CN101110440B - 固态成像装置 - Google Patents
固态成像装置 Download PDFInfo
- Publication number
- CN101110440B CN101110440B CN2007101286275A CN200710128627A CN101110440B CN 101110440 B CN101110440 B CN 101110440B CN 2007101286275 A CN2007101286275 A CN 2007101286275A CN 200710128627 A CN200710128627 A CN 200710128627A CN 101110440 B CN101110440 B CN 101110440B
- Authority
- CN
- China
- Prior art keywords
- image pickup
- semiconductor substrate
- pickup device
- state image
- solid state
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
- 238000003384 imaging method Methods 0.000 title claims description 14
- 239000004065 semiconductor Substances 0.000 claims abstract description 62
- 239000000758 substrate Substances 0.000 claims abstract description 54
- 238000006243 chemical reaction Methods 0.000 claims abstract description 8
- 239000007787 solid Substances 0.000 claims description 67
- 230000003287 optical effect Effects 0.000 claims description 41
- 238000009792 diffusion process Methods 0.000 claims description 39
- 239000012535 impurity Substances 0.000 claims description 34
- 230000005693 optoelectronics Effects 0.000 claims description 6
- 239000000463 material Substances 0.000 claims description 4
- 230000005669 field effect Effects 0.000 claims description 3
- 230000004044 response Effects 0.000 claims description 3
- 230000005622 photoelectricity Effects 0.000 claims description 2
- 230000000694 effects Effects 0.000 description 4
- 230000008859 change Effects 0.000 description 3
- 238000002955 isolation Methods 0.000 description 3
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N Silicium dioxide Chemical compound O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 description 2
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 description 2
- 229910052710 silicon Inorganic materials 0.000 description 2
- 239000010703 silicon Substances 0.000 description 2
- RYGMFSIKBFXOCR-UHFFFAOYSA-N Copper Chemical compound [Cu] RYGMFSIKBFXOCR-UHFFFAOYSA-N 0.000 description 1
- RTAQQCXQSZGOHL-UHFFFAOYSA-N Titanium Chemical compound [Ti] RTAQQCXQSZGOHL-UHFFFAOYSA-N 0.000 description 1
- 239000004411 aluminium Substances 0.000 description 1
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 description 1
- 229910052782 aluminium Inorganic materials 0.000 description 1
- 230000004888 barrier function Effects 0.000 description 1
- 230000008901 benefit Effects 0.000 description 1
- 230000015572 biosynthetic process Effects 0.000 description 1
- 239000010949 copper Substances 0.000 description 1
- 229910052802 copper Inorganic materials 0.000 description 1
- 230000007850 degeneration Effects 0.000 description 1
- 238000001514 detection method Methods 0.000 description 1
- 238000010586 diagram Methods 0.000 description 1
- 238000004519 manufacturing process Methods 0.000 description 1
- 230000001151 other effect Effects 0.000 description 1
- 230000003647 oxidation Effects 0.000 description 1
- 238000007254 oxidation reaction Methods 0.000 description 1
- 229910021420 polycrystalline silicon Inorganic materials 0.000 description 1
- 229920005591 polysilicon Polymers 0.000 description 1
- 235000012239 silicon dioxide Nutrition 0.000 description 1
- 239000000377 silicon dioxide Substances 0.000 description 1
- 239000010936 titanium Substances 0.000 description 1
- 229910052719 titanium Inorganic materials 0.000 description 1
- WFKWXMTUELFFGS-UHFFFAOYSA-N tungsten Chemical compound [W] WFKWXMTUELFFGS-UHFFFAOYSA-N 0.000 description 1
- 239000010937 tungsten Substances 0.000 description 1
- 229910052721 tungsten Inorganic materials 0.000 description 1
Images
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
- H01L27/14—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation
- H01L27/144—Devices controlled by radiation
- H01L27/146—Imager structures
- H01L27/14601—Structural or functional details thereof
- H01L27/1462—Coatings
- H01L27/14623—Optical shielding
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
- H01L27/14—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation
- H01L27/144—Devices controlled by radiation
- H01L27/146—Imager structures
- H01L27/14601—Structural or functional details thereof
- H01L27/1464—Back illuminated imager structures
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
- H01L27/14—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation
- H01L27/144—Devices controlled by radiation
- H01L27/146—Imager structures
- H01L27/14643—Photodiode arrays; MOS imagers
Landscapes
- Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- Power Engineering (AREA)
- Electromagnetism (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Solid State Image Pick-Up Elements (AREA)
Abstract
Description
Claims (12)
Applications Claiming Priority (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2006188530 | 2006-07-07 | ||
JP2006-188530 | 2006-07-07 | ||
JP2006188530A JP4976765B2 (ja) | 2006-07-07 | 2006-07-07 | 固体撮像装置 |
Publications (2)
Publication Number | Publication Date |
---|---|
CN101110440A CN101110440A (zh) | 2008-01-23 |
CN101110440B true CN101110440B (zh) | 2010-06-16 |
Family
ID=38918384
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
CN2007101286275A Expired - Fee Related CN101110440B (zh) | 2006-07-07 | 2007-07-09 | 固态成像装置 |
Country Status (3)
Country | Link |
---|---|
US (2) | US7939825B2 (zh) |
JP (1) | JP4976765B2 (zh) |
CN (1) | CN101110440B (zh) |
Families Citing this family (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP5198150B2 (ja) * | 2008-05-29 | 2013-05-15 | 株式会社東芝 | 固体撮像装置 |
JP5438374B2 (ja) * | 2009-05-12 | 2014-03-12 | キヤノン株式会社 | 固体撮像装置 |
Citations (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US6188093B1 (en) * | 1997-09-02 | 2001-02-13 | Nikon Corporation | Photoelectric conversion devices and photoelectric conversion apparatus employing the same |
Family Cites Families (31)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS56165473A (en) * | 1980-05-24 | 1981-12-19 | Semiconductor Res Found | Semiconductor pickup device |
JPS5956766A (ja) * | 1982-09-27 | 1984-04-02 | Toshiba Corp | 固体撮像素子 |
JPH03148172A (ja) * | 1989-11-02 | 1991-06-24 | Mitsubishi Electric Corp | 固体撮像装置 |
JPH05218374A (ja) * | 1992-01-31 | 1993-08-27 | Canon Inc | 光電変換装置 |
JP2000012819A (ja) * | 1998-06-17 | 2000-01-14 | Nikon Corp | 固体撮像素子 |
JP3319419B2 (ja) * | 1999-02-24 | 2002-09-03 | 日本電気株式会社 | 固体撮像装置 |
JP3530466B2 (ja) * | 2000-07-17 | 2004-05-24 | Necエレクトロニクス株式会社 | 固体撮像装置 |
JP3759435B2 (ja) * | 2001-07-11 | 2006-03-22 | ソニー株式会社 | X−yアドレス型固体撮像素子 |
JP2003264279A (ja) * | 2002-03-12 | 2003-09-19 | Mitsubishi Electric Corp | 半導体装置の製造方法及び半導体装置 |
JP3722367B2 (ja) * | 2002-03-19 | 2005-11-30 | ソニー株式会社 | 固体撮像素子の製造方法 |
JP4182393B2 (ja) * | 2002-04-10 | 2008-11-19 | ソニー株式会社 | 固体撮像素子及びその製造方法 |
KR100550413B1 (ko) * | 2002-07-31 | 2006-02-10 | 가시오게산키 가부시키가이샤 | 화상판독장치 및 그 구동방법 |
JP2004134672A (ja) * | 2002-10-11 | 2004-04-30 | Sony Corp | 超薄型半導体装置の製造方法および製造装置、並びに超薄型の裏面照射型固体撮像装置の製造方法および製造装置 |
JP4341421B2 (ja) * | 2004-02-04 | 2009-10-07 | ソニー株式会社 | 固体撮像装置 |
JP4389626B2 (ja) * | 2004-03-29 | 2009-12-24 | ソニー株式会社 | 固体撮像素子の製造方法 |
JP2006079589A (ja) * | 2004-08-05 | 2006-03-23 | Sanyo Electric Co Ltd | タッチパネル |
JP4507769B2 (ja) * | 2004-08-31 | 2010-07-21 | ソニー株式会社 | 固体撮像素子、カメラモジュール及び電子機器モジュール |
KR100614793B1 (ko) * | 2004-09-23 | 2006-08-22 | 삼성전자주식회사 | 이미지 센서 및 이의 제조 방법. |
JP4867152B2 (ja) * | 2004-10-20 | 2012-02-01 | ソニー株式会社 | 固体撮像素子 |
JP4501633B2 (ja) * | 2004-10-28 | 2010-07-14 | ソニー株式会社 | 固体撮像素子とその製造方法 |
JP4486043B2 (ja) * | 2004-12-30 | 2010-06-23 | 東部エレクトロニクス株式会社 | Cmosイメージセンサー及びその製造方法 |
US7701493B2 (en) * | 2005-02-28 | 2010-04-20 | Micron Technology, Inc. | Imager row-wise noise correction |
US8049293B2 (en) * | 2005-03-07 | 2011-11-01 | Sony Corporation | Solid-state image pickup device, electronic apparatus using such solid-state image pickup device and method of manufacturing solid-state image pickup device |
US7247829B2 (en) * | 2005-04-20 | 2007-07-24 | Fujifilm Corporation | Solid-state image sensor with an optical black area having pixels for detecting black level |
US7973380B2 (en) * | 2005-11-23 | 2011-07-05 | Taiwan Semiconductor Manufacturing Company, Ltd. | Method for providing metal extension in backside illuminated sensor for wafer level testing |
JP4678853B2 (ja) * | 2005-11-29 | 2011-04-27 | キヤノン株式会社 | 光情報記録再生装置 |
JP5175030B2 (ja) * | 2005-12-19 | 2013-04-03 | ルネサスエレクトロニクス株式会社 | 固体撮像装置 |
US7667183B2 (en) * | 2006-03-10 | 2010-02-23 | Samsung Electronics Co., Ltd. | Image sensor with high fill factor pixels and method for forming an image sensor |
KR100745991B1 (ko) * | 2006-08-11 | 2007-08-06 | 삼성전자주식회사 | 이미지 센서 및 그 제조 방법 |
US7709872B2 (en) * | 2006-09-13 | 2010-05-04 | Taiwan Semiconductor Manufacturing Co., Ltd. | Methods for fabricating image sensor devices |
US7423306B2 (en) * | 2006-09-27 | 2008-09-09 | Taiwan Semiconductor Manufacturing Co., Ltd. | CMOS image sensor devices |
-
2006
- 2006-07-07 JP JP2006188530A patent/JP4976765B2/ja active Active
-
2007
- 2007-07-06 US US11/774,039 patent/US7939825B2/en active Active
- 2007-07-09 CN CN2007101286275A patent/CN101110440B/zh not_active Expired - Fee Related
-
2011
- 2011-04-01 US US13/078,676 patent/US9159759B2/en not_active Expired - Fee Related
Patent Citations (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US6188093B1 (en) * | 1997-09-02 | 2001-02-13 | Nikon Corporation | Photoelectric conversion devices and photoelectric conversion apparatus employing the same |
Non-Patent Citations (3)
Title |
---|
JP特开2000-252452A 2000.09.14 |
JP特开2002-033469A 2002.01.31 |
JP特开平3-148172A 1991.06.24 |
Also Published As
Publication number | Publication date |
---|---|
US20110175186A1 (en) | 2011-07-21 |
JP2008016733A (ja) | 2008-01-24 |
US9159759B2 (en) | 2015-10-13 |
CN101110440A (zh) | 2008-01-23 |
US20080006896A1 (en) | 2008-01-10 |
US7939825B2 (en) | 2011-05-10 |
JP4976765B2 (ja) | 2012-07-18 |
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C06 | Publication | ||
PB01 | Publication | ||
C10 | Entry into substantive examination | ||
SE01 | Entry into force of request for substantive examination | ||
C14 | Grant of patent or utility model | ||
GR01 | Patent grant | ||
ASS | Succession or assignment of patent right |
Owner name: RENESAS ELECTRONICS CO., LTD. Free format text: FORMER OWNER: NEC CORP. Effective date: 20101123 |
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C41 | Transfer of patent application or patent right or utility model | ||
TR01 | Transfer of patent right |
Effective date of registration: 20101123 Address after: Kanagawa, Japan Patentee after: Renesas Electronics Corporation Address before: Kanagawa, Japan Patentee before: NEC Corp. |
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CP02 | Change in the address of a patent holder |
Address after: Tokyo, Japan Patentee after: Renesas Electronics Corporation Address before: Kanagawa, Japan Patentee before: Renesas Electronics Corporation |
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CP02 | Change in the address of a patent holder | ||
CF01 | Termination of patent right due to non-payment of annual fee |
Granted publication date: 20100616 Termination date: 20190709 |
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CF01 | Termination of patent right due to non-payment of annual fee |