CN100550994C - 具有替换电路分布的图像传感器阵列 - Google Patents

具有替换电路分布的图像传感器阵列 Download PDF

Info

Publication number
CN100550994C
CN100550994C CNB2004800310549A CN200480031054A CN100550994C CN 100550994 C CN100550994 C CN 100550994C CN B2004800310549 A CNB2004800310549 A CN B2004800310549A CN 200480031054 A CN200480031054 A CN 200480031054A CN 100550994 C CN100550994 C CN 100550994C
Authority
CN
China
Prior art keywords
pixel
replacement
pixels
active imaging
image sensor
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
CNB2004800310549A
Other languages
English (en)
Chinese (zh)
Other versions
CN1883190A (zh
Inventor
H·J·埃尔哈德特
D·N·尼科尔斯
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Omnivision Technologies Inc
Original Assignee
Eastman Kodak Co
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Eastman Kodak Co filed Critical Eastman Kodak Co
Publication of CN1883190A publication Critical patent/CN1883190A/zh
Application granted granted Critical
Publication of CN100550994C publication Critical patent/CN100550994C/zh
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Images

Classifications

    • HELECTRICITY
    • H04ELECTRIC COMMUNICATION TECHNIQUE
    • H04NPICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N25/00Circuitry of solid-state image sensors [SSIS]; Control thereof
    • H04N25/60Noise processing, e.g. detecting, correcting, reducing or removing noise
    • H04N25/68Noise processing, e.g. detecting, correcting, reducing or removing noise applied to defects
    • HELECTRICITY
    • H04ELECTRIC COMMUNICATION TECHNIQUE
    • H04NPICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N25/00Circuitry of solid-state image sensors [SSIS]; Control thereof
    • H04N25/70SSIS architectures; Circuits associated therewith
    • H04N25/702SSIS architectures characterised by non-identical, non-equidistant or non-planar pixel layout
    • HELECTRICITY
    • H04ELECTRIC COMMUNICATION TECHNIQUE
    • H04NPICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N23/00Cameras or camera modules comprising electronic image sensors; Control thereof
    • H04N23/80Camera processing pipelines; Components thereof
    • H04N23/84Camera processing pipelines; Components thereof for processing colour signals
    • H04N23/843Demosaicing, e.g. interpolating colour pixel values
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10FINORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
    • H10F39/00Integrated devices, or assemblies of multiple devices, comprising at least one element covered by group H10F30/00, e.g. radiation detectors comprising photodiode arrays
    • H10F39/80Constructional details of image sensors
    • H10F39/802Geometry or disposition of elements in pixels, e.g. address-lines or gate electrodes
    • HELECTRICITY
    • H04ELECTRIC COMMUNICATION TECHNIQUE
    • H04NPICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N25/00Circuitry of solid-state image sensors [SSIS]; Control thereof
    • H04N25/10Circuitry of solid-state image sensors [SSIS]; Control thereof for transforming different wavelengths into image signals
    • H04N25/11Arrangement of colour filter arrays [CFA]; Filter mosaics
    • H04N25/13Arrangement of colour filter arrays [CFA]; Filter mosaics characterised by the spectral characteristics of the filter elements
    • H04N25/134Arrangement of colour filter arrays [CFA]; Filter mosaics characterised by the spectral characteristics of the filter elements based on three different wavelength filter elements

Landscapes

  • Engineering & Computer Science (AREA)
  • Multimedia (AREA)
  • Signal Processing (AREA)
  • Physics & Mathematics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Solid State Image Pick-Up Elements (AREA)
  • Transforming Light Signals Into Electric Signals (AREA)
CNB2004800310549A 2003-10-22 2004-10-19 具有替换电路分布的图像传感器阵列 Expired - Lifetime CN100550994C (zh)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US10/691,047 2003-10-22
US10/691,047 US7304673B2 (en) 2003-10-22 2003-10-22 Image sensor array with substitutional circuit distribution

Publications (2)

Publication Number Publication Date
CN1883190A CN1883190A (zh) 2006-12-20
CN100550994C true CN100550994C (zh) 2009-10-14

Family

ID=34521786

Family Applications (1)

Application Number Title Priority Date Filing Date
CNB2004800310549A Expired - Lifetime CN100550994C (zh) 2003-10-22 2004-10-19 具有替换电路分布的图像传感器阵列

Country Status (7)

Country Link
US (1) US7304673B2 (https=)
EP (1) EP1676435B1 (https=)
JP (1) JP2007509580A (https=)
KR (1) KR101103956B1 (https=)
CN (1) CN100550994C (https=)
DE (1) DE602004026462D1 (https=)
WO (1) WO2005043894A1 (https=)

Families Citing this family (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP4090984B2 (ja) * 2003-11-14 2008-05-28 富士フイルム株式会社 デジタルカメラ及び固体撮像装置
GB2429864B (en) 2005-09-01 2008-09-24 Micron Technology Inc Method and apparatus providing pixel array having automatic light control pixels and image capture pixels
US8228405B2 (en) * 2007-01-16 2012-07-24 Bae Systems Information And Electronic Systems Integration Inc. Real-time pixel substitution for thermal imaging systems
US7781716B2 (en) * 2008-03-17 2010-08-24 Eastman Kodak Company Stacked image sensor with shared diffusion regions in respective dropped pixel positions of a pixel array
US20110115954A1 (en) * 2009-11-19 2011-05-19 Eastman Kodak Company Sparse color pixel array with pixel substitutes
US8669633B2 (en) * 2010-07-28 2014-03-11 Teledyne Dalsa, Inc. Packaged device with an image sensor aligned to a faceplate using fiducial marks and connection bodies registered thereto
CN102184931B (zh) * 2011-04-19 2013-07-17 格科微电子(上海)有限公司 图像传感器
CN102843519A (zh) * 2011-06-23 2012-12-26 鸿富锦精密工业(深圳)有限公司 影像处理系统及方法
JP2014120858A (ja) * 2012-12-14 2014-06-30 Canon Inc 固体撮像装置
JP6303352B2 (ja) * 2013-09-18 2018-04-04 株式会社デンソーウェーブ 外観検査システム
US9526468B2 (en) 2014-09-09 2016-12-27 General Electric Company Multiple frame acquisition for exposure control in X-ray medical imagers
US10685047B1 (en) 2016-12-08 2020-06-16 Townsend Street Labs, Inc. Request processing system

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB2328338A (en) * 1997-08-12 1999-02-17 Hewlett Packard Co Temperature dependent dark current correction in imaging apparatus
CN1336754A (zh) * 2000-06-22 2002-02-20 匹克希姆公司 数字像素传感器的改进设计

Family Cites Families (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH05260386A (ja) * 1992-03-16 1993-10-08 Sony Corp 固体撮像素子の欠陥画素検出回路
JPH0787284A (ja) * 1993-09-17 1995-03-31 Fuji Xerox Co Ltd 2次元イメ−ジセンサ及び画素信号の補間方法
US6618084B1 (en) * 1997-11-05 2003-09-09 Stmicroelectronics, Inc. Pixel correction system and method for CMOS imagers
US6819360B1 (en) * 1999-04-01 2004-11-16 Olympus Corporation Image pickup element and apparatus for focusing
US6970193B1 (en) * 1999-07-14 2005-11-29 Olympus Optical Co., Ltd. Electronic imaging apparatus operable in two modes with a different optical black correction procedure being effected in each mode
JP3922853B2 (ja) * 1999-12-07 2007-05-30 松下電器産業株式会社 固体撮像装置
US20030030738A1 (en) 2001-05-22 2003-02-13 Clynes Steven Derrick On-chip 2D adjustable defective pixel filtering for CMOS imagers

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB2328338A (en) * 1997-08-12 1999-02-17 Hewlett Packard Co Temperature dependent dark current correction in imaging apparatus
CN1336754A (zh) * 2000-06-22 2002-02-20 匹克希姆公司 数字像素传感器的改进设计

Also Published As

Publication number Publication date
JP2007509580A (ja) 2007-04-12
US7304673B2 (en) 2007-12-04
WO2005043894A1 (en) 2005-05-12
US20050088552A1 (en) 2005-04-28
KR20060094524A (ko) 2006-08-29
KR101103956B1 (ko) 2012-01-13
DE602004026462D1 (de) 2010-05-20
CN1883190A (zh) 2006-12-20
EP1676435A1 (en) 2006-07-05
EP1676435B1 (en) 2010-04-07

Similar Documents

Publication Publication Date Title
CN204633945U (zh) 图像传感器、成像系统和处理器系统
CN109922287B (zh) 降低图像传感器像素阵列固定图像噪声的方法、成像系统
CN106161890B (zh) 成像装置、成像系统以及信号处理方法
CN111430388B (zh) 成像像素
CN205792895U (zh) 成像系统
CN204948212U (zh) 图像像素阵列及其系统
US20200036926A1 (en) Fractional-readout oversampled image sensor
CN100550994C (zh) 具有替换电路分布的图像传感器阵列
JPH11252464A (ja) Cmosイメージャ用ピクセル補正システム及び方法
CN108234910B (zh) 成像系统和形成堆叠成像系统的方法及数字相机成像系统组件
CN102449999A (zh) 具有全局及滚动快门过程的成像器
CN105308747A (zh) 分离栅极有条件重置的图像传感器
CN102055918A (zh) 像素缺陷检测和校正设备和方法、成像装置、和程序
Kumbhar et al. Comparative study of CCD & CMOS sensors for image processing
CN206506600U (zh) 含有成像设备的系统
Wach et al. Noise modeling for design and simulation of computational imaging systems
CN112291490B (zh) 成像系统及使用图像像素生成具有降低的暗电流噪声的图像信号的方法
US9628730B2 (en) Dark current gradient estimation using optically black pixels
CN101160955B (zh) 具有校准功能的成像装置以及操作该装置的方法
CN110784667A (zh) 信号处理装置、信号处理方法、摄像元件和摄像装置
US6646245B2 (en) Focal plane averaging implementation for CMOS imaging arrays using a split photodiode architecture
CN111614917A (zh) 具有风化检测像素的成像系统
JP3980891B2 (ja) 永久情報が符号化される光センサ・アレイ
US10785426B2 (en) Apparatus and methods for generating high dynamic range images
JP2021044782A (ja) 撮像素子及び撮像装置

Legal Events

Date Code Title Description
C06 Publication
PB01 Publication
C10 Entry into substantive examination
SE01 Entry into force of request for substantive examination
C14 Grant of patent or utility model
GR01 Patent grant
ASS Succession or assignment of patent right

Owner name: FULL VISION TECHNOLOGY CO., LTD.

Free format text: FORMER OWNER: EASTMAN KODAK COMPANY (US) 343 STATE STREET, ROCHESTER, NEW YORK

Effective date: 20110706

C41 Transfer of patent application or patent right or utility model
COR Change of bibliographic data

Free format text: CORRECT: ADDRESS; FROM: NEW YORK STATE, THE USA TO: CALIFORNIA STATE, THE USA

TR01 Transfer of patent right

Effective date of registration: 20110706

Address after: California, USA

Patentee after: Full Vision Technology Co.,Ltd.

Address before: American New York

Patentee before: Eastman Kodak Co.

CP01 Change in the name or title of a patent holder
CP01 Change in the name or title of a patent holder

Address after: California, USA

Patentee after: OmniVision Technologies, Inc.

Address before: California, USA

Patentee before: Full Vision Technology Co.,Ltd.

CX01 Expiry of patent term

Granted publication date: 20091014

CX01 Expiry of patent term