CN101276776B - 卡盘工作台机构 - Google Patents
卡盘工作台机构 Download PDFInfo
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- CN101276776B CN101276776B CN 200810086968 CN200810086968A CN101276776B CN 101276776 B CN101276776 B CN 101276776B CN 200810086968 CN200810086968 CN 200810086968 CN 200810086968 A CN200810086968 A CN 200810086968A CN 101276776 B CN101276776 B CN 101276776B
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- 230000007246 mechanism Effects 0.000 title claims abstract description 18
- 230000008859 change Effects 0.000 claims abstract description 25
- 238000001514 detection method Methods 0.000 claims description 22
- 239000007921 spray Substances 0.000 claims description 3
- 238000003825 pressing Methods 0.000 abstract description 5
- 238000003754 machining Methods 0.000 abstract 3
- 235000012431 wafers Nutrition 0.000 description 18
- 239000004575 stone Substances 0.000 description 8
- 230000007257 malfunction Effects 0.000 description 3
- 238000012360 testing method Methods 0.000 description 2
- 230000009471 action Effects 0.000 description 1
- 230000015572 biosynthetic process Effects 0.000 description 1
- 230000008676 import Effects 0.000 description 1
- 238000012423 maintenance Methods 0.000 description 1
- 230000002093 peripheral effect Effects 0.000 description 1
- 230000009467 reduction Effects 0.000 description 1
Images
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- Grinding Of Cylindrical And Plane Surfaces (AREA)
- Constituent Portions Of Griding Lathes, Driving, Sensing And Control (AREA)
- Mechanical Treatment Of Semiconductor (AREA)
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2007091263A JP2008246628A (ja) | 2007-03-30 | 2007-03-30 | チャックテーブル機構 |
JP2007-091263 | 2007-03-30 |
Publications (2)
Publication Number | Publication Date |
---|---|
CN101276776A CN101276776A (zh) | 2008-10-01 |
CN101276776B true CN101276776B (zh) | 2011-06-01 |
Family
ID=39972189
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
CN 200810086968 Active CN101276776B (zh) | 2007-03-30 | 2008-03-28 | 卡盘工作台机构 |
Country Status (2)
Country | Link |
---|---|
JP (1) | JP2008246628A (ja) |
CN (1) | CN101276776B (ja) |
Families Citing this family (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP5335448B2 (ja) * | 2009-01-19 | 2013-11-06 | 株式会社ディスコ | 加工装置 |
CN102269310A (zh) * | 2010-06-03 | 2011-12-07 | 北京中电科电子装备有限公司 | 旋转接头 |
JP6018459B2 (ja) * | 2012-08-13 | 2016-11-02 | 株式会社ディスコ | 研削装置 |
JP6885732B2 (ja) * | 2017-01-17 | 2021-06-16 | 株式会社ディスコ | 研削装置 |
JP7235587B2 (ja) * | 2019-05-14 | 2023-03-08 | 株式会社ディスコ | 荷重センサの電圧調整方法 |
CN118024094B (zh) * | 2024-04-11 | 2024-06-18 | 成都工业职业技术学院 | 一种摩擦片用打磨装置及其预警方法 |
Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN1498415A (zh) * | 2000-10-13 | 2004-05-19 | ��ķ�о�����˾ | 红外线终点检测系统 |
CN1526163A (zh) * | 2001-11-30 | 2004-09-01 | ���������ƴ���ʽ���� | 探测器装置和探测器测试方法 |
US6927587B2 (en) * | 2002-08-23 | 2005-08-09 | Tokyo Electron Limited | Probe apparatus |
Family Cites Families (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH07259855A (ja) * | 1994-03-17 | 1995-10-09 | Hitachi Ltd | スラストバランス室付ガス軸受タービン |
AT404192B (de) * | 1996-05-02 | 1998-09-25 | Anton Paar Gmbh | Rotationsviskosimeter |
JPH1044017A (ja) * | 1996-08-01 | 1998-02-17 | Shibayama Kikai Kk | 平面研削装置 |
US6083082A (en) * | 1999-08-30 | 2000-07-04 | Lam Research Corporation | Spindle assembly for force controlled polishing |
JP2001138219A (ja) * | 1999-11-19 | 2001-05-22 | Disco Abrasive Syst Ltd | 研磨装置 |
JP4372603B2 (ja) * | 2004-04-09 | 2009-11-25 | 三菱原子燃料株式会社 | 棒状体の曲がり測定方法及び測定装置 |
JP4639644B2 (ja) * | 2004-05-26 | 2011-02-23 | 三菱電機株式会社 | 退避機能を備えた加工装置および退避方法 |
-
2007
- 2007-03-30 JP JP2007091263A patent/JP2008246628A/ja active Pending
-
2008
- 2008-03-28 CN CN 200810086968 patent/CN101276776B/zh active Active
Patent Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN1498415A (zh) * | 2000-10-13 | 2004-05-19 | ��ķ�о�����˾ | 红外线终点检测系统 |
CN1526163A (zh) * | 2001-11-30 | 2004-09-01 | ���������ƴ���ʽ���� | 探测器装置和探测器测试方法 |
US6927587B2 (en) * | 2002-08-23 | 2005-08-09 | Tokyo Electron Limited | Probe apparatus |
Also Published As
Publication number | Publication date |
---|---|
JP2008246628A (ja) | 2008-10-16 |
CN101276776A (zh) | 2008-10-01 |
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