DE602004026462D1 - Bildsensor-array mit substitutionaler schaltungsverteilung - Google Patents

Bildsensor-array mit substitutionaler schaltungsverteilung

Info

Publication number
DE602004026462D1
DE602004026462D1 DE602004026462T DE602004026462T DE602004026462D1 DE 602004026462 D1 DE602004026462 D1 DE 602004026462D1 DE 602004026462 T DE602004026462 T DE 602004026462T DE 602004026462 T DE602004026462 T DE 602004026462T DE 602004026462 D1 DE602004026462 D1 DE 602004026462D1
Authority
DE
Germany
Prior art keywords
substitutional
image sensor
sensor array
circuit distribution
distribution
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Active
Application number
DE602004026462T
Other languages
English (en)
Inventor
Herbert James Erhardt
David Newell Nichols
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Eastman Kodak Co
Original Assignee
Eastman Kodak Co
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Eastman Kodak Co filed Critical Eastman Kodak Co
Publication of DE602004026462D1 publication Critical patent/DE602004026462D1/de
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
    • H01L27/14—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation
    • H01L27/144—Devices controlled by radiation
    • H01L27/146—Imager structures
    • H01L27/14601—Structural or functional details thereof
    • H01L27/14603—Special geometry or disposition of pixel-elements, address-lines or gate-electrodes
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
    • H04N25/60—Noise processing, e.g. detecting, correcting, reducing or removing noise
    • H04N25/68—Noise processing, e.g. detecting, correcting, reducing or removing noise applied to defects
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N23/00—Cameras or camera modules comprising electronic image sensors; Control thereof
    • H04N23/80—Camera processing pipelines; Components thereof
    • H04N23/84—Camera processing pipelines; Components thereof for processing colour signals
    • H04N23/843—Demosaicing, e.g. interpolating colour pixel values
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
    • H04N25/70—SSIS architectures; Circuits associated therewith
    • H04N25/702—SSIS architectures characterised by non-identical, non-equidistant or non-planar pixel layout
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
    • H04N25/10—Circuitry of solid-state image sensors [SSIS]; Control thereof for transforming different wavelengths into image signals
    • H04N25/11—Arrangement of colour filter arrays [CFA]; Filter mosaics
    • H04N25/13—Arrangement of colour filter arrays [CFA]; Filter mosaics characterised by the spectral characteristics of the filter elements
    • H04N25/134—Arrangement of colour filter arrays [CFA]; Filter mosaics characterised by the spectral characteristics of the filter elements based on three different wavelength filter elements

Landscapes

  • Engineering & Computer Science (AREA)
  • Multimedia (AREA)
  • Signal Processing (AREA)
  • Physics & Mathematics (AREA)
  • Power Engineering (AREA)
  • General Physics & Mathematics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • Electromagnetism (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Solid State Image Pick-Up Elements (AREA)
  • Transforming Light Signals Into Electric Signals (AREA)
DE602004026462T 2003-10-22 2004-10-19 Bildsensor-array mit substitutionaler schaltungsverteilung Active DE602004026462D1 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US10/691,047 US7304673B2 (en) 2003-10-22 2003-10-22 Image sensor array with substitutional circuit distribution
PCT/US2004/034324 WO2005043894A1 (en) 2003-10-22 2004-10-19 Image sensor array with substitutional circuit distribution

Publications (1)

Publication Number Publication Date
DE602004026462D1 true DE602004026462D1 (de) 2010-05-20

Family

ID=34521786

Family Applications (1)

Application Number Title Priority Date Filing Date
DE602004026462T Active DE602004026462D1 (de) 2003-10-22 2004-10-19 Bildsensor-array mit substitutionaler schaltungsverteilung

Country Status (7)

Country Link
US (1) US7304673B2 (de)
EP (1) EP1676435B1 (de)
JP (1) JP2007509580A (de)
KR (1) KR101103956B1 (de)
CN (1) CN100550994C (de)
DE (1) DE602004026462D1 (de)
WO (1) WO2005043894A1 (de)

Families Citing this family (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP4090984B2 (ja) * 2003-11-14 2008-05-28 富士フイルム株式会社 デジタルカメラ及び固体撮像装置
GB2429864B (en) * 2005-09-01 2008-09-24 Micron Technology Inc Method and apparatus providing pixel array having automatic light control pixels and image capture pixels
US8228405B2 (en) * 2007-01-16 2012-07-24 Bae Systems Information And Electronic Systems Integration Inc. Real-time pixel substitution for thermal imaging systems
US7781716B2 (en) * 2008-03-17 2010-08-24 Eastman Kodak Company Stacked image sensor with shared diffusion regions in respective dropped pixel positions of a pixel array
US20110115954A1 (en) * 2009-11-19 2011-05-19 Eastman Kodak Company Sparse color pixel array with pixel substitutes
US8669633B2 (en) * 2010-07-28 2014-03-11 Teledyne Dalsa, Inc. Packaged device with an image sensor aligned to a faceplate using fiducial marks and connection bodies registered thereto
CN102184931B (zh) * 2011-04-19 2013-07-17 格科微电子（上海）有限公司 图像传感器
CN102843519A (zh) * 2011-06-23 2012-12-26 鸿富锦精密工业（深圳）有限公司 影像处理系统及方法
JP2014120858A (ja) * 2012-12-14 2014-06-30 Canon Inc 固体撮像装置
JP6303352B2 (ja) * 2013-09-18 2018-04-04 株式会社デンソーウェーブ 外観検査システム
US9526468B2 (en) 2014-09-09 2016-12-27 General Electric Company Multiple frame acquisition for exposure control in X-ray medical imagers

Family Cites Families (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH05260386A (ja) * 1992-03-16 1993-10-08 Sony Corp 固体撮像素子の欠陥画素検出回路
JPH0787284A (ja) * 1993-09-17 1995-03-31 Fuji Xerox Co Ltd ２次元イメ−ジセンサ及び画素信号の補間方法
DE19818975A1 (de) 1997-08-12 1999-02-18 Hewlett Packard Co Verfahren zum Korrigieren des Dunkelstroms in CMOS-Bilderzeugungssensoren
US6618084B1 (en) * 1997-11-05 2003-09-09 Stmicroelectronics, Inc. Pixel correction system and method for CMOS imagers
US6819360B1 (en) * 1999-04-01 2004-11-16 Olympus Corporation Image pickup element and apparatus for focusing
US6970193B1 (en) * 1999-07-14 2005-11-29 Olympus Optical Co., Ltd. Electronic imaging apparatus operable in two modes with a different optical black correction procedure being effected in each mode
JP3922853B2 (ja) * 1999-12-07 2007-05-30 松下電器産業株式会社 固体撮像装置
US20030030738A1 (en) 2001-05-22 2003-02-13 Clynes Steven Derrick On-chip 2D adjustable defective pixel filtering for CMOS imagers

Also Published As

Publication number Publication date
EP1676435B1 (de) 2010-04-07
KR101103956B1 (ko) 2012-01-13
US7304673B2 (en) 2007-12-04
KR20060094524A (ko) 2006-08-29
WO2005043894A1 (en) 2005-05-12
JP2007509580A (ja) 2007-04-12
CN100550994C (zh) 2009-10-14
EP1676435A1 (de) 2006-07-05
CN1883190A (zh) 2006-12-20
US20050088552A1 (en) 2005-04-28

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Legal Events

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