CN101983253B - 溅射设备及制造金属化结构的方法 - Google Patents
溅射设备及制造金属化结构的方法 Download PDFInfo
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- CN101983253B CN101983253B CN2009801125478A CN200980112547A CN101983253B CN 101983253 B CN101983253 B CN 101983253B CN 2009801125478 A CN2009801125478 A CN 2009801125478A CN 200980112547 A CN200980112547 A CN 200980112547A CN 101983253 B CN101983253 B CN 101983253B
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- tantalum
- layer
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- frequency signal
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- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C14/00—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
- C23C14/04—Coating on selected surface areas, e.g. using masks
- C23C14/046—Coating cavities or hollow spaces, e.g. interior of tubes; Infiltration of porous substrates
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- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C14/00—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
- C23C14/22—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the process of coating
- C23C14/34—Sputtering
- C23C14/3485—Sputtering using pulsed power to the target
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- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C14/00—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
- C23C14/06—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the coating material
- C23C14/0641—Nitrides
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- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C14/00—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
- C23C14/06—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the coating material
- C23C14/14—Metallic material, boron or silicon
- C23C14/16—Metallic material, boron or silicon on metallic substrates or on substrates of boron or silicon
- C23C14/165—Metallic material, boron or silicon on metallic substrates or on substrates of boron or silicon by cathodic sputtering
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C14/00—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
- C23C14/22—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the process of coating
- C23C14/34—Sputtering
- C23C14/3407—Cathode assembly for sputtering apparatus, e.g. Target
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C14/00—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
- C23C14/22—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the process of coating
- C23C14/34—Sputtering
- C23C14/3435—Applying energy to the substrate during sputtering
- C23C14/345—Applying energy to the substrate during sputtering using substrate bias
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C14/00—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
- C23C14/22—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the process of coating
- C23C14/34—Sputtering
- C23C14/35—Sputtering by application of a magnetic field, e.g. magnetron sputtering
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C14/00—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
- C23C14/22—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the process of coating
- C23C14/50—Substrate holders
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/32—Gas-filled discharge tubes
- H01J37/34—Gas-filled discharge tubes operating with cathodic sputtering
- H01J37/3411—Constructional aspects of the reactor
- H01J37/345—Magnet arrangements in particular for cathodic sputtering apparatus
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/32—Gas-filled discharge tubes
- H01J37/34—Gas-filled discharge tubes operating with cathodic sputtering
- H01J37/3464—Operating strategies
- H01J37/3467—Pulsed operation, e.g. HIPIMS
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P14/00—Formation of materials, e.g. in the shape of layers or pillars
- H10P14/40—Formation of materials, e.g. in the shape of layers or pillars of conductive or resistive materials
- H10P14/42—Formation of materials, e.g. in the shape of layers or pillars of conductive or resistive materials using a gas or vapour
- H10P14/44—Physical vapour deposition [PVD]
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W20/00—Interconnections in chips, wafers or substrates
- H10W20/01—Manufacture or treatment
- H10W20/031—Manufacture or treatment of conductive parts of the interconnections
- H10W20/032—Manufacture or treatment of conductive parts of the interconnections of conductive barrier, adhesion or liner layers
- H10W20/033—Manufacture or treatment of conductive parts of the interconnections of conductive barrier, adhesion or liner layers in openings in dielectrics
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W20/00—Interconnections in chips, wafers or substrates
- H10W20/40—Interconnections external to wafers or substrates, e.g. back-end-of-line [BEOL] metallisations or vias connecting to gate electrodes
- H10W20/41—Interconnections external to wafers or substrates, e.g. back-end-of-line [BEOL] metallisations or vias connecting to gate electrodes characterised by their conductive parts
- H10W20/425—Barrier, adhesion or liner layers
Landscapes
- Chemical & Material Sciences (AREA)
- Engineering & Computer Science (AREA)
- Organic Chemistry (AREA)
- Materials Engineering (AREA)
- Mechanical Engineering (AREA)
- Metallurgy (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Physics & Mathematics (AREA)
- Plasma & Fusion (AREA)
- Analytical Chemistry (AREA)
- Physical Vapour Deposition (AREA)
- Internal Circuitry In Semiconductor Integrated Circuit Devices (AREA)
- Electrodes Of Semiconductors (AREA)
Applications Claiming Priority (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US4201508P | 2008-04-03 | 2008-04-03 | |
| US61/042,015 | 2008-04-03 | ||
| PCT/IB2009/051419 WO2009122378A1 (en) | 2008-04-03 | 2009-04-03 | Apparatus for sputtering and a method of fabricating a metallization structure |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN101983253A CN101983253A (zh) | 2011-03-02 |
| CN101983253B true CN101983253B (zh) | 2012-10-24 |
Family
ID=40756963
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN2009801125478A Active CN101983253B (zh) | 2008-04-03 | 2009-04-03 | 溅射设备及制造金属化结构的方法 |
Country Status (7)
| Country | Link |
|---|---|
| US (2) | US8691058B2 (https=) |
| EP (1) | EP2268844B1 (https=) |
| JP (1) | JP5759891B2 (https=) |
| KR (2) | KR101647515B1 (https=) |
| CN (1) | CN101983253B (https=) |
| TW (1) | TWI398537B (https=) |
| WO (1) | WO2009122378A1 (https=) |
Families Citing this family (27)
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| US6896773B2 (en) * | 2002-11-14 | 2005-05-24 | Zond, Inc. | High deposition rate sputtering |
| US7095179B2 (en) * | 2004-02-22 | 2006-08-22 | Zond, Inc. | Methods and apparatus for generating strongly-ionized plasmas with ionizational instabilities |
| EP1803142A1 (en) * | 2004-09-24 | 2007-07-04 | Zond, Inc. | Apparatus for generating high-current electrical discharges |
| US8222139B2 (en) * | 2010-03-30 | 2012-07-17 | Taiwan Semiconductor Manufacturing Company, Ltd. | Chemical mechanical polishing (CMP) processing of through-silicon via (TSV) and contact plug simultaneously |
| CN102453881B (zh) * | 2010-10-27 | 2014-07-16 | 北京北方微电子基地设备工艺研究中心有限责任公司 | 物理气相沉积设备及磁控溅射方法 |
| EP2565291A1 (en) * | 2011-08-31 | 2013-03-06 | Hauzer Techno Coating BV | Vaccum coating apparatus and method for depositing nanocomposite coatings |
| JP6093363B2 (ja) * | 2011-09-30 | 2017-03-08 | セメコン アーゲー | Hipimsを用いた基材のコーティング |
| JP6093968B2 (ja) * | 2012-08-28 | 2017-03-15 | 国立研究開発法人産業技術総合研究所 | 電界放出素子用エミッタの作製方法 |
| US20170175247A1 (en) * | 2013-12-04 | 2017-06-22 | Evatec Ag | Sputtering source arrangement, sputtering system and method of manufacturing metal-coated plate-shaped substrates |
| JP6082165B2 (ja) * | 2014-05-22 | 2017-02-15 | キヤノンアネルバ株式会社 | 金属膜および金属膜の成膜方法 |
| US9812305B2 (en) * | 2015-04-27 | 2017-11-07 | Advanced Energy Industries, Inc. | Rate enhanced pulsed DC sputtering system |
| CN105448818B (zh) * | 2015-12-31 | 2018-10-16 | 上海集成电路研发中心有限公司 | 一种应用于半导体铜互连工艺的磁控溅射方法 |
| TWI615494B (zh) * | 2016-07-05 | 2018-02-21 | 鍍製光學硬膜之封閉式高能磁控濺鍍裝置及其製造方法 | |
| US20190088457A1 (en) * | 2017-09-19 | 2019-03-21 | Applied Materials, Inc. | Sync controller for high impulse magnetron sputtering |
| US10964590B2 (en) * | 2017-11-15 | 2021-03-30 | Taiwan Semiconductor Manufacturing Co., Ltd. | Contact metallization process |
| US10998209B2 (en) | 2019-05-31 | 2021-05-04 | Applied Materials, Inc. | Substrate processing platforms including multiple processing chambers |
| FR3097237B1 (fr) * | 2019-06-11 | 2021-05-28 | Safran | Procédé de revêtement d'un substrat par du nitrure de tantale |
| US12080571B2 (en) | 2020-07-08 | 2024-09-03 | Applied Materials, Inc. | Substrate processing module and method of moving a workpiece |
| US11749542B2 (en) | 2020-07-27 | 2023-09-05 | Applied Materials, Inc. | Apparatus, system, and method for non-contact temperature monitoring of substrate supports |
| US11817331B2 (en) | 2020-07-27 | 2023-11-14 | Applied Materials, Inc. | Substrate holder replacement with protective disk during pasting process |
| US11600507B2 (en) | 2020-09-09 | 2023-03-07 | Applied Materials, Inc. | Pedestal assembly for a substrate processing chamber |
| US11610799B2 (en) | 2020-09-18 | 2023-03-21 | Applied Materials, Inc. | Electrostatic chuck having a heating and chucking capabilities |
| US12195314B2 (en) | 2021-02-02 | 2025-01-14 | Applied Materials, Inc. | Cathode exchange mechanism to improve preventative maintenance time for cluster system |
| US11674227B2 (en) | 2021-02-03 | 2023-06-13 | Applied Materials, Inc. | Symmetric pump down mini-volume with laminar flow cavity gas injection for high and low pressure |
| US12002668B2 (en) | 2021-06-25 | 2024-06-04 | Applied Materials, Inc. | Thermal management hardware for uniform temperature control for enhanced bake-out for cluster tool |
| US20250163561A1 (en) * | 2023-11-01 | 2025-05-22 | Lawrence Livermore National Security, Llc | Polymer templating of alpha-phase tantalum |
| CN120362484B (zh) * | 2025-06-25 | 2025-09-05 | 西安稀有金属材料研究院有限公司 | 钽基多层复合粉末及其制备方法、冷喷涂涂层材料 |
Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN1680618A (zh) * | 2004-11-30 | 2005-10-12 | 大连理工大学 | 脉冲偏压电弧离子镀钛/氮化钛纳米多层超硬薄膜的方法 |
| CN101124350A (zh) * | 2005-02-03 | 2008-02-13 | 应用材料股份有限公司 | 具有可施加至靶材的射频电源的物理气相沉积等离子体反应器 |
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| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| SE9704607D0 (sv) * | 1997-12-09 | 1997-12-09 | Chemfilt R & D Ab | A method and apparatus for magnetically enhanced sputtering |
| US7253109B2 (en) | 1997-11-26 | 2007-08-07 | Applied Materials, Inc. | Method of depositing a tantalum nitride/tantalum diffusion barrier layer system |
| US6911124B2 (en) * | 1998-09-24 | 2005-06-28 | Applied Materials, Inc. | Method of depositing a TaN seed layer |
| WO1999040615A1 (en) * | 1998-02-04 | 1999-08-12 | Semitool, Inc. | Method and apparatus for low-temperature annealing of metallization micro-structures in the production of a microelectronic device |
| US6290825B1 (en) * | 1999-02-12 | 2001-09-18 | Applied Materials, Inc. | High-density plasma source for ionized metal deposition |
| US6193855B1 (en) * | 1999-10-19 | 2001-02-27 | Applied Materials, Inc. | Use of modulated inductive power and bias power to reduce overhang and improve bottom coverage |
| US6200433B1 (en) * | 1999-11-01 | 2001-03-13 | Applied Materials, Inc. | IMP technology with heavy gas sputtering |
| US6350353B2 (en) | 1999-11-24 | 2002-02-26 | Applied Materials, Inc. | Alternate steps of IMP and sputtering process to improve sidewall coverage |
| JP2001335919A (ja) * | 2000-03-21 | 2001-12-07 | Murata Mfg Co Ltd | αタンタル膜の製造方法、αタンタル膜及びそれを用いた素子 |
| US20020142589A1 (en) * | 2001-01-31 | 2002-10-03 | Applied Materials, Inc. | Method of obtaining low temperature alpha-ta thin films using wafer bias |
| KR100878103B1 (ko) * | 2001-05-04 | 2009-01-14 | 도쿄엘렉트론가부시키가이샤 | 순차적 증착 및 에칭에 의한 이온화된 pvd |
| US6709553B2 (en) * | 2002-05-09 | 2004-03-23 | Applied Materials, Inc. | Multiple-step sputter deposition |
| JP2004131839A (ja) * | 2002-06-17 | 2004-04-30 | Applied Materials Inc | パルス化された電力によるスパッタリング堆積 |
| JP4497447B2 (ja) * | 2003-03-03 | 2010-07-07 | 株式会社アルバック | パルス状直流スパッタ成膜方法及び該方法のための成膜装置 |
| US7686926B2 (en) * | 2004-05-26 | 2010-03-30 | Applied Materials, Inc. | Multi-step process for forming a metal barrier in a sputter reactor |
| WO2007032858A1 (en) * | 2005-09-13 | 2007-03-22 | Applied Materials, Inc. | Large-area magnetron sputtering chamber with individually controlled sputtering zones |
| US8173278B2 (en) * | 2006-04-21 | 2012-05-08 | Cemecon Ag | Coated body |
| TWI464282B (zh) | 2006-12-12 | 2014-12-11 | 歐瑞康先進科技股份有限公司 | 具有高能脈衝磁管噴濺之射頻基板偏壓 |
| JP5521136B2 (ja) | 2007-10-26 | 2014-06-11 | エリコン・アドヴァンスド・テクノロジーズ・アーゲー | 3次元半導体パッケージングにおけるSi貫通ビアのメタライゼーションへのHIPIMSの適用 |
-
2009
- 2009-04-03 JP JP2011502488A patent/JP5759891B2/ja active Active
- 2009-04-03 KR KR1020107022019A patent/KR101647515B1/ko active Active
- 2009-04-03 US US12/417,727 patent/US8691058B2/en active Active
- 2009-04-03 KR KR1020167011413A patent/KR101959113B1/ko active Active
- 2009-04-03 EP EP09728042.4A patent/EP2268844B1/en active Active
- 2009-04-03 WO PCT/IB2009/051419 patent/WO2009122378A1/en not_active Ceased
- 2009-04-03 CN CN2009801125478A patent/CN101983253B/zh active Active
- 2009-04-03 TW TW098111286A patent/TWI398537B/zh active
-
2014
- 2014-02-17 US US14/181,886 patent/US9644261B2/en active Active
Patent Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN1680618A (zh) * | 2004-11-30 | 2005-10-12 | 大连理工大学 | 脉冲偏压电弧离子镀钛/氮化钛纳米多层超硬薄膜的方法 |
| CN101124350A (zh) * | 2005-02-03 | 2008-02-13 | 应用材料股份有限公司 | 具有可施加至靶材的射频电源的物理气相沉积等离子体反应器 |
Also Published As
| Publication number | Publication date |
|---|---|
| US20090263966A1 (en) | 2009-10-22 |
| TWI398537B (zh) | 2013-06-11 |
| JP5759891B2 (ja) | 2015-08-05 |
| KR20100135774A (ko) | 2010-12-27 |
| CN101983253A (zh) | 2011-03-02 |
| JP2011516728A (ja) | 2011-05-26 |
| US9644261B2 (en) | 2017-05-09 |
| KR101959113B1 (ko) | 2019-03-15 |
| KR101647515B1 (ko) | 2016-08-10 |
| KR20160052806A (ko) | 2016-05-12 |
| WO2009122378A1 (en) | 2009-10-08 |
| EP2268844B1 (en) | 2020-11-25 |
| US8691058B2 (en) | 2014-04-08 |
| US20140158530A1 (en) | 2014-06-12 |
| EP2268844A1 (en) | 2011-01-05 |
| TW200944606A (en) | 2009-11-01 |
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