CN101551462B - 双功能探测器装置 - Google Patents

双功能探测器装置 Download PDF

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Publication number
CN101551462B
CN101551462B CN200910118727.9A CN200910118727A CN101551462B CN 101551462 B CN101551462 B CN 101551462B CN 200910118727 A CN200910118727 A CN 200910118727A CN 101551462 B CN101551462 B CN 101551462B
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pixel
pixels
line
detector
data
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CN200910118727.9A
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Chinese (zh)
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CN101551462A (zh
Inventor
D·阿尔巴利
A·J·库图尔
W·A·亨尼西
K·S·库姆普
F·高
J·Z·刘
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GE Precision Healthcare LLC
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General Electric Co
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    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10F—INORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
    • H10F39/00—Integrated devices, or assemblies of multiple devices, comprising at least one element covered by group H10F30/00, e.g. radiation detectors comprising photodiode arrays
    • H10F39/10—Integrated devices
    • H10F39/12—Image sensors
    • H10F39/18—Complementary metal-oxide-semiconductor [CMOS] image sensors; Photodiode array image sensors
    • H10F39/189—X-ray, gamma-ray or corpuscular radiation imagers
    • H10F39/1898—Indirect radiation image sensors, e.g. using luminescent members
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
    • H04N25/60—Noise processing, e.g. detecting, correcting, reducing or removing noise
    • H04N25/617—Noise processing, e.g. detecting, correcting, reducing or removing noise for reducing electromagnetic interference, e.g. clocking noise
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
    • H04N25/70—SSIS architectures; Circuits associated therewith
    • H04N25/76—Addressed sensors, e.g. MOS or CMOS sensors
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10F—INORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
    • H10F39/00—Integrated devices, or assemblies of multiple devices, comprising at least one element covered by group H10F30/00, e.g. radiation detectors comprising photodiode arrays
    • H10F39/80—Constructional details of image sensors
    • H10F39/803—Pixels having integrated switching, control, storage or amplification elements
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10F—INORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
    • H10F39/00—Integrated devices, or assemblies of multiple devices, comprising at least one element covered by group H10F30/00, e.g. radiation detectors comprising photodiode arrays
    • H10F39/80—Constructional details of image sensors
    • H10F39/811—Interconnections

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  • Engineering & Computer Science (AREA)
  • Multimedia (AREA)
  • Signal Processing (AREA)
  • Physics & Mathematics (AREA)
  • Electromagnetism (AREA)
  • Apparatus For Radiation Diagnosis (AREA)
  • Measurement Of Radiation (AREA)
  • Transforming Light Signals Into Electric Signals (AREA)
CN200910118727.9A 2008-03-31 2009-01-09 双功能探测器装置 Active CN101551462B (zh)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US11/971533 2008-03-31
US11/971,533 2008-03-31
US11/971,533 US7495228B1 (en) 2008-03-31 2008-03-31 Dual function detector device

Publications (2)

Publication Number Publication Date
CN101551462A CN101551462A (zh) 2009-10-07
CN101551462B true CN101551462B (zh) 2013-09-18

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US (1) US7495228B1 (enExample)
JP (1) JP5044577B2 (enExample)
CN (1) CN101551462B (enExample)
FR (1) FR2926164B1 (enExample)

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US8217358B2 (en) * 2009-12-14 2012-07-10 General Electric Company System and method of eliminating image artifacts
US8405038B2 (en) * 2009-12-30 2013-03-26 General Electric Company Systems and methods for providing a shared charge in pixelated image detectors
US8384041B2 (en) * 2010-07-21 2013-02-26 Carestream Health, Inc. Digital radiographic imaging arrays with reduced noise
TW201216138A (en) * 2010-10-13 2012-04-16 Chunghwa Picture Tubes Ltd Method for driving photosensor array panel
US8693747B2 (en) * 2011-04-29 2014-04-08 General Electric Company Radiological image noise reduction system and method
WO2013188498A2 (en) * 2012-06-12 2013-12-19 Arizona Board Of Regents Acting For And On Behalf Of Arizona State University Imaging system and methods of manufacturing and using the same
CN104412129B (zh) * 2012-06-20 2018-05-25 皇家飞利浦有限公司 X射线探测器像素布局
US9002084B2 (en) 2013-08-30 2015-04-07 Ge Medical Systems Israel, Ltd Systems and methods for summing signals from an imaging detector
JP6740905B2 (ja) * 2015-02-12 2020-08-19 ソニー株式会社 撮像装置およびその制御方法
US9482764B1 (en) 2015-05-28 2016-11-01 General Electric Company Systems and methods for charge-sharing identification and correction using a single pixel
CN105182396B (zh) 2015-06-29 2018-04-24 苏州瑞派宁科技有限公司 一种探测器信号读出的通道复用方法
JP6527035B2 (ja) * 2015-06-30 2019-06-05 浜松ホトニクス株式会社 固体撮像装置
CN106551701B (zh) * 2015-09-18 2020-04-10 上海奕瑞光电子科技股份有限公司 一种无线平板探测器及其图像校正方法
US10032813B2 (en) * 2016-02-05 2018-07-24 General Electric Company Active pixel radiation detector array and use thereof
US10156645B2 (en) 2016-12-23 2018-12-18 General Electric Company Systems and methods for sub-pixel location determination at sidewalls and corners of detectors
US9983320B1 (en) 2017-05-15 2018-05-29 General Electric Company Systems and methods for improved collimation sensitivity
US10145964B1 (en) 2017-05-15 2018-12-04 General Electric Company Systems and methods for improved collimation sensitivity
US10324200B2 (en) 2017-05-15 2019-06-18 General Electric Company Systems and methods for improved collimation sensitivity
US10794758B2 (en) * 2017-09-29 2020-10-06 General Electric Company System and method for verifying the integrity of a radiation detector
US10761224B2 (en) 2018-06-06 2020-09-01 General Electric Company Systems and methods for improved detector assembly sizing
US10481285B1 (en) 2018-08-13 2019-11-19 General Electric Company Systems and methods for determination of depth of interaction
US10976452B2 (en) 2018-08-13 2021-04-13 General Electric Medical Systems Israel, Ltd. (Il) Systems and methods for improved medical imaging
US10247834B1 (en) 2018-08-15 2019-04-02 General Electric Company Anodes for improved detection of non-collected adjacent signal
US10591619B2 (en) 2018-08-15 2020-03-17 GE Precision Healthcare LLC Anodes for improved detection of non-collected adjacent signals
US10828003B2 (en) 2019-03-18 2020-11-10 GE Precision Healthcare, LLC System and method for mitigating electromagnetic interference when acquiring image data
US11105755B2 (en) * 2019-06-26 2021-08-31 Biosenstech Inc X-ray detecting panel for multi signal detection and X-ray detector thereof
US11092701B1 (en) 2020-07-07 2021-08-17 GE Precision Healthcare LLC Systems and methods for improved medical imaging
US11320545B2 (en) 2020-07-07 2022-05-03 GE Precision Healthcare LLC Systems and methods for improved medical imaging
US20240007763A1 (en) * 2022-06-30 2024-01-04 Varex Imaging Corporation Imaging system with emi correction

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US6759641B1 (en) * 2000-09-27 2004-07-06 Rockwell Scientific Licensing, Llc Imager with adjustable resolution
CN1991409A (zh) * 2005-11-10 2007-07-04 通用电气公司 具有多个电荷存储装置的计算机断层摄影检测器光电二极管
CN101034163A (zh) * 2005-10-14 2007-09-12 西门子公司 具有光敏二极管阵列的检测器

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JP2000324406A (ja) * 1999-05-07 2000-11-24 Canon Inc 光電変換装置及びそれを用いた画像読み取りシステム
JP4054612B2 (ja) * 2002-06-11 2008-02-27 キヤノン株式会社 放射線撮像装置
US7119341B2 (en) 2003-12-08 2006-10-10 General Electric Company Split scan line and combined data line x-ray detectors
JP4835270B2 (ja) * 2006-06-03 2011-12-14 株式会社ニコン 固体撮像素子及びこれを用いた撮像装置
JP4808557B2 (ja) * 2006-07-04 2011-11-02 浜松ホトニクス株式会社 固体撮像装置

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6759641B1 (en) * 2000-09-27 2004-07-06 Rockwell Scientific Licensing, Llc Imager with adjustable resolution
CN101034163A (zh) * 2005-10-14 2007-09-12 西门子公司 具有光敏二极管阵列的检测器
CN1991409A (zh) * 2005-11-10 2007-07-04 通用电气公司 具有多个电荷存储装置的计算机断层摄影检测器光电二极管

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Publication number Publication date
FR2926164B1 (fr) 2014-01-10
FR2926164A1 (fr) 2009-07-10
US7495228B1 (en) 2009-02-24
JP5044577B2 (ja) 2012-10-10
CN101551462A (zh) 2009-10-07
JP2009246948A (ja) 2009-10-22

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