section, the defect that the defect of calculating respectively each the first unit area of described detected object coiled material produces density and each the second unit area produces density;
Each distinguishable region when described the first unit area is equivalent to described detected object coiled material is divided into the ranks form of N * M, each distinguishable region when described the second unit area is equivalent to the length of described detected object coiled material is divided into the L equal portions;
Described defect concentration abnormal area number, be equivalent to the defect of described each the first unit area is produced the number that density is the first above unit area of the 3rd permissible value, producing density with the defect of described each the second unit area is the number of the second unit area more than the 4th permissible value, the value of carrying out addition.
6. the quality judging system of polarizing film roll according to claim 1, it is characterized in that, adding with index and carry out size described the 7th permissible value relatively with described density anomaly, is that the defect missing rate of the probability that is not labeled according to the defect that is judged as NG by described automatic optical detector calculates.
7. the quality determination methods of a polarizing film roll, the method are to use the testing result data that polarizing film roll is carried out the automatic optical detector of defects detection to judge the method for the quality of detected object coiled material, it is characterized in that, the method comprises:
The defect of calculating the constituent parts zone of detected object coiled material according to the defective locations information in described testing result data of being contained in produces the step of density;
Producing density according to described defect becomes defect concentration abnormal area more than setting and figures out the step of the defect concentration abnormal index of described detected object coiled material;
Become the permissible value of regulation at the defect concentration abnormal index of described detected object coiled material and described detected object coiled material is judged as when above the step of defective coiled material;
The defect of described each unit area produces calculating of density, is the polarizing film roll of not implementing coating state and the polarizing film roll of implementing coating state are carried out respectively;
Judge that described detected object coiled material is underproof step, described detected object coiled material to be judged as the step of defective coiled material in following wherein any one situation, that is: for the described polarizing film roll of not implementing coating state, it does not implement the situation of defect concentration abnormal index more than the 5th permissible value of regulation of coating; And for the polarizing film roll of described enforcement coating state, the situation of the defect concentration abnormal index of applied layer more than the 6th permissible value of regulation in fact;
The described defect concentration abnormal index of not implementing coating has been given the value of the first weighted value, and the defect concentration abnormal index of described enforcement coating has been given the value of the second weighted value, carried out addition and calculate density anomaly adding step with index;
Judging that described detected object coiled material is underproof step, is to add with index and described detected object coiled material is judged as when above the step of defective coiled material at the 7th permissible value of regulation in the described density anomaly of calculating.
8. the quality determination methods of polarizing film roll according to claim 7, is characterized in that, also comprises:
, according to the fleck defect information that is contained in described testing result data, calculate the step of the fleck defect number in described detected object coiled material divided by the fleck defect number of resulting each unit length of length of described detected object coiled material;
The fleck defect number of described each unit length when the permissible value of regulation is above, is judged as described detected object coiled material the step of defective coiled material,
Calculating of the fleck defect number of described each unit length is to distinguish the fleck defect that is judged as OK and the fleck defect that is judged as NG to carry out respectively by described automatic optical detector among described fleck defect.
9. the quality determination methods of polarizing film roll according to claim 7, is characterized in that, also comprises:
In described testing result data, comprise the defect pattern information that detects by described automatic optical detector, described pattern-information comprises width, length, form, circle, the linear information of described defect,
By with at least one among described pattern-information with the major defect processing that quantizes, further calculate the step of the major defect number of the major defect number of detected object coiled material or each unit length;
Described major defect comprises: at least one among the striped of the striped of inhomogeneous, the coating of the gauffer of the gauffer of TAC film, PVA film, bottom TAC film, the striped of tack coat and extruding property,
When the permissible value of regulation is above, described detected object coiled material is judged as the step of defective coiled material at the major defect number of described major defect number or described each unit length.
10. the quality determination methods of polarizing film roll according to claim 7, is characterized in that,
The step that the defect of calculating described each unit area produces density is that the defect that the defect of calculating respectively each the first unit area of described detected object coiled material produces density and each the second unit area produces density;
Each distinguishable region when described the first unit area is equivalent to described detected object coiled material is divided into the ranks form of N * M, each distinguishable region when described the second unit area is equivalent to the length of described detected object coiled material is divided into the L equal portions;
Described defect concentration abnormal area number, be equivalent to the defect of described each the first unit area is produced the number that density is the first above unit area of the 3rd permissible value, producing density with the defect of described each the second unit area is the number of the second unit area more than the 4th permissible value, the value of carrying out addition.
11. the quality determination methods of polarizing film roll according to claim 7, it is characterized in that, adding with index and carry out size described the 7th permissible value relatively with described density anomaly, is that the defect missing rate of the probability that is not labeled according to the defect that is judged as NG by described automatic optical detector calculates.
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| KR10-2010-0043677 | 2010-05-10 | ||
| KR1020100043677A KR101294218B1 (en) | 2010-05-10 | 2010-05-10 | System and method for evaluating quality of polarized film |
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| CN102253054A CN102253054A (en) | 2011-11-23 |
| CN102253054B true CN102253054B (en) | 2013-11-13 |
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|---|---|
| JP (1) | JP5484392B2 (en) |
| KR (1) | KR101294218B1 (en) |
| CN (1) | CN102253054B (en) |
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| KR101315103B1 (en) * | 2013-05-16 | 2013-10-07 | 동우 화인켐 주식회사 | Method for discriminating defect of optical films |
| KR101349662B1 (en) * | 2013-05-16 | 2014-01-13 | 동우 화인켐 주식회사 | Method for discriminating defect of optical films |
| CN103489182B (en) * | 2013-09-05 | 2016-04-20 | 东华大学 | A kind of fabric defects detection method based on image projection and svd |
| KR101733018B1 (en) * | 2015-02-25 | 2017-05-24 | 동우 화인켐 주식회사 | Apparatus and method for detecting defect of optical film |
| KR101733017B1 (en) * | 2015-02-25 | 2017-05-24 | 동우 화인켐 주식회사 | Apparatus and method for detecting defect of optical film |
| CN106426612B (en) * | 2016-11-09 | 2018-10-30 | 天津京万科技有限公司 | A kind of rubber compound defective work automatic sorting device |
| CN108931529B (en) * | 2018-05-10 | 2020-12-22 | 深圳市盛波光电科技有限公司 | Yield estimation method for continuously producing roll-shaped materials |
| CN112304259A (en) * | 2020-11-25 | 2021-02-02 | 泰州市华发新型建材厂 | Aluminum profile flatness detection equipment |
| CN113096078B (en) * | 2021-03-26 | 2024-02-06 | 深圳市盛波光电科技有限公司 | Sorting method, sorting system and missing detection rate estimation method for film products |
| CN113145489B (en) * | 2021-04-28 | 2022-05-20 | 凌云光技术股份有限公司 | System, method and equipment for removing defective products in bag making process |
| CN116931505B (en) * | 2023-09-19 | 2023-12-08 | 单县祥瑞纺织有限公司 | Plaiter cloth control system based on thing networking |
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| JPS63133048A (en) * | 1986-11-25 | 1988-06-04 | Fuji Photo Film Co Ltd | Processing circuit for surface inspection instrument |
| JP3974400B2 (en) | 2002-01-07 | 2007-09-12 | 日東電工株式会社 | Test result recording method, test result recording system and roll-shaped molded product of sheet-shaped molded product |
| JP3976740B2 (en) * | 2004-02-16 | 2007-09-19 | テクノス株式会社 | Substrate inspection apparatus and inspection method |
| JP4796860B2 (en) * | 2006-02-16 | 2011-10-19 | 住友化学株式会社 | Object detection apparatus and object detection method |
| JP4960161B2 (en) | 2006-10-11 | 2012-06-27 | 日東電工株式会社 | Inspection data processing apparatus and inspection data processing method |
| KR101410120B1 (en) * | 2007-08-21 | 2014-06-25 | 삼성전자주식회사 | Apparatus and method for transmitting/receiving the hybrid- arq ack/nack signal in mobile communication system |
| WO2009025210A1 (en) * | 2007-08-23 | 2009-02-26 | Nitto Denko Corporation | Method and apparatus for inspecting defect of laminated film |
| JP5305246B2 (en) * | 2007-10-05 | 2013-10-02 | 株式会社ニコン | Display device defect detection method and display device defect detection apparatus |
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| CN102253054A (en) | 2011-11-23 |
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| KR20110124090A (en) | 2011-11-16 |
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