CN102105781B - 卷材检查校准系统及相关方法 - Google Patents

卷材检查校准系统及相关方法 Download PDF

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Publication number
CN102105781B
CN102105781B CN2009801289711A CN200980128971A CN102105781B CN 102105781 B CN102105781 B CN 102105781B CN 2009801289711 A CN2009801289711 A CN 2009801289711A CN 200980128971 A CN200980128971 A CN 200980128971A CN 102105781 B CN102105781 B CN 102105781B
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CN
China
Prior art keywords
web
calibration
sensor
inspection system
cross
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Expired - Fee Related
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CN2009801289711A
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English (en)
Chinese (zh)
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CN102105781A (zh
Inventor
大卫·L·霍费尔特
德里克·H·贾斯蒂斯
约翰·A·拉姆瑟恩
凯瑟琳·P·塔尔诺夫斯基
许文源
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3M Innovative Properties Co
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3M Innovative Properties Co
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/89—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B65—CONVEYING; PACKING; STORING; HANDLING THIN OR FILAMENTARY MATERIAL
    • B65H—HANDLING THIN OR FILAMENTARY MATERIAL, e.g. SHEETS, WEBS, CABLES
    • B65H20/00—Advancing webs
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B65—CONVEYING; PACKING; STORING; HANDLING THIN OR FILAMENTARY MATERIAL
    • B65H—HANDLING THIN OR FILAMENTARY MATERIAL, e.g. SHEETS, WEBS, CABLES
    • B65H43/00—Use of control, checking, or safety devices, e.g. automatic devices comprising an element for sensing a variable
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B65—CONVEYING; PACKING; STORING; HANDLING THIN OR FILAMENTARY MATERIAL
    • B65H—HANDLING THIN OR FILAMENTARY MATERIAL, e.g. SHEETS, WEBS, CABLES
    • B65H7/00—Controlling article feeding, separating, pile-advancing, or associated apparatus, to take account of incorrect feeding, absence of articles, or presence of faulty articles
    • B65H7/02—Controlling article feeding, separating, pile-advancing, or associated apparatus, to take account of incorrect feeding, absence of articles, or presence of faulty articles by feelers or detectors
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/30—Measuring arrangements characterised by the use of optical techniques for measuring roughness or irregularity of surfaces
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • G01N21/27—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands using photo-electric detection ; circuits for computing concentration
    • G01N21/274—Calibration, base line adjustment, drift correction
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/93—Detection standards; Calibrating baseline adjustment, drift correction
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B65—CONVEYING; PACKING; STORING; HANDLING THIN OR FILAMENTARY MATERIAL
    • B65H—HANDLING THIN OR FILAMENTARY MATERIAL, e.g. SHEETS, WEBS, CABLES
    • B65H2220/00—Function indicators
    • B65H2220/09—Function indicators indicating that several of an entity are present
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B65—CONVEYING; PACKING; STORING; HANDLING THIN OR FILAMENTARY MATERIAL
    • B65H—HANDLING THIN OR FILAMENTARY MATERIAL, e.g. SHEETS, WEBS, CABLES
    • B65H2515/00—Physical entities not provided for in groups B65H2511/00 or B65H2513/00
    • B65H2515/84—Quality; Condition, e.g. degree of wear
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B65—CONVEYING; PACKING; STORING; HANDLING THIN OR FILAMENTARY MATERIAL
    • B65H—HANDLING THIN OR FILAMENTARY MATERIAL, e.g. SHEETS, WEBS, CABLES
    • B65H2553/00—Sensing or detecting means
    • B65H2553/30—Sensing or detecting means using acoustic or ultrasonic elements
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B65—CONVEYING; PACKING; STORING; HANDLING THIN OR FILAMENTARY MATERIAL
    • B65H—HANDLING THIN OR FILAMENTARY MATERIAL, e.g. SHEETS, WEBS, CABLES
    • B65H2553/00—Sensing or detecting means
    • B65H2553/40—Sensing or detecting means using optical, e.g. photographic, elements
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B65—CONVEYING; PACKING; STORING; HANDLING THIN OR FILAMENTARY MATERIAL
    • B65H—HANDLING THIN OR FILAMENTARY MATERIAL, e.g. SHEETS, WEBS, CABLES
    • B65H2553/00—Sensing or detecting means
    • B65H2553/40—Sensing or detecting means using optical, e.g. photographic, elements
    • B65H2553/42—Cameras
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B65—CONVEYING; PACKING; STORING; HANDLING THIN OR FILAMENTARY MATERIAL
    • B65H—HANDLING THIN OR FILAMENTARY MATERIAL, e.g. SHEETS, WEBS, CABLES
    • B65H2557/00—Means for control not provided for in groups B65H2551/00 - B65H2555/00
    • B65H2557/60—Details of processes or procedures
    • B65H2557/61—Details of processes or procedures for calibrating

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • General Health & Medical Sciences (AREA)
  • Pathology (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Engineering & Computer Science (AREA)
  • Textile Engineering (AREA)
  • Mathematical Physics (AREA)
  • Theoretical Computer Science (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Treatment Of Fiber Materials (AREA)
  • Testing Or Calibration Of Command Recording Devices (AREA)
CN2009801289711A 2008-06-05 2009-04-24 卷材检查校准系统及相关方法 Expired - Fee Related CN102105781B (zh)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US12/133,487 US7773226B2 (en) 2008-06-05 2008-06-05 Web inspection calibration system and related methods
US12/133,487 2008-06-05
PCT/US2009/041596 WO2009148720A2 (en) 2008-06-05 2009-04-24 Web inspection calibration system and related methods

Publications (2)

Publication Number Publication Date
CN102105781A CN102105781A (zh) 2011-06-22
CN102105781B true CN102105781B (zh) 2013-02-13

Family

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Family Applications (1)

Application Number Title Priority Date Filing Date
CN2009801289711A Expired - Fee Related CN102105781B (zh) 2008-06-05 2009-04-24 卷材检查校准系统及相关方法

Country Status (6)

Country Link
US (2) US7773226B2 (https=)
EP (1) EP2294388A4 (https=)
JP (1) JP2011523056A (https=)
KR (1) KR20110015679A (https=)
CN (1) CN102105781B (https=)
WO (1) WO2009148720A2 (https=)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI559108B (zh) * 2014-07-22 2016-11-21 寧波弘訊科技股份有限公司 糾偏控制方法、控制器及糾偏控制系統

Families Citing this family (34)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7415881B2 (en) * 2004-08-19 2008-08-26 Fife Corporation Ultrasonic sensor system for web-guiding apparatus
DE102006014506A1 (de) * 2006-03-20 2007-09-27 Fraunhofer-Gesellschaft zur Förderung der angewandten Forschung e.V. Verfahren zur Detektion von Planlageabweichungen bei der Abrollung flexibler, bahnförmiger Flachformgüter
US7773226B2 (en) * 2008-06-05 2010-08-10 3M Innovative Properties Company Web inspection calibration system and related methods
EP2186624B1 (en) * 2008-11-18 2015-08-26 Tetra Laval Holdings & Finance S.A. Apparatus and method for detecting the position of application of a sealing strip onto a web of packaging material for food products
US8325225B2 (en) * 2009-03-16 2012-12-04 PT Papertech, Inc Method and apparatus for a web inspection system
US8147026B2 (en) * 2009-04-27 2012-04-03 Eastman Kodak Company Image quality matching in a mixed print engine assembly system
TWI408331B (zh) * 2009-12-17 2013-09-11 Ind Tech Res Inst 雙面光學膜片量測裝置與方法
JP2011163766A (ja) * 2010-02-04 2011-08-25 Omron Corp 画像処理方法および画像処理システム
US8762881B2 (en) * 2010-07-15 2014-06-24 Salesforce.Com, Inc. Taking screenshots of a failed application
US9172916B2 (en) 2010-12-12 2015-10-27 Event Capture Systems, Inc. Web monitoring system
CN103314288B (zh) * 2011-01-22 2015-09-02 Utc消防及保安公司 具有用于电离和光检测的单个源的检测器
DE102011106523A1 (de) 2011-07-04 2013-01-10 Giesecke & Devrient Gmbh Prüfgerät und Verfahren zur Kalibrierung eines Prüfgeräts
US8553228B2 (en) * 2011-09-30 2013-10-08 3M Innovative Properties Company Web inspection calibration system and related methods
CN102615945A (zh) * 2012-03-29 2012-08-01 吴江迈为技术有限公司 一种卷纸传片装置中保证卷纸正、反运行在相同段的方法
US8923571B2 (en) 2012-07-16 2014-12-30 Hewlett-Packard Development Company, L.P. Automated camera flat fielding and alignment
US9415963B2 (en) 2013-01-30 2016-08-16 Fife Corporation Sensor controller for interpreting natural interaction sensor for web handling
ITVR20130218A1 (it) * 2013-09-20 2015-03-21 Bema Srl Dispositivo e procedimento di controllo della qualita' di film estensibile per imballaggio
US10119225B2 (en) 2014-04-15 2018-11-06 Gpcp Ip Holdings Llc Systems for controlling a manufacturing line used to convert a paper web into paper products by reading marks on the paper web
CN104020177B (zh) * 2014-06-26 2016-06-15 重庆大学 连铸坯表面缺陷双ccd扫描成像检测方法
KR101733018B1 (ko) * 2015-02-25 2017-05-24 동우 화인켐 주식회사 광학 필름의 불량 검출 장치 및 방법
CN105222728A (zh) * 2015-09-14 2016-01-06 深圳市星源材质科技股份有限公司 一种锂电池隔膜表面平整度的检测装置及其方法
EP3339845A3 (en) * 2016-11-30 2018-09-12 Sumitomo Chemical Company, Ltd Defect inspection device, defect inspection method, method for producing separator roll, and separator roll
JP6575824B2 (ja) * 2017-03-22 2019-09-18 トヨタ自動車株式会社 膜厚測定方法および膜厚測定装置
SMT202500335T1 (it) 2017-09-22 2025-11-10 Lantech Com Llc Compensazione di qualità del materiale di imballaggio
CN107830814B (zh) * 2017-10-16 2020-09-11 北京科技大学 一种基于光度学的测量表面变形的方法
US11327010B2 (en) * 2018-01-31 2022-05-10 3M Innovative Properties Company Infrared light transmission inspection for continuous moving web
EP4365540A3 (en) 2018-04-04 2024-08-14 Paper Converting Machine Company Control for parent roll unwinding apparatus and methods
WO2020190909A1 (en) * 2019-03-20 2020-09-24 Lantech.Com, Llc Packaging material evaluation and apparatus therefor for evaluating simulated flaws
CA3147091C (en) 2019-09-19 2025-02-04 Lantech.Com, Llc ULTRASONIC DETECTION OF PACKAGING MATERIAL DEFECTS WITH TIME-LIMITED RESPONSE DETECTION
AU2020350496B2 (en) 2019-09-19 2024-01-25 Lantech.Com, Llc Packaging material grading and/or factory profiles
CN111649697B (zh) * 2020-07-03 2022-02-11 东北大学 基于线阵相机立体视觉的金属带材板形检测方法
CN114778453A (zh) * 2021-12-31 2022-07-22 南京华鼎纳米技术研究院有限公司 一种基于纸张光度的纸张修复方法
EP4397610A4 (en) * 2022-11-23 2024-11-06 Contemporary Amperex Technology (Hong Kong) Limited ROLL, METHOD AND APPARATUS FOR LOCALIZED INSPECTION, METHOD AND APPARATUS FOR TRANSPORTING COILED MATERIAL, AND DEVICE AND SUPPORT
CN118936309B (zh) * 2024-08-26 2025-12-05 西北工业大学深圳研究院 适用于卷绕系统的高反光卷材偏移量测量方法

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4566798A (en) * 1983-11-10 1986-01-28 Eastman Kodak Company Method for calibrating a reflectometer containing black and white references displaced from the sample position
CN1517702A (zh) * 2003-01-20 2004-08-04 ������������ʽ���� 外观检测装置以及外观检测方法

Family Cites Families (18)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3562525A (en) * 1967-06-29 1971-02-09 Minnesota Mining & Mfg X-ray fludrescence gauging employing a single x-ray source and a reference sample for comparative measurements
US3671744A (en) * 1970-10-05 1972-06-20 Minnesota Mining & Mfg Digital differential emission x-ray gauge
US5071514A (en) 1990-12-17 1991-12-10 Francis Systems, Inc. Paper weight sensor with stationary optical sensors calibrated by a scanning sensor
JP2635889B2 (ja) 1992-06-24 1997-07-30 株式会社東芝 ダイボンディング装置
JP3211389B2 (ja) * 1992-06-30 2001-09-25 株式会社島津製作所 蛍光検出型ゲル電気泳動装置
US5563809A (en) 1994-04-06 1996-10-08 Abb Industrial Systems, Inc. Measurement/control of sheet material using at least one sensor array
US5666199A (en) 1994-07-11 1997-09-09 Phillips Petroleum Company Apparatus and process for detecting the presence of gel defects in oriented sheets or films based on polarization detection
US6264533B1 (en) * 1999-05-28 2001-07-24 3M Innovative Properties Company Abrasive processing apparatus and method employing encoded abrasive product
US6813032B1 (en) * 1999-09-07 2004-11-02 Applied Materials, Inc. Method and apparatus for enhanced embedded substrate inspection through process data collection and substrate imaging techniques
US6721045B1 (en) * 1999-09-07 2004-04-13 Applied Materials, Inc. Method and apparatus to provide embedded substrate process monitoring through consolidation of multiple process inspection techniques
US6553133B1 (en) 1999-09-22 2003-04-22 U.T. Battelle, Llc Four-dimensional characterization of a sheet-forming web
US6452679B1 (en) 1999-12-29 2002-09-17 Kimberly-Clark Worldwide, Inc. Method and apparatus for controlling the manufacturing quality of a moving web
US6934028B2 (en) 2000-01-20 2005-08-23 Webview, Inc. Certification and verification management system and method for a web inspection apparatus
WO2002035308A2 (en) 2000-10-23 2002-05-02 Am Vision Technologies Ltd. Method and device for optically determining bulk density and uniformity of web configured material during in-line processing
US6850857B2 (en) 2001-07-13 2005-02-01 Honeywell International Inc. Data fusion of stationary array sensor and scanning sensor measurements
US6829516B2 (en) 2002-08-07 2004-12-07 Kimberly-Clark Worlwide, Inc. Combined information exchange systems and methods
US7697073B2 (en) 2005-12-06 2010-04-13 Raytheon Company Image processing system with horizontal line registration for improved imaging with scene motion
US7773226B2 (en) * 2008-06-05 2010-08-10 3M Innovative Properties Company Web inspection calibration system and related methods

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4566798A (en) * 1983-11-10 1986-01-28 Eastman Kodak Company Method for calibrating a reflectometer containing black and white references displaced from the sample position
CN1517702A (zh) * 2003-01-20 2004-08-04 ������������ʽ���� 外观检测装置以及外观检测方法

Non-Patent Citations (1)

* Cited by examiner, † Cited by third party
Title
JP特开平6-18416A 1994.01.25

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI559108B (zh) * 2014-07-22 2016-11-21 寧波弘訊科技股份有限公司 糾偏控制方法、控制器及糾偏控制系統

Also Published As

Publication number Publication date
US20090303484A1 (en) 2009-12-10
EP2294388A4 (en) 2012-10-31
WO2009148720A2 (en) 2009-12-10
EP2294388A2 (en) 2011-03-16
US20100231897A1 (en) 2010-09-16
US7773226B2 (en) 2010-08-10
CN102105781A (zh) 2011-06-22
KR20110015679A (ko) 2011-02-16
WO2009148720A3 (en) 2010-03-04
US7957000B2 (en) 2011-06-07
JP2011523056A (ja) 2011-08-04

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