CN102253054A - Polarizing film roll quality judging system and method thereof - Google Patents
Polarizing film roll quality judging system and method thereof Download PDFInfo
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- CN102253054A CN102253054A CN2011101256416A CN201110125641A CN102253054A CN 102253054 A CN102253054 A CN 102253054A CN 2011101256416 A CN2011101256416 A CN 2011101256416A CN 201110125641 A CN201110125641 A CN 201110125641A CN 102253054 A CN102253054 A CN 102253054A
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Abstract
The invention provides a polarizing film roll quality judging system and method thereof. According to the system and the method, the time and the cost for additional detections can be reduced. Meanwhile, coils of higher defect missing rate can also be automatically discriminated. In one embodiment of the invention, the important information of the roll quality based on the detection result data acquired by an optical detector is transmitted to subsequent steps, so that the early warning system function for unqualified coils is realized. Meanwhile, different processes are constructed according to coils of different qualities in subsequent steps.
Description
Technical field
The quality that the present invention relates to a kind of light polarizing film coiled material is judged system and method thereof, particularly relates to system and method thereof that a kind of testing result data of using automatic optical detector are judged the quality of light polarizing film coiled material.
Background technology
Produce a kind of manufacturer of the light polarizing film of using as the LCD optical material, in order to detect the product of high-speed production in real time, use inline (IN-LINE) automatic optical detecting system (Automated Optical Inspection system, the back is called automatic optical detector).In general, inline automatic optical detector comes the discarded position that is labeled in follow-up operation by producing marker color or slug font code on the position in defective, or detection is appended at this type of position again.
But, i) under the situation that above-mentioned defective produces in the continuum on particular point in time, ii) to minute defects etc. under the situation that can't judge whether clearly to substantial defective, because the overload and the H/W performance issue of described automatic optical detector, can take place can not the whole described defective locations of mark problem.
Be not labeled the product of defective locations, have the possibility that in subsequent handling, yet is not sent to client company by identification as substandard product.Since this reason, in subsequent handling, the step that has detection person that product is finally detected once more, this visual detection operation has needs a lot of expenses and the problem of time.
In addition, in the prior art, because can only only be used the defective generation rate information of the number of defects of measuring in the coiled material, so have the problem of the possibility of not considering defective omission (that is, defective is not labeled).
Summary of the invention
[problem that invention will solve]
The present invention finishes in view of described problem points, the object of the present invention is to provide a kind of quality to judge system and method thereof, and it can improve correctness and the reliability that the quality of light polarizing film coiled material is judged.
Other purposes of the present invention are to provide a kind of quality to judge system and method thereof, it obtains the important information of judgement coiled material quality and these important informations is communicated to subsequent handling by the testing result data of using automatic optical detector, fulfils the function of conduct for the early warning system of defective coiled material thus.
Other purposes more of the present invention are to provide a kind of quality to judge system and method thereof, and it is screened automatically for being contemplated for the coiled material that higher defective missing rate can occur.
[method of dealing with problems]
According to one embodiment of present invention, provide a kind of quality of light polarizing film coiled material to judge system, this system comprises: storage part, the testing result data that its storage obtains from the automatic optical detector that the light polarizing film coiled material is carried out defects detection; Defect data analysis portion, its defective of calculating the constituent parts zone of detected object coiled material according to the defective locations information in the described testing result data of being contained in produces density, and produces density according to described defective and become the defect concentration abnormal index that defect concentration abnormal area more than the setting is figured out described detected object coiled material; And coiled material quality judging part, when the permissible value that its defect concentration abnormal index at described detected object coiled material becomes regulation is above, described detected object coiled material is judged as defective coiled material.
In one embodiment, comprise that also the testing result data with described automatic optical detector are converted to the data-switching portion of general format, described defect data analysis portion can carry out data analysis according to the testing result data that are converted to described general format.
In one embodiment, described defect data analysis portion, according to the fleck defect information that is contained in the described testing result data, further calculate the fleck defect number of the fleck defect number in the described detected object coiled material divided by resulting each unit length of length of described detected object coiled material
Described coiled material quality judging part judges according to the fleck defect number of described each unit length of calculating whether coiled material is defective,
Calculating of the fleck defect number of described each unit length can be distinguished fleck defect that is judged as OK and the fleck defect that is judged as NG by described automatic optical detector and carry out respectively among described fleck defect.
In one embodiment, in the described testing result data, comprise the defect pattern information that detects by described automatic optical detector, described pattern-information comprises width, length, form, circle, the linear property information of described defective,
The open defect number of detected object coiled material or the open defect number of each unit length according among the described pattern-information at least one, are further calculated by described defect data analysis portion,
Here, described open defect comprises: at least one among the striped of the striped of inhomogeneous, the coating of the gauffer of TAC (cellulose triacetate sheet base) film, the gauffer of PVA (polyvinyl alcohol (PVA)) film, bottom TAC film, the striped of tack coat and extruding property,
Described coiled material quality judging part can be judged as defective coiled material with described detected object coiled material at the open defect number of described open defect number or described each unit length when the permissible value of regulation is above.
In one embodiment, described defect data analysis portion, the defective that the defective of calculating each first unit area of described detected object coiled material respectively produces density and each second unit area produces density,
Here, each distinguishable region when described first unit area is equivalent to that described detected object coiled material is divided into the ranks form of N * M, each distinguishable region when described second unit area is equivalent to length with described detected object coiled material and is divided into the L equal portions
Described defect concentration abnormal area number, the defective generation density that can be equivalent to described each first unit area is the number of first unit area more than the 3rd permissible value, producing density with the defective of described each second unit area is the number of second unit area more than the 4th permissible value, the value of carrying out addition.
In one embodiment, described defect data analysis portion, for the light polarizing film coiled material of not implementing coating state and the light polarizing film coiled material of implementing coating state, the defective of carrying out described each unit area respectively produces calculating of density,
Described coiled material quality judging part, can under following wherein any one situation, the light polarizing film coiled material be judged as defective coiled material, that is: for the described light polarizing film coiled material of not implementing coating state, it does not implement the situation of defect concentration abnormal index more than the 5th permissible value of regulation of coating; And for the light polarizing film coiled material of described enforcement coating state, the situation of the defect concentration abnormal index of applied layer more than the 6th permissible value of regulation in fact.
In one embodiment, described defect data analysis portion has given the value of first weighted value and the defect concentration abnormal index of described enforcement coating has been given the value of second weighted value the described defect concentration abnormal index of not implementing coating, carry out addition and calculate that density anomaly adds and index
Described coiled material quality judging part can add with index in the described density anomaly of calculating and when above, described light polarizing film coiled material is judged as defective coiled material at the 7th permissible value of regulation.
Here, add with index with described density anomaly and to carry out size described the 7th permissible value relatively, the defective missing rate of the probability that can not be labeled according to the defective that is judged as NG by described automatic optical detector calculates.
According to other embodiments of the invention, a kind of quality determination methods of light polarizing film coiled material is provided, this method is to use the testing result data that the light polarizing film coiled material is carried out the automatic optical detector of defects detection to judge the method for the quality of detected object coiled material, and this method comprises: the defective of calculating the constituent parts zone of detected object coiled material according to the defective locations information in the described testing result data of being contained in produces the step of density; Produce density according to described defective and become the step that defect concentration abnormal area more than the setting is figured out the defect concentration abnormal index of described detected object coiled material; Become the step that the permissible value of regulation is judged as described detected object coiled material when above defective coiled material at the defect concentration abnormal index of described detected object coiled material.
[invention effect]
According to embodiments of the invention, can improve the correctness and the reliability of the quality judgement of light polarizing film coiled material.
In addition, according to embodiments of the invention, obtain the important information of judgement coiled material quality and these important informations are communicated to subsequent handling by the testing result data of using automatic optical detector, fulfil thus as function, can in subsequent handling, construct different technology and can reduce and append needed expense and the time detected according to the difference of coiled material quality for the early warning system of defective coiled material.
Also have,, can screen automatically for being contemplated for the coiled material that higher defective missing rate can occur according to embodiments of the invention.
Description of drawings
Fig. 1 is the synoptic diagram of an example that the light polarizing film coiled material is carried out the automatic optical detector of defects detection.
Fig. 2 is used to illustrate that the quality of the light polarizing film coiled material of the embodiment of the invention judges system and the synoptic diagram that uses the quality determination methods of this system.
Fig. 3 is used to illustrate that the quality of the light polarizing film coiled material of the embodiment of the invention judges system and the synoptic diagram that uses the quality determination methods of this system.
Fig. 4 is the synoptic diagram that the light polarizing film coiled material is carried out flaw labeling.
Fig. 5 is used to illustrate the synoptic diagram to the computing method of defect concentration abnormal area number by defect data analysis portion.
Fig. 6 is used to illustrate the synoptic diagram to the computing method of defect concentration abnormal area number by defect data analysis portion.
Fig. 7 A is the fold synoptic diagram of TAC film.
Fig. 7 B is the synoptic diagram of feature of defective that is used for illustrating the fold of TAC film.
Fig. 7 C is the synoptic diagram of feature of defective that is used for illustrating the fold of TAC film.
Fig. 8 is the synoptic diagram that is used for seven standards that the coiled material quality of one embodiment of the present of invention judges.
Fig. 9 is the synoptic diagram that is used for the mutual relationship between the description defect density anomaly exponential sum defective missing rate.
Figure 10 is the synoptic diagram that is used to illustrate defective coiled material determination methods according to the defect concentration abnormal index.
[description of reference numerals]
110 storage parts
120 data-switching portions
130 defect data analysis portions
140 coiled material quality judging parts
Embodiment
The present invention can give multiple change, has various embodiment, and certain embodiments is described in detail as shown in drawings.But this is not that the present invention is defined in specific example, and is construed as all changes that comprise in design of the present invention and technical scope, is equal to substitute and sub all belongs to protection scope of the present invention.
When carrying out explanation of the present invention,, then omit this detailed explanation to specifying of related known technology when being judged as when instead making main points of the present invention unclear.In addition, this instructions employed numeral (for example first, second etc.) in declarative procedure is for an inscape being different from the identifying label of other inscapes.
Below, at first automatic optical detector is illustrated tout court in order to help to understand the present invention.Fig. 1 is the synoptic diagram of an example that the light polarizing film coiled material is carried out the automatic optical detector of defects detection.
The light polarizing film of producing is to preserve by the form of coiled material, and such light polarizing film coiled material is uncoiled from uncoiling portion (not shown) when defects detection, by the direction carrying of roller 12 to regulation.At this moment, the transporting velocity of light polarizing film 10 is read by such speed detection device such as scrambler 11 grades, the generation of the defective locations information after being used to.
Here, described automatic optical detector comprises the optical devices 20 of the camera head 22 that possesses at least one lighting device 21 and corresponding therewith at least one, can obtain the optical image of light polarizing film thus in described carrying.
The formation of optical devices 20 and design, corresponding to the project of the defective that need detect with described automatic optical detector (promptly, kind and content) difference and difference, common automatic optical detector to light polarizing film see through that detection, reflection detect, the polarisation blocking detects (being also referred to as intersections (cross) detection) etc.
Therefore, optical devices 20 are designed to, the project of the defective that detects corresponding to needs drives indirect illumination (and corresponding therewith camera head) and transmission illumination (and camera head of correspondence) therewith by optionally or arranged side by side property ground, thereby can obtain being used to detect the optical image of various defect types.
Like this, the optical image that will obtain from optical devices 20 is conveyed in image analysing computer/pick-up unit 40, and the optical image that image analysing computer/pick-up unit 40 is communicated by analysis can detect the various defectives that exist in the light polarizing film coiled material.In addition, the defective data that 40 generations of image analysing computer/pick-up unit are detected (below, be called the testing result data), and with its storage.
At this moment, produce the position based on the defective of described testing result data and be communicated to Mk system 30, the marking of control portion 32 of described Mk system 30 is labeled as defective by control mark unit 31 and shows on the described light polarizing film that produces the position corresponding to described defective.
In addition, described testing result data can be sent to this result of output such as output unit 50, display device 60, and can be sent to gerentocratic server 70 and store and manage.
After described defects detection finished, light polarizing film can be reeled once more by coiling portion (not shown), took care of with the form of original such coiled material.
Below, according to Fig. 2 and Fig. 3, and with reference to Fig. 4～Figure 10, to the quality determination methods of the light polarizing film coiled material of the embodiment of the invention with and system describe.
Fig. 2 and Fig. 3 are used to illustrate that the quality of the light polarizing film coiled material of the embodiment of the invention judges system and the synoptic diagram that uses the quality determination methods of this system.
The quality of light polarizing film coiled material of the present invention judge system with and method, as shown in Figure 2, be divided into three steps substantially and carry out.Be divided into the switch process (S100) of the testing result data of automatic optical detector, the analytical procedure (S200) of defective data and coiled material quality determining step (S300) specifically.
Promptly, the invention provides a kind of new method, the testing result data that this method will obtain from the automatic optical detector that the light polarizing film coiled material is carried out optical defects detection are as its basis, judge the quality of the light polarizing film coiled material that needs to detect (below, be called the detected object coiled material).Quality determination methods and system by light polarizing film coiled material of the present invention, when the coiled material quality that can carry out high reliability is more judged, also can obtain constituting the various information of standard of the quality level of different coiled materials, therefore can construct the subsequent handling flow process that conforms to the quality of each coiled material.
This can more clearly understand by explanation afterwards.Below, with reference to Fig. 3 described each step (S100, S200, S300) is described successively.Simultaneously, below the main body of each step of Shuo Ming carrying out both can be separated and realization independently from described automatic optical detector, also can realize with the form that one combines with automatic optical detector.
In addition, each step of coiled material quality determination methods described later, also can be included in the computer-readable recording medium (for example, hard disk, CD etc.) of the program that has write down the command language that is used to carry out these steps and be provided, this is conspicuous for those of ordinary skills.
The switch process of testing result data (S100)
The testing result data of automatic optical detector are normally stored with database (database) or the such file layout of Excel form.Automatic optical detector, can generate and store as to brightness, width, length, size (area), the form (circle/linear property) of the defective of the testing result of each coiled material batch (LOT), detect optics group various data such as (projection/reflection/polarisation interdict).
When the data of described testing result data transmit, can use FTP (file transfer protocol) here, in order to ensure most of users or gerentocratic confidential relation.The testing result data that are transmitted like this can store coiled material quality of the present invention into to be judged in the intrasystem storage part 110, for the assay format unification being converted into the general format of regulation by data-switching portion 120.Here, described general format is meant the SGML of data language, can be for example XML (Extensible Markup Language), HTML etc.Therefore, later data analysis can be carried out with XML of having changed etc.
But, the switch process (S100) of testing result data as described above, because different the obtaining of form of the machines of different rows storage data, so in order to analyze the data that obtain from the machines of different machines, need be converted into the general format of having unified.Different therewith, when the form of the storage data of machines is all identical, can omit this step.And then, also can carry out data analysis when the form of each storage data is different according to the form of each data, therefore can certainly omit under these circumstances.
The analytical procedure of defective data (S200)
The analytical procedure of defective data (S200) in each coiled material LOT, as shown in Figure 8, can be calculated the work of seven quality criterions altogether.With reference to Fig. 8, described seven quality criterions comprise three defect concentration abnormal indexs (combined index/do not implement coating index/enforcement coating index), two bright spot DPM (bright spot DPM (OK), bright spot DPM (NG)), major defect number, total mark DPM.
But quality criterion shown in Figure 8 is not to be essential all, clearly both can only use these a part, perhaps can further use other the quality criterion that comprises these yet.
That is, supposition and having illustrated in the present embodiment is calculated whole analysis results (numerical value) of described seven quality criterions, and the coiled material that any one among described seven standards is shown as the above value of the permissible value of regulation is judged as defective coiled material.But, clearly also can analyze among described seven standards at least one, be defective coiled material thereby be judged as.
Below, described seven quality criterions are described in order.The analysis of the defective data that this step is carried out is undertaken by defect data analysis portion 130.
Calculate the defect concentration abnormal index
As shown in Figure 4, automatic optical detector is to each coiled material LOT, and record is with respect to the mark position of the width/height of coiled material.The length of the coiled material in this instructions is defined as by the working direction pairing length of automatic optical detector with the coiled material carrying; The width of coiled material is defined as the pairing length of the direction that intersects vertically with this working direction.
Defect data analysis portion 130 in the coiled material quality judgement of the present invention system, from the testing result data of automatic optical detector, obtain as shown in Figure 4 " flaw labeling figure (defective locations information) " (S210), its each interval defective of being analyzed and calculating coiled material is produced density.
Each interval defective according to coiled material produces calculating of density, be each unit area that coiled material is divided into regulation, and the defective of calculating in each unit area of having been divided like this produces density (S212).Be described with reference to Fig. 5, as follows.
" each regional defective produces density ", be as shown in Figure 5, calculate this numerical value of each unit area of M/D direction (length direction of coiled material) and T/D direction (Width of coiled material) setting, this density calculation method can be calculated by following formula (1).
[several 1]
MD
i＝MC
i/(W
m·H
m)、
TD
i＝TC
i/(W
f·H
f)---(1)
Here, MC
iBe MD
iThe overall defect number in zone, TC
iBe TD
iThe overall defect number in zone.
That is, the defective of each unit area in the M/D direction produces density (that is MD,
i), overall defect number (that is MC, that exists in divided each unit area by the detected object coiled material is divided into the ranks form of N * M
i), divided by area (that is W, of this unit area
mH
m) calculate.And the defective of each unit area in the T/D direction produces density (that is TD,
i), be divided into the L equal portions and overall defect number (that is TC, that exists in divided each unit area by length with the detected object coiled material
i), divided by area (that is W, of this unit area
fH
f) calculate.
Here, the W of the unit area of the unit area of the M/D direction in the coiled material of definition, T/D direction
m, H
m, H
fAs setup parameter, also can constitute changeably in design and have suitable value.And, W
fAs the width of coiled material and be set.
Afterwards, defect concentration abnormal area number (S214) as described above, is calculated according to the defective generation density of each unit area of calculating by defect data analysis portion 130.
" defect concentration abnormal area number " is to produce density for the defective calculated, as surpass by described coiled material quality judge the predefined reference value of system the zone sum and calculated.Fig. 6 calculates the synoptic diagram that defective that the relative defective of the M/D direction of each unit area produces density and T/D direction produces the example of density, suppose that respectively the density benchmark value with the M/D direction is set at 3, the density benchmark value of T/D direction is set at 1, then described defect concentration abnormal area number is, in the M/D direction in the zone that surpasses described reference value is 4, in the T/D direction be 1, total is 5.
That is, described defect concentration abnormal area number of calculating is in each unit area in coiled material, the degree of the intensive generation of defective, the value of the visual defects closeness that promptly quantizes.So-called defective closeness is higher, means that defective is in the concentrated and generation continuously of particular point in time (that is, between the given zone in the coiled material).
Therefore, when defective is concentrated and produced continuously, produce overload between given zone because the defective of automatic optical detector detects operation, thus since the performance issue of system cause and can not the probability of happening that all defectives are all carried out mark be uprised.Calculating of defect concentration abnormal area number judging that the possibility that defective as described above is omitted (that is, have the NG defective, and the possibility that is not labeled) time is used effectively.That is, the density value with the defective closeness has quantized owing to the defective missing rate confidential relation is arranged, constitutes the main project that the coiled material quality is judged.
As mentioned above, calculate after the defect concentration abnormal area number, the defect concentration abnormal index (S216) that exponentiate has showed according to predefined mode, is calculated with the defect concentration abnormal area number of calculating by defect data analysis portion 130.
" defect concentration abnormal index " as shown in Figure 8, calculate " combined index ", " not implementing the index of coating ", " implementing the index of coating " respectively, this be do not implement the coating machines for " defect concentration abnormal area number " divided into, implement the coating machines each and with the combined index that they combine, utilize at the defective coiled material determining step that has used EW (Early Warning) index afterwards.
In order to distinguish and calculate such " not implementing the index of coating " and " implementing the index of coating ", defect data analysis portion 130 in the coiled material quality judgement of the present invention system, can distinguish the light polarizing film coiled material of not implementing coating state and the situation of implementing the light polarizing film coiled material of coating state from the step of calculating of described " defective generation density ", and carry out described density and calculate work.
Here, described " not implementing the index of coating " and " implementing the index of coating " for example can calculate by following formula (2).
[several 2]
Do not implement the index of coating=(A/C) 1000
Implement the 1000---(2) of the index of coating=(B/C)
Here, A is the defect concentration abnormal area number with respect to the light polarizing film coiled material of not implementing coating state, and B is the defect concentration abnormal area number with respect to the light polarizing film coiled material of implementing coating state, and C is the length of the light polarizing film coiled material of expression detected object.In addition, in described formula (2), when calculating each index, taken advantage of 1000, be to produce density for the defective of calculating each 1000m.
In addition, described " combined index " is shown in the formula for example described as follows (3), can never implement the coating machines respectively and implement data that the coating machines calculates (herein, be meant above-mentioned " not implementing the index of coating " and " implementing the index of coating ") in, calculate by the weighted value of giving regulation respectively.
[several 3]
Combined index=the do not implement index a of coating
1The index a of+enforcement coating
2
＝[(A·a
1+B·a
2)/C]·1000---(3)
Here, a
1Mean the weighted value that the index of not implementing coating is given, a
2Mean the weighted value that the index of implementing coating is given, a
1And a
2Can be set at greater than 0 smaller or equal to 1.
As mentioned above, combined index will not implemented the index of coating and the index of enforcement coating is distinguished in order to calculate, and the reason of giving the weighted value of regulation respectively is, do not implement the defect concentration that exists in the light polarizing film coiled material of coating state, with the defect concentration that exists in the light polarizing film coiled material of implementing coating state, after the judgement of defective coiled material the time, can utilize as different importance degrees mutually.Therefore, can make described each weighted value be set at suitable value corresponding to the characteristic of the production process of light polarizing film.
Bright spot DPM calculates
Fleck defect is that the size of defective is less trickle defective, owing to be difficult to come identification by visual detection, and the defect type of difficulty very when being defective detecting.Therefore, coiled material quality of the present invention is judged system, according to the DPM of different defect kinds bright spot DPM is classified separately, and it is used in during defective coiled material judges.In addition, described bright spot DPM, the subsequent handling after defective coiled material is judged is passed on, and uses as Useful Information in subsequent handling.
Described DPM (Defect per meter) is the value that the defective in the coiled material is produced the frequency number value, is defined as the value of whole generation of defects numbers divided by web length.
Total fleck defect number in the coiled material of calculating middle necessity of described bright spot DPM obtains (S220) in fleck defect (bright defect) information that can comprise from the testing result data of automatic optical detector.The testing result data of automatic optical detector also can comprise by the polarisation blocking and detect the fleck defect information that (intersect and detect) detects.Blocking detects according to polarisation, all light (comprising polarisation) all becomes and does not see through light polarizing film, but because the defective of light polarizing film, the zone (position) that the polarisation of a part sees through the part of light polarizing film produces fleck defect, and such fleck defect information just is recorded in the described testing result data.
Therefore, fleck defect number in the coiled material can be calculated based on the fleck defect information that comprises in the described testing result data by the defect data analysis portion 130 in the coiled material quality judgement of the present invention system, like this, just can calculate bright spot DPM (S222).In an embodiment of the present invention, described bright spot DPM can calculate by following formula (4).
[several 4]
Here, described S
iBe to be detected (being monitored), but be not judged as the fleck defect that carries out mark, that is, mean it is the fleck defect that is judged as OK, T because defect level is lower by automatic optical detector
iBe to be judged the fleck defect that carries out mark, that is, mean it is the fleck defect that is judged as NG.
Described fleck defect (the S that is judged as OK
i), it is the minute defects that under the situation of each single pixel, is difficult to be judged as defective, it is many but if these minute defects numbers become, perhaps concentrate the words that distribute at a place, just can be used as defective estimative minute defects, so the bright spot DPM (that is, with reference to described bright spot DPM (NG)) to the fleck defect that is judged as NG in the present embodiment is also calculated separately with bright spot DPM (OK).Therefore, coiled material quality of the present invention is judged system, considers that the significance level of fleck defect can be considered bright spot DPM (NG) and bright spot DPM (OK) simultaneously.
Calculating of major defect number
The coiled material quality of the embodiment of the invention is judged system, except described " fleck defect ", can also constitute in the mode of selecting other various major defect types and calculate.
Therefore, described major defect number, the generation number that means the specific defects type that is defined in the system of the present invention, in major defect, " gauffer of TAC film ", " gauffer of PVA film ", " bottom TAC film inhomogeneous ", " striped of AS coating ", " striped of NCFT/D (striped of tack coat) ", " striped of extruding property " etc. are for example arranged.
Described PVA film; usually be utilized as the polarization element that shows polarized light property; constitute the core layer of light polarizing film; described TAC film is used for supporting and protecting described PVA film; be layered on the two sides of described PVA film core layer, tack coat be used for after with light polarizing film attached to liquid crystal panel on and be stacked in described TAC film.In addition, described AS coating means that the static of light polarizing film prevents to use coating, and the striped of extruding property means the striped that is produced by the roller extruding when automated optical detects.
Described such six kinds of defect types are that discrimination power is lower, and are higher in the generation frequency of specific region, whole generation defectives all can not be carried out the representative types of the dangerous higher defect cluster of mark by automatic optical detector.Therefore, coiled material quality of the present invention is judged system, discerns the generation number of packages of described such major defect automatically and is used in the coiled material quality simultaneously and judge.But described major defect is an example only, carries out different selections with described example and obviously also is fine.
Described such major defect number, the defect pattern information that comprises in can the testing result data according to automatic optical detector is calculated (S230).In the described testing result data, produce form, can comprise the pattern-information of the size, width, length, area, circle/linear property etc. of described defective about the defective of the defective that detects.Therefore, coiled material quality of the present invention is judged the defect data analysis portion 130 of system, is the feature that has quantized by using described defect pattern data with the Feature Conversion of apparent defective, just can the such major defect (S232) of the described example of identification.
For example, in the time of " gauffer of TAC film ", shown in Fig. 7 A, as a rule this defective form is circle possibility is lower, and the ratio of the length/width of defective is higher, that is, compare with the width of defective and to have the bigger apparent feature of length.About this point, with reference to Fig. 7 B and Fig. 7 C, when the length of defective divided by the width gained ratio of defective be more than 2, defect area divided by with the longest length of defective as the area gained ratio of the circle of the supposition of diameter be below the A, when defect area is a defective more than the B, it is judged as described " gauffer of TAC film ", is the sort of example.
As mentioned above, the defect data analysis portion 130 in the coiled material quality judgement of the present invention system according to the apparent feature that each defective manifested, quantizes each major defect form and carries out identification by the combination to the characteristic data of defective.At this moment, the distinctive pattern-information that manifests in each major defect (the identification key element of defect type) can detect cumulative data by the past of analyzing automatic optical detector and obtain.In addition, can certainly use various statistical methods as the method for the identification key element of searching for each defect type.
As with described " gauffer of TAC film " relevant example, " major defect number " sets various identification key elements for specific in advance specific defects type, will meet this defective that imposes a condition and discern as major defect.At this moment, the same in the time of with described " fleck defect ", also investigate defective that is judged as OK and the defective that is judged as NG during the major defect identification simultaneously.This be because, defective generation information unelected, that discrimination power is lower from marker for judgment can be offered subsequent handling, utilize as unusual Useful Information.At this moment, described major defect number can show by DPM.
Total mark DPM calculates
" total mark DPM " from automatic optical detector as by flaw labeling DPM calculated." total mark DPM " calculates (S242) and can obtain by following formula (5).
[several 5]
Here, flaw labeling (M
i) number, the flaw labeling information that comprises in can the testing result data according to automatic optical detector is calculated (S240).Described total mark DPM is the value that the defective in the expression coiled material produces frequency, and the big event of judging as quality afterwards uses.
Coiled material quality determining step (S300)
In this step, use seven information that amount to of " the defect concentration abnormal index " of calculating in the analytical procedure (S200) of described defective data (combined index/do not implement coating index/enforcement coating index), " bright spot DPM (OK/NG) ", " major defect number " and " total mark DPM " to distinguish defective coiled material.This can be undertaken by the coiled material quality judging part 140 in the system of the present invention.
As shown in Figure 8, even any one project among seven standards that are used for the judgement of coiled material quality surpasses permissible value (the EW benchmark of regulation, during with reference to k1～k7), coiled material quality judging part 140 can judge that also corresponding coiled material is defective coiled material (S310, S320, S330, S340).Described EW benchmark can be set at defective coiled material is screened in the volume production process correctness and be the suitable value that has been verified.
Fig. 9 show the defective missing rate (that is NG defective unelected ratio from mark) of each coiled material LOT and with " combined index " mark in the EW index example.Coiled material quality judging part 140, for example in order to ensure the defective missing rate in the level of quality below 0.3%, setting " EW benchmark (combined index) " according to described Fig. 9 is k
1(k here,
1Be positive number), thus will be judged as defective coiled material above the coiled material of described permissible value.
Therefore, the correctness for defective coiled material is judged by the defective missing rate of different coiled materials and the mark relation of each EW index are carried out the cumulative statistics work of statistical correlationship, is necessary to set suitable " EW benchmark ".
By described such method, in case suitable " EW benchmark " is set, then " EW benchmark " (with reference to Fig. 9 and the Figure 10) that is set by use can screen above defective coiled material of this benchmark (permissible value) and the coiled material that does not surpass this benchmark.Promptly, judge system and method according to coiled material quality of the present invention, by defective coiled material being carried out early warning (Early Warning), confirm in advance in subsequent handling being contemplated for the higher coiled material LOT of defective missing rate, other operation of the defective omission that can prevent this coiled material can be set.In addition,, perhaps can simplify the detection operation, therefore have and to reduce the time of appending detection and the advantage of expense for not as defective coiled material and the coiled material LOT that is screened also can not use other visual detection in subsequent handling.Figure 9 illustrates, in eight coiled material LOT altogether, for EW index k
1With six interior coiled materials, can not guarantee that missing rate is at the quality level below 0.3% even in subsequent handling, do not carry out other detection yet.
More than, though describe the present invention, be to be understood that for those skilled in the art under the situation of design of not taking off the present invention and being put down in writing and scope with reference to embodiments of the invention, can carry out various modification and change to the present invention.
Claims (16)
1. the quality of a light polarizing film coiled material is judged and be it is characterized in that system, and described quality judgement system comprises:
Storage part, the testing result data that its storage obtains from the automatic optical detector that the light polarizing film coiled material is carried out defects detection;
Defect data analysis portion, its defective of calculating the constituent parts zone of detected object coiled material according to the defective locations information in the described testing result data of being contained in produces density, and produces density according to described defective and become the defect concentration abnormal index that defect concentration abnormal area more than the setting is figured out described detected object coiled material; And
Coiled material quality judging part when the permissible value that its defect concentration abnormal index at described detected object coiled material becomes regulation is above, is judged as defective coiled material with described detected object coiled material.
2. the quality of light polarizing film coiled material according to claim 1 is judged system, it is characterized in that,
Comprise that also the testing result data with described automatic optical detector are converted to the data-switching portion of general format,
Described defect data analysis portion can carry out data analysis according to the testing result data that are converted to described general format.
3. the quality of light polarizing film coiled material according to claim 1 is judged system, it is characterized in that,
Described defect data analysis portion, according to the fleck defect information that is contained in the described testing result data, further calculate the fleck defect number of the fleck defect number in the described detected object coiled material divided by resulting each unit length of length of described detected object coiled material;
Described coiled material quality judging part judges according to the fleck defect number of described each unit length of calculating whether coiled material is defective;
Calculating of the fleck defect number of described each unit length is to distinguish fleck defect that is judged as OK and the fleck defect that is judged as NG by described automatic optical detector among described fleck defect to carry out respectively.
4. the quality of light polarizing film coiled material according to claim 1 is judged system, it is characterized in that,
In the described testing result data, comprise the defect pattern information that detects by described automatic optical detector, described pattern-information comprises width, length, form, circle, the linear property information of described defective;
The major defect number of detected object coiled material or the major defect number of each unit length by using among the described pattern-information at least one with the major defect processing that quantizes, are further calculated by described defect data analysis portion;
Described major defect comprises: at least one among the striped of the striped of inhomogeneous, the coating of the gauffer of the gauffer of TAC film, PVA film, bottom TAC film, the striped of tack coat and extruding property;
Described coiled material quality judging part when the permissible value of regulation is above, is judged as defective coiled material with described detected object coiled material at the major defect number of described major defect number or described each unit length.
5. the quality of light polarizing film coiled material according to claim 1 is judged system, it is characterized in that,
Described defect data analysis portion, the defective that the defective of calculating each first unit area of described detected object coiled material respectively produces density and each second unit area produces density;
Each distinguishable region when each distinguishable region when described first unit area is equivalent to that described detected object coiled material is divided into the ranks form of N * M, described second unit area are equivalent to length with described detected object coiled material and are divided into the L equal portions;
Described defect concentration abnormal area number, be equivalent to the defective of described each first unit area is produced the number that density is the first above unit area of the 3rd permissible value, producing density with the defective of described each second unit area is the number of second unit area more than the 4th permissible value, the value of carrying out addition.
6. the quality of light polarizing film coiled material according to claim 1 is judged system, it is characterized in that,
Described defect data analysis portion, for the light polarizing film coiled material of not implementing coating state and the light polarizing film coiled material of implementing coating state, the defective of carrying out described each unit area respectively produces calculating of density;
Described coiled material quality judging part, under following wherein any one situation, the light polarizing film coiled material is judged as defective coiled material, that is: for the described light polarizing film coiled material of not implementing coating state, it does not implement the situation of defect concentration abnormal index more than the 5th permissible value of regulation of coating; And for the light polarizing film coiled material of described enforcement coating state, the situation of the defect concentration abnormal index of applied layer more than the 6th permissible value of regulation in fact.
7. the quality of light polarizing film coiled material according to claim 6 is judged system, it is characterized in that,
Described defect data analysis portion, the described defect concentration abnormal index of not implementing coating has been given the value of first weighted value, with the value of the defect concentration abnormal index of described enforcement coating having been given second weighted value, carry out addition and calculate that density anomaly adds and index;
Described coiled material quality judging part adds with index in the described density anomaly of calculating and when above, described light polarizing film coiled material to be judged as defective coiled material at the 7th permissible value of regulation.
8. the quality of light polarizing film coiled material according to claim 7 is judged system, it is characterized in that, adding with index with described density anomaly and to carry out size described the 7th permissible value relatively, is that the defective missing rate of the probability that is not labeled according to the defective that is judged as NG by described automatic optical detector calculates.
9. the quality determination methods of a light polarizing film coiled material, this method are to use the testing result data that the light polarizing film coiled material is carried out the automatic optical detector of defects detection to judge the method for the quality of detected object coiled material, it is characterized in that this method comprises:
The defective of calculating the constituent parts zone of detected object coiled material according to the defective locations information in the described testing result data of being contained in produces the step of density;
Produce density according to described defective and become the step that defect concentration abnormal area more than the setting is figured out the defect concentration abnormal index of described detected object coiled material;
Become the step that the permissible value of regulation is judged as described detected object coiled material when above defective coiled material at the defect concentration abnormal index of described detected object coiled material.
10. the quality determination methods of light polarizing film coiled material according to claim 9 is characterized in that, also comprises:
According to the fleck defect information that is contained in the described testing result data, calculate the step of the fleck defect number in the described detected object coiled material divided by the fleck defect number of resulting each unit length of length of described detected object coiled material;
The fleck defect number of described each unit length is at the permissible value of regulation when above, and described detected object coiled material is judged as the step of defective coiled material,
Calculating of the fleck defect number of described each unit length is to distinguish fleck defect that is judged as OK and the fleck defect that is judged as NG by described automatic optical detector among described fleck defect to carry out respectively.
11. the quality determination methods of light polarizing film coiled material according to claim 9 is characterized in that, also comprises:
In the described testing result data, comprise the defect pattern information that detects by described automatic optical detector, described pattern-information comprises width, length, form, circle, the linear property information of described defective,
By using among the described pattern-information at least one, further calculate the step of the major defect number of the major defect number of detected object coiled material or each unit length with the major defect processing that quantizes;
Described major defect comprises: at least one among the striped of the striped of inhomogeneous, the coating of the gauffer of the gauffer of TAC film, PVA film, bottom TAC film, the striped of tack coat and extruding property,
When the permissible value of regulation is above, described detected object coiled material is judged as the step of defective coiled material at the major defect number of described major defect number or described each unit length.
12. the quality determination methods of light polarizing film coiled material according to claim 9 is characterized in that,
The step that the defective of calculating described each unit area produces density is that the defective that the defective of calculating each first unit area of described detected object coiled material respectively produces density and each second unit area produces density;
Each distinguishable region when each distinguishable region when described first unit area is equivalent to that described detected object coiled material is divided into the ranks form of N * M, described second unit area are equivalent to length with described detected object coiled material and are divided into the L equal portions;
Described defect concentration abnormal area number, be equivalent to the defective of described each first unit area is produced the number that density is the first above unit area of the 3rd permissible value, producing density with the defective of described each second unit area is the number of second unit area more than the 4th permissible value, the value of carrying out addition.
13. the quality determination methods of light polarizing film coiled material according to claim 9 is characterized in that,
The defective of described each unit area produces calculating of density, is the light polarizing film coiled material of not implementing coating state and the light polarizing film coiled material of implementing coating state are carried out respectively;
Judge that described detected object coiled material is underproof step, it is the step that under following wherein any one situation, described detected object coiled material is judged as defective coiled material, that is: for the described light polarizing film coiled material of not implementing coating state, it does not implement the situation of defect concentration abnormal index more than the 5th permissible value of regulation of coating; And for the light polarizing film coiled material of described enforcement coating state, the situation of the defect concentration abnormal index of applied layer more than the 6th permissible value of regulation in fact.
14. the quality determination methods of light polarizing film coiled material according to claim 13 is characterized in that, also comprises:
The described defect concentration abnormal index of not implementing coating has been given the value of first weighted value and given the value of second weighted value to the defect concentration abnormal index of described enforcement coating, carried out addition and calculate density anomaly adding step with index;
Judging that described detected object coiled material is underproof step, is to add the step that described detected object coiled material is judged as defective coiled material with index when the 7th permissible value of regulation is above in the described density anomaly of calculating.
15. the quality determination methods of light polarizing film coiled material according to claim 14, it is characterized in that, adding with index with described density anomaly and to carry out size described the 7th permissible value relatively, is that the defective missing rate of the probability that is not labeled according to the defective that is judged as NG by described automatic optical detector calculates.
16. a computer-readable recording medium, it has write down and has been used for the program that enforcement of rights requires 9～15 any described methods.
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| KR10-2010-0043677 | 2010-05-10 | ||
| KR1020100043677A KR101294218B1 (en) | 2010-05-10 | 2010-05-10 | System and method for evaluating quality of polarized film |
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| KR (1) | KR101294218B1 (en) |
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| CN105911062A (en) * | 2015-02-25 | 2016-08-31 | 东友精细化工有限公司 | Apparatus and method for detecting defect of optical film |
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| KR101315103B1 (en) * | 2013-05-16 | 2013-10-07 | 동우 화인켐 주식회사 | Method for discriminating defect of optical films |
| KR101349662B1 (en) * | 2013-05-16 | 2014-01-13 | 동우 화인켐 주식회사 | Method for discriminating defect of optical films |
| CN103489182B (en) * | 2013-09-05 | 2016-04-20 | 东华大学 | A kind of fabric defects detection method based on image projection and svd |
| KR101733017B1 (en) * | 2015-02-25 | 2017-05-24 | 동우 화인켐 주식회사 | Apparatus and method for detecting defect of optical film |
| CN106426612B (en) * | 2016-11-09 | 2018-10-30 | 天津京万科技有限公司 | A kind of rubber compound defective work automatic sorting device |
| CN108931529B (en) * | 2018-05-10 | 2020-12-22 | 深圳市盛波光电科技有限公司 | Yield estimation method for continuously producing roll-shaped materials |
| CN112304259A (en) * | 2020-11-25 | 2021-02-02 | 泰州市华发新型建材厂 | Aluminum profile flatness detection equipment |
| CN113096078B (en) * | 2021-03-26 | 2024-02-06 | 深圳市盛波光电科技有限公司 | Sorting method, sorting system and missing detection rate estimation method for film products |
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| JP5484392B2 (en) | 2014-05-07 |
| CN102253054B (en) | 2013-11-13 |
| KR101294218B1 (en) | 2013-08-07 |
| JP2011237423A (en) | 2011-11-24 |
| TWI428588B (en) | 2014-03-01 |
| KR20110124090A (en) | 2011-11-16 |
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