CN101680921B - 具有快速恢复电流回路的电容测量 - Google Patents

具有快速恢复电流回路的电容测量 Download PDF

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Publication number
CN101680921B
CN101680921B CN2008800165026A CN200880016502A CN101680921B CN 101680921 B CN101680921 B CN 101680921B CN 2008800165026 A CN2008800165026 A CN 2008800165026A CN 200880016502 A CN200880016502 A CN 200880016502A CN 101680921 B CN101680921 B CN 101680921B
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CN
China
Prior art keywords
capacitance component
switch
terminal
current
voltage
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Expired - Fee Related
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CN2008800165026A
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English (en)
Chinese (zh)
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CN101680921A (zh
Inventor
戴维·W·牛顿
肯尼思·V·阿尔蒙特
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Electro Scientific Industries Inc
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Electro Scientific Industries Inc
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R27/00—Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
    • G01R27/02—Measuring real or complex resistance, reactance, impedance, or other two-pole characteristics derived therefrom, e.g. time constant
    • G01R27/26—Measuring inductance or capacitance; Measuring quality factor, e.g. by using the resonance method; Measuring loss factor; Measuring dielectric constants ; Measuring impedance or related variables
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/50—Testing of electric apparatus, lines, cables or components for short-circuits, continuity, leakage current or incorrect line connections
    • G01R31/64—Testing of capacitors
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/50—Testing of electric apparatus, lines, cables or components for short-circuits, continuity, leakage current or incorrect line connections
    • G01R31/52—Testing for short-circuits, leakage current or ground faults

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Power Engineering (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
  • Testing Electric Properties And Detecting Electric Faults (AREA)
  • Measurement Of Resistance Or Impedance (AREA)
CN2008800165026A 2007-05-24 2008-05-14 具有快速恢复电流回路的电容测量 Expired - Fee Related CN101680921B (zh)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US11/753,177 US7940058B2 (en) 2007-05-24 2007-05-24 Capacitive measurements with fast recovery current return
US11/753,177 2007-05-24
PCT/US2008/063607 WO2008147694A1 (en) 2007-05-24 2008-05-14 Capacitive measurements with fast recovery current return

Publications (2)

Publication Number Publication Date
CN101680921A CN101680921A (zh) 2010-03-24
CN101680921B true CN101680921B (zh) 2013-01-09

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CN2008800165026A Expired - Fee Related CN101680921B (zh) 2007-05-24 2008-05-14 具有快速恢复电流回路的电容测量

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Country Link
US (1) US7940058B2 (enExample)
JP (1) JP2010528288A (enExample)
KR (1) KR20100021584A (enExample)
CN (1) CN101680921B (enExample)
TW (1) TW200914843A (enExample)
WO (1) WO2008147694A1 (enExample)

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US8054085B2 (en) * 2008-03-31 2011-11-08 Electro Scientific Industries, Inc. Programmable gain trans-impedance amplifier overload recovery circuit
CN102135580B (zh) * 2011-01-24 2013-05-01 宁波海利达电器有限公司 一种电容器的检测装置
CN102497106A (zh) * 2011-12-05 2012-06-13 北京新雷能科技股份有限公司 一种单端正激功率变换器
US9244118B2 (en) * 2012-12-30 2016-01-26 Global Unichip Corp. Testing system with an isolated switching module
US9336343B2 (en) 2014-02-28 2016-05-10 International Business Machines Corporation Calculating circuit-level leakage using three dimensional technology computer aided design and a reduced number of transistors
FI127101B (en) * 2014-10-13 2017-11-15 Murata Manufacturing Co Capacitive microelectromechanical sensor with self-testing capability
CN104515968B (zh) * 2014-12-25 2017-08-01 贵州航天计量测试技术研究所 一种电容器瞬间开短路测试仪校准装置及校准方法
US9696376B2 (en) * 2015-03-12 2017-07-04 Globalfoundries Inc. Leakage testing of integrated circuits using a logarithmic transducer and a voltmeter
DE102015105075A1 (de) 2015-04-01 2016-10-06 Infineon Technologies Ag Stromsensor
CN106771647A (zh) * 2016-12-30 2017-05-31 国网天津市电力公司 一种小电流接地电网电容电流测量方法
TWI628448B (zh) * 2017-03-07 2018-07-01 慧榮科技股份有限公司 電路測試方法

Citations (1)

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US5677634A (en) * 1995-11-16 1997-10-14 Electro Scientific Industries, Inc. Apparatus for stress testing capacitive components

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JPS58102173A (ja) 1981-12-14 1983-06-17 Fujitsu Ltd コンデンサの漏洩電流測定回路
DE59105964D1 (de) * 1990-07-24 1995-08-17 Ifm Electronic Gmbh Elektronisches Schaltgerät mit Anwesenheitsindikator.
US5294889A (en) * 1992-03-27 1994-03-15 Tandy Corporation Battery operated capacitance measurement circuit
US5402329A (en) * 1992-12-09 1995-03-28 Ernest H. Wittenbreder, Jr. Zero voltage switching pulse width modulated power converters
JPH0777548A (ja) * 1993-09-08 1995-03-20 Ckd Corp コンデンサの特性検査装置用治具
JP3673589B2 (ja) 1996-03-05 2005-07-20 ローム株式会社 コンデンサのリーク電流の測定方法およびその装置
JP3663251B2 (ja) 1996-03-07 2005-06-22 ローム株式会社 コンデンサのリーク電流の測定方法
JP3233037B2 (ja) * 1996-08-26 2001-11-26 株式会社村田製作所 絶縁抵抗測定装置
US6008630A (en) * 1998-07-02 1999-12-28 Compact Computer Corporation Soft-switched built-in active snubber circuit
US6275047B1 (en) * 1999-03-12 2001-08-14 Fluke Corporation Capacitance measurement
MY121524A (en) * 1999-09-22 2006-01-28 Murata Manufacturing Co Insulation resistance measuring apparatus for capacitive electronic parts
JP2002311074A (ja) 2001-04-09 2002-10-23 Matsushita Electric Ind Co Ltd コンデンサの漏れ電流測定方法
JP4310695B2 (ja) * 2004-03-30 2009-08-12 アイシン精機株式会社 静電容量変化検出装置
US7148697B2 (en) * 2004-06-04 2006-12-12 Doljack Frank A System and method for measuring electrical characteristics of a capacitor
US7594149B2 (en) * 2005-02-22 2009-09-22 Integrated Device Technology, Inc. In-situ monitor of process and device parameters in integrated circuits
ITMI20051027A1 (it) * 2005-06-01 2006-12-02 St Microelectronics Srl Architettura per implementare una capacita' integrata
JP2006343146A (ja) * 2005-06-07 2006-12-21 Advantest Corp 試験装置
US7589538B2 (en) * 2005-12-21 2009-09-15 Weiss Instruments, Inc. Micropower voltage-independent capacitance measuring method and circuit
JP2007172766A (ja) * 2005-12-22 2007-07-05 Matsushita Electric Ind Co Ltd 半導体リーク電流検出器とリーク電流測定方法および電圧トリミング機能付半導体リーク電流検出器とリファレンス電圧トリミング方法およびこれらの半導体集積回路
KR101319155B1 (ko) * 2006-01-27 2013-10-17 루돌프 테크놀로지스 인코퍼레이티드 고속 캐패시터 누설량 측정 시스템들 및 방법들
US20080129306A1 (en) * 2006-11-30 2008-06-05 Electro Scientific Industries, Inc. Multi-Point, Multi-Parameter Data Acquisition For Multi-Layer Ceramic Capacitor Testing

Patent Citations (1)

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Publication number Priority date Publication date Assignee Title
US5677634A (en) * 1995-11-16 1997-10-14 Electro Scientific Industries, Inc. Apparatus for stress testing capacitive components

Non-Patent Citations (3)

* Cited by examiner, † Cited by third party
Title
JP昭58-102173A 1983.06.17
JP特开2002-311074A 2002.10.23
KEITHLEY Application Note Series.《Capacitor Leakage Measurements Using a Model 6517A Electrometer》.《KEITHLEY Application Note Series 》.2001,第2页右栏倒数第2段至第3页左栏第2段、附图4. *

Also Published As

Publication number Publication date
JP2010528288A (ja) 2010-08-19
KR20100021584A (ko) 2010-02-25
US7940058B2 (en) 2011-05-10
TW200914843A (en) 2009-04-01
CN101680921A (zh) 2010-03-24
WO2008147694A1 (en) 2008-12-04
US20080290879A1 (en) 2008-11-27

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