CN101160667A - 改进单元稳定性和性能的混合块soi 6t-sram单元 - Google Patents
改进单元稳定性和性能的混合块soi 6t-sram单元 Download PDFInfo
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- CN101160667A CN101160667A CNA2006800119743A CN200680011974A CN101160667A CN 101160667 A CN101160667 A CN 101160667A CN A2006800119743 A CNA2006800119743 A CN A2006800119743A CN 200680011974 A CN200680011974 A CN 200680011974A CN 101160667 A CN101160667 A CN 101160667A
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- 239000000758 substrate Substances 0.000 claims abstract description 56
- 238000002955 isolation Methods 0.000 claims abstract description 17
- 230000000694 effects Effects 0.000 claims abstract description 15
- 239000004065 semiconductor Substances 0.000 claims description 126
- 239000013078 crystal Substances 0.000 claims description 50
- 230000001105 regulatory effect Effects 0.000 claims description 6
- 230000006641 stabilisation Effects 0.000 claims description 3
- 238000011105 stabilization Methods 0.000 claims description 3
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 abstract description 13
- 229910052710 silicon Inorganic materials 0.000 abstract description 13
- 239000010703 silicon Substances 0.000 abstract description 13
- 235000012431 wafers Nutrition 0.000 description 31
- 238000000034 method Methods 0.000 description 29
- 230000008569 process Effects 0.000 description 20
- 239000004020 conductor Substances 0.000 description 15
- 238000005530 etching Methods 0.000 description 15
- 239000000463 material Substances 0.000 description 13
- 230000003044 adaptive effect Effects 0.000 description 10
- 229920002120 photoresistant polymer Polymers 0.000 description 10
- 230000004888 barrier function Effects 0.000 description 9
- 238000005516 engineering process Methods 0.000 description 9
- 238000000151 deposition Methods 0.000 description 8
- 239000002019 doping agent Substances 0.000 description 8
- 238000001020 plasma etching Methods 0.000 description 8
- 239000000203 mixture Substances 0.000 description 7
- 230000008021 deposition Effects 0.000 description 6
- 238000010586 diagram Methods 0.000 description 6
- 239000007924 injection Substances 0.000 description 6
- 238000002347 injection Methods 0.000 description 6
- 150000002500 ions Chemical class 0.000 description 6
- 238000001259 photo etching Methods 0.000 description 6
- 229910000577 Silicon-germanium Inorganic materials 0.000 description 5
- 230000008901 benefit Effects 0.000 description 5
- 238000005229 chemical vapour deposition Methods 0.000 description 5
- 230000003647 oxidation Effects 0.000 description 5
- 238000007254 oxidation reaction Methods 0.000 description 5
- 230000015572 biosynthetic process Effects 0.000 description 4
- 239000003990 capacitor Substances 0.000 description 4
- 229910021420 polycrystalline silicon Inorganic materials 0.000 description 4
- 230000005855 radiation Effects 0.000 description 4
- 229910010271 silicon carbide Inorganic materials 0.000 description 4
- 108091006146 Channels Proteins 0.000 description 3
- MWUXSHHQAYIFBG-UHFFFAOYSA-N Nitric oxide Chemical compound O=[N] MWUXSHHQAYIFBG-UHFFFAOYSA-N 0.000 description 3
- 229910003811 SiGeC Inorganic materials 0.000 description 3
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N Silicium dioxide Chemical compound O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 description 3
- 150000001875 compounds Chemical class 0.000 description 3
- 238000009792 diffusion process Methods 0.000 description 3
- 238000010438 heat treatment Methods 0.000 description 3
- 239000012212 insulator Substances 0.000 description 3
- 229910003465 moissanite Inorganic materials 0.000 description 3
- 150000004767 nitrides Chemical class 0.000 description 3
- 238000001039 wet etching Methods 0.000 description 3
- IJGRMHOSHXDMSA-UHFFFAOYSA-N Atomic nitrogen Chemical compound N#N IJGRMHOSHXDMSA-UHFFFAOYSA-N 0.000 description 2
- 229910001218 Gallium arsenide Inorganic materials 0.000 description 2
- 229910000927 Ge alloy Inorganic materials 0.000 description 2
- 229910000673 Indium arsenide Inorganic materials 0.000 description 2
- 239000012298 atmosphere Substances 0.000 description 2
- 230000008859 change Effects 0.000 description 2
- 239000002800 charge carrier Substances 0.000 description 2
- 239000003795 chemical substances by application Substances 0.000 description 2
- 230000000295 complement effect Effects 0.000 description 2
- 238000000280 densification Methods 0.000 description 2
- 239000003989 dielectric material Substances 0.000 description 2
- 238000001312 dry etching Methods 0.000 description 2
- 238000000227 grinding Methods 0.000 description 2
- 125000001475 halogen functional group Chemical group 0.000 description 2
- RPQDHPTXJYYUPQ-UHFFFAOYSA-N indium arsenide Chemical compound [In]#[As] RPQDHPTXJYYUPQ-UHFFFAOYSA-N 0.000 description 2
- 239000011810 insulating material Substances 0.000 description 2
- 229910052751 metal Inorganic materials 0.000 description 2
- 239000002184 metal Substances 0.000 description 2
- 229910044991 metal oxide Inorganic materials 0.000 description 2
- 150000004706 metal oxides Chemical class 0.000 description 2
- 229910052757 nitrogen Inorganic materials 0.000 description 2
- 238000005498 polishing Methods 0.000 description 2
- 230000003068 static effect Effects 0.000 description 2
- RYGMFSIKBFXOCR-UHFFFAOYSA-N Copper Chemical compound [Cu] RYGMFSIKBFXOCR-UHFFFAOYSA-N 0.000 description 1
- 108090000699 N-Type Calcium Channels Proteins 0.000 description 1
- 102000004129 N-Type Calcium Channels Human genes 0.000 description 1
- 108010075750 P-Type Calcium Channels Proteins 0.000 description 1
- 229910052581 Si3N4 Inorganic materials 0.000 description 1
- 229910004298 SiO 2 Inorganic materials 0.000 description 1
- BQCADISMDOOEFD-UHFFFAOYSA-N Silver Chemical compound [Ag] BQCADISMDOOEFD-UHFFFAOYSA-N 0.000 description 1
- 230000002411 adverse Effects 0.000 description 1
- 229910045601 alloy Inorganic materials 0.000 description 1
- 239000000956 alloy Substances 0.000 description 1
- 229910052782 aluminium Inorganic materials 0.000 description 1
- 239000004411 aluminium Substances 0.000 description 1
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 description 1
- 238000001311 chemical methods and process Methods 0.000 description 1
- 238000000224 chemical solution deposition Methods 0.000 description 1
- 239000010949 copper Substances 0.000 description 1
- 229910052802 copper Inorganic materials 0.000 description 1
- 230000007812 deficiency Effects 0.000 description 1
- 230000002349 favourable effect Effects 0.000 description 1
- 230000005669 field effect Effects 0.000 description 1
- 238000011049 filling Methods 0.000 description 1
- 239000011521 glass Substances 0.000 description 1
- PCHJSUWPFVWCPO-UHFFFAOYSA-N gold Chemical compound [Au] PCHJSUWPFVWCPO-UHFFFAOYSA-N 0.000 description 1
- 229910052737 gold Inorganic materials 0.000 description 1
- 239000010931 gold Substances 0.000 description 1
- 239000011261 inert gas Substances 0.000 description 1
- 238000010884 ion-beam technique Methods 0.000 description 1
- 238000004519 manufacturing process Methods 0.000 description 1
- 238000003801 milling Methods 0.000 description 1
- 238000002156 mixing Methods 0.000 description 1
- 230000003071 parasitic effect Effects 0.000 description 1
- 238000000623 plasma-assisted chemical vapour deposition Methods 0.000 description 1
- 238000007747 plating Methods 0.000 description 1
- 238000012797 qualification Methods 0.000 description 1
- 230000009467 reduction Effects 0.000 description 1
- 239000004576 sand Substances 0.000 description 1
- 229910021332 silicide Inorganic materials 0.000 description 1
- FVBUAEGBCNSCDD-UHFFFAOYSA-N silicide(4-) Chemical group [Si-4] FVBUAEGBCNSCDD-UHFFFAOYSA-N 0.000 description 1
- 239000000377 silicon dioxide Substances 0.000 description 1
- HQVNEWCFYHHQES-UHFFFAOYSA-N silicon nitride Chemical compound N12[Si]34N5[Si]62N3[Si]51N64 HQVNEWCFYHHQES-UHFFFAOYSA-N 0.000 description 1
- -1 siloxanes Chemical class 0.000 description 1
- 229910052709 silver Inorganic materials 0.000 description 1
- 239000004332 silver Substances 0.000 description 1
- 239000007787 solid Substances 0.000 description 1
- 238000003860 storage Methods 0.000 description 1
- 238000005728 strengthening Methods 0.000 description 1
- 239000000126 substance Substances 0.000 description 1
- WFKWXMTUELFFGS-UHFFFAOYSA-N tungsten Chemical compound [W] WFKWXMTUELFFGS-UHFFFAOYSA-N 0.000 description 1
- 229910052721 tungsten Inorganic materials 0.000 description 1
- 239000010937 tungsten Substances 0.000 description 1
Images
Classifications
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- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10B—ELECTRONIC MEMORY DEVICES
- H10B10/00—Static random access memory [SRAM] devices
- H10B10/12—Static random access memory [SRAM] devices comprising a MOSFET load element
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C11/00—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
- G11C11/21—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements
- G11C11/34—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices
- G11C11/40—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors
- G11C11/41—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors forming static cells with positive feedback, i.e. cells not needing refreshing or charge regeneration, e.g. bistable multivibrator or Schmitt trigger
- G11C11/412—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors forming static cells with positive feedback, i.e. cells not needing refreshing or charge regeneration, e.g. bistable multivibrator or Schmitt trigger using field-effect transistors only
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/70—Manufacture or treatment of devices consisting of a plurality of solid state components formed in or on a common substrate or of parts thereof; Manufacture of integrated circuit devices or of parts thereof
- H01L21/77—Manufacture or treatment of devices consisting of a plurality of solid state components or integrated circuits formed in, or on, a common substrate
- H01L21/78—Manufacture or treatment of devices consisting of a plurality of solid state components or integrated circuits formed in, or on, a common substrate with subsequent division of the substrate into plural individual devices
- H01L21/82—Manufacture or treatment of devices consisting of a plurality of solid state components or integrated circuits formed in, or on, a common substrate with subsequent division of the substrate into plural individual devices to produce devices, e.g. integrated circuits, each consisting of a plurality of components
- H01L21/84—Manufacture or treatment of devices consisting of a plurality of solid state components or integrated circuits formed in, or on, a common substrate with subsequent division of the substrate into plural individual devices to produce devices, e.g. integrated circuits, each consisting of a plurality of components the substrate being other than a semiconductor body, e.g. being an insulating body
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
- H01L27/02—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers
- H01L27/12—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers the substrate being other than a semiconductor body, e.g. an insulating body
- H01L27/1203—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers the substrate being other than a semiconductor body, e.g. an insulating body the substrate comprising an insulating body on a semiconductor body, e.g. SOI
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
- H01L27/02—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers
- H01L27/12—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers the substrate being other than a semiconductor body, e.g. an insulating body
- H01L27/1203—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers the substrate being other than a semiconductor body, e.g. an insulating body the substrate comprising an insulating body on a semiconductor body, e.g. SOI
- H01L27/1207—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers the substrate being other than a semiconductor body, e.g. an insulating body the substrate comprising an insulating body on a semiconductor body, e.g. SOI combined with devices in contact with the semiconductor body, i.e. bulk/SOI hybrid circuits
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10B—ELECTRONIC MEMORY DEVICES
- H10B10/00—Static random access memory [SRAM] devices
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- Engineering & Computer Science (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Computer Hardware Design (AREA)
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Manufacturing & Machinery (AREA)
- Semiconductor Memories (AREA)
- Thin Film Transistor (AREA)
- Metal-Oxide And Bipolar Metal-Oxide Semiconductor Integrated Circuits (AREA)
- Element Separation (AREA)
Abstract
Description
Claims (30)
Applications Claiming Priority (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US11/108,012 | 2005-04-15 | ||
US11/108,012 US7274072B2 (en) | 2005-04-15 | 2005-04-15 | Hybrid bulk-SOI 6T-SRAM cell for improved cell stability and performance |
PCT/US2006/011167 WO2006113061A2 (en) | 2005-04-15 | 2006-03-27 | A hybrid bulk-soi 6t-sram cell for improved cell stability and performance |
Publications (2)
Publication Number | Publication Date |
---|---|
CN101160667A true CN101160667A (zh) | 2008-04-09 |
CN101160667B CN101160667B (zh) | 2010-06-16 |
Family
ID=37107697
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
CN2006800119743A Active CN101160667B (zh) | 2005-04-15 | 2006-03-27 | 改进单元稳定性和性能的混合块soi 6t-sram单元 |
Country Status (6)
Country | Link |
---|---|
US (1) | US7274072B2 (zh) |
EP (1) | EP1875516A4 (zh) |
JP (1) | JP2008536334A (zh) |
CN (1) | CN101160667B (zh) |
TW (1) | TW200723548A (zh) |
WO (1) | WO2006113061A2 (zh) |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN103295951A (zh) * | 2012-02-27 | 2013-09-11 | 中国科学院上海微系统与信息技术研究所 | 基于混合晶向soi的器件系统结构及制备方法 |
CN103579191A (zh) * | 2012-07-20 | 2014-02-12 | 无锡华润上华半导体有限公司 | 用于测试六管sram的漏电流的半导体测试结构 |
Families Citing this family (27)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR100539243B1 (ko) * | 2003-10-04 | 2005-12-27 | 삼성전자주식회사 | 부분 에스오아이 기판에 구현된 에스램 소자 |
US7087965B2 (en) * | 2004-04-22 | 2006-08-08 | International Business Machines Corporation | Strained silicon CMOS on hybrid crystal orientations |
JP2007158295A (ja) * | 2005-11-10 | 2007-06-21 | Seiko Epson Corp | 半導体装置および半導体装置の製造方法 |
JP2007234793A (ja) * | 2006-02-28 | 2007-09-13 | Seiko Epson Corp | 半導体装置及びその製造方法 |
JP2007251005A (ja) * | 2006-03-17 | 2007-09-27 | Toshiba Corp | 半導体装置及びその製造方法 |
DE102006015076B4 (de) * | 2006-03-31 | 2014-03-20 | Advanced Micro Devices, Inc. | Halbleiterbauelement mit SOI-Transistoren und Vollsubstrattransistoren und ein Verfahren zur Herstellung |
US20090026524A1 (en) * | 2007-07-27 | 2009-01-29 | Franz Kreupl | Stacked Circuits |
US7948008B2 (en) * | 2007-10-26 | 2011-05-24 | Micron Technology, Inc. | Floating body field-effect transistors, and methods of forming floating body field-effect transistors |
US7985633B2 (en) * | 2007-10-30 | 2011-07-26 | International Business Machines Corporation | Embedded DRAM integrated circuits with extremely thin silicon-on-insulator pass transistors |
US7718496B2 (en) | 2007-10-30 | 2010-05-18 | International Business Machines Corporation | Techniques for enabling multiple Vt devices using high-K metal gate stacks |
US20090200635A1 (en) * | 2008-02-12 | 2009-08-13 | Viktor Koldiaev | Integrated Circuit Having Electrical Isolation Regions, Mask Technology and Method of Manufacturing Same |
US20100200918A1 (en) * | 2009-02-10 | 2010-08-12 | Honeywell International Inc. | Heavy Ion Upset Hardened Floating Body SRAM Cells |
US8294485B2 (en) | 2009-02-12 | 2012-10-23 | International Business Machines Corporation | Detecting asymmetrical transistor leakage defects |
US8324665B2 (en) * | 2009-04-21 | 2012-12-04 | Texas Instruments Incorporated | SRAM cell with different crystal orientation than associated logic |
US8080456B2 (en) * | 2009-05-20 | 2011-12-20 | International Business Machines Corporation | Robust top-down silicon nanowire structure using a conformal nitride |
US8018007B2 (en) * | 2009-07-20 | 2011-09-13 | International Business Machines Corporation | Selective floating body SRAM cell |
US8643107B2 (en) * | 2010-01-07 | 2014-02-04 | International Business Machines Corporation | Body-tied asymmetric N-type field effect transistor |
US8426917B2 (en) * | 2010-01-07 | 2013-04-23 | International Business Machines Corporation | Body-tied asymmetric P-type field effect transistor |
US8299519B2 (en) * | 2010-01-11 | 2012-10-30 | International Business Machines Corporation | Read transistor for single poly non-volatile memory using body contacted SOI device |
US8212294B2 (en) | 2010-01-28 | 2012-07-03 | Raytheon Company | Structure having silicon CMOS transistors with column III-V transistors on a common substrate |
US8372725B2 (en) * | 2010-02-23 | 2013-02-12 | International Business Machines Corporation | Structures and methods of forming pre fabricated deep trench capacitors for SOI substrates |
US8822295B2 (en) | 2012-04-03 | 2014-09-02 | International Business Machines Corporation | Low extension dose implants in SRAM fabrication |
US9041105B2 (en) | 2012-07-20 | 2015-05-26 | International Business Machines Corporation | Integrated circuit including transistor structure on depleted silicon-on-insulator, related method and design structure |
US8963208B2 (en) * | 2012-11-15 | 2015-02-24 | GlobalFoundries, Inc. | Semiconductor structure including a semiconductor-on-insulator region and a bulk region, and method for the formation thereof |
JP6178118B2 (ja) * | 2013-05-31 | 2017-08-09 | ルネサスエレクトロニクス株式会社 | 半導体装置およびその製造方法 |
US10109638B1 (en) * | 2017-10-23 | 2018-10-23 | Globalfoundries Singapore Pte. Ltd. | Embedded non-volatile memory (NVM) on fully depleted silicon-on-insulator (FD-SOI) substrate |
US11749671B2 (en) * | 2020-10-09 | 2023-09-05 | Globalfoundries U.S. Inc. | Integrated circuit structures with well boundary distal to substrate midpoint and methods to form the same |
Family Cites Families (9)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH03129777A (ja) * | 1989-07-13 | 1991-06-03 | Mitsubishi Electric Corp | 電界効果型トランジスタを備えた半導体装置およびその製造方法 |
JP3836166B2 (ja) * | 1993-11-22 | 2006-10-18 | 株式会社半導体エネルギー研究所 | 2層構造のトランジスタおよびその作製方法 |
WO2000048245A1 (en) * | 1999-02-12 | 2000-08-17 | Ibis Technology Corporation | Patterned silicon-on-insulator devices |
US6624459B1 (en) * | 2000-04-12 | 2003-09-23 | International Business Machines Corp. | Silicon on insulator field effect transistors having shared body contact |
JP2004079705A (ja) * | 2002-08-14 | 2004-03-11 | Renesas Technology Corp | 半導体集積回路装置およびその製造方法 |
JP4850387B2 (ja) * | 2002-12-09 | 2012-01-11 | ルネサスエレクトロニクス株式会社 | 半導体装置 |
JP4290457B2 (ja) * | 2003-03-31 | 2009-07-08 | 株式会社ルネサステクノロジ | 半導体記憶装置 |
US7329923B2 (en) * | 2003-06-17 | 2008-02-12 | International Business Machines Corporation | High-performance CMOS devices on hybrid crystal oriented substrates |
KR100539243B1 (ko) * | 2003-10-04 | 2005-12-27 | 삼성전자주식회사 | 부분 에스오아이 기판에 구현된 에스램 소자 |
-
2005
- 2005-04-15 US US11/108,012 patent/US7274072B2/en active Active
-
2006
- 2006-03-27 JP JP2008506486A patent/JP2008536334A/ja active Pending
- 2006-03-27 CN CN2006800119743A patent/CN101160667B/zh active Active
- 2006-03-27 EP EP06739771A patent/EP1875516A4/en not_active Withdrawn
- 2006-03-27 WO PCT/US2006/011167 patent/WO2006113061A2/en active Application Filing
- 2006-04-04 TW TW095112004A patent/TW200723548A/zh unknown
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN103295951A (zh) * | 2012-02-27 | 2013-09-11 | 中国科学院上海微系统与信息技术研究所 | 基于混合晶向soi的器件系统结构及制备方法 |
CN103579191A (zh) * | 2012-07-20 | 2014-02-12 | 无锡华润上华半导体有限公司 | 用于测试六管sram的漏电流的半导体测试结构 |
CN103579191B (zh) * | 2012-07-20 | 2016-06-15 | 无锡华润上华半导体有限公司 | 用于测试六管sram的漏电流的半导体测试结构 |
Also Published As
Publication number | Publication date |
---|---|
WO2006113061A3 (en) | 2007-05-24 |
TW200723548A (en) | 2007-06-16 |
US7274072B2 (en) | 2007-09-25 |
WO2006113061A2 (en) | 2006-10-26 |
EP1875516A2 (en) | 2008-01-09 |
JP2008536334A (ja) | 2008-09-04 |
EP1875516A4 (en) | 2008-08-13 |
CN101160667B (zh) | 2010-06-16 |
US20060231899A1 (en) | 2006-10-19 |
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