CN101147241A - 带有可控制切割边缘的用于分离产品的方法和设备、及分离的产品 - Google Patents
带有可控制切割边缘的用于分离产品的方法和设备、及分离的产品 Download PDFInfo
- Publication number
- CN101147241A CN101147241A CNA2006800092257A CN200680009225A CN101147241A CN 101147241 A CN101147241 A CN 101147241A CN A2006800092257 A CNA2006800092257 A CN A2006800092257A CN 200680009225 A CN200680009225 A CN 200680009225A CN 101147241 A CN101147241 A CN 101147241A
- Authority
- CN
- China
- Prior art keywords
- laser beam
- product
- cut edge
- laser
- products
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 238000000034 method Methods 0.000 title claims abstract description 34
- 238000003698 laser cutting Methods 0.000 claims abstract description 21
- 239000004065 semiconductor Substances 0.000 claims abstract description 10
- 230000003746 surface roughness Effects 0.000 claims description 11
- 238000012545 processing Methods 0.000 claims description 8
- 238000005520 cutting process Methods 0.000 claims description 7
- 238000003860 storage Methods 0.000 claims description 4
- 230000007704 transition Effects 0.000 claims description 3
- 230000000694 effects Effects 0.000 claims description 2
- 239000004020 conductor Substances 0.000 claims 1
- 238000005516 engineering process Methods 0.000 description 3
- 235000019592 roughness Nutrition 0.000 description 3
- 230000015572 biosynthetic process Effects 0.000 description 2
- 238000005336 cracking Methods 0.000 description 2
- 239000000463 material Substances 0.000 description 2
- 238000000926 separation method Methods 0.000 description 2
- 230000003068 static effect Effects 0.000 description 2
- 239000000969 carrier Substances 0.000 description 1
- 238000006243 chemical reaction Methods 0.000 description 1
- 238000013461 design Methods 0.000 description 1
- 238000005538 encapsulation Methods 0.000 description 1
- 230000002349 favourable effect Effects 0.000 description 1
- 238000009499 grossing Methods 0.000 description 1
- 238000010295 mobile communication Methods 0.000 description 1
- 238000005498 polishing Methods 0.000 description 1
- 238000012827 research and development Methods 0.000 description 1
- 230000000717 retained effect Effects 0.000 description 1
Images
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/70—Manufacture or treatment of devices consisting of a plurality of solid state components formed in or on a common substrate or of parts thereof; Manufacture of integrated circuit devices or of parts thereof
- H01L21/77—Manufacture or treatment of devices consisting of a plurality of solid state components or integrated circuits formed in, or on, a common substrate
- H01L21/78—Manufacture or treatment of devices consisting of a plurality of solid state components or integrated circuits formed in, or on, a common substrate with subsequent division of the substrate into plural individual devices
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B23—MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
- B23K—SOLDERING OR UNSOLDERING; WELDING; CLADDING OR PLATING BY SOLDERING OR WELDING; CUTTING BY APPLYING HEAT LOCALLY, e.g. FLAME CUTTING; WORKING BY LASER BEAM
- B23K26/00—Working by laser beam, e.g. welding, cutting or boring
- B23K26/36—Removing material
- B23K26/38—Removing material by boring or cutting
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B23—MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
- B23K—SOLDERING OR UNSOLDERING; WELDING; CLADDING OR PLATING BY SOLDERING OR WELDING; CUTTING BY APPLYING HEAT LOCALLY, e.g. FLAME CUTTING; WORKING BY LASER BEAM
- B23K26/00—Working by laser beam, e.g. welding, cutting or boring
- B23K26/02—Positioning or observing the workpiece, e.g. with respect to the point of impact; Aligning, aiming or focusing the laser beam
- B23K26/06—Shaping the laser beam, e.g. by masks or multi-focusing
- B23K26/062—Shaping the laser beam, e.g. by masks or multi-focusing by direct control of the laser beam
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B23—MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
- B23K—SOLDERING OR UNSOLDERING; WELDING; CLADDING OR PLATING BY SOLDERING OR WELDING; CUTTING BY APPLYING HEAT LOCALLY, e.g. FLAME CUTTING; WORKING BY LASER BEAM
- B23K26/00—Working by laser beam, e.g. welding, cutting or boring
- B23K26/352—Working by laser beam, e.g. welding, cutting or boring for surface treatment
- B23K26/3568—Modifying rugosity
- B23K26/3576—Diminishing rugosity, e.g. grinding; Polishing; Smoothing
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B23—MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
- B23K—SOLDERING OR UNSOLDERING; WELDING; CLADDING OR PLATING BY SOLDERING OR WELDING; CUTTING BY APPLYING HEAT LOCALLY, e.g. FLAME CUTTING; WORKING BY LASER BEAM
- B23K37/00—Auxiliary devices or processes, not specially adapted to a procedure covered by only one of the preceding main groups
- B23K37/08—Auxiliary devices or processes, not specially adapted to a procedure covered by only one of the preceding main groups for flash removal
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
- H01L21/18—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
- H01L21/30—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26
- H01L21/302—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26 to change their surface-physical characteristics or shape, e.g. etching, polishing, cutting
- H01L21/304—Mechanical treatment, e.g. grinding, polishing, cutting
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B23—MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
- B23K—SOLDERING OR UNSOLDERING; WELDING; CLADDING OR PLATING BY SOLDERING OR WELDING; CUTTING BY APPLYING HEAT LOCALLY, e.g. FLAME CUTTING; WORKING BY LASER BEAM
- B23K2101/00—Articles made by soldering, welding or cutting
- B23K2101/36—Electric or electronic devices
- B23K2101/40—Semiconductor devices
Landscapes
- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- Optics & Photonics (AREA)
- Mechanical Engineering (AREA)
- Plasma & Fusion (AREA)
- Manufacturing & Machinery (AREA)
- General Physics & Mathematics (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- Laser Beam Processing (AREA)
- Dicing (AREA)
- Encapsulation Of And Coatings For Semiconductor Or Solid State Devices (AREA)
Abstract
Description
Claims (17)
Applications Claiming Priority (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
NL1028588 | 2005-03-22 | ||
NL1028588A NL1028588C2 (nl) | 2005-03-22 | 2005-03-22 | Werkwijze en inrichting voor het separeren van producten met een gecontroleerde snederand en gesepareerd product. |
PCT/NL2006/050061 WO2006118454A1 (en) | 2005-03-22 | 2006-03-21 | Method and device for separating products with a controlled cut edge, and separated product |
Publications (2)
Publication Number | Publication Date |
---|---|
CN101147241A true CN101147241A (zh) | 2008-03-19 |
CN101147241B CN101147241B (zh) | 2011-01-12 |
Family
ID=35453332
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
CN2006800092257A Expired - Fee Related CN101147241B (zh) | 2005-03-22 | 2006-03-21 | 用于分离具有可控切割边产品的方法和设备及分离的产品 |
Country Status (7)
Country | Link |
---|---|
EP (1) | EP1905067A1 (zh) |
JP (1) | JP2008537511A (zh) |
KR (1) | KR20070121793A (zh) |
CN (1) | CN101147241B (zh) |
NL (1) | NL1028588C2 (zh) |
TW (1) | TWI465310B (zh) |
WO (1) | WO2006118454A1 (zh) |
Cited By (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN106346143A (zh) * | 2016-11-24 | 2017-01-25 | 武汉华星光电技术有限公司 | 一种激光切割机及其切割方法 |
CN107148324A (zh) * | 2014-08-28 | 2017-09-08 | Ipg光子公司 | 用于切割和切割后加工硬质电介质材料的多激光器系统和方法 |
CN112404745A (zh) * | 2020-11-02 | 2021-02-26 | 中国航空工业集团公司北京长城航空测控技术研究所 | 一种薄片晶体器件切割面的超快激光平整方法 |
CN113646124A (zh) * | 2019-02-25 | 2021-11-12 | Ws光学技术有限责任公司 | 用于射束加工板状或管状工件的方法 |
CN114173982A (zh) * | 2019-07-29 | 2022-03-11 | Ws光学技术有限责任公司 | 用于射束加工板状或管状工件的方法 |
Families Citing this family (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO2011004746A1 (ja) * | 2009-07-06 | 2011-01-13 | ルネサスエレクトロニクス株式会社 | 半導体装置の製造方法 |
SI25748A (sl) * | 2018-12-07 | 2020-06-30 | Intech-Les, Razvojni Center D.O.O. | Izboljšanje hrapavosti površine s laserjem |
EP3685954B1 (en) * | 2019-01-22 | 2024-01-24 | Synova S.A. | Method for cutting a workpiece with a complex fluid-jet-guided laser beam |
CN113199149B (zh) * | 2020-01-15 | 2023-08-11 | 大族激光科技产业集团股份有限公司 | 激光去除镀层的加工工艺 |
Family Cites Families (11)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US3626143A (en) * | 1969-04-02 | 1971-12-07 | American Can Co | Scoring of materials with laser energy |
US5368900A (en) * | 1991-11-04 | 1994-11-29 | Motorola, Inc. | Multistep laser ablation method for making optical waveguide reflector |
WO1997029509A1 (en) * | 1996-02-09 | 1997-08-14 | Philips Electronics N.V. | Laser separation of semiconductor elements formed in a wafer of semiconductor material |
US6407360B1 (en) * | 1998-08-26 | 2002-06-18 | Samsung Electronics, Co., Ltd. | Laser cutting apparatus and method |
US6413839B1 (en) * | 1998-10-23 | 2002-07-02 | Emcore Corporation | Semiconductor device separation using a patterned laser projection |
US6420678B1 (en) * | 1998-12-01 | 2002-07-16 | Brian L. Hoekstra | Method for separating non-metallic substrates |
IE20000618A1 (en) * | 1999-08-03 | 2001-03-07 | Xsil Technology Ltd | A circuit singulation system and method |
KR100634750B1 (ko) * | 1999-12-07 | 2006-10-16 | 삼성전자주식회사 | 레이저 커팅 장치 |
AU2001250208A1 (en) * | 2000-04-11 | 2001-10-23 | Gsi Lumonics Inc. | A method and system for laser drilling |
KR20030064808A (ko) * | 2000-12-15 | 2003-08-02 | 엑스에스아이엘 테크놀러지 리미티드 | 반도체 재료의 레이저 기계 가공 |
US6677552B1 (en) * | 2001-11-30 | 2004-01-13 | Positive Light, Inc. | System and method for laser micro-machining |
-
2005
- 2005-03-22 NL NL1028588A patent/NL1028588C2/nl not_active IP Right Cessation
-
2006
- 2006-03-20 TW TW095109431A patent/TWI465310B/zh not_active IP Right Cessation
- 2006-03-21 CN CN2006800092257A patent/CN101147241B/zh not_active Expired - Fee Related
- 2006-03-21 WO PCT/NL2006/050061 patent/WO2006118454A1/en active Application Filing
- 2006-03-21 KR KR1020077024212A patent/KR20070121793A/ko not_active Application Discontinuation
- 2006-03-21 EP EP06716694A patent/EP1905067A1/en not_active Withdrawn
- 2006-03-21 JP JP2008502936A patent/JP2008537511A/ja not_active Ceased
Cited By (11)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN107148324A (zh) * | 2014-08-28 | 2017-09-08 | Ipg光子公司 | 用于切割和切割后加工硬质电介质材料的多激光器系统和方法 |
CN114603249A (zh) * | 2014-08-28 | 2022-06-10 | Ipg光子公司 | 用于切割和切割后加工硬质电介质材料的多激光器系统和方法 |
CN106346143A (zh) * | 2016-11-24 | 2017-01-25 | 武汉华星光电技术有限公司 | 一种激光切割机及其切割方法 |
CN106346143B (zh) * | 2016-11-24 | 2018-05-25 | 武汉华星光电技术有限公司 | 一种激光切割机及其切割方法 |
CN113646124A (zh) * | 2019-02-25 | 2021-11-12 | Ws光学技术有限责任公司 | 用于射束加工板状或管状工件的方法 |
CN114367749A (zh) * | 2019-02-25 | 2022-04-19 | Ws光学技术有限责任公司 | 用于射束加工板状或管状工件的方法 |
CN113646124B (zh) * | 2019-02-25 | 2022-09-27 | Ws光学技术有限责任公司 | 用于射束加工板状或管状工件的方法 |
CN114367749B (zh) * | 2019-02-25 | 2024-05-10 | Ws光学技术有限责任公司 | 用于射束加工板状或管状工件的方法 |
CN114173982A (zh) * | 2019-07-29 | 2022-03-11 | Ws光学技术有限责任公司 | 用于射束加工板状或管状工件的方法 |
CN114173982B (zh) * | 2019-07-29 | 2023-08-11 | Ws光学技术有限责任公司 | 用于射束加工板状或管状工件的方法 |
CN112404745A (zh) * | 2020-11-02 | 2021-02-26 | 中国航空工业集团公司北京长城航空测控技术研究所 | 一种薄片晶体器件切割面的超快激光平整方法 |
Also Published As
Publication number | Publication date |
---|---|
KR20070121793A (ko) | 2007-12-27 |
TWI465310B (zh) | 2014-12-21 |
JP2008537511A (ja) | 2008-09-18 |
CN101147241B (zh) | 2011-01-12 |
TW200633809A (en) | 2006-10-01 |
WO2006118454A1 (en) | 2006-11-09 |
EP1905067A1 (en) | 2008-04-02 |
NL1028588C2 (nl) | 2006-09-25 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
C06 | Publication | ||
PB01 | Publication | ||
C10 | Entry into substantive examination | ||
SE01 | Entry into force of request for substantive examination | ||
C14 | Grant of patent or utility model | ||
GR01 | Patent grant | ||
ASS | Succession or assignment of patent right |
Owner name: BESI NETHERLANDS B. V. Free format text: FORMER OWNER: FICO INTERNATIONAL B. V. Effective date: 20130717 |
|
C41 | Transfer of patent application or patent right or utility model | ||
C56 | Change in the name or address of the patentee |
Owner name: FICO INTERNATIONAL B. V. Free format text: FORMER NAME: FICO BV |
|
CP01 | Change in the name or title of a patent holder |
Address after: Holland Patentee after: FLYCO International Ltd. Address before: Holland Patentee before: FICO B.V. |
|
TR01 | Transfer of patent right |
Effective date of registration: 20130717 Address after: Holland Patentee after: BESI NETHERLANDS B.V. Address before: Holland Patentee before: FLYCO International Ltd. |
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CF01 | Termination of patent right due to non-payment of annual fee |
Granted publication date: 20110112 Termination date: 20160321 |
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CF01 | Termination of patent right due to non-payment of annual fee |