JP5044577B2 - 二機能検出器装置 - Google Patents

二機能検出器装置 Download PDF

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Publication number
JP5044577B2
JP5044577B2 JP2009001236A JP2009001236A JP5044577B2 JP 5044577 B2 JP5044577 B2 JP 5044577B2 JP 2009001236 A JP2009001236 A JP 2009001236A JP 2009001236 A JP2009001236 A JP 2009001236A JP 5044577 B2 JP5044577 B2 JP 5044577B2
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Japan
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pixel
pixels
line
data
lines
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Expired - Fee Related
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JP2009001236A
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English (en)
Japanese (ja)
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JP2009246948A5 (enExample
JP2009246948A (ja
Inventor
ダグラス・アルバグリ
アーロン・ジュディ・クーチュール
ウィリアム・アンドリュー・ヘネシー
ケネス・スコット・クンプ
フェン・ガオ
ジェームズ・ツェンシュ・リュ
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General Electric Co
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General Electric Co
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    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10F—INORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
    • H10F39/00—Integrated devices, or assemblies of multiple devices, comprising at least one element covered by group H10F30/00, e.g. radiation detectors comprising photodiode arrays
    • H10F39/10—Integrated devices
    • H10F39/12—Image sensors
    • H10F39/18—Complementary metal-oxide-semiconductor [CMOS] image sensors; Photodiode array image sensors
    • H10F39/189—X-ray, gamma-ray or corpuscular radiation imagers
    • H10F39/1898—Indirect radiation image sensors, e.g. using luminescent members
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
    • H04N25/60—Noise processing, e.g. detecting, correcting, reducing or removing noise
    • H04N25/617—Noise processing, e.g. detecting, correcting, reducing or removing noise for reducing electromagnetic interference, e.g. clocking noise
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
    • H04N25/70—SSIS architectures; Circuits associated therewith
    • H04N25/76—Addressed sensors, e.g. MOS or CMOS sensors
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10F—INORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
    • H10F39/00—Integrated devices, or assemblies of multiple devices, comprising at least one element covered by group H10F30/00, e.g. radiation detectors comprising photodiode arrays
    • H10F39/80—Constructional details of image sensors
    • H10F39/803—Pixels having integrated switching, control, storage or amplification elements
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10F—INORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
    • H10F39/00—Integrated devices, or assemblies of multiple devices, comprising at least one element covered by group H10F30/00, e.g. radiation detectors comprising photodiode arrays
    • H10F39/80—Constructional details of image sensors
    • H10F39/811—Interconnections

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  • Engineering & Computer Science (AREA)
  • Multimedia (AREA)
  • Signal Processing (AREA)
  • Physics & Mathematics (AREA)
  • Electromagnetism (AREA)
  • Apparatus For Radiation Diagnosis (AREA)
  • Measurement Of Radiation (AREA)
  • Transforming Light Signals Into Electric Signals (AREA)
JP2009001236A 2008-03-31 2009-01-07 二機能検出器装置 Expired - Fee Related JP5044577B2 (ja)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US11/971,533 2008-03-31
US11/971,533 US7495228B1 (en) 2008-03-31 2008-03-31 Dual function detector device

Publications (3)

Publication Number Publication Date
JP2009246948A JP2009246948A (ja) 2009-10-22
JP2009246948A5 JP2009246948A5 (enExample) 2011-11-10
JP5044577B2 true JP5044577B2 (ja) 2012-10-10

Family

ID=40364615

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2009001236A Expired - Fee Related JP5044577B2 (ja) 2008-03-31 2009-01-07 二機能検出器装置

Country Status (4)

Country Link
US (1) US7495228B1 (enExample)
JP (1) JP5044577B2 (enExample)
CN (1) CN101551462B (enExample)
FR (1) FR2926164B1 (enExample)

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US8786873B2 (en) * 2009-07-20 2014-07-22 General Electric Company Application server for use with a modular imaging system
CN102053252B (zh) * 2009-11-03 2012-11-21 上海天马微电子有限公司 平板x光传感器及其驱动方法
US8217358B2 (en) * 2009-12-14 2012-07-10 General Electric Company System and method of eliminating image artifacts
US8405038B2 (en) * 2009-12-30 2013-03-26 General Electric Company Systems and methods for providing a shared charge in pixelated image detectors
US8384041B2 (en) * 2010-07-21 2013-02-26 Carestream Health, Inc. Digital radiographic imaging arrays with reduced noise
TW201216138A (en) * 2010-10-13 2012-04-16 Chunghwa Picture Tubes Ltd Method for driving photosensor array panel
US8693747B2 (en) * 2011-04-29 2014-04-08 General Electric Company Radiological image noise reduction system and method
WO2013188498A2 (en) * 2012-06-12 2013-12-19 Arizona Board Of Regents Acting For And On Behalf Of Arizona State University Imaging system and methods of manufacturing and using the same
CN104412129B (zh) * 2012-06-20 2018-05-25 皇家飞利浦有限公司 X射线探测器像素布局
US9002084B2 (en) 2013-08-30 2015-04-07 Ge Medical Systems Israel, Ltd Systems and methods for summing signals from an imaging detector
JP6740905B2 (ja) * 2015-02-12 2020-08-19 ソニー株式会社 撮像装置およびその制御方法
US9482764B1 (en) 2015-05-28 2016-11-01 General Electric Company Systems and methods for charge-sharing identification and correction using a single pixel
CN105182396B (zh) 2015-06-29 2018-04-24 苏州瑞派宁科技有限公司 一种探测器信号读出的通道复用方法
JP6527035B2 (ja) * 2015-06-30 2019-06-05 浜松ホトニクス株式会社 固体撮像装置
CN106551701B (zh) * 2015-09-18 2020-04-10 上海奕瑞光电子科技股份有限公司 一种无线平板探测器及其图像校正方法
US10032813B2 (en) * 2016-02-05 2018-07-24 General Electric Company Active pixel radiation detector array and use thereof
US10156645B2 (en) 2016-12-23 2018-12-18 General Electric Company Systems and methods for sub-pixel location determination at sidewalls and corners of detectors
US9983320B1 (en) 2017-05-15 2018-05-29 General Electric Company Systems and methods for improved collimation sensitivity
US10145964B1 (en) 2017-05-15 2018-12-04 General Electric Company Systems and methods for improved collimation sensitivity
US10324200B2 (en) 2017-05-15 2019-06-18 General Electric Company Systems and methods for improved collimation sensitivity
US10794758B2 (en) * 2017-09-29 2020-10-06 General Electric Company System and method for verifying the integrity of a radiation detector
US10761224B2 (en) 2018-06-06 2020-09-01 General Electric Company Systems and methods for improved detector assembly sizing
US10481285B1 (en) 2018-08-13 2019-11-19 General Electric Company Systems and methods for determination of depth of interaction
US10976452B2 (en) 2018-08-13 2021-04-13 General Electric Medical Systems Israel, Ltd. (Il) Systems and methods for improved medical imaging
US10247834B1 (en) 2018-08-15 2019-04-02 General Electric Company Anodes for improved detection of non-collected adjacent signal
US10591619B2 (en) 2018-08-15 2020-03-17 GE Precision Healthcare LLC Anodes for improved detection of non-collected adjacent signals
US10828003B2 (en) 2019-03-18 2020-11-10 GE Precision Healthcare, LLC System and method for mitigating electromagnetic interference when acquiring image data
US11105755B2 (en) * 2019-06-26 2021-08-31 Biosenstech Inc X-ray detecting panel for multi signal detection and X-ray detector thereof
US11092701B1 (en) 2020-07-07 2021-08-17 GE Precision Healthcare LLC Systems and methods for improved medical imaging
US11320545B2 (en) 2020-07-07 2022-05-03 GE Precision Healthcare LLC Systems and methods for improved medical imaging
US20240007763A1 (en) * 2022-06-30 2024-01-04 Varex Imaging Corporation Imaging system with emi correction

Family Cites Families (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS63266873A (ja) * 1987-04-24 1988-11-02 Hitachi Ltd 固体撮像装置
JP2977060B2 (ja) * 1992-01-29 1999-11-10 オリンパス光学工業株式会社 固体撮像装置及びその制御方法
JP2000324406A (ja) * 1999-05-07 2000-11-24 Canon Inc 光電変換装置及びそれを用いた画像読み取りシステム
US6759641B1 (en) 2000-09-27 2004-07-06 Rockwell Scientific Licensing, Llc Imager with adjustable resolution
JP4054612B2 (ja) * 2002-06-11 2008-02-27 キヤノン株式会社 放射線撮像装置
US7119341B2 (en) 2003-12-08 2006-10-10 General Electric Company Split scan line and combined data line x-ray detectors
DE102005049228B4 (de) * 2005-10-14 2014-03-27 Siemens Aktiengesellschaft Detektor mit einem Array von Photodioden
US7283609B2 (en) * 2005-11-10 2007-10-16 General Electric Company CT detector photodiode having multiple charge storage devices
JP4835270B2 (ja) * 2006-06-03 2011-12-14 株式会社ニコン 固体撮像素子及びこれを用いた撮像装置
JP4808557B2 (ja) * 2006-07-04 2011-11-02 浜松ホトニクス株式会社 固体撮像装置

Also Published As

Publication number Publication date
FR2926164B1 (fr) 2014-01-10
FR2926164A1 (fr) 2009-07-10
CN101551462B (zh) 2013-09-18
US7495228B1 (en) 2009-02-24
CN101551462A (zh) 2009-10-07
JP2009246948A (ja) 2009-10-22

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