CN101625823B - 用于接触检验对象的装置及方法 - Google Patents

用于接触检验对象的装置及方法 Download PDF

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Publication number
CN101625823B
CN101625823B CN200910150538XA CN200910150538A CN101625823B CN 101625823 B CN101625823 B CN 101625823B CN 200910150538X A CN200910150538X A CN 200910150538XA CN 200910150538 A CN200910150538 A CN 200910150538A CN 101625823 B CN101625823 B CN 101625823B
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China
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substrate
osculating element
display
contact
inspection
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Expired - Lifetime
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CN200910150538XA
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English (en)
Chinese (zh)
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CN101625823A (zh
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马蒂亚斯·布伦纳
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Applied Materials Inc
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Applied Materials Inc
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/302—Contactless testing
    • G01R31/305—Contactless testing using electron beams
    • G—PHYSICS
    • G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
    • G09G—ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
    • G09G3/00—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes
    • G09G3/006—Electronic inspection or testing of displays and display drivers, e.g. of LED or LCD displays
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G01R31/2886—Features relating to contacting the IC under test, e.g. probe heads; chucks
    • G01R31/2887—Features relating to contacting the IC under test, e.g. probe heads; chucks involving moving the probe head or the IC under test; docking stations
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/302—Contactless testing

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  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • General Engineering & Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Theoretical Computer Science (AREA)
  • Tests Of Electronic Circuits (AREA)
CN200910150538XA 2002-11-18 2003-11-14 用于接触检验对象的装置及方法 Expired - Lifetime CN101625823B (zh)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
DE10253717A DE10253717B4 (de) 2002-11-18 2002-11-18 Vorrichtung zum Kontaktieren für den Test mindestens eines Testobjekts, Testsystem und Verfahren zum Testen von Testobjekten
DE10253717.8 2002-11-18

Related Parent Applications (1)

Application Number Title Priority Date Filing Date
CNB2003801035614A Division CN100526897C (zh) 2002-11-18 2003-11-14 用于接触检验对象的装置及方法

Publications (2)

Publication Number Publication Date
CN101625823A CN101625823A (zh) 2010-01-13
CN101625823B true CN101625823B (zh) 2013-04-17

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ID=32115567

Family Applications (2)

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CN200910150538XA Expired - Lifetime CN101625823B (zh) 2002-11-18 2003-11-14 用于接触检验对象的装置及方法
CNB2003801035614A Expired - Lifetime CN100526897C (zh) 2002-11-18 2003-11-14 用于接触检验对象的装置及方法

Family Applications After (1)

Application Number Title Priority Date Filing Date
CNB2003801035614A Expired - Lifetime CN100526897C (zh) 2002-11-18 2003-11-14 用于接触检验对象的装置及方法

Country Status (9)

Country Link
US (2) US7135875B2 (https=)
EP (1) EP1420259A1 (https=)
JP (1) JP2006506629A (https=)
KR (1) KR100817597B1 (https=)
CN (2) CN101625823B (https=)
AU (1) AU2003292020A1 (https=)
DE (1) DE10253717B4 (https=)
TW (1) TWI267644B (https=)
WO (1) WO2004046740A1 (https=)

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US7319335B2 (en) * 2004-02-12 2008-01-15 Applied Materials, Inc. Configurable prober for TFT LCD array testing
US7355418B2 (en) * 2004-02-12 2008-04-08 Applied Materials, Inc. Configurable prober for TFT LCD array test
US8083853B2 (en) 2004-05-12 2011-12-27 Applied Materials, Inc. Plasma uniformity control by gas diffuser hole design
US8074599B2 (en) 2004-05-12 2011-12-13 Applied Materials, Inc. Plasma uniformity control by gas diffuser curvature
US8328939B2 (en) * 2004-05-12 2012-12-11 Applied Materials, Inc. Diffuser plate with slit valve compensation
US7429410B2 (en) * 2004-09-20 2008-09-30 Applied Materials, Inc. Diffuser gravity support
KR100780759B1 (ko) * 2005-01-24 2007-11-30 삼성전자주식회사 박막 트랜지스터 어레이 검사장치
US7535238B2 (en) * 2005-04-29 2009-05-19 Applied Materials, Inc. In-line electron beam test system
KR100643389B1 (ko) * 2005-07-04 2006-11-10 삼성전자주식회사 박막트랜지스터 기판의 검사장치와 박막트랜지스터 기판의검사방법
CN102353890B (zh) * 2006-03-14 2014-09-24 应用材料公司 减小多个柱状电子束测试系统中的串扰的方法
US7786742B2 (en) * 2006-05-31 2010-08-31 Applied Materials, Inc. Prober for electronic device testing on large area substrates
CN101454677B (zh) * 2006-05-31 2012-05-09 应用材料公司 用于tft-lcd测试的微探测器
US7602199B2 (en) * 2006-05-31 2009-10-13 Applied Materials, Inc. Mini-prober for TFT-LCD testing
US20080317973A1 (en) * 2007-06-22 2008-12-25 White John M Diffuser support
EP2164310A4 (en) * 2007-07-04 2011-01-05 Sharp Kk DISPLAY MODULE, LIQUID CRYSTAL DISPLAY DEVICE, AND METHOD OF MANUFACTURING THE DISPLAY MODULE
TWI426286B (zh) * 2010-08-02 2014-02-11 財團法人工業技術研究院 基板電性的量測設備
JP6300553B2 (ja) * 2014-02-12 2018-03-28 株式会社日立ハイテクサイエンス 荷電粒子ビーム装置
TWI676033B (zh) * 2018-11-09 2019-11-01 京元電子股份有限公司 具浮動容置座之半導體元件測試載盤及其測試設備
CN111190087B (zh) * 2018-11-15 2022-03-15 京元电子股份有限公司 具浮动容置座的半导体元件测试载盘及其测试设备
CN109765479B (zh) * 2019-01-28 2021-10-01 合肥京东方视讯科技有限公司 一种电路板缺件检测装置和方法

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EP1233274A2 (en) * 2001-02-08 2002-08-21 Three-Five Systems, Inc. System and method for testing a display device

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Publication number Priority date Publication date Assignee Title
US5365034A (en) * 1992-09-29 1994-11-15 Matsushita Electric Industrial Co., Ltd. Defect detection and defect removal apparatus of thin film electronic device
US5521522A (en) * 1992-11-13 1996-05-28 Tokyo Electron Limited Probe apparatus for testing multiple integrated circuit dies
US5691764A (en) * 1994-08-05 1997-11-25 Tokyo Electron Limited Apparatus for examining target objects such as LCD panels
US6075245A (en) * 1998-01-12 2000-06-13 Toro-Lira; Guillermo L. High speed electron beam based system for testing large area flat panel displays
JP2001318116A (ja) * 2000-05-11 2001-11-16 Micronics Japan Co Ltd 表示用パネル基板の検査装置
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Also Published As

Publication number Publication date
WO2004046740A1 (de) 2004-06-03
KR100817597B1 (ko) 2008-03-31
EP1420259A1 (en) 2004-05-19
US7474108B2 (en) 2009-01-06
US20040145383A1 (en) 2004-07-29
JP2006506629A (ja) 2006-02-23
DE10253717A1 (de) 2004-05-27
US20060181290A1 (en) 2006-08-17
TWI267644B (en) 2006-12-01
TW200417737A (en) 2004-09-16
US7135875B2 (en) 2006-11-14
DE10253717B4 (de) 2011-05-19
CN100526897C (zh) 2009-08-12
AU2003292020A1 (en) 2004-06-15
KR20050075395A (ko) 2005-07-20
CN1714298A (zh) 2005-12-28
CN101625823A (zh) 2010-01-13

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