CN100541217C - 测试结构和方法 - Google Patents
测试结构和方法 Download PDFInfo
- Publication number
- CN100541217C CN100541217C CNB2005800026941A CN200580002694A CN100541217C CN 100541217 C CN100541217 C CN 100541217C CN B2005800026941 A CNB2005800026941 A CN B2005800026941A CN 200580002694 A CN200580002694 A CN 200580002694A CN 100541217 C CN100541217 C CN 100541217C
- Authority
- CN
- China
- Prior art keywords
- test
- module
- enable signal
- control circuit
- test access
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
Images
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/317—Testing of digital circuits
- G01R31/3181—Functional testing
- G01R31/3185—Reconfiguring for testing, e.g. LSSD, partitioning
- G01R31/318533—Reconfiguring for testing, e.g. LSSD, partitioning using scanning techniques, e.g. LSSD, Boundary Scan, JTAG
- G01R31/318544—Scanning methods, algorithms and patterns
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/317—Testing of digital circuits
- G01R31/31701—Arrangements for setting the Unit Under Test [UUT] in a test mode
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/317—Testing of digital circuits
- G01R31/3181—Functional testing
- G01R31/3185—Reconfiguring for testing, e.g. LSSD, partitioning
- G01R31/318533—Reconfiguring for testing, e.g. LSSD, partitioning using scanning techniques, e.g. LSSD, Boundary Scan, JTAG
- G01R31/318555—Control logic
Landscapes
- Engineering & Computer Science (AREA)
- General Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Tests Of Electronic Circuits (AREA)
- Test And Diagnosis Of Digital Computers (AREA)
- Communication Control (AREA)
- Semiconductor Integrated Circuits (AREA)
Abstract
Description
Claims (25)
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
EP04100141 | 2004-01-19 | ||
EP04100141.3 | 2004-01-19 |
Publications (2)
Publication Number | Publication Date |
---|---|
CN1910463A CN1910463A (zh) | 2007-02-07 |
CN100541217C true CN100541217C (zh) | 2009-09-16 |
Family
ID=34802649
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
CNB2005800026941A Expired - Fee Related CN100541217C (zh) | 2004-01-19 | 2005-01-13 | 测试结构和方法 |
Country Status (8)
Country | Link |
---|---|
US (1) | US7620866B2 (zh) |
EP (1) | EP1709454B1 (zh) |
JP (1) | JP2007524088A (zh) |
KR (1) | KR101118407B1 (zh) |
CN (1) | CN100541217C (zh) |
AT (1) | ATE403160T1 (zh) |
DE (1) | DE602005008552D1 (zh) |
WO (1) | WO2005071425A1 (zh) |
Families Citing this family (15)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US7657790B2 (en) | 2006-04-05 | 2010-02-02 | Texas Instruments Incorporated | Scan frame based test access mechanisms |
ATE472106T1 (de) * | 2005-10-24 | 2010-07-15 | Nxp Bv | Ic-testverfahren und vorrichtung |
US7870449B2 (en) * | 2005-10-24 | 2011-01-11 | Nxp B.V. | IC testing methods and apparatus |
CN101292171B (zh) * | 2005-10-24 | 2012-04-18 | Nxp股份有限公司 | Ic测试方法和设备 |
DE602006015084D1 (de) * | 2005-11-02 | 2010-08-05 | Nxp Bv | Ic-testverfahren und vorrichtungen |
US7519884B2 (en) * | 2006-06-16 | 2009-04-14 | Texas Instruments Incorporated | TAM controller for plural test access mechanisms |
US7954022B2 (en) * | 2008-01-30 | 2011-05-31 | Alcatel-Lucent Usa Inc. | Apparatus and method for controlling dynamic modification of a scan path |
WO2010007472A1 (en) * | 2008-07-17 | 2010-01-21 | Freescale Semiconductor, Inc. | An integrated circuit die, an integrated circuit package and a method for connecting an integrated circuit die to an external device |
KR20100103212A (ko) | 2009-03-13 | 2010-09-27 | 삼성전자주식회사 | 복수개의 테스트 모듈을 구비하는 테스트 보드 및 이를 구비하는 테스트 시스템 |
US20100332177A1 (en) * | 2009-06-30 | 2010-12-30 | National Tsing Hua University | Test access control apparatus and method thereof |
US8918689B2 (en) * | 2010-07-19 | 2014-12-23 | Stmicroelectronics International N.V. | Circuit for testing integrated circuits |
US9236143B2 (en) | 2011-12-28 | 2016-01-12 | Intel Corporation | Generic address scrambler for memory circuit test engine |
DE112012006172B4 (de) | 2012-03-30 | 2020-12-03 | Intel Corporation | Generischer Adressen-Scrambler für Speicherschaltungs-Testengine |
US9568551B1 (en) * | 2015-09-16 | 2017-02-14 | Freescale Semiconductor, Inc. | Scan wrapper circuit for integrated circuit |
CN109857024B (zh) * | 2019-02-01 | 2021-11-12 | 京微齐力(北京)科技有限公司 | 人工智能模块的单元性能测试方法和系统芯片 |
Family Cites Families (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4860290A (en) * | 1987-06-02 | 1989-08-22 | Texas Instruments Incorporated | Logic circuit having individually testable logic modules |
US6378090B1 (en) * | 1998-04-24 | 2002-04-23 | Texas Instruments Incorporated | Hierarchical test access port architecture for electronic circuits including embedded core having built-in test access port |
US6886110B2 (en) * | 2000-11-21 | 2005-04-26 | Wind River Systems, Inc. | Multiple device scan chain emulation/debugging |
US7103814B2 (en) * | 2002-10-25 | 2006-09-05 | International Business Machines Corporation | Testing logic and embedded memory in parallel |
KR100514319B1 (ko) * | 2003-12-02 | 2005-09-13 | 조상욱 | 시스템 온 칩의 테스트를 위한 코아 접속 스위치 |
US7181663B2 (en) * | 2004-03-01 | 2007-02-20 | Verigy Pte, Ltd. | Wireless no-touch testing of integrated circuits |
US7231563B2 (en) * | 2004-05-26 | 2007-06-12 | Lsi Corporation | Method and apparatus for high speed testing of latch based random access memory |
-
2005
- 2005-01-13 CN CNB2005800026941A patent/CN100541217C/zh not_active Expired - Fee Related
- 2005-01-13 WO PCT/IB2005/050153 patent/WO2005071425A1/en active IP Right Grant
- 2005-01-13 JP JP2006548561A patent/JP2007524088A/ja active Pending
- 2005-01-13 AT AT05702665T patent/ATE403160T1/de not_active IP Right Cessation
- 2005-01-13 US US10/586,218 patent/US7620866B2/en not_active Expired - Fee Related
- 2005-01-13 EP EP05702665A patent/EP1709454B1/en not_active Not-in-force
- 2005-01-13 DE DE602005008552T patent/DE602005008552D1/de active Active
-
2006
- 2006-07-19 KR KR1020067014486A patent/KR101118407B1/ko not_active IP Right Cessation
Also Published As
Publication number | Publication date |
---|---|
CN1910463A (zh) | 2007-02-07 |
WO2005071425A1 (en) | 2005-08-04 |
EP1709454B1 (en) | 2008-07-30 |
US20070208970A1 (en) | 2007-09-06 |
ATE403160T1 (de) | 2008-08-15 |
KR20070029654A (ko) | 2007-03-14 |
JP2007524088A (ja) | 2007-08-23 |
US7620866B2 (en) | 2009-11-17 |
DE602005008552D1 (de) | 2008-09-11 |
KR101118407B1 (ko) | 2012-03-06 |
EP1709454A1 (en) | 2006-10-11 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
C06 | Publication | ||
PB01 | Publication | ||
C10 | Entry into substantive examination | ||
SE01 | Entry into force of request for substantive examination | ||
ASS | Succession or assignment of patent right |
Owner name: NXP CO., LTD. Free format text: FORMER OWNER: KONINKLIJKE PHILIPS ELECTRONICS N.V. Effective date: 20070817 |
|
C41 | Transfer of patent application or patent right or utility model | ||
TA01 | Transfer of patent application right |
Effective date of registration: 20070817 Address after: Holland Ian Deho Finn Applicant after: Koninkl Philips Electronics NV Address before: Holland Ian Deho Finn Applicant before: Koninklijke Philips Electronics N.V. |
|
C14 | Grant of patent or utility model | ||
GR01 | Patent grant | ||
C17 | Cessation of patent right | ||
CF01 | Termination of patent right due to non-payment of annual fee |
Granted publication date: 20090916 Termination date: 20140113 |