CN101243359B - 成像系统、特别是显微光刻投影曝光设备的投影物镜 - Google Patents
成像系统、特别是显微光刻投影曝光设备的投影物镜 Download PDFInfo
- Publication number
- CN101243359B CN101243359B CN2006800296095A CN200680029609A CN101243359B CN 101243359 B CN101243359 B CN 101243359B CN 2006800296095 A CN2006800296095 A CN 2006800296095A CN 200680029609 A CN200680029609 A CN 200680029609A CN 101243359 B CN101243359 B CN 101243359B
- Authority
- CN
- China
- Prior art keywords
- imaging system
- refractive index
- sub
- numerical aperture
- crystal
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
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Images
Classifications
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B1/00—Optical elements characterised by the material of which they are made; Optical coatings for optical elements
- G02B1/02—Optical elements characterised by the material of which they are made; Optical coatings for optical elements made of crystals, e.g. rock-salt, semi-conductors
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/70—Microphotolithographic exposure; Apparatus therefor
- G03F7/70216—Mask projection systems
- G03F7/70341—Details of immersion lithography aspects, e.g. exposure media or control of immersion liquid supply
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/70—Microphotolithographic exposure; Apparatus therefor
- G03F7/708—Construction of apparatus, e.g. environment aspects, hygiene aspects or materials
- G03F7/7095—Materials, e.g. materials for housing, stage or other support having particular properties, e.g. weight, strength, conductivity, thermal expansion coefficient
- G03F7/70958—Optical materials or coatings, e.g. with particular transmittance, reflectance or anti-reflection properties
- G03F7/70966—Birefringence
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Engineering & Computer Science (AREA)
- Environmental & Geological Engineering (AREA)
- Epidemiology (AREA)
- Public Health (AREA)
- Chemical & Material Sciences (AREA)
- Crystallography & Structural Chemistry (AREA)
- Optics & Photonics (AREA)
- Lenses (AREA)
Applications Claiming Priority (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US70690305P | 2005-08-10 | 2005-08-10 | |
| US60/706,903 | 2005-08-10 | ||
| PCT/EP2006/065070 WO2007017473A1 (de) | 2005-08-10 | 2006-08-04 | Abbildungssystem, insbesondere projektionsobjektiv einer mikrolithographischen projektionsbelichtungsanlage |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN101243359A CN101243359A (zh) | 2008-08-13 |
| CN101243359B true CN101243359B (zh) | 2011-04-06 |
Family
ID=37188852
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN2006800296095A Expired - Fee Related CN101243359B (zh) | 2005-08-10 | 2006-08-04 | 成像系统、特别是显微光刻投影曝光设备的投影物镜 |
Country Status (7)
| Country | Link |
|---|---|
| US (1) | US20080182210A1 (enExample) |
| EP (1) | EP1913445B1 (enExample) |
| JP (1) | JP2009505124A (enExample) |
| KR (1) | KR20080028429A (enExample) |
| CN (1) | CN101243359B (enExample) |
| AT (1) | ATE511124T1 (enExample) |
| WO (1) | WO2007017473A1 (enExample) |
Families Citing this family (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| DE102008001800A1 (de) * | 2007-05-25 | 2008-11-27 | Carl Zeiss Smt Ag | Projektionsobjektiv für die Mikrolithographie, Mikrolithographie-Projektionsbelichtungsanlage mit einem derartigen Projektionsobjektiv, mikrolithographisches Herstellungsverfahren für Bauelemente sowie mit diesem Verfahren hergestelltes Bauelement |
| CN114326075B (zh) * | 2021-12-10 | 2023-12-19 | 肯维捷斯(武汉)科技有限公司 | 一种生物样品的数字显微成像系统及镜检方法 |
Family Cites Families (12)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| KR20000034967A (ko) * | 1998-11-30 | 2000-06-26 | 헨켈 카르스텐 | 수정-렌즈를 갖는 오브젝티브 및 투사 조명 장치 |
| US6995930B2 (en) * | 1999-12-29 | 2006-02-07 | Carl Zeiss Smt Ag | Catadioptric projection objective with geometric beam splitting |
| JP2004526331A (ja) * | 2001-05-15 | 2004-08-26 | カール・ツアイス・エスエムテイ・アーゲー | フッ化物結晶レンズを含む対物レンズ |
| JP2003021619A (ja) * | 2001-07-05 | 2003-01-24 | Canon Inc | 蛍石及びその分析法、製造法、光学特性評価法 |
| JPWO2003009015A1 (ja) * | 2001-07-18 | 2004-11-11 | 株式会社ニコン | フッ化ランタン膜を備えた光学素子 |
| US7092069B2 (en) * | 2002-03-08 | 2006-08-15 | Carl Zeiss Smt Ag | Projection exposure method and projection exposure system |
| JP2005537512A (ja) * | 2002-09-03 | 2005-12-08 | カール・ツアイス・エスエムテイ・アーゲー | 複屈折レンズを伴う対物レンズ |
| KR101211451B1 (ko) * | 2003-07-09 | 2012-12-12 | 가부시키가이샤 니콘 | 노광 장치 및 디바이스 제조 방법 |
| EP1697798A2 (en) | 2003-12-15 | 2006-09-06 | Carl Zeiss SMT AG | Projection objective having a high aperture and a planar end surface |
| US7466489B2 (en) * | 2003-12-15 | 2008-12-16 | Susanne Beder | Projection objective having a high aperture and a planar end surface |
| WO2005059645A2 (en) * | 2003-12-19 | 2005-06-30 | Carl Zeiss Smt Ag | Microlithography projection objective with crystal elements |
| JP2006113533A (ja) * | 2004-08-03 | 2006-04-27 | Nikon Corp | 投影光学系、露光装置、および露光方法 |
-
2006
- 2006-08-04 JP JP2008525556A patent/JP2009505124A/ja active Pending
- 2006-08-04 AT AT06778169T patent/ATE511124T1/de active
- 2006-08-04 EP EP06778169A patent/EP1913445B1/de not_active Not-in-force
- 2006-08-04 WO PCT/EP2006/065070 patent/WO2007017473A1/de not_active Ceased
- 2006-08-04 CN CN2006800296095A patent/CN101243359B/zh not_active Expired - Fee Related
- 2006-08-04 KR KR1020087001045A patent/KR20080028429A/ko not_active Ceased
-
2008
- 2008-02-07 US US12/027,731 patent/US20080182210A1/en not_active Abandoned
Also Published As
| Publication number | Publication date |
|---|---|
| KR20080028429A (ko) | 2008-03-31 |
| EP1913445A1 (de) | 2008-04-23 |
| EP1913445B1 (de) | 2011-05-25 |
| JP2009505124A (ja) | 2009-02-05 |
| US20080182210A1 (en) | 2008-07-31 |
| WO2007017473A1 (de) | 2007-02-15 |
| CN101243359A (zh) | 2008-08-13 |
| ATE511124T1 (de) | 2011-06-15 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| C06 | Publication | ||
| PB01 | Publication | ||
| C10 | Entry into substantive examination | ||
| SE01 | Entry into force of request for substantive examination | ||
| C14 | Grant of patent or utility model | ||
| GR01 | Patent grant | ||
| CF01 | Termination of patent right due to non-payment of annual fee | ||
| CF01 | Termination of patent right due to non-payment of annual fee |
Granted publication date: 20110406 Termination date: 20180804 |