CN102063017B - 曝光装置和器件制造方法 - Google Patents
曝光装置和器件制造方法 Download PDFInfo
- Publication number
- CN102063017B CN102063017B CN2010105401255A CN201010540125A CN102063017B CN 102063017 B CN102063017 B CN 102063017B CN 2010105401255 A CN2010105401255 A CN 2010105401255A CN 201010540125 A CN201010540125 A CN 201010540125A CN 102063017 B CN102063017 B CN 102063017B
- Authority
- CN
- China
- Prior art keywords
- substrate
- transfer arm
- stage
- place
- stand
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
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Classifications
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- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/70—Microphotolithographic exposure; Apparatus therefor
- G03F7/70691—Handling of masks or workpieces
- G03F7/70775—Position control, e.g. interferometers or encoders for determining the stage position
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/70—Microphotolithographic exposure; Apparatus therefor
- G03F7/70691—Handling of masks or workpieces
- G03F7/70716—Stages
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/70—Microphotolithographic exposure; Apparatus therefor
- G03F7/70691—Handling of masks or workpieces
- G03F7/70716—Stages
- G03F7/70725—Stages control
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/70—Microphotolithographic exposure; Apparatus therefor
- G03F7/70691—Handling of masks or workpieces
- G03F7/70733—Handling masks and workpieces, e.g. exchange of workpiece or mask, transport of workpiece or mask
- G03F7/7075—Handling workpieces outside exposure position, e.g. SMIF box
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- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P72/00—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof
- H10P72/30—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for conveying, e.g. between different workstations
- H10P72/33—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for conveying, e.g. between different workstations into and out of processing chamber
- H10P72/3306—Horizontal transfer of a single workpiece
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- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P76/00—Manufacture or treatment of masks on semiconductor bodies, e.g. by lithography or photolithography
- H10P76/20—Manufacture or treatment of masks on semiconductor bodies, e.g. by lithography or photolithography of masks comprising organic materials
- H10P76/204—Manufacture or treatment of masks on semiconductor bodies, e.g. by lithography or photolithography of masks comprising organic materials of organic photoresist masks
- H10P76/2041—Photolithographic processes
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Exposure And Positioning Against Photoresist Photosensitive Materials (AREA)
- Container, Conveyance, Adherence, Positioning, Of Wafer (AREA)
- Exposure Of Semiconductors, Excluding Electron Or Ion Beam Exposure (AREA)
Applications Claiming Priority (4)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2009261318 | 2009-11-16 | ||
| JP2009-261318 | 2009-11-16 | ||
| JP2010-237915 | 2010-10-22 | ||
| JP2010237915A JP5537380B2 (ja) | 2009-11-16 | 2010-10-22 | 露光装置及びデバイス製造方法 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN102063017A CN102063017A (zh) | 2011-05-18 |
| CN102063017B true CN102063017B (zh) | 2013-03-13 |
Family
ID=43998349
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN2010105401255A Active CN102063017B (zh) | 2009-11-16 | 2010-11-11 | 曝光装置和器件制造方法 |
Country Status (4)
| Country | Link |
|---|---|
| US (1) | US9280067B2 (enExample) |
| JP (1) | JP5537380B2 (enExample) |
| KR (1) | KR101431867B1 (enExample) |
| CN (1) | CN102063017B (enExample) |
Families Citing this family (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP7212558B2 (ja) * | 2019-03-15 | 2023-01-25 | キヤノン株式会社 | 基板処理装置、決定方法及び物品の製造方法 |
| KR20210086748A (ko) * | 2019-12-30 | 2021-07-09 | 세메스 주식회사 | 기판 리프팅 방법 및 기판 처리 장치 |
| JP7625636B2 (ja) | 2023-05-24 | 2025-02-03 | キヤノン株式会社 | 基板処理装置、制御方法、および物品製造方法 |
Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN1838397A (zh) * | 2006-03-10 | 2006-09-27 | 友达光电股份有限公司 | 基板传送装置 |
| CN1922725A (zh) * | 2004-03-30 | 2007-02-28 | 东京毅力科创株式会社 | 半导体处理装置和方法 |
| CN101060066A (zh) * | 2006-04-17 | 2007-10-24 | 大日本网目版制造株式会社 | 基板处理装置 |
| CN101351878A (zh) * | 2006-09-05 | 2009-01-21 | 东京毅力科创株式会社 | 基板交接装置、基板处理装置、基板交接方法 |
Family Cites Families (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| KR100280108B1 (ko) * | 1998-11-03 | 2001-03-02 | 윤종용 | 오리엔터 플랫존 유니트의 웨이퍼 파손 방지 시스템 |
| KR100388653B1 (ko) * | 2000-12-18 | 2003-06-25 | 삼성전자주식회사 | 반송로봇과 그 제어방법 |
| JP2003163251A (ja) * | 2001-11-27 | 2003-06-06 | Sendai Nikon:Kk | 搬送装置及び露光装置 |
| JP2005114882A (ja) * | 2003-10-06 | 2005-04-28 | Hitachi High-Tech Electronics Engineering Co Ltd | 処理ステージの基板載置方法、基板露光ステージおよび基板露光装置 |
| JP2006066636A (ja) * | 2004-08-26 | 2006-03-09 | Nikon Corp | 搬送装置とその方法、及び露光装置 |
| KR101280166B1 (ko) * | 2004-11-25 | 2013-06-28 | 가부시키가이샤 니콘 | 이동체 시스템, 노광 장치 및 디바이스 제조 방법 |
| JPWO2007116752A1 (ja) * | 2006-04-05 | 2009-08-20 | 株式会社ニコン | ステージ装置、露光装置、ステージ制御方法、露光方法、およびデバイス製造方法 |
-
2010
- 2010-10-22 JP JP2010237915A patent/JP5537380B2/ja not_active Expired - Fee Related
- 2010-11-04 KR KR1020100109121A patent/KR101431867B1/ko active Active
- 2010-11-05 US US12/940,681 patent/US9280067B2/en active Active
- 2010-11-11 CN CN2010105401255A patent/CN102063017B/zh active Active
Patent Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN1922725A (zh) * | 2004-03-30 | 2007-02-28 | 东京毅力科创株式会社 | 半导体处理装置和方法 |
| CN1838397A (zh) * | 2006-03-10 | 2006-09-27 | 友达光电股份有限公司 | 基板传送装置 |
| CN101060066A (zh) * | 2006-04-17 | 2007-10-24 | 大日本网目版制造株式会社 | 基板处理装置 |
| CN101351878A (zh) * | 2006-09-05 | 2009-01-21 | 东京毅力科创株式会社 | 基板交接装置、基板处理装置、基板交接方法 |
Non-Patent Citations (1)
| Title |
|---|
| JP特开2006-66636A 2006.03.09 |
Also Published As
| Publication number | Publication date |
|---|---|
| JP5537380B2 (ja) | 2014-07-02 |
| KR20110053903A (ko) | 2011-05-24 |
| KR101431867B1 (ko) | 2014-08-25 |
| CN102063017A (zh) | 2011-05-18 |
| JP2011124548A (ja) | 2011-06-23 |
| US20110116070A1 (en) | 2011-05-19 |
| US9280067B2 (en) | 2016-03-08 |
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|---|---|---|---|
| C06 | Publication | ||
| PB01 | Publication | ||
| C10 | Entry into substantive examination | ||
| SE01 | Entry into force of request for substantive examination | ||
| C14 | Grant of patent or utility model | ||
| GR01 | Patent grant |