CN102197469A - 探针块组件 - Google Patents

探针块组件 Download PDF

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Publication number
CN102197469A
CN102197469A CN2009801432688A CN200980143268A CN102197469A CN 102197469 A CN102197469 A CN 102197469A CN 2009801432688 A CN2009801432688 A CN 2009801432688A CN 200980143268 A CN200980143268 A CN 200980143268A CN 102197469 A CN102197469 A CN 102197469A
Authority
CN
China
Prior art keywords
probe
block
constructed
grounded
coaxial connector
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
CN2009801432688A
Other languages
English (en)
Chinese (zh)
Inventor
史蒂文·费尔德曼
约瑟夫·N·卡斯蒂廖内
阿布黑·R·乔希
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
3M Innovative Properties Co
Original Assignee
3M Innovative Properties Co
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 3M Innovative Properties Co filed Critical 3M Innovative Properties Co
Publication of CN102197469A publication Critical patent/CN102197469A/zh
Pending legal-status Critical Current

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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G01R31/2886—Features relating to contacting the IC under test, e.g. probe heads; chucks
    • G01R31/2889—Interfaces, e.g. between probe and tester
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
    • H10P74/00—Testing or measuring during manufacture or treatment of wafers, substrates or devices
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes

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  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • General Engineering & Computer Science (AREA)
  • Measuring Leads Or Probes (AREA)
  • Details Of Connecting Devices For Male And Female Coupling (AREA)
  • Coupling Device And Connection With Printed Circuit (AREA)
CN2009801432688A 2008-09-08 2009-09-03 探针块组件 Pending CN102197469A (zh)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US12/206,565 2008-09-08
US12/206,565 US7740508B2 (en) 2008-09-08 2008-09-08 Probe block assembly
PCT/US2009/055872 WO2010028136A2 (en) 2008-09-08 2009-09-03 Probe block assembly

Publications (1)

Publication Number Publication Date
CN102197469A true CN102197469A (zh) 2011-09-21

Family

ID=41797849

Family Applications (1)

Application Number Title Priority Date Filing Date
CN2009801432688A Pending CN102197469A (zh) 2008-09-08 2009-09-03 探针块组件

Country Status (6)

Country Link
US (1) US7740508B2 (https=)
EP (1) EP2340555A4 (https=)
JP (1) JP2012502277A (https=)
KR (1) KR20110060922A (https=)
CN (1) CN102197469A (https=)
WO (1) WO2010028136A2 (https=)

Cited By (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN104600443A (zh) * 2015-01-21 2015-05-06 谢博 一种接地线电极
CN106249124A (zh) * 2015-06-08 2016-12-21 英飞凌科技股份有限公司 使用接口构件测试待测器件的模块化测量设备
CN107422197A (zh) * 2012-08-01 2017-12-01 日本电子材料株式会社 用于探针卡的导板和制造用于探针卡的导板的方法
CN107919542A (zh) * 2016-10-10 2018-04-17 思科技术公司 线缆接头
TWI644110B (zh) * 2016-11-29 2018-12-11 李諾工業股份有限公司 相機模組測試裝置
WO2020051842A1 (en) * 2018-09-13 2020-03-19 Harting (Zhuhai) Manufacturing Co., Ltd. Plug-in connector with ground terminal region
CN110945366A (zh) * 2017-07-28 2020-03-31 日本发条株式会社 接触式探针及探针单元
CN112240947A (zh) * 2020-12-18 2021-01-19 苏州和林微纳科技股份有限公司 一种超高频弹簧探针测试组件的装配方法
CN115021001A (zh) * 2022-06-30 2022-09-06 北京华峰测控技术股份有限公司 线缆连接结构、探针块、信号扩展装置和半导体测试机
CN115060938A (zh) * 2022-06-30 2022-09-16 北京华峰测控技术股份有限公司 探针块、信号扩展装置和半导体测试机
CN116879586A (zh) * 2023-07-28 2023-10-13 上海捷策创电子科技有限公司 一种用于半导体测试的同轴高速接口装置
CN115060938B (zh) * 2022-06-30 2026-05-01 北京华峰测控技术股份有限公司 探针块、信号扩展装置和半导体测试机

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Publication number Priority date Publication date Assignee Title
EP2197254B1 (de) * 2008-12-09 2011-08-31 Siemens Aktiengesellschaft Elektronikmodul für ein Anlagenmodul
US7909646B2 (en) * 2009-08-10 2011-03-22 3M Innovative Properties Company Electrical carrier assembly and system of electrical carrier assemblies
US7927144B2 (en) * 2009-08-10 2011-04-19 3M Innovative Properties Company Electrical connector with interlocking plates
US7850489B1 (en) 2009-08-10 2010-12-14 3M Innovative Properties Company Electrical connector system
US7997933B2 (en) 2009-08-10 2011-08-16 3M Innovative Properties Company Electrical connector system
US8187035B2 (en) * 2010-05-28 2012-05-29 Tyco Electronics Corporation Connector assembly
US8052470B1 (en) * 2011-01-12 2011-11-08 Cheng Uei Precision Industry Co., Ltd. Probe connector
US8083548B1 (en) * 2011-01-13 2011-12-27 Cheng Uei Precision Industry Co., Ltd. Probe connector
US8888531B2 (en) * 2011-10-11 2014-11-18 Tyco Electronics Corporation Electrical connector and circuit board assembly including the same
JP5857892B2 (ja) 2012-07-03 2016-02-10 株式会社オートネットワーク技術研究所 多極コネクタ
WO2014132274A1 (en) * 2013-02-27 2014-09-04 Power-One Italy S.P.A. Programming connector
CN104345184B (zh) * 2013-07-26 2019-03-01 苏州普源精电科技有限公司 一种多通道获取探头及具有多通道获取探头的测量仪器
TWM482874U (zh) * 2014-04-01 2014-07-21 Insert Entpr Co Ltd Rf射頻連接器
TWI704352B (zh) * 2015-03-13 2020-09-11 義大利商探針科技公司 測試頭之接觸探針
KR101690622B1 (ko) * 2015-04-29 2016-12-28 주식회사 한라정밀엔지니어링 엘이디검사용 프로브 및 이를 포함하는 콘텍장치
US9979112B2 (en) * 2016-03-29 2018-05-22 Aces Electronics Co., Ltd. Press-type connector
TWI626453B (zh) * 2017-09-29 2018-06-11 中華精測科技股份有限公司 探針組件及其空間轉換介面板
CN109581005B (zh) * 2017-09-29 2021-01-22 中华精测科技股份有限公司 探针组件及其空间转换介面板
KR102015788B1 (ko) 2017-11-30 2019-08-29 리노공업주식회사 검사장치
US10476196B2 (en) * 2018-02-28 2019-11-12 Ohio Associated Enterprises, Llc Electrical connector with contacts holding spring-loaded pins
US10938139B2 (en) * 2018-08-21 2021-03-02 Te Connectivity Corporation Electrical connector with retractable contacts
US11567102B2 (en) * 2019-09-04 2023-01-31 Chien Wen Chang Auxiliary device for functional expansion and signal acquisition of testing system
US11835567B2 (en) * 2020-12-18 2023-12-05 Suzhou Uigreen Micro&Nano Technology Co. Ltd. Method for assembling ultrahigh-frequency spring probe test assembly
US12517171B2 (en) * 2023-04-06 2026-01-06 Western Digital Technologies, Inc. Apparatus and method for coupling to an electrical interface of a circuit board
CN116754814B (zh) * 2023-08-11 2023-10-24 杭州朗迅科技股份有限公司 一种高密度探针卡及制备方法、测试方法

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US6498506B1 (en) * 2000-07-26 2002-12-24 Gore Enterprise Holdings, Inc. Spring probe assemblies
US6551126B1 (en) * 2001-03-13 2003-04-22 3M Innovative Properties Company High bandwidth probe assembly
KR20030081513A (ko) * 2001-03-13 2003-10-17 쓰리엠 이노베이티브 프로퍼티즈 컴파니 스프링 탐침을 유지하는 방법 및 장치
US20040043653A1 (en) * 2002-08-29 2004-03-04 Steven Feldman High density probe device
US6824427B1 (en) * 2003-05-13 2004-11-30 3M Innovative Properties Company Coaxial probe interconnection system
US7015708B2 (en) * 2003-07-11 2006-03-21 Gore Enterprise Holdings, Inc. Method and apparatus for a high frequency, impedance controlled probing device with flexible ground contacts
US20070197095A1 (en) * 2006-01-31 2007-08-23 3M Innovative Properties Company Electrical connector assembly

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US4734046A (en) 1984-09-21 1988-03-29 International Business Machines Corporation Coaxial converter with resilient terminal
US5485140A (en) * 1994-06-24 1996-01-16 Bussin; George N. Vehicle obstacle detector and alarm system
US7371128B2 (en) 2003-10-14 2008-05-13 Precision Interconnect, Inc. Cable terminal with air-enhanced contact pins

Patent Citations (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6498506B1 (en) * 2000-07-26 2002-12-24 Gore Enterprise Holdings, Inc. Spring probe assemblies
US6551126B1 (en) * 2001-03-13 2003-04-22 3M Innovative Properties Company High bandwidth probe assembly
KR20030081513A (ko) * 2001-03-13 2003-10-17 쓰리엠 이노베이티브 프로퍼티즈 컴파니 스프링 탐침을 유지하는 방법 및 장치
US20040043653A1 (en) * 2002-08-29 2004-03-04 Steven Feldman High density probe device
US6824427B1 (en) * 2003-05-13 2004-11-30 3M Innovative Properties Company Coaxial probe interconnection system
US7015708B2 (en) * 2003-07-11 2006-03-21 Gore Enterprise Holdings, Inc. Method and apparatus for a high frequency, impedance controlled probing device with flexible ground contacts
US20070197095A1 (en) * 2006-01-31 2007-08-23 3M Innovative Properties Company Electrical connector assembly

Cited By (20)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN107422197A (zh) * 2012-08-01 2017-12-01 日本电子材料株式会社 用于探针卡的导板和制造用于探针卡的导板的方法
CN107422197B (zh) * 2012-08-01 2019-12-20 日本电子材料株式会社 用于探针卡的导板和制造用于探针卡的导板的方法
CN104600443A (zh) * 2015-01-21 2015-05-06 谢博 一种接地线电极
CN106249124A (zh) * 2015-06-08 2016-12-21 英飞凌科技股份有限公司 使用接口构件测试待测器件的模块化测量设备
CN107919542B (zh) * 2016-10-10 2019-12-06 思科技术公司 线缆接头
CN107919542A (zh) * 2016-10-10 2018-04-17 思科技术公司 线缆接头
CN109983769B (zh) * 2016-11-29 2020-12-29 李诺工业股份有限公司 相机模块测试装置
TWI644110B (zh) * 2016-11-29 2018-12-11 李諾工業股份有限公司 相機模組測試裝置
CN109983769A (zh) * 2016-11-29 2019-07-05 李诺工业股份有限公司 相机模块测试装置
CN110945366A (zh) * 2017-07-28 2020-03-31 日本发条株式会社 接触式探针及探针单元
KR102546497B1 (ko) 2018-09-13 2023-06-23 하르팅 일렉트릭 슈티프퉁 운트 코우. 카게 접지 단자 영역을 갖는 플러그-인 커넥터
KR20210056408A (ko) * 2018-09-13 2021-05-18 하르팅 에렉트릭 게엠베하 운트 코우. 카게 접지 단자 영역을 갖는 플러그-인 커넥터
US11450989B2 (en) 2018-09-13 2022-09-20 Harting Electric Stiftung & Co. Kg Plug-in connector with ground terminal region
WO2020051842A1 (en) * 2018-09-13 2020-03-19 Harting (Zhuhai) Manufacturing Co., Ltd. Plug-in connector with ground terminal region
US11705672B2 (en) 2018-09-13 2023-07-18 Harting Electric Stiftung & Co. Kg Plug-in connector with ground terminal region
CN112240947A (zh) * 2020-12-18 2021-01-19 苏州和林微纳科技股份有限公司 一种超高频弹簧探针测试组件的装配方法
CN115021001A (zh) * 2022-06-30 2022-09-06 北京华峰测控技术股份有限公司 线缆连接结构、探针块、信号扩展装置和半导体测试机
CN115060938A (zh) * 2022-06-30 2022-09-16 北京华峰测控技术股份有限公司 探针块、信号扩展装置和半导体测试机
CN115060938B (zh) * 2022-06-30 2026-05-01 北京华峰测控技术股份有限公司 探针块、信号扩展装置和半导体测试机
CN116879586A (zh) * 2023-07-28 2023-10-13 上海捷策创电子科技有限公司 一种用于半导体测试的同轴高速接口装置

Also Published As

Publication number Publication date
US20100062629A1 (en) 2010-03-11
WO2010028136A8 (en) 2010-07-22
EP2340555A2 (en) 2011-07-06
WO2010028136A2 (en) 2010-03-11
JP2012502277A (ja) 2012-01-26
WO2010028136A3 (en) 2010-06-03
US7740508B2 (en) 2010-06-22
EP2340555A4 (en) 2012-08-22
KR20110060922A (ko) 2011-06-08

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Legal Events

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C10 Entry into substantive examination
SE01 Entry into force of request for substantive examination
C02 Deemed withdrawal of patent application after publication (patent law 2001)
WD01 Invention patent application deemed withdrawn after publication

Application publication date: 20110921